SGS Thomson Microelectronics M28256-W, M28256 Datasheet

M28256
256 Kbit (32Kb x8) Parallel EEPROM
with Software Data Protection
PRELIMINARY DATA
January 1999 1/21
Thisis preliminaryinformationon a new product now in developmentor undergoingevaluation.Detail s aresubject to change without notice.
AI01885
A0-A14
W
DQ0-DQ7
V
CC
M28256
G
E
V
SS
8
Figure1. LogicDiagram
28
1
PDIP28 (BS) PLCC32 (KA)
A0-A14 Address Input DQ0-DQ7 Data Input / Output W Write Enable E Chip Enable G Output Enable V
CC
Supply Voltage
V
SS
Ground
Table1. Signal Names
FASTACCESSTIME: – 90ns at 5V – 120ns at 3V SINGLESUPPLYVOLTAGE: –5V±10%for M28256 – 2.7V to 3.6Vfor M28256-xxW LOWPOWER CONSUMPTION FASTWRITECYCLE: – 64 Bytes Page Write Operation – Byte or Page WriteCycle ENHANCEDEND of WRITEDETECTION: – Data Polling – ToggleBit STATUSREGISTER HIGHRELIABILITYDOUBLEPOLYSILICON,
CMOSTECHNOLOGY: – Endurance >100,000Erase/WriteCycles – Data Retention>10 Years JEDECAPPROVEDBYTEWIDE PIN OUT ADDRESS and DATALATCHEDON-CHIP SOFTWAREDATAPROTECTION
DESCRIPTION
TheM28256and M28256-Ware 32Kx8lowpower ParallelEEPROMfabricatedwithSTMicroelectron­ics proprietary double polysilicon CMOS technol­ogy.
TSOP28 (NS)
8 x13.4mm
28
1
SO28 (MS)
300 mils
A1 A0
DQ0
A7
A4 A3 A2
A6 A5
A13
A10
A8 A9
DQ7
W
A11 G
E
DQ5DQ1
DQ2
DQ3V
SS
DQ4
DQ6
A12
A14 V
CC
AI01886
M28256
8
1 2 3 4 5 6 7
9 10 11 12 13 14
Figure2A. DIPPin Connections
AI01887
A13
A8
A10
DQ4
A0
NC
DQ0
DQ1
DQ2DUDQ3
A6
A3 A2 A1
A5 A4
9
W
A9
1
A14
A11
DQ6
A7
DQ7
DU
V
CC
M28256
A12
NC
DQ5
G
E
V
SS
Figure2B. LCC Pin Connections
Warning:
NC = Not Connected, DU = Don’t Use.
A1
A0
DQ0
A5
A2
A4 A3
A9
A11
DQ7
A8
G
E
DQ5
DQ1
DQ2
DQ3
DQ4
DQ6
A13
W
A12
A6
A14
V
CC
A7
AI01889
M28256
78
V
SS
A10
Figure2D. TSOPPin Connections
DQ0 DQ1
A3
A0
A2 A1
A10 E
A13
DQ7
G
DQ5
V
CC
DQ4
A9
W
A4
A14
A7
AI01888
M28256
8
2 3 4 5 6 7
9 10 11 12 13 14
DQ2
V
SS
A6 A5
DQ6
DQ3
1
A12
A8
Figure 2C. SOPin Connections
2/21
M28256
Symbol Parameter Value Unit
T
A
Ambient Operating Temperature
(2)
–40to85 °C
T
STG
Storage TemperatureRange – 65 to 150
°
C
V
CC
Supply Voltage – 0.3 to 6.5 V
V
IO
Input/Output Voltage – 0.3 to VCC+0.6 V
V
I
Input Voltage – 0.3 to 6.5 V
V
ESD
Electrostatic Discharge Voltage (Human Body model)
(3)
4000 V
Notes:
1. Except for therating ”Operating Temperature Range”, stresses above those listed in the Table ”Absolute Maximum Ratings”may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied.Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability.Refer also to the STMicroelectronicsSUREProgram and other relevant quality documents.
2. Depends on range.
3. 100pF through 1500; MIL-STD-883C, 3015.7
Table2. Absolute Maximum Ratings
(1)
AI01697
ADDRESS
LATCH
A6-A14
(Page Address)
X DECODE
CONTROL LOGIC
256K ARRAY
ADDRESS
LATCH
A0-A5
Y DECODE
VPPGEN RESET
SENSE AND DATA LATCH
I/O BUFFERS
EGW
PAGE
LOAD TIMER STATUS TOGGLE BIT DATA POLLING
DQ0-DQ7
Figure3. Block Diagram
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M28256
Mode E G W DQ0 - DQ7
Read V
IL
V
IL
V
IH
Data Out
Write V
IL
V
IH
V
IL
Data In
Standby / Write Inhibit V
IH
X X Hi-Z
Write Inhibit X X V
IH
Data Out or Hi-Z
Write Inhibit X V
IL
X Data Out or Hi-Z
Output Disable X V
IH
X Hi-Z
Notes: 1. X = VIHor V
IL.
