Quadtech 7400 Operations Guide

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7400 Precision LCR Meter Model B Instruction Manual

Form 150262/A4

QuadTech, Inc., 1997

5 Clock Tower Place, 210 East

Maynard, Massachusetts, U.S.A. 01754

January, 2002

Telephone 978-461-2100 Sales 800-253-1230 Facsimile 978-461-4295 Website www.quadtech.com

The material in this manual is for informational purposes only and is subject to change, without notice. QuadTech assumes no responsibility for any error or for consequential damages that may result from the misinterpretation of any procedures in this publication.

Product will be marked with this symbol (ISO#3684) when it is necessary for the user to

refer to the instruction manual in order to prevent injury or equipment damage.

Product marked with this symbol (IEC417) indicates presence of direct current.

Page 2 of 118

Contents

Warranty ...........................................................................................................7

Specifications ...........................................................................................................9

Introduction - Section 1

1.1 Unpacking and Inspection.............................................................................13

1.2 Product Overview..........................................................................................13

1.3 Controls and Indicators.................................................................................. 14

1.4 Accessories Included.....................................................................................17

1.5 Accessories/Options Available...................................................................... 17

1.6 Installation .....................................................................................................18

1.6.1 Instrument Positioning.......................................................................18

1.6.2 Power Requirements.......................................................................... 18

1.6.3 Safety Inspection ............................................................................... 20

Operation - Section 2

2.1 General........................................................................................................... 21

2.2 Startup ........................................................................................................... 21

2.3 Connection to Device Under Test ................................................................. 21

2.4 Zeroing........................................................................................................... 22

2.5 Measurement Procedure................................................................................23

2.5.1 General...............................................................................................23

2.5.2 Default Measurement Conditions...................................................... 23

2.6 Menu Functions.............................................................................................25

2.6.1 General...............................................................................................25

2.6.2 Setup Menu........................................................................................25

2.6.2.1 Primary Parameter................................................................26

2.6.2.2 Secondary Parameter............................................................29

2.6.2.3 Frequency ............................................................................. 30

2.6.2.4 AC Test Signal .....................................................................30

2.6.2.5 DC Bias Voltage...................................................................32

2.6.2.6 Range Hold........................................................................... 34

2.6.2.7 Range Locked....................................................................... 34

2.6.2.8 Measurement Accuracy........................................................39

2.6.2.9 Measurement Delay..............................................................39

2.6.2.10 # to Average .......................................................................40

2.6.2.11 Contact Check ....................................................................40

Page 3 of 118

Contents (continued)

2.6.3 I/O Menu............................................................................................41

2.6.3.1 Display Type ........................................................................42

2.6.3.2 Nominal Value...................................................................... 45

2.6.3.3 Result Format ....................................................................... 45

2.6.3.4 Trigger..................................................................................46

2.6.3.5 Handler Interface..................................................................46

2.6.3.6 RS-232 Interface................................................................... 46

2.6.3.7 IEEE-488.2 Interface............................................................ 47

2.6.3.8 Print Results..........................................................................47

2.6.3.9 Results to Floppy.................................................................. 48

2.6.4 Analysis Menu................................................................................... 54

2.6.4.1 Binning ................................................................................. 55

2.6.4.2 Test Sequencing....................................................................60

2.6.4.3 Parameter Sweep .................................................................. 63

2.6.4.4 Median.................................................................................. 65

2.6.4.5 Distortion Detection ............................................................. 65

2.6.4.6 Load Correction....................................................................65

2.6.5 Utilities Menu.................................................................................... 67

2.6.5.1 Save Setup ............................................................................ 68

2.6.5.2 Recall Setup..........................................................................69

2.6.5.3 Setup Accuracy..................................................................... 70

2.6.5.4 Open / Short.......................................................................... 72

2.6.5.5 Lock Out............................................................................... 73

2.6.5.6 Calibration............................................................................74

2.6.5.7 Set Time/Date....................................................................... 74

2.6.5.8 Usage/Cal Date..................................................................... 75

2.6.5.9 Set Contrast ..........................................................................76

2.6.5.10 Self Test.............................................................................. 76

2.6.5.11 LCD Backlite......................................................................76

2.7 Input/Output Interface ................................................................................... 77

2.7.1 I/O Interface....................................................................................... 77

2.7.2 Parallel Interface................................................................................81

2.7.3 IEEE-488.2 Interface......................................................................... 82

2.7.3.1 Formats.................................................................................92

2.7.3.2 Sample Program for National Instruments GPIB card..........94

2.7.4 RS232 Interface.................................................................................95

2.7.5 Results to Printer ............................................................................... 96

Page 4 of 118

Contents (continued)

2.8 Operation with Accessories........................................................................... 97

2.8.1 General...............................................................................................97

2.8.2 Rack Mount Kit (7000-00)................................................................97

2.8.3 BNC Cable Set, 1 Meter (7000-01), 2 Meter (7000-02)...................97

2.8.4 Kelvin Clip Leads (7000-03).............................................................98

2.8.5 Alligator Clip Leads (7000-04).........................................................100

2.8.6 Chip Component Tweezers (7000-05) .............................................. 101

2.8.7 Low V, Axial/Radial Lead Component Test Fixture (7000-06).......102

2.8.8 Low V, Chip component Test Fixture (7000-07)..............................103

2.8.9 High Voltage Test Fixture (7000-08)................................................ 104

2.8.10 Calibration Kit (7000-09).................................................................. 105

2.8.11 Connections to 874 Type Adapters ................................................... 106

2.9 Error Messages .............................................................................................. 107

Theory Section 3

3.1 General........................................................................................................... 111

3.2 Instrument Description..................................................................................111

3.2.1 Basic I2000 Instrument Architecture ................................................111

3.2.2 7400 Instrument Module ................................................................... 112

3.2.3 I2000 Instrument Options..................................................................113

Maintenance/Calibration - Section 4

4.1 General........................................................................................................... 115

4.2 Instrument Return.......................................................................................... 115

4.3 Routine Maintenance.....................................................................................115

4.3.1 Battery Replacement .........................................................................115

4.3.2 Bias Voltage Fuse Replacement........................................................ 116

4.3.3 Resetting of Time and Date............................................................... 117

4.3.4 Loss of Display Contrast...................................................................117

4.3.5 Preventive Maintenance/Cleaning..................................................... 118

4.4 Calibration ..................................................................................................... 118

4.4.1 General............................................................................................... 118

4.4.2 Calibration Procedure........................................................................ 118

Page 5 of 118

Page 6 of 118

Warranty

QuadTech warrants that Products are free from defects in material and workmanship and, when properly used, will perform in accordance with QuadTech's applicable published specifications. If within one (1) year after original shipment it is found not to meet this standard, it will be repaired, or at the option of QuadTech, replaced at no charge when returned to a QuadTech service facility.

Changes in the Product not approved by QuadTech shall void this warranty.

QuadTech shall not be liable for any indirect, special or consequential damages, even if notice has been given of the possibility of such damages.

This warranty is in lieu of all other warranties, expressed or implied, including, but not limited to any implied warranty or merchantability or fitness for a particular purpose.

SERVICE POLICY

QuadTech policy is to maintain product repair capability for a period of at least five (5)

years after original shipment and to make this capability available at the then prevailing

schedule of charges.

Page 7 of 118

Page 8 of 118

Specifications

Measurement Capacitance (Cs/Cp), Inductance (Ls/Lp), Resistance (Rs/Rp), Parameters: Dissipation (DF) and Quality (Q) Factors, Impedance |Z|, Admittance |Y|, Phase Angle (θ), Equivalent Series Resistance (ESR), Conductance (Gp), Reactance (Xs), Susceptance (Bp) Any two parameters measured and displayed simultaneously

Measurement |Z|, R, X: 000.0001 mohm to 99.99999 Mohm Ranges: |Y|, G, B: 00000.01 µS to 9.999999 MS C: 00000.01 fF to 9.999999 F L: 0000.001 nH to 99.99999 H D: .0000001 to 99.99999 Q: .0000000 to 999999.9 Phase Angle: -180.0000 to +179.9999 degrees Delta %: -99.9999 % to +99.9999 %

Measurement Basic Accuracy: LCR: +/- 0.5%* +/- 0.25%* +/- 0.05%* DF: +/- 0.0050 +/- 0.0025 +/- 0.0005

* At optimum test signal levels, optimum DUT value and without calibration uncertainty error. Instrument accuracy can be reduced from nominal specifications when using some 7000 accessory fixtures and cables. Best accuracy requires geometric consistency between that utilized during open/short zeroing and that utilized on fixtures and cables during the actual measurement process. This consistency may be especially difficult to achieve when using unshielded Kelvin clip and tweezer type connections.

0.25 x (normal accuracy) with Load Correction implemented and compared to user supplied standard. In a range of 3Ω ≤ Z ≤ 80kΩ, 100mV ≤ programmed V ≤ 1V or 100mV ≤ (programmed I) x (Z) ≤ 1V

Test Frequency: 10 Hz to 500 kHz Resolution: 0.1 Hz from 10 Hz to 10 kHz, 5 digits > 10 kHz Accuracy: +/-(0.002% +0.02 Hz)

Measurement Speed: Basic Accuracy: 25 msec*/measurement Enhanced Accuracy: 125 msec*/measurement Extended Accuracy: 1 sec*/measurement

* may be longer, depending on test conditions & frequency

Ranging: Automatic or Range Hold

Note: s = series, p = parallel, ESR equivalent to Rs

Enhanced Extended

Page 9 of 118

Specifications (continued)

Source Impedance: 25Ω, 400Ω, 6.4 kΩ or 100 kΩ, measurement range dependent

Trigger: Internal (automatic) and External (via handler, RS-232 or IEEE-

488.2 interfaces)

AC Test Signal: Voltage: 20 mV to 5.0 V (open circuit) in 5 mV steps Accuracy: +/- (5% + 1 mV) ≤ 100kHz +/- (10% + 1 mV) > 100kHz Current: 250 µA to 100 mA* (short circuit) in 50 µA steps Accuracy: +/- (5% +50 µA) ≤ 100kHz +/- (10% +50 µA) > 100kHz

* Can exceed 100 mA in some cases

Bias Voltage: Internal: 2.0 V External: 0 to 200 V

Display: LCD Graphics with adjustable contrast and back light

- Results of Dual Measurement Parameters in engineering (7 digits) or scientific (5 digits) notation

- Deviation from Nominal of Primary Parameter

- % Deviation from Nominal of Primary Parameter

- Instrument Setting and Test Conditions

- Bin Limits and Pass/Fail Results

- Plot of Primary Measurement Parameter vs. Test Conditions

- Table of Measurement Parameters vs. Test Conditions

- Sequenced Test Results Summary

Limit Detection: 15 bins total (10 pass, 4 fail, 1 no contact)

Interfaces: IEEE-488.2, RS-232, Handler, Printer Port and 3.5" Floppy Drive

Front Panel Four terminal (BNC) with Guard Test Terminals:

Environmental: MIL-T-28800E, Type 3, Class 5, Style E & F. Operating: 0 to + 50o C Storage: - 40 to + 71o C Humidity: < 75% for < 40o C operating Altitude <2000m, Installation Category 1, Pollution Degree 1

Page 10 of 118

8/C

2 / C

Specifications (continued)

Mechanical: Bench mount with tilt bail Dimensions: (w x h x d): 16 x 6 x 14in (410 x 150 x 360mm) Weight: 17 lbs (8kg) net, 23 lbs (10.5kg) shipping

Power Requirements: 90 to 250Vac 47 - 63 Hz 100W maximum

Other Features: Charged Capacitor Protection:

C = Capacitance in farads of the device under test

Measurement Delay programmable from 0-1000 ms in 1 ms steps Measurement Averaging programmable from 1-1000 Median Value Mode Open and Short Circuit Zeroing at Multiple Frequencies Power Fail Protection (setting, results, & calibration data stored) Storage and Recall of 25 Setups, 125/disk w/Floppy Option Self-Test Routines at Power-up Stored Results up to 40,000 measurements/disk w/Floppy Option Self Accuracy Calibration and Display Contact Check

Supplied: Instruction Manual Power Cable Calibration Certificate

Ordering Description Catalog No. Information:

7400 Precision LCR Meter, Model B 7400 7400-CE Precision LCR Meter, Model B 7400-CE 7400A Precision LCR Meter, Model B +/-500V ext bias 7400A 7400A-CE Precision LCR Meter, Model B+/-500V ext bias 7400A-CE 7400C Precision LCR Meter, Model B charged C protection 7400C 7400C-CE Precision LCR Meter, Model B

Options & Accessories: Rack Mount Kit 7000-00

BNC Cable Set, 1 meter 7000-01 BNC Cable Set, 2 meters 7000-02 Kelvin Clip Leads 7000-03 Alligator Clip Leads 7000-04 Chip Component Tweezers 7000-05 Low Voltage Axial/Radial Lead Component Test Fixture 7000-06 Low Voltage Chip Component Test Fixture 7000-07 High Voltage Test Fixture 7000-08 Calibration Kit 7000-09

for Vmax ≤ 250 V

for Vmax ≤ 1000V

charged C prot.

7400C-CE

Page 11 of 118

Section 1 Introduction

1.1 Unpacking and Inspection

Inspect the shipping carton before opening, if damaged contact the carrier’s agent immediately. Inspect the instrument for any damage. If the instrument appears damaged or fails to meet specifications notify QuadTech (refer to instruction manual front cover) or its local representative. Retain the shipping carton and packing material for future use such as returning for recalibration or service.

1.2 Product Overview

The 7400 Precision LCR Meter is an automatic, user programmable instrument for measuring a wide variety of impedance parameters. The 7400 instrument covers a frequency range from 10 Hz to 500 kHz with a basic measurement accuracy of 0.05%. The instrument’s high-resolution graphics display and keypad makes for easy menu programming. Test conditions are stored and recalled from internal memory, eliminating wasted measurement setup time. Extensive pass/fail binning capability and measurements speeds up to 40/sec makes the unit well suited for production applications.

The instrument's unique measurement sequencing allows up to six parameters to be measured on a single pass. Additionally, a parameter can be plotted against a test condition variable, an invaluable technique for component design and product evaluation.

The 7400 instrument comes with IEEE-488.2, RS-232, I/O port (handler), and parallel interfaces, all standard, for remote control operation and communication with other instrumentation. A 3 1/2" floppy drive is also included for program/data storage of test conditions and measurement results.

Introduction

QuadTech

Precision

7400

LCR Meter

CAUTION

HIGH VOLTAGE

DISPLAY SELECT ENTRY TEST

17.52520 pF

.0000100

Freq Range Delay

1.0000kHz 0 ms

AC Signal AverageAuto Bias

1.0000V 1 Off

12 4 7

CNCL

ENTER

Figure 1-1

7400 Precision LCR Meter

FAIL PASS

STOP

START

Page 13 of 118

23456

789

1.3 Controls and Indicators

Figure 1-2 shows the controls and indicators on the front panel of the 7400. Table 1-1 identifies them with descriptions and functions.

QuadTech

Precision

7400

LCR Meter

CAUTION

HIGH VOLTAGE

DISPLAY SELECT ENTRY TEST

17.52520 pF

.0000100

Freq

1.0000kHz Range Delay

AC Signal AverageAuto Bias0 ms

1.0 V 1 Off

12 4

CNCL

ENTER

11 12 131

FAIL PASS

STOP

START

Figure 1-2

Front Panel Controls & Indicators

Table 1-1

Front Panel Controls and Indicators

Figure 1-2 Ref. No. Item Function

1 Input Panel BNC connectors, for connection to device under test (DUT). 7/8 inch spacing. IL Current, low connection to DUT PL Potential, low connection to DUT PH Potential, high connection to DUT IH Current, high connection to DUT

2 Voltage indicator Indicates when external dc bias voltage is called for or applied to rear panel connectors, from external source

3 Graphics display Displays test conditions, measured results, instrument status and user interface menus.

Page 14 of 118 Introduction

Table 1-1 (continued)

Front Panel Controls and Indicators

Figure 1-2 Ref. No. Item Function

Select keys (4)

Soft key functions as indicated on the

adjacent LCD display.

- from top to bottom, functions such as up, down, right or left arrow during menu selection.

