Philips PCF1252-XP Technical data

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PCF1252-X family
Threshold detector and reset generator
Product specification Supersedes data of 1996 Jan 23 File under Integrated Circuits, IC11
1998 Apr 16
Philips Semiconductors Product specification
Threshold detector and reset generator PCF1252-X family
FEATURES
Very low current consumption, typically 10 µA
10 factory programmed threshold voltages available
covering trip voltages from 4.75 to 2.55 V
•±50 mV trip point accuracy over full temperature range
Variable RESET delay
RESET pulse polarity selection
Defined outputs at 0.6 V (typ.)
Comparator for second level detection
(e.g. overvoltage detection)
Advance warning of power fail
Operating temperature range 40 to +85 °C.
ORDERING INFORMATION
TYPE NUMBER
NAME DESCRIPTION VERSION
PCF1252-XP PCF1252-XT
(1) (1)
DIP8 plastic dual in-line package; 8 leads (300 mil) SOT97-1
SO8 plastic small outline package; 8 leads; body width 3.9 mm SOT96-1
Note
1. X = 0 to 9; depending on threshold voltage.
GENERAL DESCRIPTION
The PCF1252-Xs are low-power CMOS voltage threshold detectors designed especially for supervision of microcontroller/microprocessor systems for detection of power-on/off conditions and generation of a system reset pulse. The PCF1252-X also provides a POWF (power fail) output which is activated at a precise factory-programmed trip point. A system RESET output has a built-in delay with duration determined by an external capacitor (CCT).
A second comparator (comparator 2) has been included to enable the possibility of a second monitoring point in the system.
PACKAGE
BLOCK DIAGRAM
handbook, full pagewidth
V
COMIN
DD
83
42
V
SS
comparator 2
+
comparator 1
+
1.30 V
PCF1252-X
DELAY
1
CT SELECT
MGC915
5
COMOUT
7
POWF
6
RESET
Fig.1 Block diagram.
1998 Apr 16 2
Philips Semiconductors Product specification
Threshold detector and reset generator PCF1252-X family
PINNING
SYMBOL PIN DESCRIPTION
CT 1 connection for the external capacitor SELECT 2 select polarity or external reset input COMIN 3 comparator input V
SS
4 ground (0 V) COMOUT 5 comparator output RESET 6 reset output POWF 7 power failure signal output V
DD
8 supply voltage
handbook, halfpage
1
CT
SELECT
COMIN
2
PCF1252-X
3 4
V
SS
Fig.2 Pinning diagram.
MGC916
V
8
POWF
7
RESET
6
COMOUT
5
DD
FUNCTIONAL DESCRIPTION (see Fig.1) The PCF1252-X contains:
A precise factory-programmed voltage reference
Two comparators
A delay circuit.
The PCF1252-X family is comprised of 10 versions with different factory-programmed voltage trip-points (V
TRIP
see Chapter “Characteristics”.
Supply
The supply voltage (V
) is internally divided before being
DD
compared, via comparator 1, with the internal reference voltage.
POWF (see Fig.3) The POWF output is:
LOW, if VDD is below V
HIGH, if VDD is above V
TRIP
TRIP
.
Power-on reset (SELECT = LOW)
As V
rises past V
DD
, a positive reset pulse is generated
TRIP
at RESET. The duration of the reset pulse (tR) is determined by the value of the external capacitor (CCT; maximum 1 µF, see Fig.8) connected to CT. With no external capacitor connected, CCT assumes a minimum value of 100 pF. If SELECT is HIGH, the reset pulse is inverted.
Voltage trip-point
By selecting the voltage trip-point slightly higher than the minimum operating voltage of the microcontroller/microprocessor, there is sufficient time for data storage before the power actually fails.
In order to prevent oscillations around the voltage trip-point, a small hysteresis has been included, resulting
),
in a power-on switching point that is higher than the voltage trip-point (minimum of 15 mV). The voltage trip-point refers to the value at which power-off is signalled.
