LLC in the United St ates and/o r other countries. Pulsar and SeaTools are either trademarks or regis
tered trademarks of Seagate Technology LLC or one of its affiliated companies in the United States
and/or other countries. All other trademarks or registered trademarks are the property of their
respective owners.
No part of this publication may be reproduced in any form without written permission of Seagate
Technology LLC. Call 877-PUB-TEK1 (877-782-8351) to request permission.
One gigabyte, or GB, equals one billion bytes and one terabyte, or TB, equals one trillion bytes.
Your computer's operating system may use a different standard of measurement and report a lower
capacity. In addition, some of the listed capacity is used for formatting and other functions, and thus
will not be available for data storage. Seagate reserves the right to change, without notice, product
offerings or specifications.
For information regarding products and services, visit http://www.seagate.com/www/en-us/about/contact_us/
Available services include:
Presales & Technical support
Global Support Services telephone numbers & business hours
Authorized Service Centers
For information regarding Warranty Support, visit
http://www.sea
For information regarding Data Recovery Services, visit http://www.i365.com
For Seagate OEM & Distribution partner portal, visit https://direct.seagate.com/portal/system
For Seagate reseller portal, visit http://spp.seagate.com
This manual describes Seagate Technology® LLC, Pulsar® XT.2 SAS (Serial Attached SCSI) drives.
Pulsar XT.2 drives support the SAS Protocol specifications to the extent described in this manual. The SAS
Interface Manual (part number 100293071) describes the general SAS characteristics of this and other Seagate SAS drives. The Self-Encrypting Drive Reference Manual, part number 100515636, describes the interface, general operation, and security features available on Self-Encrypting Drive models.
Product data communicated in this manual is specific only to the model numbers listed in this ma nual. The dat a
listed in this manual may not be predictive of future generation specifications or requirements. If you are
designing a system which will use one of the models listed or future generation products and need further
assistance, please contact your Field Applications Engineer (FAE) or our global support services group as
shown in Section 1.0.
Unless otherwise stated, the information in this manual applies to standard and Self-Encrypting Drive models.
Standard modelsStandard SED models
ST400FX0002ST400FX0012
ST200FX0002
ST100FX0002
Note.Previous generations of Seagate Self-Encrypting Drive models were called Full Disk Encryption
(FDE) models before a differentiation between drive-based encryption and other forms of encryp
tion was necessary.
-
Note.The Self-Encrypting Drive models indicated on the cover of this product manual have provisio ns for
“Security of Data at Rest” based on the standards defined by the Trusted Computing G roup (see
www.trustedcomputinggroup.org).
2Pulsar XT.2 SAS Product Manual, Rev. B
3.0Applicable standards and reference documentation
The drives documented in this manual have been developed as system peripherals to the highest standards of
design and construction. The drives depend on host equipment to provide adequate power and environment
for optimum performance and compliance with applicable industry and governmental regulations. Special
attention must be given in the areas o f safety, power distribution, shielding, audible noise control, and temperature regulation. In particular, the drives must be securely mounted to guarantee the specified performance
characteristics. Mounting by bottom holes must meet the requirements of Section 10.3.
3.1Standards
The Pulsar XT.2 family complies with Seagate standards as noted in the appropriate sections of this manual
and the Seagate SAS Interface Manual, part number 100293071.
The drives are recognized in accordance with UL 60950 and CSA 60950 as tested by UL(CSA) and EN60950
as tested by TUV.
The security features of Self-Encrypting Drive models are based on the “TCG Storage Architecture Core Specification” and the “TCG Storage Workgroup Security Subsystem Class: Enterprise_A” specification with additional vendor-unique features as noted in this product manual.
3.1.1Electromagnetic compatibility
The drive, as delivered, is designed for system integration and installation into a suitable enclosure prior to
use. The drive is supplied as a subasse mbly and is not s ubject to Subpart B o f Part 15 of the F CC Rules and
Regulations nor the Radio Interference Reg ula tio ns of the Canadian Department of Communications.
The design characteristics of the drive serve to minimize radiation when installed in an enclosure that provides
reasonable shielding. The drive is capable of meeting the Class B limits of the FCC Rules and Regulations of
the Canadian Department of Communications when properly packaged; however, it is the user’s responsibility
to assure that the drive meets the appropriate EMI requirements in their system. Shielded I/O cables may be
required if the enclosure does not provide adequate shielding. If the I/O cables are external to the enclosure,
shielded cables should be used, with the shields grounded to the enclosure and to the host controller.
