1. Add x32 org part and industrial temperature part
1. change scan order(1) form 4T to 6T at 119BGA(x18)
1. Final spec release
2. Change I
Change ordering information( remove 225MHz at Nt-Pipelined)
1. Delete 119BGA package
1. Remove x32 organization
SB2 form 50mA to 60mA
Draft Date
May. 18. 2001
Aug. 11. 2001
Aug. 28 .2001
Nov. 16. 2001
April. 01. 2002
April. 04. 2003
Nov. 17. 2003
Remark
Preliminary
Preliminary
Preliminary
Final
Final
Final
Final
The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the
specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions on the parameters of this device. If you have any questions, please contact the SAMSUNG branch office near your office, call or contact Headquarters.
- 1 -
Nov. 2003
Rev 3.0
K7N803601B
K7N801801B
8Mb NtRAM(Flow Through / Pipelined) Ordering Information
Org.Part NumberModeVDD
K7M801825B-QC(I)65/75FlowThrough3.36.5/7.5 ns
K7N801801B-QC(I)16/13Pipelined3.3167/133 MHz
512Kx18
256Kx36
K7N801809B-QC(I)25Pipelined3.3250 MHz
K7N801845B-QC(I)16/13Pipelined2.5167/133 MHz
K7N801849B-QC(I)25Pipelined2.5250MHz
K7M803625B-QC(I)65/75FlowThrough3.36.5/7.5 ns
K7N803601B-QC(I)16/13Pipelined3.3167/133 MHz
K7N803609B-QC(I)25Pipelined3.3250 MHz
K7N803645B-QC(I)16/13Pipelined2.5167/133 MHz
K7N803649B-QC(I)25Pipelined2.5250 MHz
256Kx36 & 512Kx18 Pipelined NtRAM
Speed
FT ; Access Time(ns)
Pipelined ; Cycle Time(MHz)
PKGTemp
Commercial
Temperature
Q:
100TQFP
Industrial
Temperature
TM
C:
Range
I:
Range
- 2 -
Nov. 2003
Rev 3.0
K7N803601B
K7N801801B
256Kx36 & 512Kx18 Pipelined NtRAM
TM
256Kx32 & 256Kx36 & 512Kx18-Bit Pipelined NtRAM
GENERAL DESCRIPTIONFEATURES
• 3.3V+0.165V/-0.165V Power Supply.
• I/O Supply Voltage 3.3V+0.165V/-0.165V for 3.3V I/O
or 2.5V+0.4V/-0.125V for 2.5V I/O.
• Byte Writable Function.
• Enable clock and suspend operation.
• Single
READ/WRITE control pin.
• Self-Timed Write Cycle.
• Three Chip Enable for simple depth expansion with no data
contention .
• Α interleaved burst or a linear burst mode.
• Asynchronous output enable control.
• Power Down mode.
• 100-TQFP-1420A
• Operating in commercial and industrial temperature range.
FAST ACCESS TIMES
PARAMETERSymbol-16-13 Unit
Cycle Timet
Clock Access Timet
Output Enable Access Timet
CYC6.07.5ns
CD3.54.2ns
OE3.53.8ns
The K7N803601B and K7N801801B are
9,437,184 bits Synchronous Static SRAMs.
The NtRAM
lizes all the bandwidth in any combination of operating cycles.
Address, data inputs, and all control signals except output
enable and linear burst order are synchronized to input clock.
Burst order control must be tied "High or Low".
Asynchronous inputs include the sleep mode enable(ZZ).
Output Enable controls the outputs at any given time.
Write cycles are internally self-timed and initiated by the rising
edge of the clock input. This feature eliminates complex offchip write pulse generation
and provides increased timing flexibility for incoming signals.
For read cycles, pipelined SRAM output data is temporarily
stored by an edge triggered output register and then released
to the output buffers at the next rising edge of clock.
The K7N803601B and K7N801801B are implemented with
SAMSUNG′s high performance CMOS technology and is available in 100pin TQFP and Multiple power and ground pins minimize ground bounce.
TM
, or No Turnaround Random Access Memory uti-
TM
LOGIC BLOCK DIAGRAM
A [0:17] or
A [0:18]
CLK
LOGIC
CKE
CS
1
CS
2
CS
2
ADV
WE
BW
x
(x=a,b,c,d or a,b)
OE
ZZ
0
~ DQd
7
DQa
DQPa ~ DQPd
or DQa0 ~ DQb8
CONTROL
ADDRESS
REGISTER
K
REGISTER
CONTROL
A2~A
LBO
A0~A
17
or A2~A18
WRITE
ADDRESS
REGISTER
BURST
ADDRESS
1
COUNTER
CONTROL
LOGIC
A
WRITE
ADDRESS
REGISTER
′0~A
′
1
256Kx36 , 512Kx18
MEMORY
ARRAY
DATA-IN
K
REGISTER
DATA-IN
K
REGISTER
OUTPUT
K
REGISTER
BUFFER
36 or 18
NtRAMTM and No Turnaround Random Access Memory are trademarks of Samsung,
and its architecture and functionalities are supported by NEC and Toshiba.
The K7N803601B and K7N801801B is NtRAMTM designed to sustain 100% bus bandwidth by eliminating turnaround cycle when
there is transition from Read to Write, or vice versa.
All inputs (with the exception of OE
All read, write and deselect cycles are initiated by the ADV input. Subsequent burst addresses can be internally generated by the
burst advance pin (ADV). ADV should be driven to Low once the device has been deselected in order to load a new address for next
operation.
, LBO and ZZ) are synchronized to rising clock edges.
Clock Enable(CKE
inputs are ignored and the internal device registers will hold their previous values.
TM
NtRAM
are active .
Output Enable(OE
Read operation is initiated when at the rising edge of the clock, the address presented to the address inputs are latched in the
address register, CKE
high, and ADV driven low.The internal array is read between the first rising edge and the second rising edge of the clock and the data
is latched in the output register. At the second clock edge the data is driven out of the SRAM. Also during read operation OE
be driven low for the device to drive out the requested data.
Write operation occurs when WE
lined NtRAM
At the first rising edge of the clock, WE
later.
Subsequent addresses are generated by ADV High for the burst access as shown below. The starting point of the burst seguence is
provided by the external address. The burst address counter wraps around to its initial state upon completion.
The burst sequence is determined by the state of the LBO
And when this pin is high, Interleaved burst sequence is selected.
During normal operation, ZZ must be driven low. When ZZ is driven high, the SRAM will enter a Power Sleep Mode after 2 cycles. At
this time, internal state of the SRAM is preserved. When ZZ returns to low, the SRAM normally operates after 2 cycles of wake up
time.
latches external address and initiates a cycle, when CKE, ADV are driven to low and all three chip enables(CS1, CS2, CS2)
) pin allows the operation of the chip to be suspended as long as necessary. When CKE is high, all synchronous
) can be used to disable the output at any given time.
is driven low, all three chip enables(CS1, CS2, CS2) are active, the write enable input signals WE are driven
TM
uses a late-late write cycle to utilize 100% of the bandwidth.
is driven low at the rising edge of the clock. BW[d:a] can be used for byte write operation. The pipe-
and address are registered, and the data associated with that address is required two cycle
pin. When this pin is low, linear burst sequence is selected.