Q-Tech CLASS B+ User Manual

Q-TECH

COR PORATI ON

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Features

• Made in the USA

• ECCN: EAR99

• DFARS 252-225-7014 Compliant:
Electronic Component Exemption

• Broad frequency range from 15kHz to 350MHz

• Rugged 4-point mount (SMD ceramic) or 3 point mount
(Others) shock resistant

• HCMOS, LVCMOS, TTL, LVDS logic

• Tristate Output option (-D)

• Hermetically sealed package

• Fundamental and 3rd Overtone design

• Swept Quartz Crystal or Cultured Quartz Crystal

• Low phase noise and jitter

• Q-Tech does not use pure lead or pure tin in its products

• Custom screening and QCI available with MCM part number

• MIL-PRF-55310/9, /16, /21, /26, /27, /28, /30, /33, /34, ,/35,
/37, /38, /39 equivalent

• RoHs compliant

Ordering Information

Materials Level
1 = Rad Tolerant Die, Swept Quartz Crystal
2 = Rad Tolerant Die, Cultured Quartz Crystal
3 = Class B Die, Swept Quartz Crystal

Logic & Supply Voltage:

HC = HCMOS 5.0V

(QT22, QT28, QT25, QT27 & QT93 Only)

LW = LVDS 3.3V

NW = LVDS 2.5V

Lead Finish:
T = Standard (*)
S = Solder Dip (**)

Package:

See Pages 5, 20, 21, 22

(All B+ Packages)

L = HCMOS 3.3V
T = TTL 5.0V

N = LVCMOS 2.5V

(Sample part number)

QT188HCD10S- 1 0 0 . 0 00MHz

Q T 1 88 HC D 10 S-100.000MHz

Output Frequency

Screening Option:

S = Per MIL-PRF-38534, Class K (modified)
A = Per MIL-PRF-55310, Level S (modified)
B = Per MIL-PRF-55310, Level B (modified)

E = Engineering Model

Frequency vs. Temperature Code(***):

2 = ± 65ppm at -55ºC to +125ºC

6 = ± 50ppm at -55ºC to +105ºC

7 = ± 75ppm at -55ºC to +125ºC

9 = ± 50ppm at -55ºC to +125ºC

10 = ±100ppm at -55ºC to +125ºC

11 = ± 50ppm at -40ºC to +85ºC

12 = ±100ppm at -40ºC to +85ºC

Tristate Option:

(Standard offering in LW & NW)

Blank = No Tristate

D = Tristate

(*) Gold Plated: 50μ ~ 80μ inches typ.
(**) Hot Solder Dip Sn60/Pb40 per MIL-PRF 55310 is optional for an additional cost
(***) Frequency stability vs. temperature codes may not be available in all frequencies

For Non-Standard requirements, contact Q-Tech Corporation at [e-mail]

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

QPDS-0001, Rev L, June 2013 (ECO #10851)

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CLASS B+ PRODUCTS

Q-TECH

COR PORATI ON

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

GENERAL SPECIFICATION

1 SCOPE

1.1 Scope. This specification establishes the general quality and reliability requirements for a family of hybrid, hermetically sealed
square wave, B+ crystal oscillators.

1.2 Part Number. The part number shall be as specified in the detail specification.

2 APPLICABLE DOCUMENTS

2.1 Specifications and Standards. Unless otherwise specified, the following documents shall be applicable to this specification to
the extent specified herein.

SPECIFICATIONS
MIL-PRF-55310 Crystal Oscillators, General Specification For
MIL-PRF-38534 Hybrid Microcircuits, General Specification For
STANDARDS
MIL-STD-202 Test Methods for Electronic and Electrical Component Parts
MIL-STD-883 Test Methods and Procedures for Microelectronics

2.2 Conflicting Requirements. In the event of conflict between requirements of this specification and other requirements of the
applicable detail drawing, the precedence in which requirements shall govern, in descending order, is as follows:

a) Applicable Customer purchase order.
b) Applicable Customer detail drawing.
c) This specification.
d) Other specifications or standards referenced in 2.1 herein.

2.3 Customer Purchase Order Special Requirements. Additional special requirements shall be specified in the applicable Customer
purchase order when additional requirements or modifications specified herein are needed for compliance to special program
or product line requirements

3 REQUIREMENTS

3.1 Item Requirements.

3.2 Case Outline. The case outline and terminal connections shall be as specified in the detail specification. (See pages 20 to 23)

3.2.1 Terminal Connections.

3.2.2 Lead Material and Finish.

3.2.3 Hot Solder Dip. Terminals can be solder dipped Sn60/Pb40 per MIL-PRF-55310 at additional cost. Prefix designated with an
“S”. See sample part number in the “Ordering Information” table.

3.2.4 Solderability. Leads shall meet the requirements of MIL-PRF-55310/38534 when tested.

3.3 Maximum Ratings. Unless otherwise specified, the maximum ratings shall as specified in the detail specification.

The individual item requirements shall be as specified herein and the detail specification.

The terminal connections shall be as shown on page 23.

Lead material and finish shall be as shown on page 24.

3.4 Electrical Performance Requirements.
detail specification.

3.5 Design and Construction.
oscillators shall meet the design and construction requirements of MIL-PRF-55310.

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QPDS-0001, Rev L, June 2013 (ECO #10851)

The design and construction of the crystal oscillator shall be as specified herein. As a minimum, the

The electrical performance requirements shall be as specified herein and the applicable

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HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

GENERAL SPECIFICATION (Cont’d)

3.5.1 Construction Technology.

3.5.2 Workmanship. The device workmanship shall meet the requirements of MIL-PRF-55310.

3.5.3 Element Derating. All active and passive elements shall be derated in accordance with the applicable hybrid microcircuit
element requirements of MIL-STD-975. Elements shall not operate in excess of derated values.

3.5.4 Active Elements. The active component shall be derived from lots that meet the Element Evaluation requirements of
MIL-PRF-38534, Class K (for QT100 and QT200), and MIL-PRF-55310, Level B (QT300).

3.5.5 Quartz Crystal. Unless otherwise specified by the detail specification, the quartz crystal material for the QT100 and QT300
shall be swept synthetic, grade 2.2 or better and cultured quartz crystal for QT200.

3.5.6 Passive Elements. Element Evaluation shall be as a minimum in accordance with MIL-PRF-55310, Level S for QT100 and
Level B for QT200 And QT300.

3.5.7 Crystal Mounting. The crystal element shall be three-point minimum mounted in such a manner as to assure adequate crystal
performance when the oscillator is subjected to the environmental conditions specified herein.

3.5.8 Maximum Allowable Leak Rate. The maximum allowable leakage rate shall be as specified by MIL-STD-883, method 1014
based on the internal cavity volume. The hermetic seal (fine and gross leak) tests shall be in accordance with MIL-STD-883,
Method 1014.

3.5.9 Weight.

3.5.10 Delta Criteria.
The change in the parameter (delta) shall be calculated between the initial measurement and the present (interim or final)
measurement.

3.5.11 Marking. Each unit shall be permanently marked with the manufacturer's name or symbol, part number, frequency, lot date
code number, and serial number. The unit shall be marked with the outline of an equilateral triangle near pin 1 to show that it
contains devices which are sensitive to electrostatic discharge.

The maximum weight of the crystal oscillator shall be defined on page 24.

The crystal oscillator shall meet the parameter delta criteria post burn-in called out in the detail specification.

The device shall be constructed as a class 2-Type 1 hybrid oscillator of MIL-PRF-55310.

