Q-Tech CLASS B+ User Manual

Q-TECH

COR PORATI ON

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Features

• Made in the USA

• ECCN: EAR99

• DFARS 252-225-7014 Compliant:
Electronic Component Exemption

• Broad frequency range from 15kHz to 350MHz

• Rugged 4-point mount (SMD ceramic) or 3 point mount
(Others) shock resistant

• HCMOS, LVCMOS, TTL, LVDS logic

• Tristate Output option (-D)

• Hermetically sealed package

• Fundamental and 3rd Overtone design

• Swept Quartz Crystal or Cultured Quartz Crystal

• Low phase noise and jitter

• Q-Tech does not use pure lead or pure tin in its products

• Custom screening and QCI available with MCM part number

• MIL-PRF-55310/9, /16, /21, /26, /27, /28, /30, /33, /34, ,/35,
/37, /38, /39 equivalent

• RoHs compliant

Ordering Information

Materials Level
1 = Rad Tolerant Die, Swept Quartz Crystal
2 = Rad Tolerant Die, Cultured Quartz Crystal
3 = Class B Die, Swept Quartz Crystal

Logic & Supply Voltage:

HC = HCMOS 5.0V

(QT22, QT28, QT25, QT27 & QT93 Only)

LW = LVDS 3.3V

NW = LVDS 2.5V

Lead Finish:
T = Standard (*)
S = Solder Dip (**)

Package:

See Pages 5, 20, 21, 22

(All B+ Packages)

L = HCMOS 3.3V
T = TTL 5.0V

N = LVCMOS 2.5V

(Sample part number)

QT188HCD10S- 1 0 0 . 0 00MHz

Q T 1 88 HC D 10 S-100.000MHz

Output Frequency

Screening Option:

S = Per MIL-PRF-38534, Class K (modified)
A = Per MIL-PRF-55310, Level S (modified)
B = Per MIL-PRF-55310, Level B (modified)

E = Engineering Model

Frequency vs. Temperature Code(***):

2 = ± 65ppm at -55ºC to +125ºC

6 = ± 50ppm at -55ºC to +105ºC

7 = ± 75ppm at -55ºC to +125ºC

9 = ± 50ppm at -55ºC to +125ºC

10 = ±100ppm at -55ºC to +125ºC

11 = ± 50ppm at -40ºC to +85ºC

12 = ±100ppm at -40ºC to +85ºC

Tristate Option:

(Standard offering in LW & NW)

Blank = No Tristate

D = Tristate

(*) Gold Plated: 50μ ~ 80μ inches typ.
(**) Hot Solder Dip Sn60/Pb40 per MIL-PRF 55310 is optional for an additional cost
(***) Frequency stability vs. temperature codes may not be available in all frequencies

For Non-Standard requirements, contact Q-Tech Corporation at [e-mail]

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

QPDS-0001, Rev L, June 2013 (ECO #10851)

1 of 27

CLASS B+ PRODUCTS

Q-TECH

COR PORATI ON

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

GENERAL SPECIFICATION

1 SCOPE

1.1 Scope. This specification establishes the general quality and reliability requirements for a family of hybrid, hermetically sealed
square wave, B+ crystal oscillators.

1.2 Part Number. The part number shall be as specified in the detail specification.

2 APPLICABLE DOCUMENTS

2.1 Specifications and Standards. Unless otherwise specified, the following documents shall be applicable to this specification to
the extent specified herein.

SPECIFICATIONS
MIL-PRF-55310 Crystal Oscillators, General Specification For
MIL-PRF-38534 Hybrid Microcircuits, General Specification For
STANDARDS
MIL-STD-202 Test Methods for Electronic and Electrical Component Parts
MIL-STD-883 Test Methods and Procedures for Microelectronics

2.2 Conflicting Requirements. In the event of conflict between requirements of this specification and other requirements of the
applicable detail drawing, the precedence in which requirements shall govern, in descending order, is as follows:

a) Applicable Customer purchase order.
b) Applicable Customer detail drawing.
c) This specification.
d) Other specifications or standards referenced in 2.1 herein.

2.3 Customer Purchase Order Special Requirements. Additional special requirements shall be specified in the applicable Customer
purchase order when additional requirements or modifications specified herein are needed for compliance to special program
or product line requirements

3 REQUIREMENTS

3.1 Item Requirements.

3.2 Case Outline. The case outline and terminal connections shall be as specified in the detail specification. (See pages 20 to 23)

3.2.1 Terminal Connections.

3.2.2 Lead Material and Finish.

3.2.3 Hot Solder Dip. Terminals can be solder dipped Sn60/Pb40 per MIL-PRF-55310 at additional cost. Prefix designated with an
“S”. See sample part number in the “Ordering Information” table.

