Philips tda1314 DATASHEETS

Philips Semiconductors Product speciﬁcation

Quadruple ﬁlter DAC TDA1314T

FEATURES

• High dynamic range to enable digital DSP (Digital Signal Processor) volume control

APPLICATIONS

• Stand-alone quadruple low noise DAC

• Car radio DAC in conjunction with DSP.

• 18 bits data input format for each of the four channels

• Four times bit-serial oversampling filter

• 1st-order 4fas (audio sampling frequency) noise shaper

• Four very low noise DACs

• Only 1st-order analog post filtering required

• Smooth power-on of the DAC output currents

• Because of the automatic digital PLL divider range

setting the master clock is selectable in a wide 4f

integer range

GENERAL DESCRIPTION

The TDA1314T is a quadruple very low noise high dynamic range DAC which is intended for use in motor cars and is controlled by the car radio DSP. Each channel incorporates an 8th-order IIR up-sampling filter from 1ASF to 4ASF followed by a 1st-order noise shaper and DAC. The DAC currents are converted to audio voltage signals using operational amplifiers (one per channel).

• Insensitive to jitter on the I2S-bus signals with respect to the DAC total harmonic distortion deterioration.

QUICK REFERENCE DATA

= 2.5 and 5 V; T

ref

= 25 °C; all voltages referenced to ground; unless otherwise speciﬁed.

amb

SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT

DDA

DDD

O(DAC)

analog supply voltage 4.5 5.0 5.5 V digital supply voltage 4.5 5.0 5.5 V DAC output current (FS) R DAC output voltage,

= 20.5 kΩ ±0.4 ±0.5 ±0.6 mA

ref

RL≥ 5 kΩ; Rfb= 3 kΩ 1.0 − 4.0 V nominal DAC operational ampliﬁer output voltage

RES DAC resolution length of data input word − − 18 bits (THD + N)/S total harmonic distortion

plus noise-to-signal ratio

DR dynamic range of DAC fi= 1 kHz;

fi= 1 kHz;

0 dB signal level

− −66 −56 dB

92 96 − dB

−60 dB signal level DS digital silence no signal; A-weighted − −110 −100 dB P

tot

amb

total power dissipation − 85 − mW operating ambient

−40 +25 +85 °C

temperature

ORDERING INFORMATION

TYPE NUMBER

NAME DESCRIPTION VERSION

PACKAGE

TDA1314T SO28 plastic small outline package; 28 leads; body width 7.5 mm SOT136-1

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Philips Semiconductors Product speciﬁcation

handbook, full pagewidth

MBE001

20 20

20-bit

DATA WORD

LATCH

NOISE

SHAPER

15-bit

DATA WORD

LATCH

THERM.

DEC.

MSB

1 2 3 31 32

COARSE CURRENT SOURCES

ref

FINE

CURRENT

MATRIX

CURRENT

DIRECTION

SWITCH

out-f

out-c

DAC LATCH

out

DAC FL

4 f

UP-SAMPLE

FILTER

4 f

UP-SAMPLE

FILTER

4 f

UP-SAMPLE

FILTER

4 f

UP-SAMPLE

FILTER

NOISE

SHAPER

DAC

LATCH

DAC FR

NOISE

SHAPER

DAC

LATCH

DAC RL

NOISE

SHAPER

DAC

LATCH

DAC RR

181818

I S

INTERFACE

ORR

ORL

OFR

OFL

ref

16 15

OGND

229876

POWER-UP

DDA

DDO

DDD

AGNDDGND

TEST

INTERFACE

test

signals

UP-SAMPLE

CLOCK GENERATOR

SYNTHESIZER

DIVIDED BY 45 . . . 128

4 ASF GENERATOR

FASF DAC

UPSAMPLE

CLOCKS

MCLK

SELINPH

SCK

SDF

SDR

26425

AT/DT

SCOUT1

SCOUT2

CMT

TDA1314T

Fig.1 Block diagram.

Quadruple ﬁlter DAC TDA1314T

BLOCK DIAGRAM

August 1994 3

Philips Semiconductors Product speciﬁcation

Quadruple ﬁlter DAC TDA1314T

PINNING

SYMBOL PIN DESCRIPTION

TC 1 test control signal input (test/operational) AT/DT 2 analog test/digital test select input SELINPH 3 select in-phase 4fas mode/scan input signal 1 in test mode SCK 4 serial clock input; I2S-bus MCLK 5 master clock input; fi= N × 4fas (45 ≤ N ≤ 128) DGND 6 digital ground AGND 7 analog ground V

DDD

DDA

ORR

ORL

ref

OGND 15 operational ampliﬁer ground V

DDO

OFR

OFL

ref

POWER-UP 22 analog mute input for all DACs CMT 23 current mirror input test signal SDR 24 serial data input for rear DACs (I2S-bus); scan input signal 2 in test mode SDF 25 serial data input for front DACs (I2S-bus) WS 26 word select input (I2S-bus) SCOUT1 27 scan output signal 1 in test mode; 4fas signal SCOUT2 28 scan output signal 2 in test mode; PLL lock indicator

8 digital supply voltage

9 analog supply voltage 10 DAC output current; rear right 11 DAC output voltage; rear right 12 DAC output current; rear left 13 DAC output voltage; rear left 14 resistor reference input for DACs current

16 operational ampliﬁer supply 17 DAC output current; front right 18 DAC output voltage; front right 19 DAC output current; front left 20 DAC output voltage; front left 21 reference voltage input (1⁄2 operational ampliﬁer supply voltage)

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Philips Semiconductors Product speciﬁcation

Fig.2 Pin configuration.