Table3. Operating Modes
(1)
The devices offer fast access timewith low power dissipationand requires a 5V or 3Vpower supply.
The circuit has been designed to offer a flexible microcontroller interface featuring both hardware and software handshaking with Data Polling and Toggle Bit and access to a status register. The devicessupport a 64 byte page write operation.A Software Data Protection (SDP) is also possible using the standardJEDECalgorithm.
PIN DESCRIPTION Addresses (A0-A14).
The address inputs select an 8-bit memory location during a read or write operation.
Chip Enable (E).
The chip enable input must be lowto enableall read/writeoperations.When Chip Enableis high, power consumptionis reduced.
OutputEnable (G).
The Output Enable input con­trols the dataoutput buffers and is usedto initiate readoperations.
DataIn/ Out(DQ0-DQ7).
Datais writtento orread
fromthe memorythrough the I/O pins.
WriteEnable(W).
TheWriteEnable inputcontrols
the writingof datato thememory.
OPERATIONS WriteProtection
In orderto preventdata corruptionand inadvertent writeoperations;an internalV
CC
comparatorinhib-
its Write operationsif V
CC
is below VWI (see Table 7andTable9).Accesstothememoryinwrite mode is allowed after a power-upas specifiedin Table7 and Table 9.
Read
Thedevice is accessedlike a staticRAM. WhenE and G are low with W high, the data addressedis presented on the I/O pins. The I/O pins are high impedancewhen either G or E is high.
Write
Writeoperations are initiated when both W and E are low and G is high.Thedevice supportsboth E and W controlled write cycles. The Address is latched by the falling edge of E or W which ever occurslast and the Data on the risingedge of E or W which ever occurs first. Once initiated the write operation is internally timed until completion and the status of the Data Polling and the Toggle Bit functions on DQ7 and DQ6 is controlled accord­ingly.
Page Write
Page write allows up to 64 bytes within the same page to be consecutivelylatched into the memory prior to initiating a programming cycle. All bytes must be located in a single page address, that is A14-A6 mustbe the same forall bytes;if not,the Page Write instruction is not executed. The page writecan be initiatedby any byte write operation.
A page write is composed of successive Write instructions which have to be sequenced with a specific period of time between two consecutive Write instructions, period of time which has to be smaller than the t
WHWH
value (see Table 12 and
Table13). If thisperiod of time exceedsthet
WHWH
value, the internalprogrammingcycle will start.Onceinitiated thewrite operationis internallytimed until comple­tion and the status of the Data Polling and the ToggleBit functionson DQ7and DQ6 is controlled accordingly.
DESCRIPTION
(Cont’d)
4/21
M28256
StatusRegister
Thedevicesprovide severalWriteoperationstatus flags that can beused to minimize the application writetime. These signals are available on the I/O portbits during programming cycleonly.
Data Polling bit (DQ7).
During the internal write cycle,any attemptto read the last bytewrittenwill produceon DQ7 the complementary value of the previously latched bit. Once the write cycle is fin­ished the true logic value appears on DQ7 in the readcycle.
Toggle bit (DQ6). The devices offer another way for determining when the internal write cycle is completed.During theinternal Erase/Write cycle, DQ6 will toggle from ”0” to ”1” and ”1” to ”0” (the first read value is ”0”) on subsequent attempts to read any byte of the memory. When the internal cycle is completed the toggling will stop and the data read on DQ7-DQ0is the addressed memory byte.The deviceisnow accessiblefor a newRead or Write operation.
PageLoadTimerStatusbit(DQ5).DuringaPage Writeinstruction,the devicesexpectto receivethe stream of data with a minimum period of time between each data byte. This period of time (t
WHWH
) isdefined by theon-chip Page Loadtimer whichrunning/overflowstatusis availableonDQ5. DQ5 Low indicates that the timeris running, DQ5 Highindicatesthe time-outafter which the internal writecycle will start.
Software Data Protection
The devices offer a software controlled write pro­tectionfacility thatallowstheuser to inhibitallwrite modesto the device.This can be usefulin protect­ing the memory from inadvertentwrite cycles that may occur due to uncontrolledbus conditions.
Thedevicesare shippedas standardinthe”unpro­tected” state meaning thatthe memory contents canbe changedas required by the user. After the Software Data Protection enable algorithm is is­sued, the device enters the ”Protect Mode” of operationwhere no further write commands have anyeffect on the memorycontents.
