The MC14043B and MC14044B quad R–S latches are constructed
with MOS P–channel and N–channel enhancement mode devices in a
single monolithic structure. Each latch has an independent Q output
and set and reset inputs. The Q outputs are gated through three–state
buffers having a common enable input. The outputs are enabled with a
logical “1” or high on the enable input; a logical “0” or low
disconnects the latch from the Q outputs, resulting in an open circuit at
the Q outputs.
• Double Diode Input Protection
• Three–State Outputs with Common Enable
• Outputs Capable of Driving T wo Low–power TTL Loads or One
Low–Power Schottky TTL Load Over the Rated T emperature Range
• Supply Voltage Range = 3.0 Vdc to 18 Vdc
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16
PDIP–16
P SUFFIX
CASE 648
16
SOIC–16
D SUFFIX
CASE 751B
MARKING
DIAGRAMS
MC140XXBCP
AWLYYWW
1
140XXB
AWLYWW
1
MAXIMUM RATINGS (Voltages Referenced to V
Symbol
V
DD
Vin, V
Iin, I
P
T
T
stg
T
2. Maximum Ratings are those values beyond which damage to the device
may occur.
3. Temperature Derating:
Plastic “P and D/DW” Packages: – 7.0 mW/_C From 65_C To 125_C
This device contains protection circuitry to guard against damage due to high
static voltages or electric fields. However, precautions must be taken to avoid
applications of any voltage higher than maximum rated voltages to this
high–impedance circuit. For proper operation, V
to the range V
Unused inputs must always be tied to an appropriate logic voltage level (e.g.,
either V
DC Supply Voltage Range–0.5 to +18.0V
Input or Output Voltage Range
out
Input or Output Current
out
Power Dissipation,
D
Ambient Temperature Range–55 to +125°C
A
Storage Temperature Range–65 to +150°C
Lead Temperature
L
SS
or VDD). Unused outputs must be left open.
SS
ParameterValueUnit
(DC or Transient)
(DC or Transient) per Pin
per Package (Note 3.)
(8–Second Soldering)
v (Vin or V
) v VDD.
out
) (Note 2.)
SS
–0.5 to VDD + 0.5V
±10mA
500mW
260°C
and V
in
should be constrained
out
16
SOEIAJ–16
F SUFFIX
CASE 966
XX= Specific Device Code
A= Assembly Location
WL or L = Wafer Lot
YY or Y = Year
WW or W = Work Week
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.127 (0.005) TOTAL
IN EXCESS OF THE D DIMENSION AT
MAXIMUM MATERIAL CONDITION.
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS D AND E DO NOT INCLUDE
MOLD FLASH OR PROTRUSIONS AND ARE
Q
1
c
MEASURED AT THE PARTING LINE. MOLD FLASH
OR PROTRUSIONS SHALL NOT EXCEED 0.15
(0.006) PER SIDE.
4. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
5. THE LEAD WIDTH DIMENSION (b) DOES NOT
INCLUDE DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08 (0.003)
TOTAL IN EXCESS OF THE LEAD WIDTH
DIMENSION AT MAXIMUM MATERIAL CONDITION.
DAMBAR CANNOT BE LOCATED ON THE LOWER
RADIUS OR THE FOOT. MINIMUM SPACE
BETWEEN PROTRUSIONS AND ADJACENT LEAD
TO BE 0.46 ( 0.018).
MILLIMETERS
DIM MINMAXMINMAX
–––2.05––– 0.081
A
A
0.050.20 0.0020.008
1
0.350.50 0.0140.020
b
0.180.27 0.0070.011
c
9.90 10.500.390 0.413
D
5.105.45 0.2010.215
E
1.27 BSC0.050 BSC
e
H
7.408.20 0.2910.323
E
0.500.85 0.0200.033
L
L
1.101.50 0.043 0.059
E
0
M
_
Q
0.700.90 0.0280.035
1
–––0.78––– 0.031
Z
INCHES
10
_
10
0
_
_
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7
MC14043B, MC14044B
ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes
without further notice to any products herein. SCILLC makes no warranty , representation or guarantee regarding the suitability of its products for any particular
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including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be
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8
MC14043B/D
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