3.1.1.1Electromagnetic susceptibility
As a component assembly, the drive is not required to meet any susceptibility performance requirements. It is
the responsibility of those integrating the drive within their systems to perform those tests required and design
their system to ensure that equipment operating in the same system as the drive or external to the system
does not adversely affect the performance of the drive. See Tables 8 through 10, DC power r equirements.
Pulsar XT.2 SAS Product Manual, Rev. B3
3.1.2Electromagnetic compliance
Seagate uses an independent laboratory to confirm compliance with the directives/standards for CE Marking
and C-Tick Marking. The drive was teste d in a repr esent ative system for typical applications. The selected system represents the most popular characteristics for test platforms. The system configurations include:
• Typical current use microprocessor
• Keyboard
• Monitor/display
• Printer
•Mouse
Although the test system with this Seagate model complies with the directives/standards, we cannot guarantee
that all systems will comply. The computer manufacturer or system integrator shall confirm EMC compliance
and provide the appropriate marking for their product.
Electromagnetic compliance for the European Union
If this model has the CE Marking it complies with the European Union requirements of the Electromagnetic
Compatibility Directive 2004/108/EC as put into place on 20 July 2007.
Australian C-Tick
If this model has the C-Tick Marking it complies with the Australia/New Zealand Standard AS/NZ CISPR22 an d
meets the Electromagnetic Compatibility (EMC) Framework requirements of Australia’s Spectrum Management Agency (SMA).
Korean KCC
If these drives have the Korean Communications Commission (KCC) logo, they comply with KN22 and
KN61000.
Taiwanese BSMI
If this model has the Taiwanese certification mark then it complies with Chinese National S t and ard, CNS13438.
3.1.3European Union Restriction of Hazardous Substances (RoHS)
The European Union Restriction of Hazardous Substances (RoHS) Directive restricts the presence of chemical
substances, including Lead (Pb), in electronic products effective July 2006.
A number of parts and materials in Seagate products are procured from external suppliers. We rely on the representations of our suppliers regarding the presence of RoHS substances in these parts and materials. Our
supplier contracts require compliance with our ch emical substance restrictions, and our suppliers document
their compliance with our requirements by providing material conten t declarations for all p arts and materials for
the drives documented in this publication. Current supplier declarations include disclosure of the inclusion of
any RoHS-regulated substance in such parts or materials.
Seagate also has internal systems in place to ensure on going compliance with the RoHS Directive and all laws
and regulations which restrict chemical content in electronic products. These systems include st andard ope rating procedures that ensure that restricted substances are not utilized in our manufacturing operations, laboratory analytical validation testing, and an internal auditing process to ensure that all standard operating
procedures are complied with.
4Pulsar XT.2 SAS Product Manual, Rev. B
3.1.4China Restriction of Hazardous Substances (RoHS) Directive
This product has an Environmental Protection Use Period (EPUP) of 20 years. The following
table contains information mandated by China's "Marking Requirements for Control of Pollution
Caused by Electronic Information Products" Standard.
"O" indicates the hazardous and toxic substa nce content of the p art (at the homogenou s material level) is lower
than the threshold defined by the China RoHS MCV Standard.
"X" indicates the hazardous and toxic substance content of the part (at the homogenous material level) is over
the threshold defined by the China RoHS MCV Standard.
3.2Reference documents
SCSI Commands Reference ManualSeagate part number: 100293068
SAS Interface ManualSeagate p
ANSI SAS Documents
SFF-82232.5” Drive Form Factor with Serial Connector
SFF-8460HSS Backplane Design Guidelines
SFF-8470Multi Lane Copper Connector
SFF-8482SAS Plug Connector
ANSI INCITS.xxx Serial Attached SCS
ISO/IEC 14776-xxxSCSI Architecture Model-3 (SAM-4) Standard (T10/1683-D)
ISO/IEC 14776-xxxSCSI Primary Commands-3 (SPC-4) Standard (T10/1731- D)
ISO/IEC 14776-xxxSCSI Block Commands-3 (SBC-3) Standard ( T10/1799-D)
ANSI Small Computer System In
Trusted Computing Group (TCG) Documents (apply
Self-Encrypting Drives Reference M
JEDEC Standards
JESD218 - Solid-State Drive (SSD) Requirements and Endurance Test Method
JESD219 - Solid-State Drive (SSD) Endurance
art number: 100293071
I (SAS-2) Standard (T10/1760-D)
Workloads
In case of conflict between this document and any re
Pulsar XT.2 SAS Product Manual, Rev. B5
ferenced document, this document takes precedence.
