SAMSUNG K9F1G08U0A Technical data

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K9F1G08R0A
K9F1G08U0A

K9K2G08U1A FLASH MEMORY

Document Title

128M x 8 Bit / 256M x 8 Bit NAND Flash Memory

Revision History

Revision No

0.0

0.1

0.2

0.3

0.4

0.5

0.6

0.7

History

1. Initial issue

1. The tADL(Address to Data Loading Time) is added.

- tADL Minimum 100ns (Page 11, 23~26)

-

tADL is the time from the WE rising edge of final address cycle

to the WE

2. Added Addressing method for program operation

1. Add the Protrusion/Burr value in WSOP1 PKG Diagram.

1. PKG(TSOP1, WSOP1) Dimension Change

1. Technical note is changed

2. Notes of AC timing characteristics are added

3. The description of Copy-back program is changed

4. Voltage range is changed

-1.7V~1.95V -> 1.65V~1.95V

5. Note2 of Command Sets is added

1. CE

1. The value of tREA for 3.3V device is changed.(18ns->20ns)

2. EDO mode is added.

1. The flow chart to creat the initial invalid block table is cahnged.

rising edge of first data cycle at program operation.

access time : 23ns->35ns (p.11)

Draft Date

Aug. 24. 2003
Jan. 27. 2004

Apr. 23. 2004

May. 19. 2004

Jan. 21. 2005

Feb. 14. 2005

May. 24. 2005

May 6. 2005

Remark

Advance
Preliminary

Preliminary

Preliminary

Preliminary

Preliminary

The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right

to change the specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions about device. If you have
any questions, please contact the SAMSUNG branch office near your office.

1

K9F1G08R0A
K9F1G08U0A

K9K2G08U1A FLASH MEMORY

128M x 8 Bit /256M x 8 Bit NAND Flash Memory

PRODUCT LIST

Part Number Vcc Range Organization PKG Type

K9F1G08R0A 1.65 ~ 1.95V

K9F1G08U0A-Y,P

K9F1G08U0A-V,F WSOP1

K9K2G08U1A-I 52-ULGA

2.7 ~ 3.6V

FEATURES

• Voltage Supply

-1.8V device(K9F1G08R0A): 1.65V~1.95V

-3.3V device(K9F1G08U0A): 2.7 V ~3.6 V

• Organization

- Memory Cell Array : (128M + 4,096K)bit x 8bit

- Data Register : (2K + 64)bit x8bit

- Cache Register : (2K + 64)bit x8bit

• Automatic Program and Erase

- Page Program : (2K + 64)Byte

- Block Erase : (128K + 4K)Byte

• Page Read Operation

- Page Size : 2K-Byte

- Random Read : 25µs(Max.)

- Serial Access : 30ns(Min.) - 3.3v device
50ns(Min.) -1.8v device

• Fast Write Cycle Time

- Program time : 200µs(Typ.)

- Block Erase Time : 2ms(Typ.)

• Command/Address/Data Multiplexed I/O Port

• Hardware Data Protection

- Program/Erase Lockout During Power Transitions

• Reliable CMOS Floating-Gate Technology

- Endurance : 100K Program/Erase Cycles

- Data Retention : 10 Years

• Command Register Operation

• Cache Program Operation for High Performance Program

• Intelligent Copy-Back Operation

• Unique ID for Copyright Protection

• Package :

- K9F1G08U0A-YCB0/YIB0
48 - Pin TSOP I (12 x 20 / 0.5 mm pitch)

- K9F1G08U0A-VIB0
48 - Pin WSOP I (12X17X0.7mm)

- K9F1G08U0A-PCB0/PIB0
48 - Pin TSOP I (12 x 20 / 0.5 mm pitch)- Pb-free Package

- K9F1G08U0A-FIB0
48 - Pin WSOP I (12X17X0.7mm)- Pb-free Package
* K9F1G08U0A-V,F(WSOPI ) is the same device as
K9F1G08U0A-Y,P(TSOP1) except package type.

