Samsung K4D263238D-QC50, K4D263238D-QC40 Datasheet

K4D263238D
128M DDR SDRAM
128Mbit DDR SDRAM
1M x 32Bit x 4 Banks
Double Data Rate Synchronous DRAM
Revision 1.3
July 2002
-1-
Rev. 1.3 (Jul. 2002)
K4D263238D
Revision History
Revision 1.3 (July 18, 2002)
• Changed power dissipation from 2.0W to 1.8W
Revision 1.2 (June 17, 2002)
• Removed K4D263238D-QC55 from the spec.
• 183/166MHz were supported in K4D263238D-QC50.
Revision 1.1 (May 24, 2002)
• Removed K4D263238D-QC45/60 from the spec
Revision 1.0 (May 20, 2002)
• Define DC spec.
Revision 0.0 (April 23, 2002)- Target spec
• Define target spec.
128M DDR SDRAM
-2-
Rev. 1.3 (Jul. 2002)
K4D263238D
1M x 32Bit x 4 Banks Double Data Rate Synchronous DRAM with Bi-directional Data Strobe and DLL
FEATURES
128M DDR SDRAM
• 2.5V ± 5% power supply
• SSTL_2 compatible inputs/outputs
• 4 banks operation
• MRS cycle with address key programs
-. Read latency 3,4 (clock)
-. Burst length (2, 4, 8 and Full page)
-. Burst type (sequential & interleave)
• Full page burst length for sequential burst type only
• Start address of the full page burst should be even
• All inputs except data & DM are sampled at the positive
going edge of the system clock
• Differential clock input
• No Write Interrupted by Read function
• Data I/O transactions on both edges of Data strobe
• DLL aligns DQ and DQS transitions with Clock transition
• Edge aligned data & data strobe output
• Center aligned data & data strobe input
• DM for write masking only
• Auto & Self refresh
• 32ms refresh period (4K cycle)
• 100pin TQFP package
• Maximum clock frequency up to 250MHz
• Maximum data rate up to 500Mbps/pin
ORDERING INFORMATION
Part NO. Max Freq. MaxDataRate Interface Package
K4D263238D-QC40 250MHz 500Mbps/pin
K4D263238D-QC50 200MHz 400Mbps/pin
SSTL_2 100 TQFP
GENERAL DESCRIPTION
FOR 1M x 32Bit x 4 Bank DDR SDRAM
The K4D263238D is 134,217,728 bits of hyper synchronous data rate Dynamic RAM organized as 4 x 1,048,576 words by
32 bits, fabricated with SAMSUNG
extremely high performance up to 2.0GB/s/chip. I/O transactions are possible on both edges of the clock cycle. Range of
operating frequencies, programmable burst length and programmable latencies allow the device to be useful for a variety
of high performance memory system applications.
s high performance CMOS technology. Synchronous features with Data Strobe allow
-3-
Rev. 1.3 (Jul. 2002)
K4D263238D
PIN CONFIGURATION (Top View)
128M DDR SDRAM
DQ29
VSSQ
DQ30
DQ31
VSS
VDDQ
N.C
N.C
N.C
N.C
N.C
VSSQ
RFU
DQS
VDDQ
VDD
DQ0
DQ1
VSSQ
DQ2
DQ28
VDDQ
DQ27
DQ26
VSSQ
DQ25
DQ24
VDDQ
DQ15
DQ14
VSSQ
DQ13
DQ12
VDDQ
VSS
VDD
DQ11
DQ10
VSSQ
DQ9
DQ8
VDDQ
VREF
DM3
DM1
8079787776757473727170696867666564636261605958575655545352
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
1
2
3
4
5
6
7
8
9
101112131415161718192021222324252627282930
100 Pin TQFP
20 x 14 mm
2
0.65mm pin Pitch
CKCKCKE
MCL
A8(AP)
51
50
A7
49
A6
48
A5
47
A4
46
VSS
45
A9
44
N.C
43
N.C
42
N.C
41
N.C
40
N.C
39
N.C
38
N.C
37
A11
36
A10
35
VDD
34
A3
33
A2
32
A1
31
A0
DQ3
VDDQ
DQ4
DQ5
VSSQ
DQ6
DQ7
DQ16
VDDQ
VSS
DQ17
DQ18
VSSQ
VDD
DQ19
VDDQ
DQ20
DQ21
DQ22
DQ23
VSSQ
VDDQ
WE
DM0
DM2
CAS
RAS
CS
BA0
BA1
PIN DESCRIPTION
CK,CK Differential Clock Input BA0,BA1 Bank Select Address
CKE Clock Enable A
CS
RAS
CAS
WE
Chip Select DQ0 ~DQ31 Data Input/Output
Row Address Strobe VDD Power
Column Address Strobe VSS Ground Write Enable VDDQ Power for DQs
DQS Data Strobe V
DMi Data Mask MCL Must Connect Low
RFU Reserved for Future Use
0 ~A11 Address Input
SSQ Ground for DQs
-4-
Rev. 1.3 (Jul. 2002)
K4D263238D
INPUT/OUTPUT FUNCTIONAL DESCRIPTION
Symbol Type Function
The differential system clock Input.