4.0General description
Pulsar XT.2 drives provide high performance, high capacity data storage for a variety of systems with a Serial
Attached SCSI (SAS) interface. The Serial Attached SCSI interface is designed to meet next-generation computing demands for performance, scalability, flexibility and high-density storage requirements.
Pulsar XT.2 drives are random access storage devices designed to support the Serial Attached SCSI Protocol
as described in the ANSI specifications, this document, and the SAS Interface Manual (part number
100293071) which describes the general interface characteri stics of this drive. Pulsar XT.2 drives are classified
as intelligent peripherals and provide level 2 conformance (highest level) with the ANSI SCSI-1 standard. The
SAS connectors, cables and electrical interface are compatible with Serial ATA (SATA), giving future users the
choice of populating their systems with either SAS or SATA drives. This allows users to continue to leverage
existing investment in SCSI while gaining a 6Gb/s ser ial da ta transfer rate .
The Self-Encrypting Drive models indicated on the cover of this product manual have provisions for “Security
of Data at Rest” based on the st andards defined by the Trusted Computing Group (see www.trustedcomputinggroup.org).
Note.Never disassemble and do not attempt to service items in the enclosure. Th e drive does not cont ain
user-replaceable parts. Opening for any reason voids the drive warranty.
4.1Standard features
Pulsar XT.2 SAS drives have the following standard features:
• Integrated dual port SAS controller supporting the SCSI protocol
• Support for SAS expanders and fanout adapters
• Firmware downloadable using the SAS interface
• 128 - deep task set (queue)
• Supports up to 32 initiators
• Jumperless configuration
• User-selectable logical block size (512, 520, 524, 528, 4096, 4160, 4192, or 4224 bytes per logical block)
• Industry standard SFF 2.5-inch dimensions
• ECC maximum burst correction length of 90 bits
• No preventive maintenance or adjustments required
• Self diagnostics performed when power is applied to the drive
• Vertical, horizontal, or top down mounting
• Drive Self Test (DST)
• Background Media Scan (BMS)
• Parallel flash access channels
• Power loss data protection
• Thin Provisioning with Block Unmap Support
• Silent operation
• Lifetime Endurance Management
Pulsar XT.2 SAS Self-Encrypting Drive models have the following additional features:
6Pulsar XT.2 SAS Product Manual, Rev. B
• Automatic data encryption/decryption
• Controlled access
• Random number generator
• Drive locking
• 16 independent data bands
• Cryptographic erase of user data for a drive that will be repurposed or scrapped
• Authenticated firmware download
4.2Media description
The media used on the drive consists of Single Layer Cell (SLC) NAND Flash for improved reliability and performance.
4.3Performance
• Programmable multi-segmentable cache buffer
• 600MB/s maximum instantaneous data transfers.
• Background processing of queue
• Non-Volatile Write Cache
Note.There is no significant performance difference between Self-Encrypting Drive and standard (non-
Self-Encrypting Drive) models.
4.4Reliability
• Annualized Failure Rate (AFR) of 0.44%
• Mean time between failures (MTBF ) of 2,00 0 ,0 00 hou rs
• Incorporates industry-standard Self-Monitoring Analysis and Reporting Technology (S.M.A.R.T.)
• 5-year warranty
Pulsar XT.2 SAS Product Manual, Rev. B7
4.5Formatted capacities
Standard OEM models are formatted to 512 bytes per block. The block size is selectable at format time and
must be a multiple of 4 bytes. Users having the necessary equipment may modify the data block size before
issuing a FORMAT UNIT command and obtain different formatted capacities than those listed.
To provide a stable target capacity environment and at the same time provide users with flexibility if they
choose, Seagate recommends product planning in one of two modes:
Seagate designs specify capacity points at certain block sizes that Seagate guarantees current and future
products will meet. We recommend customers use this capacity in project planning, as it ensures a stable
operating point with backward and forward compatibility from generation to generation. The current guaranteed
operating points for this product are shown below. The Capacity stated is identical when the drive is formatted
with or without PI enabled.
