Quadtech 1855 Instuction Manual

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1855

Capacitor Leakage Current/IR Meter

Instruction Manual

Form 150767/A4

©QuadTech, Inc., 2004

5 Clock Tower Place, 210 East

Maynard, Massachusetts, U.S.A. 01754

October 2006

Telephone 978-461-2100 Sales 800-253-1230 Facsimile 978-461-4295

Website www.quadtech.com

The material in this manual is for informational purposes only and is subject to change, without notice. QuadTech assumes no responsibility for any error or for consequential damages that may result from the misinterpretation of any procedures in this publication.

CAUTION

Voltage may be present on front and rear panel terminals. Follow all warnings in this manual when

operating or servicing this instrument. Substantial levels of energy may be stored in capacitive devices

tested by this unit.

Product will be marked with this symbol (ISO#3864) when it is necessary for the user to refer to

the instruction manual in order to prevent injury or equipment damage.

Product marked with this symbol (IEC417) indicates presence of direct current.

Product will be marked with this symbol (ISO#3864) when voltages in excess of 1000V are

present.

Page 2 of 76

Contents

Warranty ....................................................................................................................5

Specifications ....................................................................................................................7

Accessories ....................................................................................................................11

Safety Precautions...............................................................................................................13

Condensed Operating Instructions....................................................................................15

Introduction - Section 1

1.1 Unpacking and Inspection........................................................................................ 19

1.2 Product Overview .................................................................................................... 19

1.3 Controls and Indicators............................................................................................ 20

1.3.1 Front Panel Controls and Indicators .......................................................... 20

1.3.2 Rear Panel Controls and Connectors .........................................................21

1.4 Installation .............................................................................................................. 22

1.4.1 Dimensions ................................................................................................. 22

1.4.2 Instrument Positioning................................................................................ 22

1.4.3 Power Requirements ................................................................................... 22

1.4.4 Safety Inspection......................................................................................... 23

Operation - Section 2

2.1 Terms and Conventions ........................................................................................... 25

2.2 Start-Up.................................................................................................................... 27

2.3 SYSTEM SETUP ...................................................................................................27

2.3.1 Calibration ................................................................................................. 27

2.3.2 Memory Manage ........................................................................................ 27

2.3.3 System Configuration ................................................................................28

2.3.3.1 Test Parameter ........................................................................... 29

2.3.3.2 Beeper ........................................................................................ 29

2.3.3.3 Sound Mode ............................................................................... 29

2.3.3.4 Alarm Mode ............................................................................... 30

2.3.3.5 Trig Delay .................................................................................. 30

2.3.3.6 Trig Edge ................................................................................... 30

2.3.3.7 Handler Mode ............................................................................ 31

2.3.3.8 Contrast ...................................................................................... 31

2.3.3.9 GPIB Address ............................................................................ 31

2.3.3.10 RS232 Baud Rate ...................................................................... 32

2.3.3.11 Key Lock ................................................................................... 32

2.3.3.12 Line Frequency .......................................................................... 33

2.3.3.13 Charge Time .............................................................................. 33

2.3.3.14 Range Dwell .............................................................................. 33

2.3.3.15 Average ...................................................................................... 34

2.3.3.16 EXT Vm Display ....................................................................... 34

Page 3 of 76

Contents

Operation - Section 2 – Continued

2.4 MAIN INDEX ........................................................................................................ 35

2.4.1 Sequence Test ............................................................................................35

2.4.2 Step Test .................................................................................................... 36

2.4.3 Null ............................................................................................................36

2.4.4 W.V. Test ................................................................................................... 38

2.4.5 Compare .....................................................................................................39

2.5 MEAS DISPLAY .................................................................................................... 41

2.5.1 Test Voltage ............................................................................................... 42

2.5.2 Constant Current ........................................................................................42

2.5.3 Range .........................................................................................................43

2.5.4 Charge Time ............................................................................................... 44

2.5.5 Dwell Time ................................................................................................. 44

2.5.6 Speed...........................................................................................................45

2.5.7 Trigger .......................................................................................................45

2.5.8 Rated Withstand Voltage (Vf) ................................................................... 46

2.5.9 Measurement Time (Tend) ........................................................................ 46

2.5.10 Maximum Charge Time (CHG Tend) ........................................................ 47

2.6 Connection to Device under Test............................................................................. 48

2.7 Measurement Procedure........................................................................................... 49

Interface - Section 3

3.1 RS-232 Interface ..................................................................................................... 51

3.1.1 RS232 Pin Configuration ........................................................................... 51

3.1.2 RS232 Specifications ................................................................................. 51

3.1.3 RS232 Commands .....................................................................................52

3.2 IEEE-488 Interface .................................................................................................. 53

3.2.1 Pin Configuration........................................................................................ 53

3.2.2 IEEE-488 Interface Function Codes and Messages.................................... 55

3.2.3 IEEE-488 Interface Commands .................................................................. 57

3.2.4 IEEE-488 Command Format .....................................................................59

3.2.5 IEEE-488 Commands - Detailed ............................................................... 60

3.2.6 Error Messages .......................................................................................... 71

3.3 Handler Interface .................................................................................................... 72

3.3.1 Trigger ....................................................................................................... 73

3.3.2 Handler Pin Assignments for Compare Operation .................................... 74

Service & Calibration - Section 4

4.1 General ................................................................................................................... 75

4.2 Instrument Return .................................................................................................... 75

4.3 Calibration ............................................................................................................... 75

4.3.1 1855 Verification Procedure ...................................................................... 76

4.3.2 1855 Verification Data Sheet ..................................................................... 76

Page 4 of 76

Warranty

QuadTech warrants that Products are free from defects in material and workmanship and, when properly used, will perform in accordance with QuadTech’s applicable published specifications. If within one (1) year after original shipment it is found not to meet this standard, it will be repaired, or at the option of QuadTech, replaced at no charge when returned to a QuadTech service facility.

Changes in the Product not approved by QuadTech shall void this warranty.

QuadTech shall not be liable for any indirect, special or consequential damages, even if notice has been given of the possibility of such damages.

This warranty is in lieu of all other warranties, expressed or implied, including, but not limited to any implied warranty or merchantability of fitness for a particular purpose.

SERVICE POLICY

QuadTech’s service policy is to maintain product repair capability for a period of at least five (5) years after original shipment and to make this capability available at the then prevailing schedule

of charges.

Page 5 of 76

Page 6 of 76

Specifications

Leakage Current Test: Leakage Current: 0.001uA – 20.0mA

Accuracy: ±(0.3% + 0.005uA) Test Voltage: 1.0V – 650V DC, 0.1V/Step Voltage Accuracy: ±(0.5% + 0.2V) Test Current: 0.5mA – 500mA, 0.5mA/Step for DCV ≤ 100V

0.5mA – 150mA, 0.5mA/Step for DCV > 100V

Charge Current Accuracy: ±(3% + 0.05mA)

Insulation Resistance Test: Insulation Resistance: 10Ω – 99.99GΩ

IR Accuracy:

20V

++ +0.6

0.5uA Im

Where Vm and Im are measured voltage & current for a giv en load.

Test Voltage: 1.0V – 650V DC, 0.1V/Step Voltage Accuracy: ±(0.5% + 0.2V) Test Current: 0.5mA – 500mA, 0.5mA/Step for DCV ≤ 100V

0.5mA – 150mA, 0.5mA/Step for DCV > 100V

Charge Current Accuracy: ±(3% + 0.05mA) Withstand Voltage Test:

Rise Time (Tr): 0.05s – 120s Withstand Voltage (Vf): 1.0V – 650V DC, 0.1V/Step Test Current: 0.5mA – 150mA, 0.5mA/Step Charge Current Accuracy: ±(3% + 0.05mA) Measure Time: 30s – 600s MAX Charge Time: 5s – 600s

0.005uA

Page 7 of 76

Specifications (Continued)

General Features Test Types: Automatic Sequence Test

Manual Step Test

Null: Correction for Lead Leakage

Monitored Voltage (Vm): 1.0V – 650V DC (Voltage across DUT)

Charge Time: 0 – 999seconds in 1s/10s increments <100s; 100s increments >100s

Delay Time: 0.2 – 999seconds in 0.1s increments <100s; 10s increments>100s

Discharge: 65 Watt Discharge Circuit

Trigger: Delay: 0 – 9.995 seconds in 0.1s increments

Edge: Falling or Rising

Measurement Mode: Continuous or Trigger (INT, EXT or Manual)

Measurement Rate: Fast: 18 measurements/second

Medium: 14 measurements/second Slow: 7 measurements/second

Ranging: Automatic or Hold

Averaging: 1-8 measurements

Compare: Set Upper & Lower Limits for LC and IR Tests

Display: 240 x 64 LCD Graphic display

Indication: Audible alarm programmable HI, LOW or OFF for Pass or Fail

Standard Interface: RS232

Optional Interfaces: IEEE-488 & Handler

Connectors: 1 BNC terminal: Input

2 Banana terminals: HV (+), HV (-) 1 Banana Socket: Chassis Ground

Front Panel Lockout: Keypad Lock

Page 8 of 76

Specifications (Continued)

Mechanical: Bench Mount

Dimensions: (w x h x d): 12.50 x 4.00 x 13.50 inches

317.2 x 101.5 x 342.6 mm

Weight: 18 lbs (8.2kg) net, 22 lbs (10kg) shipping

Environmental: Operating: 10°C to 40

Storage: -10°C to 50 Humidity: <90% Pollution Degree 2 Installation Category I

Power: • 90-125VAC • 190-250VAC

• 50 or 60Hz • 400W max

Supplied: • Instruction Manual • Power Cable

• Calibration Certificate • Lead Set

Ordering Information: Description Catalog No. Capacitor Leakage Current/IR Meter 1855

Page 9 of 76

Page 10 of 76

Accessories

Accessories Included

Item Quantity QuadTech P/N

AC Power Cord 1 4200-0300 Power Line Fuse: 4A 250V SB for 115V operation 1 520149 Power Line Fuse: 2A 250V SB for 230V operation 1 520148 Test Leads: Banana to Alligator Clip & BNC to Alligator Clip 1 1855-01 Instruction Manual 1 150767 Calibration Certificate 1 N/A

Accessories/Options Available

Item Quantity QuadTech P/N

IEEE-488 & Handler Interface 1 700171 RS-232 Cable 1 630157 Resistivity Test Cell for Surface & Volume Resistivity Msmts 1 1855-11

Page 11 of 76

Page 12 of 76

Safety Precautions

CAUTION

The 1855 Capacitor Leakage Current/IR Meter can provide an output voltage of 650V DC to the

device under test (DUT). Although the 1855 unit is a low voltage instrument, some devices

(especially capacitors) can store charge when tested. If not discharged properly, these devices

may cause serious hazards. Follow these safety instructions.

1. Operate the 1855 unit with its chassis connected to earth ground. The instrument is shipped with a three-prong power cord to provide this connection to ground. This power cord should only be plugged in to a receptacle that provides earth ground. Serious injury can result if the 1855 unit is not connected to earth ground.

2. Tightly connect BNC cable to the silver INPUT terminal. If this is not done, the DUT’s casing can be charged to the high voltage test level and injury or electrical shock hazards could result if the DUT is touched.

3. Never touch the test leads, test fixture or DUT in any manner (this includes insulation on all wires and clips) when [TRIGGER] has been pressed and the output is applied.

4. Before turning on the 1855 instrument, make sure there is no device (DUT) or fixture connected to the test leads.

5. Make sure any capacitive device has been discharged fully before touching the test lead

wires or output terminals.

6. In the case of an emergency, turn OFF the POWER switch using a “hot stick” and

disconnect the AC power cord from the wall. Do not touch the 1855 instrument.

7. Be wary when the 1855 instrument is used in remote control mode. The voltage/current output is being turned on and off with an external signal.]

8. Do not exceed the 1A Maximum Input Current.

Page 13 of 76

Page 14 of 76

Condensed Operating Instructions

General Information

The 1855 Capacitor Leakage Current/IR Meter is an instrument for measuring the parameters of leakage current (LC), insulation resistance (IR), withstand voltage (WV) and rise time (Tr). The 1855 instrument functions mainly as a leakage current and withstand voltage tester for aluminum foil electrolytic capacitors and high dielectric ceramic capacitors. The 1855 instrument is useful in testing any components for which leakage current is a major factor including Zener diodes, absorbers, etc. For production testing, the 1855 instrument has a Compare function and Pass/Fail indication. Connection to device under test is through BNC/Banana terminals on the front panel.

Start-Up

The 1855 Capacitor Leakage Current/IR Meter can be operated from a power source between 90125V or 190-250V AC at a power line frequency of 50 or 60Hz. The standard 1855 unit is shipped from QuadTech with a 4A fuse in place for AC 90-125V operation. (A 2A fuse is included for AC 190-250V operation). The 1855 unit is shipped with the line voltage selector set for 115V. Refer to paragraph 1.4.3 for instructions on changing the fuse or line voltage selector.

Connect the 1855 Capacitor Leakage Current/IR Meter’s AC power cord to the source of proper voltage. Operate the 1855 instrument with its chassis connected to earth ground. The 1855 instrument is shipped with a three-prong power cord to provide this connection to ground. This power cord should only be plugged into a receptacle that provides earth ground. Serious injury may result if the 1855 instrument is not connected to earth ground.

To turn the 1855 instrument ON, press the power button on the front panel. To switch the power OFF, press the button again or if measurements are to be made proceed with the Test Parameter Setup in Table COI-1. The 1855 instrument should warm up for 15 minutes prior to use.