3.5.12 Traceability.

3.5.13 Rework Provisions. Rework shall be in accordance with the provisions of MIL-PRF-55310.

4 QUALITY ASSURANCE PROVISIONS

4.1 Responsibility for Inspection.
the performance of all inspection requirements as specified. Customer reserves the right to perform any of the inspections set
forth in the specification where such inspections are deemed necessary to assure supplies and services conform to prescribed
requirements, and to return any product failing to meet the specified requirements.

4.2 Screening.
in Tables I, II, III, IV.

4.2.1 Nondestructive Bondpull. Not applicable in all ceramic packages due to size constraint and cavity height for crystal mount
clearance.

4.2.2 Percent Defective Allowable (PDA). The percent defective allowable shall be 2% or one device, whichever is greater. PDA
accountability shall be based on failures occurring during the second half of burn-in only. PDA shall be applicable to the
+25 ºC static parameters as specified in the delta criteria.

4.3 Quality Conformance Inspection (QCI). Shall be as outlined in the QCI section for each screening option here-in. All records
shall be traceable to the lot number and unit serial number. Samples used for Group A that pass all tests may be delivered on
contract prior to QCI completion.

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

Material, element and process traceability requirements shall be as specified by MIL-PRF-55310.

Unless otherwise specified in the contract or purchase order, the supplier shall be responsible for

Hybrid crystal oscillators shall have been subjected to and successfully passed all the screening tests as applicable

QPDS-0001, Rev L, June 2013 (ECO #10851)

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Q-TECH

COR PORATI ON

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HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

GENERAL SPECIFICATION (Cont’d)

4.4 Customer Source Inspection.
manufacturing plan. Q-Tech will notify customer when the deliverable devices are ready for an in-process source inspection.
The inspection points shall, as a minimum, be:

a) Pre crystal mount visual inspection. (Optional, applicable to all B+ ceramic packages)
b) Pre cap visual inspection.
c) Prior to shipment inspection.

4.5 Retention of Records. All records pertaining to the design, processes, incoming receiving, in-process inspections, screening and
quality conformance inspection, product lot identification, product traceability, failure reports and analyses etc., shall be retained
by the vendor for a period of seven years from the date of product shipment.

5 PREPARATION FOR DELIVERY

5.1 Packaging. The requirements for packaging shall be in accordance with MIL-PRF-55310.

5.2 Electrostatic Discharge Sensitivity. Meet MIL-STD-883, Method 3015, Class 1C HBM 1,000V to 1,999V

6 NOTES

6.1 Ordering Data.
a) Customer or Q-Tech part number.
b) Quality Conformance Inspection requirements.
c) Requirements for special technical documentation.
d) Test data requirements.
e) Special packaging.

The contract or purchase order should specify the following:

Provisions for periodic in-process source inspection by Customer shall be included in the supplier's

f) Requirement for source inspection and notification.

6.2 Handling.

6.3 Certificate of Conformance. Deliverables include a certificate of conformance to this specification, signed by an authorized
representative of the manufacturer.

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

The devices used must be handled with certain precautions to avoid damage due to electrostatic discharge.

QPDS-0001, Rev L, June 2013 (ECO #10851)

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COR PORATI ON

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HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

CLASS B+ PRODUCT OFFERINGS

Photo

Product

QT

QT101
QT201
QT301

QT106
QT206
QT306

QT141
QT241
QT341

QT142
QT242
QT342

QT122
QT222
QT322

QT128
QT228
QT328

QT125
QT225
QT325

QT127
QT227
QT327

QT178
QT278
QT378

QT188
QT288
QT388

QT189
QT289
QT389

QT190
QT290
QT390

QT192
QT292
QT392

QT193
QT293
QT393

QT194
QT294
QT394

Package

Transistor Outline

(TO-5)

8 Pin

Dual In-Line

(DIP-14)

14 Pin

Dual In-Line

(DIP-14)

4 Pin

Dual In-Line

(DIP-14)

4 Pin

Flat Pack

(FP)

16 Pin

Flat Pack

(FP)

16 Pin Formed Lead

Flat Pack

(FP)

20 Pin

Flat Pack

(FP)

20 Pin Formed Lead

Surface Mount

(SMD)

4 Pin J-Lead

Surface Mount

(SMD)

4 Pin J-Lead

Surface Mount

(SMD)

4 Pin Thru-hole

Surface Mount

(SMD)

4 Pin Gull Wing

Surface Mount

(SMD)

4 Pin Formed Lead

Surface Mount

(SMD)

6 Pin Formed Lead

Surface Mount

(SMD)

6 Pin Gull Wing

Output

Logic

CMOS

TTL

CMOS

TTL

CMOS

TTL

CMOS

TTL

CMOS

TTL

LVDS

CMOS

TTL

LVDS

CMOS

TTL

LVDS

CMOS

TTL

LVDS

CMOS

TTL

CMOS

TTL

CMOS

TTL

CMOS

TTL

CMOS

TTL

CMOS

TTL

LVDS

CMOS

TTL

LVDS

Vdd (V)

3.3Vdc, 5.0Vdc 450kHz to 85MHz Pg 20

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

Frequency

Range

15kHz to 200MHz Pg 20

15kHz to 200MHz Pg 20

15kHz to 200MHz Pg 20

450kHz to 350MHz Pg 21

450kHz to 350MHz Pg 21

15kHz to 350MHz Pg 21

15kHz to 350MHz Pg 21

15kHz to 160MHz Pg 22

450kHz to 160 MHz Pg 22

450kHz to 160 MHz Pg 22

450kHz to 160 MHz Pg 22

450kHz to 160 MHz Pg 22

450kHz to 160 MHz Pg 22

450kHz to 160 MHz Pg 22

Outline

Pin

Connection

See

page

23

(*) Frequency stability vs. temperature codes may not be available in all frequencies

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

QPDS-0001, Rev L, June 2013 (ECO #10851)

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COR PORATI ON

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HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

SCREENING OPTIONS SUMMARY

(Click on appropriate column to view screening details)

Screening

S

Modified

MIL-PRF-38534

Class K

See Details in

Test Description

Non Destructive Bond Pull (*)

Internal Visual

Stabilization Bake

Thermal Shock N/A

Temperature Cycling

Constant Acceleration

Particle Impact Noise Detection (PIND)

Pre Burn-In Electrical

Burn-In # 1

Interim Electrical

Burn-In # 2

Final Electrical

Table I

(Pages 7- 8)

✓ ✓

✓ ✓ ✓ ✓

✓ ✓ ✓ ✓

✓ ✓ ✓

✓ ✓ ✓

✓ ✓ ✓

✓ ✓ ✓

✓

(160 Hrs at +125ºC)✓(240 Hrs at +125ºC)✓(160 Hrs at +125ºC)

✓

✓

(160 Hrs at +125ºC)

✓ ✓ ✓ ✓

Screening

A

Modified

MIL-PRF-55310

Level S

See Details in

Table II

(Page 9-10)

✓

N/A N/A N/A

N/A N/A N/A

Screening

B

Modified

MIL-PRF-55310

Level B

See Details in

Table III

(Page 11)

N/A N/A

N/A N/A

Screening

E

Engineering

Model

See Details in

Table IV

(Page 12)

N/A

N/A

N/A

N/A

N/A

Percent Defective Allowance (PDA)

Seal Fine Leak

Seal Gross Leak

Radiographic Inspection

Frequency Aging 30 days

External Visual

✓ ✓ ✓

✓ ✓ ✓ ✓

✓ ✓ ✓ ✓

✓ ✓

✓

✓ ✓ ✓ ✓

100% Group B Tested (QCI Group B) N/A

N/A N/A

(*) Except on ceramic packages (see paragraph 4.2.1)

