Sharp LH28F800BGR-TL85, LH28F800BGR-TL12, LH28F800BGR-BL85, LH28F800BGR-BL12, LH28F800BGHR-TL85 Datasheet

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LH28F800BG-L/BGH-L (FOR TSOP, CSP)
8 M-bit (512 kB x 16) SmartVoltage
LH28F800BG-L/BGH-L (FOR TSOP, CSP)
The LH28F800BG-L/BGH-L flash memories with SmartVoltage technology are high-density, low-cost, nonvolatile, read/write storage solution for a wide range of applications. The LH28F800BG-L/BGH-L can operate at V low voltage operation capability realizes longer battery life and suits for cellular phone application. Their boot, parameter and main-blocked architecture, flexible voltage and enhanced cycling capability provide for highly flexible component suitable for portable terminals and personal computers. Their enhanced suspend capabilities provide for an ideal solution for code + data storage applications. For secure code storage applications, such as networking, where code is either directly executed out of flash or downloaded to DRAM, the LH28F800BG-L/BGH-L offer two levels of protection : absolute protection with V hardware boot block locking. These alternatives give designers ultimate control of their code security needs.
CC = 2.7 V and VPP = 2.7 V. Their
PP at GND, selective
FEATURES
• SmartVoltage technology – 2.7 V, 3.3 V or 5 V V – 2.7 V, 3.3 V, 5 V or 12 V VPP
• High performance read access time LH28F800BG-L85/BGH-L85 – 85 ns (5.0±0.25 V)/90 ns (5.0±0.5 V)/
100 ns (3.3±0.3 V)/120 ns (2.7 to 3.6 V) LH28F800BG-L12/BGH-L12 – 120 ns (5.0±0.5 V)/130 ns (3.3±0.3 V)/
150 ns (2.7 to 3.6 V)
• Enhanced automated suspend options – Word write suspend to read – Block erase suspend to word write – Block erase suspend to read
CC
• Enhanced data protection features – Absolute protection with V – Block erase/word write lockout during power
transitions
– Boot blocks protection with WP# = V
• SRAM-compatible write interface
• Optimized array blocking architecture – Two 4 k-word boot blocks – Six 4 k-word parameter blocks – Fifteen 32 k-word main blocks – Top or bottom boot location
• Enhanced cycling capability – 100 000 block erase cycles
• Low power management – Deep power-down mode – Automatic power saving mode decreases I
in static mode
• Automated word write and block erase – Command user interface – Status register
TM
• ETOX
• Packages – 48-pin TSOP Type I (TSOP048-P-1220)
– 48-ball CSP (FBGA048-P-0808)
ETOX is a trademark of Intel Corporation.
V nonvolatile flash technology
Normal bend/Reverse bend
Flash Memories
PP = GND
IL
CC
In the absence of confirmation by device specification sheets, SHARP takes no responsibility for any defects that may occur in equipment using any SHARP devices shown in catalogs, data books, etc. Contact SHARP in order to obtain the latest device specification sheets before using any SHARP device.
- 1 -
A2
1
A
A
3B
A
1C
A
0D
GND
E
CE#
A5
2
A
6
A4
OE#
DQ8
DQ0
A17
WP# WE#
3
A
7
DQ1
DQ2
DQ9
4
VPP
DQ10
DQ11
DQ3
5
RP#
NC
DQ12
VCC
DQ4
A8
6
NC
A9
DQ6
DQ5
DQ13
A11
7
A10
A12
DQ15
DQ14
DQ7
A14
8
A13
A15
A16
GND
NC
F
RY/BY#
A18
(FBGA048-P-0808)
48-BALL CSP48-PIN TSOP (Type I)
(TSOP048-P-1220)
A15 A14 A13 A12 A11 A10
A9
A8 NC NC
WE#
RP#
V
PP
WP#
RY/BY#
A
18
A17
A7
A6
A5
A4
A3
A2
A1
1 2 3 4 5 6 7 8
9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25
A16 NC GND DQ
15
DQ7 DQ14 DQ6 DQ13 DQ5 DQ12 DQ4 VCC DQ11 DQ3 DQ10 DQ2 DQ9 DQ1 DQ8 DQ0 OE# GND CE# A
0
COMPARISON TABLE
VERSIONS
LH28F800BG-L (FOR TSOP, CSP) LH28F800BGH-L (FOR TSOP, CSP) LH28F800BG-L (FOR SOP)
