ON Semiconductor NTB75N03R, NTP75N03R Technical data

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NTB75N03R, NTP75N03R
Power MOSFET 75 Amps, 25 Volts
N−Channel D
PAK, TO−220
Features
Planar HD3e Process for Fast Switching Performance
Low R
Low C
to Minimize Conduction Loss
DS(on)
to Minimize Driver Loss
iss
Low Gate Charge
MAXIMUM RATINGS (T
Parameter
Drain−to−Source Voltage V Gate−to−Source Voltage − Continuous V Thermal Resistance − Junction−to−Case
Total Power Dissipation @ TC = 25°C Drain Current
− Continuous @ T
− Single Pulse (t
Thermal Resistance − Junction−to−Ambient
(Note 1) Total Power Dissipation @ T Drain Current − Continuous @ T
Thermal Resistance − Junction−to−Ambient
(Note 2) Total Power Dissipation @ T Drain Current − Continuous @ T
Operating and Storage Temperature Range TJ, T
Single Pulse Drain−to−Source Avalanche Energy − Starting T (V
= 30 Vdc, V
DD
L = 1 mH, R Maximum Lead Temperature for Soldering
Purposes, 1/8 from Case for 10 Seconds
1. When surface mounted to an FR4 board using 1 inch pad size, (Cu Area 1.127 in
2. When surface mounted to an FR4 board using minimum recommended pad size, (Cu Area 0.412 in
p
J
= 10 Vdc, IL = 12 Apk,
GS
= 25 )
G
= 25°C Unless otherwise specified)
J
= 25°C
C
= 10 s)
= 25°C
A
= 25°C
A
= 25°C
A
= 25°C
A
= 25°C
2
).
2
).
Symbol Value Unit
stg
25 V
±20 V
1.68
74.4 75
225
60
2.08
12.6
100
1.25
9.7
−55 to 150
71.7 mJ
260 °C
°C/W
°C/W
°C/W
R
R
R
P
I
P
P
E
DSS
GS
JC D
I
D
DM
JA
D
I
D
JA
D
I
D
AS
T
L
W
W
W
°C
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75 AMPERES
25 VOLTS
R
DS(on)
dc dc
A A
A
A
1
2
Gate
3
4
Drain
P75N03R YWW
1
Drain
ORDERING INFORMATION
Device Package Shipping
= 5.6 m (Typ)
4
1
TO−220AB
CASE 221A
STYLE 5
MARKING DIAGRAMS
& PIN ASSIGNMENTS
3 Source
2
75N03 = Device Code Y = Year WW = Work Week
1
Gate
2
3
D2PAK
CASE 418AA
STYLE 2
4
Drain
75N03R YWW
2
Drain
3 Source
4
Semiconductor Components Industries, LLC, 2003
October, 2003 − Rev. 2
NTP75N03R TO−220AB 50 Units/Rail NTB75N03R D2PAK 50 Units/Rail NTB75N03RT4 D2PAK 800/Tape & Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D.
1 Publication Order Number:
NTB75N03R/D
NTB75N03R, NTP75N03R
)
f = 1 MHz)
(
(V
GS
V
d
V
DD
V
d
)
V
DS
V
d
) (Note 3)
g
Forward On−Voltage
V
SD
V
d
(
S dc,GS dc
)( )
(I
S
A
d
V
GS
V
d
ELECTRICAL CHARACTERISTICS (T
Characteristics
= 25°C Unless otherwise specified)
J
Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain−to−Source Breakdown Voltage (Note 3)
(V
= 0 Vdc, I
GS
Temperature Coefficient (Positive)
= 250 Adc)
D
V
Zero Gate Voltage Drain Current
(V
= 20 Vdc, VGS = 0 Vdc)
DS
= 20 Vdc, VGS = 0 Vdc, TJ = 150°C)
(V
DS
Gate−Body Leakage Current
(VGS = ±20 Vdc, VDS = 0 Vdc)
ON CHARACTERISTICS (Note 3)
Gate Threshold Voltage (Note 3)
V
(VDS = VGS, ID = 250 Adc)
Threshold Temperature Coefficient (Negative) Static Drain−to−Source On−Resistance (Note 3)
R (VGS = 4.5 Vdc, ID = 20 Adc) (V
= 10 Vdc, ID = 20 Adc)
GS
Forward Transconductance (Note 3)
(VDS = 10 Vdc, ID = 15 Adc)
DYNAMIC CHARACTERISTICS
Input Capacitance Output Capacitance
(VDS = 20 Vdc, VGS = 0 V,
f = 1 MHz
Transfer Capacitance
SWITCHING CHARACTERISTICS (Note 4)
Turn−On Delay Time t Rise Time Turn−Off Delay Time
V
= 10 V
= 10
ID = 30 Adc, RG = 3)
, V
,
c
= 10 V
= 10
,
,
c
Fall Time t Gate Charge
(VGS = 5 Vdc, ID = 30 Adc,
= 10
V
= 10 V) (Note 3
c
SOURCE−DRAIN DIODE CHARACTERISTICS
Forward On−Volta
e V
(IS = 20 Adc, VGS = 0 Vdc) (Note 3)
(IS = 20 Adc, VGS = 0 Vdc, TJ = 125°C) 0.73
Reverse Recovery Time
(I
= 35 A
= 35
dIS/dt = 100 A/s) (Note 3)