Using the MODE SELECT command, the drive can change its capacity to something less than maximum. See
the MODE SELECT (6) parameter list table in the SAS Interface Manual, part number 100293071. A value of
zero in the Number of Blocks field indicates that the drive will not change the capacity it is currently formatted
to have. A number other than zero and less than the maximum number of LBAs in the Number of Blocks field
changes the total drive capacity to the value in the Number of Blocks field. A value greater than the maximum
number of LBAs is rounded down to the maximum capacity.
4.7Factory-installed options
OEMs may order the following items which are incorporated at the manufacturing facility during production or
packaged before shipping. Some of the options available are (not an exhaustive list of possible options):
• Other capacities can be ordered depending on sparing scheme and LBA size requested.
• Single-unit shipping pack. The drive is normally shipped in bulk packaging to provide ma ximum protection
against transit damage. Units shipped individually require additional protection as p rovided by the sin gle unit
shipping pack. Users planning single unit distribution should specify this option.
•The Safety and Regulatory Agency Specifications, part number 75789512, is usually included with each
standard OEM drive shipped, but extra copies may be ordered.
8Pulsar XT.2 SAS Product Manual, Rev. B
4.8Thin Provisioning
4.8.1Logical Block Provisioning
The drive is designed with a feature called Thin Provisioning. Thin Provisioning is a technique which does not
require Logical Blocks to be associated to Physical Blocks on the storage med ium un til su ch a time as neede d.
The use of Thin Provisioning is a major factor in SSD products because it reduces the amount of wear leveling
and garbage collection that must be performed. The result is an incre ase in the product s endur ance. For more
details on Logical Block Provisioning and Thin Provisioning, Reference the SBC-3 document provided by the
T-10 committee.
4.8.2Thin Provisioning capabilities
The level of Thin Provisioning support may vary by product model. Devices that support Thin Provisioning are
allowed to return a default data pattern for read re quest s made to Logical Blo cks that have not been mapped to
Physical Blocks by a previous WRITE command.
In order to determine if Thin Provisioning is supported and what features of it are implemented requires th e
system to send a READ CAPACITY 16 (9Eh) command to the drive. Thin Provisioning and the READ
CAPACITY 16 (9Eh) command is defined in the Seagate SCSI Command Reference 100293068.
A logical block provisioning management enabled (LBPME) bit set to one indicates that the logical unit implements logical block provisioning management. An LBPME bit set to zero indicates that the logical unit is fully
provisioned and does not implement logical block provisioning management.
A logical block provisioning read zeros (LBPRZ) bit set to one indicates that, for an unmapped LBA specified
by a read operation, the device server sends user data with all bits set to zero to the data-in buffer. An LBPRZ
bit set to zero indicates that, for an unmapped LBA specified by a read operation, the device server may send
user data with all bits set to any value to the data-in buffer.
4.8.3UNMAP
The UNMAP command requests that the device server break the association of a specific Logical Block
address from a Physical Block, thereby freeing up the Physical Block from use and no longer requiring it to
contain user data. An unmapped block will respond to a READ command with data that is determined by the
setting of the LBPRZ bit in the READ CAPACITY parameter data.
4.8.4FORMAT UNIT command
A device which supports Thin Provisioning will be capable of performing a SCSI FORMAT UNIT command
which allocates Logical Blocks Addres ses that are not linked to Physical Block Locations. A FORMAT command will cause all LBAs to become unmapped.
4.8.5Protection Information (PI) and Security (SED)
The requirements in this section apply to any device which supports LBA unmapping.
In SCSI devices, umapped LBAs are defined as part of the Thin Pro visioning model. Sup port of the Thin Pro vi-
sioning model is indicated by the LBPME bit having a value of '1' in the READ CAPACITY (16) parameter data.
Pulsar XT.2 SAS Product Manual, Rev. B9
When a region of LBA's are erased via cryptographic erase, as part of the erase, the drive shall unmap those
LBAs.
If the host attempts to access an unmapped or trimmed LBA, the drive shall r eturn scrambled da t a. For a given
LBA, the data shall be identical from access to access, until that LBA is either updated with actual data from
the host or that LBA is cryptographically erased. The drive shall r eport a value of '0 ' in the LBPRZ field r eturned
in the READ CAPACITY (16) parameter data.