- other functions such as measurement units, exponent, Y or N (yes or no) and del (delete).

5 Keypad (12) For making numerical entries as labeled, 0 through 9, minus sign and decimal.

6 CNCL key Exits an active field in vertical or horizontal selections, clears entry on # fields when pressed once and exits # fields when pressed twice.

7 MENU key Enters menu display mode or exits sub menu back to main menu.

ENTER key

Switches user to entry mode or accepts

menu entry as entered.

Pass/Fail indicator

Indicates measurement results based on

entered test limits.

10 STOP key Stops the measurement process.

11 START key Starts the measurement process.

Power switch

Turns main power to instrument on or off.

Floppy drive

For storing measurement setup conditions and measurement results. A high density (1.44M) or low density (720K) DOS 3.5" compatible floppy drive. Floppies should be double sided, formatted for DOS compatibility.

Introduction

Page 15 of 118

23456

BIAS VOLTAGE

200V MAX

BATTERY

90 - 250 V 47 - 63 Hz 100 WATTS MAX

IEEE-488 INTERFACE

PARALLEL PORT RS-232 INTERFACE

I/O PORT

Figure 1-3

Rear Panel View

Table 1-2

Rear Panel Connectors and Controls

Figure 1-3 Ref. No. Item Function

1 ! AC Inlet Module AC power input, filtering, fusing and switching. Use with Belden SPH-386 socket or equivalent. Contains T2.5A, 250V, 5x20mm time delay fuse for 115 or 120V operation. Replace only with the same type and rating. Also refer to paragraph 1.6.2.

2 IEEE-488.2 Input/output connections according to IEEE STD-488.2. 24 pin socket for standard IEEE-488 cable. Refer to paragraph 2.7.3.

I/O Connector

Connection to component handler. 36 pin Amp connector, mates with Amp 552302-1 plug and 552073-5 strain relief cover or ribbon cable clamp connector 553600-1 or equivalents. Refer to paragraph 2.7.1

4 Parallel Port Connection to parallel printer. Type DB25 (25 pin) female connector. Refer to paragraph 2.7.2.

RS232 Connector

Connection according to RS232 std interface. Type DB9 (9 pin) male connector. Refer to paragraph 2.7.4.

Page 16 of 118 Introduction

Table 1-2 (continued)

Rear Panel Connectors and Controls

Figure 1-3 Ref. No. Item Function

6 ! Bias Voltage External bias input, maximum of +/-200Vdc. Contains F0.25A, 250V, 5x20mm fast blow fuse. Replace only with the same type and rating. Also refer to paragraph 2.6.2.5.

Battery

DC source for backup of system memory, 3 standard alkaline AA batteries which should be replaced annually (Refer to paragraph 4.3.1)

1.4 Accessories Included

Table 1-3

Item Quantity

Instruction Manual 1 Calibration Certificate 1 Power Cord (CE units with international cord set) 1 Fuse (T2.5A, 250V, 5x20mm, for 115/120V operation) 1

1.5 Accessories/Options Available

Table 1-4

Item Part Number

Rack Mount Kit 7000-00 BNC Cable Set, 1 meter 7000-01 BNC Cable Set, 2 meters 7000-02 Kelvin Clip Leads 7000-03 Alligator Clip Leads 7000-04 Clip Component Tweezers 7000-05 Low Voltage Axial/Radial Lead Component Test Fixture 7000-06 Low Voltage Chip Component Test Fixture 7000-07 High Voltage Test Fixture 7000-08 Calibration Kit 7000-09

Introduction

Page 17 of 118

1.6 Installation

1.6.1 Instrument Positioning

The 7400 contains a high resolution back lit LCD for convenient viewing. The optimum angle for viewing is straight onto the display. This means that for bench operation the front bail should sometimes be used to angle the instrument up and for rack installation it should be mounted somewhat at eye level.

1.6.2 Power Requirements

The 7400 Precision LCR Meter can be operated from a power source between 90

and 250Vac at a power line frequency of 47 to 63Hz, no line voltage switching is necessary. Power connection to the rear panel is through an ac inlet module comprised of an ac connector and fuse drawer. Before connecting the 3-wire power cord between the unit and AC power the fuse should be in accordance with the power source, T2.5A, 250V, 5x20mm (QuadTech PN 520049) for 115 or 120V source. Always use an outlet that has a properly connected protection ground. The 7400 unit is factory shipped with

the 2.5A fuse in place. The instrument can be damaged if the wrong fuse is installed.

MAKE SURE THE UNIT HAS BEEN DISCONNECTED FROM ITS AC POWER

To change the fuse proceed as follows:

WARNING

SOURCE FOR AT LEAST FIVE MINUTES BEFORE PROCEEDING.

Fuse drawer with release tab

BIAS VOLTAGE

200V MAX

BATTERY

IEEE-488 INTERFACE

PARALLEL PORT RS-232 INTERFACE

I/O PORT

90 - 250 V 47 - 63 Hz 100 WATTS MAX

Figure 1-4

Fuse Drawer

Page 18 of 118 Introduction

Spare fus

Contacts

Remove the fuse drawer by inserting a small flat head screwdriver behind the small

•

tab to force the draw outward. Refer to Figure 1-4.

•

Once the fuse draw has been completely removed from the instrument remove the

clear fuse tray from the drawer by lifting upward slightly on the long narrow black locking tab. This will allow the fuse tray to be removed from the fuse draw. This tray contains the active fuse, left side (secured by holder) and spare fuse on the right side (if present). Refer to Figure 1-5.

• Remove the active fuse from the holder by prying upward using a small flat head

screwdriver. Insert the replacement fuse into the fuse holder.

• Once the fuse has been installed in the holder and spare fuse (if desired) installed in

the right side of the tray insert the tray back into the fuse drawer, push in and lock. The two silver contacts on the fuse tray should be positioned towards the outside.

• Once the fuse tray has been installed in the draw, reinstall the fuse draw back into the

instrument ac inlet module, push in and lock.

Active fuse in holder this side

Locking tab

this side

Figure 1-5

Fuse Drawer

Introduction

Page 19 of 118

1.6.3 Safety Inspection

Before operating the instrument inspect the power inlet module on the rear of the

7400 to ensure that the properly rated fuse is in place, otherwise damage to unit is possible. Refer to paragraph 1.6.2.

The 7400 is shipped with a standard U.S. power cord, QuadTech PN 4200-0300 (with Belden SPH-386 socket or equivalent, and 3 wire plug conforming to IEC 320) and CE units with an approved international cord set. Make sure the instrument is only used with these cables (or other approved international cord set) which ensures the instrument is provided with connection to protective earth ground.

When the 7400 is used in a rack installation (using the QuadTech 7000-00 Rack Mount Kit) make sure the unit is secured using the cabinet mounting rails and not secured solely by the front panel angle brackets.

In bench or rack mount applications the instrument should be positioned with consideration for ample air flow to the rear panel fan ventilation holes. An open space of at least 3 inches (75mm) is recommend behind the rear panel. The surrounding environment should be

free from excessive dust

to prevent contamination of electronic

circuits.

If this instrument is used in a manner not specified in this manual

WARNING

If this instrument is used in a manner not specified in this manual protection to the

operator and equipment may be impaired.

Page 20 of 118 Introduction

Section 2 Operation

2.1 General

Once the 7400 unit is powered up it is ready immediately for testing, at default test conditions, by pressing the START button. Power-up default conditions are discussed

in paragraph 2.5.2. Any of these conditions and all other instrument operations can be changed by easy-to-use menu functions, for simplicity of understanding, descriptions and uses of all these functions refer to menu discussions in paragraph 2.6. The Contents list in the front of this manual should be used for quickly locating specific subjects of interest.

NOTE

For optimum measurement results at specified accuracy a 30-minute instrument

warm-up period is highly recommended.

2.2 Startup

Connect the instrument power cord to the source of proper voltage. The instrument is to be used only with three-wire grounded outlets. The proper fuse must be installed as described in paragraph 1.6.2.

Power is applied to the 7400 by pressing the POWER button on the front panel. The instrument runs a self-test and any error messages are displayed accordingly.

2.3 Connection to Device Under Test

The 7400 instrument employs a four terminal measurement configuration that permits easy, accurate and stable measurements and avoids mutual inductance, interference from measurement signals, noise and other factors inherent with other types of connections. To help maintain measurement integrity, QuadTech makes available a number of accessory cable sets and fixtures for connection directly to the front panel BNC connectors. Refer to paragraph 1.5 for a list of available accessories.

Operation Page 21 of 118

DUT

7400

Precision LCR Meter

Ground

IH PH PL IL

CAUTION

HIGH VOLTAGE

IL IH

PL PH

Figure 2-1 Figure 2-2 Panel Layout Test Lead Configuration

Figures 2-1 and 2-2 show the 7400 connector configuration and a typical four terminal connection to the device under test. H and L on the 7400 denote polarity of AC test

signal at the measurement terminals as well as + and - polarity of DC bias voltage when applied to the DUT. Refer to paragraph 2.8 for information on operation and

connection of QuadTech accessory cables and fixtures.

WARNING

When DC bias is applied, the PH connection carries a DC positive voltage with respect to

ground.

2.4 Zeroing

Before making measurements, the 7400 should be zeroed to correct for test lead and/or fixture errors. During the zeroing process corrections are calculated and stored in instrument memory and applied to subsequent measurements. Measurement accuracy is specified at the end of the QuadTech one meter cable (7000-01). Open and short circuit zeroing should be done at the end of this cable. In order to maintain instrument accuracy with other cable lengths the instrument should be re calibrated using the QuadTech 700009 Calibration Kit and the alternate cable. Generally the unit should be zeroed at least once per day and each time test leads or fixture are changed. zero if the test frequency is changed. The zeroing routine is accessed through the Utilities Menu as follows:

•

Press MENU key

•

Press LEFT/RIGHT ARROW to select Utilities menu

• Press UP/DOWN ARROW key for Open / Short

•

Press ENTER

It is not necessary to re-

For guarded measurements connect to DUT shield

Page 22 of 118 Operation

Follow the instructions shown on the LCD display for open and short circuit zeroing of test leads and/or fixture. During the Open Test the leads or fixture should be open with no component connected. During the Short Test leads should be connected or fixture shorted (using a clean copper wire, as short as possible). Refer to paragraph 2.6.5.4 as necessary for more detail.

2.5 Measurement Procedure

2.5.1 General

Whenever the 7400 instrument is powered up it is ready immediately to begin measuring at default test conditions. Initially, these conditions will be set to a factory

default but can be changed by the user and stored to overwrite factory default.

initiate a test once a device is connected press START;

the LCD display shows the measured results and test conditions similar to the illustration of Figure 2-3. For information on changing test conditions refer to paragraph 2-6 on Menu Functions.

NOTE

For optimum measurement results at specified accuracy a 30-minute instrument

warm-up period is highly recommended.

Measured Parameters

Voltage

RETST

pFCs 17.52510

Freq Range Delay

2.5.2 Default Measurement Conditions

A set of default measurement conditions are initially established at the factory and stored in instrument memory. Default conditions are those that determine the instruments status on power up, thus the instrument is always set to a known state before any testing begins. The user can change these conditions to tailor the test to a specific application. Refer to paragraph 2.6.5.1 under Save Setup on the Utilities menu.

0.0000500

1.0000kHz Auto

Figure 2-3

Measured Results Display

AC Signal Average Bias

1.000V 1 Off0 ms

Operation Page 23 of 118

Factory default measurement conditions are:

Under Setup Menu Primary Parameter - Auto Secondary Parameter - None Frequency - 1 kHz AC Test Signal - 1V DC Bias Voltage - Off Range Hold - Off Range Locked - 0 Measurement Accuracy - Enhanced Delay Time - 0 # to Average - 1 Contact Check - Off

Under I/O Menu Display Type - Measured Parameters Nominal Value - None Result Format - Engineering Trigger - External Handler - On RS-232 - Disable IEEE - Disable Print Results - Off Results to Floppy - Off

Under Analysis Menu Binning - None Test Sequence - Off Parameter Sweep - Off Median - Off Distort Detect - On Load Correction - Off

Under Utilities Menu Lockout - Off Backlite - On

Page 24 of 118 Operation

2.6 Menu Functions

2.6.1 General

All programmable functions of the Model 7400 are controlled by easy to use menu displays. The user enters the menu mode by selecting the MENU key that calls up four top level menus, Setup, I/O, Analysis and Utilities. Each one of these is comprised of a sub menu list whose functions are described in detail below. Maneuvering around the menu listing is accomplished in a fashion similar to an Automatic Teller Machine (ATM) using the UP, DOWN, RIGHT and LEFT arrow keys as indicated on the adjacent LCD display. A highlighted menu function can be controlled by selecting the ENTER key,

making the desired entry or selection and pressing ENTER again to implement.

2.6.2 Setup Menu

Setup

Primary Parameter

Secondary Parameter Frequency AC Test Signal DC Bias Voltage Range Hold Off On Range Locked = 0 Measurement Accuracy Measurement Delay # to Average Contact Check

I/0 Utilities

(ms)

Analysis

= 1.0000 kHz

Off

= 0 = 1

Off

Int

>> >>

Ext

Figure 2-4

Setup Menu

The first of the four main menus is Setup, shown above. Each function controls a 7400 measurement condition and is described in detail below.

Operation Page 25 of 118

Setup I/O Analysis Utilities

- On

Primary Parameter

Secondary Parameter

Frequency - (numeric entry)

AC Test Signal

- Voltage

- Current

- Value - (numeric entry)

DC Bias Voltage

- Off

- Int

- Ext

- OffRange Hold

- On

Range Locked - (numeric entry)

Measurement Accuracy

- Basic

- Enhanced

- Extended

Measurement Delay - (numeric entry)

# to Average - (numeric entry)

None

DF Q ESR

Rs Rp Gp Cs Cp

Ls Lp

|Z| |Y| Xs Bp

Auto Cs Cp Ls Lp Rs Rp DF Q |Z| |Y|

ESR Gp Xs Bp

Contact Check - Off

2.6.2.1 Primary Parameter

Pri Param

Auto

Cs Cp Ls Lp Rs Rp DF Q |Z| |Y|

(more)

HIT MENU TO RETURN TO MAIN MENU

Additional Parameters not shown may be selected by UP/DOWN arrow keys and include:

θθθθ

, ESR, Gp, Xs, Bp

I/0 UtilitiesSetup

Analysis

Figure 2-5

Primary Parameters

Page 26 of 118 Operation

Any combination of two parameters can be measured and displayed simultaneously on the 7400, one referred to as the Primary (displayed first) and the other the Secondary. The instrument as powered up provides a default primary parameter selection of Auto, a feature that enables any passive component to be measured without knowing what type of component it is. Depending on the component type the primary and secondary default could be Cs & DF, Rs & Q, or Ls & Q. The parameter selection can be chosen by the operator through menu selection as shown in Figure 2-5 above. In addition to Auto, the following selections are possible and discussed in more detail below.

Cs - Capacitance in farads |Z| - Impedance magnitude in ohms Cp - Capacitance in farads |Y| - Admittance magnitude in siemens Ls - Inductance in henries θ - Phase angle in degrees Lp - Inductance in henries ESR - Equivalent series resistance in ohms Rs - Resistance in ohms Gp - Conductance in siemens Rp - Resistance in ohms Xs - Reactance in ohms DF- Dissipation Factor (no units) Bp - Susceptance in siemens Q - Quality Factor (no units)

s = series equivalent circuit p = parallel equivalent circuit

An impedance that is neither a pure resistance nor a pure reactance can be represented at any specific frequency by either a series or a parallel combination of resistance and reactance. Such a representation is called an equivalent circuit. The value of the primary measurement of a device depends on which equivalent circuit, series or parallel, is chosen to represent it. The manufacturer or user of a device specifies how a device is to be measured (usually series) and at what frequency. If this is not known, be sure to specify if the results were series or parallel and at what frequency.

Series and parallel equivalent circuits for a lossy inductor and lossy capacitor are shown in Figure 2-6.

