Philips 74abt20 DATASHEETS

INTEGRATED CIRCUITS
74ABT20
Dual 4-input NAND gate
Product specification 1995 Sep 22 IC23 Data Handbook
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Philips Semiconductors Product specification
CC

QUICK REFERENCE DATA

CONDITIONS
SYMBOL PARAMETER
T
Propagation
IN
CC
delay An, Bn, Cn, Dn to Y
n
Output to Output skew
Input capacitance
Total supply current
CL = 50pF; VCC = 5V
VI = 0V or V Outputs disabled;
VCC = 5.5V
t
PLH
t
PHL
t
OSLH
t
OSHL
C
I

PIN CONFIGURATION

1
A0
2
B0
NC
3
C0
4
D0
5
0
6
Y
GND

PIN DESCRIPTION

PIN
NUMBER
1, 2, 4, 5, 9,
10, 12, 13
6, 8 Yn Data outputs
7 GND Ground (0V)
14 V
SYMBOL NAME AND FUNCTION
An, Bn, Cn, Dn
Data inputs
Positive supply voltage
CC

LOGIC SYMBOL

12 459101213
D0 A1 B1A0 B0 C0 C1 D1
Y0Y1
VCC = Pin 14 GND = Pin 7
68
= 25°C;
amb
GND = 0V
SA00350
CC
14 13 12 11 10
9 87
SA00351
TYPICAL UNIT
2.7
2.2
0.3 ns
3 pF
50 µA
V
CC
D1 C1 NC B1 A1 Y1
ns

LOGIC DIAGRAM

1
A0
2
VCC = Pin 14 GND = Pin 7
B0
4
C0
5
D0
9
A1
10
B1
12
C1
13
D1
6
8
SA00352
Y0
Y1
LOGIC SYMBOL (IEEE/IEC)
1
2 4
5
9
10 12
13
&
SF00068

FUNCTION TABLE

INPUTS OUTPUT
An Bn Cn Dn Yn
L X X X H X L X X H X X L X H X X X L H
H H H H L
NOTES:
H = High voltage level L = Low voltage level X = Don’t care
6
8

ORDERING INFORMATION

PACKAGES TEMPERATURE RANGE OUTSIDE NORTH AMERICA NORTH AMERICA DWG NUMBER
14-Pin Plastic DIP –40°C to +85°C 74ABT20 N 74ABT20 N SOT27-1 14-Pin plastic SO –40°C to +85°C 74ABT20 D 74ABT20 D SOT108-1 14-Pin Plastic SSOP Type II –40°C to +85°C 74ABT20 DB 74ABT20 DB SOT337-1 14-Pin Plastic TSSOP Type I –40°C to +85°C 74ABT20 PW 74ABT20PW DH SOT402-1
1995 Sep 22 853-181 1 15793
2
Philips Semiconductors Product specification
SYMBOL
PARAMETER
UNIT
74ABT20Dual 4-input NAND gate

ABSOLUTE MAXIMUM RATINGS

1, 2
SYMBOL PARAMETER CONDITIONS RATING UNIT
V
I
V
CC
I
IK
V
I
OK
OUT
OUT
T
stg
DC supply voltage –0.5 to +7.0 V DC input diode current VI < 0 –18 mA
I
DC input voltage
3
–1.2 to +7.0 V DC output diode current VO < 0 –50 mA DC output voltage
3
output in Off or High state –0.5 to +5.5 V DC output current output in Low state 40 mA Storage temperature range –65 to 150 °C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability .
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.

RECOMMENDED OPERATING CONDITIONS

LIMITS
MIN MAX
V
CC
V V V I
OH
I
OL
t/v Input transition rise or fall rate 0 10 ns/V
T
amb
DC supply voltage 4.5 5.5 V Input voltage 0 V
I
High-level input voltage 2.0 V
IH
Low-level input voltage 0.8 V
IL
High-level output current –15 mA Low-level output current 20 mA
Operating free-air temperature range –40 +85 °C
CC
V

DC ELECTRICAL CHARACTERISTICS

LIMITS
SYMBOL PARAMETER TEST CONDITIONS
V
V
V
I
OFF
I
CEX
I
I
Input clamp voltage VCC = 4.5V; IIK = –18mA –0.9 –1.2 –1.2 V
IK
High-level output voltage VCC = 4.5V; IOH = –15mA; VI = VIL or V
OH
Low-level output voltage VCC = 4.5V; IOL = 20mA; VI = VIL or V
OL
I
Input leakage current VCC = 5.5V; VI = GND or 5.5V ±0.01 ±1.0 ±1.0 µA
I
IH
IH
Power-off leakage current VCC = 0.0V; VO or VI 4.5V ±5.0 ±100 ±100 µA Output High leakage current VCC = 5.5V; VO = 5.5V; VI = GND or V
I
Output current
O
Quiescent supply current VCC = 5.5V; VI = GND or V
CC
Additional supply current per
CC
input pin
1
2
VCC = 5.5V; VO = 2.5V –50 –75 –180 –50 –180 mA
VCC = 5.5V; One data input at 3.4V, other inputs at VCC or GND
CC
CC
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
3. For valid test results, data must not be loaded into the flip-flop or latch after applying the power.
T
= +25°C
amb
MIN TYP MAX MIN MAX
2.5 2.9 2.5 V
0.35 0.5 0.5 V
5.0 50 50 µA
2 50 50 µA
0.25 500 500 µA
T
amb
to +85°C
= –40°C
UNIT
1995 Sep 22
3
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