, V
= 0 V
= 0
,
,
c
,
c
Reverse Recovery Stored Charge Q
3. Pulse Test: Pulse Width = 300 s, Duty Cycle = 2%.
4. Switching characteristics are independent of operating junction temperatures.
(br)DSS
I
DSS
I
GSS
GS(th)
DS(on)
g
FS
C
iss
C
oss
C
rss
d(on)
t
r
t
d(off)
f
Q
T
Q
1
Q
2
D
t
rr
t
a
t
b
RR
25
28
20.5
1.0 10
mV/°C
±100
1.0
1.5
4.0
8.1
5.6
2.0
13
8.0
mV/°C
Mhos
27
1333
600
218
6.9
1.3
18.4
5.5
13.2
3.3
6.2
0.86
1.2
15.6
13.8
1.78
0.004 C
V
A
nA
V
m
V
dc
dc
dc
dc
pF
ns
nC
c
ns
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2
NTB75N03R, NTP75N03R
140
10 V
120
100
80
5 V
8 V 6 V
4.5 V
4 V
3.5 V 60
40
, DRAIN CURRENT (AMPS)
D
I
20
3 V
VGS = 2.5 V
0
010
V
, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
DS
42
6
8
140
VDS 10 V
120
100
80
60
TJ = 25°C
40
, DRAIN CURRENT (AMPS)
D
I
20
TJ = 125°C
0
10
, GATE−TO−SOURCE VOLTAGE (VOLTS)
V
GS
23
TJ = −55°C
Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics
0.022
0.018
0.014
0.010
0.006
, DRAIN−TO−SOURCE RESISTANCE (Ω)
0.002
DS(on)
R
VGS = 10 V
TJ = 150°C
TJ = 125°C
TJ = 25°C
TJ = −55°C
20 80
0
6040
100
120 140
ID, DRAIN CURRENT (AMPS)
Figure 3. On−Resistance versus Drain Current
and Temperature
0.022
0.018
0.014
0.010
0.006
, DRAIN−TO−SOURCE RESISTANCE (Ω)
0.002
DS(on)
R
VGS = 4.5 V
TJ = 125°C
TJ = 25°C
TJ = −55°C
0
20 100
6040
ID, DRAIN CURRENT (AMPS)
Figure 4. On−Resistance versus Drain Current
and Temperature
45
TJ = 150°C
80
120
6
140
1.8 ID = 30 A
V
1.6
GS
= 10 V
1.4
1.2
1.0
(NORMALIZED)
0.8
, DRAIN−TO−SOURCE RESISTANCE
0.6
DS(on)
−50 50250−25 75 125100
R
TJ, JUNCTION TEMPERATURE (°C)
Figure 5. On−Resistance Variation with
Temperature
100,000
10,000
, LEAKAGE (nA)
1000
DSS
I
100
150
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3
VGS = 0 V
TJ = 150°C
TJ = 125°C
01510 255
20
VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 6. Drain−to−Source Leakage Current
versus V oltage
NTB75N03R, NTP75N03R
POWER MOSFET SWITCHING
Switching behavior is most easily modeled and predicted
by recognizing that the power MOSFET is charge controlled. The lengths of various switching intervals (∆t) are determined by how fast the FET input capacitance can be charged by current from the generator.