If the host attempts to access an unmapped LBA on a drive that has been formatted with Protection Information (PI), the drive shall return scrambled PI data for that LBA. Depending on the value of the RDPROTECT
field in the data-access command CDB, this may result in the drive returning a standard PI error to the host.
If the host reduces the addressable capacity of the drive via a MODE SELECT command, the drive shall
unmap or trim any LBA within the inaccessible region of the device.
Additionally, an UNMAP command is not permitted on a locked band.
Table 3: PI and SED Drive Configuration
Drive Configuration
StandardSED
PI SettingDisabledEnabledDisabledEnabled
PROT_EN bit0101
LBPME bit1111
LBPRZ bit1100
PI Check RequestedN/AYesNoN/AYesNo
DATA Returned for
Thin Provisioned LBA
PI Returned for
Thin Provisioned LBA
PI Check PerformedN/ANoNoN/AYesNo
Error reported to HostNoNoNoNoYesNo
0x000x000x00RandomNoneRandom
None0xFF0xFFNoneNone
Scrambled
PI data
10Pulsar XT.2 SAS Product Manual, Rev. B
5.0Performance characteristics
This section provides detailed information concerning performance-related characteristics and features of Pulsar XT.2 drives.
Note.Data provided is based on format at 512-bytes.
5.1Internal drive characteristics
ST400FX0002ST200FX0002ST100FX0002
ST400FX0012
Drive capacity400200100GB (formatted, rounded off value)
Flash Memory TypeNAND SLC
Emulated LBA Size512, 520, 524, 528, 4096, 4160, 4192, or 4224
Native Programmable Page Size4096 User Bytes
Default Transfer Alignment Offset 0
5.2Performance characteristics
See Section 1 1.4.1, "SAS physical interface" and the SAS Interface Manual ( p ar t numbe r 1002930 71) for a dditional timing details.
5.2.1Access time
Access measurements are taken with nominal power at 25°C ambient temperature. All times are measured
using drive diagnostics. The specifications in the table below are defined as follows:
• Page-to-page access time is an average of all possible page-to-page accesses in both directions for a
sequentially preconditioned drive.
• Average access time is a true statistical random average of at least 5000 measurements of accesses
between programmable pages on a randomly prec onditioned drive.
Table 4: Typical Access Time (µsec)
400GB
ReadWriteReadWrite
Average
3
Page to Page268133207121
Average Latency247188
Typical
268133208121
1,2
100/200 GB
1,2
1.Execution time measured from receipt of the Command to the Response.
2.Assumes no errors.
3.Typical access times are measured under nomina l conditions of temperature, voltage, and horizontal orientation as
measured on a representative sample of drives.
Note.These drives are designed to provide the highest possible performance under typical conditions.
However, due to the nature of Flash memory technologies there are many factors that can result in
2.
values different than those stated in this specification
Pulsar XT.2 SAS Product Manual, Rev. B11
5.2.2FORMAT UNIT command execution time for 512-byte LBA’s (minutes)
The device may be formatted as either a Thin Provisioned
device or a Fully Provisioned device. The default
format is Thin Provisioned and is recommended for most applications. Thin Provisioning provides the most
flexibility for the device to manage the flash medium to maximize endurance.
Maximum Burst Transfer Rate600MB/s
Peak sequential 128KB read/write data transfer rate (MB/s max)[1]360/300
Sustained sequential 128KB read/write dat
Peak 4KB random read/write command rate (IOPs)[2]48,000/22,000
Sustained 4KB random read/write command rate (IOPs)[2]48,000/
Sustainable 4KB Random combined IOPS for 5 year Endurance
(65%/35% R/W, 70% Duty Cycle)
[1]Testing performed at Queue Depth = 32, Sequentiall
[2]Testing performed at Queue Depth = 32, Randomly
[3]Testing performed at Queue Depth = 32, Non-Preconditioned drive, using IOMeter 2006.7.27.
a transfer rate (MB/s)[1]300/300300/200300/100
,000
22
[3]31,00031,00031,000
y Preconditioned drive, using IOMeter 2006.7.27.
Preconditioned drive, using IOMeter 2006.7.27.
48,000/
16,000
48,000/
8000
Note.IOMeter is available at http://www.iometer.org/ or http://sourceforge.net/projects/iometer/.
