W27E040
512K × 8 ELECTRICALLY ERASABLE EPROM
GENERAL DESCRIPTION
The W27E040 is a high speed, low power Electrically Erasable and Programmable Read Only
Memory organized as 524288 × 8 bits that operates on a single 5 volt power supply. The W27E040
provides an electrical chip erase function.
FEATURES
• High speed access time:
90/120 nS (max.)
• Read operating current: 15 mA (typ.)
• Erase/Programming operating current
15 mA (typ.)
• Standby current: 5 µA (typ.)
• Single 5V power supply
• +14V erase/+12V programming voltage
• Fully static operation
• All inputs and outputs directly TTL/CMOS
compatible
• Three-state outputs
• Available packages: 32-pin 600 mil DIP, 450
mil SOP, PLCC and TSOP
PIN CONFIGURATIONS
V
PP
1
2
A16
3
A15
4
A12
5
A7
6
A6
7
A5
A4
A3
A2
A1
A0
Q0
Q1
Q2
GND
A7
A6
A5
A4
A3
A2
A1
A0
Q0
A11
2
A9
3
A8
A13
5
A14
A17
A18
9
10
A16
11
A15
12
A12
13
A7
14
A6
15
A5
16
A4
32-pin
8
DIP
9
10
11
12
13
14
15
16
A
1
5
34
2
V
A
1
P
6
P
32-pin
PLCC
G
Q3Q4Q5Q
N
D
32-pin
TSOP
A
V
C
1
8
C
A
1
2
5
6
7
8
9
10
11
12
13
Q1Q
BLOCK DIAGRAM
32
V
CC
31
A18
30
A17
29
A14
28
A13
27
A8
26
A9
A11
25
24
OE
A10
23
22
CE
Q7
21
Q6
20
Q5
19
Q4
18
17
Q3
A
1
7
30313212
29
A14
28
A13
27
A8
26
A9
25
A11
24
OE
23
A10
22
CE
21
Q7
20191817161514
6
32
OE
A10
31
30
CE
Q7
29
Q6
28
Q5
27
Q4
26
Q3
25
GND
24
23
Q1
22
Q0
21
A0
20
A1
19
A2
18
A3
17
PIN DESCRIPTION
CE
OE
CONTROL
OUTPUT
BUFFER
A0
.
.
DECODER
CORE
ARRAY
A18
V
CC
GND
V
PP
SYMBOL DESCRIPTION
A0−A18
Q0−Q7
Address Inputs
Data Inputs/Outputs
Chip Enable
Output Enable
VPP Program/Erase Supply Voltage
VCC Power Supply
GND Ground
NC No Connection
Q0
.
.
Q7
Publication Release Date: May 1997
- 1 - Revision A1
W27E040
FUNCTIONAL DESCRIPTION
Read Mode
Like conventional UVEPROMs, the W27E040 has two control functions, both of which produce data
at the outputs. CE is for power control and chip select. OE controls the output buffer to gate data to
the output pins. When addresses are stable, the address access time (TACC) is equal to the delay
from CE to output (TCE), and data are available at the outputs TOE after the falling edge of OE, if
TACC and TCE timings are met.
Erase Mode
The erase operation is the only way to change data from "0" to "1." Unlike conventional UVEPROMs,
which use ultraviolet light to erase the contents of the entire chip (a procedure that requires up to half
an hour), the W27E040 uses electrical erasure. Generally, the chip can be erased within 100 mS by
using an EPROM writer with a special erase algorithm.
Erase mode is entered when VPP is raised to VPE (14V), VCC = VCE (5V), CE = VIL, (0.8V or below
but higher than GND), OE = VIH (2V or above but lower than VCC), A9 = VHH (14V), A0 = VIL, and all
other address pins equal VIL and data input pins equal VIH.
Erase Verify Mode
After an erase operation, all of the bytes in the chip must be verified to check whether they have been
successfully erased to "1" or not. The erase verify mode automatically ensures a substantial erase
margin. This mode will be entered after the erase operation if VPP = VPE (14V), CE = VIH, and OE =
VIL.
Program Mode
Programming is performed exactly as it is in conventional UVEPROMs, and programming is the only
way to change cell data from "1" to "0." The program mode is entered when VPP is raised to VPP
(12V), VCC = VCP (5V), CE = VIL, OE = VIH, the address pins equal the desired address, and the input
pins equal the desired inputs.
Program Verify Mode
All of the bytes in the chip must be verified to check whether they have been successfully
programmed with the desired data or not. Hence, after each byte is programmed, a program verify
operation should be performed. The program verify mode automatically ensures a substantial
program margin. This mode will be entered after the program operation if VPP = VPP (12V), CE = VIH,
= VIL and VCC = VCP (5V).
Erase/Program Inhibit
Erase or program inhibit mode allows parallel erasing or programming of multiple chips with different
data. When CE = VIH, VPP = VPP/VPE (12V/14V), and VCC = 5V, erasing or programming of nontarget chips is inhibited, so that except for the CE and VPP, and VCC, the W27E040 may have
common inputs.
