HOLDINGCURRENT = 150mA min.
LOWGATE TRIGGERINGCURRENT :
=15 mA max.
I
GT
DESCRIPTION
This device has been especially designed to
protect a subscriber line card interface (SLIC)
againsttransientovervoltage.
Positive overloads are clipped with two diodes,
while negative surges are suppressed by two
protection thyristors, their breakdown voltage
beingis referencedto the -Vbat.
This component presents a very low gate
triggering current (I
) in order to reduce the
GT
current consumption on the PC board during the
firingphase.
SIP4
SCHEMATIC DIAGRAM
COMPLIES WITHTHE FOLLOWING STANDARDS:
CCITT- K2010/700µs1kV
5/310µs25A
VDE0433
10/700µs2kV
5/200µs50A
VDE08781.2/50µs1.5kV
1/20µs40A
FCC part68
2/10µs2.5kV
2/10µs150A(*)
BELLCORE
TR-NWT-001089 : 2/10µs2.5kV
2/10µs150A(*)
10/1000µs1kV
10/1000µs50A(*)
CNET0.5/700µs1kV
0.2/310µs25A
(*)with series resistors or PTC.
TM: ASD is trademarksof SGS-THOMSON Microelectronics.
3 - PARAMETERSRELATIVE TODIODE AND PROTECTIONTHYRISTOR
SymbolTestsConditionsMin.Max.Unit
I
R
Tc= 25°C-1<V
Tc= 70°C-1<V
CV
Note 2 : See test circuit for IHand V
= - 3 VF < 1MHz
R
= - 48 VF < 1MHz
V
R
SGL
< -VbatVR= - 85 V
GL
< -VbatVR= - 85 V
GL
5
50
150
80
.
µ
µ
pF
pF
A
A
A
3/6
LCP150S
Fig. 1 : Surge peak current versus overload
duration(typicalvalues).
I(A)
TSM
30
25
20
15
10
5
0
1E-21E-11E+01E+11E+21E+3
t(s)
FUNCTIONAL HOLDING CURRENT (IH) TEST CIRCUIT = GO - NOGO TEST.
Tj initial = 25°C
R
Vbat = - 48V
SGL
V
Ipp = 10A,10/1000 s
Thisis a GO-NOGOTest which allowsto confirm the holdingcurrent (IH) levelin a functional
testcircuit.
Thistest can be performedif thereferencetest circuitcan’t be implemented.
TESTPROCEDURE:
1) Adjustthe currentlevel at the IH value by short circuitingthe AK of the D.U.T.
2) Firethe D.U.T with a surgeCurrent : Ipp = 10A, 10/1000µs.
3) TheD.U.T will come backto theOFF-Statewithin a durationof 50 msmax.
TheV
is measuredjustbeforefiring
SGL
-Vpp
4/6
APPLICATIONCIRCUIT
TypicalSLIC ProtectionConcept.
RING
GENERATOR
-V
LCP150S
BAT
LINE A
LINE B
T
E
S
T
R
E
L
A
Y
S
PTC
PTC
FUNCTIONAL DESCRIPTION
THBT200S
RING
RELAY
220
nF
LCP150S
LINEA PROTECTION:
- For positivesurgesversus GND,the diodeD1
will conduct.
- For negativesurgesversus GND, the protection deviceP1 will trigger at a voltagefixed by
the -VBATreference.
SLIC
LINEB PROTECTION:
- For surgeson LineB, the operatingmode is the
same, D2 or P2 is activated.
A capacitor(C = 220nF)can be addedclose to
the gateof theLCP15xx,in orderto speedup
the triggering.
Information furnished is believed to be accurate and reliable. However, SGS-THOMSON Microelectronics assumes no responsibility for the
consequences of use of such information nor for any infringement of patents or other rights of thirdparties which may result from its use. No
license is grantedby implication or otherwise under any patentor patent rights of SGS-THOMSON Microelectronics.Specifications mentioned
in this publication are subject to change withoutnotice.This publication supersedes and replacesall informationpreviously supplied.
SGS-THOMSONMicroelectronics productsare notauthorizedforuse as criticalcomponentsin lifesupport devices or systems withoutexpress
written approval of SGS-THOMSON Microelectronics.
Australia- Brazil - Canada - China - France - Germany - Italy - Japan - Korea - Malaysia - Malta - Morocco
The Netherlands - Singapore - Spain -Sweden - Switzerland - Taiwan - Thailand - United Kingdom -U.S.A.
6/6
:Productssuppliedinantistatictubes.
: 0.55g
1998 SGS-THOMSON Microelectronics - Printed in Italy - All rights reserved.
SGS-THOMSON MicroelectronicsGROUP OF COMPANIES
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