Table COI-1: Test Parameter Setup

Test LC/IR WV/Tr Parameter

Test V 1.0V – 650V DC N/A C.C. 0.5mA – 500mA N/A Range 2uA-20uA-200uA-2mA-20mA N/A CHG T 0s – 999s N/A DWELL T 0.2s – 999s N/A Speed Fast – Medium – Slow N/A Vf N/A 1.0 – 650V DC C.C. N/A 0.5mA – 150mA Tend N/A 30s – 600s CHG Tend N/A 5s – 600s

NOTE

Refer to paragraphs 2.3.3 through 2.4 for a full description of programming test parameters. Test parameters must

be set before the 1855 instrument can be zeroed.

Page 15 of 76

Condensed Operating Instructions (Continued)

There are three main menus within the 1855 instrument software. Familiarize yourself with these menus prior to programming a test. Figure COI-1 illustrates the MEAS DISPLAY screen and lists the functions that can be accessed by pressing the [MAIN INDEX] and [SYSTEM SETUP] keys.

Function of F1 - F4 Keys

MEAS DISPLAY

MAIN

< MEAS DISPLAY: SEQ. TEST >

TEST V.

1.0V

MEAS

DISPLAY

INDEX

SYSTEM

SETUP

Lc :

Vm = 0.0V

MEAS

DISPLAY

SEQ. STEP

Test Voltage Constant Current Range

NEXT PAGE 1/2

Charge Time Dwell Time Speed

NEXT PAGE 2/2

Test Voltage Constant Current Range

NEXT PAGE 1/2

Trigger Speed

NEXT PAGE 2/2

-1.2 A

DISCHARGECHARGE TEST

Sequence Test

Step Test

Null W.V. Test

Compare

MAIN

INDEX

Test Voltage Constant Current Range Charge Time Dwell Time Speed

Test Voltage Constant Current Range Trigger Speed

Foil Voltage Constant Current End Time Charge End Time

C.C. RANGE NEXT PAGE 1/2

0.5mA

2uA

SYSTEM

SETUP

CALIBRATION

Need Password*

MEMORY MANAGE

Need Paasword*

SYSTEM CONFIGURATION

Test Parameter Beeper Sound Mode Alarm Mode Trigger Delay Trigger Edge Handler Mode Contrast GPIB Address RS232 Baud Rate Key Lock Line Frequency Charge Time Range Dwell Average EXT Vm Display

* Qualified Service Personnel Only Instrument Calibration & Verification

CHARG E/TEST DISCHARGE

TRIGGER

Figure COI-1: 1855 Instrument Menus

NOTE:

The function keys [F1 – F4] are used to select the parameter to change and in some menus to

change the value of that selected parameter.

The function of UP/DOWN depends on the menu. In some menus, the LEFT/RIGHT keys are

used to select a digit by moving the underscored cursor left or right.

Page 16 of 76

Condensed Operating Instructions (Continued)

1. Set Test Parameters

• Press [POWER] ON.

• Allow the instrument to warm up for 15 minutes.

• Press [MEAS DISPLAY]

• Set test parameters (voltage, current, range, etc.) using the function & arrow keys.

2. Null

After setting your test parameters, use the Null function of the 1855 instrument to zero the test leads. With no device connected, connect the appropriate cable to the front panel BNC/Banana connectors. Refer to paragraph 2.6 for cable connections.

With the instrument in MEAS DISPLAY status:

1. Press [MAIN INDEX]

2. Press [F3] = NULL

3. Press [TRIGGER] button.

4. Wait while instrument cycles through NULL test.

5. Press [MAIN INDEX] to return to MEAS DISPLAY status.

6. Choose Test: [SEQ Test], [STEP Test] or [Next Page] to select [WV Test]

QuadTech

<MEAS. DISPLAY: NULL>

LC : mA

Press TRIGGER to start ...

CHARGE TEST DISCHARGE

1855 Capacitor Leakage Current /IR Meter

OPEN No DUT Connected for NUL L function

MAIN INDEX

TRIGGER

SYSTEM

SETUP

F1 F2

(-)(+)INPUT

MEAS

DISPLAY

CHARGE/TEST DISCHARGE

Figure COI-2: NULL OPEN Configuration

Page 17 of 76

Condensed Operating Instructions (Continued)

3. Connection to Device under Test (DUT)

Figure COI-3 illustrates the connection of the 1855 instrument to a DUT using the 1855-01 Lead Set. For Leakage Current, Insulation Resistance and Withstand Voltage Tests, the red alligator clip/BNC cable is connected between the silver INPUT terminal on the 1855 unit and the high side of the device under test. The black alligator clip/banana cable is connected between the white HV (-) terminal on the 1855 unit and the low side of the DUT.

QuadTech

<MEAS. DISPLAY: SEQ. TEST>

LC :

CHARGE TEST DISCHARGE

1855 Capacitor Leakage Current /IR Meter

1.5 mA

TEST V C.C

RANGE NEXT PAGE 1/2

DUT

1.0

0.5

MAIN INDEX

TRIGGER

SYSTEM

SETUP

(-)(+)INPUT

MEAS

DISPLAY

CHARGE/TEST DISCHARGE

COI-3: Connection to DUT for LC Test

4. Make a Measurement

1. Press [MEAS DISPLAY]

2. Connect device under test (DUT) to test leads.

3. Press [TRIGGER].

4. Record measurement.

NOTE

Please read this instruction manual in its entirety before operating this instrument.

These condensed operating instructions are not a substitute for all the information provided in the

remainder of this manual.

Page 18 of 76

Section 1: Introduction

1.1 Unpacking and Inspection

Inspect the shipping carton before opening. If damaged, contact the carrier agent immediately. Inspect the 1855 Capacitor Leakage Current/IR Meter for any damage. If the instrument appears damaged or fails to meet specifications notify QuadTech (refer to instruction manual front cover) or its local representative. Retain the original shipping carton and packing material for future use such as returning the instrument for recalibration or service.

1.2 Product Overview

The 1855 Capacitor Leakage Current/IR Meter is a compact yet powerful LC Tester and IR meter for production or laboratory testing of aluminum electrolytic capacitors, resistors and other passive components. The 1855 instrument measures 4 parameters: Leakage Current (LC), Insulation Resistance (IR), Rise Time (Tr) and Withstand Voltage (Vf) and displays two simultaneously. Basic accuracy is ±0.3%. From 1-8 measurements can be made, averaged and the result displayed with the Averaging function. Ranging is automatic or user selectable. Measurement rate is also selectable (Slow, Medium or Fast) with rates up to 18 measurements per second. Measurements can be made continuously or triggered with a programmable delay time up to 10 seconds. The 1855 comes standard with an RS-232 interface. An optional IEEE488 and Handler interface is also available. Voltage across the DUT can be monitored and displayed. Zero the effects of stray leakage in the test leads with the Null function. The Compare function on the 1855 instrument has programmable upper and lower limits and displays Pass/Fail in addition to the measurement value. Connection to the device under test is through 1 BNC INPUT terminal and 2 Banana HV terminals on the front panel.

QuadTech

<MEAS. DISPLAY: SEQ. TEST>

LC :

CHARGE TEST DISCHARGE

1855 Capacitor Leakage Current /IR Meter

1.0

0.5

1.5 mA

TEST V C.C

RANGE NEXT PAGE 1/2

MEAS

MAIN

(-)(+)INPUT

DISPLAY

CHARGE/TEST DISCHARGE

INDEX

TRIGGER

SYSTEM

SETUP

Figure 1-1: 1855 Capacitor Leakage Current/IR Meter

Introduction Page 19 of 76

1.3 Controls and Indicators

1.3.1 Front Panel Controls and Indicators

Figure 1-2 illustrates the controls and indicators on the front panel of the 1855 Capacitor Leakage Current/IR Meter instrument. Table 1-1 identifies them with description and function.

10 9 811

QuadTech

<MEAS. DISPLAY: SEQ. TEST>

LC :

CHARGE TEST DISCHARGE

1 423 56

1855 Capacitor Leakage Current /IR Meter

1.5 mA

TEST V C.C

RANGE NEXT PAGE 1/2

1.0

0.5

MEAS

MAIN

(-)(+)INPUT

DISPLAY

CHARGE/TEST DISCHARGE

INDEX

TRIGGER

SYSTEM

SETUP

Figure 1-2: 1855 Front Panel Controls & Indicators

Table 1-1: 1855 Front Panel Controls & Indicators

Reference # Figure 1-2

1 Green Push Button Apply AC POWER: 1=ON, 0=OFF 2 Silver Banana Jack Chassis ground connection 3a INPUT Silver BNC terminal Current Drive Terminal, High (+) 3b HV (+) Red Banana Jack Voltage Sense Terminal, High (+) 3c HV (-) White Banana Jack Voltage Sense Terminal, Low (-) 4 F1, F2, F3 and

5 ◄, ▼, ►, ▲ 4 gray push buttons Move backlit box around display to choose parameter

6 TRIGGER Gray push button Initiate measurement 7 DISCHARGE STOP measurement in progress & initiate discharge time 8 SYSTEM

9 MAIN

10 MEAS

11 240 x 64 LCD

Name Type Function

4 gray push buttons Select Instrument Functions

Keys perform different functions under different menus. Right side of display shows corresponding key function.

Change parameter value (increase/decrease)

Gray push button View, Select or Change System Parameters:

SETUP

Parameter, Beeper, Sound, Alarm, Trigger, Handler, Contrast, GPIB, RS-232, Key Lock, Line Frequency, Charge, Dwell, Average & EXT Vm Display

Gray push button View, Select or Change Setup & Result Parameters:

INDEX

Sequence, Step, Null, WV Test & Compare

Gray push button View, Select or Change Measurement Parameters:

DISPLAY

Voltage, Current, Range, Charge, Dwell, Speed & Trigger Show measurement results as value or pass/fail.

display

Show programming instructions

Page 20 of 76 Introduction

1.3.2 Rear Panel Controls and Connectors

Figure 1-3 illustrates the controls and connectors on the rear panel of the 1855 Capacitor Leakage Current/IR Meter instrument. Table 1-2 identifies them with description and function.

115V ~/230V~

RS232

WARNING:

IEEE-488 INTERFACEHANDLER INTERFACE

FOR CONTI NUED PROTECTION AGAINST FIRE HAZARD, REPLACE ONLY WITH THE SAME TYPE AND RATING OF FUSE AS SPECIFIED FOR THE LINE VOLTAGE BEING UTILIZED.

CAUTION:

NO OPERATO R SERVICEABLE PARTS INSIDE. REFER SERVICING TO QUALIFIED PERSONNEL.

POLLUTION DEGREE 2 INSTALLATION CATEGORY I

MODEL NO.

SERIAL NO.

50/60Hz 400VA MAX

FUSE LINE VOLTAGE

SELECTED

115V

230V

115V

90V - 125V~ T4.0AL 250V

190V - 250V~ T2.0AL 250V

234

Figure 1-3: Rear Panel 1855 Instrument

Table 1-2: 1855 Rear Panel Controls & Connectors

Reference # Figure 1-3

1 HANDLER

2 IEEE-488

3 FUSE Black screw cap fuse

4 LINE VOLTAGE

5 AC Line Input Black 3-wire inlet

6 RS-232

Name Type Function

Blue 24-pin

INTERFACE

connector Blue 24-pin

INTERFACE

connector

holder

2 Red 2-position

SELECTED

Slide Switches

module Black 9-pin RS-232 interface for serial communication

INTERFACE

Handler Interface connector for remote operation

IEEE-488 Interface connector for data transfer

Short circuit protection T 4A 250V fuse for 115V operation T 2A 250V fuse for 230V operation Select Voltage Level corresponding to AC Source 90V – 125V: T4.0A 250V fuse 190V – 250V: T 2A 250V fuse Connection to AC power source

Introduction Page 21 of 76

1.4 Installation

1.4.1 Dimensions

The 1855 Capacitor Leakage Current/IR Meter unit is supplied in a bench configuration, i.e., in a cabinet with resilient feet for placement on a table. Flip feet are attached under the front feet so that the 1855 instrument can be tilted up for convenient operator viewing.

4.0"

101.6mm

QuadTech

1855 Capacitor Leakage Cur rent/IR Meter

<MEAS. DISPLAY: SEQ. TEST>

Lc : 1.5 mA

TEST V. C.C

RANGE

NEXT PAGE 1/ 2

0.5mA

MEAS

MAIN

1.0V

2uA

(-)(+)INPUT

DISPLAY

SYSTEM

INDEX

SETUP

TRIGGER

13.5"

342.9mm

14.0"

355.6mm including front and

rear

12.50"

connectors

317.50mm

Figure 1-4: 1855 Instrument Dimensions

1.4.2 Instrument Positioning

The 1855 instrument contains one (1) graphic display for direct readout of measured parameters. The optimum angle for viewing is slightly down and about 10 degrees either side of center. For bench operation the front flip feet should always be used to angle the instrument up. In bench or rack mount applications the instrument should be positioned with consideration for ample air flow around the rear panel fan ventilation hole. An open space of at least 3 inches (75mm) is recommended behind the rear panel. Testing should be performed on a non-conductive surface. An ESD mat is not a recommended test platform.

1.4.3 Power Requirements

The 1855 can be operated from a power source of 90 to 125V AC or 190 to 250V AC. Power connection is via the rear panel through a standard receptacle. Before connecting the 3-wire power cord between the unit and AC power source, make sure the voltage selection switches on the rear panel (Figure 1-5) are in accordance with the power source being used. For a 90-125V source, use a 4A 250V fuse. For a 190-250V source, use a 2A 250V fuse. Always use an outlet that has a properly connected protection ground.

4.5"

114.3mm including

feet

Page 22 of 76 Introduction

CAUTION

Make sure the unit has been disconnected from its AC power source for at least five minutes

before proceeding.