1 Refer to the datasheet of LH28F800BG-L (FOR SOP).
OPERATING
TEMPERATURE
0 to +70°C
– 40 to +85°C
1
PACKAGE
48-pin TSOP (I) 48-ball CSP WP# and 48-pin TSOP (I) 48-ball CSP WP# and
0 to +70°C 44-pin SOP 10 µA Controlled by RP# pin
PIN CONNECTIONS
LH28F800BG-L/BGH-L (FOR TSOP, CSP)
DC CHARACTERISTICS
VCCdeep power-down current (MAX.)
10 µA
20 µA
WRITE PROTECT FUNCTION
FOR BOOT BLOCKS
Controlled by
Controlled by
RP# pins
RP# pins
TOP VIEW
NOTE :
Reverse bend available on request.
- 2 -
BLOCK ORGANIZATION
INPUT
BUFFERBUFFER
OUTPUT
MULTIPLEXER
VCC
CE#
RP#
OE#
IDENTIFIER
REGISTER
COMMAND
USER
INTERFACE
WRITE STATE
MACHINE
PROGRAM/ERASE VOLTAGE SWITCH
I/O
LOGIC
STATUS
REGISTER
DATA
REGISTER
DATA
COMPARATOR
15
32 k-WORD
MAIN BLOCKS
X
DECODER
Y
DECODER
Y GATING
RY/BY#
V
PP
V
CC
GND
A0-A18
INPUT
BUFFER
ADDRESS
LATCH
ADDRESS COUNTER
BOOT BLOCK 0
BOOT BLOCK 1
PARAMETER BLOCK 0
PARAMETER BLOCK 1
PARAMETER BLOCK 2
PARAMETER BLOCK 3
PARAMETER BLOCK 4
PARAMETER BLOCK 5
MAIN BLOCK 0
MAIN BLOCK 1
MAIN BLOCK 13
MAIN BLOCK 14
WP#
WE#
OUTPUT
DQ0-DQ15
This product features an asymmetrically-blocked architecture providing system memory integration. Each erase block can be erased independently of the others up to 100 000 times. For the address locations of the blocks, see the memory map in
Fig. 1.
Boot Blocks : The two boot blocks are intended to
replace a dedicated boot PROM in a micro­processor or microcontroller-based system. The boot blocks of 4 k words (4 096 words) feature hardware controllable write-protection to protect the crucial microprocessor boot code from accidental modification. The protection of the boot blocks is controlled using a combination of the V
PP, RP# and
WP# pins.
BLOCK DIAGRAM
LH28F800BG-L/BGH-L (FOR TSOP, CSP)
Parameter Blocks : The boot block architecture
includes parameter blocks to facilitate storage of frequently update small parameters that would normally require an EEPROM. By using software techniques, the byte-rewrite functionality of EEPROMs can be emulated. Each boot block component contains six parameter blocks of 4 k words (4 096 words) each. The parameter blocks are not write-protectable.
Main Blocks : The reminder is divided into main blocks for data or code storage. Each 8 M-bit device contains fifteen 32 k words (32 768 words) blocks.
- 3 -
LH28F800BG-L/BGH-L (FOR TSOP, CSP)
PIN DESCRIPTION
SYMBOL TYPE NAME AND FUNCTION
A
0-A18 INPUT
DQ0-DQ15
INPUT/
OUTPUT
CE# INPUT
RP# INPUT/
OE# INPUT OUTPUT ENABLE : Gates the device’s outputs during a read cycle.
WE# INPUT
WP# INPUT
RY/BY# OUTPUT
V
PP SUPPLY
V
CC SUPPLY
GND SUPPLY GROUND : Do not float any ground pins.
NC NO CONNECT : Lead is not inter nal connected; recommend to be floated.
ADDRESS INPUTS : Inputs for addresses during read and write operations. Addresses are internally latched during a write cycle. DATA INPUT/OUTPUTS : Inputs data and commands during CUI write cycles; outputs data during memory array, status register and identifier code read cycles. Data pins float to high-impedance when the chip is deselected or outputs are disabled. Data is internally latched during a write cycle. CHIP ENABLE : Activates the device’s control logic, input buffers, decoders and sense amplifiers. CE#-high deselects the device and reduces power consumption to standby levels. RESET/DEEP POWER-DOWN : Puts the device in deep power-down mode and resets internal automation. RP#-high enables normal operation. When driven low, RP# inhibits write operations which provide data protection during power transitions. Exit from deep power-down sets the device to read array mode. With RP# = V write can operate to all blocks without WP# state. Block erase or word write with V RP# < VHH produce spurious results and should not be attempted.