3.2.4 Solderability. Leads shall meet the requirements of MIL-PRF-55310/38534 when tested.

3.3 Maximum Ratings. Unless otherwise specified, the maximum ratings shall as specified in the detail specification.

The individual item requirements shall be as specified herein and the detail specification.

The terminal connections shall be as shown on page 23.

Lead material and finish shall be as shown on page 24.

3.4 Electrical Performance Requirements.
detail specification.

3.5 Design and Construction.
oscillators shall meet the design and construction requirements of MIL-PRF-55310.

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QPDS-0001, Rev L, June 2013 (ECO #10851)

The design and construction of the crystal oscillator shall be as specified herein. As a minimum, the

The electrical performance requirements shall be as specified herein and the applicable

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HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

GENERAL SPECIFICATION (Cont’d)

3.5.1 Construction Technology.

3.5.2 Workmanship. The device workmanship shall meet the requirements of MIL-PRF-55310.

3.5.3 Element Derating. All active and passive elements shall be derated in accordance with the applicable hybrid microcircuit
element requirements of MIL-STD-975. Elements shall not operate in excess of derated values.

3.5.4 Active Elements. The active component shall be derived from lots that meet the Element Evaluation requirements of
MIL-PRF-38534, Class K (for QT100 and QT200), and MIL-PRF-55310, Level B (QT300).

3.5.5 Quartz Crystal. Unless otherwise specified by the detail specification, the quartz crystal material for the QT100 and QT300
shall be swept synthetic, grade 2.2 or better and cultured quartz crystal for QT200.

3.5.6 Passive Elements. Element Evaluation shall be as a minimum in accordance with MIL-PRF-55310, Level S for QT100 and
Level B for QT200 And QT300.

3.5.7 Crystal Mounting. The crystal element shall be three-point minimum mounted in such a manner as to assure adequate crystal
performance when the oscillator is subjected to the environmental conditions specified herein.

3.5.8 Maximum Allowable Leak Rate. The maximum allowable leakage rate shall be as specified by MIL-STD-883, method 1014
based on the internal cavity volume. The hermetic seal (fine and gross leak) tests shall be in accordance with MIL-STD-883,
Method 1014.

3.5.9 Weight.

3.5.10 Delta Criteria.
The change in the parameter (delta) shall be calculated between the initial measurement and the present (interim or final)
measurement.

3.5.11 Marking. Each unit shall be permanently marked with the manufacturer's name or symbol, part number, frequency, lot date
code number, and serial number. The unit shall be marked with the outline of an equilateral triangle near pin 1 to show that it
contains devices which are sensitive to electrostatic discharge.

The maximum weight of the crystal oscillator shall be defined on page 24.

The crystal oscillator shall meet the parameter delta criteria post burn-in called out in the detail specification.

The device shall be constructed as a class 2-Type 1 hybrid oscillator of MIL-PRF-55310.

3.5.12 Traceability.

3.5.13 Rework Provisions. Rework shall be in accordance with the provisions of MIL-PRF-55310.

4 QUALITY ASSURANCE PROVISIONS

4.1 Responsibility for Inspection.
the performance of all inspection requirements as specified. Customer reserves the right to perform any of the inspections set
forth in the specification where such inspections are deemed necessary to assure supplies and services conform to prescribed
requirements, and to return any product failing to meet the specified requirements.

4.2 Screening.
in Tables I, II, III, IV.

4.2.1 Nondestructive Bondpull. Not applicable in all ceramic packages due to size constraint and cavity height for crystal mount
clearance.

4.2.2 Percent Defective Allowable (PDA). The percent defective allowable shall be 2% or one device, whichever is greater. PDA
accountability shall be based on failures occurring during the second half of burn-in only. PDA shall be applicable to the
+25 ºC static parameters as specified in the delta criteria.

4.3 Quality Conformance Inspection (QCI). Shall be as outlined in the QCI section for each screening option here-in. All records
shall be traceable to the lot number and unit serial number. Samples used for Group A that pass all tests may be delivered on
contract prior to QCI completion.

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

Material, element and process traceability requirements shall be as specified by MIL-PRF-55310.