Operation Page 27 of 118

Rp or

Figure 2-6

Series and Parallel Circuits for both Capacitive and Inductive Impedances

Impedance is the parameter used to characterize electronic components, materials and circuits. Impedance |Z| is defined as the opposition a device or circuit offers to the flow of ac current at a particular frequency and is generally represented as a complex quantity consisting of a real part (resistance, R) and imaginary part (reactance, jX). Impedance can be expressed using the rectangular coordinate form (R + jX) or polar form as magnitude and phase angle (|Z| ∠θ). Figure 2-7 shows the mathematical relationship between R, X, |Z|, and θ for both inductive and capacitive devices. In some cases it becomes mathematically practical to represent impedance using the reciprocal where 1/|Z| = |Y| = |G + jB|, where |Y| represents admittance, G conductance, and B susceptance. This mathematical relationship is shown in Figure 2-8 for inductive and capacitive devices.

+jX

+j Ls

|Z|

Rp or

-j/ Cs

-jX

|Z|

Impedance

-jXRs

InductanceCapacitance

Figure 2-7

Phasor Diagrams of Impedances

Page 28 of 118 Operation

j Cp

+jB

|Y|

+jB

InductanceCapacitance

-j/ Lp

|Y|

-jB

Admittance

Figure 2-8

Phasor Diagrams of Admittances

Quality factor (Q) is used as a measure of a reactance's purity (how close it is to being a pure reactance, i.e. no resistance) and defined as the ratio of the energy stored in a device to the energy dissipated by the device. Q is dimensionless and is expressed as Q = X/R = B/G. From Figure 2-8 one can see that Q is the tangent of the angle φ. Q is commonly applied to inductors and for capacitors the term generally used to express purity is Dissipation Factor (D), which is the reciprocal of Q.

Any parameter, primary or secondary, can be chosen as the default parameter at power up, refer to paragraph 2.6.5.1, changing default conditions.

2.6.2.2 Secondary Parameter

Sec Param

None

DF Q ESR

θθθθ

Rs Rp Gp Cs Cp Ls

(more)

HIT MENU TO RETURN TO MAIN MENU

I/0 UtilitiesSetup

Analysis

Figure 2-9

Secondary Parameter

Operation Page 29 of 118

Additional Parameters not shown and selected by UP/DOWN arrow keys include: Lp,

|Z|, |Y|, Xs, Bp

As in the primary parameter selection, any parameter can be chosen by the operator for display. The instrument as powered up provides a default secondary parameter. When the default primary parameter is Auto the secondary parameter is dependent and determined by it. If the primary default is Cs the secondary defaults to D. If the primary default is Ls or Rs the secondary defaults to Q. The parameter selection can be chosen by the operator through menu selection as shown in Figure 2-9.

2.6.2.3 Frequency

Numerical entry accepts up to five digits with decimal, of the desired test frequency between 10 Hz and 500 kHz. Resolution of setting is 0.1 Hz from 10 Hz to 10 kHz and 5 digits above 10 kHz.

Units of frequency,

Hz, kHz, or MHz

are selected by the

UP/DOWN

arrow keys.

2.6.2.4 AC Test Signal

Setup AC Signal

Signal Type

Signal Value

I/0 Utilities

Analysis

Voltage

= 1.000 V

Current

HIT MENU TO RETURN TO MAIN MENU

Figure 2-10

AC Test Signal

RIGHT/LEFT arrow keys allow selection of the AC Signal Type as either a

Voltage

source or Current source.

With Signal Type selected as Voltage, Signal Value accepts entry of a value between .020 and 5 volts (open circuit) in 0.005 V steps. With Signal Type selected as

Current,

Signal Value accepts entry of a value between

.00025 and .1 amp (short circuit) in .00005 amp steps.

Numerical values can be entered directly with units. Units for voltage value, mV or V and units of current value, µµµµ

Page 30 of 118 Operation

A, mA or A are selected by the UP/DOWN arrow keys. Any

numerical entries with resolution greater than .005 (5 mV) for voltage or .00005 (50

µµµµ

A) for current will be truncated or ignored.

In voltage mode the selected voltage is maintained at the instrument test terminals with the terminals open, but not necessarily at the device under test. In current mode the selected current is maintained at the device under test, independent of changes in the device's impedance.

The current required to test a device

may exceed 100 mA

if the source voltage is programmed to greater than 2.5 V. To determine the current required use the following formula:

=++25

I Vprog R X

()()

dut dut

If the current is greater than 100 mA reduce the program voltage, otherwise unpredictable measurement results may occur. It should also be noted that even though the maximum programmable current is 100 mA

3 volts in current mode

, i.e. (I) times (Z) must be less than 3 volts otherwise erratic

the instrument is limited to a compliance voltage of

measurement results could result.

Operation Page 31 of 118

Maximi m Reccomended Test Frequency in C urrent Mode

vs.

Inductance

1.0E+6

400 kHz

Testing in current

100.0E+3

Current Testi ng O K

below thi s li ne

10.0E+3

mode may give Q

errors for induc t ors

above thi s l i ne

35 kHz

_________

sqrt(L(mH))

1.0E+3

1.00E-06 1.00E-05 1.00E-04 1.00E-03 1.00E-02 1.00E-01 1.00E+00

Maximum Test Frequency vs. Measured Inductance

(In Current Mode)

2.6.2.5 DC Bias Voltage

Allows selection of a dc Bias Voltage of

Off, Internal or External.

•

Int - When selected an internal bias voltage of 2 volts is applied to the device under

- When selected

Off

no dc bias

voltage is applied to the device under test.

test. Internal bias can not be programmed if the AC Test Signal is programmed for > 4V at 500kHz.

•

Ext - When selected an external bias voltage between 0 and +/-200 volts can be

applied to the device under test by way of the rear panel external bias connection.

Page 32 of 118 Operation

Make sure the

WARNING

AC test Signal is selected for VOLTAGE and not Current

before

switching to INT (internal) or EXT (external) bias. This also applies to the instrument's

Default setup at power-up or any setups recalled from memory, they

VOLTAGE

sustain damage from any external source or from a charge stored on the device under test.

When using external bias, the unit must be

External bias supply must be

before applying bias. If programmed to CURRENT the instrument can

programmed for EXT bias

external bias supply is connected to the 7400.

returned to zero volts and turned off

MUST be set to

before the

before switching

back to the OFF or INT mode.

The

BIAS ON indicator

, adjacent to the BNC measurement terminals, serves to indicate

if external bias has been called for. It indicates that external bias connections have been switched in, but not necessarily the presence of external bias.

When dc bias is to be applied to a device observe the correct polarity when connecting the bridge or inserting the device in a test fixture. Bias POSITIVE polarity is applied

to the high terminals (PH, IH), and bias NEGATIVE polarity applied to the low terminals (PL, IL). It is good practice to wait approximately 1 second after initiating a

measurement before taking a reading, this allows the device to stabilize after bias is applied. When the instrument is triggered remotely, a programmed delay is advisable to ensure that the device has stabilized.

If bias is required at voltages other than the internal 2 volts, an external bias can be used as discussed below.

•

Be sure that the voltage does not exceed +/-200 volts.

• A current limiting voltage supply is recommended, with a limit set at 200 mA.

•

The bias supply must be floating, DO NOT connect either side to ground.

When using a single polarity supply for positive or negative biasing observe proper

polarity when connecting to the 7400. For positive bias the positive output of the supply must be connected to Bias Voltage + and the negative to Bias Voltage -. The opposite is true for negative bias, the negative output of the supply must be connected to the Bias Voltage + and the positive to Bias Voltage -.

•

Generally the external circuit must provide switching for both application of bias

after the device is connected and discharge before it is removed.

•

A well-filtered supply is recommended. Hum can affect some measurements,

particularly at power line frequencies.

Operation Page 33 of 118

When applying a bias voltage there are two effects to be aware of in watching for stabilization of the DUT: voltage and capacitance. Besides charging to a final voltage, there is also the stabilization of capacitance value itself. For example, some electrolytic capacitors respond slowly to a change in applied voltage, therefore the capacitance can be changing well after the voltage is stable. In general DC bias should only be applied to capacitors,

impedance devices.

unreliable measurement results can occur if DC bias is applied to low

When applying external bias on capacitors below 200pF with an

AC signal level below 100mV the instrument can exhibit excessive noise.

2.6.2.6 Range Hold

Allows selection of Range Hold

Off or On

To eliminate operator errors in range setting and ensure specified instrument accuracy the 7400 Range Hold should generally be left Off.

There may be exceptions to this when repetitive measurements are

to be made over a concentrated range of values and there is a desire to reduce test time by eliminating range switching.

•

Off - When selected the instrument automatically selects the optimum range for the

test voltage and test frequency selected and the impedance being measured.

• On - When selected the range is held based on the one currently selected, 1 through

59. Measured results outside the bounds of a selected range will be indicated by an

OVER RANGE or UNDER RANGE display message.

NOTE

The 7400 unit provides an extensive array of range switching based on the user test

conditions selected and impedance being measured. Refer to paragraph 2.6.2.7.

One of the most important uses of the range holding capability is to avoid range changes when the component is removed from a fixture when repetitive internal triggering is selected. With no component connected the instrument can go into a range search and time is lost when the next component is connected. Another use of range hold occurs when measuring components of the same nominal value whose actual values spread across the boundary of two ranges. If allowed to auto range, the units and decimal point can change with the range and confuse the operator. It is important to note that when a

range is held which is not the range the instrument auto ranging would have selected, some accuracy may be sacrificed.

2.6.2.7 Range Locked

Accepts entry of selected measurement ranges between

0 and 59 (as listed below)

, 0 for no range locked and others for the selected range. Measurement ranges are a function of the impedance being measured (Z), selected test frequency (F) and ac test voltage (V). For best measurement results the instrument is generally recommended to operate with Range Hold to Off and Range Locked to 0. It is possible to calculate a range, based on Z, F and V, as detailed below.

Page 34 of 118 Operation

AC Signal Voltage Mode

Measurement Range #'s

1 2 3

5 6 7

9 10 11

17 18 19

21 22 23

25 26 27

33 34 35

37 38 39

41 42 43

49 50 51

53 54 55

57 58 59

Determine Range where R# = R1 + R2 + R3 where R1 = 1 and K* = 10 µA if F < 25 kHz and I < 10 µA

= 17 and K* = 160 µA if F < 200 kHz and I < 160 µA = 33 and K* = 2.56 mA if I < 2.56 mA = 49 and K* = 40 mA if I ≥ 2.56 mA

* value for K required in calculation of R3 below

Z25

Vi = 10V if V ≤ 0.1V = V if V > 0.1 and < 1.01 = V/5 if ≥ 1.01

V = programmed ac test voltage Z = impedance value Z in ohms of the device

under test (refer to Figures 2-11 and 2-12 to help determine Z in terms of capacitive and inductive reactance).

where R2 = 0 if (I)(Z) > 0.25 = 1 if (I)(Z) > 0.1 = 2 if (I)(Z) > 0.025

where R3 = 0 if I / K > 0.25 = 4 if I / K > 0.1 = 8 if I / K > 0.025

Operation Page 35 of 118

AC Signal Current Mode

Measurement Range #'s

33 34 35

37 38 39

41 42 43

49 50 51

53 54 55

57 58 59

133 134 135

137 138 139

141 142 143

149 150 151

153 154 155

157 158 159

Determine Range where R# = R + R1 + R2 + R3 where R = 33 and Rs = 400Ω if I ≤ 2.2mA

= 49 and Rs = 25Ω if I > 2.2mA

I = programmed ac test current

where R1 = 0 and Vs = 1.0 if E

DUT

= 100 and Vs = 5.0 if E

or E

DUT

DET

or E

≤ 1.0

> 1.0

DET

2.6.2.4 AC Test Signal

= (I) (Z)

DUT

= (I) (Rs)

DET

this value must be less than 3.0, reference paragraph

Z = impedance value Z in ohms of the device under test (refer to Figures 2-11 and 2-12 to help determine Z in terms of capacitive and inductive reactance).

where R2 = 0 if E = 1 if E = 2 if E

/Vs > 0.25

DUT

/Vs ≤ 0.25

DUT

/Vs ≤ 0.1

DUT

where R3 = 0 if E = 4 if E = 8 if E

/Vs > 0.25

DET

/Vs ≤ 0.25

DET

/Vs ≤ 0.1

DET

Page 36 of 118 Operation

Capacitive Reactance (Xc=1/(2pifC))

1000000000

100000000

10000000

1000000

0.1pF

1.0pF

10pF

100pF

1.0nF

10nF

100nF

1.0uF10uF100uF1.0mF10mF

Ohms

100000

10000

1000

100

0.1

0.01 10 100 1000 10000 100000 1000000 10000000

Frequency

Figure 2-11

Capacitive Reactance vs. Frequency

Operation Page 37 of 118

Inductive Reactance (Xl = 2pi f L)

1000000000

100000000

10000000

1000000

100000

10000

Ohms

1000

100

0.1

0.01

1kH 100H 10H

100mH

10mH

1mH

100uH

10uH

1uH

100nH

10nH

10 100 1000 10000 100000 1000000 10000000

Frequency

Figure 2-12

Inductive Reactance vs. Frequency

Page 38 of 118 Operation

2.6.2.8 Measurement Accuracy

Setup Accuracy

Basic .1% 40 meas / sec

Enhanced Extended

I/0 Utilities

Analysis

Voltage .05% 8 meas / sec .01% 1 meas / sec

HIT MENU TO RETURN TO MAIN MENU

Figure 2-13

Measurement Accuracy

Allows selection of a Measurement Accuracy of Basic, Enhanced or Extended.

There is a tradeoff of measurement speed vs. accuracy. The meter will make a more precise and accurate measurement at a slower rate. The speed/accuracy tradeoff is as follows:

• Basic - Measurement time of 25 ms (or one frequency cycle, whichever is longer),

nominal accuracy of 0.5%.

••••

Enhanced - Measurement time is 125 ms, nominal accuracy of 0.25%.

•

Extended

- Measurement time is 1 sec, nominal accuracy of

0.05%.

NOTE

Measurement times may be longer depending on frequency and other test conditions.

One complete cycle of stimulus voltage is required for measurement. For example: at 10

Hz, 100 ms (1 cycle) is required just to collect data.

2.6.2.9 Measurement Delay

Accepts entry of a delay time between

0 and 1000

in 1 ms steps. This is a programmable delay time from the internal or external trigger command to the start of the measurement. In many cases it is helpful to have a time delay before actually starting to take data. Such a delay allows time for switching transients or mechanical handling to settle.

Operation Page 39 of 118

2.6.2.10 # to Average

Accepts entry of the number of measurements to Average between 1 and 1000. If the entered value is 1, averaging is disabled and the display is updated with each individual measurement. If the average is 2 to 1000 the final average value is displayed at the end of the measurement cycle and held until the end of the next measurement cycle.

Measurement accuracy can be improved as noted below and will be indicated on the AutoAcc display (but never less than 0.05% for primary parameter or 0.0005 for secondary parameter).

If the number to average is greater than 1: Divide the primary accuracy by the square root of the number to average. Divide the secondary accuracy by the square root of the number to average.

2.6.2.11 Contact Check

Allows selection of Contact Check Off or On. When on, any detection of contact failure or open circuit to the device under test will be indicated prior to the measurement. A contact failure is considered to be an open circuit greater than the open circuit calibration of the instrument.

Contact Check is generally recommended in automatic handler/production type applications with the 7400. For Contact Check operation the Range Hold must

be selected ON, paragraph 2.6.2.6.

NOTE

A contact check is possible on three of the four Kelvin connections by a loss of voltage detecting technique, a failure on the PL connection can't be detected since it is at virtual ground potential, internal to the instrument. The contact check is likely to be unreliable when measuring devices of less than 100 mΩ of impedance.

Page 40 of 118 Operation

Setup I/O Analysis Utilities

- On

- Enable

2.6.3 I/O Menu

I/0

Display Type >>

Nominal Value = 0 Result Format Trigger Handler RS-232 IEEE >> Print Results Results to Floppy

Analysis

UtilitiesSetup

EngSci

Int Ext

Off

Off Off

On On

The second of the four main menus is I/O, shown above. Each function controls measurement results or instrument I/O interface and is described in detail below.