Procedure for Changing an 1855 Instrument Fuse

Unscrew the fuse cap on the rear panel of the 1855 and pull fuse holder outward.

Once the fuse holder has been removed from the instrument snap the fuse from the holder and replace. Make sure the new fuse is of the proper rating.

Install the fuse back into the cap holder by pushing in until it locks securely in place.

115V ~/230V~

WARNING:

AGAINST FIRE HAZARD, REPLACE ONLY WITH THE SAME TYPE AND RATING OF FUSE AS SPECIFIED FOR THE LINE VOLTAGE BEING UTILIZED.

FOR CONTINUED PROTECTION

50/60Hz 400VA MAX

CAUTION:

PARTS INSIDE. REFER SERVICING TO QUALIFIED PERSONNEL.

POLLUTION DEGREE 2 INSTALLATION CATEGORY I

NO OPERATOR SERVICEABLE

FUSE

LINE VOLTAGE

SELECTED

115V

230V

90V-125V~ T4.0AL 250V

190V-250V~ T2.0AL 250V

Figure 1-5: Close-Up of 1855 Rear Panel

1.4.4 Safety Inspection

Before operating the instrument inspect the fuse holder on the rear of the 1855 instrument to ensure that the properly rated fuse is in place, otherwise damage to the unit is possible. Make sure that the voltage selector switches are set in accordance with the power source in use. Refer to paragraph 1.4.3 and Figure 1-5.

The 1855 instrument is shipped with a standard U.S. power cord, QuadTech P/N 4200-0300 (with Belden SPH-386 socket or equivalent, and a 3-wire plug conforming to IEC 320). Make sure the instrument is only used with these cables (or other approved international cord set) to ensure that the instrument is provided with connection to protective earth ground.

The surrounding environment should be free from excessive dust to prevent contamination of electronic circuits. The surrounding environment should also be free from excessive vibration. Do not expose the 1855 instrument to direct sunlight, extreme temperature or humidity variations, or corrosive chemicals.

Introduction Page 23 of 76

Section 2: Operation

2.1 Terms and Conventions Table 2-1: Measurement Unit Prefixes

Multiple Scientific Engineering Symbol

1000000000000000 1015 Peta P

1000000000000 1012 Tera T

1000000000 109 Giga G

1000000 106 Mega M

1000 103 Kilo k

.001 10-3 milli m

.000001 10

.000000001 10-9 nano n

.000000000001 10

.000000000000001 10

Capacitor: Abbreviated C. A capacitor is passive component comprised of two conductors

Capacitance: The measure of the ratio of charge on either plate of a capacitor to the potential

Compare: Procedure for sorting components by comparing the measured value against a

DC: Direct Current. Non-reversing polarity. The movement of charge is in one

Dielectric: A material which is an electrical insulator or in which an electric field can be

Dielectric Absorption: The physical phenomenon of insulation appearing to absorb and retain an

Dielectric Constant: Abbreviated K, relative dielectric constant. The dielectric constant of a material

Discharge: The act of draining off an electrical charge to ground. Devices that retain charge

-6

micro µ

-12

pico p

-15

separated by a dielectric. A capacitor stores charge blocks DC flow and allows AC flow based on frequency and capacitor design.

difference (voltage) across the plates. Unit of measure is the Farad (F).

known standard.

direction. Used to describe both current and voltage. Batteries supply direct current (DC).

sustained with a minimum dissipation of power.

electrical charge slowly over time. Apply a voltage to a capacitor for an extended period of time and then quickly discharge it to zero voltage. Leave the capacitor open circuited for a period of time then connect a voltmeter and measure the residual voltage. The residual voltage is caused by the dielectric absorption of the capacitor.

is the ratio of the capacitance of a capacitor filled with a given dielectric to that same capacitor having only a vacuum as a dielectric.

should be discharged after an IR test or DC hipot test.

femto f

Interface Page 25 of 76

DUT: Device Under Test. (i.e. the product being tested).

Ground: The base reference from which voltages are measured, nominally the same

potential as the earth. Ground is also the side of a circuit that is at the same potential as the base reference.

Insulation Resistance: Measures the total resistance between any two points separated by electrical

insulation. The IR test determines how effective the dielectric (insulation) is in resisting the flow of electrical current.

Interface:

Handler: Device for remote control of test instrument in component handling operations.

IEEE-488: General Purpose Interface Bus (GPIB). GPIB is an industry standard definition

of a Parallel bus connection for the purpose of communicating data between devices.

RS232: An industry standard definition for a Serial line communication link or port.

Range: The resistance ranges the instrument uses for reference in making the

measurement.

Speed: The rate at which the instrument makes a measurement in measurements per

second. Speed is inversely proportional to accuracy.

Trigger: The device for initiating the test (applying the voltage or current).

External: The test is initiated via an external source such as a computer with an IEEE-488

or Handler interface. One measurement is made each time the external trigger is asserted on the handler.

Internal: The instrument continuously makes measurements.

Manual: The operator initiates the test by pressing the [START] button. One

measurement is made each time the trigger is pressed.

Withstand Voltage: Voltage at which the product’s insulation begins to break down. There are many

definitions for Withstand Voltage. This manual uses the terminology from the EIAJ RC-2364A standard, “Test Methods of Electrode Foils for Aluminum Electrolytic Capacitors”.

Term Symbol Definition Formation Voltage Vfe The final applied voltage Standard Dielectric Withstand Voltage Rise Time Tr The time between when the current is applied and

Withstand Voltage Vt

Rated Voltage WV Rated working voltage of a capacitor

Vf The withstand voltage of formed foil

the voltage reaches 90% of the rated withstand voltage, Vf.

Tr + 3minutes ±10seconds (formed foils) Tr + 1minute ±10seconds (unformed foils)

Page 26 of 76 Interface

2.2 Startup

Check to make sure the red Line Voltage Selector switch on the rear panel agrees with the power source available. Depending on the power source the switch position should be in the up or down position as shown in Figure 1-5 (Close-Up of 1855 Rear Panel).

CAUTION

USE ALL PRECAUTIONS NECESSARY TO AVOID TOUCHING THE DEVICE UNDER TEST WHEN THE

TRIGGER BUTTON HAS BEEN PRESSED.

Connect the instrument power cord to the source of proper voltage. The instrument is to be used only with three-wire grounded outlets.

Power is applied to the 1855 instrument by pressing the green power switch on the front panel to the ON (1 position). The 1855 unit should warm up for a period of at least 15 minutes prior to measurements being made.

2.3 SYSTEM SETUP

System Setup contains the 1855 instrument setup functions: Calibration, Memory Manage and System Configuration. Press [SYSTEM SETUP] to access these functions.

< SYSTEM SETUP > CALIBRATION

MEM MANAGE

Enter Calibration

Enter Memory Manage

SYSTEM CONFIG

Enter System Configuration

Figure: 2-1: System Setup

2.3.1 Calibration

The Calibration menu is to be accessed by Qualified Service Personnel Only. Altering the 1855 instrument calibration will void the instrument warranty. The Calibration function is used to verify the resistance measurement ranges. To access the calibration function, press [SYSTEM SETUP] then press [F1] = [CALIBRATION]. Enter the password. [▲] [▼] [►] [◄] [TRIGGER]. Select cal range 20V or 200V. Refer to paragraph 4.3 Calibration for procedure.

2.3.2 Memory Manage

The Memory Manage menu is to be accessed by Qualified Service Personnel Only. Altering the 1855 instrument memory will void the instrument warranty. The memory manage function is used to verify the setup of the 1855 unit with a Function Test and a Handler Test. To access the memory manage function, press [SYSTEM SETUP] then press [F2] = [MEM MANAGE]. Enter the password. [▲] [▼] [►] [◄] [TRIGGER].

Interface Page 27 of 76

2.3.3 System Configuration

Prior to programming a test or measuring a device, set up the system controls of the 1855 instrument. To access the system controls, press [SYSTEM SETUP] then press [F3] = [SYSTEM CONFIG]. Table 2-2 lists the contents of SYSTEM CONFIG.

< SYSTEM SETUP > CALIBRATION

MEM MANAGE SYSTEM CONFIG

Enter Calibration

Enter Memory Manage

Enter System Configuration

< SYSTEM CONFIG > TEST PARAMETER : BEEPER SOUND MODE ALARM MODE TRIG DELAY TRIG EDGE HANDLER MODE :

< SYSTEM CONFIG > CONTRAST : GPIB ADDRESS RS232 BAUD RATE KEY LOCK LINE FREQUENCY CHARGE TIME

RANGE DWELL :

< SYSTEM CONFIG > AVERAGE : EXT Vm DISPLAY :

L.C. LOW

FAIL

PULSE

0000 mS

FALLING

CLEAR

19200

OFF

60Hz

Vm = Vs

0.0 S

1 OFF

I.R. L.C.

DIGIT UP DIGIT DOWN

Set Test Parameter to IR

Set Test Parameter to LC

Increase brightness: 00 - 15

Decrease brightness: 15 - 00

Increase # to Average: 1 - 8

Decrease # to Average: 8 - 1

Figure 2-2: System Configuration

Table 2-2: SYSTEM CONFIG

Parameter Function Range

Test Parameter Set the parameter to be tested LC, IR Beeper Set beeper loudness OFF, LOW or HIGH Sound Mode Set when the buzzer to sounds PASS/FAIL Alarm Mode Set type of alarm signal PULSE/CONTINUOUS Trigger Delay Set external trigger time 0000 – 9999 ms Trigger Edge Set trigger mode FALLING/RISING Handler Mode Set handler interface mode CLEAR/HOLD Contrast Set display contrast 00 – 15 GPIB Address Code Set interface address 00 – 30 RS-232 Baud Rate Set baud rate 600, 1200, 4800, 9600, 19200, 28800 Key Lock Lock out front panel programming OFF/ON Line Frequency Set line input frequency 50Hz/60Hz Charge Time Set time for unit to charge DUT 0 – 999seconds Range Dwell Set time for unit to stabilize at test level 0.2 – 999seconds Average Time Set measurement average 1 – 8 EXT VM Display Display output voltage OFF/ON

Page 28 of 76 Interface

2.3.3.1 Test Parameter

The 1855 Capacitor Leakage Current/IR Meter can function as a Leakage Current tester or as an Insulation Resistance meter. The instrument default setting is L.C. To change the function of the 1855 Capacitor Leakage Current/IR Meter press [SYSTEM SETUP] then [SYSTEM CONFIG] The box next to TEST PARAMETER is highlighted. Press [F1] = I.R. to select an Insulation Resistance test or press [F2] = L.C. to select the Leakage Current test.

< SYSTEM CONFIG > TEST PARAMETER : BEEPER SOUND MODE ALARM MODE TRIG DELAY TRIG EDGE

HANDLER MODE :

L.C.

LOW

FAIL

PULSE

0000 mS

FALLING CLEAR

I.R. L.C.

Set Test Parameter to IR

Set Test Parameter to LC

2.3.3.2 Beeper

The volume of the beeper or audible alarm can be set to OFF, LOW or HIGH. The instrument default setting is LOW. To change the beeper loudness press [SYSTEM SETUP], [SYSTEM CONFIG] and the down arrow [⇓] until the box next to BEEPER is highlighted, then press [F1] = OFF, [F2] = LOW or [F3] = HIGH.

< SYSTEM CONFIG >

TEST PARAMETER : BEEPER SOUND MODE ALARM MODE TRIG DELAY TRIG EDGE HANDLER MODE :

L.C. LOW

FAIL

PULSE

0000 mS

FALLING

CLEAR

OFF LOW HIGH

Turn Beeper OFF

Set Beeper to Low

Set Beeper to High

2.3.3.3 Sound Mode

The audible alarm can be set to sound on PASS or to sound on FAIL under high or low limit judgment in the measure display. The instrument default setting is FAIL. To change the sound mode press [SYSTEM SETUP], [SYSTEM CONFIG] and the down arrow [⇓] until the box next to SOUND MODE is highlighted, then press [F1] = PASS for the alarm to sound on a pass result or [F2] = FAIL for the alarm to sound on a fail result.

< SYSTEM CONFIG >

TEST PARAMETER : BEEPER SOUND MODE ALARM MODE TRIG DELAY TRIG EDGE HANDLER MODE :

L.C.

LOW FAIL

PULSE

0000 mS

FALLING

CLEAR

PASS FAIL

Alarm will sound on PASS

Alarm will sound on FAIL

Interface Page 29 of 76

2.3.3.4 Alarm Mode

The type of audible alarm can be set to PULSE or CONTINUOUS during judgment in the measure display. The instrument default setting is PULSE. To change the alarm mode press [SYSTEM SETUP], [SYSTEM CONFIG] and the down arrow [⇓] until the box next to ALARM MODE is highlighted, then press [F1] = PULSE for the alarm to sound in a pulse tone or [F2] = CONTINUOUS for the alarm to sound continuously.

< SYSTEM CONFIG >

TEST PARAMETER : BEEPER SOUND MODE ALARM MODE TRIG DELAY TRIG EDGE HANDLER MODE :

L.C.

LOW

FAIL

PULSE

0000 mS

FALLING CLEAR

PULSE CONTINUOUS

Alarm will Pulse*

Alarm will Continuously sound*

*(Until Discharge is pressed)

2.3.3.5 Trigger Delay

The trigger delay is the amount of time between the activation of a trigger (via IEEE, Handler or front panel) and the 1855 making the measurement. The delay time can be programmed from 0000 to 9995 seconds. The instrument default value is 0000 seconds. To change the TRIGGER DELAY press [SYSTEM SETUP], [SYSTEM CONFIG] and the down arrow [⇓] until the box next to TRIGGER DELAY is highlighted, then press [F1] = DIGIT UP to increase the delay time, [F2] = DIGIT DOWN to decrease the delay time or [F3] = DIGIT to move over a decimal place.