The devices remain in this mode until a valid SoftwareData Protection(SDP) disablesequence is received whereby the device reverts to its ”un­protected”state. TheSoftware Data Protection is fully non-volatile and is not changed by power on/off sequences. To enable the Software Data Protection (SDP) the device requires the user to write(with a PageWrite addressing three specific databytestothreespecificmemorylocations,each locationin a different page) as per Figure 6. Simi­larly to disable the Software Data Protection the userhas to write specific data bytes intosix differ­ent locations as per Figure 5 (with a Page Write adressingdifferent bytes in differentpages).
Thiscomplexseriesensuresthattheuserwillnever enable or disable the Software Data Protection accidentally.
To write into the devices when SDP is set, the sequence shown in Figure 6 must be used. This sequence provides an unlock key to enable the writeaction, and at the same time SDP continues to be set.
Anextension to this is whereSDPis required to be set,and data is to be written.
Using the same sequenceas above, the datacan be written and SDP is set at the same time, giving boththese actions in thesame Write cycle (t
WC
).
DQ7 DQ6 DQ5 DQ4 DQ3 DQ2 DQ1 DQ0
DP TB PLTS X X X X X
DP = Data Polling TB = ToggleBit PLTS = Page Load Timer Status
Figure4. StatusBit Assignment
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M28256
AI01698B
WRITE AAh in
Address 5555h
WRITE 55h in
Address 2AAAh
WRITE A0h in
Address 5555h
SDP is set
WRITE AAh in
Address 5555h
WRITE 55h in
Address 2AAAh
WRITE A0h in
Address 5555h
WRITE Data
to be Written in any Address
SDP ENABLE ALGORITHM
Page Write
Instruction
Page Write
Instruction
WRITE is enabled
SDP
Set
SDP
not Set
Write
in Memory
Write
Data
+
SDP Set
after tWC
Figure5. SoftwareData Protection Enable Algorithmand Memory Write
AI01699B
WRITE AAh in Address 5555h
WRITE 55h in
Address 2AAAh
WRITE 80h in
Address 5555h
Unprotected
State
after
tWC (Write Cycle time)
WRITE AAh in Address 5555h
WRITE 55h in
Address 2AAAh
WRITE 20h in
Address 5555h
Page Write
Instruction
Figure6. SoftwareData Protection Disable Algorithm
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M28256
Input Rise and FallTimes 20ns Input Pulse Voltages(M28256) 0.4V to 2.4V Input Pulse Voltages(M28256-W) 0V toV
CC
–0.3V Input and Output Timing Ref. Voltages(M28256) 0.8V to 2.0V Input and Output Timing Ref. Voltages(M28256-W) 0.5 V
CC
Table4. AC MeasurementConditions
AI02101B
4.5V to 5.5V Operating Voltage
2.7V to 3.6V Operating Voltage
VCC– 0.3V
0V
0.5 V
CC
2.4V
0.4V
2.0V
0.8V
Figure7. AC TestingInput Output Waveforms
AI02102B
OUT
CL= 100pF
CLincludes JIG capacitance
I
OL
DEVICE UNDER
TEST
I
OH
Figure8. AC TestingEquivalent LoadCircuit
Symbol Parameter Test Condition Min Max Unit
C
IN
Input Capacitance VIN=0V 6 pF
C
OUT
Output Capacitance V
OUT
=0V 12 pF
Note:
1. Sampled only, not 100% tested.
Table5. Capacitance
(1)
(TA=25°C, f = 1 MHz )
Symbol Parameter TestCondition Min Max Unit
I
LI
Input Leakage Current 0V VIN≤ V
CC
10 µA
I
LO
Output Leakage Current 0V VIN≤ V
CC
10 µA
I
CC
(1)
Supply Current (TTLinputs) E = VIL,G=VIL,f=5MHz 30 mA Supply Current (CMOS inputs) E = V
IL
,G=VIL,f=5MHz 25 mA
I
CC1
(1)
Supply Current (Standby) TTL E = V
IH
1mA
I
CC2
(1)
Supply Current (Standby) CMOS E > VCC–0.3V 100 µA
V
IL
Input Low Voltage – 0.3 0.8 V
V
IH
Input High Voltage 2 VCC+ 0.5 V
V
OL
Output Low Voltage IOL= 2.1 mA 0.4 V
V
OH
Output High Voltage IOH= –400 µA 2.4
Note: 1. All I/O’s open circuit.
Table6. Read Mode DC Characteristicsfor M28256
(T
A
=0 to 70°C or –40 to85°C;VCC= 4.5V to 5.5V)
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M28256
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