WRITE ENABLE : Controls writes to the CUI and array blocks. Addresses and data are latched on the rising edge of the WE# pulse. WRITE PROTECT : Master control for boot blocks locking. When V blocks cannot be erased and programmed. READY/BUSY : Indicates the status of the internal WSM. When low, the WSM is performing an internal operation (block erase or word write). RY/BY#-high indicates that the WSM is ready for new commands, block erase is suspended, and word write is inactive, word write is suspended, or the device is in deep power-down mode. RY/BY# is always active and does not float when the chip is deselected or data outputs are disabled. BLOCK ERASE AND WORD WRITE POWER SUPPLY : For erasing array blocks or writing words. With V word write with an invalid V
PP ≤ VPPLK, memory contents cannot be altered. Block erase and
PP (see Section 6.2.3 "DC CHARACTERISTICS") produce
spurious results and should not be attempted. DEVICE POWER SUPPLY : Internal detection configures the device for 2.7 V, 3.3 V or 5 V operation. To switch from one voltage to another, ramp V
CC down to GND and then
ramp VCC to the new voltage. Do not float any power pins. With VCC ≤ VLKO, all write attempts to the flash memory are inhibited. Device operations at invalid V (see Section 6.2.3 "DC CHARACTERISTICS") produce spurious results and should not be attempted.
HH, block erase or word
IH <
IL, locked boot
CC voltage
- 4 -
1 INTRODUCTION
This datasheet contains LH28F800BG-L/BGH-L specifications. Section 1 provides a flash memory overview. Sections 2, 3, 4 and 5 describe the memory organization and functionality. Section 6 covers electrical specifications. LH28F800BG-L/ BGH-L flash memories documentation also includes ordering information which is referenced in Section 7.
1.1 New Features
Key enhancements of LH28F800BG-L/BGH-L SmartVoltage flash memories are :
• SmartVoltage Technology
• Enhanced Suspend Capabilities
• Boot Block Architecture
Note following important differences :
LH28F800BG-L/BGH-L (FOR TSOP, CSP)
But, 5 V V performance. V eliminates the need for a separate 12 V converter,
PP = 12 V maximizes block erase and word
while V write performance. In addition to flexible erase and program voltages, the dedicated V complete data protection when V
Table 1 VCC and VPP Voltage Combinations
VCC VOLTAGE VPP VOLTAGE
Internal VCC and VPP detection circuitry auto­matically configures the device for optimized read and write operations.
CC provides the highest read
PP at 2.7 V, 3.3 V and 5 V
PP pin gives
PP ≤ VPPLK.
Offered by SmartVoltage Technology
2.7 V 2.7 V, 3.3 V, 5 V, 12 V
3.3 V 3.3 V, 5 V, 12 V 5 V 5 V, 12 V
PPLK has been lowered to 1.5 V to support
•V
2.7 V, 3.3 V and 5 V block erase and word write operations. Designs that switch V
PP off
during read operations should make sure that
PP voltage transitions to GND.
the V
• To take advantage of SmartVoltage technology, allow V
PP connection to 2.7 V, 3.3 V or 5 V.
1.2 Product Overview
The LH28F800BG-L/BGH-L are high-performance 8 M-bit SmartVoltage flash memories organized as 512 k-word of 16 bits. The 512 k-word of data is arranged in two 4 k-word boot blocks, six 4 k-word parameter blocks and fifteen 32 k-word main blocks which are individually erasable in-system. The memory map is shown in Fig. 1.
SmartVoltage technology provides a choice of V and VPP combinations, as shown in Table 1, to meet system performance and power expectations.
2.7 V V power of 5 V V
CC consumes approximately one-fifth the
CC and 3.3 V VCC consumes
approximately one-fourth the power of 5 V V
CC
CC.
A Command User Interface (CUI) serves as the interface between the system processor and internal operation of the device. A valid command sequence written to the CUI initiates device automation. An internal Write State Machine (WSM) automatically executes the algorithms and timings necessary for block erase and word write operations.