< SYSTEM CONFIG >

TEST PARAMETER : BEEPER SOUND MODE ALARM MODE TRIG DELAY TRIG EDGE HANDLER MODE :

L.C.

LOW

FAIL

PULSE 0000 mS

FALLING

CLEAR

DIGIT UP DIGIT DOWN DIGIT

0 - 9995 mS

9995 - 0 mS

Move cursor to next digit

2.3.3.6 Trigger Edge

Select on which edge the measurement is triggered: FALLING or RISING. The instrument default setting is FALLING. To change the TRIGGER EDGE press [SYSTEM SETUP], [SYSTEM CONFIG] and the down arrow [⇓] until the box next to TRIGGER EDGE is highlighted, then press [F1] = FALLING or [F2] = RISING.

< SYSTEM CONFIG >

TEST PARAMETER : BEEPER SOUND MODE ALARM MODE TRIG DELAY TRIG EDGE HANDLER MODE :

L.C.

LOW

FAIL

PULSE

0000 mS FALLING

CLEAR

FALLING RISING

Initiate Trigger on Falling Edge

Initiate Trigger on Rising Edge

Page 30 of 76 Interface

2.3.3.7 Handler Mode

The handler interface mode can be set to CLEAR or HOLD. The instrument default setting is CLEAR. When set to CLEAR, the handler interface will clear the last test result prior to each subsequent measurement. When set to HOLD, the handler interface will hold the last test result until the next measurement is made and displayed. To change the handler mode press [SYSTEM SETUP], [SYSTEM CONFIG] and the down arrow [⇓] until the box next to HANDLER MODE is highlighted, then press [F1] = CLEAR or [F2] = HOLD.

< SYSTEM CONFIG >

TEST PARAMETER : BEEPER SOUND MODE ALARM MODE TRIG DELAY TRIG EDGE HANDLER MODE :

L.C.

LOW

FAIL

PULSE

0000 mS

FALLING CLEAR

CLEAR HOLD

Clear Test Results

Hold Test Results

2.3.3.8 Contrast

The display contrast can be set from 00 to 15. The instrument default setting is 07. The darkest contrast is 00 the brightest is 15. To change the display contrast press [SYSTEM SETUP], [SYSTEM CONFIG] and the down arrow [⇓] until the box next to CONTRAST is highlighted, then press [F1] = DIGIT UP to brighten the contrast or [F2] = DIGIT DOWN to darken the contrast.

< SYSTEM CONFIG >

CONTRAST : GPIB ADDRESS RS232 BAUD RATE KEY LOCK LINE FREQUENCY CHARGE TIME RANGE DWELL :

19200

OFF

60Hz

Vm = Vs

0.0 S

DIGIT UP DIGIT DOWN

Increase brightness: 00 - 16

Decrease brightness: 16 - 00

2.3.3.9 GPIB Address Code

The IEEE-488 interface address can be programmed from 00 to 30. The instrument default setting is 17. To change the GPIB ADDRESS press [SYSTEM SETUP], [SYSTEM CONFIG] and the down arrow [⇓] until the box next to GPIB ADDRESS is highlighted, then press [F1] = DIGIT UP to increase the address, or [F2] = DIGIT DOWN to decrease the address.

< SYSTEM CONFIG >

CONTRAST : GPIB ADDRESS RS232 BAUD RATE KEY LOCK LINE FREQUENCY CHARGE TIME RANGE DWELL :

07 17

19200

OFF

60Hz

Vm = Vs

0.0 S

DIGIT UP DIGIT DOWN

Increase address: 00 - 30

Decrease address: 30 - 00

Interface Page 31 of 76

2.3.3.10 RS-232 Baud Rate

The baud rate of the RS-232 interface can be programmed from 600 to 28800 bps. The instrument default setting is 9600bps. To change the RS-232 BAUD RATE press [SYSTEM SETUP], [SYSTEM CONFIG] and the down arrow [⇓] until the box next to RS-232 BAUD RATE is highlighted, then press [F1] = 600, [F2] = [1200], [F3] = 4800, [F4] = NEXT to go to the next page and select [F1] = 9600, [F2] = 19200, [F3] = 28800 or [F4] = NEXT to return to first RS232 baud rate selection page.

< SYSTEM CONFIG >

CONTRAST : GPIB ADDRESS RS232 BAUD RATE KEY LOCK LINE FREQUENCY CHARGE TIME RANGE DWELL :

:0717 :

19200

OFF

60Hz

Vm = Vs

0.0 S

600 1200 4800 NEXT PAGE 1/2

Select 600 bps

Select 1200 bps

Select 4800 bps

Go to 2

RS232 page

< SYSTEM CONFIG >

CONTRAST : GPIB ADDRESS RS232 BAUD RATE KEY LOCK LINE FREQUENCY CHARGE TIME

RANGE DWELL :

:0717 :

19200

OFF

60Hz

Vm = Vs

0.0 S

9600 19200 28800 NEXT PAGE 2/2

Select 9600 bps

Select 19200 bps

Select 28800 bps

Go back to 1

RS232 page

2.3.3.11 Key Lock

To lock out the front panel operations with the exception of the [TRIGGER] key, set the key lock function to ON. Press [SYSTEM SETUP], [SYSTEM CONFIG], [⇓] until OFF is highlighted next to KEY LOCK, then press [F1] = ON. The backlit LOCK block will appear in the top right hand corner of the measure display. To turn the key lock function OFF: press [F1], [F4] and then [SYSTEM SETUP]. Key lock can be set ON or OFF. The instrument default setting is OFF.

< SYSTEM CONFIG >

CONTRAST : GPIB ADDRESS RS232 BAUD RATE KEY LOCK LINE FREQUENCY CHARGE TIME RANGE DWELL :

< MEAS DISPLAY: SEQ. TEST >

:0717 :

19200 OFF

60Hz

Vm = Vs

0.0 S

ON OFF

TEST V.

LOCK

1.0V

ON= Front panel locked out

OFF = Front panel operational

Lc :

Vm = 0.0V

3.65 mA

DISCHARGECHARGE TEST

C.C. RANGE NEXT PAGE 1/2

: :

0.5mA

2uA

NOTE: Key Lock is disabled when the 1855 instrument is shut down.

Page 32 of 76 Interface

2.3.3.12 Line Frequency

In accordance with the AC power source, the frequency of the line voltage can be set to 50Hz or 60Hz. The instrument default setting is 60Hz. To change the line frequency press [SYSTEM SETUP], [SYSTEM CONFIG] and the down arrow [⇓] until the box next to LINE FREQUENCY is highlighted, then press [F1] = 50Hz or [F2] = 60Hz.

< SYSTEM CONFIG >

CONTRAST : GPIB ADDRESS RS232 BAUD RATE KEY LOCK LINE FREQUENCY CHARGE TIME RANGE DWELL :

:0717 :

19200

OFF

60Hz

Vm = Vs

0.0 S

60Hz 50Hz

Line Frequency = 60Hz

Line Frequency = 50Hz

2.3.3.13 Charge Time

Charge Time is defined as when the 1855 instrument will start charging the device under test. Select Vm = Vs to have the 1855 instrument start charging when monitored voltage reaches the set (programmed) voltage. Select Vm = 0V to have the instrument start charging the device when the [TRIGGER] button is pressed. The instrument default value is Vm = Vs. To change the CHARGE TIME press [SYSTEM SETUP], [SYSTEM CONFIG] and the down arrow [⇓] until the box next to CHARGE TIME is highlighted, then press [F1] = Vm=Vs or [F2] = Vm=0V.

< SYSTEM CONFIG >

CONTRAST : GPIB ADDRESS RS232 BAUD RATE KEY LOCK LINE FREQUENCY CHARGE TIME RANGE DWELL :

:0717 :

19200

OFF

60Hz Vm = Vs

0.0 S

Vm = Vs Vm = 0V

Start Charge Time when

monitored

Start Charge Time when

[TRIGGER] is pressed

= V

set

2.3.3.14 Range Dwell

The range dwell is the amount of time the instrument holds at the programmed test voltage before the 1855 makes the measurement. The range dwell is in addition to, and occurs after, the charge time. The range dwell can be programmed from 0 to 9.9 seconds. The instrument default value is 0 seconds. To change the RANGE DWELL press [SYSTEM SETUP], [SYSTEM CONFIG] and the down arrow [⇓] until the box next to RANGE DWELL is highlighted, then press [F1] = DIGIT UP to increase the delay time, [F2] = DIGIT DOWN to decrease the delay time or [F3] = DIGIT to move over a decimal place.

< SYSTEM CONFIG >

CONTRAST : GPIB ADDRESS RS232 BAUD RATE KEY LOCK LINE FREQUENCY CHARGE TIME RANGE DWELL :

:0717 :

19200

OFF

60Hz

Vm = Vs

0.0 S

DIGIT UP DIGIT DOWN

Increase dwell time 0.0 - 9.9S

Decrease dwell time 9.9 - 0.0S

Note: Refer to paragraph 2.5.5 to program Dwell Time in a Sequence Test.

Interface Page 33 of 76

2.3.3.15 Average

The 1855 instrument can make many measurements then display the average based on what average number was selected. The range is 1 – 8 and the instrument default setting is 1. To change the number to average press [SYSTEM SETUP], [SYSTEM CONFIG] and the down arrow [⇓] until the box next to AVERAGE is highlighted, then press [F1] = DIGIT UP to increase then number of measurements to take before displaying the average or [F2] = DIGIT DOWN to decrease the number.

< SYSTEM CONFIG >

AVERAGE : EXT Vm DISPLAY :

1 OFF

DIGIT UP DIGIT DOWN

Increase # to Average: 1 - 8

Decrease # to Average: 8 - 1

2.3.3.16 EXT VM Display

The voltage across the DUT can be displayed along with the measured value when EXT Vm DISPLAY is set to ON. EXT Vm DISPLAY can be selected OFF/ON. The instrument default setting is OFF. To change the EXT Vm Display press [SYSTEM SETUP], [SYSTEM CONFIG] and the down arrow [⇓] until the box next to EXT Vm DISPLAY is highlighted, then press [F1] = ON to display the voltage across the DUT, or [F2] = OFF.

< SYSTEM CONFIG >

AVERAGE : EXT Vm DISPLAY :

< MEAS DISPLAY: SEQ. TEST >

1 OFF

Lc :

Vm = 0.996V

DISCHARGECHARGE TEST

3.65 mA

ON OFF

TEST V. C.C. RANGE NEXT PAGE 1/2

: : :

0.5mA

1.0V

2uA

Display Voltage across DUT

Do not display Vm

When selected ON, the measured voltage (Vm) will be displayed in the bottom left-hand corner of the display.

Note:

For Faster test speed during production testing, EXT Vm should be set to OFF.

Page 34 of 76 Interface

2.4 MAIN INDEX

Within the 1855 instrument’s MAIN INDEX are the Sequence Test, Step Test, Null, Withstand Voltage Test and Compare functions. To access these functions, press [MAIN INDEX] and the display should look as shown in Figure 2-3.

< MAIN INDEX >

SEQ. TEST STEP TEST NULL NEXT PAGE 1/2

< MAIN INDEX >

W.V. TEST COMPARE

NEXT PAGE 2/2

Figure 2-3: MAIN INDEX

2.4.1 Sequence Test

The Sequence Test automatically cycles through the test when [TRIGGER] is pressed. To access the Sequence Test, press [MAIN INDEX] and [F1] = SEQ. TEST. The MEAS DISPLAY menu will appear. Program the Test Voltage, Constant Current, Range, Charge Time, Dwell Time and Speed. Refer to paragraphs 2.5.1 through 2.5.6 for programming details.

< MEAS DISPLAY: SEQ. TEST >

Lc :

Vm = 0.0V

DISCHARGECHARGE TEST

TEST V.

C.C. RANGE NEXT PAGE 1/2

: : :

0.5mA

1.0V

2uA

< MEAS DISPLAY: SEQ. TEST >

Lc :

Vm = 0.0V

DISCHARGECHARGE TEST

CHG T.

DWELL T SPEED NEXT PAGE 2/2

: :

0.2 S

MEDIUM

0 S

Figure 2-4: Sequence Test Parameters

Interface Page 35 of 76

2.4.2 Step Test

The Step Test manually cycles through the test when [TRIGGER] is pressed. To access the Step Test, press [MAIN INDEX] and [F2] = STEP TEST. The MEAS DISPLAY menu will appear. Program the Test Voltage, Constant Current, Range, Trigger and Speed. Refer to paragraphs

2.5.1 through 2.5.7 for programming details.

< MEAS DISPLAY: STEP TEST >

TEST V.

1.0V

Lc :

Vm = 0.0V

DISCHARGECHARGE TEST

< MEAS DISPLAY: STEP TEST >

Lc :

Vm = 0.0V

DISCHARGECHARGE TEST

C.C. RANGE NEXT PAGE 1/2

TRIGGER SPEED::

NEXT PAGE 2/2

0.5mA

2uA

INT

MEDIUM

Figure 2-5: Step Test Parameters

2.4.3 Null

During the 1855 instrument Null process a correction is made (subtracted out) as the result of lead leakage current and stored in instrument memory to be applied to ongoing measurements. For maximum measurement accuracy it is recommended that the NULL function be performed on the 1855 instrument after power up, any time the test parameters are changed and any time the test leads or fixture is changed.