- K9K2G08U1A-ICB0/IIB0
52-ULGA (12X17X0.65mm)

X8

Only available in MCP

TSOP1

GENERAL DESCRIPTION

Offered in 128Mx8bit the K9F1G08X0A is 1G bit with spare 32M bit capacity. Its NAND cell provides the most cost-effective solution
for the solid state mass storage market. A program operation can be performed in typical 200µs on the 2112-byte page and an erase
operation can be performed in typical 2ms on a 128K-byte block. Data in the data page can be read out at 30ns(50ns with 1.8V
device) cycle time per byte. The I/O pins serve as the ports for address and data input/output as well as command input. The on-chip
write controller automates all program and erase functions including pulse repetition, where required, and internal verification and
margining of data. Even the write-intensive systems can take advantage of the K9F1G08X0A′s extended reliability of 100K program/
erase cycles by providing ECC(Error Correcting Code) with real time mapping-out algorithm. The K9F1G08X0A is an optimum solu­tion for large nonvolatile storage applications such as solid state file storage and other portable applications requiring non-v ol at il it y.

2

K9F1G08R0A
K9F1G08U0A

PIN CONFIGURATION (TSOP1)

PACKAGE DIMENSIONS

48-PIN LEAD/LEAD FREE PLASTIC THIN SMALL OUT-LINE PACKAGE TYPE(I)

K9K2G08U1A FLASH MEMORY

K9F1G08X0A-YCB0,PCB0/YIB0,PIB0

X8 X8

N.C

N.C
N.C
N.C
N.C
N.C
N.C
R/B
RE

CE
N.C
N.C
Vcc
Vss
N.C
N.C

CLE
ALE

WE

WP
N.C
N.C
N.C
N.C
N.C

1
2
3
4
5
6
7
8

9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24

48-pin TSOP1

Standard Type
12mm x 20mm

48

N.C

47

N.C

46

N.C

45

I/O7

44

I/O6

43

I/O5

42

I/O4

41

N.C

40

N.C

39

N.C

38

Vcc

37

Vss

36

N.C

35

N.C

34

N.C

33

I/O3

32

I/O2

31

I/O1

30

I/O0

29

N.C

28

N.C

27

N.C

26

N.C

25

48 - TSOP1 - 1220AF

+0.07

-0.03

#1

0.20

+0.003

-0.001

+0.07

-0.03

0.16

0.008

0.50

0.0197
#24

TYP

0.25

0.010

0~8°

20.00±0.20

0.787±0.008

18.40±0.10

0.724±0.004

#48

#25

Unit :mm/Inch

MAX

0.10

0.004

0.25

0.010

()

MAX

12.00

0.472

0.488

12.40

1.00±0.05

0.039±0.002

1.20
MAX

+0.075

0.035
+0.003

-0.001

0.125

0.005

0.047

0.05

0.002

MIN

0.45~0.75

0.018~0.030

0.50

()

0.020

3

K9F1G08R0A
K9F1G08U0A

PIN CONFIGURATION (WSOP1)

PACKAGE DIMENSIONS

48-PIN LEAD PLASTIC VERY VERY THIN SMALL OUT-LINE PACKAGE TYPE (I)

K9K2G08U1A FLASH MEMORY

K9F1G08U0A-VIB0,FIB0

N.C
N.C

DNU

N.C
N.C
N.C
R/B
RE

CE

DNU

N.C
Vcc
Vss
N.C

DNU

CLE
ALE

WE
WP
N.C
N.C

DNU

N.C
N.C

1
2
3
4
5
6
7
8

9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24

48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25

N.C
N.C
DNU
N.C
I/O7
I/O6
I/O5
I/O4
N.C
DNU
N.C
Vcc
Vss
N.C
DNU
N.C
I/O3
I/O2
I/O1
I/O0
N.C
DNU
N.C
N.C

48 - WSOP1 - 1217F

#1

+0.07

-0.03

0.16

+0.07

-0.03

0.20

0.50TYP
(0.50±0.06)

