The TDA8712 and TDF8712 are 8-bit digital-to-analog
converters (DACs) for video and other applications. They
convert the digital input signal into an analog voltage
output at a maximum conversion rate of 50 MHz. No
external reference voltage is required and all digital inputs
are TTL compatible.
REF1voltage reference (decoupling)
AGND2analog ground
D23data input; bit 2
D34data input; bit 3
CLK5clock input
DGND6digital ground
D77data input; bit 7 (MSB)
D68data input; bit 6
D59data input; bit 5
D410data input; bit 4
D111data input; bit 1
D012data input; bit 0 (LSB)
V
V
V
V
CCD
OUT
OUT
CCA
13digital supply voltage (+5 V)
14analog output voltage
15complimentary analog output voltage
16analog supply voltage (+5 V)
In accordance with the Absolute Maximum Rating System (IEC134).
SYMBOLPARAMETERMIN.MAX.UNIT
V
V
∆V
∆V
V
I
tot
T
T
T
CCA
CCD
CC
GND
I
stg
amb
j
analog supply voltage−0.3+7.0V
digital supply voltage−0.3+7.0V
supply voltage differences between V
ground voltage differences between V
input voltage (pins 3 to 5 and 7 to 12)−0.3V
total output current (I
OUT
+ I
; pins 14 and 15)−5+26mA
OUT
CCA
AGND
and V
and V
CCD
−0.5+0.5V
−0.1+0.1V
DGND
CCD
V
storage temperature−55+150°C
operating ambient temperature
TDA87120+70°C
TDF8712−40+85°C
junction temperature−+150°C
HANDLING
Inputs and outputs are protected against electrostatic discharges in normal handling. However, to be totally safe, it is
desirable to take normal precautions appropriate to handling integrated circuits.
THERMAL CHARACTERISTICS
SYMBOLPARAMETERVALUEUNIT
R
th j-a
thermal resistance from junction to ambient in free air
data set-up time−0.3−−ns
data hold time2.0−−ns
propagation delay time−−1.0ns
settling time 110% to 90% full-scale
= 50 MHz; notes 4 and 5; see Figs 3, 4 and 5)
clk
−1.11.5ns
change to ±1 LSB
t
S2
settling time 210% to 90% full-scale
−6.58.0ns
change to ±1 LSB
t
d
Output transients (glitches; f
E
g
input to 50% output delay time−3.05.0ns
= 50 MHz; note 6; see Fig.6)
clk
glitch energy from codetransition 127 to 128−−30LSB⋅ns
Notes
1. D0 to D7 are connected to V
2. The analog output voltages (V
between V
and each of these outputs is typically 75 Ω.
CCA
and CLK is connected to DGND.
CCD
OUT
and V
) are negative with respect to V
OUT
(see Table 1). The output resistance
CCA
3. The −3 dB analog output bandwidth is determined by real time analysis of the output transient at a maximum input
code transition (code 0 to 255).
4. The worst case characteristics are obtained at the transition from input code 0 to 255 and if an external load
impedance greater than 75 Ω is connected between V
measured with an active probe between V
and AGND. No further load impedance between V
OUT
OUT
or V
OUT
and V
. The specified values have been
CCA
and AGND has
OUT
been applied. All input data is latched at the rising edge of the clock. The output voltage remains stable (independent
of input data variations) during the HIGH level of the clock (CLK = HIGH). During a LOW-to-HIGH transition of the
clock (CLK = LOW), the DAC operates in the transparent mode (input data will be directly transferred to their
corresponding analog output voltages; see Fig.5.
5. The data set-up time (t
) is the minimum period preceding the rising edge of the clock that the input data must
SU;DAT
be stable in order to be correctly registered. A negative set-up time indicates that the data may be initiated after the
rising edge of the clock and still be recognized. The data hold time (t
) is the minimum period following the rising
HD;DAT
edge of the clock that the input data must be stable in order to be correctly registered. A negative hold time indicates
that the data may be released prior to the rising edge of the clock and still be recognized.
6. The definition of glitch energy and the measurement set-up are shown in Fig.6. The glitch energy is measured at the
input transition between code 127 and 128 and on the falling edge of the clock.
June 19948
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