N74F00N
74F00
Quad 2-input NAND gate
Product specification
IC15 Data Handbook
1990 Oct 04
INTEGRATED CIRCUITS
Philips Semiconductors Product specification
74F00Quad 2-input NAND gate
2
October 4, 1990 853-0325 00623
FEA TURE
•Industrial temperature range available (–40°C to +85°C)
TYPE
TYPICAL
PROPAGATION
DELAY
TYPICAL
SUPPLY CURRENT
(TOTAL)
74F00 3.4ns 4.4mA
PIN CONFIGURATION
14
13
12
11
10
9
87
6
5
4
3
2
1
GND
V
CC
D2b
D2a
Q2
Q3
D3b
D3a
D0a
D0b
Q
1
Q
0
D1a
D1b
SF00001
ORDERING INFORMA TION
ORDER CODE
DESCRIPTION
COMMERCIAL RANGE
V
CC
= 5V ±10%, T
amb
= 0°C to +70°C
INDUSTRIAL RANGE
V
CC
= 5V ±10%, T
amb
= –40°C to +85°C
PKG DWG #
14-pin plastic DIP N74F00N I74F00N SOT27-1
14-pin plastic SO N74F00D I74F00D SOT108-1
INPUT AND OUTPUT LOADING AND FAN OUT TABLE
PINS DESCRIPTION 74F (U.L.) HIGH/LOW LOAD VALUE HIGH/LOW
Dna, Dnb Data inputs 1.0/1.0 20µA/0.6mA
Qn Data output 50/33 1.0mA/20mA
NOTE: One (1.0) FAST unit load is defined as: 20µA in the high state and 0.6mA in the low state.
LOGIC DIAGRAM
D0a
D0b
D1a
D1b
D2a
Q
0
D2b
D3a
D3b
Q
1
Q2
Q
3
V
CC
= Pin 14
GND = Pin 7
3
6
8
11
1
2
4
5
9
10
12
13
SF00002
FUNCTION TABLE
INPUTS OUTPUT
Dna Dnb Qn
L L H
L H H
H L H
H H L
NOTES:
H = High voltage level
L = Low voltage level
LOGIC SYMBOL
D0a D0bD1a D2a D2b D3a D3bD1b
Q0 Q1 Q2 Q3
36811
12459101213
V
CC
= Pin 14
GND = Pin 7
SF00003
IEC/IEEE SYMBOL
1
2
4
5
9
10
12
13
&
3
6
8
11
SF00004
Philips Semiconductors Product specification
74F00Quad 2-input NAND gate
October 4, 1990
3
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free air temperature range.)
SYMBOL
PARAMETER RATING UNIT
V
CC
Supply voltage –0.5 to +7.0 V
V
IN
Input voltage –0.5 to +7.0 V
I
IN
Input current –30 to +5 mA
V
OUT
Voltage applied to output in high output state –0.5 to V
CC
V
I
OUT
Current applied to output in low output state 40 mA
T
amb
Operating free air temperature range Commercial range 0 to +70 °C
Industrial range –40 to +85 °C
T
stg
Storage temperature range –65 to +150 °C
RECOMMENDED OPERATING CONDITIONS
SYMBOL PARAMETER LIMITS UNIT
MIN NOM MAX
V
CC
Supply voltage 4.5 5.0 5.5 V
V
IH
High-level input voltage 2.0 V
V
IL
Low-level input voltage 0.8 V
I
Ik
Input clamp current –18 mA
I
OH
High-level output current –1 mA
I
OL
Low-level output current 20 mA
T
amb
Operating free air temperature range Commercial range 0 +70 °C
Industrial range –40 +85 °C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER TEST CONDITIONS
1
LIMITS UNIT
MIN TYP
2
MAX
V
OH
High-level output voltage V
CC
= MIN, V
IL
= MAX ±10%V
CC
2.5 V
V
IH
= MIN, I
OH
= MAX ±5%V
CC
2.7 3.4 V
V
OL
Low-level output voltage V
CC
= MIN, V
IL
= MAX ±10%V
CC
0.30 0.50 V
V
IH
= MIN, I
Ol
= MAX ±5%V
CC
0.30 0.50 V
V
IK
Input clamp voltage V
CC
= MIN, I
I
= I
IK
-0.73 -1.2 V
I
I
Input current at maximum input
voltage
V
CC
= MAX, V
I
= 7.0V 100 µA
I
IH
High-level input current V
CC
= MAX, V
I
= 2.7V 20 µA
I
IL
Low-level input current V
CC
= MAX, V
I
= 0.5V -0.6 mA
I
OS
Short-circuit output current
3
V
CC
= MAX -60 -150 mA
I
CC
Supply current (total) I
CCH
V
CC
= MAX V
IN
= GND 1.9 2.8 mA
I
CCL
V
CC
= MAX V
IN
= 4.5V 6.8 10.2 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25°C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
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