- 2 -
W27E040
Standby Mode
The standby mode significantly reduces VCC current. This mode is entered when CE = VIH, VPP = 5V,
and VCC = 5V. In standby mode, all outputs are in a high impedance state, independent of OE.
Two-line Output Control
Since EPROMs are often used in large memory arrays, the W27E040 provides two control inputs for
multiple memory connections. Two-line control provides for lowest possible memory power
dissipation and ensures that data bus contention will not occur.
System Considerations
EPROM power switching characteristics require careful device decoupling. System designers are
interested in three supply current issues: standby current levels (ISB), active current levels (ICC), and
transient current peaks produced by the falling and rising edges of CE. Transient current magnitudes
depend on the device output's capacitive and inductive loading. Two-line control and proper
decoupling capacitor selection will suppress transient voltage peaks. Each device should have a 0.1 µ
F ceramic capacitor connected between its VCC and GND. This high frequency, low inherentinductance capacitor should be placed as close as possible to the device. Additionally, for every eight
devices, a 4.7 µF electrolytic capacitor should be placed at the array's power supply connection
between VCC and GND. The bulk capacitor will overcome voltage slumps caused by PC board trace
inductances.
TABLE OF OPERATING MODES
(VPP = 12V, VPE = 14V, VHH = 12V, VCP = 5V, X = VIH or VIL)
MODE PINS
A0 A9 VCC VPP OUTPUTS
Read VIL VIL X X VCC VCC DOUT
Output Disable VIL VIH X X VCC VCC High Z
Standby (TTL) VIH X X X VCC VCC High Z
Standby (CMOS)
Program VIL VIH X X VCP VPP DIN
Program Verify VIH VIL X X VCP VPP DOUT
Program Inhibit VIH X X X VCP VPP High Z
Erase VIL VIH VIL VPE VCE VPE DIH
Erase Verify VIH VIL X X VCE VPE DOUT
Erase Inhibit VIH X X X VCE VPE High Z
Product Identifier-manufacturer VIL VIL VIL VHH VCC VCC DA (Hex)
Product Identifier-device VIL VIL VIH VHH VCC VCC 86 (Hex)
VCC ±0.3V
X X X VCC VCC High Z
Publication Release Date: May 1997
- 3 - Revision A1
DC CHARACTERISTICS
Absolute Maximum Ratings
PARAMETER RATING UNIT
W27E040
Ambient Temperature with Power Applied -55 to +125
Storage Temperature -65 to +125
Voltage on all pins with Respect to Ground Except VPP, A9
and VCC pins
Voltage on VPP Pin with Respect to Ground -0.5 to +14.5 V
Voltage on A9 Pin with Respect to Ground -0.5 to +14.5 V
Voltage on VCC Pin with Respect to Ground -0.5 to +7 V
Note: Exposure to conditions beyond those listed under Absolute Maximum Ratings may adversely affect the life and reliability of the
device.
-0.5 to VCC +0.5 V
°C
°C
DC Erase Characteristics
(TA = 25° C ±5° C, VCC = 5.0V ±10%, VHH = 14V)
PARAMETER SYM. CONDITIONS LIMITS UNIT
MIN. TYP. MAX.
Input Load Current ILI VIN = VIL or VIH -10 - 10
VCC Erase Current ICP
VPP Erase Current IPP
Input Low Voltage VIL - -0.3 - 0.8 V
= VIL
= VIL
- - 30 mA
- - 30 mA
µA
Input High Voltage VIH - 2.4 - 5.5 V
Output Low Voltage (Verify) VOL IOL = 2.1 mA - - 0.45 V
Output High Voltage (Verify) VOH IOH = -0.4 mA 2.4 - - A9 Erase Voltage VID - 13.75 14 14.25 V
VPP Erase Voltage VPE - 13.75 14 14.25 V
VCC Supply Voltage (Erase) VCE - 4.5 5.0 5.5 V
Note: VCC must be applied simultaneously or before VPP and removed simultaneously or after VPP.
CAPACITANCE
(VCC = 5V, TA = 25° C, f = 1 MHz)
PARAMETER SYMBOL CONDITIONS MAX. UNIT
Input Capacitance CIN VIN = 0V 6 pF
Output Capacitance COUT VOUT = 0V 12 pF
- 4 -
W27E040
AC CHARACTERISTICS
AC Test Conditions
PARAMETER CONDITIONS
Input Pulse Levels 0.45V to 2.4V
Input Rise and Fall Times 10 nS
Input and Output Timing Reference Level 0.8V/2.0V
Output Load CL = 100 pF, IOH/IOL = -0.4 mA/2.1 mA
AC Test Load and Waveform
+1.3V
(IN914)
D
OUT
Input
2.4V
0.45V
3.3K ohm
100 pF (Including Jig and Scope)
Output
Test Points Test Points
2.0V
0.8V
2.0V
0.8V
Publication Release Date: May 1997
- 5 - Revision A1