Display Type

Nominal Value - (numeric entry)

Result Format - Sci

- Eng

Trigger - Int

- Ext

Handler - Off

- On

RS-232

Figure 2-14

I/O Menu

Stop Bits - 1

Mode - Talk

- Talk/Listen

Measured Parmeters Deviation from Nominal % Deviation from Nominal Pass/Fail Bin Summary Bin Number No Display

Parity - None

Data Bits - 7

- 8

- 2

- Odd

- Even

Baud - 12

- 24

- 48

- 96

State - Disable

- Enable

IEEE

Print Results

- Off

- On

Print Results to Floppy

- Off

Address - (numeric entry)

Mode

- Talk

- Talk/Listen

- DisableState

Operation Page 41 of 118

Shown only when

2.6.3.1 Display Type

Display

AnalysisI/0

Measured Parameters

Deviation from Nominal % Deviation from Nominal Pass / Fail Bin Summary Bin Number No Display

UtilitiesSetup

HIT MENU TO RETURN TO MAIN MENU

Figure 2-15

Display Type

Allows selection from seven different modes of measurement display, these being:

•

Measured Parameters - Display is the measured values of both the primary and

secondary parameter, displayed along with decimal point and units. Each value is shown with 7 digits of resolution (6 digits if the result is negative). The message Measuring is shown when a measurement is in process, with the exception of short measuring times.

Load Correction is on

COMP

Measured Parameters

Voltage

RETST

pFCs 17.52510

Freq Range Delay

.0006500

Measuring

1.0000kHz Auto

AC Signal Average Bias

1.000V 1 Off0 ms

Figure 2-16

Measured Parameters Display

Page 42 of 118 Operation

∆ =

Measuremen

t - Nominal

Deviation from Nominal - Display is the difference in value above or below a stored

•

nominal value for the primary parameter (also refer to paragraph 2.6.3.2). It should be noted that the nominal value is only shown in this display and the % Deviation display (Figure 2-18).

Deviation from Nominal

Voltage

2.8804

0.0000500

1.0000kHz Auto

82.00000 p

AC Signal Average Bias

1.000V 1 Off0 ms

Freq Range Delay Nominal

Figure 2-17

Deviation from Nominal Display

• % Deviation from Nominal - Display is the measurement in terms of a percent

difference above or below (-) a stored nominal value (also refer to paragraph 2.6.3.2). It should be noted that the nominal value is only shown in this display and the Deviation from Nominal display (Figure 2-17).

Measurement - Nominal

∆=

Nominal

x 100

% Deviation from Nominal

Voltage

2.59417

0.0000500

1.0000kHz Auto

82.00000 p

AC Signal Average Bias

1.000V 1 Off0 ms

Freq Range Delay Nominal

Figure 2-18

% Deviation from Nominal Display

Operation Page 43 of 118

••••

Pass/Fail - Display is measured results as a pass or fail only based on entered binning

limits (see paragraph 2.6.4.1).

Pass / Fail

ΩΩΩΩ

Rs 2.894050 M

Q 0.0000500

PASS

Freq Range Delay

1.0000kHz Auto

AC Signal Average Bias

1.000V 1 Off0 ms

Figure 2-19

PASS/FAIL

• Bin Summary - Display is a summary of the entered bin limits and the total number

of measurements made which meet the requirements of that bin since the bin counter was last reset (see paragraph 2.6.4.1).

Bin Low LIMIT High LIMIT

ΩΩΩΩ

1 2 3 4 5 11 PRI Pass SEC Fail LOW 12 13 14 15

90.00 k

100.00 k 120.00 k

110.00 k 130.00 k

120.00 k 140.00 k

130.00 k

PRI Pass SEC Fail HI PRI Fail SEC Pass PRI Fail SEC Fail NO CONTACT

ΩΩΩΩ ΩΩΩΩ ΩΩΩΩ ΩΩΩΩ

110.00 k

150.00 k

ΩΩΩΩ ΩΩΩΩ ΩΩΩΩ ΩΩΩΩ ΩΩΩΩ

Total

250 100

90 80 75 60 55 50 20

Totals:

785Fail 190Pass 595

Figure 2-20

Bin Summary Display

Page 44 of 118 Operation

Bin Number - Display is a bin assignment, along with the currently programmed test

•

conditions, for the most recently measured result.

Bin Number

Voltage

Freq Range Delay

1.0000kHz Auto

AC Signal Average Bias

1.000V 1 Off0 ms

Figure 2-21

Bin Number Display

• No Display - Instrument display is inhibited from indicating any measurement

results. This is sometimes used for security reasons or for the purpose of reducing test time during remote operation.

2.6.3.2 Nominal Value

Allows entry of a Nominal Value for the primary parameter, which is the basis for the measurement result in Deviation or % Deviation. Accepts numerical entry up to

seven digits with decimal. Units are selected by the UP/DOWN arrow keys and determined by the primary parameter selection, i.e. in Farads, Ohms, Henries, etc.

NOTE

The nominal value has no relationship to nominal values entered during binning

setup.

2.6.3.3 Result Format

Allows selection from two different measurement result formats,

SCI and ENG,

for scientific or engineering units. Scientific units are expressed as an exponent and engineering units are expressed in ohms for resistance, farads for capacitance, henries for inductance, etc. For example e3 in scientific units can be expressed as kohms in engineering units or e

-3

in scientific units can be expressed as mohms in engineering

units, this is strictly user preference and convenience.

When scientific units are selected, the results will always be displayed as some number of digits with decimal, exponent and units. When engineering units are selected the results will be displayed as some number of digits with decimal and units.

Operation Page 45 of 118

2.6.3.4 Trigger

Allows selection of two trigger modes, Internal or External.

• Internal - Measurement trigger is automatic and continuous once initiated with a

START. If the STOP key is pressed in the middle of a measurement (with Range Hold set to OFF) any measurement range indication or displayed results is invalid.

•

External

- Measurement trigger is under

remote control

via front panel, handler, RS

232 or IEEE-488 interface.

2.6.3.5 Handler Interface

Allows user to turn Handler Interface function On or Off. When On is selected the input and output lines on the rear panel I/O interface connector are acknowledged, if

Off

selected they are ignored.

2.6.3.6 RS-232 Interface

I/0

RS-232

Baud Parity Data Bits Stop Bits Mode State Enable

Analysis

12 24 48

None

Talk

Disable

Odd Even

UtilitiesSetup

Talk/Listen

HIT MENU TO RETURN TO MAIN MENU

Figure 2-22

RS-232 Setup Format

Allows user setup of standard RS-232 interface formats. Choices include: Baud Rate - 12, 24, 48 or 96 (for 1200, 2400, 4800, and 9600 respectively)

Parity

- None, Even or Odd

Data Bits - 7 or 8

Stop Bits

- 1 or 2

Mode - Talk or Talk/Listen

UP/DOWN

arrow and

selects the desired format and then

Enter

LEFT/RIGHT

arrow

and ENTER allows for selection of choices within each format.

Page 46 of 118 Operation

2.6.3.7 IEEE-488.2 Interface

Address Mode State

I/0

IEEE = 4

Talk

Disable

Analysis

Talk/Listen

Enable

UtilitiesSetup

HIT MENU TO RETURN TO MAIN MENU

Figure 2-23

IEEE Setup Format

Allows user setup of IEEE-488 interface format. Choices include: Address - 1 through 16 Mode - Talk or Talk/Listen

State - Disable or Enable

UP/DOWN arrow and ENTER selects the desired format and then LEFT/RIGHT arrow

and ENTER allows for selection of choices within each format.

The instrument will function as either a Talk or a Talk/Listen device in a system depending on the choice made by the operator under Mode. Talk is generally suited to a simple system with no controller or other talkers, for example a printer. Talk/Listen denotes full programmability and is suited for use in a system that has a controller or computer to manage data flow. The "handshake" routine assures that the active talker proceeds slowly enough for the slowest listener.

2.6.3.8 Print Results

Allows user to output results to the parallel port by selection of Off or On.

CAUTION

Before selecting On make sure the printer is connected and on-line.

File format for printing is the same as shown in the next paragraph under

Results to

Floppy. Lines not printed are indicated.

Operation Page 47 of 118

2.6.3.9 Results to Floppy

Allows user to store measurement results on 3.5" floppy disk (unless drive is not present). When selected, if a results file is not open, the user is prompted for the filename (up to 8 numeric characters) and the file is opened.

To close a results file that is currently open, select Results to Floppy and close.

If a results file is open when a setup is saved, when the setup is later recalled the user will be prompted for a results file name.

When multiple tests are being conducted the results are stored to floppy periodically (every 10 measurements) from an internal buffer. To be sure of storing all results

before power is shut down the file needs to be closed

as discussed earlier. It is also important to note that a file should be closed before changing or recalling a new set of test conditions, otherwise the stored measurement results would not be consistent with the setup conditions stored in the file.

NOTE

3 1/2" floppy disks must be formatted for

DOS compatibility

on a PC or purchased

formatted from the manufacturer, 1.44M high-density or 720K low-density. The floppy

drive does not support sub directories.

The measurement results are stored as a DOS text file under its assigned identifying number (up to 8 characters) with an extension of .b4r. The test setup conditions are saved as a header at the beginning of a results file. A sample file format is shown below. Note that the results can be stored in either engineering or scientific terms dependent on what the user has selected for setup conditions. The format of the result string is as follows:

Label<TAB>Primary result<TAB>Units<TAB>Label<TAB>Secondary result<TAB>Units<TAB>Bin#<CR><LF>

Page 48 of 118 Operation

Sample file format as follows. Lines listed as not printed are not saved as results to floppy but only as Save Setup, refer to paragraph 2.6.5.1.

100000.000000 ;frequency

5.000000 ;primary parameter

2.000000 ;secondary parameter

0.000000 ;ac signal type

0.100000 ;ac signal value

0.000000 ;bias

0.000000 ;range

1.000000 ;rangelocked

68.000000 ;range relay not printed

205.000000 ;relay 2 |

69.000000 ;relay 3 |

66.000000 ;va not printed

2.000000 ;measurment speed

0.000000 ;delay time

1.000000 ;# to average

0.000000 ;contact check

0.000000 ;display type

0.00000000009989577000 ;nominal value

0.000000 ;result format

1.000000 ;trigger

1.000000 ;handler

3.000000 ;baud

0.000000 ;parity

1.000000 ;data bits

0.000000 ;stop bits

1.000000 ;rs232 mode

1.000000 ;rs232 state

4.000000 ;IEEE address

1.000000 ;IEEE mode

0.000000 ;IEEE state

0.000000 ;print results

0.000000 ;result to floppy

0.00000000000000000000 ;low limit bin 0 not printed

0.00000000000000000000 ;high limit bin 0 |

0.00000000000000000000 ;nominal value bin 0 |

0.000000 ;limit format bin 0 |

0.00000000000000000000 ;low limit bin 1 |

0.00000000000000000000 ;high limit bin 1 |

0.00000000000000000000 ;nominal value bin 1 |

0.000000 ;limit format bin 1 |

0.00000000000000000000 ;low limit bin 2 |

0.00000000000000000000 ;high limit bin 2 |

0.00000000000000000000 ;nominal value bin 2 |

Operation Page 49 of 118

0.000000 ;limit format bin 2 |

0.00000000000000000000 ;low limit bin 3 |

0.00000000000000000000 ;high limit bin 3 |

0.00000000000000000000 ;nominal value bin 3 |

0.000000 ;limit format bin 3 |

0.00000000000000000000 ;low limit bin 4 |

0.00000000000000000000 ;high limit bin 4 |

0.00000000000000000000 ;nominal value bin 4 |

0.000000 ;limit format bin 4 |

0.00000000000000000000 ;low limit bin 5 |

0.00000000000000000000 ;high limit bin 5 |

0.00000000000000000000 ;nominal value bin 5 |

0.000000 ;limit format bin 5 |

0.00000000000000000000 ;low limit bin 6 |

0.00000000000000000000 ;high limit bin 6 |

0.00000000000000000000 ;nominal value bin 6 |

0.000000 ;limit format bin 6 |

0.00000000000000000000 ;low limit bin 7 |

0.00000000000000000000 ;high limit bin 7 |

0.00000000000000000000 ;nominal value bin 7 |

0.000000 ;limit format bin 7 |

0.00000000000000000000 ;low limit bin 8 |

0.00000000000000000000 ;high limit bin 8 |

0.00000000000000000000 ;nominal value bin 8 |

0.000000 ;limit format bin 8 |

0.00000000000000000000 ;low limit bin 9 |

0.00000000000000000000 ;high limit bin 9 |

0.00000000000000000000 ;nominal value bin 9 |

0.000000 ;limit format bin 9 |

0.00000000000000000000 ;low limit bin 10 |

0.00000000000000000000 ;high limit bin 10 |

0.00000000000000000000 ;nominal value bin 10 |

0.000000 ;limit format bin 10 |

0.00000000000000000000 ;low limit bin 11 |

0.00000000000000000000 ;high limit bin 11 |

0.00000000000000000000 ;nominal value bin 11 |

0.000000 ;limit format bin 11 |

0.00000000000000000000 ;low limit bin 12 |

0.00000000000000000000 ;high limit bin 12 |

0.00000000000000000000 ;nominal value bin 12 |

0.000000 ;limit format bin 12 |

0.00000000000000000000 ;low limit bin 13 |

0.00000000000000000000 ;high limit bin 13 |

0.00000000000000000000 ;nominal value bin 13 |

0.000000 ;limit format bin 13 |

0.00000000000000000000 ;low limit bin 14 |

0.00000000000000000000 ;high limit bin 14 |

0.00000000000000000000 ;nominal value bin 14 |

0.000000 ;limit format bin 14 not printed

Page 50 of 118 Operation

0.000000 ;secondary low

0.000000 ;secondary high

0.000000 ;sequence

0.000000 ;sequence status printed only if sequence enabled

1000.000000 ;sequence frequency |

0.000000 ;sequence pri param |

0.000000 ;sequence sec param |

0.000000 ;sequence bias |

0.000000 ;sequence ac signal type |

1.000000 ;sequence ac signal value |

0.000000 ;sequence delay |

0.000000 ;sequence range |

0.000000 ;sequence range relay |

0.000000 ;sequence relay 2 |

0.000000 ;sequence relay 3 |

0.000000 ;sequence var relay |

1.000000 ;sequence stop on fail |

0.000000 ;sequence status |

1000.000000 ;sequence frequency |

0.000000 ;sequence pri param |

0.000000 ;sequence sec param |

0.000000 ;sequence bias |

0.000000 ;sequence ac signal type |

1.000000 ;sequence ac signal value |

0.000000 ;sequence delay |

0.000000 ;sequence range |

0.000000 ;sequence range relay |

0.000000 ;sequence relay 2 |

0.000000 ;sequence relay 3 |

0.000000 ;sequence var relay |

1.000000 ;sequence stop on fail |

0.000000 ;sequence status |

1000.000000 ;sequence frequency |

0.000000 ;sequence pri param |

0.000000 ;sequence sec param |

0.000000 ;sequence bias |

0.000000 ;sequence ac signal type |

1.000000 ;sequence ac signal value |

0.000000 ;sequence delay |

0.000000 ;sequence range |

0.000000 ;sequence range relay |

0.000000 ;sequence relay 2 |

0.000000 ;sequence relay 3 |

0.000000 ;sequence var relay |

1.000000 ;sequence stop on fail |

0.000000 ;sequence status |

1000.000000 ;sequence frequency |

0.000000 ;sequence pri param |

0.000000 ;sequence sec param |

Operation Page 51 of 118

0.000000 ;sequence bias |

0.000000 ;sequence ac signal type |

1.000000 ;sequence ac signal value |

0.000000 ;sequence delay |

0.000000 ;sequence range |

0.000000 ;sequence range relay |

0.000000 ;sequence relay 2 |

0.000000 ;sequence relay 3 |

0.000000 ;sequence var relay |

1.000000 ;sequence stop on fail |

0.000000 ;sequence status |

1000.000000 ;sequence frequency |

0.000000 ;sequence pri param |

0.000000 ;sequence sec param |

0.000000 ;sequence bias |

0.000000 ;sequence ac signal type |

1.000000 ;sequence ac signal value |

0.000000 ;sequence delay |

0.000000 ;sequence range |

0.000000 ;sequence range relay |

0.000000 ;sequence relay 2 |

0.000000 ;sequence relay 3 |

0.000000 ;sequence var relay |

1.000000 ;sequence stop on fail |

0.000000 ;sequence status |

1000.000000 ;sequence frequency |

0.000000 ;sequence pri param |

0.000000 ;sequence sec param |

0.000000 ;sequence bias |

0.000000 ;sequence ac signal type |

1.000000 ;sequence ac signal value |

0.000000 ;sequence delay |

0.000000 ;sequence range |

0.000000 ;sequence range relay |

0.000000 ;sequence relay 2 |

0.000000 ;sequence relay 3 |

0.000000 ;sequence var relay |

1.000000 ;sequence stop on fail |

0.000000 ;sweep printed only if sequence enabled

0.000000 ;sweep parameter

10.000000 ;sweep begin

1000.000000 ;sweep end

0.000000 ;sweep step

0.000000 ;sweep result format

0.000000 ;median

1.000000 ;correction

25.000000 ;correction primary nominal

50.000000 ;correction secondary nominal

1.000000 ;correction status

Page 52 of 118 Operation

1000.000000 ;correction frequency

49.000000 ;correction range

5.000000 ;correction primary parameter

4.000000 ;correction secondary parameter

25.17072 ohms ;correction measured primary

-.1947500 ;correction measured secondary

-0.170725 ;correction primary correction

50.194742 ;correction secondary correction

0.000000 ;enhanced distortion

0.000000 ;lockout

1.000000 ;backlite

ENDHEADER Cs 9.69573e-09 F DF 0.0052921 Bin 1

Cs 9.69645e-09 F DF 0.0052307 Bin 1

Cs 9.69575e-09 F DF 0.0052404 Bin 1

Cs 9.69583e-09 F DF 0.0052983 Bin 1

Cs 9.69698e-09 F DF 0.0053328 Bin 1

The number of measurement results that can be stored is dependent on available disk space and length of the data string. For example; if no limit is set the measurement string contains no bin results, thus the string has fewer characters. The same is true with header information, multiple headers (different test conditions) will consume more memory. Whatever the case, a blank disk is capable of storing thousands of measurements.