Using the output voltage set in the SEQ or STEP test, the Null function measures the leakage current of each range (20mA – 2mA – 200uA – 20uA – 2uA) under open circuit conditions. After setting test parameters in the SEQ or STEP tests, connect the test leads to the 1855 output connectors. Do not connect the device under test. Press [MAIN INDEX] and [F3] = NULL TEST. There are no settings for NULL TEST. Press [TRIGGER] and the 1855 instrument will complete the null function.

Page 36 of 76 Interface

Connection of test leads for Null function:

QuadTech

<MEAS. DISPLAY: NULL>

LC : mA

Press TRIGGER to start ...

CHARGE TEST DISCHARGE

1855 Capacitor Leakage Current /IR Meter

MEAS

MAIN

F1 F2

DISPLAY

CHARGE/TEST DISCHARGE

INDEX

TRIGGER

SYSTEM

SETUP

(-)(+)INPUT

OPEN No DUT Connected for NUL L function

Figure 2-6: Null Connection

Interface Page 37 of 76

2.4.4 Withstand Voltage Test

To access the Withstand Voltage Test, press [MAIN INDEX] and [F4] = NEXT PAGE 1/2 and then press [F1] = W.V. TEST. The MEAS DISPLAY menu will appear. Program the Test Voltage, Constant Current, Measurement Time and maximum Charge Time. Refer to paragraphs

2.5.8 through 2.5.10 for programming details.

< MEAS DISPLAY: W.V. TEST >

50.0V

Tr : Vt : V

Vm = 0.0V

Vt Vf

0.15

58.00

(V)

58.0V/30.15S DISCHARGECHARGE TEST

Withs tand Voltage Time

C.C. Tend CHG Tend

TendTr0

: :

(t)

2.0mA 30S

5S:

Figure 2-7: Withstand Voltage Parameters

Withstand Voltage is the voltage at which the product’s insulation begins to break down. There are however many definitions for Withstand Voltage. The 1855 instrument and this manual use the WV terminology from the EIAJ RC-2364A standard, “Test Methods of Electrode Foils for Aluminum Electrolytic Capacitors”.

Vf: The standard dielectric withstand voltage CC: The constant charge current for the WV test Tend: The measurement time for the WV test. Tend = Tr+ the programmed test time. CHG. Tend: The maximum charge time for the WV test. Tr: The time between the start of the current application and the voltage reaching

90% of rated withstand voltage (Vf).

Vt: The measured voltage at the end of the WV test.

Figure 2-7 illustrates a Withstand Voltage test. The following parameters were set: Vf=50V, CC=2mA, Tend=30seconds and CHG Tend=5seconds. After [TRIGGER] is pressed, the results shown in Figure 2-7 are Rise Time (Tr) = 0.15seconds and Measured Voltage (Vt) = 58.00V. In the bottom left-hand corner above the test status boxes (CHARGE – TEST – DISCHARGE) are two results: Vm=0.0V and 58.0V/30.15S. The Vm=0.0V box is the monitor of the output voltage during the test. The 58.0V/30.15S box is the last measured voltage and time when the test ended.

Page 38 of 76 Interface

2.4.5 Compare

The Compare function provides the capability to set an upper and/or lower limit for a leakage current or insulation resistance test and to display Pass/Fail with the measured result. To access the Compare function, press [MAIN INDEX] and [F4] = NEXT PAGE 1/2 then press [F2] = COMPARE. Select the Parameter (L.C. or IR) and program the Upper and Lower limits.

The Upper Limit is the high limit or upper value for a test to be considered a pass. If the measured value is higher than the upper limit the test is considered a fail. The Lower Limit is the lower value for a test to be considered a pass. If the measured value is lower than the low limit the test is considered a fail.

In an LC test, the range for Upper Limit is 0.000uA – 999.999mA and the Lower Limit range is

0.000uA to the Upper Limit. In an IR test, the range of the Upper Limit is 0.01kΩ – 99.99GΩ and the Lower Limit is 0.01kΩ – the Upper Limit.

< MAIN INDEX >

SEQ. TEST STEP TEST NULL NEXT PAGE 1/2

< MAIN INDEX >

< MEAS INDEX: COMPARE >

L.C. UPPER (+) LOWER (-)::

< MEAS INDEX: COMPARE >

UPPER (+) LOWER (-)::

000.000mA

- - - - - -

:L.C.

0.000mA

- - - - - -

W.V. TEST COMPARE

NEXT PAGE 2/2

COMPARE : ONPARAMETER

EXIT

DIGIT UP DIGIT DOWNPARAMETER DIGIT LIMIT OFF

Select

Compare Function

Turn Compare

Increase value of underscored digit

Decrease value of underscored digit

Move underscore cursor to next digit

Turn Upper or Lower Limit Off

Figure 2-8: Compare Function

Interface Page 39 of 76

To set up and display PASS/FAIL on the MEAS DISPLAY screen, use the COMPARE function. Example: Parameter = Leakage Current. Upper Limit = 15mA, Lower Limit = 0.

< MAIN INDEX >

SEQ. TEST STEP TEST NULL NEXT PAGE 1/2

Select:

Upper (+)

Select:

Lower (-)

PRESS

MEAS

DISPLAY

< MAIN INDEX >

< MEAS INDEX: COMPARE >

L.C.

: UPPER (+) LOWER (-)::

000.000mA

- - - - - -

< MEAS INDEX: COMPARE >

:L.C. UPPER (+) LOWER (-)::

0.000mA

- - - - - -

< MEAS INDEX: COMPARE >

:L.C. UPPER (+) LOWER (-)::

015.000mA

- - - - - -

< MEAS DISPLAY: STEP TEST >

W.V. TEST COMPARE

NEXT PAGE 2/2

COMPARE : ONPARAMETER

EXIT

DIGIT UP DIGIT DOWNPARAMETER DIGIT LIMIT OFF

TEST V.

20V

Select

Compare Function

Turn Compare

Increase value of underscored digit

Decrease value of underscored digit

Move underscore cursor to next digit

Turn Lower Limit Off

: : :

0.5mA 20mA

20V

0.5mA

2uA

PRESS

TRIGGER

Lc :

Vm = 0.0V

DISCHARGECHARGE TEST

< MEAS DISPLAY: STEP TEST >

Lc :

0.750

PASS

Vm = 20.0 V

DISCHARGECHARGE TEST

C.C. RANGE NEXT PAGE 1/2

TEST V. C.C. RANGE NEXT PAGE 1/2

Figure 2-9: Compare Example

Page 40 of 76 Interface

2.5 MEAS DISPLAY

The 1855 instrument’s stand-by display is the MEAS DISPLAY. After power has been applied to the instrument and it cycles quickly through the information screen, the instrument reverts to the MAIN INDEX. Once [SEQ. TEST] or [STEP TEST] is selected the instrument enters the MEAS DISPLAY. To view the instrument information screen as illustrated in Figure 2.10, press [SYSTEM SETUP] then [⇐].

QUADTECH 1855

LEAKAGE CURRENT/IR METER

VERSION 1.02 BETA .09.02 CPLD:1855

TEL 1-800-253-1230 FAX 1-978-461-4295

Figure 2.10: Instrument Information Screen

< MEAS DISPLAY: SEQ. TEST >

TEST V.

1.0V

Lc :

Vm = 0.0V

DISCHARGECHARGE TEST

< MEAS DISPLAY: SEQ. TEST >

Lc :

Vm = 0.0V

DISCHARGECHARGE TEST

C.C. RANGE NEXT PAGE 1/2

CHG T. DWELL T SPEED NEXT PAGE 2/2

0.5mA

2uA

0.2 S

MEDIUM

0 S

Figure 2.11: MEAS DISPLAY- SEQUENCE TEST

< MEAS DISPLAY: STEP TEST >

Lc :

Vm = 0.0V

DISCHARGECHARGE TEST

< MEAS DISPLAY: STEP TEST >

Lc :

TEST V.

C.C. RANGE NEXT PAGE 1/2

TRIGGER SPEED::

1.0V

0.5mA

2uA

INT

MEDIUM

Vm = 0.0V

DISCHARGECHARGE TEST

NEXT PAGE 2/2

Figure 2-12: MEAS DISPLAY – STEP TEST

Interface Page 41 of 76

Figure 2.11 illustrates the two pages of parameters that can be programmed within the MEAS DISPLAY for a SEQUENCE TEST. Figure 2.12 illustrates the two pages of parameters that can be programmed within the MEAS DISPLAY for a STEP TEST. The two tests have the similar programmable parameters with the exception of Charge Time, Range Dwell and Trigger. All programmable parameters are explained in Paragraphs 2.5.1 through 2.5.8.

2.5.1 Test Voltage

The test voltage can be programmed from 1.00V to 650V. In MEAS DISPLAY press [F1] = TEST V so that the 1.00 V box is highlighted. Use the up arrow or down arrow keys to in/decrease the voltage in multi-V increments. The left and right arrows will increase/decrease the voltage in 1V increments. The instrument default setting is 1.00V.

UP arrow [⇑] key: 6.3 → 10.0 → 16.0 → 25.0 → 35.0 → 50.0 → 63.0 → 100.0 → 160.0 →

200.0 → 250.0 → 350.0 → 400.0 → 450.0 → 500.0 → 550.0 → 600.0 → 630.0.

DOWN arrow [⇓] key: 630.0 → 600.0 → 550.0 → 500.0 → 450.0 → 400.0 → 350.0 → 250.0 → 200.0 → 160.0 → 100.0 → 63.0 → 50.0 → 35.0 → 25.0 → 16.0 → 10.0 → 6.3.

RIGHT arrow [⇒] key: increase voltage in 1V increments.

LEFT arrow [⇐] key: decrease voltage in 1V increments.

< MEAS DISPLAY: SEQ. TEST >

TEST V.

1.0

Select Test V

Lc :

Vm = 0.0V

DISCHARGECHARGE TEST

C.C. RANGE NEXT PAGE 1/2

: :

0.5mA 2uA

1.0, 6.3 - 630V 630V - 6.3V

630V - 650V

6.3 - 1.0V

2.5.2 Constant Charge Current

The test current can be programmed from 0.5mA to 500mA. In MEAS DISPLAY press [F2] = C.C so that the 0.5 mA box is highlighted. Use the up arrow [⇑] key to increase the current or use the down arrow [⇓] key to decrease the current in 5/50mA increments. The left and right arrows will increase/decrease the current in 1mA increments. The instrument default setting is

0.5mA.

< MEAS DISPLAY: SEQ. TEST >

Lc :

Vm = 0.0V

DISCHARGECHARGE TEST

TEST V. C.C. RANGE NEXT PAGE 1/2

: : :

1.0 V

0.5 mA 2uA

0.5 - 450.5mA

450.5 - 0.5mA

450.5 - 500.0mA

500.0mA - 450.5

NOTE:

For the WV test, the range of C.C. is from 0.5mA to 150mA.

Page 42 of 76 Interface

UP arrow [⇑] key: increase current by 5mA from 0.5mA to 100mA then by 50mA from 100mA to 500mA

DOWN arrow [⇓] key: decrease current by 50mA from 500mA to 100mA then by 5mA from 100mA to 0.5mA

RIGHT arrow [⇒] key: increase current in 1mA increments.

LEFT arrow [⇐] key: decrease current in 1mA increments.

2.5.3 Range

The 1855 instrument’s measurement range can be selected as AUTO or HOLD. The instrument current measurement ranges are 20mA, 2mA, 200uA, 20uA and 2uA. In MEAS DISPLAY, press [F3] = RANGE so that the A box is highlighted*. The instrument default setting is A (Auto Range).

* Use the up arrow [⇑] key to toggle between A (Auto) and H (Hold).

< MEAS DISPLAY: SEQ. TEST >

TEST V.

1.0

Lc :

Vm = 0.0V

DISCHARGECHARGE TEST

< MEAS DISPLAY: SEQ. TEST >

Lc :

Vm = 0.0V

DISCHARGECHARGE TEST

C.C. RANGE NEXT PAGE 1/2

TEST V. C.C. RANGE NEXT PAGE 1/2

: :

: : :

0.5mA

1.0

0.5mA

2uA

2uAA

Toggle between:

A = Auto H = Hold

2uA - 20uA - 200uA - 2mA - 20mA 20mA - 2mA - 200uA - 20uA - 2uA

Press [F3] = RANGE a second time to select the value of the range.

UP arrow [⇑] key: increase range: 2uA → 20uA → 200uA → 2mA → 20mA

DOWN arrow [⇓] key: decrease range: 20mA → 2mA → 200uA → 20uA → 2uA

Interface Page 43 of 76

2.5.4 Charge Time

The charge time can be programmed from 0 to 999seconds. In MEAS DISPLAY press [F4] = NEXT PAGE 1/2. Press [F1] = CHG T so that the 0 s box is highlighted. Use the up or down arrow keys to in/decrease the charge time by base-10 second increments. The left and right arrows will increase/decrease the time in 1second increments. The instrument default setting is 0s.

< MEAS DISPLAY: SEQ. TEST >

CHG T.

Lc :

Vm = 0.0V

DISCHARGECHARGE TEST

DWELL T SPEED NEXT PAGE 2/2

0.2 S

MEDIUM

0 - 900s

by base-10

900 - 999s

by base-1

UP arrow [⇑] key: 0 → 10 → 20 → 30 → 40 → 50 → 60 → 70 → 80 → 90 → 100 → 200 → 300 → 400 → 500 → 600 → 700 → 800 → 900.

RIGHT arrow [⇒] key: increase charge time in 1 second increments. (example: 900 to 999)

DOWN arrow [⇓] key: 999 → 899 → 799 → 699 → 599 → 499 → 399 → 299 → 199 → 99 → 89 → 79 → 69 → 59 → 49 → 39 → 29 → 19 → 9.

