MC74HCT374A
Octal 3-State Noninverting D Flip-Flop with LSTTL-Compatible Inputs
High−Performance Silicon−Gate CMOS
The MC74HCT374A may be used as a level converter for interfacing TTL or NMOS outputs to High−Speed CMOS inputs.
The HCT374A is identical in pinout to the LS374.
Data meeting the setup and hold time is clocked to the outputs with the rising edge of Clock. The Output Enable does not affect the state of the flip−flops, but when Output Enable is high, the outputs are forced to the high−impedance state. Thus, data may be stored even when the outputs are not enabled.
The HCT374A is identical in function to the HCT574A, which has the input pins on the opposite side of the package from the output pins. This device is similar in function to the HCT534A, which has inverting outputs.
Features
•Output Drive Capability: 15 LSTTL Loads
•TTL/NMOS−Compatible Input Levels
•Outputs Directly Interface to CMOS, NMOS, and TTL
•Operating Voltage Range: 4.5 to 5.5 V
•Low Input Current: 1.0 mA
•In Compliance With the JEDEC Standard No. 7.0 A Requirements
•Chip Complexity: 276 FETs or 69 Equivalent Gates
•Improvements over HCT374
♦Improved Propagation Delays
♦50% Lower Quiescent Power
♦Improved Input Noise and Latchup Immunity
•These Devices are Pb−Free and are RoHS Compliant
LOGIC DIAGRAM
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SOIC−20 |
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TSSOP−20 |
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DW SUFFIX |
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DT SUFFIX |
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CASE 751D |
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CASE 948E |
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PIN ASSIGNMENT |
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OUTPUT ENABLE |
1 |
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20 |
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VCC |
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Q0 |
2 |
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19 |
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Q7 |
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D0 |
3 |
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18 |
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D7 |
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D1 |
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17 |
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D6 |
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Q1 |
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16 |
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Q6 |
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Q2 |
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15 |
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Q5 |
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D2 |
7 |
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14 |
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D5 |
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D3 |
8 |
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13 |
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D4 |
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Q3 |
9 |
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12 |
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Q4 |
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GND |
10 |
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11 |
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CLOCK |
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MARKING DIAGRAMS |
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20 |
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20 |
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HCT374A |
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HCT |
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374A |
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AWLYYWWG |
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ALYWG |
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G |
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1 |
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1 |
TSSOP−20 |
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SOIC−20 |
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A |
= Assembly Location |
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WL, L |
= Wafer Lot |
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YY, Y |
= Year |
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WW, W |
= Work Week |
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G or G = Pb−Free Package
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D0 |
3 |
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2 |
Q0 |
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(Note: Microdot may be in either location) |
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4 |
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5 |
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D1 |
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Q1 |
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FUNCTION TABLE |
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7 |
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6 |
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D2 |
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Q2 |
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Inputs |
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Output |
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8 |
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9 |
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DATA |
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D3 |
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Q3 |
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NONINVERTING |
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Output |
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13 |
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INPUTS |
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12 |
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Enable |
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Clock |
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D |
Q |
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D4 |
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Q4 |
OUTPUTS |
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D5 |
14 |
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15 |
Q5 |
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L |
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H |
H |
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17 |
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16 |
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L |
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L |
L |
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D6 |
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Q6 |
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L |
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L,H, |
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X |
No Change |
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18 |
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D7 |
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19 |
Q7 |
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H |
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X |
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X |
Z |
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CLOCK |
11 |
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X = don’t care |
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Z = high impedance |
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1 |
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PIN 20 = VCC |
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ORDERING INFORMATION |
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OUTPUT ENABLE |
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PIN 10 = GND |
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See detailed ordering and shipping information on page 5 of |
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this data sheet. |
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♥ Semiconductor Components Industries, LLC, 2014 |
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1 |
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Publication Order Number: |
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September, 2014 |
− Rev. 12 |
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MC74HCT374A/D |
MC74HCT374A
Design Criteria |
Value |
Units |
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Internal Gate Count* |
69 |
ea. |
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Internal Gate Propagation Delay |
1.5 |
ns |
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Internal Gate Power Dissipation |
5.0 |
mW |
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Speed Power Product |
.0075 |
pJ |
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*Equivalent to a two−input NAND gate. |
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MAXIMUM RATINGS
Symbol |
Parameter |
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Value |
Unit |
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VCC |
DC Supply Voltage (Referenced to GND) |
–0.5 to +7.0 |
V |
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Vin |
DC Input Voltage (Referenced to GND) |
–0.5 to VCC + 0.5 |
V |
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Vout |
DC Output Voltage (Referenced to GND) |
–0.5 to VCC + 0.5 |
V |
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Iin |
DC Input Current, per Pin |
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±20 |
mA |
Iout |
DC Output Current, per Pin |
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±35 |
mA |
ICC |
DC Supply Current, VCC and GND Pins |
±75 |
mA |
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PD |
Power Dissipation in Still Air, |
SOIC Package† |
500 |
mW |
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TSSOP Package† |
450 |
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Tstg |
Storage Temperature |
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–65 to +150 |
_C |
TL |
Lead Temperature, 1 mm from Case for 10 Seconds |
260 |
_C |
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(SOIC or TSSOP Package) |
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Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected.