Operation Page 53 of 118

Setup I/O Analysis Utilities

- Edit

2.6.4 Analysis Menu

I/0Setup UtilitiesAnalysis

Binning

Test Sequencing Parameter Sweep Median Distort Detect Load Correction Edit

Off Off On

Off

Edit Edit

The third of the four main menus is Analysis, shown above. Each function controls the analysis of measurement results and is described in detail below.

Binning - Bin #

Test Sequencing - Off

- On

- Edit

Figure 2-24

Analysis Menu

Absolute Limit

Tolerance %

Secondary Low - (numeric entry)

Secondary High - (numeric entry)

View Bin Totals

Zero Bin Totals

- Bin #

- Nominal

- % Below

- % Above

- Low Limit

- High Limit

Parameter Sweep - Off

- On

- Edit

Median

- Off

- On

Distort Detect

- Off

- On

Load Correction

- Off

- On

Page 54 of 118 Operation

2.6.4.1 Binning

I/0 Analysis

Absolute Limit

Tolerance % Secondary Low Secondary High View Bin Totals Zero Bin Totals

Binning

= 0.000000 = 0.000000

UtilitiesSetup

>> >>

HIT MENU TO RETURN TO MAIN MENU

Figure 2-25

Binning

The 7400 provides sorting capability into 15 bins (10 pass, 4 fail and 1 for no contact). For binning function to be enabled, one or both of the two conditions must be met:

1. Bin 1 limits must be set (non-zero)

2. Secondary parameter must be set (not NONE, Figure 2-9) and secondary low/high limits must be (non-zero).

These are assigned as follows: Bins 1 through 10 - Pass bins for the primary parameter (Pass for secondary parameter if limit is entered) Bin 11 - Primary parameter pass and secondary parameter fail low Bin 12 - Primary parameter pass and secondary parameter fail high Bin 13 - Primary parameter

and secondary parameter

fail

pass

Bin 14 - Primary parameter fail and secondary parameter fail Bin 15 - No contact

NOTE

If no limit is entered for the primary parameter but one is entered for the secondary

parameter, bin assignment will be to Bin 1 for a

and Bin 11 for a

pass

fail low

or Bin 12

for a fail high.

Bin assignment during the test sequencing mode of operation is entirely different and discussed in paragraph 2.6.4.2.

Bin limits for the primary parameter can be entered in terms of absolute value or as a percent tolerance about a defined nominal. Two of the most common methods sorting is nested limits and sequential limits. Nested limits are a natural choice for sorting by % tolerance around a single nominal value with the lower number bins narrower than the higher numbered ones. Nested limits for three bins are illustrated below, note that limits do not have to be symmetrical as shown for bin 3.

Operation Page 55 of 118

Bin 3 Bin 2 Bin 1

Measured Value Axis

-1% +1%

-5% +5%

-7% +10% Nominal Value

100.00 k

Ω

Tolerance Percent

Bin Nominal % BELOW % ABOVE

1 2 3

100.00 k

1.00

5.00

7.00

1.00

5.00

10.00

Sequential limits are a natural choice for sorting by absolute value. Sequential limits for three bins is illustrated below. It should be noted that the bins do not necessarily have to be adjacent. Depending on the specified limits for each they can be overlapping, adjacent or even isolated (gaps) from each other. Any overlap is assigned to the lower numbered bin and a gap would be assigned to the overall fail bin.

Bin 1 Bin 2 Bin 3

100.00 k90.00 k85.00 k

120.00 k

ΩΩΩ Ω

Absolute Limit

Bin Low LIMIT High LIMIT

90.00 k85.00 k

100.00 k

1 2 3

90.00 k

100.00 k 120.00 k

In the above example, a measured value of 90.00 k would be assigned to bin 1.

Measured Value Axis

Page 56 of 118 Operation

••••

Absolute Limit

Absolute limit selection allows for entry of both the upper and lower limit for each bin in absolute value (both must be entered). Valid range for each is -108 to 109. When

limits are entered in terms of absolute value, the same limits will automatically be shown in terms of percent on the Tolerance Percent Display. Arrow up, down, left to right to select the limit of interest in either the low or high limit column as shown below (low limit for bin 5 is chosen in this example)

Absolute Limit

Bin Low LIMIT High LIMIT

110.00 k90.00 k

150.00 k

170.00 k

190.00 k

120.00 k

1 2 3 4 5 6 7 8 9 10

100.00 k 120.00 k

110.00 k 130.00 k

120.00 k 140.00 k

130.00 k

140.00 k 160.00 k

150.00 k

160.00 k 180.00 k

170.00 k

180.00 k

Figure 2-26

Absolute Limit

Once the limit of choice is selected by UP/DOWN, LEFT/RIGHT arrow and ENTER the numerical value can be entered directly as shown below (entry is 130 in this example).

Absolute Limit

Bin Low LIMIT High LIMIT

110.00 k90.00 k

150.00 k

170.00 k

190.00 k

200.00 k

1 2 3 4 5 6 7 8 9 10

100.00 k 120.00 k

110.00 k 130.00 k

120.00 k 140.00 k

130

140.00 k 160.00 k

150.00 k

160.00 k 180.00 k

170.00 k

180.00 k

Figure 2-27

Absolute Limit (Numeric Entry)

Operation Page 57 of 118

Then arrow up or down to select units from those available (k is chosen in this example).

Absolute Limit

Bin Low LIMIT High LIMIT

110.00 k90.00 k

150.00 k

170.00 k

190.00 k

120.00 k

1 2 3 4 5 6 7 8 9 10

100.00 k 120.00 k

110.00 k 130.00 k

120.00 k 140.00 k

130 k

140.00 k 160.00 k

150.00 k

160.00 k 180.00 k

170.00 k

180.00 k

Figure 2-28

Absolute Limit (Engineering Units)

Press ENTER to finalize the entry, use the UP/DOWN and LEFT/RIGHT arrows to choose the next limit to be entered or changed.

••••

Tolerance Percent

Tolerance Percent selection allows for entry of both upper and lower limit in terms of percent below or above an entered nominal (both must be entered). When limits are

entered in terms of percent the same limits will automatically be shown in terms of absolute value on the Absolute Value Display. Arrow UP/DOWN, left to right to select the nominal value or % limit of interest as shown below. The nominal value can be entered in the same fashion as the absolute limit entered above, numerical value, then arrow UP/DOWN to select units. Valid range is -108 to 109. If zero is entered for Nominal, the entire row is cleared and that bin disabled. The % tolerance can be entered directly in increments of .01%, any increments smaller than this are rounded to the closest .01%.

Valid range for each is 0 to 100.

If zero is entered for %Below or

%Above, the previous value is cleared and that bin disabled.

Tolerance Percent

Bin Nominal % BELOW % ABOVE

10.00

10.0010.00

10.00

10.0010.00

10.00

10.0010.00

10.00

10.0010.00

10.00

10.0010.00

10.00

10.0010.00

10.00

10.0010.00

10.00

10.0010.00

10.00

10.0010.00

10.00

10.0010.00

1 2 3 4 5 6 7 8 9 10

100.00 k

110.00 k

120.00 k

130.00 k

140.00 k

150.00 k

160.00 k

170.00 k

180.00 k

190.00 k

10.00

10.0010.00

10.00

10.0010.00

10.00

10.0010.00

10.00

10.0010.00

10.00

10.0010.00

10.00

10.0010.00

10.00

10.0010.00

10.00

10.0010.00

10.00

10.0010.00

10.00

10.0010.00

Figure 2-29

Tolerance Percent

Page 58 of 118 Operation

••••

Secondary Low

Accepts entry of numerical value for the low limit of the secondary parameter. Units are determined by the secondary parameter selection, i.e. in Farads, Ohms, Henries, etc. and selected by the UP/DOWN arrow keys. Valid range is -103 to 104.

NOTE

Low limit must be less than the High limit

••••

Secondary High

Accepts entry of numerical value for the high limit of the secondary parameter. Units are determined by the secondary parameter selection, i.e. in Farads, Ohms, Henries, etc. and selected by the UP/DOWN arrow keys.

Valid range is -103 to 104.

NOTE

High limit must be greater than the Low limit

••••

View Bin Totals

Total

250 100

90 80 75 60 55 50 20

785

Bin Low LIMIT High LIMIT

1 2 3 4 5 11 PRI Pass SEC Fail LOW 12 13 14 15

Totals:

HIT MENU TO RETURN TO MAIN MENU

100.00 k 120.00 k

110.00 k 130.00 k

120.00 k 140.00 k

130.00 k

PRI Pass SEC Fail HI PRI Fail SEC Pass PRI Fail SEC Fail NO CONTACT

110.00 k90.00 k

150.00 k

Fail 190Pass 595

Figure 2-30

Bin Totals

The total count for each bin is tracked from 0 to 999,999.

••••

Zero Bin Totals

Bin count totals are all reset to zero when selected and operator is returned to the Menu screen.

Operation Page 59 of 118

2.6.4.2 Test Sequencing The 7400 is capable of performing a sequenced measurement containing up to six

different test steps

. Different measurement parameters and conditions can be defined

for each test in the sequence. Test sequencing can be selected as Off, On or Edit. Edit allows measurement

parameters and test conditions to be changed for all six tests. It is important to note that tests can only be enabled in sequence, for example, one can enable tests 1 through 3 but not tests 1 and 3 only, i.e. it is not possible to skip a test. For optimum measure speed performance, whenever possible, set test conditions of test 1 to be the same as default conditions, paragraph 2.5.2.

Sequence Setup Test 1

Test 1 Status Primary Parameter Secondary Parameter Frequency DC Bias Voltage AC Signal Type AC Signal Value Measurement Delay Range Hold Off On Stop on Fail OnOff Binning >>

HIT MENU TO RETURN TO MAIN MENU

(ms)

Disable Enable

= 1.0000kHz

Int Ext

Off Voltage Current

= 1.000 V = 0

>> >>

Prev Test

Next Test

Figure 2-31

Sequence Setup (Test Conditions)

If Range Hold is turned ON and this is the "first" sequence measurement, for each test the 7400 automatically finds the correct range and completes a measurement (this range is saved for all future measurements) for that sequence only. It is important that the first part be "good" for the range hold to select the correct range. To repeat an auto range selection, turn sequences off and then back on again (making the next measurement taken the "first" sequence measurement).

Test conditions for each setup are selected as shown above except for the primary parameter, secondary parameter and binning, these are selected on individual menus as shown below. To change test conditions on any or all six tests select Prev Test or Next Test to access test conditions for that test.

Page 60 of 118 Operation

Sequence Setup Test 1

Pri Param

Auto

Cs Cp Ls Lp Rs Rp DF Q |Z| |Y|

HIT MENU TO RETURN TO MAIN MENU

Figure 2-32

Sequence Setup (Parameter Selection)

Bin assignment in the test sequence mode is defined as follows:

Bin #

Assigned

Bin 1 Test 1 (Primary parameter, fail) Bin 2 Test 1 (Secondary parameter, fail) Bin 3 Test 2 (Primary parameter, fail) Bin 4 Test 2 (Secondary parameter, fail) Bin 5 Test 3 (Primary parameter, fail) Bin 6 Test 3 (Secondary parameter, fail) Bin 7 Test 4 (Primary parameter, fail) Bin 8 Test 4 (Secondary parameter, fail) Bin 9 Test 5 (Primary parameter, fail) Bin 10 Test 5 (Secondary parameter, fail) Bin 11 Test 6 (Primary parameter, fail) Bin 12 Test 6 (Secondary parameter, fail) Bin 13 Unused Bin 14 Pass Bin Bin 15 Contact Check, fail

For the binning function to be enabled, Bin 1 limits must be set (non-zero). If zero is entered for Low or High, the previous value is cleared and that bin disabled.

Valid

range for primary or secondary bin limit is -108 to 109. All sequence binning limits

must be entered on the display shown below and NOT

the standard binning displays,

paragraph 2.6.4.1.

Operation Page 61 of 118

Sequence Setup Test 1

Bin Low LIMIT High LIMIT

Pri

Sec

100.00 k 120.00 k

110.00 k90.00 k

Figure 2-33

Sequence Binning

Test conditions of measurement sequences can be stored and/or recalled as part of test setups, refer to paragraphs 2.6.5.1 and 2.6.5.2 for storing or recalling setups. If a test sequence is stored as On, the sequence will be executed once the Start button is pressed, if the test sequence is stored as Off, the sequence will be inactive until turned on.

Note that a sequence (of up to six tests) can be terminated on any test of the sequence if the user has specified Stop on Fail for that test. If Stop on Fail is not selected the sequence continues until a failure occurs in a test where Stop on Fail has been enabled or until the whole sequence has been completed. Once a sequence is complete, it will be binned to the first fail bin (1 thru 12) or if all tests pass, binned into the overall pass bin (14).

When a test sequence is turned on, the results of the sequence are shown on the summary screen shown below. Measured values outside of specified limits are highlighted.

Sequence Results

BIN

DF 0.0078950 DF 0.0067994

Test 1 Test 2 Test 3

FAIL 5

Cs 1.561062 uF DF 0.0089290 Cs 1.498650 uF

Cs 1.278650 uF FAIL

Figure 2-34

Sequence Results

Page 62 of 118 Operation

2.6.4.3 Parameter Sweep

The 7400 is capable of displaying a table or plot of measured results vs. a variable of frequency, voltage or current.

Sweep can be selected as

Off, On or Edit.

Edit allows sweep test conditions to be

changed.

I/0 Analysis

Parameter Sweep Begin

Sweep End

Sweep Step Sweep Format

Sweep

Voltage Current

Freq

= 10.0 = 1.0000 kHz

50 100 200

Table

UtilitiesSetup

Plot

HIT MENU TO RETURN TO MAIN MENU

Figure 2-35

Parameter Sweep

Parameter is the variable test condition of Frequency, Voltage or Current.

Sweep Begin is the lower boundary of the sweep table or plot in units of Hz, Volts or Amps. The numerical value is entered directly and units selected by UP/DOWN arrow

keys.

Sweep End is the upper boundary of the sweep in units of Hz, Volts or Amps and entered the same as Sweep Begin.

Sweep Step

is the chosen number of increments in a sweep of

25, 50 100 or 200

values are automatically selected, logarithmically over the specified begin to end range.

where

Sweep Format

is selected to be

as shown in Figure 2-36 or

Table

as shown in

Plot

Figure 2-37.