IOMeter is licensed under the Intel Open Source Licen
se and the GNU General Public License. Intel
does not endorse any IOMeter results.
Peak performance is defined as the typical best case performance
that the product will be able to
achieve when the product is preconditioned as mentioned and host commands are aligned on 4KB
boundaries.
Sustained performance is defined as the typical worst case
performance that the product will be able to
achieve when the product is precon ditioned as mentioned and host commands are aligned on 4KB boundaries. Write values also take into account the worst case performance throttling that may occur to ensure the
product meets specified reliability specifications.
12Pulsar XT.2 SAS Product Manual, Rev. B
Due to the nature of Flash memory technolo gies the re ar e many factors that can result in values different than
those stated in this specification. Some discrepancies can be caused by bandwidth limitations in the host
adapter, operating system, or driver limitations. It is not the inten t of this ma nua l to cover all possible causes of
performance discrepancies.
When evaluating performance of SSD devices, it is recommended to measure performance of the device in a
method that resembles the targeted application using real world data and workloads. Test time should also be
adequately large to ensure that sustainable metrics and measures are obtained.
5.3Start/stop time
The drive accepts the commands listed in the SAS Interface Manual less than 3 seconds after DC power has
been applied.
If the drive receives a NOTIFY (ENABLE SPINUP) primitive through either port and has not received a START
STOP UNIT command with the START bit equal to 0, the drive becomes ready for normal operations within 13
seconds (excluding the error recovery procedure).
If the drive receives a START STOP UNIT command with the START bit equal to 0 before receiving a NOTIFY
(ENABLE SPINUP) primitive, the drive waits for a START ST OP UNIT command with the START bit equal to 1.
After receiving a START STOP UNIT command with the START bit equal to 1, the drive waits for a NOTIFY
(ENABLE SPINUP) primitive. After receiving a NOTIFY (ENABLE SPINUP) primitive through either port, the
drive becomes ready for normal operations within 13 seconds (excluding the error recovery procedure).
If the drive receives a START STOP UNIT command with the START bit and IMMED bit equal to 1 and does
not receive a NOTIFY (ENABLE SPINUP) primitive within 5 seconds, the drive fails the START STOP UNIT
command.
The START STOP UNIT command may be used to command the drive to stop. Stop time is 3 seconds (maximum) from removal of DC power. SCSI stop time is 3 seconds. There is no power control switch on the drive.
5.4Cache control
All default cache mode parameter values (Mode Page 08h) for standard OEM versions of this drive family are
given in Table 17 and 18.
5.4.1Caching write data
Write caching is a write operation by the drive that make s use of a drive b uffer storage area wher e the da ta to
be written to the medium is stored while the drive performs the WRITE command.
If the number of write data logical blocks exceed the size of the segme nt being written into, when the end of the
segment is reached, the data is written into the beginning of the same cache segment, overwriting the da ta that
was written there at the beginning of the operation; however, the drive does not overwrite data that has not yet
been written to the medium.
If write caching is enabled (WCE=1), then the drive may return Good status on a WRITE command after the
data has been transferred into the cache, but before the data has been written to the medium. If an error
occurs while writing the data to the medium, and Good status has already been returned, a deferred error will
be generated.
Data that has not been written to the medium is protected by a back up power source which provides the ability
of the data to be written to non-volatile medium in the event of an unexpected power loss.
The SYNCHRONIZE CACHE command may be used to force the drive to write all cached write data to the
medium. Upon completion of a SYNCHRONIZE CACHE command, all data received from previous WRITE
commands will have been written to the medium. Tables 16, 17 and 18 show the mode default settings for the
drive.
Pulsar XT.2 SAS Product Manual, Rev. B13
6.0Reliability specifications
The following reliability specifications assume correct host and drive operational interface, including all interface timings, power supply voltages, environmental requirements and drive mounting constraints.
Read Error Rates
Unrecovered DataLess than 1 LBA in 1016 bits transferred
Miscorrected DataLess than 1 LBA in 10
Interface error rate:Less than 1 erro r in 10
Mean Time Between Failure (MTBF):2,000,000 hours
Annualized Failure Rate (AFR):0.44%
Preventive maintenance:None required
Typical Data Retention with
Power removed (at 40C)
Endurance Rating:
1. Error rate specified with automatic retries and data correction with ECC enabled and all flaws reallocated.
2. As NAND Flash devices age with use, the capability of the media to retain a programmed value begins to deteriorate.
This deterioration is affected by the number of times a particular memory cell is programmed and subsequently erased.