The published capacitance data is difficult to use for calculating rise and fall because drain−gate capacitance varies greatly with applied voltage. Accordingly, gate charge data is used. In most cases, a satisfactory estimate of average input current (I
) can be made from a
G(AV)
rudimentary analysis of the drive circuit so that t = Q/I
G(AV)
During the rise and fall time interval when switching a resistive load, VGS remains virtually constant at a level known as the plateau voltage, V
. Therefore, rise and fall
SGP
times may be approximated by the following: tr = Q2 x RG/(VGG − V tf = Q2 x RG/V
GSP
GSP
)
where VGG = the gate drive voltage, which varies from zero to V
GG
RG = the gate drive resistance and Q2 and V
are read from the gate charge curve.
GSP
During the turn−on and turn−off delay times, gate current is not constant. The simplest calculation uses appropriate values from the capacitance curves in a standard equation for voltage change in an RC network. The equations are:
t
d(on)
t
d(off)
= RG C
= RG C
In [VGG/(V
iss
In (VGG/V
iss
GG
GSP
− V
)
GSP
)]
The capacitance (C
) is read from the capacitance curve at
iss
a voltage corresponding to the off−state condition when calculating t on−state when calculating t
and is read at a voltage corresponding to the
d(on)
.
d(off)
At high switching speeds, parasitic circuit elements complicate the analysis. The inductance of the MOSFET source lead, inside the package and in the circuit wiring which is common to both the drain and gate current paths, produces a voltage at the source which reduces the gate drive current. The voltage is determined by Ldi/dt, but since di/dt is a function of drain current, the mathematical solution is complex. The MOSFET output capacitance also complicates the mathematics. And finally, MOSFETs have finite internal gate resistance which effectively adds to the resistance of the driving source, but the internal resistance is difficult to measure and, consequently, is not specified.
The resistive switching time variation versus gate resistance (Figure 9) shows how typical switching performance is affected by the parasitic circuit elements. If the parasitics were not present, the slope of the curves would maintain a value of unity regardless of the switching speed. The circuit used to obtain the data is constructed to minimize common inductance in the drain and gate circuit loops and is believed readily achievable with board mounted components. Most power electronic loads are inductive; the data in the figure is taken with a resistive load, which approximates an optimally snubbed inductive load. Power MOSFETs may be safely operated into an inductive load; however, snubbing reduces switching losses.
2400
C
2000
1600
1200
C, CAPACITANCE (pF)
GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLTS)
iss
C
rss
800
400
0
10 0 10 15 20
55
Figure 7. Capacitance Variation
VGS = 0 VVDS = 0 V
V
V
GS
DS
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4
TJ = 25°C
C
C
iss
C
oss
rss
NTB75N03R, NTP75N03R
8
6
Q
T
4
, GATE−TO−SOURCE VOLTAGE (VOLTS)
GS
V
Q
1
2
0
0
Q
Q
2
48
, TOTAL GATE CHARGE (nC)
G
ID = 35 A
= 25°C
T
J
12
Figure 8. Gate−T o−Source and Drain−To−Source
Voltage versus Total Charge
DRAIN−TO−SOURCE DIODE CHARACTERISTICS
70
VGS = 0 V
60
50
1000
V
GS
16
100
t
t, TIME (ns)
10
1
1 10 100
d(off)
t
d(on)
t
f
t
r
RG, GATE RESISTANCE (OHMS)
VDS = 10 V I
= 35 A
D
V
GS
= 10 V
Figure 9. Resistive Switching Time
Variation versus Gate Resistance
40
30
20
, SOURCE CURRENT (AMPS)
10
S
I
0
0
0.2 0.4 1.0
VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS)
Figure 10. Diode Forward Voltage versus Current
SAFE OPERATING AREA
The Forward Biased Safe Operating Area curves define the maximum simultaneous drain−to−source voltage and drain current that a transistor can handle safely when it is forward biased. Curves are based upon maximum peak junction temperature and a case temperature (T
) of 25°C.
C
Peak repetitive pulsed power limits are determined by using the thermal response data in conjunction with the procedures discussed in AN569, “Transient Thermal Resistance − General Data and Its Use.”
Switching between the off−state and the on−state may traverse any load line provided neither rated peak current (I
) nor rated voltage (V
DM
) is exceeded and the
DSS
transition time (tr,tf) do not exceed 10 µs. In addition the total power averaged over a complete switching cycle must not exceed (T
J(MAX)
− TC)/(R
).