#24

15.40±0.10

#48

#25

0.70 MAX

0.58±0.04

(0.01Min)

Unit :mm

12.00±0.10

12.40MAX

17.00±0.20

+0.075

-0.035

0.10

0

°

~

8

°

0.45~0.75

4

K9F1G08R0A
K9F1G08U0A

PIN CONFIGURATION (ULGA)

K9K2G08U1A FLASH MEMORY

K9K2G08U1A-ICB0/IIB0

AB

CDE

G

F

L

M

K

H

J

N

7

6

5

4

3

2

1

PACKAGE DIMENSIONS

52-ULGA (measured in millimeters)

Top View

12.00±0.10

#A1

NC

NC

Vcc

/CE1

CLE1

Vss

NC

NC

NC NC

NC

/RE1

/RB2

/RE2

/RB1

/CE2

CLE2

/WE1

ALE2

ALE1

/WE2

NC

NC

Vss

/WP1

IO7-2

/WP2

IO0-1

IO0-2

IO7-1

IO1-1

IO6-2

IO6-1

IO2-1

IO1-2

NC

IO5-1

IO3-1

IO5-2

IO4-1

Vss

IO2-2

NC

NC

NC

Vcc

IO4-2

IO3-2

Vss

NC

NC

NC

Bottom View

12.00±0.10

1.00

10.00

1.00

2.00

7 6 5 4 3 2 1

(Datum A)

A

B

C

(Datum B)

17.00±0.10

D

E

F

G

H

J

K

L

M

N

1.00

1.00

A

B

1.30

1.00

2.50

12.00

17.00±0.10

1.00

2.50

1.00

2.00

0.50

0.10 C

12-∅1.00±0.05

Side View

17.00

±

0.10

0.1

ABCM

∅

41-∅0.70±0.05

0.1

∅

ABCM

.)

Max

(

0.65

5

K9F1G08R0A
K9F1G08U0A

PIN DESCRIPTION

Pin Name Pin Function

0 ~ I/O7

I/O

CLE

K9K2G08U1A FLASH MEMORY

DATA INPUTS/OUTPUTS

The I/O pins are used to input command, address and data, and to output data during read operations. The I/
O pins float to high-z when the chip is deselected or when the outputs are disabled.

COMMAND LATCH ENABLE

The CLE input controls the activating path for commands sent to the command register. When active high,
commands are latched into the command register through the I/O ports on the rising edge of the WE

signal.

ALE

CE

RE

WE

WP

R/B

Vcc

Vss GROUND

N.C

ADDRESS LATCH ENABLE

The ALE input controls the activating path for address to the internal address registers. Addresses are
latched on the rising edge of WE

CHIP ENABLE

The CE
the device does not return to standby mode.

READ ENABLE

The RE
tREA after the falling edge of RE

WRITE ENABLE

The WE
the WE

WRITE PROTECT

The WP
generator is reset when the WP

READY/BUSY OUTPUT

The R/B
random read operation is in process and returns to high state upon completion. It is an open drain output and
does not float to high-z condition when the chip is deselected or when outputs are disabled.

POWER

V

CC is the power supply for device.

NO CONNECTION

Lead is not internally connected.

with ALE high.

input is the device selection control. When the device is in the Busy state, CE high is ignored, and

input is the serial data-out control, and when active drives the data onto the I/O bus. Data is valid

which also increments the internal column address counter by one.

input controls writes to the I/O port. Commands, address and data are latched on the rising edge of

pulse.

pin provides inadvertent write/erase protection during power transitions. The internal high voltage

pin is active low.

output indicates the status of the device operation. When low, it indicates that a program, erase or

NOTE : Connect all VCC and VSS pins of each device to common power supply outputs.
Do not leave V

CC or VSS disconnected.