✓

Group A Inspection (QCI)

Group B Inspection (Aging)

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QPDS-0001, Rev L, June 2013 (ECO #10851)

See Details in

Table I-c

N/A

✓

MIL-PRF-55310

Level S

✓

MIL-PRF-55310

Level S

N/A N/A

N/A N/A

N/A

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Q-TECH

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HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Screening - Option S (Modified MIL-PRF-38534, Class K)

(Example: QT178LD10S-50.000MHz)

Table I

Test Description

Non Destructive Bond Pull 883 2023 100%
Internal Visual 883 2017 Class H 100%
Stabilization Bake 883 1008 C 100% 48 hours at +150°C
Temperature Cycling 883 1010 C 100% 10 cycles
Constant Acceleration 883 2001 A 100% Y1 direction only (5,000g’s)

Particle Impact Noise Detection (PIND) 883 2020 B 100%

Pre Burn-In Electrical Refer to Table I-b and Detail Specification 100%

Burn-In # 1 883 1015

Interim Electrical Refer to Table I-b and Detail Specification 100%

Burn-In # 2 883 1015

Final Electrical Refer to Table I-a, I-b and Detail Specification 100%

Percent Defective Allowance (PDA) 38534

Seal Fine Leak 883 1014 A1 100%
Seal Gross Leak 883 1014 C 100%
Radiographic Inspection 883 2012 Class S 100%

Frequency Aging 30 days 55310

External Visual 883 2009 100%

MIL

Standard

Method Condition Qty Comments

Except on ceramic packages

5 passes minimum

(See Note 1)

+125°C

for 160 hours

+125°C

for 160 hours

Refer to table 1-a

below

+70°C±3°C

Refer to Table I-a

below

100% With load and nominal supply voltage

100% With load and nominal supply voltage

PDA=2% (Supply Current only)

±1.5ppm max. for F≤150MHz

±2ppm max. for >150MHz < F ≤ 200MHz

100%

±2.5ppm max. for F > 200MHz

(See Note 2)

NOTES:

1. PIND testing shall be performed using five (5) independent passes and all failures found at the end of each pass are rejected. The

survivors of the last pass are acceptable.

2. Normally frequency aging is up 30 days. However, aging may be ceased if value at 15 days is half than the limit of 30-day aging

value, or continued up to 90 days if value exeeds 30 day aging limit.

Table I-a
Delta Limits

Tests Parameters Symbol Delta Limits

Burn-In # 2 Supply current Icc ±10% of initial reading
Life Test after 1,000 hours at +125°C Supply current Icc (Life) ±10% of initial reading
Frequency Aging after 30 days at +70°C Output Frequency Fo Refer to detail spec.

Option S - Continue

Back To Summary

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Screening - Option S (Continued)

Table I-b
Electrical Test - Measurement Requirements

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Parameters

Output Frequency
Frequency/Temperature Stability
Frequency/Voltage Stability
Input Current
Output Voltage
Waveform
Duty Cycle
Rise and Fall Times
Start-up Time
Tristate Function

Pre BI

at 25ºC

✓ ✓ ✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓

Pre BI

Low Temp

Pre BI

High Temp

Interim BI

at 25ºC

Post BI
at 25ºC

Table I-c
Group A Inspection (100%)

Test Description Condition

Supply Current 25°C and temperature extremes

Initial Accuracy at Reference Temperature 25°C and temperature extremes

Frequency - Temperature Stability

Frequency - Voltage Tolerance

Output Voltages

Duty Cycle (output waveform symmetry)

Output Rse and Fall Times

Start-up Time

Tristate Function

Over specified operating temperature range, measure output

frequency at minimum ten equispaced points of the temperature extremes.

25°C and temperature extremes

Post BI

Low Temp

Post BI

High Temp

QCI Options (per MIL-PRF-55310, level S)

• Group C Inspection per MIL-PRF-55310, Level S (See details on Table VIII)

QCI (per MIL-PRF-38534, Class K-Modified) (To be specified on Purchase Order)

• Group B Inspection per MIL-PRF-38534, Class K-Modified (See details on Table V)

• Group C Inspection per MIL-PRF-38534, Class K-Modified (Delta Limits per Table I-a) (See details on Table VI)

• Group D Inspection per MIL-PRF-38534, Class K-Modified (See details on Table VII)

Option S - Back

Back To Summary

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Screening Option A (Modified MIL-PRF-55310, Level S)

Table II

Test Description

Non Destructive Bond Pull

Internal Visual

Stabilization Bake
Thermal Shock
Temperature Cycling
Constant Acceleration
Seal Fine and Gross Leak

Particle Impact Noise Detection (PIND)

Pre Burn-In Electrical

Burn-In

Final Electrical
Percent Defective Allowance (PDA)
Radiographic Inspection
External Visual

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

(Example: QT188HCD10A-40.000MHz)

MIL

Standard

883 2023

883

883 1008
883
883 1010
883 2001 A
883 1014 A1, C

883 2020

Refer to Table II-a and Detail Specification 100%

883 1015

Refer to Table II-a and Detail Specification

55310

883 2012
883 2009

Method

2017
2032

1011

Condition Qty

100%

Level B

C
A
B

B

+125°C

for 240 hours

minimum

Class S

100%

100% 48 hours at +150°C
100%
100%
100%
100%

100%

100%

100%

100%
100%

CLASS B+ PRODUCTS

2.5 to 5.0Vdc - 15kHz to 350MHz

Comments

Except on ceramic packages

See 4.4.2 of MIL-PRF-55310

10 cycles

Y1 direction only (5,000g’s)

5 passes minimum

(see Note 1)

With load and nominal supply voltage

PDA=2% (Supply Current only)

NOTES:

1. PIND testing shall be performed using five (5) independent passes and all failures found at the end of each pass are rejected. The

survivors of the last pass are acceptable.

2. 100% QCI Group A and Group B Inspections are performed. See table II-b

Table II-a
Electrical Test – Measurement Requirements

Parameters

Output Frequency
Frequency/Temperature Stability
Frequency/Voltage Stability
Input current
Output Voltage
Waveform
Duty cycle
Rise and Fall Times
Start-up Time
Tristate Function (if applicable)

Pre BI

at 25ºC

✓
✓
✓
✓
✓
✓
✓

✓
✓
✓

Pre BI

Low Temp

✓
✓

✓
✓
✓

Pre BI

High Temp

✓
✓

✓
✓
✓

Post BI
at 25ºC

✓
✓
✓
✓
✓
✓
✓

✓
✓
✓

Post BI

Low Temp

✓
✓

✓
✓
✓
✓

✓
✓
✓

Post BI

High Temp

✓
✓

✓
✓
✓
✓

✓
✓
✓

Option A - Continue

Back To Summary

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Screening - Option A (Continued)

Table II-b
Electrical Test - Measurement Requirements

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Parameters

Output Frequency

Frequency/Temperature Stability

Frequency/Voltage Stability

Input Current

Output Voltage

Waveform

Duty Cycle

Rise and Fall Times

Start-up Time

Tristate Function

Pre BI

at 25ºC

✓ ✓ ✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓

Pre BI

Low Temp

Pre BI

High Temp

Interim BI

at 25ºC

Post BI
at 25ºC

Post BI

Low Temp

QCI (per MIL-PRF-55310, Level S) (To be specified on Purchase Order)

• Group C Inspection per MIL-PRF-55310, Level S (See details on Table VIII)

QCI (per MIL-PRF-38534, Class K-Modified) (To be specified on Purchase Order)

• Group B Inspection per MIL-PRF-38534, Class K-Modified (See details on Table V)

