The MC74HC245A is identical in pinout to the LS245. The device
inputs are compatible with standard CMOS outputs; with pull−up
resistors, they are compatible with LSTTL outputs.
The HC245A is a 3−state noninverting transceiver that is used for
2−way asynchronous communication between data buses. The device
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MARKING
DIAGRAMS
has an active−low Output Enable pin, which is used to place the I/O
ports into high−impedance states. The Direction control determines
whether data flows from A to B or from B to A.
Features
0
1
PDIP−20
N SUFFIX
CASE 738
20
MC74HC245AN
AWLYYWWG
1
• Output Drive Capability: 15 LSTTL Loads
• Outputs Directly Interface to CMOS, NMOS, and TTL
• Operating Voltage Range: 2.0 to 6.0 V
• Low Input Current: 1 mA
• High Noise Immunity Characteristic of CMOS Devices
20
SOIC−20
DW SUFFIX
1
CASE 751D
• In Compliance with the Requirements Defined by JEDEC Standard
No. 7A
• Moisture Sensitivity: MSL1 for All Packages
• Chip Complexity: 308 FETs or 77 Equivalent Gates
• Pb−Free Packages are Available*
20
1
TSSOP−20
DT SUFFIX
CASE 948E
20
74HC245A
AWLYYWWG
1
20
HC
245A
ALYWG
G
1
*For additional information on our Pb−Free strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques
Reference Manual, SOLDERRM/D.
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*This package is inherently Pb−Free.
18 Units / Rail
38 Units / Rail
1000 Tape & Reel
40 Units / Rail
2000 Tape & Reel
†
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2
MC74HC245A
Î
Î
Î
Î
Î
MAXIMUM RATINGS (Note 1)
Symbol
V
V
I
I
T
V
OUT
I
I
OK
OUT
I
CC
GND
STG
T
T
q
P
DC Supply Voltage*0.5 to )7.0V
CC
DC Input Voltage*0.5 to VCC )0.5V
IN
DC Output Voltage(Note 2)*0.5 to VCC )0.5V
DC Input Diode Current$20mA
IK
DC Output Diode Current$35mA
DC Output Sink Current$35mA
DC Supply Current per Supply Pin$75mA
DC Ground Current per Ground Pin$75mA
Storage Temperature Range*65 to )150
Lead Temperature, 1 mm from Case for 10 Seconds260
L
Junction Temperature Under Bias)150
J
Thermal ResistancePDIP
JA
Power Dissipation in Still Air at 85_CPDIP
D
MSLMoisture SensitivityLevel 1
F
V
ESD
I
LATCHUP
Flammability RatingOxygen Index: 30% to 35%UL 94 V−0 @ 0.125 in
R
ESD Withstand VoltageHuman Body Model (Note 3)
Latchup PerformanceAbove VCC and Below GND at 85_C (Note 6)
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 20 ounce copper trace with no air flow.