6

K9F1G08R0A
K9F1G08U0A

Figure 1-1. K9F1G08X0A Functional Block Diagram

VCC

SS

V

K9K2G08U1A FLASH MEMORY

A12 - A27

A0 - A11

Command

CE
RE
WE

X-Buffers
Latches
& Decoders

Y-B uf fers
Latches
& Decoders

Command

Register

Control Logic

& High Voltage

Generator

CLE

ALE PRE

WP

Figure 2-1. K9F1G08X0A Array Organization

1024M + 32M Bit

NAND Flash

ARRAY

(2048 + 64)Byte x 65536

Data Register & S/A

Cache Register

Y-G ating

I/O Buffers & Latches

Global Buffers

1 Block = 64 Pages
(128K + 4k) Byte

Output

Driver

VCC
VSS

I/0 0

I/0 7

64K Pages
(=1,024 Blocks)

2K Bytes 64 Bytes

Page Register

2K Bytes

I/O 0 I/O 1 I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7

1st Cycle A

2nd Cycle A8 A9 A10 A11 *L *L *L *L

3rd Cycle A

4th Cycle A20 A21 A22 A23 A24 A25 A26 A27

NOTE : Column Address : Starting Address of the Register.

* L must be set to "Low".

* The device ignores any additional input of address cycles than required.

0 A1 A2 A3 A4 A5 A6 A7

12 A13 A14 A15 A16 A17 A18 A19

1 Page = (2K + 64)Bytes
1 Block = (2K + 64)B x 64 Pages
= (128K + 4K) Bytes
1 Device = (2K+64)B x 64Pages x 1024 Blocks
= 1056 Mbits

8 bit

I/O 0 ~ I/O 7

64 Bytes

Column Address

Column Address

Row Address
Row Address

7

K9F1G08R0A
K9F1G08U0A

Product Introduction

The K9F1G08X0A is a 1056Mbit(1,107,296,256 bit) memory organized as 65,536 rows(pages) by 2112x8 columns. Spare 64 col­umns are located from column address of 2048~2111. A 2112-byte data register and a 2112-byte cache register are serially con­nected to each other. Those serially connected registers are connected to memory cell arrays for accommodating data transfer
between the I/O buffers and memory cells during page read and page program operations. The memory array is made up of 32 cells
that are serially connected to form a NAND structure. Each of the 32 cells resides in a different page. A block consists of two NAND
structured strings. A NAND structure consists of 32 cells. Total 1081344 NAND cells reside in a block. The program and read opera­tions are executed on a page basis, while the erase operation is executed on a block basis. The memory array consists of 1024 sep­arately erasable 128K-byte blocks. It indicates that the bit by bit erase operation is prohibited on the K9F1G08X0A.

The K9F1G08X0A has addresses multiplexed into 8 I/Os. This scheme dramatically reduces pin counts and allows system upgrades
to future densities by maintaining consistency in system board design. Command, address and data are all written through I/O's by
bringing WE
Enable(ALE) are used to multiplex command and address respectively, via the I/O pins. Some commands require one bus cycle. For
example, Reset Command, Status Read Command, etc require just one cycle bus. Some other commands, like page read and block
erase and page program, require two cycles: one cycle for setup and the other cycle for execution. The 128M byte physical space
requires 28 addresses, thereby requiring four cycles for addressing: 2 cycles of column address, 2 cycles of row address, in that
order. Page Read and Page Program need the same four address cycles following the required command input. In Block Erase oper­ation, however, only the two row address cycles are used. Device operations are selected by writing specific commands into the com­mand register. Table 1 defines the specific commands of the K9F1G08X0A.

The device provides cache program in a block. It is possible to write data into the cache registers while data stored in data registers
are being programmed into memory cells in cache program mode. The program performace may be dramatically improved by cache
program when there are lots of pages of data to be programmed.

to low while CE is low. Those are latched on the rising edge of WE. Command Latch Enable(CLE) and Address Latch

K9K2G08U1A FLASH MEMORY

In addition to the enhanced architecture and interface, the device incorporates copy-back program feature from one page to another
page without need for transporting the data to and from the external buffer memory. Since the time-consuming serial access and
data-input cycles are removed, system performance for solid-state disk application is significantly increased.