COMIN
Input to the second comparator (comparator 2). When used in conjunction with an external voltage divider, this allows a second point in the system to be monitored. This input has no built-in hysteresis. When not in use connect to V
. COMOUT will be LOW or HIGH
DD
depending on the voltage at COMIN:
COMOUT = HIGH, if voltage at COMIN is above the switch point VSP (typically 1.30 V).
COMOUT = LOW, if voltage at COMIN is below the switch point VSP (typically 1.30 V).
Power failure
During a power-off condition (V
DD<VTRIP
), POWF goes LOW. After a time delay (tS), also determined by CCT, RESET goes HIGH. Any POWF assertion (VDD<V
TRIP
)
will result in a subsequent RESET pulse.
1998 Apr 16 3
Philips Semiconductors Product specification
Threshold detector and reset generator PCF1252-X family
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
DD
V
I
I
I
I
O
P
tot
T
stg
T
amb
HANDLING
Inputs and outputs are protected against electrostatic discharge in normal handling. However, to be totally safe, it is desirable to take normal handling precautions appropriate to handling MOS devices (see
supply voltage 0.5 +7.0 V input voltage 0.5 VDD+ 0.5 V DC clamp-diode current all pins: VI< 0.5 V
20 mA
or VI>VDD+ 0.5 V output current 20 mA total power dissipation 150 mW storage temperature 65 +100 °C operating ambient temperature 40 +85 °C
“Handling MOS Devices”
).
CHARACTERISTICS
= 2.4 to 6.0 V; VSS=0V; T
V
DD
= 40 to +85 °C; (see Fig.3); unless otherwise specified.
amb
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V V
DD TRIP
supply voltage 2.4 6.0 V Voltage trip-point: T
=25°C; note 1
amb
PCF1252-0 4.70 4.75 4.80 V PCF1252-1 4.50 4.55 4.60 V PCF1252-2 4.20 4.25 4.30 V PCF1252-3 4.00 4.05 4.10 V PCF1252-4 3.70 3.75 3.80 V PCF1252-5 3.50 3.55 3.60 V PCF1252-6 3.20 3.25 3.30 V PCF1252-7 3.00 3.05 3.10 V PCF1252-8 2.70 2.75 2.80 V PCF1252-9 2.50 2.55 2.60 V
I
DD
supply current T
=25°C;
amb
VDD=V
TRIP
10 15 µA
+ 0.5 V; COMIN = VDD; see Figs. 4 and 5
V
TRIP
voltage trip-point temperature
note 2 −±100 × 10−6±400 × 10−6mV/K
coefficient
V
hys
voltage trip-point hysteresis 15 30 50 mV
1998 Apr 16 4
Philips Semiconductors Product specification
Threshold detector and reset generator PCF1252-X family
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
COMIN
V V
SP
SP
COMIN switch point T COMIN switch point temperature
coefficient
SELECT
V
IL
V
IH
LOW level input voltage −− 0.3V HIGH level input voltage 0.7V
SELECT and COMIN
I
LI
I
LI
LOW level leakage input current −− 1.0 µA HIGH level leakage input current −− 1.0 µA
POWF, RESET and COMOUT
I
O
I
O
t
R
t
S
t
R/tS
C
int
output sink current VO= 0.4 V;
output source current VO= 2.0 V;
reset time CCT= 1 nF; note 3 400 1000 2000 µs save time CCT= 1 nF; note 3 40 100 200 µs reset to save time ratio 10 CT internal capacitance 100 pF
Notes
1. Long time stability of COMIN switch point VSP and voltage trip point V at V drift for V
and an average operating temperature of 55 °C the drift of VSP will not exceed ±10 mV. The maximum
DD(max)
will not exceed (±V
TRIP
TRIP(typ)/VSP(typ)
2. Values given per degree Kelvin; tested on a sample basis.
3. Conformance to these specifications is only guaranteed if the slew rate of VDD is less than 25 V/ms.
=25°C; note 1 1.28 1.30 1.32 V
amb
note 2 −±0.1 ±0.5 mV/K
DD
−−V
DD
V
13 mA VDD= 2.4 V; see Fig.6
0.75 2 mA VDD= 2.4 V; see Fig.7
: within 10 years of continuous operation
TRIP
) 10 mV.
1998 Apr 16 5
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