Philips TDA1311A-N2 Datasheet

DATA SH EET
Preliminary specification Supersedes data of July 1993 File under Integrated Circuits, IC01
1995 Dec 18
INTEGRATED CIRCUITS
TDA1311A
1995 Dec 18 2
Philips Semiconductors Preliminary specification
Stereo Continuous Calibration DAC (CC-DAC)
TDA1311A
FEATURES
Voltage output
Space saving packages SO8 or DIP8
Low power consumption
Wide dynamic range (16-bit resolution)
Continuous Calibration (CC) concept
Easy application:
– single 4 to 5.5 V rail supply – output current and bias current are proportional to the
supply voltage
– integrated current-to-voltage converter
Fast settling time permits 2, 4 and 8 × oversampling (serial input) or double-speed operation at 4 × oversampling
Internal bias current ensures maximum dynamic range
Wide operating temperature range (40 °C to +85 °C)
Compatible with most current Japanese input formats:
time multiplexed, two's complement, TTL
No zero-crossing distortion
Cost efficient.
GENERAL DESCRIPTION
The TDA1311A; AT is a voltage-driven digital-to-analog converter and is new generation of DAC devices which embodies the innovative technique of Continuous Calibration (CC). The largest bit-currents are repeatedly generated by one single current reference source. This duplication is based upon an internal charge storage principle which has an accuracy insensitive to ageing, temperature matching and process variations.
The TDA1311A; AT is fabricated in a 1.0 µm CMOS process and features an extremely low-power dissipation, small package size and easy application. Furthermore, the accuracy of the intrinsic high coarse-current combined with the implemented symmetrical offset decoding method preclude zero-crossing distortion and ensures high quality audio reproduction. Therefore, the CC-DAC is eminently suitable for use in (portable) digital audio equipment.
ORDERING INFORMATION
TYPE
NUMBER
PACKAGE
NAME DESCRIPTION VERSION
TDA1311A DIP8 plastic dual in-line package; 8 leads (300 mil) SOT97-1 TDA1311AT SO8 plastic small outline package; 8 leads; body width 3.9 mm SOT96-1
1995 Dec 18 3
Philips Semiconductors Preliminary specification
Stereo Continuous Calibration DAC (CC-DAC)
TDA1311A
QUICK REFERENCE DATA
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
DD
supply voltage 4 5 5.5 V
I
DD
supply current VDD= 5 V at code 0000H 3.4 6.0 mA
V
FS
full scale output voltage VDD= 5 V 1.8 2.0 2.2 V
(THD+N)/S total harmonic distortion
plus noise
at 0 dB signal level −−68 63 dB
0.04 0.07 %
at 60 dB signal level −−30 24 dB
36%
at 60 dB signal level; A-weighted
−−33 dB
2 %
S/N signal-to-noise ratio at
bipolar zero
A-weighted at code 0000H 86 92 dB
t
cs
current settling time to ±1 LSB
0.2 −µs
BR input bit rate at data input −− 18.4 Mbits/s f
BCK
clock frequency at clock input
−− 18.4 MHz
TC
FS
full scale temperature coefficient at analog outputs (IOL; IOR)
−±400 ppm
T
amb
operating ambient temperature
40 +85 °C
P
tot
total power dissipation VDD= 5 V at code 0000H 17 30 mW
1995 Dec 18 4
Philips Semiconductors Preliminary specification
Stereo Continuous Calibration DAC (CC-DAC)
TDA1311A
BLOCK DIAGRAM
Fig.1 Block diagram.
handbook, full pagewidth
MBG858
32 (5-BIT)
CALIBRATED
CURRENT SOURCES
1 CALIBRATED
SPARE SOURCE
11-BIT
PASSIVE
DIVIDER
LEFT BIT SWITCHES
6
I/V
LEFT INPUT REGISTER
LEFT OUTPUT REGISTER
RIGHT BIT SWITCHES
RIGHT INPUT REGISTER
RIGHT OUTPUT REGISTER
8
I/V
32 (5-BIT)
CALIBRATED
CURRENT SOURCES
1 CALIBRATED
SPARE SOURCE
11-BIT
PASSIVE
DIVIDER
REFERENCE
SOURCE
CONTROL
AND TIMING
1 2 3
5
4
C2 100 nF
V
DD
V
OR
I
OR
GND
TDA1311A
TDA1311AT
V
OL
BCK
WS
DATA
I
OL
PINNING
SYMBOL PIN DESCRIPTION
BCK 1 bit clock input WS 2 word select input DATA 3 data input GND 4 ground V
DD
5 supply voltage
V
OL
6 left channel output
n.c.