2. IO absolute maximum rating must observed.
3. Tested to EIA/JESD22−A114−A.
4. Tested to EIA/JESD22−A115−A.
5. Tested to JESD22−C101−A.
6. Tested to EIA/JESD78.
ParameterValueUnit
_C
_C
_C
SOIC
TSSOP
SOIC
TSSOP
Machine Model (Note 4)
Charged Device Model (Note 5)
67
96
128
750
500
450
u2000
u200
u1000
_C/W
mW
V
$300mA
RECOMMENDED OPERATING CONDITIONS
Symbol
V
Vin, V
T
tr, t
ÎÎ
DC Supply Voltage (Referenced to GND)
CC
DC Input Voltage, Output Voltage (Referenced to GND)
out
Operating Temperature, All Package Types
A
Input Rise and Fall TimeVCC = 2.0 V
f
(Figure 3)VCC = 4.5 V
ООООООООООООООООООО
Parameter
VCC = 6.0 V
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3
Min
2.0
0
–55
0
0
ÎÎÎ
0
Max
6.0
V
CC
+125
1000
500
ÎÎ
400
Unit
V
V
_C
ns
Î
ÎÎ
ÎÎ
Î
Î
Î
Î
Î
Î
Î
Î
Î
Î
Î
Î
ÎÎ
ÎÎ
ÎÎ
Î
Î
Î
Î
Î
Î
Î
Î
Î
Î
Î
Î
ÎÎ
ÎÎ
ÎÎ
Î
Î
Î
Î
Î
Î
Î
Î
Î
Î
ÎÎ
ÎÎ
ÎÎ
ÎÎ
Î
Î
Î
Î
Î
Î
Î
Î
Î
Î
Î
Î
Î
Î
ÎÎ
ÎÎ
ÎÎ
ÎÎ
Î
Î
Î
Î
ÎÎ
Î
Î
Î
Î
Î
Î
ÎÎ
ÎÎ
Î
Î
Î
Î
Î
Î
ÎÎ
ÎÎ
Î
l
Î
Î
ÎÎ
ÎÎ
Î
Î
Î
Î
Î
Î
Î
Î
Î
Î
ÎÎ
ÎÎ
ÎÎ
Î
Î
Î
Î
Î
Î
Î
Î
Î
Î
ÎÎ
ÎÎ
ÎÎ
Î
Î
Î
Î
Î
Î
Î
Î
Î
Î
ÎÎ
ÎÎ
ÎÎ
Î
Î
Î
Î
Î
ÎÎ
ÎÎ
ÎÎ
Î
Î
Î
Î
Î
ÎÎ
ÎÎ
PD
MC74HC245A
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
V
Symbol
V
IH
ÎÎ
ÎÎ
V
IL
ÎÎ
ÎÎ
V
OH
ÎÎ
ÎÎ
ÎÎ
V
OL
ÎÎ
ÎÎ
ÎÎ
I
in
I
OZ
ÎÎ
I
CC
ÎÎ
Minimum High−Level Input Voltage
ОООООООО
ОООООООО
Maximum Low−Level Input Voltage
ОООООООО
ОООООООО
Minimum High−Level Output
Voltage
ОООООООО
ОООООООО
ОООООООО
Maximum Low−Level Output
Voltage
ОООООООО
ОООООООО
ОООООООО
Maximum Input Leakage Current
Maximum Three−State Leakage
Current
ОООООООО
Maximum Quiescent Supply
Current (per Package)
ОООООООО
Parameter
Test Conditions
V
= VCC – 0.1 V
out
|I
| v 20 mA
out
ООООООО
ООООООО
V
= 0.1 V
out
|I
| v 20 mA
out
ООООООО
ООООООО
Vin = V
IH
|I
| v 20 mA
out
ООООООО
Vin = V
IH
ООООООО
Vin = V
IL
|I
| v 20 mA
out
ООООООО
Vin = V
IL
ООООООО
|I
| v 2.4 mA
out
|I
| v 6.0 mA
out
|I
| v 7.8 mA
out
|I
| v 2.4 mA
out
|I
| v 6.0 mA
out
|I
| v 7.8 mA
out
Vin = VCC or GND
Output in High−Impedance Stat e
Vin = VIL or V
ООООООО
V
= VCC or GND
out
IH
Vin = VCC or GND
I
= 0 mA
out
ООООООО
2.0
3.0
Î
4.5
Î
6.0
2.0
3.0
Î
4.5
6.0
Î
2.0
4.5
6.0
Î
3.0
4.5
Î
6.0
2.0
4.5
Î
6.0
3.0
4.5
Î
6.0
6.0
6.0
Î
6.0
Î
7. Information on typical parametric values and high frequency or heavy load considerations can be found in th e ON Semic onductor
High−Speed CMOS Data Book (DL129/D).
