PMV45EN
μTrenchMOS™ enhanced logic level FET
Rev. 01 — 15 January 2003 |
Product data |
M3D088
1.Product profile
1.1Description
N-channel enhancement mode field-effect transistor in a plastic package using
TrenchMOS™ technology.
Product availability:
PMV45EN in SOT23.
1.2 |
Features |
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■ Surface mount package |
■ Fast switching. |
1.3 |
Applications |
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■ Battery management |
■ High speed switch. |
1.4 |
Quick reference data |
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■ VDS ≤ 30 V |
■ ID ≤ 5.4 A |
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■ Ptot ≤ 2 W |
■ RDSon ≤ 42 mΩ |
Table 1: |
Pinning - SOT23 simplified outline and symbol |
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Pin |
Description |
Simplified outline |
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Symbol |
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1 |
gate (g) |
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3 |
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d |
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source (s) |
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3 |
drain (d) |
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g |
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1 |
2 |
MBB076 |
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s |
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Top view |
MSB003 |
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SOT23 |
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Philips Semiconductors |
PMV45EN |
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μTrenchMOS™ enhanced logic level FET |
Table 2: Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol |
Parameter |
Conditions |
Min |
Max |
Unit |
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VDS |
drain-source voltage (DC) |
25 °C ≤ Tj ≤ 150 °C |
- |
30 |
V |
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VDGR |
drain-gate voltage (DC) |
25 °C ≤ Tj ≤ 150 °C; RGS = 20 kΩ |
- |
30 |
V |
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VGS |
gate-source voltage (DC) |
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- |
±20 |
V |
ID |
drain current (DC) |
Tsp = 25 °C; VGS = 10 V; Figure 2 and 3 |
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5.4 |
A |
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Tsp = 100 °C; VGS = 10 V; Figure 2 |
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3.4 |
A |
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IDM |
peak drain current |
Tsp = 25 |
°C; pulsed; tp ≤ 10 μs; Figure 3 |
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21.6 |
A |
Ptot |
total power dissipation |
Tsp = 25 |
°C; Figure 1 |
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2 |
W |
Tstg |
storage temperature |
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−55 |
+150 |
°C |
Tj |
junction temperature |
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−55 |
+150 |
°C |
Source-drain diode |
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IS |
source (diode forward) current (DC) |
Tsp = 25 |
°C |
- |
1.7 |
A |
ISM |
peak source (diode forward) current |
Tsp = 25 |
°C; pulsed; tp ≤ 10 μs |
- |
6.9 |
A |
9397 750 10894 |
© Koninklijke Philips Electronics N.V. 2003. All rights reserved. |
Product data |
Rev. 01 — 15 January 2003 |
2 of 12 |
Philips Semiconductors |
PMV45EN |
|
μTrenchMOS™ enhanced logic level FET |
120 |
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03aa17 |
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Pder |
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(%) |
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80 |
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40 |
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0 |
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0 |
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50 |
100 |
150 |
200 |
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Tsp (°C) |
P |
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= |
Ptot |
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× 100% |
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der |
---------------------- |
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P |
°C ) |
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tot (25 |
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Fig 1. Normalized total power dissipation as a function of solder point temperature.
120 |
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03aa25 |
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Ider |
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(%) |
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80 |
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40 |
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0 |
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0 |
50 |
100 |
150 |
200 |
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Tsp (°C) |
I der |
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I D |
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= ------------------- × 100% |
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I D(25°C ) |
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Fig 2. Normalized continuous drain current as a function of solder point temperature.
102 |
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03al02 |
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ID |
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(A) |
Limit RDSon = VDS/ID |
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10 |
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tp = 10 μ s |
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100 μ s |
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1 |
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1 ms |
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DC |
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10 ms |
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10-1 |
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100 ms |
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10-2 |
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10-1 |
1 |
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10 |
VDS |
(V) |
102 |
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Tsp = 25 °C; IDM is single pulse; VGS = 10 V
Fig 3. Safe operating area; continuous and peak drain currents as a function of drain-source voltage.
9397 750 10894 |
© Koninklijke Philips Electronics N.V. 2003. All rights reserved. |
Product data |
Rev. 01 — 15 January 2003 |
3 of 12 |
Philips Semiconductors |
|
PMV45EN |
||||
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μTrenchMOS™ enhanced logic level FET |
|||
4. Thermal characteristics |
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Table 3: |
Thermal characteristics |
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Symbol |
Parameter |
Conditions |
Min |
Typ |
Max |
Unit |
Rth(j-sp) |
thermal resistance from junction to solder point |
Figure 4 |
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60 |
K/W |
102 |
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03ak68 |
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Zth(j-sp) |
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(K/W) |
δ = 0.5 |
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0.2 |
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10 |
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0.1 |
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0.05 |
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P |
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tp |
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δ = T |
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0.02 |
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single pulse |
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tp |
T |
t |
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1 |
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10-4 |
10-3 |
10-2 |
10-1 |
1 |
tp (s) |
10 |
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Fig 4. Transient thermal impedance from junction to solder point as a function of pulse duration.
9397 750 10894 |
© Koninklijke Philips Electronics N.V. 2003. All rights reserved. |
Product data |
Rev. 01 — 15 January 2003 |
4 of 12 |