When a device is new, it has a powered off data retention capability of up to several years. With use the retention capability of the device is reduced. Temperature also has an effect on how long a Flash component can retain its programmed value with power removed. At high temperature the retention capabilities of the device are reduced. Data
retention is not an issue with power applied to the SSD. The SSD drive contains firmware and hardware features that
can monitor and refresh memory cells when power is applied.
3. Endurance rating is the expected amount of host data that can be written by product when subjected to a specified workload at a specified operating and storage temperature. For the specific workload to achieve this level of endurance,
please reference JEDEC Specification JESD218. TBW is defined as 1x10^12 Bytes.
1
21
bits transferred
12
bits transferred
2
3
3 months
Method 1: Full drive writes per day 35
Method 2: TBW (per JEDEC JESD218 400GB = 24,800 TB
200GB = 12,400 TB
100GB = 6,200 TB
6.1Error rates
The error rates stated in this manual assume the following:
• The drive is operated in accordance with this manual using DC power as defined in paragraph 7.3, "DC
power requirements."
• Errors caused by host system failures are excluded from error rate computations.
• Assume random data.
• Default OEM error recovery settings are applied. This includes AWRE, ARRE, full read retries, full write
retries and full retry time.
14Pulsar XT.2 SAS Product Manual, Rev. B
6.1.1Unrecoverable Errors
An unrecoverable data error is def ined as a failure of the d rive to recover data from the media. These errors
occur due to read or write problems. Unrecoverable data errors are only detected during read operations, but
not caused by the read. If an unrecoverable data error is detected, a MEDIUM ERROR (03h) in the Sense Key
will be reported. Multiple unrecoverable data errors resulting from the same cause are treated as 1 error.
6.1.2Interface errors
An interface error is defined as a failure of the receiver on a port to recover the data as transmitted by the
device port connected to the receiver. The error may be detected as a running disparity error, illegal code, loss
of word sync, or CRC error.
6.2Endurance Management
Customer satisfaction with Solid State Drives can be directly related to the internal algorithms which an SSD
uses to manage the limited number of Program-Erase (PE) cycles that NAND Flash can withstand. These
algorithms consist of Wearleveling, Garbage Collection, Write Amplification, Unmap, Data Retention, Lifetime
Endurance Management.
6.2.1Wear Leveling
Wear Leveling is a technique used by the drive to ensure that all Flash cells are written to or exercised as
evenly as possible to avoid any hot spots where some cells are used up faster than other locations. Wear Leveling is automatically managed by the drive and requires no user interaction. The Seagate algorithm is tuned to
operate only when needed to ensure reliable product operation.
6.2.2Garbage Collection
Garbage Collection is a technique used by the drive to consolidate valid user data into a common cell range
freeing up unused or obsolete locations to be erased and used for future storage needs. Garbage Collection is
automatically managed by the drive and requires no user interaction. The Seagate algorithm is tuned to operate only when needed to ensure reliable product operation.
6.2.3Write Amplification
While Write Amplification is not an algorithm, it is a major characteristic of SSD's that must be accounted for by
all the algorithms that the SSD implements. The Write Amplification Factor of an SSD is defined as the ratio of
Host/User data requested to be written to the actual amount of data written by the SSD internal to account for
the user data and the housekeeping activities such as Wear Leveling and Garbage Collection. The Write
Amplification Factor of an SSD can also be directly affected by the characte ristics of the host dat a being sent to
the SSD to write. The best Write Amplification Factor is achieved for data that is written in sequ ential LBA's that
are aligned on 4KB boundaries. The worst case Write Amp lification Factor typically occurs for randomly written
LBA's of transfer sizes that are less than 4KB and that originate on LBA's that are not on 4KB boundaries.
6.2.4UNMAP
A new SCSI command has been added to the SSD as part of the Thin Provisioning feature set. Use of the
UNMAP command reduces the Write Amplification Factor of the drive during housekeeping tasks such as
Wear Leveling and Garbage Collection. This is accomplished because the drive does not need to retain data
which has been classified by the host as obsolete.
Pulsar XT.2 SAS Product Manual, Rev. B15
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