AC ELECTRICAL CHARACTERISTICS (C
ÎÎ
Symbo
t
PLH
ÎÎ
t
PHL
ÎÎ
t
PLZ
t
PHZ
ÎÎ
ÎÎ
t
PZL
t
PZH
ÎÎ
ÎÎ
t
TLH
t
THL
ÎÎ
ОООООООООООООООО
,
Maximum Propagation Delay,
ОООООООООООООООО
A to B, B to A
(Figures 1 and 3)
ОООООООООООООООО
,
Maximum Propagation Delay,
Direction or Output Enable to A or B
ОООООООООООООООО
(Figures 2 and 4)
ОООООООООООООООО
,
Maximum Propagation Delay,
Output Enable to A or B
ОООООООООООООООО
(Figures 2 and 4)
ОООООООООООООООО
,
Maximum Output Transition Time,
Any Output
(Figures 1 and 3)
ОООООООООООООООО
= 50 pF, Input tr = tf = 6 ns)
L
Parameter
V
Î
2.0
Î
3.0
4.5
Î
6.0
2.0
3.0
Î
4.5
Î
6.0
2.0
3.0
Î
4.5
6.0
Î
2.0
3.0
4.5
Î
6.0
C
Maximum Input Capacitance (Pin 1 or Pin 19)
in
C
ÎÎ
Maximum Three−State I/O Capacitance
out
(I/O in High−Impedance State)
ОООООООООООООООО
Î
8. For propagation delays with loads other than 50 pF, and information on typical parametric values, see the ON Semiconductor High−Speed
CMOS Data Book (DL129/D).
C
9. Used to determine the no−load dynamic power consumption: PD = CPD V
Power Dissipation Capacitance (Per Transceiver Channel) (Note 9)
Semiconductor High−Speed CMOS Data Book (DL129/D).
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2
f + ICC VCC. For load considerations, see the ON
CC
4
–55 to
CC
V
25_C
1.5
2.1
ÎÎ
3.15
ÎÎ
4.2
0.5
0.9
ÎÎ
1.35
1.8
ÎÎ
1.9
4.4
5.9
ÎÎ
2.48
3.98
ÎÎ
5.48
0.1
0.1
ÎÎ
0.1
0.26
0.26
ÎÎ
0.26
± 0.1
± 0.5
ÎÎ
4.0
ÎÎ
Guaranteed Limit
–55 to
CC
25_C
V
75
ÎÎ
55
15
ÎÎ
13
110
90
ÎÎ
22
ÎÎ
19
110
90
ÎÎ
22
19
ÎÎ
60
23
12
ÎÎ
10
−
−
10
15
ÎÎ
Typical @ 25°C, VCC = 5.0 V
v 85_C
1.5
2.1
ÎÎ
3.15
ÎÎ
4.2
0.5
0.9
ÎÎ
1.35
1.8
ÎÎ
1.9
4.4
5.9
ÎÎ
2.34
3.84
ÎÎ
5.34
0.1
0.1
ÎÎ
0.1
0.33
0.33
ÎÎ
0.33
± 1.0
± 5.0
ÎÎ
40
ÎÎ
v 85_C
95
ÎÎ
70
19
ÎÎ
16
140
110
ÎÎ
28
ÎÎ
24
140
110
ÎÎ
28
24
ÎÎ
75
27
15
ÎÎ
13
10
15
ÎÎ
40
v 125_C
v 125_C
1.5
2.1
ÎÎ
3.15
ÎÎ
4.2
0.5
0.9
ÎÎ
1.35
1.8
ÎÎ
1.9
4.4
5.9
ÎÎ
2.2
3.7
ÎÎ
5.2
0.1
0.1
ÎÎ
0.1
0.4
0.4
ÎÎ
0.4
± 1.0
± 10
ÎÎ
160
ÎÎ
110
ÎÎ
80
22
ÎÎ
19
165
130
ÎÎ
33
ÎÎ
28
165
130
ÎÎ
33
28
ÎÎ
90
32
18
ÎÎ
15
10
15
ÎÎ
Unit
V
V
V
V
mA
mA
mA
Unit
ns
ns
ns
ns
pF
pF
pF
INPUT
A OR B
OUTPUT
B OR A
t
PLH
MC74HC245A
V
DIRECTION
t
r
90%
50%
10%
90%
50%
10%
t
TLH
t
f
t
PHL
t
THL
V
CC
GND
OUTPUT
ENABLE
A OR B
A OR B
50%
t
PZLtPLZ
50%
t
PZHtPHZ
50%
50%
10%
90%
CC
GND
V
CC
GND
HIGH
IMPEDANCE
V
OL
V
OH
HIGH
IMPEDANCE
Figure 3. Switching Waveform
TEST POINT
OUTPUT
DEVICE
UNDER
TEST
CL*
*Includes all probe and jig capacitance
Figure 5. Test Circuit
DEVICE
UNDER
TEST
Figure 4. Switching Waveform
TEST POINT
OUTPUT
1 kW
CONNECT TO VCC WHEN
TESTING t
CONNECT TO GND WHEN
CL*
TESTING t
*Includes all probe and jig capacitance
Figure 6. Test Circuit
PLZ
PHZ
AND t
AND t
PZL
PZH
.
