INTEGRATED CIRCUITS
74F269
8-bit bidirectional binary counter
Product specification 1996 Jan 05
IC15 Data Handbook
Philips Semiconductors Product specification
74F2698–bit bidirectional binary counter
FEA TURES
•Synchronous counting and loading
•Built-in look-ahead carry capability
•Count frequency 115MHz typ
•Supply current 95mA typ
DESCRIPTION
The 74F269 is a fully synchronous 8-stage Up/Down Counter
featuring a preset capability for programmable operation, carry
look-ahead for easy cascading and a U/D
direction of counting. All state changes, whether in counting or
parallel loading, are initiated by the rising edge of the clock.
TYPE
TYPICAL f
MAX
74F269 115MHz 95mA
input to control the
TYPICAL
SUPPLY CURRENT
(TOTAL)
PIN CONFIGURATION
1U/D
2
Q0
3
Q1
4
Q2
5
Q3
6
Q4
7
GND
8
Q5
9
Q6
10
Q7
11
CP
CEP CET
24
PE
23
P0
22
P1
21
P2
20
P3
19
V
18
P4
17
P5
16
P6
15
P7
TC
14
1312
SF00834
ORDERING INFORMA TION
DESCRIPTION
24-Pin Plastic Slim DIP (300mil) N74F269N SOT222-1
24-Pin Plastic SOL N74F269D SOT137-1
24-Pin Plastic SSOP type II N74F269DB SOT340-1
COMMERCIAL RANGE
VCC = 5V ±10%, T
= 0°C to +70°C
amb
CC
PKG DWG #
INPUT AND OUTPUT LOADING AND FAN-OUT TABLE
PINS DESCRIPTION
74F(U.L.)
HIGH/LOW
P0 - P7 Parallel Data inputs 1.0/1.0 20µA/0.6mA
PE Parallel Enable input (active Low) 1.0/1.0 20µA/0.6mA
U/D Up/Down count control input 1.0/1.0 20µA/0.6mA
CEP Count Enable Parallel input (active Low) 1.0/1.0 20µA/0.6mA
CET Count Enable Trickle input (active Low) 1.0/1.0 20µA/0.6mA
CP Clock input 1.0/1.0 20µA/0.6mA
TC Terminal Count output (active Low) 50/33 1.0mA/20mA
Q0 - Q7 Flip-flop outputs 50/33 1.0mA/20mA
NOTE:
One (1.0) FAST Unit Load is defined as: 20µA in the High state and 0.6mA in the Low state.
LOAD VALUE
HIGH/LOW
1996 Jan 05 853–0056 16186
2
Philips Semiconductors Product specification
74F2698–bit bidirectional binary counter
LOGIC SYMBOL
23 22 21 20 18 17 16 15
P0 P1 P2 P3 P4 P5 P6 P7
24
PE
1
U/D
12
CEP
13
CET
11
CP
Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7
=Pin 19
V
CC
GND=Pin 7
APPLICATION
CP
U/D
PE
TC
234568910
SF00835
LOGIC SYMBOL (IEEE/IEC)
24
1
12
13
11
23
14
22
21
20
18
17
16
15
CTR DIV 256
M1[LOAD]
M2[COUNT]
M3[UP]
M4[DOWN]
&
G5
EN6
2, 3, 5, 6 +/C7
2, 4, 5, 6–
[1]
1, 7D
[2]
[4]
[8]
[16]
[32]
[64]
[128]
3, 5, 6 CT=256
4, 5, 8 CT=0
2
3
4
5
6
8
9
10
14
SF00836
P0 P1 P2 P3 P4 P5 P6
PE
U/D
CP
CEP
CET
Q0Q1 Q2 Q3 Q4 Q5 Q6 Q7
P7
TC
P0 P1 P2 P3 P4 P5 P6 P7
PE
U/D
CP
CEP
CET
Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7
TC
P0 P1 P2 P3 P4 P5 P6 P7
PE
U/D
CP
CEP
CET
Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7
TC
Figure 1. Synchronous Multistage Counting Scheme
MODE SELECT FUNCTION TABLE
INPUTS OUTPUTS
CP U/D CEP CET PE P
↑
↑
↑
↑
↑
↑
X X X l l L (a)
X X X l h H (a)
h l l h X Count Up (a) Count Up
l l l h X Count Down (a) Count Down
X h l h X q
X X h h X q
n
H = High voltage level
h = High voltage level one setup prior to the Low-to-High clock transition
L = Low voltage level
l = Low voltage level one setup time prior to the Low-to-High clock transition
q = Lower case letters indicate the state of the referenced output prior to the Low-to-High clock transition
X = Don’t care
↑ = Low-to-High clock transition
(a)= TC
is Low when CET is Low and the counter is at Terminal Count. Terminal Count Up is with all Qn outputs High and Terminal Count
Down is with all Qn outputs Low.