LEFT arrow [⇐] key: decrease charge time in 1 second increments. (example: 9 to 0)

2.5.5 Dwell Time

The dwell time can be programmed from 0.2 to 999seconds. In MEAS DISPLAY press [F4] = NEXT PAGE 1/2. Press [F2] = DWELL T so that the 0.2 s box is highlighted. Use the up or down arrow keys to in/decrease the dwell time by base-10 second increments. The left and right arrows will increase/decrease the time in 1second increments. The instrument default setting is 0s.

< MEAS DISPLAY: SEQ. TEST >

Lc :

Vm = 0.0V

DISCHARGECHARGE TEST

CHG T.

DWELL T SPEED NEXT PAGE 2/2

: :

0.2

MEDIUM

0.2 - 900s by base-10

900 - 999s

by base-1

UP arrow [⇑] key: 0.2 → 10 → 20 → 30 → 40 → 50 → 60 → 70 → 80 → 90 → 100 → 200 → 300 → 400 → 500 → 600 → 700 → 800 → 900.

RIGHT arrow [⇒] key: increase dwell time in 1 second increments. (example: 900 to 999)

Page 44 of 76 Interface

DOWN arrow [⇓] key: 999 → 899 → 799 → 699 → 599 → 499 → 399 → 299 → 199 → 99 → 89 → 79 → 69 → 59 → 49 → 39 → 29 → 19 → 9.

LEFT arrow [⇐] key: decrease dwell time in 1 second increments. (example: 9 to 0)

2.5.6 Speed

Program the measurement speed of the 1855 instrument to Slow (7measurements/second), Medium (14 measurements/second) or Fast (18 measurements/second). In MEAS DISPLAY, press [F4] = NEXT PAGE 1/2 and then press [F3] = SPEED so that the MEDIUM box is highlighted. Press [F3] = SPEED to toggle through and select the measurement rate: SLOW, MEDIUM or FAST. The instrument default setting is MEDIUM (14 meas/second).

< MEAS DISPLAY: SEQ. TEST >

CHG T.

Lc :

Vm = 0.0V

DISCHARGECHARGE TEST

DWELL T SPEED NEXT PAGE 2/2

0.2

MEDIUM

Toggle between: SLOW MEDIUM FAST

2.5.7 Trigger

In the Step Test only, the 1855 instrument can be triggered manually, internally or externally.

In MEAS DISPLAY, press [F4] = NEXT PAGE 1/2 and then press [F1] = TRIGGER so that the INT box is highlighted. Press [F1] = TRIGGER to change the trigger. The instrument default setting is INT (internal trigger). When MANUAL trigger is selected, one measurement will be made each time the trigger is pressed. When EXTERNAL trigger is selected, one measurement will be made each time the external trigger is asserted by the handler. When INTERNAL trigger is selected, measurements are performed continuously when in [MEAS DISPLAY].

Toggle

< MEAS DISPLAY: STEP TEST >

Lc :

Vm = 0.0V

DISCHARGECHARGE TEST

TRIGGER

SPEED::

NEXT PAGE 2/2

INT

MEDIUM

between: INTernal EXTernal MANual

Interface Page 45 of 76

2.5.8 Rated Withstand Voltage (Vf)

In the W.V. Test only, the rated withstand voltage (Vf) can be programmed from 1.00V to

650V. In MEAS DISPLAY press [F1] = Vf so that the 1.00 V box is highlighted. Use the up arrow or down arrow keys to in/decrease the voltage in multi-V increments. The left and right arrows will increase/decrease the voltage in 1V increments. The instrument default setting is

1.00V.

< MEAS DISPLAY: W.V. TEST >

50.0 V

Select Vf

Tr : Vt : V

Vm = 0.0V

0.15

58.00

58.0V / 30.15S DISCHARGECHARGE TEST

C.C Tend : CHG Tend

2.0 mA

Tr+ 30 s

5 s

1.0, 6.3 - 630V 630V - 6.3V

630V - 650V

6.3 - 1.0V

UP arrow [⇑] key: 6.3 → 10.0 → 16.0 → 25.0 → 35.0 → 50.0 → 63.0 → 100.0 → 160.0 →

200.0 → 250.0 → 350.0 → 400.0 → 450.0 → 500.0 → 550.0 → 600.0 → 630.0.

DOWN arrow [⇓] key: 630.0 → 600.0 → 550.0 → 500.0 → 450.0 → 400.0 → 350.0 → 250.0 → 200.0 → 160.0 → 100.0 → 63.0 → 50.0 → 35.0 → 25.0 → 16.0 → 10.0 → 6.3.

RIGHT arrow [⇒] key: increase voltage in 1V increments.

LEFT arrow [⇐] key: decrease voltage in 1V increments.

2.5.9 Measurement Time (Tend)

In the W.V. Test only, the measurement time can be programmed from 30 to 600seconds. In

MEAS DISPLAY press [F3] = Tend so that the 30 s box is highlighted. Use the up or down arrow keys to in/decrease the measure time by 10 second increments. The left and right arrows will increase/decrease the time in 1second increments. The instrument default setting is 30s.

< MEAS DISPLAY: W.V. TEST >

50.0 V

Tr : Vt : V

Vm = 0.0V

0.15

58.00

58.0V / 30.15S DISCHARGECHARGE TEST

C.C Tend : CHG Tend

2.0 mA

Tr+ s

5 s

Select Tend

30 - 530s

by base-10

530 - 600s

by base-1

UP arrow [⇑] key: 30 → 40 → 50 → 60 → 70 → 80 → 90 → 100 → 200 → 300 → 400 → 500 → 600.

RIGHT arrow [⇒] key: increase measurement time in 1 second increments.

DOWN arrow [⇓] key: 600 → 500 → 400 → 300 → 200 → 100 → 90 → 80 → 70 → 60 → 50 → 40 → 30.

LEFT arrow [⇐] key: decrease measurement time in 1 second increments.

Page 46 of 76 Interface

2.5.10 Maximum Charge Time (CHG Tend)

In the W.V. Test only, the charge time can be programmed from 5 to 600seconds. In MEAS

DISPLAY press [F4] = CHG Tend so that the 5 s box is highlighted. Use the up or down arrow keys to in/decrease the charge time by 10 second increments. The left and right arrows will increase/decrease the time in 5 second increments. The instrument default setting is 5s.

< MEAS DISPLAY: W.V. TEST >

50.0 V

Tr : Vt : V

Vm = 0.0V

0.15

58.00

58.0V / 30.15S DISCHARGECHARGE TEST

C.C Tend : CHG Tend

2.0 mA

Tr+ 30 s

5 - 505s

Select CHG Tend

by base-10

505 - 600s

by base-1

UP arrow [⇑] key: 5 → 15 → 25 → 35 → 45 → 55 → 65 → 75 → 85 → 95 → 105 → 205 → 305 → 405 → 505.

RIGHT arrow [⇒] key: increase charge time in 1 second increments. (example: 505 to 600)

DOWN arrow [⇓] key: 600 → 500 → 400 → 300 → 200 → 100 → 90 → 80 → 70 → 60 → 50 → 40 → 30 → 20 → 10.

LEFT arrow [⇐] key: decrease charge time in 1 second increments. (example: 10 to 5)

Interface Page 47 of 76

2.6 Connection to Device under Test

Figure 2-13 illustrates the connection of the 1855 instrument to a DUT using the 1855-01 Lead Set. For Leakage Current, Insulation Resistance and Withstand Voltage Tests, the red alligator clip/BNC cable is connected between the silver INPUT terminal on the 1855 unit and the high side of the device under test. The black alligator clip/banana cable is connected between the white HV (-) terminal on the 1855 unit and the low side of the DUT.

QuadTech

<MEAS. DISPLAY: SEQ. TEST>

LC :

CHARGE TEST DISCHARGE

1855 Capacitor Leakage Current /IR Meter

1.5 mA

TEST V C.C

RANGE NEXT PAGE 1/2

1.0

0.5

MEAS

MAIN

(-)(+)INPUT

DISPLAY

CHARGE/TEST DISCHARGE

INDEX

TRIGGER

SYSTEM

SETUP

DUT

Figure 2-13: Connection for Leakage Current Test

Page 48 of 76 Interface

2.7 Measurement Procedure

Before a measurement is made verify the following:

1. 1855 instrument [POWER] ON.

2. 15-minute warm-up.

3. Test parameters programmed and shown on MEAS DISPLAY.

4. Test cables or fixture connected.

5. NULL function initiated.

6. Device under test connected.

To initiate a test:

• Press [TRIGGER].

• The test voltage is shut off when all test steps are completed,

• OR when a test result is judged a FAIL per programmed test limits.

• The test result is displayed on MEAS DISPLAY

NOTE:

If for any reason the output must be terminated during a test, press the right arrow marked

“DISCHARGE”.

The 1855 instrument judges the measurement value based on the COMPARE function set up previously. Refer to paragraph 2.4.5 for instructions on setting the COMPARE Pass/Fail judgment parameter. Upon completion of the test the output voltage is terminated and the display shows the test result.

CAUTION:

Before touching the DUT or the 1855 instrument, make sure all capacitive devices have been

fully discharged.

Interface Page 49 of 76

Section 3: Interface

3.1 RS-232 Interface

3.1.1 RS-232 Pin Configuration

The 1855 instrument comes standard with an RS232 Interface for remote operation. Connection is through the black/silver 9-pin connector labeled ‘RS232’ on the rear panel of the 1855 instrument. Figure 3-1 illustrates the designation of the pins on the RS232 connector. The connection cable must be a ‘straight through’ cable for the 1855 unit to communicate.

RS232

Figure 1-3

DB9 Female

Data Carrier Detected

Signal Ground

Transmitted Data

Data Terminal Ready

Received Data

Shield

Data Set Ready

Request to Send

Clear to Send

Ring Indicator

Figure 3-1: RS-232 Interface Pin Configuration

3.1.2 RS232 Specifications

Data Bits: 8 Stop Bits: 1 Parity: None Baud Rate: 600, 1200, 4800, 9600, 19200 or 28800bps, Software selectable EOS: CR + LF Echo: Off

Interface Page 51 of 76

Refer to paragraph 2.3.3.10. Setting the Baud Rate is done in the SYSTEM CONFIGURATION function under SYSTEM SETUP settings:

• From the MEAS DISPLAY, press [SYSTEM SETUP]

• Press [F3] = SYSTEM CONFIG.

• Press [⇓] = until the box next to BAUD RATE is highlighted.

• Press [F1] = INCREASE or [F2] = DECREASE to select baud rate.

• Press [F4] to EXIT

3.1.3 RS232 Commands

The command set for the RS232 interface is the same as the IEEE-488 interface command set listed in paragraphs 3.2.3 through 3.2.5 of this instruction manual.

NOTE

CR + LF is the necessary end code for the RS232 commands.

Page 52 of 76 Interface

3.2 IEEE-488 Interface

3.2.1 Pin Configuration

The 1855 instrument has an optional IEEE-488 interface as illustrated in Figure 3-2. Connection is through the blue 24-pin connector labeled ‘IEEE-488 INTERFACE’ on the rear panel of the 1855 instrument. This interface can be used to connect a system containing a number of instruments and a controller in which each meets IEEE Standard 488.2 (Standard Digital Interface for Programmable Instrumentation).

1855 IEEE-488 Interface PIN Configuration: Rear Panel View

12 67891011

15 1419 18 17 162024 23 2122

1855 IEEE-488 Interface PIN Designation

DIO1 DIO2 DIO3 DIO4

EOI

DAV

NFRD NDAC

IFC SRQ ATN

SHIELD GND

12534

DIO5 DIO6 DIO7 DIO8

REN

Figure 3-2: IEEE-488 Interface Pin Configuration

Interface Page 53 of 76

Table 3-1 lists the IEEE-488 Interface pin designations by pin number, signal name and pin function. Bus and driver information is also listed.

Table 3-1: IEEE-488 Interface Pin Designations

Bus Driver Signal

Name

Handshake

3 States DAV 6 Low State: “Data is Available” and valid on DI01

Pin Number

Function

through DI08 Open Collector Open Collector

Control

3 States ATN 11 “Attention” specifies 1 of 2 uses for the DI01 through

NRFD 7 Low State: At least one Listener on the bus is “Not

Ready For Data”

NDAC 8 Low State: At least one Listener on the bus is “Not

Accepting Data”

DI08 lines:

Low State: Controller command messages

High State: Data bytes from the Talker device 3 States IFC 9 “Interface Clear”

Low State: Returns portion of interface system to a

known quiescent state Open Collector

SRQ 10 “Service Request”

Low State: A Talker or Listener signals (to the

controller) need for attention in the midst of the

current sequence of events. 3 States REN 17 “Remote Enable”

Low State: Enables each device to enter remote mode

when addressed to listen.

High State: All devices revert to Local control. 3 States EOI 5 “End of Identify”

If ATN is in HIGH state, then EOI LOW state

indicates the end of a multiple-byte data transfer

sequence.

If ATN is in LOW state, then EOI LOW state

indicates a parallel poll.

Data

Open Collector

DI01 1 DI02 2 DI03 3 DI04 4 DI05 13 DI06 14 DI07 15 DI08 16

The 8-Line Data Bus.

If ATN is in LOW state, then the bus conveys

interface messages.

If ATN is in HIGH state, then the bus conveys device-

dependent messages. (Example: carries remote

control commands from the controller or from a talker

device)

Page 54 of 76 Interface

3.2.2 IEEE-488 Interface Function Codes and Messages

The IEEE-488 (GPIB) address is defined under the SYSTEM SETUP in the SYSTEM CONFIG menu. Press [SYSTEM SETUP], then the numerical key [F3] to enter the SYSTEM CONFIG menu. Press down arrow [⇓] to enter the GPIB ADDRESS code. To select a new IEEE-488 address, use the function keys. Refer to paragraph 2.3.2 for more information. The default setting for the IEEE address is 17.