Operation Page 63 of 118

Plot Table

Frequency Cs DF

0.003135

0.003675

0.003867

0.010035

0.010078

0.011045

0.012895

0.014786

0.016782

0.018544

1.0000kHz

1.2915kHz

1.6681kHz

2.1544kHz

2.7825kHz

3.5938kHz

4.6415kHz

5.9948kHz

7.7426kHz

10.000kHz

471.4576nF

470.4563nF

469.8878nF

468.9983nF

466.4532nF

462.6634nF

460.6645nF

459.7892nF

458.7845nF

456.5454nF

Figure 2-36

Sweep Table

The sweep table lists the measurement results for primary and secondary parameter (unless none is selected) along with the test condition variable of frequency , voltage or current. A table can be comprised of 25, 50, 100 or 200 entries and the UP/DOWN arrow keys or Prev or Next Page used to scroll through the display.

Note: Scroll is not functional when RS-232 or IEEE-488 is enabled

200.0

180.0

160.0

140.0

120.0

100.0 |Z|

ΩΩΩΩ

50.000k 62.000k

51.000k 54.000k Frequency Hz

Figure 2-37

Sweep Plot

The sweep plot shows the measurement results of the primary parameter (vertical axis) vs. the variable test condition of frequency, voltage or current (horizontal axis). It should be noted that space available on the display

limits the number of graduations and resolution of axis labeling. The horizontal axis is labeled from the Sweep Begin to the Sweep End values as selected by the user with two additional labels in between (chosen logarithmically). The vertical axis is labeled from the lowest measured value to the highest measured value

with four additional labels in between (chosen linearly).

Page 64 of 118 Operation

2.6.4.4 Median

Allows for the selection of Median measurement mode to be On or Off. When selected each measurement will actually be three individual measurements, the

lowest and

highest values discarded and the median value displayed.

Measurement accuracy can be improved as noted below and will be indicated on the AutoAcc display (but never less than 0.05% for primary parameter or 0.0005 for secondary parameter).

With Median set to On: Divide the primary accuracy by the square root of three. Divide the secondary accuracy by the square root of three.

2.6.4.5 Distortion Detection

Allows for the selection of Distortion Detection mode to be On or Off. When set to On, the unit will detect distortion during a measurement and indicates the message "DISTORTION" if this condition occurs. When set to Off, distortion will not be detected during a measurement.

Distortion is dependent on programmed test conditions, connection to the device, device impedance and so indicated when the signal + noise + distortion divided by the signal exceeds 1.2. Distortion set to On is the recommended test condition and is particularly important for high precision measurements where test leads could resonate with the device under test. Distortion may want to be turned to Off in a "noisy" environment.

To ensure that stored setups are backward compatible Distortion On or Off is not saved in setups stored (internally or on floppy). On instrument power down the Distort Detect will be restored to its last previous state.

2.6.4.6 Load Correction

Load correction allows the user to specify the value of the component under test (user supplied standard) and apply a correction to subsequent measurements of similar components under the same test conditions. This feature corrects for instrument nonlinearity and for fixture effects which can be dependent on the test frequency, test voltage level or impedance range.

Measurement accuracy is 0.25 x (normal accuracy) with Load Correction implemented and compared to user supplied standard and for the same measurement conditions. Same measurement conditions being test voltage, test frequency and 7400 measurement range.

Operation Page 65 of 118

This increased accuracy applies in a range of: DUT's with impedance (Z) between 3Ω and 800kΩ, with programmed voltage from 100mV to 1V, or from 100mV to (programmed current) x (Z) ≤1V.

Load correction can be selected as

Off, On or Edit.

Edit allows the primary and secondary values to be entered, the parameter for these values is defined by the Primary and Secondary Parameter in the main Setup menu. After the nominal values have been entered, if Measure is selected for ON the user presses START to initiate the correction measurement. While the measurement is being made,

Measuring Correction

will be

displayed. After the correction measurement the actual Measured Primary and

Secondary value will be displayed along with the selected Freq, Range, Primary and Secondary parameter. During the load correction measurement the instrument is

automatically placed in the Slow Measurement Accuracy mode.

Load Correction

Measure

Primary Nominal Secondary Nominal

Off

60.00000 pF

4.000000 m

Measuring Correction

Measured Primary Measured Secondary

Freq

Range 49 HIT <START> TO MEASURE CORRECTION HIT <ENTER> TO CHANGE VALUES HIT <MENU> TO RETURN TO MAIN MENU

100.00kHz

60.25518 pF

.0042580

Primary Cs Secondary DF

Figure 2-38

Load Correction

The Load Correction will only be made for the Frequency, Range, Primary and Secondary Parameter that was selected when the correction was determined. For example; if the correction measurement is made under the conditions of Cs, DF, at 100kHz and range 49, these are the only conditions under which it will be applied.

Page 66 of 118 Operation

Setup I/O Analysis Utilities

- On

2.6.5 Utilities Menu

I/0Setup Utilities

Analysis

Save Setup >>

Recall Setup Setup Accuracy Open / Short Lock Out Calibration Set Time / Date Usage / Cal Date Set Contrast Self Test LCD Backlite

Save

>> >> >> >> >> >> >> >> >>

The last of the four main menus is Utilities, shown above. Each function is described in detail below.

Save Setup

Recall Setup

Setup Accuracy

Open/Short

Lock Out

Calibration

See para. 4.4

Set Time/Date

Usage/Cal Date

Figure 2-39

Utilities Menu

AutoAcc

- Lock Out with Setup Recall

- Lock Out Only

- T

- D

- delete

- Short

- Open

Set Contrast

Self Test

LCD Backlite

Messages

- Save

Operation Page 67 of 118

2.6.5.1 Save Setup

Analysis

Save

NEW

DEFAULT FLOPPY 12345 1234 123

I/0Setup Utilities

HIT MENU TO RETURN TO MAIN MENU

Figure 2-40

Save Setup

Allows a set of test conditions to be stored in instrument memory or on floppy disk (unless drive is not present) for later recall. Test conditions are those that are user programmable in the Setup and I/O menus, as discussed in paragraphs 2.6.2 and 2.6.3. Setups stored on non Model B 7400's are not compatible with the 7400 Model B. File format for storing test conditions is the same as shown under Results to Floppy, paragraph 2.6.3.9, all lines shown are saved as setup.

Stored setup conditions should always be backed up on disk using the floppy drive. The number of setups saved to floppy is limited to 125.

To store the current set of test conditions as a new set in unit memory one needs to select NEW in the Save Setup menu and enter the identifying name up to 8 characters under which these conditions will be stored (allowable characters from the keypad include 0 through 9 and minus, characters can also include A through Z when operating from remote control ). To save the setup under the name selected or to overwrite if the name already exists one needs to answer Yes or No, Figure 2-41.

I/0Setup UtilitiesAnalysis

SAVE AS 1234?

Figure 2-41

Yes or No

Page 68 of 118 Operation

To make the current set of test conditions the default (at power up) one needs to select DEFAULT in the Save Setup menu and overwrite the conditions currently stored. To prevent overwriting the default setup by mistake an additional level of safety exists where the operator is required to respond with Yes or No, similar to Figure 2-41 above.

Selecting

will delete a set of test conditions and requires a Yes or No response.

del

When there are more setups than can fit on the display, the page down key is active. If there is less than a whole page below, the display wraps around to the previous display. Continuing to page down will eventually return to the first display of setups. The page down key is only shown when there are more setups than can be displayed.

There are two ways to make the current set of test conditions overwrite an existing setup, one is to select that setup in the menu and answer Yes to overwrite and the other way is to enter the same name under New and answer Yes to overwrite.

File format for storing test conditions is the same as shown under Results to Floppy, paragraph 2.6.3.9, all lines shown are saved as setup. The extension of files saved to floppy is .b4s.

2.6.5.2 Recall Setup

I/0Setup Utilities

Analysis

Recall

DEFAULT

FLOPPY 12345 1234 123

HIT MENU TO RETURN TO MAIN MENU

Figure 2-42

Recall Setup

Allows a previously stored set of test conditions to be recalled from instrument memory. Test conditions are those that are user programmable in the Setup and I/O menus as discussed in paragraphs 2.6.2 and 2.6.3. Setups stored on non Model B 7400's are not

compatible with the 7400 Model B.

To recall a set of test conditions one needs to arrow

down or up to the desired set. DEFAULT is always one of the set of test conditions that can be recalled as discussed in the previous paragraph. Selecting

FLOPPY

allows setups

to be recalled from disk (unless drive is not present). Selecting del will delete a set of test conditions and requires a Yes or No response.

Operation Page 69 of 118

1 D

1 Q

2.6.5.3 Setup Accuracy

Allows user to access the measurement calculation. Calculated accuracy is displayed for the instruments currently selected test conditions, as shown in the example below and in accordance with the formulas for basic, enhanced or extended accuracy. Factors affecting this calculation include frequency, ac test signal level, measurement accuracy and # to average, all test conditions are under operator control on the Setup Menu. The selection of Median, on the Analysis Menu, also has an affect on the accuracy calculation.

Note: For all 7400 CE Marked Models. With a programmed AC Test Signal

between 1.005 and 1.500 Volts, and device impedance less than 2.5 Ohms, the calculated instrument accuracy is increased by a factor of 2.

The Accuracy, Average and Median can be changed on this screen as instructed for the purpose of evaluating their effect on the instrument accuracy calculation and the changes implemented if the operator so chooses. The frequency, AC signal or parameter selection can only be changed on the Setup menu. In summary, this display shows instrument

accuracy for currently selected test conditions or as a tool so the operator can see what the accuracy would be if certain conditions were selected.

AutoAcc

Accuracy Extended Freq

Average Median

Arrow keys to select parameters ENTER key to change the values START key to calculate accuracy

Accuracy as Configured

OnOff

AC Signal 1.000 V

1.0000kHz

.075% .0005000

Figure 2-43

Setup Accuracy

The basis for the AutoAcc calculation is based on the formulas below where A% = calculated primary accuracy for C, X, B with D < 0.1 and R, L, G with Q < 0.1 for optimum signal levels and test conditions.

For C, X, and B, with D > 0.1, multiply A% by For R and G, with Q > 0.1, multiply A% by

For L, with Q < 10, multiply A% by

Page 70 of 118 Operation





For Basic Accuracy, R, L, C, X, G, B, |Z|, and |Y|



%. .

*.*

025 025

=± + + +

 









 





 





 



RANGE



125

  

10 1

()

 



+−



()

[]



−



 



FS s

 





  





*1022



*. *





 

500









 









An = nominal accuracy 0.5

For Enhanced Accuracy, R, L, C, X, G, B, |Z|, and |Y|



%. .

*.*

0125 0125

=± + + +

 









 











RANGE

125

  





−

**.

()

 



+−



()

[]



10 08

FS s

 





 

*1022



















 

310

400







An = nominal accuracy 0.25

For Extended Accuracy, R, L, C, X, G, B, |Z|, and |Y|



%. .

*.*

0025 0025

=± + + +

 









 











RANGE

125

  





−

**.

()

 



+−



()

[]



10 055

FS s

 





 











*1022









 

510

300

An = nominal accuracy 0.05

Vs = Test voltage in voltage mode, I * Zm in current mode* Zm = Impedance of DUT Fm = Test frequency Kt = 1 for 18o to 28oC, 2 for 8o to 38oC, and for 4 for 5o to 45oC

= 5.0 for 1.000V < Vs ≤ 5.000V

* For I * Zm > 3, accuracy is not specified

1.0 for 0.100V < Vs ≤ 1.000V

0.1 for 0.020V ≤ Vs ≤ 0.100V

In Voltage Mode

In Current Mode

100kΩ for Zm ≥ 25kΩ 400Ω for i < 2.5mA

RANGE

= 6kΩ for 1.6kΩ ≤ Zm < 25kΩ 25Ω for i > 2.5mA 6kΩ for Zm > 25kΩ and Fm > 25kHz 400Ω for 100Ω ≤ Zm < 1.6kΩ 400Ω for Zm > 1.6kΩ and Fm > 250kHz 25Ω for Zm < 100Ω

Operation Page 71 of 118

100D50

5*10

D Accuracy Q Accuracy

















=+ +

100A%100

 



 



*Q Q





100A%500



 



θθθθ

Accuracy

ESR Accuracy

 



180

 









100

 



D = DF of unknown

Q = Q of unknown

A% = calculated primary accuracy for all cases

Note: Calculated Rs accuracy applies only when device under test is primarily reactive.

Calculated ESR accuracy applies only when device under test is primarily capacitive.

Note: Accuracy given by the equations is the measurement accuracy relative to calibration standards,

total accuracy equals the relative measurement accuracy plus the calibration uncertainty of the calibration standards.

2.6.5.4 Open / Short

The zeroing process automatically measures stray parameters and retains the data, which is used to correct measurements so that results represent parameters of the DUT alone without test lead or fixture capacitance. Measurement accuracy is specified at the end of the QuadTech one meter cable (7000-01). Open and short circuit zeroing should be done at the end of this cable. In order to maintain instrument accuracy with other cable lengths the instrument should be re calibrated using the QuadTech 7000-09 Calibration Kit and the alternate cable. Zeroing is recommended at the start of each work day or more often if leads, fixture or test configuration to the DUT is changed. It is not necessary to re- zero if the test frequency is changed. It is important to note, that anytime the instrument is zeroed it is done at a test voltage of 1 volt and frequencies of 50, 100Hz, 1, 10, 50, 100, 250, 500kHz. Once

Open

is selected in the menu and the Enter key

Short

pressed, the operator is prompted by instructions on the display for short or open zeroing as shown in Figure 2-45 below.

When the instrument measurement accuracy is selected for

EXTENDED

the unit will

perform its Open/Short in this mode. When the instrument accuracy is selected for ENHANCED or BASIC the unit will perform its Open/Short in the Enhanced mode. The Open/Short performed in the Extended mode is necessary only for measurements with extreme accuracy requirements at very high or low impedance. Open/Short takes about 5 minutes in the Enhanced mode versus about 15 minutes in the Extended mode.

When Quick Open & Short is selected the zeroing process is performed as prompted on the display, in much less time and only at the frequency currently selected on the instrument. It is important to note that the quick open and short data is no longer valid if the frequency is changed, or if sweep or sequence is selected or instrument powered down.

Page 72 of 118 Operation

Short

2.6.5.5 Lock Out

Connect an Open or a Short to the instrument

Press the function key for the connection desired.

HIT MENU TO RETURN TO MAIN MENU

Figure 2-44

Open / Short

SELECT THE LOCK OUT TYPE

HIT <CNCL> TO EXIT

Open

Quick

Open +

Short

LOCKOUT WITH

SETUP RECALL

LOCKOUT

ONLY

Figure 2-45

Lockout

Allows user to turn keypad lock feature on or off. There are two choices that can be selected,

lockout only

and

lockout with setup recall

. In both modes only the START,

STOP and MENU on the instrument front panel are active, all other keys are disabled. The difference is that in lockout with setup recall the menu key also allows setups to be recalled from instrument memory.

When either is selected the operator must enter a password number up to 8 characters.

CAUTION

FOR SECURITY REASONS THE PASSWORD IS NOT DISPLAYED WHEN IT

IS ENTERED, SO THE PASSWORD SHOULD BE KEYED IN DISTINCTLY

AND REMEMBERED. FAILURE TO REMEMBER AN ENTERED PASSWORD

REQUIRES CALLING THE FACTORY FOR OVERRIDE INFORMATION.

Operation Page 73 of 118

ENTER PASSWORD (8 CHARACTERS MAXIMUM)

Once the password is entered and entered again for verification, testing can begin by pressing START or the password cleared or changed by selecting MENU.

HIT <MENU> KEY TO ENTER PASSWORD AND TO RETURN TO THE MENU OR HIT THE <START> KEY TO START A MEASUREMENT

Once activated, only the START, STOP and MENU on the instrument front panel are active, all other keys are disabled. To turn the lockout feature off and reactivate menus select MENU (select Exit Lockout in Lockout with Setup Recall mode) and enter the previous password from the keypad, the instrument will again function as normal.

If Recall Setups is chosen in the Lockout with Setup Recall mode, the instrument functions as described in paragraph 2.6.5.2 under Recall Setup.