Table 1. Command Sets

Function 1st. Cycle 2nd. Cycle Acceptable Command during Busy

Read 00h 30h

Read for Copy Back 00h 35h

Read ID 90h -

Reset FFh - O

Page Program 80h 10h

Cache Program

Copy-Back Program 85h 10h

Block Erase 60h D0h

Random Data Input

Random Data Output

Read Status 70h O

*2

*1

*1

80h 15h

85h -

05h E0h

NOTE : 1. Random Data Input/Output can be executed in a page.

2. Cache program and Copy-Back program are supported only with 3.3V device.

Caution : Any undefined command inputs are prohibited except for above command set of Table 1.

8

K9F1G08R0A
K9F1G08U0A

ABSOLUTE MAXIMUM RATINGS

Voltage on any pin relative to V

Temperature Under
Bias

Storage Temperature

Short Circuit Current Ios 5 mA

NOTE :

1. Minimum DC voltage is -0.6V on input/output pins. During transitions, this level may undershoot to -2.0V for periods <30ns.
Maximum DC voltage on input/output pins is V

2. Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded. Functional operation should be restricted to the conditions
as detailed in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for extended periods may affect reliability.

RECOMMENDED OPERATING CONDITIONS

(Voltage reference to GND, K9F1G08X0A-XCB0 :TA=0 to 70°C, K9F1G08X0A-XIB0:TA=-40 to 85°C)

Parameter Symbol

Supply Voltage V

Supply Voltage V

K9K2G08U1A FLASH MEMORY

Parameter Symbol

SS

K9F1G08X0A-XCB0

K9F1G08X0A-XIB0 -40 to +125

K9F1G08X0A-XCB0

K9F1G08X0A-XIB0

CC,+0.3V which, during transitions, may overshoot to VCC+2.0V for periods <20ns.

VIN/OUT -0.6 to + 2.45 -0.6 to + 4.6

V

CC -0.2 to + 2.45 -0.6 to + 4.6

T

BIAS

T

STG -65 to +150 °C

1.8V DEVICE 3.3V DEVICE

K9F1G08R0A(1.8V)

Min Typ . Max Min Typ. Max

CC 1.65 1.8 1.95 2.7 3.3 3.6 V

SS 000000 V

Rating

-10 to +125

K9F1G08U0A(3.3V)

Unit

Unit

V

°C

DC AND OPERATING CHARACTERISTICS(Recommended operating conditions otherwise noted.)

K9F1G08R0A K9F1G08U0A

Parameter Symbol Test Conditions

Min Typ Max Min Ty p Max

Page Read with

Operating

Serial Access

Current

Program ICC2 - - 10 20 - 15 30

Erase I

Stand-by Current(TTL) ISB1CE=VIH, WP=0V/VCC --1--1

Stand-by Current(CMOS) I

Input Leakage Current I

Output Leakage Current ILO VOUT=0 to Vcc(max) - - ±10 - - ±10

Input High Voltage V

Input Low Voltage, All inputs VIL* - -0.3 - 0.2xVcc -0.3 - 0.2xVcc

Output High Voltage Level V

Output Low Voltage Level

Output Low Current(R/B

NOTE : VIL can undershoot to -0.4V and VIH can overshoot to VCC +0.4V for durations of 20 ns or less.

)IOL(R/B)

tRC=30ns(50ns with 1.8V device),

I

CC1

CE=VIL

- 10 20 - 15 30

IOUT=0mA

CC3 - - 10 20 - 15 30

CE

SB2

LI VIN=0 to Vcc(max) - - ±10 - - ±10

IH* -0.8xVCC -

OH

OL

V

=VCC-0.2,

=0V/VCC

WP

K9F1G08R0A :IOH=-100µA

K9F1G08U0A :I

OH=-400µA

K9F1G08R0A :IOL=100uA

K9F1G08U0A :I

K9F1G08R0A :V

K9F1G08U0A :V

OL=2.1mA

OL=0.1V

OL=0.4V

- 10 50 - 10 50

V

CC

0.8xVcc -

Vcc

-0.1

+0.3

--2.4--

+0.3

--0.1--0.4

34- 810-mA

V

CC

Unit1.8V 3.3V

mA

µA

V

9

K9F1G08R0A

K9F1G08U0A

VALID BLOCK

Parameter Symbol Min Typ. Max Unit

K9F1G08X0A N

K9K2G08U1A

NOTE :