Unless otherwise specified in the contract or purchase order, the supplier shall be responsible for

Hybrid crystal oscillators shall have been subjected to and successfully passed all the screening tests as applicable

QPDS-0001, Rev L, June 2013 (ECO #10851)

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Q-TECH

COR PORATI ON

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

GENERAL SPECIFICATION (Cont’d)

4.4 Customer Source Inspection.
manufacturing plan. Q-Tech will notify customer when the deliverable devices are ready for an in-process source inspection.
The inspection points shall, as a minimum, be:

a) Pre crystal mount visual inspection. (Optional, applicable to all B+ ceramic packages)
b) Pre cap visual inspection.
c) Prior to shipment inspection.

4.5 Retention of Records. All records pertaining to the design, processes, incoming receiving, in-process inspections, screening and
quality conformance inspection, product lot identification, product traceability, failure reports and analyses etc., shall be retained
by the vendor for a period of seven years from the date of product shipment.

5 PREPARATION FOR DELIVERY

5.1 Packaging. The requirements for packaging shall be in accordance with MIL-PRF-55310.

5.2 Electrostatic Discharge Sensitivity. Meet MIL-STD-883, Method 3015, Class 1C HBM 1,000V to 1,999V

6 NOTES

6.1 Ordering Data.
a) Customer or Q-Tech part number.
b) Quality Conformance Inspection requirements.
c) Requirements for special technical documentation.
d) Test data requirements.
e) Special packaging.

The contract or purchase order should specify the following:

Provisions for periodic in-process source inspection by Customer shall be included in the supplier's

f) Requirement for source inspection and notification.

6.2 Handling.

6.3 Certificate of Conformance. Deliverables include a certificate of conformance to this specification, signed by an authorized
representative of the manufacturer.

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

The devices used must be handled with certain precautions to avoid damage due to electrostatic discharge.

QPDS-0001, Rev L, June 2013 (ECO #10851)

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Q-TECH

COR PORATI ON

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

CLASS B+ PRODUCT OFFERINGS

Photo

Product

QT

QT101
QT201
QT301

QT106
QT206
QT306

QT141
QT241
QT341

QT142
QT242
QT342

QT122
QT222
QT322

QT128
QT228
QT328

QT125
QT225
QT325

QT127
QT227
QT327

QT178
QT278
QT378

QT188
QT288
QT388

QT189
QT289
QT389

QT190
QT290
QT390

QT192
QT292
QT392

QT193
QT293
QT393

QT194
QT294
QT394

Package

Transistor Outline

(TO-5)

8 Pin

Dual In-Line

(DIP-14)

14 Pin

Dual In-Line

(DIP-14)

4 Pin

Dual In-Line

(DIP-14)

4 Pin

Flat Pack

(FP)

16 Pin

Flat Pack

(FP)

16 Pin Formed Lead

Flat Pack

(FP)

20 Pin

Flat Pack

(FP)

20 Pin Formed Lead

Surface Mount

(SMD)

4 Pin J-Lead

Surface Mount

(SMD)

4 Pin J-Lead

Surface Mount

(SMD)

4 Pin Thru-hole

Surface Mount

(SMD)

4 Pin Gull Wing

Surface Mount

(SMD)

4 Pin Formed Lead

Surface Mount

(SMD)

6 Pin Formed Lead

Surface Mount

(SMD)

6 Pin Gull Wing

Output

Logic

CMOS

TTL

CMOS

TTL

CMOS

TTL

CMOS

TTL

CMOS

TTL

LVDS

CMOS

TTL

LVDS

CMOS

TTL

LVDS

CMOS

TTL

LVDS

CMOS

TTL

CMOS

TTL

CMOS

TTL

CMOS

TTL

CMOS

TTL

CMOS

TTL

LVDS

CMOS

TTL

LVDS

Vdd (V)

3.3Vdc, 5.0Vdc 450kHz to 85MHz Pg 20

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

2.5Vdc, 3.3Vdc,

5.0Vdc

Frequency

Range

15kHz to 200MHz Pg 20

15kHz to 200MHz Pg 20

15kHz to 200MHz Pg 20

450kHz to 350MHz Pg 21

450kHz to 350MHz Pg 21

15kHz to 350MHz Pg 21

15kHz to 350MHz Pg 21

15kHz to 160MHz Pg 22

450kHz to 160 MHz Pg 22

450kHz to 160 MHz Pg 22

450kHz to 160 MHz Pg 22

450kHz to 160 MHz Pg 22

450kHz to 160 MHz Pg 22

450kHz to 160 MHz Pg 22

Outline

Pin

Connection

See

page

23

(*) Frequency stability vs. temperature codes may not be available in all frequencies