A block erase operation erases one of the device’s 32 k-word blocks typically within 0.39 second (5 V V
CC, 12 V VPP), 4 k-word blocks typically within
0.25 second (5 V V
CC, 12 V VPP) independent of
other blocks. Each block can be independently erased 100 000 times. Block erase suspend mode allows system software to suspend block erase to read data from, or write data to any other block.
Writing memory data is performed in word increments of the device’s 32 k-word blocks typically within 8.4 µs (5 V V word blocks typically within 17 µs (5 V V
PP). Word write suspend mode enables the
V
CC, 12 V VPP), 4 k-
CC, 12 V
- 5 -
LH28F800BG-L/BGH-L (FOR TSOP, CSP)
system to read data from, or write to any other flash memory array location.
The boot block is located at either the top or the bottom of the address map in order to accommodate different micro-processor protect for boot code location. The hardware-lockable boot block provides complete code security for the kernel code required for system initialization. Locking and unlocking of the boot block is controlled by WP# and/or RP# (see Section 4.9 for details). Block erase or word write for boot block must not be carried out by WP# to low and RP# to
IH.
V
The status register indicates when the WSM’s block erase or word write operation is finished.
The RY/BY# output gives an additional indicator of WSM activity by providing both a hardware signal of status (versus software polling) and status masking (interrupt masking for background block erase, for example). Status polling using RY/BY# minimizes both CPU overhead and system power consumption. When low, RY/BY# indicates that the WSM is performing a block erase or word write. RY/BY#-high indicates that the WSM is ready for a new command, block erase is suspended (and word write is inactive), word write is suspended, or the device is in deep power-down mode.
The access time is 85 ns (t
AVQV) at the VCC supply
voltage range of 4.75 to 5.25 V over the temperature range, 0 to +70°C (LH28F800BG-L)/ – 40 to +85°C (LH28F800BGH-L). At 4.5 to 5.5 V V
CC, the access time is 90 ns or 120 ns. At lower CC voltage, the access time is 100 ns or 130 ns
V (3.0 to 3.6 V) and 120 ns or 150 ns (2.7 to 3.6 V).
The Automatic Power Saving (APS) feature substantially reduces active current when the device is in static mode (addresses not switching). In APS mode, the typical I
CC and 3 mA at 2.7 V and 3.3 V VCC.
5 V V
When CE# and RP# pins are at V
CCR current is 1 mA at
CC, the ICC
CMOS standby mode is enabled. When the RP# pin is at GND, deep power-down mode is enabled which minimizes power consumption and provides write protection during reset. A reset time (t
PHQV) is
required from RP# switching high until outputs are valid. Likewise, the device has a wake time (t
PHEL)
from RP#-high until writes to the CUI are recognized. With RP# at GND, the WSM is reset and the status register is cleared.
- 6 -
LH28F800BG-L/BGH-L (FOR TSOP, CSP)
32 k-Word Main Block
32 k-Word Main Block 32 k-Word Main Block
32 k-Word Main Block
32 k-Word Main Block 32 k-Word Main Block
32 k-Word Main Block
32 k-Word Main Block
32 k-Word Main Block
32 k-Word Main Block 32 k-Word Main Block
32 k-Word Main Block
32 k-Word Main Block 32 k-Word Main Block
32 k-Word Main Block
7FFFF 78000
77FFF
6FFFF
70000
68000 67FFF
60000 5FFFF
58000 57FFF
50000 4FFFF
48000 47FFF
40000 3FFFF
38000 37FFF
30000 2FFFF
28000 27FFF
20000 1FFFF
18000 17FFF
10000 0FFFF
08000 07FFF
07000 06FFF
06000 05FFF
05000 04FFF
04000 03FFF
03000 02FFF
02000 01FFF
01000 00FFF
00000
14
13
12
11 10
9
8 7
6 5
4
3 2
1
0
4 k-Word Parameter Block
5
4 k-Word Parameter Block
4
4 k-Word Parameter Block
3
4 k-Word Parameter Block
2
4 k-Word Parameter Block
1
4 k-Word Parameter Block
0
4 k-Word Boot Block
1
4 k-Word Boot Block
0
Bottom Boot
4 k-Word Boot Block
4 k-Word Boot Block 4 k-Word Parameter Block
4 k-Word Parameter Block
4 k-Word Parameter Block 4 k-Word Parameter Block
4 k-Word Parameter Block
4 k-Word Parameter Block
32 k-Word Main Block
32 k-Word Main Block 32 k-Word Main Block
32 k-Word Main Block
32 k-Word Main Block 32 k-Word Main Block
32 k-Word Main Block
7FFFF 7F000
7EFFF
7DFFF
7E000
7D000 7CFFF
7C000 7BFFF
7B000 7AFFF
7A000 79FFF
79000 78FFF
78000 77FFF
70000 6FFFF
68000 67FFF
60000 5FFFF
58000 57FFF
50000 4FFFF
48000 47FFF