2.6.5.6 Calibration

Refer to Calibration in Paragraph 4.4. INSTRUMENT CALIBRATION SHOULD ONLY BE PERFORMED BY QUALIFIED SERVICE PERSONNEL.

2.6.5.7 Set Time/Date

* * * * * * * *

Wed Apr 15 10:30:10 1993

TO CHANGE TIME PRESS T KEY

TO CHANGE DATE PRESS D KEY

TO RETURN PRESS <MENU>

Figure 2-46

Set Time / Date

Page 74 of 118 Operation

Allows resetting of time and date into unit memory. This is used as the basis for the elapsed time counter and stored calibration date.

T (time) is entered in HOURS (up to 2 digits, 0 through 23)

D (date)

is entered in

MINUTES SECONDS

MONTHS

(up to 2 digits, 0 through 59)

(up to 2 digits, 1 through 12)

DAYS (up to 2 digits, 1 through 31) YEARS (4 digits, 1991 through 2100)

2.6.5.8 Usage/Cal Date

QuadTech 7400 Model B Version 4.0 THE TOTAL OPERATING TIME FOR

THIS INSTRUMENT IS

1205.50 hours

THIS INSTRUMENT WAS CALIBRATED ON

10/15/97

AT 11:25:10

HIT <MENU> KEY TO CONTINUE

cal

data

Figure 2-47

Usage / Cal Date

When selected, indicates the total elapsed time in hours that the unit has been powered up and the date of last calibration. The elapsed time is from the moment of initial use and may show some time when shipped from the factory. The calibration date is retained in instrument memory until the unit is re calibrated and then it is updated. When

cal data

is selected, the calibrated values are shown as entered from the Report of Calibration provided with the 7000-09 Calibration Kit previously used. Refer to paragraph 4.4.

Operation Page 75 of 118

2.6.5.9 Set Contrast

HIT ARROW KEYS TO

CHANGE THE DISPLAY CONTRAST

HIT <ENTER> TO ACCEPT THE CONTRAST SETTING

Figure 2-48

Set Contrast

Allows adjustment of contrast on the LCD display. Use Up arrow to increase contrast or Down arrow to decrease. When the instrument is powered up it returns to the last set contrast.

2.6.5.10 Self Test

When selected, runs a group of internal self tests to verify that calibration and open/short data are not corrupt.

2.6.5.11 LCD Backlite

Allows the backlite on the LCD display to be

or On. When set to Save the backlite

Save

turns off automatically if no keypad has been hit for 5 minutes and turns back on with the touch of START, MENU or ENTER keys. When set to On the backlite is constantly on. The Save mode will prolong the life of the display.

Page 76 of 118 Operation

2.7 Input/Output Interface

2.7.1 I/O Interface

The 7400 comes standard with an automatic component handler I/O interface port available through a 36 pin Centronics type connector located on the rear panel of the instrument. This port outputs signals to indicate measurement in process, measurement completed, and bin sorting judgments. The Handler Interface also has inputs for an external trigger signal and a safety interlock signal. All output lines are negative true, optically isolated, open collector. Pull-up resistors to allow operation from +5V to +24V logic must be implemented externally. Inputs are optically isolated, and can be current driven from either positive or negative true logic. Current limiting resistors to allow operation from +5V to +24V logic must be implemented externally.

Refer to Table 2-1 for signal names, pin numbers and functions as necessary for cable connections.

Table 2-1 I/O Interface Connections

Signal Name Pin Number Function

-Bin1 1 Bin Sorting Results (Bin1-Bin10)

-Bin2 19 All signals active low, open collector

-Bin3 2

-Bin4 20

-Bin5 3

-Bin6 21

-Bin7 4

-Bin8 22

-Bin9 6

-Bin10 24

-Bin11 7 Primary parameter pass, secondary fail low

-Bin12 25 Primary parameter pass, secondary fail high

-Bin13 8 Primary parameter fail, secondary pass

-Bin14 26 Primary parameter fail, secondary fail

-Bin15 9 No Contact

-Bin16 27 Unused

-EOT 29 End of Test, test completed and bin and measurement data valid.

Operation Page 77 of 118

Table 2-1

I/O Interface Connections (continued)

Signal Name Pin Number Function

-BUSY 30 Measurement/comparison in progress INT+ 13 Interlock high input from external source HTC 31 Handler timing control TRIG+ 14 Trigger high input TRIG- 16 Trigger low input START+ 34 Isolated Trigger high input START- 35 Isolated Trigger low input source GND 11, 15, 33 System common IGND 5, 10, 23, 28 Isolated common +5V 12, 32 System +5V through 100 ohms

118

Pin Configuration (Viewed from Rear Panel)

Operation

o not apply an external source in excess of 5 volts with jumpers JP2, JP3 or JP4 in place, otherwise

the instrument can be damaged. The instrument is shipped with these jumpers in place and must be

removed for optical isolation. These jumpers are discussed below and physically located on the I/O

WARNING

board, and depending on the I/O board version may be located under the stack.

The operation of START and TRIG circuits is identical. Both inputs are active low, for optical isolation they require a positive +5 to +24V external source and current limiting resistor to operate. START is always optically isolated. TRIG can be converted to a

isolated active low input

by removing jumper JP3 on the I/O PCB. Both signals are open collector OR'ed on the I/O pcb; current flowing through the isolator input on either signal causes a single Start line to be pulled low.

The INTerlock signal can be optically isolated, and also requires a positive +5 to +24V external source and current limiting resistor to operate. This signal can be converted to a

isolated active low input

by removing jumper JP4 on the I/O PCB. Current flowing

through the isolator input causes the internal Interlock line to be driven low. All bin and control outputs can be active low optically isolated open - collector drivers

that pull each signal line to IGND (isolated common) when asserted. All outputs require a positive +5 to +24V external source (referenced to IGND) and pullresistor to operate as fully isolated signals. IGND can be isolated from system GND by removing jumper JP2 on the I/O PCB. With jumper JP2 in place optical isolation is defeated allowing the outputs to be pulled up to the system +5V with external resistors.

Page 78 of 118 Operation

End of Measurement

START

EOT

(pin 31 floating)

EOT

(pin 31 grounded)

BUSY

Bin Data

10 us min

Active

Previous Data Valid Data Valid 2nd Test

10 us min

Figure 2-49

I/O Interface Timing

Test Initiation

•

INTerlock signal is verified to be active, indicating safety interlock in place.

• A test is initiated by activating either the START+/- or TRIG+/- inputs.

• The BUSY line is asserted low to indicate that a measurement is in progress.

• The EOT line is de-activated (asserted high) to indicate that the end of the test

had not been reached

•

Binning data from the previous test is still valid.

During a Test

• The START+/- or TRIG+/- inputs are released and return to their inactive state.

• The BUSY line is held low to indicate that the 7400 is making a measurement.

•

The EOT line is held high (inactive) until the 7400 is done making a

measurement and bin data is valid.

Operation Page 79 of 118

End of Test

• The BUSY line is returned to high impedance (de-activated) to indicate that the

7400 is done making a measurement. This condition may be used to signal the automatic component handler to advance the DUT to the binning station and insert the next DUT.

• Simultaneously, the EOT line is asserted low to indicate that the test is

completed, bin data lines and measurement data are valid and can be read from the IEEE or RS-232 ports. Data must be valid a minimum of 10µs before the trailing edge of BUSY and EOT.

•

All data for the current test is valid, and will remain valid until the end of the next test. This includes comparator bins 1-10, primary and secondary parameter bins 11-15, and analog measurement data.

Electrical Characteristics

Inputs: START+/-, TRIG+/-, INT+/-

Condition

Input Current Input Voltage

Active High Signal+ current driven, Signal- @ IGND 5 - 60 mA 5 - 24V

Active Low Signal- current driven, Signal+ @ V+(ext) 5 - 60 mA 5 - 24V

Outputs: -Bin1 : -Bin16, -EOT, -BUSY

Condition

Sink Current Output Voltage

Low High

-Binning signals 80 mA max <

-Control signals 80 mA max <

0.5V 5 - 24V

Page 80 of 118 Operation

$%&'()*)

+,-./(+,-.0#

+123

+,456

789:

53;<3=>(3<78=

793=

$%&'()*)

!"##

53;<3+>(3<78+

793+

Figure 2-50

I/O Interface Isolation

All handler I/O is conducted through a single 8255. The outputs from the 8255 are optically isolated for added interfacing flexibility and to increase reliability by reducing noise pickup and ground loop interference. The isolators utilize open collector darlington outputs, and can sink up to 80mA of current provided by an external source at up to 24V. No provisions for pull-up resistors are provided onboard. The isolated ground return can be floated, or connected to the 7400 system ground for use with isolated handlers. The isolators are driven by inverting high current buffers. All outputs are asserted active low by writing a logic 1 to the desired bit in the appropriate 8255 port.

All inputs are also optically isolated. Both anode and cathode of the input opto isolators are available in the handler interface connector. Active high inputs can be achieved by grounding the cathode ( "-" signal ) and driving the anode ( "+" signal ), while connecting the anode to the external supply and sinking current through the cathode will result in active low drive. No provisions for current limiting resistors are provided on board. All inputs are reverse bias protected. The isolator outputs are connected directly to the 8255 Port C inputs. Asserting the input to the isolators drives the outputs low; reading a logic 0 from the 8255 input port indicates that the input line has been activated. The START and TRIG isolator outputs are open collector OR'ed to the same 8255 Port C input line; the 7400 cannot tell which of the devices generated the external trigger command.

2.7.2 Parallel Interface

The 7400 comes standard with a parallel printer port available through a connector (25 pin) on the rear panel of the instrument. This is a standard PC compatible interface for connection to an IBM matrix type printer. Refer to Table 2-2 for signal names, pin numbers as necessary for cable connections.

Operation Page 81 of 118

Table 2-2

Parallel Interface Connections

Signal Name Pin Number Function Outputs:

-STROBE 1 Indicates that data is ready to read D0 2 Data bit 1 D1 3 Data bit 2 D2 4 Data bit 3 D3 5 Data bit 4 D4 6 Data bit 5 D5 7 Data bit 6 D6 8 Data bit 7 D7 9 Data bit 8

-AUTOFD 14 Auto paper feed

-INIT 16 Initializes printer

-SLCT IN 17 Selects printer GROUND 18 - 25 Signal ground

Inputs:

-ACK 10 Indicates that data has been received and printer is ready to accept more data BUSY 11 Indicates that printer cannot receive data PE 12 Indicates that printer is out of paper SLCT 13 Indicates that printer is ready to receive data

-ERROR 15 Indicates printer error

113

25 14

Pin Configuration (Viewed from Rear Panel)

2.7.3 IEEE-488.2 Interface

The 7400 comes standard with IEEE-488 interface with connection through a connector (24 pin) on the rear panel. This interface can be used to connect to a system containing a number of instruments and a controller in which each meets IEEE Standard 488.2 (Standard Digital Interface for Programmable Instrumentation) Refer to Table 2-3 below for a full tabulation of connections and Table 2-4 for the command set.

The following functions have been implemented. Refer to the standard for an explanation of the function subsets, represented by the identifications below.

Page 82 of 118 Operation

SH1 Source Handshake PP1 Parallel Poll AH1 Acceptor Handshake DC1 Device Clear T5 Talker DT1 Device Trigger L3 Listener C0 Controller SR1 Service Request E2 Electrical Interface RL1 Remote Local

Table 2-3 IEEE-488 Interface Connections

Signal Name Pin Number Function

DAV 6 Low state: "Data is Available" and valid on DI01 through DI08 NRFD 7 Low state: At least one listener on the bus is "Not ready for Data". NDAC 8 Low state: At least one listener on the bus is "Not Accepting Data". ATN 11 "Attention" specifies 1 of 2 uses for the DI01 through DI08 lines Low state - Controller command messages High state - Data bytes from the talker device IFC 9 "Interface Clear" Low state - Returns portions of interface system to a known quiescent state. SRQ 10 "Service Request" Low state - a talker or listener signals (to the controller) need for attention in the midst of the current sequence of events REN 17 "Remote Enable" Low state - enables each device to enter remote mode when addressed to listen High state - all devices revert to local control EOI 5 "End of Identify" if ATN is in high state, then low state of EOI indicates end of a multiple-byte data transfer sequence. If ATN is in low state, then low state of EOI activates a parallel poll. DI01 1 The 8-line data bus, which conveys interface DI02 2 messages (ATN low state) or device-dependent DI03 3 messages (ATN high state), such as remote-control DI04 4 commands from the controller or from a talker DI05 13 device DI06 14 DI07 15 DI08 16

Operation Page 83 of 118

Table 2-4

IEEE Commands

Command Function Parameter(s)

CONFigure:

FREQuency Set the frequency from 10 to 500000 Hz 000000.00 PPARameter Set the primary parameter A(auto) CS CP LS LP RP RS DF Q Z Y P(phase angle) ESR GP XS BP SPARameter Set the secondary parameter N(none) CS CP LS LP RP RS DF Q Z Y P(phase angle) ESR GP XS BP ACTYpe Set the AC test signal type to V I

This command should be set prior to setting the ACValue.

ACValue Set the AC signal to value 0.0 BIAS Set the bias to INT EXT or OFF RANGe Set the range AUTO or HOLD or #(1 - 59) MACcuracy Set the measurement accuracy BASic ENHanced EXTended TDELay Set the measurement delay ##### AVERage Set # to average ### MEDian Set the median function to ON or OFF ON OFF DISTortion Set distortion detection to ON or OFF ON OFF CCHeck Set the contact check to ON or OFF ON OFF DISPlay type Set display type to M (Measured Parameter) D (Deviation from Nominal) % (% Deviation from Nominal) B (Bin Number) S (Bin Summary) P (Pass/Fail) N (No Display) TRIGger Set the trigger to INTernal EXTernal NOMinal Set the nominal value floating point # (for deviation or % deviation)

Page 84 of 118 Operation

Table 2-4

IEEE Commands (continued)

Command Function Parameter(s)

CONFigure: BINNing:

bin#

ABS* Set the low & high limit for the bin low high (floating point #'s) TOL Set the % below, % above & nominal % below, % above, nominal (3 floating point #'s w/space between) SECondary Set the secondary low & high limit low high (floating point #'s) TRESet Reset the bin totals to zero SUMMary? Retrieve the bin summary data

FRESult Set the result format to SCIentific ENGineering HANDler (state) Turn handler port OFF or ON ON OFF RPRint Turn print results ON or OFF ON OFF RFLoppy: Results to floppy DUPLicate Save results as duplicate filename on floppy xxxxxxxx NEW Save results as new filename on floppy xxxxxxxx APPend Append results to existing filename xxxxxxxx CLOSe Close results of filename xxxxxxxx

SWEep:

PARameter The parameter to sweep F (frequency) V (voltage) I (current) BEGin The beginning value floating point number END The ending value floating point number STEP The step to increment during the sweep 10 25 50 100 200 RDISplay The result display for the sweep T (table) P (plot) SWEep Set the sweep function to ON or OFF ON OFF VALid? Is filename valid to save to battery backed xxxxxxxx RAM?

