Philips Semiconductors Product specification
N-channel enhancement mode IRLZ34N
Logic level TrenchMOS
GENERAL DESCRIPTION QUICK REFERENCE DATA
N-channel enhancement mode logic SYMBOL PARAMETER MAX. UNIT
level field-effectpowertransistorina
plastic envelope using ’trench’V
technology.Thedevicefeatures very I
low on-state resistance and has P
integral zener diodes giving ESD T
protectionupto 2kV. Itis intended for R
useinswitchedmodepowersupplies resistance VGS = 10 V
and general purpose switching
applications.
PINNING - TO220AB PIN CONFIGURATION SYMBOL
PIN DESCRIPTION
1 gate
2 drain
3 source
TM
transistor
DS
D
tot
j
DS(ON)
Drain-source voltage 55 V
Drain current (DC) 30 A
Total power dissipation 68 W
Junction temperature 175 ˚C
Drain-source on-state 35 mΩ
tab
d
g
tab drain
123
s
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
DSS
V
DGR
V
GS
I
D
Drain-source voltage Tj = 25 ˚C to 175˚C - 55 V
Drain-gate voltage Tj = 25 ˚C to 175˚C; RGS = 20 kΩ -55V
Gate-source voltage - ± 13 V
Continuous drain current Tmb = 25 ˚C - 30 A
Tmb = 100 ˚C - 21 A
I
DM
P
D
Tj, T
Pulsed drain current Tmb = 25 ˚C - 110 A
Total power dissipation Tmb = 25 ˚C - 68 W
Operating junction and - 55 175 ˚C
stg
storage temperature
THERMAL RESISTANCES
SYMBOL PARAMETER CONDITIONS TYP. MAX. UNIT
R
R
th j-mb
th j-a
Thermal resistance junction - 2.2 K/W
to mounting base
Thermal resistance junction 60 - K/W
to ambient
ESD LIMITING VALUE
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
C
February 1999 1 Rev 1.000
Electrostatic discharge Human body model (100 pF, 1.5 kΩ)-2kV
capacitor voltage, all pins
Philips Semiconductors Product specification
N-channel enhancement mode IRLZ34N
Logic level TrenchMOS
ELECTRICAL CHARACTERISTICS
Tj= 25˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
(BR)DSS
V
(BR)GSS
V
GS(TO)
R
DS(ON)
g
fs
I
GSS
I
DSS
Q
g(tot)
Q
gs
Q
gd
t
d on
t
r
t
d off
t
f
L
d
L
d
L
s
C
iss
C
oss
C
rss
Drain-source breakdown VGS = 0 V; ID = 0.25 mA; 55 - - V
voltage Tj = -55˚C 50 - - V
Gate-source breakdown IG = ±1 mA; 10 - - V
voltage
Gate threshold voltage VDS = VGS; ID = 1 mA 1.0 1.5 2.0 V
Drain-source on-state VGS = 5 V; ID = 17 A - 28 46 mΩ
resistance VGS = 10 V; ID = 17 A - 26 35 mΩ
Forward transconductance VDS = 25 V; ID = 15 A 12 40 - S
Gate source leakage current VGS = ±5 V; VDS = 0 V - 0.02 1 µA
Zero gate voltage drain VDS = 55 V; VGS = 0 V; - 0.05 10 µA
current Tj = 175˚C - - 500 µA
Total gate charge ID = 30 A; V
Gate-source charge - 6 - nC
Gate-drain (Miller) charge - 11 - nC
Turn-on delay time VDD = 30 V; ID = 25 A; - 14 21 ns
Turn-on rise time VGS = 5 V; RG = 10 Ω - 77 110 ns
Turn-off delay time Resistive load - 55 80 ns
Turn-off fall time - 48 65 ns
Internal drain inductance Measured from tab to centre of die - 3.5 - nH
Internal drain inductance Measured from drain lead to centre of die - 4.5 - nH
Internal source inductance Measured from source lead to source - 7.5 - nH
Input capacitance VGS = 0 V; VDS = 25 V; f = 1 MHz - 1050 1400 pF
Output capacitance - 205 245 pF
Feedback capacitance - 113 150 pF
TM
transistor
(SOT78 package only)
bond pad
Tj = 175˚C 0.5 - - V
Tj = -55˚C - - 2.3 V
Tj = 175˚C - - 74 mΩ
Tj = 175˚C - - 20 µA
= 44 V; VGS = 5 V - 22.5 - nC
DD
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS
Tj = 25˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
I
S
I
SM
V
SD
t
rr
Q
rr
February 1999 2 Rev 1.000
Continuous source current - - 30 A
(body diode)
Pulsed source current (body - - 110 A
diode)
Diode forward voltage IF = 25 A; VGS = 0 V - 0.95 1.2 V
IF = 34 A; VGS = 0 V - 1.0 - V
Reverse recovery time IF = 34 A; -dIF/dt = 100 A/µs; - 40 - ns
Reverse recovery charge VGS = -10 V; VR = 30 V - 0.16 - µC
Philips Semiconductors Product specification
N-channel enhancement mode IRLZ34N
Logic level TrenchMOS
AVALANCHE LIMITING VALUE
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
W
DSS
Drain-source non-repetitive ID = 20 A; VDD ≤ 25 V; VGS = 5 V; - 45 mJ
unclamped inductive turn-off RGS = 50 Ω; Tmb = 25 ˚C
energy
PD%
120
110
100
90
80
70
60
50
40
30
20
10
0
0 20 40 60 80 100 120 140 160 180
Tmb / C
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/P
TM
transistor
Normalised Power Derating
= f(Tmb)
D 25 ˚C
1000
ID/A
100
10
1
1 10 100
RDS(ON) = VDS/ID
DC
VDS/V
tp =
1 us
10us
100 us
1 ms
10ms
100ms
Fig.3. Safe operating area. Tmb = 25 ˚C
ID & IDM = f(VDS); IDM single pulse; parameter t
p
ID%
120
110
100
90
80
70
60
50
40
30
20
10
0
0 20 40 60 80 100 120 140 160 180
Normalised Current Derating
Tmb / C
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/I
= f(Tmb); conditions: VGS ≥ 5 V
D 25 ˚C
ZTH/ (K/W)
10
1
0.5
0.2
0.1
0.05
0.1
0.02
0
0.01
1.0E-06 0.0001 0.01 1 100
p
t
P
D
t/s
Fig.4. Transient thermal impedance.
Z
= f(t); parameter D = tp/T
th j-mb
p
t
D =
T
t
T
February 1999 3 Rev 1.000