Table 3-2 defines the IEEE-488 interface codes and their function. Table 3-3 defines the IEEE488 interface messages the 1855 instrument responds to and their function.

Table 3-2: IEEE-488 Interface Functions

Code Function

SH1 Source Handshake (Talker) AH1 Acceptor Handshake (Listener) T6

Basic Talker Function Serial Poll Function Listener-specified Talker Release Function No TALK-ONLY Function Basic Listener Function L4

Talker-specified Listener Release Function SR1 Service Request Function RL1 All Remote/Local Functions PP0 No Parallel Poll Function DC1 Device Clear Function DT1 Device Trigger Function C0 No Controller Functions

Table 3-3: IEEE-488 Interface Messages

Interface

Function Description

Message

GTL Go To Local Only addressed devices that receive this command are set to

local mode. Cancels the remote control mode, making the front panel switches operative.

Interface Page 55 of 76

Table 3-4 lists the IEEE-488 interface commands the 1855 instrument accepts to set or query a parameter value. Paragraphs 3.2.3 through 3.2.5 detail the function, format, return value and description of the IEEE-488 commands.

Table 3-4: IEEE-488 Commands

Command Name Function Output Format

*CLS Clear Status Clear standard event status

*ESE Event Status Enable Enable standard event status

0 – 255

*ESE? Event Status Enable Query standard event status of

0 – 255

device enable register

*ESR? Event Status Register Query standard event register

0 – 255 value of device. After this command, the standard register is cleared to 0.

*IDN? Identification Query/Read basic device data.

(A comma separates the identification fields.)

4 ID:

Manufacturer,

Device Model,

Serial Number,

Firmware Version

*OPC Operation Complete Operation is complete. 0 *OPC? Operation Complete Query operation complete. 1 *RST Reset Reset Device. *SRE Service Request Enable Enable service request register

0 – 255 value.

*SRE? Service Request Enable Query/Read service request

0 – 255 register value.

*TRG Trigger Bus Trigger the 1730 instrument *TST? Self Test Perform self test & report error 0 = no error

1 = RAM

2 = EEPROM

4 = CPLD

8 = Calibration Data

*LRN? Null Perform Null *SAV Save Save current status to memory. 1 – 50 *RCL Recall Recall saved status from memory. 1 – 50

Page 56 of 76 Interface

3.2.3 IEEE-488 Commands

Figure 3-3 illustrates the programming commands accepted by the IEEE-488 interface of the 1855 instrument. The commands are written in tabular format as a single reference to view all the commands. The command format and examples are detailed in paragraphs 3.2.4 – 3.2.5.

ABORt

CALCulate LIMit FORMat

DISPlay

LCTest

BEEPer CONDition FAIL? LOWer STATe UPPer ONOFf

NULL

STATe WVTest

SOURce

CONFigure FUNCtion

IMMediate DATA?

VOLTage CURRent

STATe

DATA

SPEed RANGe AUTO CHG Ti me DWELl

MEASure STATe?

IR? LC? VMON?

Figure 3-3a: IEEE-488 Commands

Interface Page 57 of 76

Tabular Format IEEE-488 Commands – continued

ABORt

WVTest

TRIGger

SYSTem BEEPer

SOURce VOLTage

CONFigure

MEASure STATe?

IMMediate SOURce DELay EDGE

CURRent

TEND CHGTEND

VTerminate? TEnd?

IMMediate

STATe ALARm LFRequency HANDler CONTrast RANGEDwell AVErage PRESet ERRor?

Figure 3-3b: IEEE-488 Commands

Page 58 of 76 Interface

3.2.4 IEEE-488 Command Format

The IEEE-488 commands are configured in Root format. There are six levels of the instruction from top to bottom. Follow the specific path (as illustrated in Figure 3.3) to configure a specific command. The colon at the beginning of each line denotes that all line signals are root. Use a colon (:) to separate levels. Use the semicolon (;) to separate two commands on the same line.

For example, to format the command for the LC function, use this path:

:CALCulate:LIMit:FORMat:LC

If the command is a setting, then put the parameter after the instruction. If the command is an inquiry, then put a question mark (?) after the instruction.

For example, to set the beeper to sound on Fail:

:CALCulate:LIMit:BEEPer:CONDition:FAIL

To inquire what the beeper is set to:

:CALCulate:LIMit:BEEPer:CONDition?

The Ending Code can be any type in Table 3-5.

Table 3-5: IEEE-488 Interface Ending Codes

Ending Code

[CR] (0Dh) [LF] (0Ah) [CR] (0Dh) + [LF] (0Ah)

Interface Page 59 of 76

3.2.5 IEEE-488 Commands - Detailed

The IEEE commands listed in Figure 3-3 are detailed in paragraphs 3.2.5.1 – 3.2.5.39 including command, parameter, return value, function, and description. Note: Numerical data is transferred via one of three methods: integer format, fixed decimal format or floating point decimal format. Refer to Figure 3-4.

Integer Format

<NR1>

Example : 9000

<digit>

Fixed De cima l Format

Floating Point Format

<NR2>

<NR3>

<digit>

Example : 9000.0

<digit>

Example : 9.0E+3

Figure 3-4: Numerical Data Transfer

3.2.5.1 ABOR

Instruction: ABOR Parameter: None Return Value: None Function: Terminate Trigger in process and initiates Discharge.

3.2.5.2 CALC:LIM:FORM

Instruction: CALC:LIM:FORM Parameter: {IR⏐LC} Return Value: {IR⏐LC} Function: Set or Query the measurement parameter for the Compare function. Description: IR Insulation Resistance LC Leakage Current

3.2.5.3 CALC:LIM:BEEP:COND

Instruction: CALC:LIM:BEEP:COND Parameter: {FAIL⏐PASS} Return Value: {FAIL⏐PASS} Function: Set or Query the condition on which the beeper sounds. Description: FAIL Beeper sounds on FAIL result PASS Beeper sounds on PASS result

<digit>

Page 60 of 76 Interface

3.2.5.4 CALC:LIM:BEEP:STAT

Instruction: CALC:LIM:BEEP:STAT Parameter: {OFF⏐ON⏐0⏐1} Return Value: {0⏐1} Function: Set or query the status of the beeper. Description: OFF (0) Beeper sound is set to OFF ON (1) Beeper sound is set to ON

3.2.5.5 CALC:LIM:FAIL?

Instruction: CALC:LIM:FAIL? Parameter: {0 (FAIL)⏐1 (PASS)} Return Value: {0⏐1} Function: Query the result of the Compare function. Description: 0 FAIL result 1 PASSL result

3.2.5.6 CALC:LIM:LOW[:DATA]

Instruction: CALC:LIM:LOW[:DATA] Parameter: {The lower limit value⏐MAX⏐MIN} Return Value: The lower limit value, the format is <NR3> (Floating point) Function: Set or query the lower limit value. Description: MINimum 000.000kΩ MAXimum 9.999E14

3.2.5.7 CALC:LIM:STAT

Instruction: CALC:LIM:STAT Parameter: {OFF⏐ON⏐0⏐1} Return Value: {0⏐1} Function: Set or query the state of the Compare Function. Description: 0 Compare Function is OFF 1 Compare Function is ON

3.2.5.8 CALC:LIM:UPP[:DATA]

Instruction: CALC:LIM:UPP[:DATA] Parameter: {The upper limit value⏐MAX⏐MIN} Return Value: The upper limit value, the format is <NR3> (Floating point) Function: Set or query the upper limit value. Description: MINimum 000.001kΩ MAXimum 9.999E14

Interface Page 61 of 76

3.2.5.9 CALC:LIM:ONOF

Instruction: CALC:LIM:ONOF Parameter: {0⏐1⏐2⏐3} Return Value: {0⏐1⏐23⏐3} Function: Set or query the status of the Compare function. Description: 0 Compare function is OFF 1 Compare Upper Limit is ON 2 Compare Lower Limit is ON 3 Compare Upper and Lower Limits are ON

3.2.5.10 CALC:NULL:[IMM]

Instruction: CALC:NULL:[IMM] Parameter: None Return Value: None Function: Initiate NULL. Description: No data. Instrument performs Null function

3.2.5.11 CALC:NULL:DATA?

Instruction: CALC:NULL:DATA?

Parameter: None Return Value: The Null value in <NR3> format (-20.0E6 to 20.0E6) Function: Query the Null leakage current reading for each current range. Description: ____ Null value of 20mA range ____ Null value of 2mA range ____ Null value of 200uA range ____ Null value of 20uA range ____ Null value of 2uA range

3.2.5.12 DISP:STAT?

Instruction: DISP:STAT? Parameter: {ON (1)⏐OFF (0)} Return Value: {LCTEST⏐WVTEST⏐NULL ⏐MAIN ⏐SYSTEM} Function: Query the status of the LCD display. Description: LCTEST Display is in LCTEST mode WVTEST Display is in WVTEST mode NULL Display is in NULL mode MAIN Display is in MAIN mode SYSTEM Display is in SYSTEM mode

Page 62 of 76 Interface

3.2.5.13 DISP:⏐ WVT, L CT, null, main, system⏐

Instruction: DISP: WVT DISP: LCT DISP: NULL DISP: MAIN DISP: SYSTem Parameter: None Return Value: None Function: Set the Display to WV Mode, L CT mode, null, main or system mode. Description: Set the Display to WV Mode

3.2.5.14 LCT:SOUR:VOLT

Instruction: LCT:SOUR:VOLT Parameter: {Test Voltage⏐MIN⏐MAX} Unit: Volts Return Value: {Test Voltage} in {NR3} format Function: Set or query the test voltage for the LC Test. {Voltage} 1.0 -650V MIN 1.0V MAX 650V

3.2.5.15 LCT:SOUR:CURR

Instruction: LCT:SOUR:CURR Parameter: {Test Current⏐MIN⏐MAX} Unit: Milliamps Return Value: {Test Current} in {NR3} format Function: Set or query the test current for the LC Test. {current} 0.5mA – 500mA MIN 0.5mA MAX 500mA (150mA for V>100V)

3.2.5.16 LCT:CONF:FUNC

Instruction: LCT:CONF:FUNC Parameter: {SEQ⏐STEP} Return Value: {SEQ⏐STEP} Function: Set or query the configuration of the LC Test. Description: SEQ LC Test is a Sequence Test STEP LC Test is a Single Manual Test

Interface Page 63 of 76

3.2.5.17 LCT:CONF:SPE

Instruction: LCT:CONF:SPE Parameter: {FAST⏐MEDIUM⏐SLOW} Return Value: {FAST⏐MEDIUM⏐SLOW} Function: Set or query the Measurement Speed. Description: FAST 18 measurements/second MEDIUM 14 measurements/second SLOW 7 measurements/second

3.2.5.18 LCT:CONF:RANG

Instruction: LCT:CONF:RANG Parameter: {<range>⏐MIN⏐MAX} Return Value: {<range>} Function: Set or query the measurement range for the LC Test. Description: 4 20mA 3 2mA 2 200uA 1 20uA 0 2uA MIN 2uA MAX 20mA

3.2.5.19 LCT:CONF:RANG:AUTO

Instruction: LCT:CONF:RANG:AUTO Parameter: {OFF⏐ON⏐0⏐1} Return Value: {0⏐1} Function: Set or query if the Auto Range function is OFF or ON. Description: 0 Auto Range is OFF 1 Auto Range is ON

3.2.5.20 LCT:CONF:CHGT

Instruction: LCT:CONF:CHGT Parameter: {<numeric value>⏐MIN⏐MAX} Return Value: {<numeric value>} Function: Set or query the charge time for the LC Test. Description: <numeric value> 0 – 999seconds MIN 0seconds MAX 999seconds

Page 64 of 76 Interface

3.2.5.21 LCT:CONF:DWEL

Instruction: LCT:CONF:DWEL Parameter: {<numeric value>⏐MIN⏐MAX} Return Value: {<numeric value>} Function: Set or query the dwell time for the LC Test. Description: <numeric value> 0.2 – 999seconds MIN 0.2seconds MAX 999seconds

3.2.5.22 LCT:MEAS:STAT?

Instruction: LCT:MEAS:STAT? Parameter: None Return Value: {CHG⏐TEST⏐DCHG} Function: Query the test status of the LC Test. Description: CHG Instrument is in Charge mode TEST Instrument is in Test mode DCHG Instrument is in Discharge mode

3.2.5.23 LCT:MEAS:FETC?

Instruction: LCT:MEAS:FETC? Parameter: None Return Value: {0⏐1}, {ON⏐PASS⏐HIGH⏐LOW} Function: Query the test result of the LC Test. Description: 0 Okay 1 Error ON Instrument in Test mode PASS Test Passed HIGH Test Failed – result above High Limit LOW Test Failed – result below Low Limit

3.2.5.24 LCT:MEAS:IR?

Instruction: LCT:MEAS:IR? Parameter: None Return Value: {Measured value} in <NR3> format Function: Query the IR measurement value. Description: IR measurement value

Interface Page 65 of 76

3.2.5.25 LCT:MEAS:LC?

Instruction: LCT:MEAS:LC? Parameter: None Return Value: {Measured value} in <NR3> format Function: Query the LC measurement value. Description: LC measurement value

3.2.5.26 LCT:MEAS:VMON?

Instruction: LCT:MEAS:VMON? Parameter: None Return Value: {Measured value} in <NR3> format Function: Query the value of the monitored voltage (voltage across DUT). Description: VMON value