40000 3FFFF
38000 37FFF
30000 2FFFF
28000 27FFF
20000 1FFFF
18000 17FFF
10000 0FFFF
08000 07FFF
00000
0
1
0
1 2
3
4 5
0 1
2
3 4
5
6
32 k-Word Main Block
7
32 k-Word Main Block
8
32 k-Word Main Block
9
32 k-Word Main Block
10
32 k-Word Main Block
11
32 k-Word Main Block
12
32 k-Word Main Block
13
32 k-Word Main Block
14
Top Boot
NOTES :
BLOCK CONFIGURATION VERSIONS
Top Boot
Bottom Boot
LH28F800BG-TL LH28F800BGH-TL LH28F800BG-BL LH28F800BGH-BL
Fig. 1 Memory Map
- 7 -
2 PRINCIPLES OF OPERATION
The LH28F800BG-L/BGH-L SmartVoltage flash memories include an on-chip WSM to manage block erase and word write functions. It allows for : 100% TTL-level control inputs, fixed power supplies during block erasure and word write, and minimal processor overhead with RAM-like interface timings.
After initial device power-up or return from deep power-down mode (see Table 2 "Bus Operations"), the device defaults to read array mode. Manipulation of external memory control pins allow array read, standby and output disable operations.
Status register and identifier codes can be accessed through the CUI independent of the V voltage. High voltage on VPP enables successful block erasure and word writing. All functions associated with altering memory contents—block erase, word write, status and identifier codes—are accessed via the CUI and verified through the status register.
Commands are written using standard micro­processor write timings. The CUI contents serve as input to the WSM, which controls the block erase and word write. The internal algorithms are regulated by the WSM, including pulse repetition, internal verification and margining of data. Addresses and data are internally latched during write cycles. Writing the appropriate command outputs array data, accesses the identifier codes or outputs status register data.
PP
LH28F800BG-L/BGH-L (FOR TSOP, CSP)
software to suspend a word write to read data from any other flash memory array location.
2.1 Data Protection
Depending on the application, the system designer may choose to make the V
PP power supply
switchable (available only when memory block erases or word writes are required) or hardwired to
PPH1/2/3. The device accommodates either design
V practice and encourages optimization of the processor-memory interface.
When V
PP ≤ VPPLK, memory contents cannot be
altered. The CUI, with two-step block erase or word write command sequences, provides protection from unwanted operations even when high voltage is applied to V when V
CC is below the write lockout voltage VLKO
PP. All write functions are disabled
or when RP# is at VIL. The device’s boot blocks locking capability for WP# provides additional protection from inadvertent code or data alteration by block erase and word write operations.
3 BUS OPERATION
The local CPU reads and writes flash memory in­system. All bus cycles to or from the flash memory conform to standard microprocessor bus cycles.
3.1 Read
Information can be read from any block, identifier codes or status register independent of the V voltage. RP# can be at either VIH or VHH.
PP
Interface software that initiates and polls progress of block erase and word write can be stored in any block. This code is copied to and executed from system RAM during flash memory updates. After successful completion, reads are again possible via the Read Array command. Block erase suspend allows system software to suspend a block erase to read/write data from/to blocks other than that which is suspended. Word write suspend allows system
The first task is to write the appropriate read mode command (Read Array, Read Identifier Codes or Read Status Register) to the CUI. Upon initial device power-up or after exit from deep power­down mode, the device automatically resets to read array mode. Five control pins dictate the data flow in and out of the component : CE#, OE#, WE#, RP# and WP#. CE# and OE# must be driven active to obtain data at the outputs. CE# is the
- 8 -
LH28F800BG-L/BGH-L (FOR TSOP, CSP)
7FFFF
00002 00001
00000
Reserved for
Future Implementation
Device Code
Manufacture Code
device selection control, and when active enables the selected memory device. OE# is the data output (DQ
0-DQ15) control and when active drives
the selected memory data onto the I/O bus. WE# must be at V
IH and RP# must be at VIH or VHH.