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: [phone] - Fax: [phone] - www.q-t ech.c o m

QPDS-0001, Rev L, June 2013 (ECO #10851)

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Q-TECH

COR PORATI ON

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

SCREENING OPTIONS SUMMARY

(Click on appropriate column to view screening details)

Screening

S

Modified

MIL-PRF-38534

Class K

See Details in

Test Description

Non Destructive Bond Pull (*)

Internal Visual

Stabilization Bake

Thermal Shock N/A

Temperature Cycling

Constant Acceleration

Particle Impact Noise Detection (PIND)

Pre Burn-In Electrical

Burn-In # 1

Interim Electrical

Burn-In # 2

Final Electrical

Table I

(Pages 7- 8)

✓ ✓

✓ ✓ ✓ ✓

✓ ✓ ✓ ✓

✓ ✓ ✓

✓ ✓ ✓

✓ ✓ ✓

✓ ✓ ✓

✓

(160 Hrs at +125ºC)✓(240 Hrs at +125ºC)✓(160 Hrs at +125ºC)

✓

✓

(160 Hrs at +125ºC)

✓ ✓ ✓ ✓

Screening

A

Modified

MIL-PRF-55310

Level S

See Details in

Table II

(Page 9-10)

✓

N/A N/A N/A

N/A N/A N/A

Screening

B

Modified

MIL-PRF-55310

Level B

See Details in

Table III

(Page 11)

N/A N/A

N/A N/A

Screening

E

Engineering

Model

See Details in

Table IV

(Page 12)

N/A

N/A

N/A

N/A

N/A

Percent Defective Allowance (PDA)

Seal Fine Leak

Seal Gross Leak

Radiographic Inspection

Frequency Aging 30 days

External Visual

✓ ✓ ✓

✓ ✓ ✓ ✓

✓ ✓ ✓ ✓

✓ ✓

✓

✓ ✓ ✓ ✓

100% Group B Tested (QCI Group B) N/A

N/A N/A

(*) Except on ceramic packages (see paragraph 4.2.1)

✓

Group A Inspection (QCI)

Group B Inspection (Aging)

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QPDS-0001, Rev L, June 2013 (ECO #10851)

See Details in

Table I-c

N/A

✓

MIL-PRF-55310

Level S

✓

MIL-PRF-55310

Level S

N/A N/A

N/A N/A

N/A

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CLASS B+ PRODUCTS

Q-TECH

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HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Screening - Option S (Modified MIL-PRF-38534, Class K)

(Example: QT178LD10S-50.000MHz)

Table I

Test Description

Non Destructive Bond Pull 883 2023 100%
Internal Visual 883 2017 Class H 100%
Stabilization Bake 883 1008 C 100% 48 hours at +150°C
Temperature Cycling 883 1010 C 100% 10 cycles
Constant Acceleration 883 2001 A 100% Y1 direction only (5,000g’s)

Particle Impact Noise Detection (PIND) 883 2020 B 100%

Pre Burn-In Electrical Refer to Table I-b and Detail Specification 100%

Burn-In # 1 883 1015

Interim Electrical Refer to Table I-b and Detail Specification 100%

Burn-In # 2 883 1015

Final Electrical Refer to Table I-a, I-b and Detail Specification 100%

Percent Defective Allowance (PDA) 38534

Seal Fine Leak 883 1014 A1 100%
Seal Gross Leak 883 1014 C 100%
Radiographic Inspection 883 2012 Class S 100%

Frequency Aging 30 days 55310

External Visual 883 2009 100%

MIL

Standard

Method Condition Qty Comments

Except on ceramic packages

5 passes minimum

(See Note 1)

+125°C

for 160 hours

+125°C

for 160 hours

Refer to table 1-a

below

+70°C±3°C

Refer to Table I-a

below

100% With load and nominal supply voltage

100% With load and nominal supply voltage

PDA=2% (Supply Current only)

±1.5ppm max. for F≤150MHz

±2ppm max. for >150MHz < F ≤ 200MHz

100%

±2.5ppm max. for F > 200MHz

(See Note 2)

NOTES:

1. PIND testing shall be performed using five (5) independent passes and all failures found at the end of each pass are rejected. The

survivors of the last pass are acceptable.

2. Normally frequency aging is up 30 days. However, aging may be ceased if value at 15 days is half than the limit of 30-day aging

value, or continued up to 90 days if value exeeds 30 day aging limit.