K9F1G08X0A may include invalid blocks when first shipped. Additional invalid blocks may develop while being used. The number of valid

1. The
blocks is presented with both cases of invalid blocks considered. Invalid blocks are defined as blocks that contain one or more bad bits. Do not erase
or program factory-marked bad blocks

2. The 1st block, which is placed on 00h block address, is guaranteed to be a valid block, does not require Error Correction up to 1K program/erase
cycles.

Each K9F1G08U0A chip in the K9K2G08U1A has Maximum 20 invalid blocks.

* :

AC TEST CONDITION

(K9F1G08X0A-XCB0 :TA=0 to 70°C, K9F1G08X0A-XIB0:TA=-40 to 85°C

K9F1G08R0A : Vcc=1.65V~1.95V, K9F1G08U0A : Vcc=2.7V~3.6V unless otherwise noted)

Input Pulse Levels 0V to Vcc 0V to Vcc

Input Rise and Fall Times 5ns 5ns

Input and Output Timing Levels Vcc/2 Vcc/2

Output Load 1 TTL GATE and CL=30pF 1 TTL GATE and CL=50pF

CAPACITANCE(TA=25°C, VCC=1.8V/3.3V, f=1.0MHz)

Input/Output Capacitance C

Input Capacitance C

NOTE : Capacitance is periodically sampled and not 100% tested.

MODE SELECTION

CLE ALE CE WE RE WP Mode

HLL HX

L H L H X Address Input(4clock)

HLL HH

L H L H H Address Input(4clock)

L L L H H Data Input

L L L H X Data Output

XXXXHX During Read(Busy)

XXXXXH During Program(Busy)

XXXXXH During Erase(Busy)

X

XXHXX

NOTE : 1. X can be VIL or VIH.

2. WP should be biased to CMOS high or CMOS low for standby.

Program / Erase Characteristics

Program Time

Dummy Busy Time for Cache Program

Number of Partial Program Cycles
in the Same Page

Block Erase Time t

NOTE : 1. Typical program time is defined as the time within which more than 50% of the whole pages are programmed at Vcc of 3.3V ans 25’C.

2. Max. time of tCBSY depends on timing between internal program completion and data in.

K9K2G08U1A FLASH MEMORY

VB 1004 - 1024 Blocks

VB

N

. Refer to the attached technical notes for appropriate management of invalid blocks.

Parameter K9F1G08R0A K9F1G08U0A

Item Symbol Test Condition Min Max Unit

I/O VIL=0V - 10 pF

IN VIN=0V - 10 pF

*1

X

X X X L Write Protect

Parameter Symbol Min Ty p Max Unit

Main Array

Spare Array - - 4 cycles

2008 - 2048 Blocks

Read Mode

Write Mode

(2)

0V/V

*1

PROG

t

*2

CBSY

t

Nop

BERS -23ms

Stand-by

CC

- 200 700 µs

- - 4 cycles

Command Input

Command Input

3 700

µs

10

K9F1G08R0A

K9F1G08U0A

AC Timing Characteristics for Command / Address / Data Input

Parameter Symbol

CLE setup Time

CLE Hold Time t

CE

setup Time

Hold Time tCH 10 5 - - ns

CE

WE

Pulse Width tWP 25 15 - - ns

ALE setup Time

ALE Hold Time t

Data setup Time

Data Hold Time t

Write Cycle Time t

WE

High Hold Time tWH 15 10 - - ns

ALE to Data Loading Time

NOTE : 1. The transition of the corresponding control pins must occur only once while WE is held low.

