Philips N74F260D, N74F260N Datasheet
INTEGRATED CIRCUITS
74F260
Dual 5-input NOR gate
Product specification
IC15 Data Handbook
1988 Nov 29
Philips Semiconductors Product specification
74F260Dual 5-input NOR gate
PIN CONFIGURATION
D0a
1
D0b
2
D0c
3
D1e
4
Q0
5
1
Q
6
GND
14
V
Doe
13
D0d
12
D1d
11
D1c
10
D1b
9
D1a
87
SF00829
CC
TYPE
TYPICAL
PROPAGATION
DELA Y
TYPICAL
SUPPLY CURRENT
(TOTAL)
74F260 3.5ns 6mA
ORDERING INFORMATION
COMMERCIAL RANGE
DESCRIPTION
14-pin plastic DIP N74F260N SOT27-1
14-pin plastic SO N74F260D SOT108-1
VCC = 5V ±10%,
T
= 0°C to +70°C
amb
PKG DWG #
INPUT AND OUTPUT LOADING AND FAN-OUT TABLE
PINS DESCRIPTION 74F (U.L.) HIGH/LOW LOAD VALUE HIGH/LOW
Dna, Dnb, Dnc, Dnd, Dne Data inputs 1.0/1.0 20µA/0.6mA
Q0, Q1 Data outputs 50/33 1.0mA/20mA
NOTE: One (1.0) FAST unit load is defined as: 20µA in the High state and 0.6mA in the Low state.
LOGIC SYMBOL
12
D0b D0c
312
D0dD0a
13 8
910
D1a D1b
11 4
D1cD0e
D1d
D1e
LOGIC DIAGRAM
D0a
D0b
D0c
D0d
D0e
1
2
3
12
13
5
Q0
VCC = Pin 14
GND = Pin 7
IEC/IEEE SYMBOL
1
2
3
12
13
8
9
10
11
4
Q0
Q1
6
5
SF00830
VCC = Pin 14
GND = Pin 7
D1a
D1b
D1c
D1d
D1e
8
9
10
11
4
6
SF00832
Q1
FUNCTION TABLE
INPUTS OUTPUT
≥ 1
5
6
SF00831
Dna Dnb Dnc Dnd Dne Qn
H X X X X L
X H X X X L
X X H X X L
X X X H X L
X X X X H L
L L L L L H
H = High voltage level
L = Low voltage level
X = Don’t care
1988 Nov 29 853–0048 95209
2
Philips Semiconductors Product specification
SYMBOL
PARAMETER
UNIT
NO TAG
VOHHigh-level output voltage
V
VOLLow-level output voltage
V
ICCSupply current (total)
V
MAX
74F260Dual 5-input NOR gate
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
V
V
I
IN
V
I
OUT
T
T
CC
IN
OUT
amb
stg
Supply voltage –0.5 to +7.0 V
Input voltage –0.5 to +7.0 V
Input current –30 to +5 mA
Voltage applied to output in High output state –0.5 to V
Current applied to output in Low output state 40 mA
Operating free-air temperature range 0 to +70 °C
Storage temperature range –65 to +150 °C
RECOMMENDED OPERATING CONDITIONS
V
V
V
I
I
I
T
CC
IH
IL
IK
OH
OL
amb
Supply voltage 4.5 5.0 5.5 V
High-level input voltage 2.0 V
Low-level input voltage 0.8 V
Input clamp current –18 mA
High-level output current –1 mA
Low-level output current 20 mA
Operating free-air temperature range 0 +70 °C
PARAMETER RATING UNIT
CC
V
LIMITS
MIN NOM MAX
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
SYMBOL PARAMETER TEST CONDITIONS
p
p
V
IK
I
I
I
IH
I
IL
I
OS
Input clamp voltage VCC = MIN, II = I
Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA
High-level input current VCC = MAX, VI = 2.7V 20 µA
Low-level input current VCC = MAX, VI = 0.5V –0.6 mA
Short-circuit output current
pp
NO TAG
I
CCH
I
CCL
VCC = MIN, VIL = MAX ±10%V
VIH = MIN, IOH = MAX ±5%V
VCC = MIN, VIL = MAX ±10%V
VIH = MIN, IOL = MAX ±5%V
IK
VCC = MAX –60 –150 mA
=
CC
MIN
2.5
CC
CC
CC
2.7 3.4
CC
VIN=GND 4.6 6.5 mA
VIN=4.5V 7.3 9.5 mA
TYP
NO TAG
MAX
0.30 0.50
0.30 0.50
–0.73 –1.2 V
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I
= 5V, T
CC
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
amb
= 25°C.
, the use of high-speed test apparatus and/or sample-and-hold
OS
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
tests should be performed last.
OS
UNIT
1988 Nov 29
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