Fig. 11 illustrates read cycle.
3.2 Output Disable
With OE# at a logic-high level (VIH), the device outputs are disabled. Output pins (DQ
0-DQ15) are
placed in a high-impedance state.
3.3 Standby
CE# at a logic-high level (VIH) places the device in standby mode which substantially reduces device power consumption. DQ
0-DQ15 outputs are placed
in a high-impedance state independent of OE#. If deselected during block erase or word write, the device continues functioning, and consuming active power until the operation completes.
3.4 Deep Power-Down
RP# at VIL initiates the deep power-down mode.
assert RP# during system reset. When the system comes out of reset, it expects to read from the flash memory. Automated flash memories provide status information when accessed during block erase or word write modes. If a CPU reset occurs with no flash memory reset, proper CPU initialization may not occur because the flash memory may be providing status information instead of array data. SHARP’s flash memories allow proper CPU initialization following a system reset through the use of the RP# input. In this application, RP# is controlled by the same RESET# signal that resets the system CPU.
3.5 Read Identifier Codes Operation
The read identifier codes operation outputs the manufacture code and device code (see Fig. 2). Using the manufacture and device codes, the system CPU can automatically match the device with its proper algorithms.
In read modes, RP#-low deselects the memory, places output drivers in a high-impedance state and turns off all internal circuits. RP# must be held low for a minimum of 100 ns. Time t
PHQV is required
after return from power-down until initial memory access outputs are valid. After this wake-up interval, normal operation is restored. The CUI is reset to read array mode and status register is set to 80H.
During block erase or word write modes, RP#-low will abort the operation. RY/BY# remains low until the reset operation is complete. Memory contents being altered are no longer valid; the data may be partially erased or written. Time t after RP# goes to logic-high (V command can be written.
As with any automated device, it is important to
PHWL is required
IH) before another
Fig. 2 Device Identifier Code Memory Map
3.6 Write
Writing commands to the CUI enable reading of device data and identifier codes. They also control inspection and clearing of the status register. When V
CC = VCC1/2/3/4 and VPP = VPPH1/2/3, the CUI
additionally controls block erasure and word write.
The Block Erase command requires appropriate command data and an address within the block to be erased. The Word Write command requires the command and address of the location to be written.
- 9 -
LH28F800BG-L/BGH-L (FOR TSOP, CSP)
The CUI does not occupy an addressable memory location. It is written when WE# and CE# are active. The address and data needed to execute a command are latched on the rising edge of WE# or CE# (whichever goes high first). Standard
4 COMMAND DEFINITIONS
When the VPP voltage ≤ VPPLK, read operations from the status register, identifier codes, or blocks are enabled. Placing V successful block erase and word write operations.
PPH1/2/3 on VPP enables
microprocessor write timings are used. Fig. 12 and Fig. 13 illustrate WE# and CE# controlled write operations.
Device operations are selected by writing specific commands into the CUI. Table 3 defines these commands.
Table 2 Bus Operations
MODE NOTE RP# CE# OE# WE#
Read 1, 2, 3, 8 Output Disable 3 Standby 3
VIHor V VIHor V VIHor V
HH HH HH
V
IL
V
IL
V
IH
V
IL
V
IH
XXXXHigh Z X
V V
IH IH
ADDRESS
XXD
VPP DQ0-15 RY/BY#
OUT
X X High Z X
Deep Power-Down 4 VIL XXXXXHigh Z V Read Identifier Codes 8 Write 3, 6, 7, 8
VIHor V VIHor V
HH HH
V
IL
V
IL
V
IL
V
IH
V
V
IH IL
See Fig. 2
X(
NOTE 5)
XXDINX
NOTES :
1. Refer to Section 6.2.3 "DC CHARACTERISTICS". When V
PP ≤ VPPLK, memory contents can be read, but
not altered.
2. X can be V
PPLK or VPPH1/2/3 for VPP. See Section 6.2.3 "DC
V CHARACTERISTICS" for V
3. RY/BY# is V block erase or word write algorithms. It is V when the WSM is not busy, in block erase suspend mode (with word write inactive), word write suspend mode or deep power-down mode.
