
MC14001B Series
B-Suffix Series CMOS Gates
MC14001B, MC14011B, MC14023B,
MC14025B, MC14071B, MC14073B,
MC14081B, MC14082B
The B Series logic gates are constructed with P and N channel
enhancement mode devices in a single monolithic structure
(Complementary MOS). Their primary use is where low power
dissipation and/or high noise immunity is desired.
Features
• Supply Voltage Range = 3.0 Vdc to 18 Vdc
• All Outputs Buffered
• Capable of Driving Two Low−power TTL Loads or One Low−power
Schottky TTL Load Over the Rated Temperature Range.
• Double Diode Protection on All Inputs Except: Triple Diode
Protection on MC14011B and MC14081B
• Pin−for−Pin Replacements for Corresponding CD4000 Series
B Suffix Devices
• These Devices are Pb−Free and are RoHS Compliant
• NLV Prefix for Automotive and Other Applications Requiring
Unique Site and Control Change Requirements; AEC−Q100
Qualified and PPAP Capable
MAXIMUM RATINGS (Voltages Referenced to V
Symbol
V
Vin, V
Iin, I
T
V
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1. Temperature Derating:
Plastic “P and D/DW” Packages: – 7.0 mW/_C From 65_C To 125_C
This device contains protection circuitry to guard against damage due to high
static voltages or electric fields. However, precautions must be taken to avoid
applications of any voltage higher than maximum rated voltages to this
high−impedance circuit. For proper operation, V
to the range V
Unused inputs must always be tied to an appropriate logic voltage level
(e.g., either V
DC Supply Voltage Range −0.5 to +18.0 V
DD
Input or Output Voltage Range
out
(DC or Transient)
Input or Output Current
out
(DC or Transient) per Pin
P
Power Dissipation, per Package
D
(Note 1)
T
Ambient Temperature Range −55 to +125 °C
A
Storage Temperature Range −65 to +150 °C
stg
T
Lead Temperature
L
(8−Second Soldering)
ESD Withstand Voltage
ESD
SS
SS
Parameter Value Unit
Human Body Model
Machine Model
Charged Device Model
v (Vin or V
or VDD). Unused outputs must be left open.
) v VDD.
out
)
SS
−0.5 to VDD + 0.5 V
± 10 mA
500 mW
260 °C
> 3000
> 300
N/A
and V
in
should be constrained
out
V
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MARKING
DIAGRAMS
14
PDIP−14
P SUFFIX
CASE 646
SOIC−14
D SUFFIX
CASE 751A
TSSOP−14
DT SUFFIX
CASE 948G
xx = Specific Device Code
A = Assembly Location
WL, L = Wafer Lot
YY, Y = Year
WW, W = Work Week
G or G = Pb−Free Package
(Note: Microdot may be in either location)
MC140xxBCP
AWLYYWWG
1
14
140xxBG
AWLYWW
1
14
14
0xxB
ALYWG
G
1
DEVICE INFORMATION
Device Description
MC14001B Quad 2−Input NOR Gate
MC14011B Quad 2−Input NAND Gate
MC14023B Triple 3−Input NAND Gate
MC14025B Triple 3−Input NOR Gate
MC14071B Quad 2−Input OR Gate
MC14073B Triple 3−Input AND Gate
MC14081B Quad 2−Input AND Gate
MC14082B Dual 4−Input AND Gate
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 8 of this data sheet.
© Semiconductor Components Industries, LLC, 2013
April, 2013 − Rev. 10
1 Publication Order Number:
MC14001B/D

MC14001B Series
ELECTRICAL CHARACTERISTICS (Voltages Referenced to V
V
DD
Characteristic
Output Voltage “0” Level
V
= VDD or 0
in
“1” Level
V
= 0 or V
in
DD
Input Voltage “0” Level
(V
= 4.5 or 0.5 Vdc)
O
= 9.0 or 1.0 Vdc)
(V
O
(V
= 13.5 or 1.5 Vdc)
O
“1” Level
(V
= 0.5 or 4.5 Vdc)
O
= 1.0 or 9.0 Vdc)
(V
O
(V
= 1.5 or 13.5 Vdc)
O
Output Drive Current
(V
= 2.5 Vdc) Source
OH
= 4.6 Vdc)
(V
OH
(V
= 9.5 Vdc)
OH
(V
= 13.5 Vdc)
OH
(VOL = 0.4 Vdc) Sink