• Group C Inspection per MIL-PRF-38534, Class K-Modified (Delta Limits per Table I-a) (See details on Table VI)

• Group D Inspection per MIL-PRF-38534, Class K-Modified (See details on Table VII)

Post BI

High Temp

Option A - Back

Back To Summary

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QPDS-0001, Rev L, June 2013 (ECO #10851)

10 of 27

CLASS B+ PRODUCTS

Q-TECH

COR PORATI ON

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Screening - Option B (Modified MIL-PRF-55310, Level B)

(Example: QT178LD10B-50.000MHz)

Table III

Test Description

Internal Visual 883 2017 Class H 100%
Stabilization Bake 883 1008 C 100% 48 hours at +150°C
Temperature Cycling 883 1010 B 100% 10 cycles
Constant Acceleration 883 2001 A 100% Y1 direction only (5,000g’s)

Particle Impact Noise Detection (PIND) 883 2020 B 100%

Pre Burn-In Electrical Refer to Table III-a and Detail Specification 100%

Burn-In 883 1015

Final Electrical Refer to Table III-a and Detail Specification 100%
Percent Defective Allowance (PDA) 38534
Seal Fine Leak 883 1014 A1 100%
Seal Gross Leak 883 1014 C 100%
External Visual 883 2009 100%

NOTES:

1. PIND testing shall be performed using five (5) independent passes and all failures found at the end of each pass are rejected. The

survivors of the last pass are acceptable.

2. 100% Group A QCI test per MIL-PRF-55310

MIL

Standard

Method Condition Qty Comments

5 passes minimum

(see Note 1)

+125°C

for 160 hours

100% With load and nominal supply voltage

PDA=2% (Supply Current only)

Table III-a
Electrical Test - Measurement Requirements

Parameters

Output frequency
Frequency/temperature stability
Frequency/voltage stability
Input current
Output voltage
Waveform
Duty cycle
Rise and fall times
Start up time
Tristate Function (if applicable)

Pre BI

at 25ºC

✓ ✓ ✓ ✓ ✓ ✓
✓ ✓ ✓ ✓ ✓ ✓
✓ ✓
✓ ✓ ✓ ✓
✓ ✓ ✓ ✓ ✓ ✓
✓ ✓ ✓ ✓ ✓ ✓
✓ ✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓
✓ ✓ ✓ ✓
✓ ✓ ✓ ✓

Pre BI

Low Temp

Pre BI

High Temp

Post BI
at 25ºC

Post BI

Low Temp

QCI (per MIL-PRF-55310, Level B or S) (To be specified on Purchase Order)

• Group B (AgingTest)

• Group C (See details on Table VIII)

QCI Options (per MIL-PRF-38534, Class K-Modified)

• Group B Inspection per MIL-PRF-38534, Class K-Modified (See details on Table V)

• Group C Inspection per MIL-PRF-38534, Class K-Modified (Delta Limits per Table II) (See details on Table VI)

• Group D Inspection per MIL-PRF-38534, Class K-Modified (See details on Table VII)

Post BI

High Temp

Back To Summary

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

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Q-TECH

COR PORATI ON

Table IV

Test Description

Internal Visual
Stabilization Bake
Seal Fine and Gross Leak
Final Electrical

Frequency vs. Temperature Stability

External Visual

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Screening Option E (Engineering Model)

(Example: QT122HCD9E-16.000MHz)

MIL

Standard

883
883
883 1014

Refer to Table IV-a and Detail Specification

55310

883 2009

Method

2017
1008

Measure output frequency at
10 equispaced points
minimum of the specified
operating temperature range

Condition

Class H

C

A1, C

Qty

100%
100%
100%
100%

100%

100%

Comments

48 hours at +150°C

Table IV-a
Electrical Test – Measurement Requirements

Parameters

Output frequency

Frequency/temperature stability

Frequency/voltage stability

Input current

Output voltage

Waveform

Duty cycle

Rise and fall times

Start up time

Tristate Function (if applicable)

Final

at 25ºC

✓

✓

✓

✓

✓

✓

✓

✓

✓

✓

Engineering model oscillators will have the same design and manufacturing processes as to the flight units. Finished units will be
tested over the operating temperature range. No screening test and/or QCI are required.

Final

Low Temp

✓

✓

✓

✓

✓

✓

✓

✓

✓

✓

Final

High Temp

✓

✓

✓

✓

✓

✓

✓

✓

✓

✓

Back To Summary

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QPDS-0001, Rev L, June 2013 (ECO #10851)

12 of 27

CLASS B+ PRODUCTS

Q-TECH

COR PORATI ON

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Electrical Performance Characteristics 15kHz to 85MHz

(For FACT +5Vdc and +3.3Vdc CMOS Outputs Using 54ACT3301NSC)

Maximum Ratings

Parameters Symbol Min. Max. Units

Supply Voltage Vdd -0.5 +7 V
Operating Temperature Top. -55 +125 °C
Storage Temperature Tstg -62 +125 °C
Lead Solder Temperature 260/10 °C/seconds
Package Thermal Resistance ѲJc 50 °C/W
Junction Temperature +175 ºC

Recommended Operating Conditions

Electrical Parameter Test Conditions

Frequency Range +3.3Vdc or +5.0Vdc

Frequency/Temperature Stability See temperature codes -55 +25 +125 °C (See Note 1)
Supply Voltage

Input Current at 3.63Vdc

Input Current at 5.5Vdc

Output Voltage VOL

Output Voltage VOH

Output Waveform Square Wave N/A
Rise and Fall Time

Duty Cycle

Load
Frequency Aging after 30 days 70°C±3°C ±1.5 ppm (See Note 2)

Frequency Aging/Year 70°C±3°C ±5 ppm (See Note 3)
Start-up Time 100µs ramp 10 ms
Output Enable VIH 2.2 Vdc
Output Disable VIL 0.8 Vdc Output High Impedance

Frequency Voltage Tolerance

Measured without load

at maximum Vdd

Measured without load

at maximum Vdd

10% to 90%

(0.8V to 2.0V for TTL)

50% of output

(1.4Vdc for TTL)

over ±10% change

in supply voltage

Min. Nom. Max. Units

.015 85 MHz TO, DIP, FP20

0.450 85 MHz Other Packages

3.0

4.5

Vdd x 0.9

2.4 (TTL)

45
40

15pF//10kΩ (CMOS)

6TTL to 10TTL (TTL)

-2 +2

-4 +4 All Ceramic Packages

Limits

3.3

5.0

50 55

3.63

5.5

Vdd x 0.1

0.4 (TTL)

10
20
30

20
25
35
45

60

Notes

Vdc

Vdc
3
6

mA

mA

Vdc

Vdc

6
3

ns
ns

%
%

ppm

15k-<500kHz
500k-<16MHz
16M-<32MHz
32M-<60MHz

60M-70MHz

15k-<16MHz
16M-<32MHz
32M-<60MHz

60M-85MHz

15k-<30MHz

30M-85MHz

15k-<16MHz

16M-85MHz

Per MIL-PRF-55310 loads

TO, DIP, FP

NOTES:

1. Frequency stability compared to nominal frequency including initial accuracy at 25°C, load, and supply variations ±10%.
2 Normally frequency aging is up 30 days. However, aging may be ceased if value at 15 days is half than the limit of 30-day aging

value, or continued up to 90 days if value exeeds 30 day aging limit.