2. tADL is the time from the WE

3. For cache program operation, the whole AC Charcateristics must be same as that of K9F1G08R0A.

K9K2G08U1A FLASH MEMORY

Min Max

K9F1G08R0A K9F1G08U0A K9F1G08R0A K9F1G08U0A

*1

CLS

t

CLH 10 5 - - ns

*1

CS

t

*1

t

ALS

ALH 10 5 - - ns

*1

DS

t

DH 10 5 - - ns

WC 45 30 - - ns

*2

t

ADL

rising edge of final address cycle to the WE rising edge of first data cycle.

25 15 - - ns

35 20 - - ns

25 15 - - ns

20 15 - - ns

100

*2

100

*2

--ns

Unit

AC Characteristics for Operation

Parameter Symbol

K9F1G08R0A K9F1G08U0A K9F1G08R0A K9F1G08U0A

Data Transfer from Cell to Register tR - - 25 25 µs

ALE to RE

CLE to RE

Ready to RE

RE Pulse Width t

WE High to Busy t

Read Cycle Time t

RE

CE

RE

CE

RE

RE

Output Hi-Z to RE

RE

WE

Device Resetting Time
(Read/Program/Erase)

NOTE: 1. If reset command(FFh) is written at Ready state, the device goes into Busy for maximum 5us.

2. For cache program operation, the whole AC Charcateristics must be same as that of K9F1G08R0A.

Delay tAR 10 10 - - ns

Delay tCLR 10 10 - - ns

Low tRR 20 20 - - ns

RP 25 15 - - ns

WB - - 100 100 ns

RC 50 30 - - ns

Access Time tREA - - 30 20 ns

Access Time tCEA - - 45 35 ns

High to Output Hi-Z tRHZ - - 30 30 ns

High to Output Hi-Z tCHZ - - 20 20 ns

or CE High to Output hold tOH 15 15 - - ns

High Hold Time tREH 15 10 - - ns

Low tIR 00- -ns

High to WE Low tRHW 100 100 - - ns

High to RE Low tWHR 60 60 - - ns

t

RST --

Min Max

5/10/500

*1

5/10/500

*1

Unit

µs

11

K9F1G08R0A

K9F1G08U0A

NAND Flash Technical Notes

Initial Invalid Block(s)

Initial invalid blocks are defined as blocks that contain one or more initial invalid bits whose reliability is not guaranteed by Samsung.
The information regarding the initial invalid block(s) is so called as the initial invalid block information. Devices with initial invalid
block(s) have the same quality level as devices with all valid blocks and have the same AC and DC characteristics. An initial invalid
block(s) does not affect the performance of valid block(s) because it is isolated from the bit line and the common source line by a
select transistor. The system design must be able to mask out the initial invalid block(s) via address mapping. The 1st block, which is
placed on 00h block address, is guaranteed to be a valid block, does not require Error Correction up to 1K program/erase cycles.

Identifying Initial Invalid Block(s)

All device locations are erased(FFh) except locations where the initial invalid block(s) information is written prior to shipping. The
initial invalid block(s) status is defined by the 1st byte in the spare area. Samsung makes sure that either the 1st or 2nd page of every
initial invalid block has non-FFh data at the column address of 2048. Since the initial invalid block information is also erasable in
most cases, it is impossible to recover the information once it has been erased. Therefore, the system must be able to recognize the
initial invalid block(s) based on the initial invalid block information and create the initial invalid block table via the following suggested
flow chart(Figure 3). Any intentional erasure of the initial invalid block information is prohibited.

K9K2G08U1A FLASH MEMORY

Start

Increment Block Address

Create (or update)

Initial Invalid Block(s) Table

Figure 3. Flow chart to create initial invalid block table.

Set Block Address = 0

No

No

Check "FFh

Yes

Last Block ?

Yes

End

Check "FFh" at the column address

of the 1st and 2nd page in the block

2048

*

12