IL or VIH for control pins and addresses, and
PPLK and VPPH1/2/3 voltages.
OL when the WSM is executing internal
OH during
4. RP# at GND±0.2 V ensures the lowest deep power­down current.
5. See Section 4.2 for read identifier code data.
6. Command writes involving block erase or word write are reliably executed when V V
CC1/2/3/4. Block erase or word write with VIH < RP# < HH produce spurious results and should not be
V attempted.
7. Refer to Table 3 for valid D
8. Don’t use the timing both OE# and WE# are V
PP = VPPH1/2/3 and VCC =
IN during a write operation.
X
OH
V
OH
IL.
- 10 -
LH28F800BG-L/BGH-L (FOR TSOP, CSP)
COMMAND
Table 3 Command Definitions
BUS CYCLES
REQ’D.
NOTE
FIRST BUS CYCLE SECOND BUS CYCLE
(NOTE 1)
Oper
Addr
(NOTE 7)
(NOTE 2)
Data
(NOTE 3)
Oper
(NOTE 1)
Addr
(NOTE 2)
Data
Read Array/Reset 1 Write X FFH Read Identifier Codes 2 4 Write X 90H Read IA ID Read Status Register 2 Write X 70H Read X SRD Clear Status Register 1 Write X 50H Block Erase 2 5 Write BA 20H Write BA D0H Word Write 2 5, 6 Write WA Block Erase and Word Write Suspend Block Erase and Word Write Resume
1 5 Write X B0H
1 5 Write X D0H
40H or 10H
Write WA WD
NOTES :
1. Bus operations are defined in Table 2.
2. X = Any valid address within the device. IA = Identifier code address : see Fig. 2. BA = Address within the block being erased. WA = Address of memory location to be written.
3. SRD = Data read from status register. See Table 6 for a
description of the status register bits.
WD = Data to be written at location WA. Data is latched
on the rising edge of WE# or CE# (whichever goes high first).
ID = Data read from identifier codes.
4. Following the Read Identifier Codes command, read operations access manufacture and device codes. See Section 4.2 for read identifier code data.
5. If the block is boot block, WP# must be at V must be at V operations. Attempts to issue a block erase or word write to a boot block while WP# is V
6. Either 40H or 10H is recognized by the WSM as the word write setup.
7. Commands other than those shown above are reserved by SHARP for future device implementations and should not be used.
HH to enable block erase or word write
IH or RP# is VIH.
IH or RP#
(NOTE 3)
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LH28F800BG-L/BGH-L (FOR TSOP, CSP)
4.1 Read Array Command
Upon initial device power-up and after exit from deep power-down mode, the device defaults to read array mode. This operation is also initiated by writing the Read Array command. The device remains enabled for reads until another command is written. Once the internal WSM has started a block erase or word write, the device will not recognize the Read Array command until the WSM completes its operation unless the WSM is suspended via an Erase Suspend or Word Write Suspend command. The Read Array command functions independently of the V RP# can be V
IH or VHH.
PP voltage and
4.2 Read Identifier Codes Command
The identifier code operation is initiated by writing the Read Identifier Codes command. Following the command write, read cycles from addresses shown in Fig. 2 retrieve the manufacture and device codes (see Table 4 for identifier code values). To terminate the operation, write another valid command. Like the Read Array command, the Read Identifier Codes command functions independently of the V
IH or VHH. Following the Read Identifier Codes
V
PP voltage and RP# can be
command, the following information can be read :
Table 4 Identifier Codes
CODE ADDRESS DATA
Manufacture Code 00000H 00B0H Device Code (Top Boot) 00001H 0060H Device Code (Bottom Boot) 00001H 0062H
4.3 Read Status Register Command
The status register may be read to determine when a block erase or word write is complete and whether the operation completed successfully. It may be read at any time by writing the Read Status Register command. After writing this command, all subsequent read operations output data from the status register until another valid command is written. The status register contents are latched on
the falling edge of OE# or CE#, whichever occurs. OE# or CE# must toggle to V
IH before further reads
to update the status register latch. The Read Status Register command functions independently of the V
PP voltage. RP# can be VIH or VHH.