JC
θ
A Power MOSFET designated E−FET can be safely used in switching circuits with unclamped inductive loads. For
TJ = 150°C
TJ = 25°C
0.6 0.8
reliable operation, the stored energy from circuit inductance dissipated in the transistor while in avalanche must be less than the rated limit and adjusted for operating conditions differing from those specified. Although industry practice is to rate in terms of energy, avalanche energy capability is not a constant. The energy rating decreases non−linearly with an increase of peak current in avalanche and peak junction temperature.
Although many E−FETs can withstand the stress of drain−to−source avalanche at currents up to rated pulsed current (I
), the energy rating is specified at rated
DM
continuous current (ID), in accordance with industry custom. The energy rating must be derated for temperature as shown in the accompanying graph (Figure 12). Maximum e ner gy a t currents below rated continuous I
can safely be assumed to
D
equal the values indicated.
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5
1000
100
NTB75N03R, NTP75N03R
SAFE OPERATING AREA
VGS = 20 V SINGLE PULSE T
= 25°C
C
10 µs
100 µs
10
, DRAIN CURRENT (AMPS)
D
I
1
0.1 1 100
1
D = 0.5
0.2
0.1
0.05
0.01
RESISTANCE (NORMALIZED)
SINGLE PULSE
0.1
r(t), EFFECTIVE TRANSIENT THERMAL
0.001
1 ms
R
LIMIT
DS(on)
THERMAL LIMIT
10 ms dc
PACKAGE LIMIT
10
, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
V
DS
Figure 11. Maximum Rated Forward Biased
Safe Operating Area
P
(pk)
t
1
t
2
DUTY CYCLE, D = t1/t
t, TIME (s)
2
R
(t) = r(t) R
θ
JC
θ
JC
D CURVES APPLY FOR POWER PULSE TRAIN SHOWN READ TIME AT t T
− TC = P
J(pk)
(pk)
1
R
(t)
θ
JC
1100.10.010.0001
Figure 12. Thermal Response
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6
NTB75N03R, NTP75N03R
PACKAGE DIMENSIONS
D2PAK
CASE 418AA−01
ISSUE O
−T−
SEATING PLANE
VARIABLE CONFIGURATION ZONE
M
−B−
G
C
E
V
4
W
A
231
S
K
W
J
3 PL
D
M
0.13 (0.005) T
M
B
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
DIM MIN MAX MIN MAX
A 0.340 0.380 8.64 9.65 B 0.380 0.405 9.65 10.29 C 0.160 0.190 4.06 4.83 D 0.020 0.036 0.51 0.92 E 0.045 0.055 1.14 1.40 F 0.310 −−− 7.87 −−− G 0.100 BSC 2.54 BSC J 0.018 0.025 0.46 0.64 K 0.090 0.110 2.29 2.79 M 0.280 −−− 7.11 −−− S 0.575 0.625 14.60 15.88 V 0.045 0.055 1.14 1.40
STYLE 2:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN
MILLIMETERSINCHES
U
M
M
F
VIEW W−W VIEW W−W VIEW W−W
123
F
F
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7
NTB75N03R, NTP75N03R
PACKAGE DIMENSIONS
TO−220
CASE 221A−09
ISSUE AA
SEATING
−T−
PLANE
B
4
Q
123
F
T
A
U
C
S
H
K
Z
L
V
R J
G
D
N
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION Z DEFINES A ZONE WHERE ALL BODY AND LEAD IRREGULARITIES ARE ALLOWED.
DIM MIN MAX MIN MAX
A 0.570 0.620 14.48 15.75 B 0.380 0.405 9.66 10.28 C 0.160 0.190 4.07 4.82 D 0.025 0.035 0.64 0.88 F 0.142 0.147 3.61 3.73 G 0.095 0.105 2.42 2.66 H 0.110 0.155 2.80 3.93 J 0.018 0.025 0.46 0.64 K 0.500 0.562 12.70 14.27 L 0.045 0.060 1.15 1.52 N 0.190 0.210 4.83 5.33 Q 0.100 0.120 2.54 3.04 R 0.080 0.110 2.04 2.79 S 0.045 0.055 1.15 1.39 T 0.235 0.255 5.97 6.47 U 0.000 0.050 0.00 1.27 V 0.045 −−− 1.15 −−− Z −−− 0.080 −−− 2.04
STYLE 5:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN
MILLIMETERSINCHES
ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
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NTB75N03R/D
8
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