7
not connected
V
OR
8 right channel output
Fig.2 Pin configuration.
handbook, halfpage
1 2 3 4
8 7 6 5
MBG859
TDA1311A
TDA1311AT
BCK
WS
DATA
GND
V
DD
V
OL
V
OR
n.c.
1995 Dec 18 5
Philips Semiconductors Preliminary specification
Stereo Continuous Calibration DAC (CC-DAC)
TDA1311A
FUNCTIONAL DESCRIPTION
The basic operation of the continuous calibration DAC is illustrated in Fig.3. The figure shows the calibration and operation cycle. During calibration of the MOS current source (see Fig.3a) transistor M1 is connected as a diode by applying a reference current. The voltage Vgs on the intrinsic gate-source capacitance Cgs of M1 is then determined by the transistor characteristics. After calibration of the drain current to the reference value I
REF
, the switch S1 is opened and S2 is switched to the other position (see Fig.3b). The gate-to-source voltage V
gs
of M1 is not changed because the charge on Cgs is preserved. Therefore, the drain current of M1 will still be equal to I
REF
and this exact duplicate of I
REF
is now
available at the OUT terminal. The 32 current sources and the spare current source of the
TDA1311A; AT are continuously calibrated (see Fig.1). The spare current source is included to allow continuous converter operation. The output of one calibrated source is connected to an 11-bit binary current divider consisting of 2048 transistors.
A symmetrical offset decoding principle is incorporated that arranges the bit switching in such a way that the zero-crossing is performed only by switching the LSB currents.
The TDA1311A; AT (CC-DAC) accepts serial input data formats of 16-bit word length. Left and right data words are time multiplexed. The most significant bit (bit 1) must always be first. The input data format is shown in Figs 4 and 5.
With a HIGH level on the word select input (WS), data is placed in the left input register and with a LOW level on the WS input, data is placed in the right input register (see Fig.1). The data in the input registers are simultaneously latched in the output registers which control the bit switches.
An internal offset voltage V
OS
is added to the full scale output voltage VFS; VOS and VFS are proportional to VDD: V
DD1/VDD2=VFS1/VFS2=VOS1/VOS2
.
Fig.3 Calibration principle.
handbook, full pagewidth
MBG860
out
S2
S1
M1
C
gs
V
gs
C
gs
V
gs
out
S2
S1
M1
I
ref
I
ref
I
ref
(a) (b)
(a) =calibration. (b) =operation.
1995 Dec 18 6
Philips Semiconductors Preliminary specification
Stereo Continuous Calibration DAC (CC-DAC)
TDA1311A
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
Note
1. Human body model: C = 100 pF, R = 1500 , 3 pulses positive and 3 pulses negative.
2. Machine model: C = 200 pF, L = 0.5 µH, R = 10 , 3 pulses positive and 3 pulses negative.
THERMAL RESISTANCE
QUALITY SPECIFICATION
In accordance with SNW-FQ-0611.
CHARACTERISTICS
V
DD
=5V; T
amb
=25°C; measured in Fig.1; unless otherwise specified.
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
DD
supply voltage 6.0 V
T
stg
storage temperature 55 +150 °C
T
XTAL
maximum crystal temperature +150 °C
T
amb
operating ambient temperature 40 +85 °C
V
es
electrostatic handling note 1 2000 +2000 V
note 2 200 +200 V
SYMBOL PARAMETER VALUE UNIT
R
th j-a
thermal resistance from junction to ambient in free air
DIL8 100 K/W SO8 210 K/W
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
Supply
V
DD
supply voltage 4.0 5.0 5.5 V
I
DD
supply current at code 0000H 3.4 6.0 mA
Digital inputs; pins WS, BCK and DATA
|I
IL
| input leakage current LOW VI= 0.8 V −− 10 µA
|I
IH
| input leakage current HIGH VI= 2.4 V −− 10 µA
f
BCK
clock frequency −− 18.4 MHz BR bit rate data input −− 18.4 Mbits/s f
WS
word select input frequency −− 384 kHz
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