4.4 Clear Status Register Command
Status register bits SR.5, SR.4, SR.3 or SR.1 are set to "1"s by the WSM and can only be reset by the Clear Status Register command. These bits indicate various failure conditions (see Table 6). By allowing system software to reset these bits, several operations (such as cumulatively erasing multiple blocks or writing several words in sequence) may be performed. The status register may be polled to determine if an error occurred during the sequence.
To clear the status register, the Clear Status Register command (50H) is written. It functions independently of the applied V be V
IH or VHH. This command is not functional
PP voltage. RP# can
during block erase or word write suspend modes.
4.5 Block Erase Command
Erase is executed one block at a time and initiated by a two-cycle command. A block erase setup is first written, followed by a block erase confirm. This command sequence requires appropriate sequencing and an address within the block to be erased (erase changes all block data to FFFFH). Block preconditioning, erase, and verify are handled internally by the WSM (invisible to the system). After the two-cycle block erase sequence is written, the device automatically outputs status register data when read (see Fig. 3). The CPU can detect block erase completion by analyzing the output data of the RY/BY# pin or status register bit SR.7.
When the block erase is complete, status register bit SR.5 should be checked. If a block erase error is detected, the status register should be cleared before system software attempts corrective actions.
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LH28F800BG-L/BGH-L (FOR TSOP, CSP)
The CUI remains in read status register mode until a new command is issued.
This two-step command sequence of set-up followed by execution ensures that block contents are not accidentally erased. An invalid Block Erase command sequence will result in both status register bits SR.4 and SR.5 being set to "1". Also, reliable block erasure can only occur when V
CC1/2/3/4 and VPP = VPPH1/2/3. In the absence of
V
CC =
this high voltage, block contents are protected against erasure. If block erase is attempted while
PP ≤ VPPLK, SR.3 and SR.5 will be set to "1".
V Successful block erase for boot blocks requires that the corresponding if set, that WP# = V V
HH. If block erase is attempted to boot block when
the corresponding WP# = V
IL or RP# = VIH, SR.1
IH or RP# =
and SR.5 will be set to "1". Block erase operations
IH < RP# < VHH produce spurious results and
with V should not be attempted.
4.6 Word Write Command
Word write is executed by a two-cycle command sequence. Word write setup (standard 40H or alternate 10H) is written, followed by a second write that specifies the address and data (latched on the rising edge of WE#). The WSM then takes over, controlling the word write and write verify algorithms internally. After the word write sequence is written, the device automatically outputs status register data when read (see Fig. 4). The CPU can detect the completion of the word write event by analyzing the RY/BY# pin or status register bit SR.7.
When word write is complete, status register bit SR.4 should be checked. If word write error is detected, the status register should be cleared. The internal WSM verify only detects errors for "1"s that do not successfully write to "0"s. The CUI remains in read status register mode until it receives another command.
Reliable word writes can only occur when V
CC1/2/3/4 and VPP = VPPH1/2/3. In the absence of
V
CC =
this high voltage, memory contents are protected against word writes. If word write is attempted while V
PP ≤ VPPLK, status register bits SR.3 and SR.4 will
be set to "1". Successful word write for boot blocks requires that the corresponding if set, that WP# =
IH or RP# = VHH. If word write is attempted to
V boot block when the corresponding WP# = V RP# = V write operations with V
IH, SR.1 and SR.4 will be set to "1". Word
IH < RP# < VHH produce
IL or
spurious results and should not be attempted.
4.7 Block Erase Suspend Command
The Block Erase Suspend command allows block erase interruption to read or word write data in another block of memory. Once the block erase process starts, writing the Block Erase Suspend command requests that the WSM suspend the block erase sequence at a predetermined point in the algorithm. The device outputs status register data when read after the Block Erase Suspend command is written. Polling status register bits SR.7 and SR.6 can determine when the block erase operation has been suspended (both will be set to "1"). RY/BY# will also transition to V Specification t
WHRH2 defines the block erase
suspend latency.
At this point, a Read Array command can be written to read data from blocks other than that which is suspended. A Word Write command sequence can also be issued during erase suspend to program data in other blocks. Using the Word Write Suspend command (see Section 4.8), a word write operation can also be suspended. During a word write operation with block erase suspended, status register bit SR.7 will return to "0" and the RY/BY# output will transition to V However, SR.6 will remain "1" to indicate block erase suspend status.
OH.
OL.
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