(V
= 0.5 Vdc)
OL
= 1.5 Vdc)
(V
OL
Input Current
Input Capacitance
(V
= 0)
in
Quiescent Current
(Per Package)
Total Supply Current
(3) (4)
(Dynamic plus Quiescent,
Per Gate, C
= 50 pF)
L
Symbol
V
OL
V
OH
V
IL
V
IH
I
OH
I
OL
I
in
C
in
I
DD
I
T
Vdc
5.0
10
15
5.0
10
15
5.0
10
15
5.0
10
15
5.0
5.0
10
15
5.0
10
15
15
5.0
10
15
5.0
10
15
Min
−
−
−
4.95
9.95
14.95
−
−
−
3.5
7.0
11
– 3.0
– 0.64
– 1.6
– 4.2
0.64
1.6
4.2
−
−
−
−
−
−
SS
− 55_C
)
Max
0.05
0.05
0.05
−
−
−
1.5
3.0
4.0
−
−
−
−
−
−
−
−
−
−
± 0.1
−
0.25
0.5
1.0
25_C
Min
−
−
−
4.95
9.95
14.95
−
−
−
3.5
7.0
11
– 2.4
– 0.51
– 1.3
– 3.4
0.51
1.3
3.4
−
−
−
−
−
(2)
Typ
0
0
0
5.0
10
15
2.25
4.50
6.75
2.75
5.50
8.25
– 4.2
– 0.88
– 2.25
– 8.8
0.88
2.25
8.8
± 0.00001
5.0
0.0005
0.0010
0.0015
± 0.1
IT = (0.3 mA/kHz) f + IDD/N
I
= (0.6 mA/kHz) f + IDD/N
T
I
= (0.9 mA/kHz) f + IDD/N
T
Max
0.05
0.05
0.05
−
−
−
1.5
3.0
4.0
−
−
−
−
−
−
−
−
−
−
7.5
0.25
0.5
1.0
Min
−
−
−
4.95
9.95
14.95
−
−
−
3.5
7.0
11
– 1.7
– 0.36
– 0.9
– 2.4
0.36
0.9
2.4
−
−
−
−
−
125_C
Max
0.05
0.05
0.05
−
−
−
1.5
3.0
4.0
−
−
−
−
−
−
−
−
−
−
± 1.0
−
7.5
15
30
Unit
Vdc
Vdc
Vdc
Vdc
mAdc
mAdc
mAdc
pF
mAdc
mAdc
2. Data labelled “Typ” is not to be used for design purposes but is intended as an indication of the IC’s potential performance.
3. The formulas given are for the typical characteristics only at 25_C.
4. To calculate total supply current at loads other than 50 pF:
) = IT(50 pF) + (CL − 50) Vfk
I
T(CL
where: IT is in mA (per package), CL in pF, V = (VDD − VSS) in volts, f in kHz is input frequency, and k = 0.001 x the number of exercised gates
per package.
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MC14001B Series
B−SERIES GATE SWITCHING TIMES
SWITCHING CHARACTERISTICS
Characteristic
Output Rise Time, All B−Series Gates
t
= (1.35 ns/pF) CL + 33 ns
TLH
= (0.60 ns/pF) CL + 20 ns
t
TLH
t
= (0.40 ns/PF) CL + 20 ns
TLH
Output Fall Time, All B−Series Gates
t
= (1.35 ns/pF) CL + 33 ns
THL
= (0.60 ns/pF) CL + 20 ns
t
THL
t
= (0.40 ns/pF) CL + 20 ns
THL
Propagation Delay Time
(5)
(CL = 50 pF, T
= 25_C)
A
t
Symbol
t
TLH
t
THL
, t
PLH
PHL
V
DD
Vdc
5.0
10
15
5.0
10
15
Min
−
−
−
−
−
−
Typ
100
50
40
100
50
40
(6)
Max
200
100
80
200
100
80
MC14001B, MC14011B only
t
, t
PLH
t
PLH
t
PLH
= (0.90 ns/pF) CL + 80 ns
PHL
, t
= (0.36 ns/pF) CL + 32 ns
PHL
, t
= (0.26 ns/pF) CL + 27 ns
PHL
5.0
10
15
−
−
−
125
50
40
250
100
80
All Other 2, 3, and 4 Input Gates
t
PLH
t
PLH
t
PLH
, t
= (0.90 ns/pF) CL + 115 ns
PHL
, t
= (0.36 ns/pF) CL + 47 ns
PHL
, t
= (0.26 ns/pF) CL + 37 ns
PHL
5.0
10
15
−
−
−
160
65
50
300
130
100
8−Input Gates (MC14068B, MC14078B)
t
PLH
t
PLH
t
PLH
, t
= (0.90 ns/pF) CL + 155 ns
PHL
, t
= (0.36 ns/pF) CL + 62 ns
PHL
, t
= (0.26 ns/pF) CL + 47 ns
PHL
5.0
10
15
−
−
−
200
80
60
350
150
110
5. The formulas given are for the typical characteristics only at 25_C.
6. Data labelled “Typ” is not to be used for design purposes but is intended as an indication of the IC’s potential performance.
Unit
ns
ns
ns
V
14
DD
PULSE
GENERATOR
INPUT
*
C
OUTPUT
L
VSS7
*All unused inputs of AND, NAND gates must be connected to VDD.
All unused inputs of OR, NOR gates must be connected to V
SS
.
Figure 1. Switching Time Test Circuit and Waveforms
20 ns 20 ns
INPUT
OUTPUT
INVERTING
OUTPUT
NON-INVERTING
t
PHL
t
t
THL
PLH
V
0 V
V
V
V
V
DD
OH
OL
OH
OL
90%
50%
10%
90%
t
TLH
50%
10%
90%
50%
10%
t
PLH
t
TLH
t
PHL
t
THL
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