3. Aging is ±5ppm after first year and ±2ppm/year thereafter.

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

QPDS-0001, Rev L, June 2013 (ECO #10851)

13 of 27

CLASS B+ PRODUCTS

Q-TECH

COR PORATI ON

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Electrical Performance Characteristics 40MHz to 200MHz

(For BiCMOS +2.5Vdc, +3.3Vdc CMOS Ouputs)

Maximum Ratings

Parameters Symbol Min. Max. Units

Supply Voltage Vdd -0.5 +5 V
Operating Temperature Top. -55 +125 °C
Storage Temperature Tstg -62 +125 °C
Lead Solder Temperature 260/10 °C/seconds
Package Thermal Resistance ѲJc 50 °C/W
Junction Temperature +150 ºC

Recommended Operating Conditions

Electrical Parameter Test Conditions

+2.5Vdc

Frequency Range

+3.3Vdc

Frequency/Temperature Stability See temperature codes -55 +25 +125 °C (See Note 1)
Supply Voltage 3.0 3.3 3.63 Vdc

Input Current

Output Voltage VOL Vdd x 0.1 Vdc
Output Voltage VOH Vdd x 0.9 Vdc
Output Waveform Square Wave N/A
Rise and Fall Time 10% to 90% 3 ns
Duty Cycle 50% of output 40 60 %
Load 15pF//10kΩ

Frequency Aging after 30 days 70°C±3°C

Frequency Aging/Year 70°C±3°C ±5 ppm (See Note 3)
Start-up Time 100µs ramp 10 ms
Output Enable VIH 2.2 Vdc
Output Disable VIL 0.8 Vdc Output High Impedance

Frequency Voltage Tolerance

Measured without load

at maximum Vdd

over ±10% change

in supply voltage

Min. Nom. Max. Units

40 133
70 133 DIP, FP16, FP20
70 165 All Ceramic Packages
70 200 DIP, FP16, FP20

-2 +2

-4 +4 All Ceramic Packages

Limits

30
40
50

±1.5

±2

MHz

mA

ppm
ppm

ppm

Notes

DIP, FP20

40M-<100MHz

100M-<130MHz

130M-200MHz

40M-150MHz

>150M-200MHz

(See Note 2)

DIP, FP16, FP20

NOTES:

1. Frequency stability compared to nominal frequency including initial accuracy at 25°C, load, and supply variations ±10%.

2. Normally frequency aging is up 30 days. However, aging may be ceased if value at 15 days is half than the limit of 30-day aging
value, or continued up to 90 days if value exeeds 30 day aging limit.

3. Aging is ±5ppm after first year and ±2ppm/year thereafter.

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

QPDS-0001, Rev L, June 2013 (ECO #10851)

14 of 27

CLASS B+ PRODUCTS

Q-TECH

COR PORATI ON

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Electrical Performance Characteristics 50MHz to 350MHz

(For BiCMOS +2.5Vdc and +3.3Vdc LVDS Ouputs)

Maximum Ratings

Parameters Symbol Min. Max. Units

Supply Voltage Vdd -0.5 +5 V
Operating Temperature Top. -55 +125 °C
Storage Temperature Tstg -62 +125 °C
Lead Solder Temperature 260/10 °C/seconds
Package Thermal Resistance ѲJc 50 °C/W
Junction Temperature +150 ºC

Recommended Operating Conditions

Electrical Parameter Test Conditions

Frequency Range +2.5Vdc or +3.3Vdc 50 350 MHz FP16, FP20, QT93
Frequency/Temperature Stability See temperature codes -55 +25 +125 °C (See Note 1)

Supply Voltage

Input Current

Output Voltage VOL 0.90 1.1 Vdc
Output Voltage VOH 1.45 1.65 Vdc
Output Waveform Square Wave N/A
Rise and Fall Time 20% to 80% 600 ps
Duty Cycle 50% of output 45 50 55 %

Load

Frequency Aging after 30 days 70°C±3°C

Frequency Aging/Year 70°C±3°C ±5 ppm (See Note 3)
Start-up Time 100µs ramp 10 ms
Output Enable VIH 0.7xVcc Vdc
Output Disable VIL 0.3xVcc Vdc Output High Impedance

Measured without load

at maximum Vdd

Min. Nom. Max. Units

3.135

2.375

(Connected between Q & QNOT)

Limits

3.3

2.5

100Ω

3.465

2.625

80 mA

±1.5

±2
±3

Vdc
Vdc

Ω

ppm
ppm
ppm

Notes

50M-150MHz

>150M-<200MHz

200M-350MHz

(See Note 2)

NOTES:

1. Frequency stability compared to nominal frequency including initial accuracy at 25°C, load, and supply variations ±5%.

2. Normally frequency aging is up 30 days. However, aging may be ceased if value at 15 days is half than the limit of 30-day aging
value, or continued up to 90 days if value exeeds 30 day aging limit.

3. Aging is ±5ppm after first year and ±2ppm/year thereafter.

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

QPDS-0001, Rev L, June 2013 (ECO #10851)

15 of 27

FEEDING (PULL) DIRECTION

ø13.0±0.5

2.5

5º MAX

ø1.5

2.0

1.75±0.1

0.3±.005

ø1.5

2.0±0.1

11.5

4.0±0.1

26

24.0±0.3

16±0.1

120º

B

A

C

P/N

FREQUENCY

D/C S/N

Ø178±1

or

Ø330±1

Q-TECH

0 20 40 60 80 100 120 140 160

180

200 220 240 260

280

300 320 340 360 380 400 420 Time (s)

25

50

75

100

125

150

175

200

225

250

TEMP(*C)

0

60s min.

120s max.

60s min.

120s max.

225º min.

240º max.

60s min.

150s max.

240º

Ramp down (6ºC/s Max)

Ramp up (3ºC/s Max)

TYPICAL REFLOW PROFILE FOR Sn-Pb ASSEMBLY

COR PORATI ON

Reflow Profile

The five transition periods for the typical reflow process are:

• Preheat

• Flux activation

• Thermal equalization

• Reflow

• Cool down

Environmental Specifications

Q-Tech Standard Screening/QCI (MIL-PRF-38534 or MIL-PRF55310) is available for all of our B+ Products. Q-Tech can also
customize screening and test procedures to meet your specific requirements. The B+ product is designed and processed to exceed the
following test conditions:

Temperature cycling MIL-STD-883, Method 1010, Cond. B or Cond. C
Constant acceleration MIL-STD-883, Method 2001, Cond. A, Y1
Seal: Fine and Gross Leak MIL-STD-883, Method 1014, Cond. A and C
Burn-in 160 hours, 125°C with load
Aging 30 days, 70°C, ±1.5ppm max
Vibration sinusoidal MIL-STD-202, Method 204, Cond. D
Shock, non operating MIL-STD-202, Method 213, Cond. I (See Note 1)
Thermal shock, non operating MIL-STD-202, Method 107, Cond. B
Ambient pressure, non operating MIL-STD-202, 105, Cond. C, 5 minutes dwell time minimum
Resistance to solder heat MIL-STD-202, Method 210, Cond. B
Moisture resistance MIL-STD-202, Method 106
Terminal strength MIL-STD-202, Method 211, Cond. C
Resistance to solvents MIL-STD-202, Method 215
Solderability MIL-STD-202, Method 208
ESD Classification MIL-STD-883, Method 3015, Class 1C HBM 1,999V
Moisture Sensitivity Level J-STD-020, MSL=1

Note 1: Additional shock results successfully passed on 16MHz, 40MHz, and 80MHz

QPDS-0001, Rev L, June 2013 (ECO #10851)

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Embossed Tape and Reel Information

Dimensions are in mm. Tape is compliant to EIA-481-A.