* Example CONF: BINN: BIN1: ABS 100 300

Operation Page 85 of 118

Table 2-4

IEEE Commands (continued)

Command Function Parameter(s)

CONFigure:

SAVe:

DUPLicate Save setup as duplicate filename in battery backed RAM xxxxxxxx NEW Save setup as new filename in battery backed RAM xxxxxxxx RECall filename Recall setup filename from battery xxxxxxxx backed RAM FVALid? Is filename valid to save to floppy? xxxxxxxx

FSAVe:

DUPLicate Save setup as duplicate filename on floppy xxxxxxxx NEW Save setup as new filename on floppy xxxxxxxx FRECall filename Recall setup filename from floppy drive xxxxxxxx RVALid? Is results filename valid? xxxxxxxx

SEQuence:

SEQuence Set the sequence function to ON or OFF ON OFF TEST Enable or Disable a test test #(1-6) and ENAble DISable FREQuency Set the frequency from 10 to 500000 HZ test # and ######.## PPARameter Set the primary parameter test # and A(auto) RS RP LS LP CS CP DF Q Z Y P(phase angle) ESR GP XS BP SPARameter Set the secondary parameter test # and N(none) RS RP LS LP CS CP DF Q Z Y P(phase angle)ESR GP XS BP ACTYpe Set the AC test signal type to test # and V I (This command should be set prior to setting the ACValue) ACValue Set the AC signal to value test # and 0.0 BIAS Set the bias to test # and INT EXT or OFF RANGe Set the range test # and ON OFF TDELay Set the measurement delay test # and #### STOP Stop on fail test # and ON OFF

Page 86 of 118 Operation

Table 2-4

IEEE Commands (continued)

Command Function Parameter(s)

LOAd correction:

NOMinals Set primary & secondary nominal values primary secondary (floating point #'s) MEAsure Perform the Correction Measurement and set Load Correction to On ON Set Load Correction to ON (valid only if a Correction Measurement has previously been made OFF Set Load Correction to Off

SYSTem:

TIME Set the time to hours, minutes hh:mm DATE Set the date to month, day, year mm/dd/yyyy LOCKout state Set the front panel lockout off or on ON OFF ELAPsed? Query the elapsed time the machine has run DCALibration? Query the calibration date BLCD Turn lcd backlite On or set to Screen Save ON SAVE

Caution: Setting the remote LOCKout state with certain screens displayed on the unit can prevent one from entering or exiting lockout.

CALibrate:

DATA? Returns the calibration data to the user

QUIckos Perform quick open calibration IEEE wait for SRQ OPC to indicate continue Send Any command if desired to implement Send Fetch? This will continue calibration Receive Connect the Open Circuit. Ensure that the open is connected to the instrument Send CONTINUE Wait for SRQ OPC (operation complete, IEEE only)

Perform quick short calibration Send Any command if desired to implement Send Fetch? This will continue calibration Receive Connect the Short Circuit. Ensure that the short is connected to the instrument Send CONTINUE Receive Complete (for RS232 only) Wait for SRQ OPC (operation complete, IEEE only)

Operation Page 87 of 118

Table 2-4

IEEE Commands (continued)

Command Function Parameter(s)

SHORt Perform short circuit calibration

The procedure for performing a remote short is as follows: IEEE wait for SRQ OPC to indicate continue Send Any command if desired to implement Send Fetch? This will continue calibration Receive Connect the Short Circuit. Ensure that the short is connected to the instrument Send CONTINUE Receive Complete (for RS232 only) Wait for SRQ OPC (operation complete, IEEE only)

OPEN Perform open circuit calibration

The procedure for performing a remote open is as follows: IEEE wait for SRQ OPC to indicate continue Send Any command if desired to implement Send Fetch? This will continue calibration Receive Connect the Open Circuit. Ensure that the open is connected to the instrument Send CONTINUE Receive Complete (for RS232 only) Wait for SRQ OPC (operation complete, IEEE only)

FULL Perform full calibration

The procedure for performing full calibration is as follows: IEEE wait for SRQ OPC to indicate continue Send Any command if desired to implement Send Fetch? This will continue calibration Receive Connect the 374 Ω Standard. Ensure that the standard is connected to the instrument Send CONTINUE IEEE wait for SRQ OPC to indicate gain cal is done Send Any command if desired to implement Send Fetch? This will continue calibration Receive Connect the open circuit. Ensure that the open is connected to the instrument Send CONTINUE

Page 88 of 118 Operation

Table 2-4

IEEE Commands (continued)

Command Function Parameter(s)

IEEE wait for SRQ OPC to indicate open circuit cal is done Send Any command if desired to implement Send Fetch? This will continue calibration Receive Connect the short circuit. Ensure that the standard is connected to the instrument Send CONTINUE IEEE wait for SRQ OPC to indicate short circuit cal is done Send Any command if desired to implement Send Fetch? This will continue calibration

for the next 4 standards

Receive Connect the standard. Ensure that the standard is connected to the instrument Send CONTINUE Send Any command if desired to implement Send Fetch? This will continue calibration Receive Get prompt for Rnom and Qnom values at 1 kHz

IEEE wait for SRQ OPC to indicate current standard cal is done Send Any command if desired to implement Send Fetch? Receive Get prompt for Rnom and Qnom values at 50 kHz IEEE wait for SRQ OPC to indicate range cal is done Send Any command if desired to implement Send Fetch?

after last standard IEEE wait for SRQ OPC RS232 wait for Complete

MEASure

Triggers a measurement of the selected type. If sequence or sweep is enabled this command will trigger those type of measurements also. The result type is set by the display type parameter.

Operation Page 89 of 118

Table 2-4

IEEE Commands (continued)

Command Function Parameter(s)

FETCh?

Fetches the most recent measurement results. The character sequence formats are as follows:

Normal Measurements:

<primary result name> <tab> <primary result> <tab> <units> <secondary result name> <secondary result> <tab> <units> <tab> <bin or tab> <tab> <#> <tab> <pass string or fail string or tab> <tab> <retest or tab> terminated by a linefeed. The secondary parameter will be blank when the parameter is set to NONE.

Sweep Measurement:

If sweep is enabled, fetch will give all of the results based on the number of steps selected with the normal measurement format.

FETCh? Sequence Measurement:

If sequence is enabled, results will be sent for each test enabled. 1st line: <pass/fail bin> <tab> <#>, additional lines for tests enabled: <test> <tab> <#> <tab> <primary result> <tab> <units> <tab> <secondary results> <tab> <units> <tab> <fail or tab>, . . . last line for tests enabled: <test> <tab> <#> <tab> <primary result> <tab> <units> <tab> <secondary results> <tab> <units> <tab> <fail or tab> terminated by a linefeed.

Bin Summary Measurement:

Bins 1 - 10 <bin> <tab> <#> <tab> <low limit> <tab> <# or tab> <tab> <high limit> <tab> <# or tab> <tab> <total> <tab> <#> terminated by a linefeed. Bins 11 - 15 <bin> <tab> <#> <tab> <bin description> <tab> <total> <tab> <#> terminated by a linefeed. Last Line <totals:> <tab> <pass> <tab> <#> <tab> <fail> <tab> <#> <tab> <#> <tab> <total> terminated by a linefeed.

Page 90 of 118 Operation

Table 2-4

IEEE Commands (continued)

Command Function Parameter(s)

LOADFEtch?

Returns load correction status Valid, measured primary & secondary values or Invalid

IDN?

Returns instrument identification "QuadTech,7400modelb, xx..xx,software version"

ESR?

x denotes serial number up to 10 digits

Returns the read of the event status register.

STB?

Returns the read of the status byte register.

ESE?

Returns the read of the event status enable register.

SRE?

Returns the read of the service request enable register.

ESE

Set the event status enable register. value

SRE Set the service request enable register. value RST

Reset the buffer

TST?

Self test query

CLS

Clear standard event status register

Any remote command can start with * symbol for IEEE 488.2 compatibility.

Note:

Operation Page 91 of 118

2.7.3.1 Formats

IEEE 488.2 enables remote programming of all instrument functions, measurement conditions and comparator settings etc. Outputs include measurement conditions, open/short corrections, and measured values.

Data Formats

Data will be transmitted in ASCII NR3 format per IEEE488.2 sec. 8.7.4 and reproduced below. Note that there is always precisely one digit before the decimal point, and precisely three digits in the exponent.

Multiple results

For the case where a measurement produces multiple results (e.g. MEASure Cs, and DF), the individual numbers will be separated by commas per IEEE488.2 para. 8.4.2.2.

Sequences of Test (Sequence Mode) will be treated as a single Message Unit, with results separated by commas. If a particular test has “None” selected as a secondary parameter, no place will be reserved for the null result. As an example, a sequence of three tests asking for C/D, ESR, and Z/φ would appear as follows:

All response messages will be terminated by the NL (New Line) character together with the EOI line asserted.

Status Byte Register

Decimal Bit

Value Use 7 128 None 6 64 SRQ, SPOL Resets 5 32 Summary of Standard Event Status Register* 4 16 Message Available 3 8 None 2 4 None 1 2 None 0 1 None

Page 92 of 118 Operation

*The Status Byte Regester is readable via the standard STB? as defined in para. 11.2.2.2 of the IEEE spec. The 7400 will also implement an SRE register to enable each bit of the Status Byte Register per para 11.3.2 of the IEEE spec. This register shall be readable by a SRE? command and writeable by a SRE <#> command.

Standard Event Status Register

Decimal Bit

Value Use 7 128 Power Up Since Last Query 6 64 None 5 32 Command Error (Syntax) 4 16 Execution Error (Over Range, etc.) 3 8 No Contact 2 4 Query Error 1 2 None 0 1 Operation Complete

This register is read by executing an “ESR?” command per para. 11.5.1.2.2 (except no *). Note that this is a destructive read. Reading the register clears it. Each bit of the Event register must be enabled in order to cause the ESB bit of the Status Register to be set. This enabling is done in the Standard Event Status Enable Register by issuing an ESE command per para 11.5.1.3.

Operation Page 93 of 118

2.7.3.2 Sample Program for National Instruments GPIB card

260 '*SAMPLE 7400 BASIC PROGRAM FOR NATIONAL INSTRUMENTS IEEE ** ' Merge National DECL.BAS here 270 ADAP$="GPIB0" : DEV4$="Dev4": R$ = SPACE$(60) 280 CALL IBFIND (DEV4$,DEV4%) 290 CLS '***** SET CONDITIONS, MEASURE, AND DISPLAY DATA ************ 300 SET$="CONF:REC DEFAULT" : CALL IBWRT (DEV4%,SET$) 310 SET$="CONF:FREQ 1000.00" : CALL IBWRT (DEV4%,SET$) 320 SET$="CONF:PPAR CS" : CALL IBWRT (DEV4%,SET$) 330 SET$="CONF:SPAR DF" : CALL IBWRT (DEV4%,SET$) 340 SET$="CONF:MAC ENH" : CALL IBWRT (DEV4%,SET$) 350 SET$="CONF:NOM 0" : CALL IBWRT (DEV4%,SET$) 360 SET$="CONF:DISP M" : CALL IBWRT (DEV4%,SET$) 370 SET$="MEAS:" : CALL IBWRT (DEV4%,SET$) 380 FOR I = 1 TO 5000 : NEXT I 390 SET$="FETC?" : CALL IBWRT (DEV4%,SET$) 400 CALL IBRD (DEV4%,R$) : PRINT R$ 410 CALL IBLOC (DEV4%) 420 END

Page 94 of 118 Operation

2.7.4 RS232 Interface

The 7400 comes standard with an RS-232 serial port interface, available through a connector (9 pin) on the rear panel of the instrument, for connecting to a PC. The RS232 standard defines electrical specifications for the transmission of bit serial information. The use of the RS-232 port requires five lines, receive data, transmit data, data terminal ready, data set ready and signal ground. With some controllers additional signals may be required and are listed in Table 2-5 below. Refer to Figure 2-51 for null modem cable configuration to the standard db9 or db25 connector.

Refer to Table 2-4

for the command set which also applies to the RS-232 interface.

Table 2-5 RS-232 Interface Connections

Signal Name Pin Number Function

Inputs:

DCD 1 Data Carrier Detect DSR 6 Data Set Ready RXD 2 Receive Data CTS 8 Clear to Send RI 9 Ring Indicator

Outputs:

RTS 7 Request to Send TXD 3 Transmit Data DTR 4 Data Terminal Ready GND 5 Signal Ground

Operation Page 95 of 118

7400 Controller Pin # Function Pin # Function 2 3 4 5 6

Receive data Transmit data Data terminal ready Signal ground Data set ready

Connect to

3 2 6 5 4

Transmit data Receive data Data set ready Signal ground Data terminal ready

db9 to db9 Cable Configuration

7400 Controller Pin # Function Pin # Function 2 3 4 5 6

Receive data Transmit data Data terminal ready Signal ground Data set ready

Connect to

2 3 6 7 20

Transmit data Receive data Data set ready Signal ground Data terminal ready

db9 to db25 Cable Configuration

Figure 2-51 RS-232 Null Modem Cable Configurations

2.7.6 Results to Printer

The 7400 can be setup to output to an RS-232 or IEEE printer. Results format is the same as results to floppy, refer to paragraph 2.6.3.8.

RS-232

RS-232 must be selected on I/O Menus and format set IEEE must also

be selected for Talk mode and Disable state.

IEEE

IEEE must be selected on I/O Menus and set for Address, Talk mode

and Enable state.

Page 96 of 118 Operation

2.8 Operation with Accessories

2.8.1 General

A wide selection of accessories such as test leads, cables and fixtures are available from QuadTech to enhance the operation of the 7400 Precision LCR Meter. A full list of accessories are given in paragraph 1.5 of this instruction manual and each is discussed in more detail below. Some accessories may include information and or installation instructions which are not repeated here.

2.8.2 Rack Mount Kit (7000-00)

The 7000-00 Rack Mount Kit is used to install the 7400 in a rack mount configuration. The main components of the kit include front handles, front angle brackets, rear vertical trim pieces and rear support brackets. Assembly instructions (QuadTech Form # 150077) is provided with the kit.

2.8.3 BNC Cable Set, 1 Meter (7000-01), 2 Meter (7000-02)

The 7000-01 and 7000-02 are BNC to BNC cable sets used for connecting fixtures, component handlers or other measurement devices to the measurement terminals of the

7400. The only difference between the two is that the 7000-01 cable is 1 meter in length and the 7000-02 is 2 meters in length.

Rd/Wh

Bk/Wh PL

Bk IL

Figure 2-52

BNC Cable Sets

Rd IHIH

Bk/Wh

Bk IL

Operation Page 97 of 118

Connection to 7400:

Connect to 7400 Cable Marking/Color Connection to DUT

PH (potential, high) PH (Red/white) Positive (+) terminal of DUT IH (current, high) IH (Red) Positive (+) terminal of DUT PL (potential, low PL (Black/white) Negative (-) terminal of DUT IL (current , low) IL (Black) Negative (-) terminal of DUT

Note: H and L denote polarity of AC test signal at 7400 measurement terminals as well as the + and - polarity of DC bias voltage when applied.

2.8.4 Kelvin Clip Leads (7000-03)

The 7000-03 Kelvin Clip Leads provide a means for easily making four-terminal connections to passive components when they are tested by the 7400. This cable is especially useful for testing low-impedance devices that have large or non-standard terminations, devices such as electrolytic capacitors and inductors.

Rd/Wh PH

Rd/Wh

Rd IH

Bk/Wh PL

Bk IL

Rd IH

Bk/Wh

Bk IL

+ and - denote polarity

of DC bias voltage

Figure 2-53

Kelvin Clip Leads

Page 98 of 118 Operation

Connection to 7400:

Connection to the 7400 is made through four shielded cables with BNC connectors that mate directly with the measurement terminals of the 7400. The cables are color coded to facilitate proper connections as detailed below.

Connect to 7400

Cable Marking/Color Connection to DUT

Note: H and L denote polarity of AC test signal at 7400 measurement terminals as well as the + and - polarity of DC bias voltage when applied

Open/Short Zeroing:

When these Kelvin Test Leads are used an open/short-circuit "zeroing" procedure should be done, as described in paragraph 2.4 of this manual, to correct for residual resistance and inductance. The following diagram shows how to connect the clips for the shortcircuit "zero."

RedWhite

Black

White

Figure 2-54

Kelvin Test Leads Open/Short Zeroing

Operation Page 99 of 118

2.8.5 Alligator Clip Leads (7000-04)

The 7000-04 Alligator Clip Leads is generally used to connect to devices that are multiterminal, physically large or otherwise unsuited for one of the remote test fixtures. the lead set consists of a BNC to BNC cable, four banana plug adapters and four alligator clips. One of the banana plug adapters is supplied with a pigtail for connecting a "guard" if necessary.

Rd/Wh PH

Rd/Wh

Rd IH

Bk/Wh PL

Bk IL

Rd IH

Bk/Wh

Bk IL

Figure 2-55

Alligator Clip Leads

Connection to 7400:

Connect to 7400 Cable Marking/Color Connection to DUT

Note: H and L denote polarity of AC test signal at 7400 measurement terminals as well as the + and - polarity of DC bias voltage when applied

Page 100 of 118 Operation

Quadtech 7400 Operations Guide

Specifications and Main Features

Frequently Asked Questions

User Manual