CK, CK
*1
CKE Input
CS
Input
Input
All of the inputs are sampled on the rising edge of the clock except
sandDM′s that are sampled on both edges of the DQS.
DQ
Activates the CK signal when high and deactivates the CK signal when low. By deactivating the clock, CKE low indicates the Power down mode or Self refresh mode.
CS
enables the command decoder when low and disabled the com­mand decoder when high. When the command decoder is disabled, new commands are ignored but previous operations continue.
128M DDR SDRAM
RAS
CAS
WE
Input
Input
Input
Latches row addresses on the positive going edge of the CK with RAS
low. Enables row access & precharge.
Latches column addresses on the positive going edge of the CK with CAS
low. Enables column access.
Enables write operation and row precharge. Latches data in starting from CAS
,WEactive.
DQS Input/Output Data input and output are synchronized with both edge of DQS.
Data In mask. Data In is masked by DM Latency=0 when DM is high
0 ~DM3 Input
DM
in burst write. DM0 for DQ0 ~DQ7, DM1 for DQ8 ~DQ15, DM2 for
16 ~DQ23, DM3 for DQ24 ~DQ31.
DQ
DQ0 ~DQ31 Input/Output Data inputs/Outputs are multiplexed on the same pins.
BA
0,BA1 Input Selects which bank is to be active.
Row/Column addresses are multiplexed on the same pins.
0 ~A11 Input
A
V
DD/VSS Power Supply Power and ground for the input buffers and core logic.
V
DDQ/VSSQ Power Supply
Row addresses : RA0 ~RA11, Column addresses : CA0 ~CA7. Column address CA
8 is used for auto precharge.
Isolated power supply and ground for the output buffers to provide improved noise immunity.
V
REF Power Supply Reference voltage for inputs, used for SSTL interface.
MCL Must Connect Low Must connect Low
*1 : The timing reference point for the differential clocking is the cross point of CK and CK.
For any applications using the single ended clocking, apply V
REF to CK pin.
-5-
Rev. 1.3 (Jul. 2002)
K4D263238D
BLOCK DIAGRAM (1Mbit x 32I/O x 4 Bank)
128M DDR SDRAM
32
Intput Buffer
LWE
CK,CK
ADDR
LCKE
Address Register
Bank Select
LRAS
Row Buffer
LRAS
LCBR
Refresh Counter
CK, CK
Row Decoder
LCBR
LWE
Col. Buffer
LCAS
Data Input Register
Serial to parallel
64
1Mx32
1Mx32
1Mx32
1Mx32
Column Decoder
Latency & Burst Length
Programming Register
LWCBR
Sense AMP
2-bit prefetch
64 32
DLL
CK,CK
Output BufferI/O Control
Gen.
LDMi
x32
DQi
Strobe
Data Strobe
LDMi
CK,CK
Timing Register
CKE CS RAS CAS WE DMi
-6-
Rev. 1.3 (Jul. 2002)
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