Table I-a
Delta Limits

Tests Parameters Symbol Delta Limits

Burn-In # 2 Supply current Icc ±10% of initial reading
Life Test after 1,000 hours at +125°C Supply current Icc (Life) ±10% of initial reading
Frequency Aging after 30 days at +70°C Output Frequency Fo Refer to detail spec.

Option S - Continue

Back To Summary

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Screening - Option S (Continued)

Table I-b
Electrical Test - Measurement Requirements

CLASS B+ PRODUCTS

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Parameters

Output Frequency
Frequency/Temperature Stability
Frequency/Voltage Stability
Input Current
Output Voltage
Waveform
Duty Cycle
Rise and Fall Times
Start-up Time
Tristate Function

Pre BI

at 25ºC

✓ ✓ ✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓ ✓

✓ ✓ ✓ ✓

Pre BI

Low Temp

Pre BI

High Temp

Interim BI

at 25ºC

Post BI
at 25ºC

Table I-c
Group A Inspection (100%)

Test Description Condition

Supply Current 25°C and temperature extremes

Initial Accuracy at Reference Temperature 25°C and temperature extremes

Frequency - Temperature Stability

Frequency - Voltage Tolerance

Output Voltages

Duty Cycle (output waveform symmetry)

Output Rse and Fall Times

Start-up Time

Tristate Function

Over specified operating temperature range, measure output

frequency at minimum ten equispaced points of the temperature extremes.

25°C and temperature extremes

Post BI

Low Temp

Post BI

High Temp

QCI Options (per MIL-PRF-55310, level S)

• Group C Inspection per MIL-PRF-55310, Level S (See details on Table VIII)

QCI (per MIL-PRF-38534, Class K-Modified) (To be specified on Purchase Order)

• Group B Inspection per MIL-PRF-38534, Class K-Modified (See details on Table V)

• Group C Inspection per MIL-PRF-38534, Class K-Modified (Delta Limits per Table I-a) (See details on Table VI)

• Group D Inspection per MIL-PRF-38534, Class K-Modified (See details on Table VII)

Option S - Back

Back To Summary

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Screening Option A (Modified MIL-PRF-55310, Level S)

Table II

Test Description

Non Destructive Bond Pull

Internal Visual

Stabilization Bake
Thermal Shock
Temperature Cycling
Constant Acceleration
Seal Fine and Gross Leak

Particle Impact Noise Detection (PIND)

Pre Burn-In Electrical

Burn-In

Final Electrical
Percent Defective Allowance (PDA)
Radiographic Inspection
External Visual

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

(Example: QT188HCD10A-40.000MHz)

MIL

Standard

883 2023

883

883 1008
883
883 1010
883 2001 A
883 1014 A1, C

883 2020

Refer to Table II-a and Detail Specification 100%

883 1015

Refer to Table II-a and Detail Specification

55310

883 2012
883 2009

Method

2017
2032

1011

Condition Qty

100%

Level B

C
A
B

B

+125°C

for 240 hours

minimum

Class S

100%

100% 48 hours at +150°C
100%
100%
100%
100%

100%

100%

100%

100%
100%

CLASS B+ PRODUCTS

2.5 to 5.0Vdc - 15kHz to 350MHz

Comments

Except on ceramic packages

See 4.4.2 of MIL-PRF-55310

10 cycles

Y1 direction only (5,000g’s)

5 passes minimum

(see Note 1)

With load and nominal supply voltage

PDA=2% (Supply Current only)

NOTES:

1. PIND testing shall be performed using five (5) independent passes and all failures found at the end of each pass are rejected. The

survivors of the last pass are acceptable.

2. 100% QCI Group A and Group B Inspections are performed. See table II-b

Table II-a
Electrical Test – Measurement Requirements

Parameters

Output Frequency
Frequency/Temperature Stability
Frequency/Voltage Stability
Input current
Output Voltage
Waveform
Duty cycle
Rise and Fall Times
Start-up Time
Tristate Function (if applicable)

Pre BI

at 25ºC

✓
✓
✓
✓
✓
✓
✓

✓
✓
✓

Pre BI

Low Temp

✓
✓

✓
✓
✓

Pre BI

High Temp

✓
✓

✓
✓
✓

Post BI
at 25ºC

✓
✓
✓
✓
✓
✓
✓

✓
✓
✓

Post BI

Low Temp

✓
✓

✓
✓
✓
✓

✓
✓
✓

Post BI

High Temp

✓
✓

✓
✓
✓
✓

✓
✓
✓

Option A - Continue

Back To Summary

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