QT178
QT190
QT188, QT192, QT193

Reel size vs. quantity:

QT

Reel size

(Diameter in mm)

178
330

Environmental Test Test Conditions

• Shock 850g peak, half-sine, 1 ms duration (MIL-STD-202, Method 213, Cond. D modified)

• Shock 1,500g peak, half-sine, 0.5ms duration (MIL-STD-883, Method 2002, Cond. B)

• Shock 36,000g peak, half-sine, 0.12 ms duration (QT188, QT190 & QT192, QT193)

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

Please contact Q-Tech for higher shock requirements

A B C

10.01 ±0.1 14.53 ±0.1 4.80 ±0.1

9.470 ±0.1 11.92 ±0.1 6.16 ±0.1

7.747 ±0.1 9.271 ±0.1 4.699 ±0.1

Qty per reel (pcs)

QT178 QT188,QT190,QT192, QT193

250 150

1000 800

16 of 27

Q-TECH

-

-

Output

Ground

0.1µF

15pF

Tristate Function

Power
supply

10k

mA

Vdc

+

+

+

(*)

or

0.01µF

(*) CL includes probe and jig capacitance

Typical test circuit for CMOS logic

43

21

QT178

-5

-4

-3

-2

-1

0

1

2

3

4

5

-50

-40

-30

-20

-10

0

10

20

30

40

50

-55 -45 -35 -25 -15 -5 5 15 25 35 45 55 65 75 85 95 105 115 125

Frequency Stability (PPM)

Temperature (°C)

Frequency-Temperature Curve QTX88LD9M-48.21MHz

45º 45º

Hybrid Case

Substrate

Die

D/A epoxy

D/A epoxy

Heat

Die

R1

D/A epoxy

Substrate

D/A epoxy

Hybrid Case

R2 R3 R4 R5

JA JC CA

Die

T

T

T

C

A

J

CA

JC

COR PORATI ON

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Differential Output of a

Test Circuit

QT93NW10M-312.500MHz

The Tristate function on pin 1 has a built-in pull-up resistor typical 50kΩ, so it can
be left floating or tied to Vdd without deteriorating the electrical performance.

Frequency vs. Temperature Curve 15-Day Aging of a QT122L10S-200MHz

Thermal Characteristics

The heat transfer model in a hybrid package is described in figure 1.

Heat spreading occurs when heat flows into a material layer of
increased cross-sectional area. It is adequate to assume that spreading
occurs at a 45° angle.

The total thermal resistance is calculated by summing the thermal
resistances of each material in the thermal path between the device
and hybrid case.

RT = R1 + R2 + R3 + R4 + R5

The total thermal resistance RT (see figure 2) between the heat source
(die) to the hybrid case is the Theta Junction to Case (Theta JC)
in°C/W.

• Theta junction to case (Theta JC) for this product is 30°C/W.

• Theta case to ambient (Theta CA) for this part is 100°C/W.

• Theta Junction to ambient (Theta JA) is 130°C/W.

Maximum power dissipation PD for this package at 25°C is:

• PD(max) = (TJ (max) – TA)/Theta JA

• With TJ = 175°C (Maximum junction temperature of die)

• PD(max) = (175 – 25)/130 = 1.15W

QPDS-0001, Rev L, June 2013 (ECO #10851)

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

(Figure 1)

(Figure 2)

17 of 27

Q-TECH

COR PORATI ON

Jitter And Phase Noise

As data rate increases, effect of jitter becomes critical
with its budget tighter. Jitter is the deviation of a timing
event of a signal from its ideal position. Jitter is
complex and is composed of both random jitter (RJ) and
deterministic jitter (DJ) components.
Random Jitter (RJ) is theoretically unbounded and
Gaussian in distribution, while Deterministic Jitter (DJ)
is bounded and does not follow any predictable
distribution.

Q-Tech utilizes the EZJIT Plus jitter analysis software
with Noise reduction software that supports Agilent
Infinium real-time oscilloscope. Measure at its
maximum sampling rate 40Gs/s and memory depth, we
can separate the signal’s aggregate total jitter into
Random Jitter (RJ) and Deterministic Jitter (DJ).

Since Random Jitter is unbounded and Gaussian in
style, the Total Jitter is a function of Bit Error Rate
(BER).

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Figure 1: Jitter Analysis of a QT128L10S-200MHz

TJ = RJ + DJ

Where:

RJ = RJ(rms) x 2α + DJ(p-p)

BER

10E-3
10E-6
10E-9
10E-12

α

3.1

4.75
6

7.0

Typical Jitter at BER=10E-12

Frequency

22.118MHz
100MHz
125MHz
200MHz

DJ

(p-p) psRJ(rms) ps

31 3.36 78.9

1.61 1.99 21.1

1.34 1.23 18.9

1.53 2.04 30.7

TJ

(ps)

Figure 2: Jitter Analysis of a QT192LD9S-125MHz

Typical Phase Noise

Frequency

22.118MHz
100MHz
125MHz
200MHz

10Hz 100Hz 1kHz 10kHz 100kHz 1MHz

-90 -125 -150 -157 -162 -162 0.151

-76 -101 -128 -140 -143 -149 0.120

-74 -101 -131 -143 -145 -150 0.118

-73 -99 -124 -134 -145 -148 0.121

(*) Integrated from 1kHz to 20MHz

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

Phase Jitter

(ps) *

QPDS-0001, Rev L, June 2013 (ECO #10851)

18 of 27

CLASS B+ PRODUCTS

Q-TECH

COR PORATI ON

Phase Noise and Phase Jitter Integration

Phase noise is measured in the frequency domain, and is expressed as a ratio of signal power to noise power measured in a 1Hz bandwidth
at an offset frequency from the carrier, e.g. 10Hz, 100Hz, 1kHz, 10kHz, 100kHz, etc. Phase noise measurement is made with an Agilent
E5052A Signal Source Analyzer (SSA) with built-in outstanding low-noise DC power supply source. The DC source is floated from the
ground and isolated from external noise to ensure accuracy and repeatability.

In order to determine the total noise power over a certain frequency range (bandwidth), the time domain must be analyzed in the frequency
domain, and then reconstructed in the time domain into an rms value with the unwanted frequencies excluded. This may be done by
converting L(f) back to Sφ(f) over the bandwidth of interest, integrating and performing some calculations.

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Symbol

∫L(f)
Sφ (f)=(180/Π)x√2 ∫L(f)df
RMS jitter = Sφ (f)/(fosc.360°) Jitter(in seconds) due to phase noise. Note Sφ (f) in degrees.

Integrated single side band phase noise (dBc)
Spectral density of phase modulation, also known as RMS phase error (in degrees)

Definition

The value of RMS jitter over the bandwidth of interest, e.g. 10kHz to 20MHz, 10Hz to 20MHz, represents 1 standard deviation of phase
jitter contributed by the noise in that defined bandwidth.

Figure below shows a typical Phase Noise/Phase jitter of a QT193NW10M, 2.5Vdc, 312MHz and QT178HC9A, 5.0Vdc, 80MHz clock
at offset frequencies 10Hz to 1MHz, and phase jitter integrated over the bandwidth of 12kHz to 1MHz.

QT178HC9A, 5.0Vdc, 80MHzQT193NW10M, 2.5Vdc, 312MHz

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

QPDS-0001, Rev L, June 2013 (ECO #10851)

19 of 27

Q-TECH

(6.60)

.260

.500

(12.70)

(.457)

.018

(5.08)

.200

PIN No. 1

(9.14)

.360

FREQ.
D/C S/N

P/N

Q-TECH

MAX.

MIN.

17

814

Q-TECH
P/N
FREQ.
D/C S/N

(22.35)

(15.24)

.880

.600

.300

(7.62)

(2.54)

.100

.505

(12.83)

MAX.

