K6F4016U4G |
Preliminary |
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K6F4016U4G Family |
CMOS SRAM |
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Document Title
256Kx16 bit Super Low Power and Low Voltage Full CMOS Static RAM
Revision History
Revision No. |
History |
Draft Date |
Remark |
0.0 |
Initial Draft |
October 15, 2003 |
Preliminary |
The attached datasheets are provided by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications and products. SAMSUNG Electronics will answer to your questions about device. If you have any questions, please contact the SAMSUNG branch offices.
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Revision 0.0 |
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October 2003 |
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Preliminary |
K6F4016U4G Family |
CMOS SRAM |
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256K x 16 bit Super Low Power and Low Voltage Full CMOS Static RAM
FEATURES
∙Process Technology: Full CMOS
∙Organization: 256K x16 bit
∙Power Supply Voltage: 2.7~3.3V
∙Low Data Retention Voltage: 1.5V(Min)
∙Three State Outputs
∙Package Type: 48-TBGA-6.00x7.00
GENERAL DESCRIPTION
The K6F4016U4G families are fabricated by SAMSUNG′s advanced full CMOS process technology. The families support industrial temperature range and 48 ball Chip Scale Package for user flexibility of system design. The family also supports low data retention voltage for battery back-up operation with low data retention current.
PRODUCT FAMILY
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Power Dissipation |
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Product Family |
Operating Temperature |
Vcc Range |
Speed |
Standby |
Operating |
PKG Type |
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(ISB1, Typ.) |
(ICC1, Max) |
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K6F4016U4G-F |
Industrial(-40~85°C) |
2.7~3.3V |
551)/70ns |
3μA2) |
4mA |
48-TBGA-6.00x7.00 |
1.The parameter is measured with 30pF test load.
2.Typical value is measured at VCC=3.0V, TA=25°C and not 100% tested.
PIN DESCRIPTION |
FUNCTIONAL BLOCK DIAGRAM |
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1 |
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6 |
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A |
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LB |
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OE |
A0 |
A1 |
A2 |
DNU |
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B |
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I/O9 |
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UB |
A3 |
A4 |
CS |
I/O1 |
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C |
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I/O10 |
I/O11 |
A5 |
A6 |
I/O2 |
I/O3 |
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D |
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Vss |
I/O12 |
A17 |
A7 |
I/O4 |
Vcc |
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E |
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Vcc |
I/O13 |
DNU |
A16 |
I/O5 |
Vss |
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F |
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I/O15 |
I/O14 |
A14 |
A15 |
I/O6 |
I/O7 |
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G |
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I/O16 |
DNU |
A12 |
A13 |
WE |
I/O8 |
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H |
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DNU |
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A8 |
A9 |
A10 |
A11 |
DNU |
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48-TBGA: Top View (Ball Down) |
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Name |
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Function |
Name |
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Function |
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CS |
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Chip Select Inputs |
Vcc |
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Power |
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OE |
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Output Enable Input |
Vss |
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Ground |
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WE |
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Write Enable Input |
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UB |
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Upper Byte(I/O9~16) |
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A0~A17 |
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Address Inputs |
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LB |
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Lower Byte(I/O1~8) |
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I/O1~I/O16 |
Data Inputs/Outputs |
DNU |
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Do Not Use |
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Clk gen. |
Precharge circuit. |
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Vcc |
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Vss |
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Row |
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Memory |
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Addresses |
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select |
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Array |
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I/O1~I/O8 |
Data |
I/O Circuit |
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cont |
Column select |
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I/O9~I/O16 |
Data |
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cont |
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Data |
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cont |
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Column Addresses |
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CS |
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OE |
Control Logic |
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WE |
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UB |
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LB |
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SAMSUNG ELECTRONICS CO., LTD. reserves the right to change products and specifications without notice.
- 2 - |
Revision 0.0 |
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October 2003 |
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Preliminary |
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K6F4016U4G Family |
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CMOS SRAM |
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PRODUCT LIST |
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Industrial Temperature Products(-40~85°C) |
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Part Name |
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Function |
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K6F4016U4G-EF55 |
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48-TBGA, 55ns, 3.0V |
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K6F4016U4G-EF70 |
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48-TBGA, 70ns, 3.0V |
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FUNCTIONAL DESCRIPTION |
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CS |
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OE |
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WE |
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LB |
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UB |
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I/O1~8 |
I/O9~16 |
Mode |
Power |
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H |
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X1) |
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X1) |
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X1) |
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X1) |
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High-Z |
High-Z |
Deselected |
Standby |
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X1) |
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X1) |
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X1) |
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H |
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H |
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High-Z |
High-Z |
Deselected |
Standby |
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L |
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H |
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H |
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L |
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X1) |
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High-Z |
High-Z |
Output Disabled |
Active |
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L |
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H |
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H |
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X1) |
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L |
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High-Z |
High-Z |
Output Disabled |
Active |
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L |
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L |
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H |
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L |
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H |
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Dout |
High-Z |
Lower Byte Read |
Active |
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L |
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L |
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H |
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H |
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L |
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High-Z |
Dout |
Upper Byte Read |
Active |
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L |
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L |
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H |
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L |
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L |
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Dout |
Dout |
Word Read |
Active |
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L |
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X1) |
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L |
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L |
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H |
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Din |
High-Z |
Lower Byte Write |
Active |
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L |
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X1) |
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L |
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H |
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L |
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High-Z |
Din |
Upper Byte Write |
Active |
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L |
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X1) |
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L |
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L |
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L |
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Din |
Din |
Word Write |
Active |
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1. X means don′t care. (Must be low or high state)
ABSOLUTE MAXIMUM RATINGS1)
Item |
Symbol |
Ratings |
Unit |
Voltage on any pin relative to Vss |
VIN, VOUT |
-0.3 to VCC+0.3V(Max. 3.6V) |
V |
Voltage on Vcc supply relative to Vss |
VCC |
-0.3 to 3.6 |
V |
Power Dissipation |
PD |
1.0 |
W |
Storage temperature |
TSTG |
-65 to 150 |
°C |
Operating Temperature |
TA |
-40 to 85 |
°C |
1.Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Functional operation should be restricted within recommended operating condition. Exposure to absolute maximum rating conditions for extended period may affect reliability.
- 3 - |
Revision 0.0 |
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October 2003 |