3.2.5.27 WVT:SOUR:VOLT

Instruction: WVT:SOUR:VOLT Parameter: {<numeric value>⏐MIN⏐MAX} Unit: Volts Return Value: {Test Voltage} in <NR3> format Function: Set or query the test voltage for the Withstand Voltage Test. Description: <numeric value> 1.0 – 650volts MIN 1.0volt MAX 650volts

3.2.5.28 WVT:SOUR:CURR

Instruction: WVT:SOUR:CURR Parameter: {<numeric value>⏐MIN⏐MAX} Unit: Milliamps Return Value: {Test Current} in <NR3> format Function: Set or query the test current for the Withstand Voltage Test. Description: <numeric value> 0.5 – 150mA MIN 0.5mA MAX 150mA

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3.2.5.29 WVT:CONF:TEND

Instruction: WVT:CONF:TEND Parameter: {<numeric value>⏐MIN⏐MAX} Unit: seconds Return Value: {Measurement Time} in <NR3> format Function: Set or query the measurement time for the WV Test. Description: <numeric value> 30 – 600seconds MIN 30seconds MAX 600seconds

3.2.5.30 WVT:CONF:CHGTEND

Instruction: WVT:CONF:CHGTEND Parameter: {<numeric value>⏐MIN⏐MAX} Unit: seconds Return Value: {Maximum Charge Time} in <NR3> format Function: Set or query the maximum charge time for the WV Test. Description: <numeric value> 5 – 600seconds MIN 5seconds MAX 600seconds

3.2.5.31 WVT:MEAS:STAT?

Instruction: WVT:MEAS:STAT? Parameter: None Return Value: {CHG⏐TEST⏐DCHG} Function: Query the test status of the WV Test. Description: CHG Instrument is in Charge mode TEST Instrument is in Test mode DCHG Instrument is in Discharge mode

3.2.5.32 WVT:MEAS:VT?

Instruction: WVT:MEAS:VT? Parameter: None Return Value: {Test Voltage} in <NR3> format Function: Query the Test Voltage at the Termination of the WV Test. Description: <numeric value> 1.0 – 650volts

Interface Page 67 of 76

3.2.5.33 WVT:MEAS:TE?

Instruction: WVT:MEAS:TE? Parameter: None Return Value: {Measurement Time} in <NR3> format Function: Query the total Measurement Time of the WV Test (Tr + Test Time). Description: <numeric value> 30 – 600seconds

3.2.5.34 TRIG[:IMM]

Instruction: TRIG[:IMM] Parameter: None Return Value: None Function: Initiate the Trigger function.

3.2.5.35 TRIG:SOUR

Instruction: TRIG:SOUR Parameter: {BUS⏐EXT⏐INT⏐MAN} Return Value: {BUS⏐EXT⏐INT⏐MAN} Function: Set or query the trigger mode. Description: BUS Bus trigger EXTernal External trigger INTernal Internal trigger MANual Manual trigger

3.2.5.36 TRIG:DEL

Instruction: TRIG:DEL Parameter: {<numeric value>⏐MIN⏐MAX} Unit: milliseconds Return Value: {Trigger Delay Time} in <NR3> format Function: Set or query the trigger delay time. Description: <numeric value> 0 – 9999milliseconds MIN 0milliseconds MAX 9999milliseconds

3.2.5.37 TRIG:EDGE

Instruction: TRIG:EDGE Parameter: {FALL⏐RISI} Return Value: {FALL⏐RISI} Function: Set or query the edge on which to initiate the trigger. Description: FALL Measurement is triggered on falling edge RISI Measurement is triggered on rising edge

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3.2.5.38 SYST:BEEP[:IMM]

Instruction: SYST:BEEP[:IMM] Parameter: None Return Value: None Function: Set the beeper to sound immediately.

3.2.5.39 SYST:BEEP:STAT

Instruction: SYST:BEEP:STAT Parameter: {OFF (0)⏐ON, LOW (1)⏐ON, HIGH (2)} Return Value: {0⏐1⏐2} Function: Set the loudness of the beeper. Description: 0 Turn Beeper OFF 1 Set Beeper sound to LOW 2 Set Beeper sound to HIGH

3.2.5.40 SYST:ALAR

Instruction: SYST:ALAR Parameter: {PULS⏐CONT} Return Value: {PULS⏐CONT} Function: Set the mode the alarm will sound in. Description: PULS The alarm sound will pulse CONT The alarm will continuously sound

3.2.5.41 SYST:LFR

Instruction: SYST:LFR Parameter: {50⏐60} Unit: Hz Return Value: {50⏐60} Function: Set or query the Line Frequency. Description: 50Hz AC Power Line Source is 50Hz 60Hz AC Power Line Source is 60Hz

3.2.5.42 SYST:HAND

Instruction: SYST:HAND Parameter: {CLEA⏐HOLD} Return Value: {CLEA⏐HOLD} Function: Set the Handler to clear result or hold result for each test Description: CLEA Handler will clear result after each test HOLD Handler will hold result after each test

Interface Page 69 of 76

3.2.5.43 SYST:CONT

Instruction: SYST:CONT Parameter: {<numeric value>} Return Value: {Contrast} in <NR1> format Function: Set or query the contrast of the display. Description: <numeric value> 1-16

3.2.5.44 SYST:RANGED

Instruction: SYST:RANGED Parameter: {<numeric value>⏐MIN⏐MAX} Return Value: {Dwell Time} in <NR3> format Function: Set or query the range dwell time. Description: <numeric value> 0 – 9.9seconds MIN 0seconds MAX 9.9seconds

3.2.5.45 SYST:AVER

Instruction: SYST:AVER Parameter: {<numeric value>⏐MIN⏐MAX} Return Value: {Average} in <NR1> format Function: Set or query the number of measurements made & averaged before result shown. Description: <numeric value> 1-8 MIN 1 MAX 8

3.2.5.46 SYST:PRES

Instruction: SYST:PRES Parameter: None Return Value: None Function: Set the instrument to initial default values.

3.2.5.47 SYST:ERR?

Instruction: SYST:ERR? Parameter: None Return Value: Error message Function: Query if there are any system errors. Description: <numeric value>, <string>

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3.2.6 Error Messages

Table 3-6 lists the Error Messages for the IEEE-488 interface of the 1855 instrument. In response to the command “SYSTem:ERRor?”, the 1855 unit responds with the error message number and an error message string of up to 80 characters in length.

Table 3-6: Error Messages

Code Type Message

0 No error There is no error in the error queue

-102 Syntax error Invalid character exists in the command string.

-104 Data error Parameter is not defined in the command string.

-106 Illegal parameter Parameter is not a valid command.

-202 Conflicting Settings Command conflicts with instrument settings. Example: Send ‘Trigger’ when mode is external.

-203 Data range Data exceeds the valid range.

-211 Data stale No resent measurement result. Example: Send ‘Read?’ when in Standby status.

-224 Self-Test failed Self-test via remote interface (*TST) failed.

-225 Excess errors The error queue is full (more than 20 errors). Queue cleared after power down or *CLS command.

-226 Query interrupted Device status changed after query sent. Output buffer will be cleared

Interface Page 71 of 76

3.3 Handler Interface

There is an available Handler interface for the 1855 instrument as illustrated in Figure 3-4. [The IEEE-488 and HANDLER interfaces come together as an optional accessory]. Connection to the Handler interface is through the blue 24-pin connector labeled HANDLER on the rear panel of the 1855 instrument.

1855 HANDLER Interface PIN Configuration: Rear Panel View

12 67891011

15 1419 18 17 162024 23 2122

1855 HANDLER Interface: PIN Designation

/EXT N.C. /TEST FAIL HI GND GND GND COM N.C. VEXT VINT N.C.

/FAIL_CHARGE

/PASS

/CHARGE

/TEST

12534

N.C. N.C.

/FAIL

EOT

/HI

/LO

ACQ

N.C.

Figure 3-4: Handler Interface Pin Configuration

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3.3.1 Trigger

Paragraph 2.3.16 contains the instructions for changing the Handler mode. Paragraphs 2.3.3 and

2.3.4 contain instructions for setting the Trigger Delay time and selecting the Trigger Edge. Figure 3-5 illustrates the Trigger function.

Start measurement on RISING or FALLING edge

RISING FALLING

Trigger

DELAY

START

ACQ OVER

minimum

1uS

+2.5V < Vh < 5V 0V < Vl < 0.4V

Vh < 24V Ih < 6mA (for Vl < +0.4V)

Vh < 24V

BIN

EOT

Ih < 6mA (for Vl < +0.4V)

Vh < 24V Ih < 6mA (for Vl < +0.4V)

Figure 3-5: Trigger

Output Signals

The output lines of the 1855 Handler interface are open collector drivers that pull each signal line to a low voltage, signal ground when the signal is active (true). Each external line should be pulled up (with a resistor) to a positive voltage between 5V and 24V. The pull-up resistor must limit the current to < 6mA for a signal of a comparison function and to < 5mA for a control signal (EOT).

Input Signal

The input signal to the 1855 Handler interface is active low and requires a positive external voltage to pull the signal down below 0.4V, ground.

Interface Page 73 of 76

3.3.2 Handler Pin Assignments for Compare Operation

Table 3-7 lists the pin assignments when the handler interface on the 1855 instrument is performing a Compare operation. The device under test is being compared against a standard of known value. High and low limits can be defined as absolute value or percent value.

Table 3-7: Handler Pin Assignments for Compare

Pin Name Description

1 /EXT External trigger 2 X No connection 3, 20 /TEST Instrument is in Test mode 4, 24 X No connection 5 - 7 GND Ground external DC 8 COM Common Ground 9, 13 X No connection 10 VEXT External DC voltage: 5V ~ 24V 11 VINT Internal DC voltage: +5V 12 X No connection 14 X No connection 15 /PASS Measured Result is within the upper/lower limit(s) (PASS) 16 /CHARGE Instrument is in Charge mode 17 /FAIL Measured Result is outside the upper/lower limit(s) (FAIL) 18 /EOT End of Test 19 /HI For LC: Measured Result is > Upper Limit

For IR: Measured Result is < Lower Limit

21 /LO For LC: Measured Result is < Lower Limit

For IR: Measured Result is > Upper Limit 22 ACQ Received data, ready to accept next 23 EOT End of Test 45 – 46 /FAIL_CHARGE Instrument is in Discharge mode

NOTE:

When using External DC Voltage (VEXT), Pins 5, 6 & 7 (GND) must be connected to Pin 8

(COM).

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Section 4: Service & Calibration

4.1 General

The warranty (at the front of this manual) attests to the quality of materials and workmanship in QuadTech products. If malfunction should be suspected, or other information desired, applications engineers are available for technical assistance. Applications assistance is available in the U.S. by calling (978) 461-2100 and asking for Applications Support. For support outside of the United States please contact your local QuadTech Distributor.

4.2 Instrument Return Before returning an instrument to QuadTech for service please call our Customer Care Center

(CCC) at 800-253-1230 for Return Material Authorization (RMA). It will be necessary to

include a Purchase Order Number to insure expedient processing, although units found to be in warranty will be repaired at no-charge. For any questions on repair costs or shipping instructions please contact our CCC Department at the afore-mentioned number. To safeguard an instrument during storage and shipping, please use packaging that is adequate to protect it from damage, i.e. equivalent to the original packaging, and mark the box “Delicate Electronic Instrument”. Return material should be sent freight prepaid to:

QuadTech, Inc. 5 Clock Tower Place, 210 East Maynard, Massachusetts 01754

Attention: RMA#

Shipments sent collect cannot be accepted.

4.3 Calibration

Calibration of the 1855 Capacitor Leakage Current/IR Meter is completed at the factory and includes a NIST calibration certificate. Verification of the instrument is recommended on an annual basis. Accurate operation of the 1855 instrument is confirmed using the 1855-TP Test Procedure.

Service & Calibration Page 75 of 76

4.3.1 1855 Verification Procedure

This section outlines the relevant information to verify performance of the 1855 Meter. It is recommended that performance be performed at least once a year using this outline procedure. Instrument should be warmed up for a minimum of 15 minutes prior to verification. Verification should be performed under the following conditions: Temperature equal to 23°C ±1.2°C and Relative Humidity (RH) between 35% and 55%.

Recommended standards are listed below. All standards should be traceable to a National Laboratory (such as NIST) and have calibrated values for primary and secondary parameters at the required test frequencies. QuadTech’s verification conforms to ANSI Z540 and QuadTech recommends that the calibrated values for the primary and secondary standards have an uncertainty 4 times better than the primary and secondary accuracy specified in the Verification Data Sheet. If the calibrated values for the standards used do not have an uncertainty of 4 times better than the specified accuracy of the 1855 the uncertainty of the standard should be added to the specified accuracy of the 1855.

4.3.2 1855 Verification Data Sheet Out Voltage: @ 10mA

(Verify Display & Measured Values are within high and low limits) (Note: MEASURE between RED (+) and WHITE (-) mounting jacks)

Voltage Setting

(V)

Measured

Voltage (Fluke)

Displayed

Voltage (1855)

Low Limit

Voltage

High Limit

Voltage

1 795mV 1.205V

50 49.55V 50.45V 200 198.8V 201.2V 400 397.8V 402.2V

600 596.8V 603.2V

IR Measurement: @ .5mA

(Note: MEASURE between BNC jack and WHITE (-) mounting jacks)

Nominal

Setting

(V)

100V 10M 0.805% 100V 100M 0.854%

200V 1G 0.973% 500V 1G 0.747%

Resistance

(Ω)

Actual

Resistance

(Ω)

Before After Voltage

Displayed

Value

(Ω)

Test

Specifications

Displayed

Value

(Ω)

Page 76 of 76 Service & Calibration

Quadtech 1855 Instuction Manual

Specifications and Main Features

Frequently Asked Questions

User Manual