.
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5
A
DATA
PORT
A1
A2
A3
A4
A5
A6
MC74HC245A
2
18
B1
3
17
B2
4
16
B3
5
15
B4
6
14
B5
7
13
B6
B
DATA
PORT
DIRECTION
OUTPUT ENABLE
8
A7
9
A8
1
19
Figure 7. Expanded Logic Diagram
12
11
B7
B8
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6
MC74HC245A
SOIC−20
PACKAGE DIMENSIONS
PDIP−20
N SUFFIX
PLASTIC DIP PACKAGE
CASE 738−03
ISSUE E
−T−
SEATING
PLANE
−A−
20
11
B
1
10
C
L
K
M
E
FG
N
D 20 PL
0.25 (0.010)T
J 20 PL
M
M
A
0.25 (0.010)T
M
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION L TO CENTER OF LEAD WHEN
FORMED PARALLEL.
4. DIMENSION B DOES NOT INCLUDE MOLD
FLASH.
DIM MINMAXMINMAX
A25.66 27.171.010 1.070
B6.106.600.240 0.260
C3.814.570.150 0.180
D0.390.550.015 0.022
E
F
G2.54 BSC0.100 BSC
1. DIMENSIONING AND TOLERANCING
PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION:
MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE
MOLD FLASH, PROTRUSIONS OR GATE
BURRS. MOLD FLASH OR GATE BURRS
SHALL NOT EXCEED 0.15 (0.006) PER
SIDE.
4. DIMENSION B DOES NOT INCLUDE
INTERLEAD FLASH OR PROTRUSION.
INTERLEAD FLASH OR PROTRUSION
SHALL NOT EXCEED 0.25 (0.010) PER
SIDE.
5. DIMENSION K DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08
(0.003) TOTAL IN EXCESS OF THE K
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
6. TERMINAL NUMBERS ARE SHOWN
FOR REFERENCE ONLY.
7. DIMENSION A AND B ARE TO BE
DETERMINED AT DATUM PLANE −W−.
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
1
3. DIMENSIONS D AND E DO NOT INCLUDE MOLD
FLASH OR PROTRUSIONS AND ARE MEASURED
AT THE PARTING LINE. MOLD FLASH OR
PROTRUSIONS SHALL NOT EXCEED 0.15 (0.006)
PER SIDE.
4. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
5. THE LEAD WIDTH DIMENSION (b) DOES NOT
INCLUDE DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08 (0.003)
TOTAL IN EXCESS OF THE LEAD WIDTH
DIMENSION AT MAXIMUM MATERIAL CONDITION.
DAMBAR CANNOT BE LOCATED ON THE LOWER
RADIUS OR THE FOOT. MINIMUM SPACE
BETWEEN PROTRUSIONS AND ADJACENT LEAD
c
TO BE 0.46 ( 0.018).
MILLIMETERS
DIM MINMAXMINMAX
−−−2.05−−− 0.081
A
A
0.050.20 0.002 0.008
1
0.350.50 0.014 0.020
b
0.180.27 0.007 0.011
c
12.35 12.80 0.486 0.504
D
5.105.45 0.201 0.215
E
1.27 BSC0.050 BSC
e
H
7.408.20 0.291 0.323
E
0.500.85 0.020 0.033
L
L
1.101.50 0.043 0.059
E
M
Q
1
Z
10
0
_
0.700.90 0.028 0.035
−−−0.81−−− 0.032
INCHES
0 _10
_
_
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9
MC74HC245A
ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
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For additional information, please contact your
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MC74HC245A/D
10
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