Quadruple ﬁlter DAC TDA1314T

FUNCTIONAL DESCRIPTION I2S-bus interface

The word select input (pin 26) is connected to the word select line of the I2S-bus interface. This interface has a standard I2S-bus specification as described in the Philips

“I2S-bus specification”

9398 332 10011). Figure 4 shows an excerpt of the Philips I2S-bus specification interface report with respect to the general timing and format of the I2S-bus. WS logic 0 means left channel word, logic 1 means right channel word.

The serial clock input (pin 4) must be in accordance with the I2S-bus specification, i.e. a continuous clock.

Serial data front (SDF, pin 25) and serial data rear (SDR, pin 24) are the I2S-bus serial data lines to be processed in the DACs for the loudspeakers of the car (see Fig.2, blocks DACFL and DACFR for the front loudspeakers and blocks DACRL and DACRR for the right loudspeakers). FL stands for Front Left, FR for Front Right, RL for Rear Left and RR for Rear Right. In order to utilize the capabilities of this IC fully, the data word length should be 18 bits. Signals derived from this block are 4 × 18-bit parallel data words which are applied to the 4fs up-sample filters.

(ordering number

August 1994 5

4ASF generator

YNTHESIZER

S SELINPH (pin 3) and WS (pin 26) are the data inputs for

this block which generates the FASFDAC, this being the 4fas signal (at 4 times the audio sample frequency), which is used to latch the data words to the DACs and as a reference to the clock generator block for the up-sample filters. It consists of a digital PLL operating at the master clock signal MCLK (pin 5). In normal mode (i.e. in the event that the MCLK signal on pin 5 is a jitter free clock, with a frequency of integer multiples between 45 and 128, of 4 times the frequency of the WS signal) this block is able to generate a jitter free FASFDAC signal for optimum performance of the DAC. This mode is called the free running mode.

If, in some applications, there is considerable jitter on the MCLK while WS is more stable (less jitter), the phase-locked mode should be selected. This mode is normally not used and is not recommended.

Philips Semiconductors Product speciﬁcation

Quadruple ﬁlter DAC TDA1314T

UP-SAMPLE GENERATOR This block generates the clocks for the up-sample

filters.The external pinning of the 4fas generator block is:

• MCLK (see Fig.4), which is a jitter free (maximum 30 ns jitter) external clock at any multiple integer from 45 to 128 times 4fas (4 times the frequency of WS) of the I2S-bus input, thus for a sample frequency of 38 kHz this clock frequency will range from 6.840 MHz to

19.456 MHz in multiples of 152 kHz.

• The select in-phase (SELINPH) or free running mode of the synthesizer 45 to 128. In the normal application the free-running mode is used and this pin is not connected (this pin is pulled down by an internal resistor). The phase-locked mode can be selected by hard-wiring this pin to V

(pin 8). However, this mode is

DDD

not recommended.

Test interface

This block controls the circuit in the test mode, which can be either an analog or digital test mode. Test pins TC (pin 1), AT/DT (pin 2), CMT (pin 23), SCOUT1 (pin 27) and SCOUT2 (pin 28) are not connected in Fig.6.

Up-sample ﬁlter and noise shaper

The signal flow applied to the up-sample filter and noise shaper blocks is the 4 × 18-bit parallel data words in two's complement format from the I

S-bus interface at the audio sampling frequency. The signal flow from these blocks is the 4 × 15-bit parallel data words in two's complement format at a frequency of 4fas. Each of the four digital filters is a four times up-sampling filter. This up-sampling filter is an elliptic filter of 8th order.

The filters produce an attenuation of 29 dB (min) for signals outside the audio band. The noise shaper operates at 4fas and reduces the word length from 22 bits to 15 bits which is the word length of the DAC.

DAC input signals

The following signals are input to the DAC blocks FL, FR, RL and RR:

• DATA WORD (bits 10 to 14). These 5 bits are used to control, via a thermometer decoder, the current of the 32 coarse current sources of the analog DAC part. The value of this data word determines the total coarse current flowing to the DAC current output. The value of the current of each coarse current source is determined by the following:

; this is the current reference input at pin 14 and is at

ref

the same voltage level as V

. A resistor connected to

ref

OGND results in a current. This being the reference current of the coarse current sources and subsequently of the DAC in total.

• DATA WORD (bits 1 to 9). A current from one of the coarse current sources is fed into a 512 transistor matrix. The value of the DATA WORD (bits 1 to 9) determines which part of one coarse current flows to the DAC current output.

• DATA WORD (bit 15). This data word MSB controls the direction of the flow of the DAC output current by switching the current direction switch.

• V

. Voltage reference pin internally connected to a

ref

resistor divider to obtain half of the power supply voltage. This voltage is buffered and used as reference voltage input for the operational amplifiers and as a reference voltage in the DAC.

• POWER-UP. The analog signal on this pin controls the current biasing circuit of the DACs. This pin is connected internally via a high value resistor to V

. Together with

DDA

an external capacitor a soft switch-on of the DAC output currents is obtained. This pin can also be used as the analog mute input for all DAC output currents by pulling it to ground.

August 1994 6

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