(.457)

.018

MIN.

(5.08)

.200

.200

(5.08)

MAX.

MAX.

14 8

71

FREQ.
D/C S/N

P/N

Q-TECH

.600

(15.24)

(7.62)

.300

.200

(5.08)

MAX.

MIN.

(5.08)

.200

(.457)

.018

MAX.

(20.32)

.800

.505

(12.83)

MAX.

Q-TECH
P/N

.600

.800

.200

.505

.300

.200

.018

FREQ.
D/C S/N

(12.83)

(7.62)

MAX.

(5.08)

MAX.

(5.08)

MIN.

(.457)

(20.32)

MAX.

(15.24)

17

814

ø .080

(ø 2.03)

.020

(.508)

COR PORATI ON

Package Outline - Dimensions are in inches (mm)

QT101 QT106

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

QPDS-0001, Rev L, June 2013 (ECO #10851)

QT141

QT142

20 of 27

Q-TECH

1

89

16

(3.05)

.120

.060/.035

(1.52/.889)

.010

(.254)

(.381)

.015

(1.27)

.050

(8.89)

.350

MAX.

Q-TECH

P/N

FREQ.

D/C S/N

.500

(12.70)

MIN.

(9.53±.13)

.375±.005

.500±.005

(12.70±.13)

.015

(.381)

(1.27)

.050

.450

(11.43)

.625

(15.88)

(.254)

.010.060/.045

(1.52/1.14)

(3.81)

.150

FREQ.

P/N

Q-TECH

20

1110

1

MAX.

SQ.

D/C S/N

.500

(12.70)

MIN.

(3.81)

(.254)

.010

.150

.625

.450

20

19

18

17

16

15

14

13

12

1110
9
8
7
6
5
4
3
2

1

Q-TECH
P/N
FREQ.
D/C S/N

(15.88)

SQ ±.005.

.05

MIN.

(1.27)

.05

MIN.

(1.27)

.15

(3.81)

(11.43)

(.381)

.015

(1.27)

.050

(.381)

.015

(9.53±.13)

.375±.005

(8.89)

.350

.010

.05

.15

1

89

16

Q-TECH

P/N

FREQ.

D/C S/N

(3.05)

.120

MAX.

.500±.005

(12.70±.13)

(1.27)

.050

(3.81)

MIN.

(.254)

(1.27)

.05

MIN.

(1.27)

COR PORATI ON

Package Outline - Dimensions are in inches (mm)

(Continued)

QT122

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

QT128

QPDS-0001, Rev L, June 2013 (ECO #10851)

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

QT125

QT127

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Q-TECH

0.170 MAX.

0.018±.003

(0.46±0.08)

(4.318 MAX.)

0.550±.0.005

(13.970±0.13)

0.350±0.005

(8.89±0.13)

0.100±.005

0.200±.005

(2.54±0.13)

(5.080±0.13)

(7.620±0.13)

(9.525 max.)

P/N
FREQ.
D/C S/N

Q-TECH

4

3

1

2

.130 MAX.

0.300±.005

0.375 max.

3.302 MAX.

0.290±0.005

(7.37±0.13)

0.350±0.005

(8.89±0.13)

0.100±0.005

(2.54±0.13)

0.200±0.005

(5.08±0.13)

0.170 Max.

(4.32)

0.018±0.003

(0.457±0.076)

0.315 max.

(8.00 max.)

0.240±0.005

(6.10±0.13)

0.040 Max.

(1.02)

12

43

Q-TECH
P/N
FREQUENCY
D/C S/N

.190 MAX.

(4.826 MAX.)

(.203)

(8.00 max.)

(10.16 ± .13)

.008

.315 max.

.400 TYP.

1

2

4

3

.350 ± .005

.290 ± .005

.100 ± .005

.200 ± .005

(8.89 ± .13)

(7.37 ± .13)

(2.54 ± .13)

(5.08 ± .13)

FREQ.

Q-TECH

D/C S/N

4 X

.048 ± .002

(1.22 ± .051)

4 X

.018 ± .003

(.457 ± .076)

P/N

4 X

.290 ± .005

.190 MAX.

(1.396 ± .13)

.200 ± .005

.048 ± .002

(1.22 ± .051)

(7.37 ± .13)

(5.08 ± .13)

.100 ± .005

(2.54 ± .13)

(4.826 MAX.)

(.203) (2.794 ± .13)

(8.00 max.)

.315 max.

.055 ± .005

.008

.110 ± .005

1 2

43

.350 ± .005

(8.89 ± .13)

4 X

.018 ± .003

(.457 ± .076)

Q-TECH
P/N
FREQ.
D/C S/N

1

2

4

3

0.350±0.005

0.290±0.005

0.130

0.018±.003

(8.00 max.)

(5.080±0.13)

0.100±.005

0.200±.005

(.457±0.076)

(8.89±0.13)

(7.37±0.13)

(2.54±0.13)

(5.080±0.13)

(3.30)

0.050

(1.27)

(.203)

FREQ.

Q-TECH

D/C S/N

0.315 max.

0.200±.005

0.008

MAX.

P/N

6 X

1 32

.350 ± .005

.290 ± .005

.190 MAX.

(1.396 ± .13)

.200 ± .005

.048 ± .002

(1.22 ± .051)

6 X

.018 ± .003

(.457 ± .076)

(8.89 ± .13)

(7.37 ± .13)

(5.08 ± .13)

.100 ± .005

(2.54 ± .13)

(4.826 MAX.)

(.203) (2.794 ± .13)

(8.00 max.)

.315 max.

.055 ± .005

.008

.110 ± .005

6 45

P/N
FREQ.

Q-TECH

D/C S/N

0.190 MAX.

0.018±.003

(.457±0.076)

(4.826 MAX.)

0.130 MAX.

(3.302 MAX.)

(.203)

(8.00 max.)

(10.160±0.13)

0.008

0.315 max.

0.400TYP.

1

32

6

45

0.350±.0.005

0.290±0.005

0.100±.005

0.200±.005

(8.89±0.13)

(7.37±0.13)

(2.54±0.13)

(5.080±0.13)

P/N
FREQ.

Q-TECH

D/C S/N

COR PORATI ON

Package Outline - Dimensions are in inches (mm)

(Continued)

QT178 QT188

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

QT189

QPDS-0001, Rev L, June 2013 (ECO #10851)

QT190

QT192

QT193

QT194

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

22 of 27

Q-TECH

COR PORATI ON

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Pin Connections

QT # Vcc GND Case Output

E/D

or

N/C

Equivalent

MIL-PRF-55310

Configuration

QT101 8 4 4 5 3 /9 = QT1T

QT106 14 7 7 8 1

/16 = QT6T
/26A = QT6HC

QT141 14 7 7 8 1 /26B = QT41HC
QT142 14 7 7 8 1 N/A

QT122 8 9 9

QT128 8 9 9

QT125 13 10 10

QT127 13 10 10

10 (CMOS, TTL)

10 & 11 (LVDS)

10 (CMOS, TTL)

10 & 11 (LVDS)
11 (CMOS TTL) 12

11 & 12 (LVDS) 8
11 (CMOS TTL) 12
11 & 12 (LVDS) 8

7 N/A

7 N/A

/21 = QT25T

N/A

/27 = QT78HCD

QT178 4 2 2 3 1

/28 = QT78TD
/30 = QT78LD
/33 = QT88HCD

QT188 4 2 2 3 1

/34 = QT88LD
/35 = QT88ND

QT189 4 2 2 3 1 N/A
QT190 4 2 2 3 1 N/A

/37 = QT92HCD

QT192 4 2 2 3 1

/38 = QT92LD
/39 = QT92ND

QT193 6 3 3

QT194 6 3 3

4 (CMOS, TTL)
4 & 5 (LVDS)
4 (CMOS, TTL)
4 & 5 (LVDS)

1 N/A

1 N/A

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

QPDS-0001, Rev L, June 2013 (ECO #10851)

23 of 27

Q-TECH

COR PORATI ON

Package Information

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

QT101

• Package material (header and leads): Kovar

• Lead finish: Gold Plated – 50μ ~ 80μ inches
Nickel Underplate – 100μ ~ 250μ inches

• Cover: Pure Nickel Grade A

• Package to lid attachment: Resistance weld

• Weight: 2.0g typ., 4.96g max.