†Derating: SOIC Package: –7 mW/_C from 65_ to 125_C TSSOP Package: −6.1 mW/_C from 65_ to 125_C
RECOMMENDED OPERATING CONDITIONS
This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high−impedance circuit. For proper operation, Vin and Vout should be constrained to the
range GND v (Vin or Vout) v VCC. Unused inputs must always be
tied to an appropriate logic voltage level (e.g., either GND or VCC). Unused outputs must be left open.
Symbol |
Parameter |
Min |
Max |
Unit |
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VCC |
DC Supply Voltage (Referenced to GND) |
4.5 |
5.5 |
V |
Vin, Vout |
DC Input Voltage, Output Voltage (Referenced to GND) |
0 |
VCC |
V |
TA |
Operating Temperature, All Package Types |
–55 |
+125 |
_C |
tr, tf |
Input Rise and Fall Time (Figure 1) |
0 |
500 |
ns |
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability.
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MC74HCT374A
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
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Guaranteed Limit |
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VCC |
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−55 to |
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Symbol |
Parameter |
Test Conditions |
V |
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25_C |
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≤ |
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Unit |
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85 C |
≤ 125 C |
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VIH |
Minimum High−Level Input Voltage |
Vout = 0.1 V or VCC – 0.1 V |
4.5 |
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2.0 |
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2.0 |
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2.0 |
V |
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|Iout| ≤ 20 mA |
5.5 |
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2.0 |
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2.0 |
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2.0 |
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VIL |
Maximum Low−Level Input Voltage |
Vout = 0.1 V or VCC – 0.1 V |
4.5 |
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0.8 |
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0.8 |
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0.8 |
V |
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|Iout| ≤ 20 mA |
5.5 |
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0.8 |
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0.8 |
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0.8 |
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VOH |
Minimum High−Level Output Voltage |
Vin = VIH or VIL |
4.5 |
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4.4 |
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4.4 |
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4.4 |
V |
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|Iout| ≤ 20 mA |
5.5 |
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5.4 |
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5.4 |
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5.4 |
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Vin = VIH or VIL |
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|Iout| ≤ 6.0 mA |
4.5 |
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3.98 |
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3.84 |
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3.7 |
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VOL |
Maximum Low−Level Output Voltage |
Vin = VIH or VIL |
4.5 |
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0.1 |
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0.1 |
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0.1 |
V |
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|Iout| ≤ 20 mA |
5.5 |
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0.1 |
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0.1 |
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0.1 |
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Vin = VIH or VIL |
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|Iout| ≤ 6.0 mA |
4.5 |
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0.26 |
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0.33 |
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0.4 |
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Iin |
Maximum Input Leakage Current |
Vin = VCC or GND |
5.5 |
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±0.1 |
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±1.0 |
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±1.0 |
mA |
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IOZ |
Maximum Three−State Leakage |
Output in High−Impedance State |
5.5 |
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±0.5 |
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±5.0 |
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±10 |
mA |
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Current |
Vin = VIL or VIH |
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Vout = VCC or GND |
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ICC |
Maximum Quiescent Supply Current |
Vin = VCC or GND |
5.5 |
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4.0 |
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40 |
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160 |
mA |
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(per Package) |
Iout = 0 mA |
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DICC |
Additional Quiescent Supply Current |
Vin = 2.4 V, Any One Input |
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≥ −55_C |
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25_C to 125_C |
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Vin = VCC or GND, Other Inputs |
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2.9 |
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2.4 |
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lout = 0 mA |
5.5 |
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mA |
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1. Total Supply Current = ICC + ΣDICC. |
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AC ELECTRICAL CHARACTERISTICS (VCC = 5.0 V ±10%, CL = 50 pF, Input tr = tf = 6.0 ns) |
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Guaranteed Limit |
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Symbol |
Parameter |
−55 to 25_C |
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≤ 85_C |
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≤ 125_C |
Unit |
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fmax |
Maximum Clock Frequency (50% Duty Cycle) |
30 |
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24 |
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20 |
MHz |
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(Figures 1 and 4) |
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tPLH, |
Maximum Propagation Delay, Clock to Q |
31 |
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39 |
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47 |
ns |
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tPHL |
(Figures 1 and 4) |
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tPLZ, |
Maximum Propagation Delay, Output Enable to Q |
30 |
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38 |
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45 |
ns |
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tPHZ |
(Figures 2 and 5) |
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tPZL, |
Maximum Propagation Delay, Output Enable to Q |
30 |
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38 |
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45 |
ns |
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tPZH |
(Figures 2 and 5) |
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tTLH, |
Maximum Output Transition Time, Any Output |
12 |
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15 |
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18 |
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tTHL |
(Figures 1 and 4) |
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Cin |
Maximum Input Capacitance |
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10 |
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10 |
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10 |
pF |
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Cout |
Maximum Three−State Output Capacitance |
15 |
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15 |
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15 |
pF |
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(Output in High−Impedance State) |
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Typical @ 25°C, VCC = 5.0 V |
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CPD |
Power Dissipation Capacitance (Per Flip−Flop)* |
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65 |
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pF |
* Used to determine the no−load dynamic power consumption: PD = CPD VCC2f + ICC VCC.
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3