Q
n
n
n
TC
(a)
H
P0 P1 P2 P3 P4 P5 P6 P7
PE
U/D
CP
CEP
CET
Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7
Most significant 8-bit counterLeast significant 8-bit counter
TC
SF00851
1996 Jan 05
3
Philips Semiconductors Product specification
74F2698–bit bidirectional binary counter
LOGIC DIAGRAM
2
23
P0
P1
P2
P3
P4
DETAIL A
22
DETAIL A
21
DETAIL A
20
DETAIL A
18
DETAIL A
Q0
3
Q1
4
Q2
5
Q3
6
Q4
8
17
P5
P6
P7
PE
CP
U/D
CEP
CET
Pn
DETAIL A
16
DETAIL A
15
DETAIL A
24
11
1
12
13
TOGGLE
DETAIL A
Q
D
QCP
Q5
9
Q6
10
Q7
14
TC
V
=Pin 19
CC
GND=Pin 7
1996 Jan 05
PE CP
SF00837
4
Philips Semiconductors Product specification
VOHHigh-level output voltage
VOLLow-level output voltage
ICCSupply current (total)
74F2698–bit bidirectional binary counter
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
V
V
I
IN
V
I
OUT
T
T
CC
IN
OUT
amb
stg
Supply voltage –0.5 to +7.0 V
Input voltage –0.5 to +7.0 V
Input current –30 to +5 mA
Voltage applied to output in High output state –0.5 to V
Current applied to output in Low output state 40 mA
Operating free-air temperature range 0 to +70 °C
Storage temperature –65 to +150 °C
RECOMMENDED OPERATING CONDITIONS
V
V
V
I
I
I
T
CC
IH
IL
IK
OH
OL
amb
Supply voltage 4.5 5.0 5.5 V
High-level input voltage 2.0 V
Low-level input voltage 0.8 V
Input clamp current –18 mA
High-level output current –1 mA
Low-level output current 20 mA
Operating free-air temperature range 0 70 °C
PARAMETER RATING UNIT
CC
V
LIMITS
MIN NOM MAX
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL PARAMETER TEST CONDITIONS
V
IK
I
I
I
IH
I
IL
I
OS
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
1996 Jan 05
LIMITS
UNIT
p
p
VCC = MIN, VIL = MAX ±10%V
VIH = MIN, IOH = MAX ±5%V
VCC = MIN, VIL = MAX ±10%V
VIH = MIN, IOL = MAX ±5%V
Input clamp voltage VCC = MIN, II = I
MIN
CC
CC
CC
CC
IK
2.5
2.7 3.4
TYP
NO TAG
MAX
0.30 0.50
0.30 0.50
–0.73 –1.2 V
Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA
High-level input current VCC = MAX, VI = 2.7V 20 µA
Low-level input current VCC = MAX, VI = 0.5V –0.6 mA
Short-circuit output current
pp
= 5V, T
CC
NO TAG
= 25°C.
amb
tests should be performed last.
OS
VCC = MAX –60 –150 mA
I
CCH
VCC =
MAX
I
CCL
PE=CET=CEP=U/D=GND,
Pn=4.5V, CP=↑
PE=CET=CEP=U/D=GND,
Pn=GND, CP=↑
, the use of high-speed test apparatus and/or sample-and-hold
OS
93 120 mA
98 125 mA
5