QT106, QT141, QT142

• Package material (header and leads): Kovar

• Lead finish: Gold Plated – 50μ ~ 80μ inches

Nickel Underplate – 100μ ~ 250μ inches

• Package to lid attachment: Resistance weld

• Cover: (DIP-14): Pure Nickel Grade A

• Weight: (DIP-14): 3.4g typ.,14.2g max.

QT122, QT125, QT127, QT128:

• Package material (Header and Leads): Kovar

• Lead finish: Gold Plated – 50µ ~ 80µ inches
Nickel Underplate – 100µ ~ 250µ inches

• Cover: Kovar, Gold Plated – 50µ ~ 100µ inches

Nickel Underplate – 70µ ~ 90µ inches

• Package to lid attachment: Seam weld

• Weight: 2.0g typ., 4.0g max.

QT178, QT188, QT189, QT190, QT192, QT193

• Package material: 90% AL2O3

• Lead material: Kovar

• Lead finish: Gold Plated: 50μ ~ 80μ inches

Nickel Underplate: 100μ ~ 250μ inches

• Weight: QT178: 1.1g typ., 3.0g max.

QT188, QT189, QT190, QT192, QT193: .6g typ., 3.0g max.

Packaging Options

QT101, QT106, QT141, QT142

• Standard packaging in black foam

QT122, QT125, QT127, QT128

• Standard packaging in a locked anti-static cardboard

Specifications subject to change without prior notice.

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

QT178, QT188, QT189, QT190, QT192, QT193, QT194

• Standard packaging in anti-static plastic tube (60pcs/tube)

• Tape and Reel is available for an additional charge.

QPDS-0001, Rev L, June 2013 (ECO #10851)

24 of 27

CLASS B+ PRODUCTS

Q-TECH

COR PORATI ON

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

QCI Per MIL-PRF-38534, CLASS K (Modified)

Table V
Group B Inspection

Subgroup

1
2
3
4
5
6
7
8
9

NOTES:

1. Non catastrophic screening test rejects may be used for Group B.

2. To be omitted. Being performed during screening, see Table I.

3. Subgroup 5 shall be performed in accordance with the Group B bond strength requirements of MIL-PRF-38534. This test may be
performed in-process anytime prior to cover seal.

4. Die shear test samples shall not be the same units as subjected to bond pull. Die shear specimens shall not be exposed to the 300ºC
preconditioning used for the bond strength test.

5. Solder temperature shall be 245 ±5ºC.

6. Subgroup 8, the fine and gross leak tests are being done during screening, see Table I.

7. Subgroup 9, the ESD classification test, is not required. The hybrid has been classified as ESDS Class 1 (i.e., Electrostatic voltage
= 0 to 1999V) and shall be marked accordingly.

Physical Dimensions
Particle Impact Noise Detection (Note 2)
Resistance to Solvents
Internal Visual and Mechanical
Bond Strength (Note 3) 2011
Die Shear Strength (Note 4)
Solderability (Note 5)
Seal; Fine Leak and Gross Leak (Note 6)
ESD Classification (Note 7)

(Note 1)

Test Description

Method

2016
2020
2015
2014

2019
2003
1014
3015

MIL-STD-883

Condition

-

B 15 (0)

-

-

C or D

-

Solder Temperature: 245 ±5º C

A

& C

1

-

Quantity / (Accept No.)

2 (0)

4 (0)
1 (0)
2 (0)
2 (0)
1 (0)
4 (0)
4 (0)

Table VI
Group C Inspection

Subgroup

1

2

3

External Visual
Temperature Cycling
Constant Acceleration
Seal (fine & gross leak)
Radiographic Inspection
Visual Examination
End Point Electricals

End Point Electricals
Steady State Life
End Point Electricals

Internal Water Vapor Content

Test Description

Method

2009
1010 C, 20 Cycles
2001
1014
2012

1005

1018

NOTES:

1. Five units shall be used for Group C inspection based on limited usage acquisition requirements of MIL-PRF-38534.

2. End point electrical shall be as specified in the detail specification.

3. Subgroup 1 specimens shall be used for subgroup 3 testing.

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

MIL-STD-883

Condition

A, Y

Axis

1

A

& C

1

1000 hours at 125ºC 5 (0)

Quantity / (Accept No.)

5 (0)

3 (0) or 5 (1)

QPDS-0001, Rev L, June 2013 (ECO #10851)

25 of 27

Q-TECH

COR PORATI ON

Table VII
Group D Inspection

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

QCI Per MIL-PRF-38534, CLASS K (Modified)

(continued)

Subgroup

Thermal Shock 1011
Stabilization Bake

1

Lead Integrity

Seal (fine and gross leak)

Table VIII
Group C Inspection

Subgroup

1

all sample units

2

1/2 of all sample units

3

1/4 of all sample units

Test Description

QCI Per MIL-PRF-55310, LEVEL S

Vibration
Shock

Thermal Shock
Ambient Pressure
Storage Temperature

Resistance to Solder Heat
Moisture Resistance
Salt Atmosphere

Method

1008 1 hour at 150ºC
2004

2028
1014

Test Description

MIL-STD-883

Condition

B2 (lead fatigue)

(LCC) Rigid Leads

A

1

C

& C

Quantity / (Accept No.)

5 (0)
5 (0)

1 (0)

5 (0)

Quantity/ (Accept No.)

4 (0)

2 (0)

1 (0)

4

1/4 of all sample units

Terminal Strength
Resistance to Solvents

1 (0)

1.A minimum of four (4) sample units shall be selected from inspection lots which have passed quality conformance inspection
unless otherwise specified by the qualifying activity.

2.All test conditions are in accordance with MIL-PRF-55310, Level S.

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

QPDS-0001, Rev L, June 2013 (ECO #10851)

26 of 27

CLASS B+ PRODUCTS

Q-TECH

COR PORATI ON

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Revision History

ECO REV REVISION SUMMARY PAGE DATE

Change Frequency: Was: 450kHz -350MHz

Is: 250kHz -350MHz

Add QT189 package Applicable Pages
Remove USML Registration 1

10380 K

10625 K w/amendment 1 Add document number on footer of all pages All 7/16/2012
10703 K w/amendment 2 Add Group B, C, D, Inspection tables 21 & 22 10/26/2012

10851 L

Add tolerance code 2 & 7 to Freq vs. Temp Code 1
Add General Specification 2 - 4
Add Class B+ Logic Offerings 5
Add Group B Inspection (100% Aging) to Screening Option A 6
Add tolerance to dimensions (QT122 & QT128) 19

Add QT101, QT106, QT125, QT127, QT141, QT142, QT194

Add Supply Voltage 2.5V to ordering information table for CMOS 1

Applicable Pages

Applicable Pages

3/22/2012

5/21/2013Update frequency range from 250kHz - 350MHz to 15kHz - 350MHz

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

QPDS-0001, Rev L, June 2013 (ECO #10851)

27 of 27