The MC100EP91 is a triple any level positive input to NECL output
translator. The device accepts LVPECL, LVTTL, LVCMOS, HSTL,
CML or LVDS signals, and translates them to differential NECL
output signals (−3.0 V/−5.5 V).
To accomplish the level translation the EP91 requires three power
rails. The V
and the V
The GND pins are connected to the system ground plane. Both V
and VCC should be bypassed to ground via 0.01 mF capacitors.
Under open input conditions, the D
and the D input will be pulled to GND. These conditions will force the
Q outputs to a low state, and Q outputs to a high state, which will
ensure stability.
The V
this device only. For single-ended input conditions, the unused
differential input is connected to V
V
may also rebias AC coupled inputs. When used, decouple V
BB
and VCC via a 0.01 mF capacitor and limit current sourcing or sinking
to 0.5 mA. When not used, V
Features
• Maximum Input Clock Frequency = > 2.0 GHz Typical
• Maximum Input Data Rate = > 2.0 Gb/s Typical
• 500 ps Typical Propagation Delay
• Operating Range:
V
CC
• Q Output will Default LOW with Inputs Open or at GND
• These Devices are Pb-Free, Halogen Free and are RoHS Compliant
pins should be connected to the positive power supply,
CC
pin should be connected to the negative power supply.
EE
input will be biased at VCC/2
pin, an internally generated voltage supply, is available to
BB
as a switching reference voltage.
BB
should be left open.
BB
= 2.375 V to 3.8 V; VEE = −3.0 V to −5.5 V; GND = 0 V
EE
BB
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20
1
SOIC−20 WB
DW SUFFIX
CASE 751D
MARKING DIAGRAMS*
20
MC100EP91
AWLYYWWG
1
SOIC−20 WBQFN−24
A= Assembly Location
WL, L= Wafer Lot
YY, Y= Year
WW, W = Work Week
G or G= Pb-Free Package
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D
1Publication Order Number:
.
MC100EP91/D
MC100EP91
Positive Level
Input
D0
R1
R2
D0
R1
D1
R1
R2
D1
R1
D2
R1
R2
D2
R1
Figure 1. Logic Diagram
Table 1. PIN DESCRIPTION
Pin
SOICQFN
1, 203, 4, 12V
1015, 16V
NameI/O
CC
EE
−−Positive Supply Voltage. All VCC Pins must be Externally
−−Negative Supply Voltage. All VEE Pins must be Externally
14, 1719, 20, 23,24GND−−Ground
Default
State
Connected to Power Supply to Guarantee Proper
Operation
Connected to Power Supply to Guarantee Proper
Operation
NECL Output
Q0
Q0
Q1
Q1
Q2
Q2
V
CC
V
BB
GND
V
EE
Description
4, 77, 11V
BB
2, 5, 85, 8, 13D[0:2]LVPECL, LVDS, LVTTL,
−−ECL Reference Voltage Output
Low
Noninverted Differential Inputs [0:2]. Internal 75 kW to GND.
LVCMOS, CML, HSTL Input
3, 6, 96, 9, 14D[0:2]LVPECL, LVDS,
LVTTL,LVCMOS, CML,
HSTL Input
High
Inverted Differential Inputs [0:2]. Internal 75 kW to GND and
75 kW to V
(VCC − GND) / 2
. When Inputs are Left Open They Default to
CC
19,16,132, 22, 18Q[0:2]NECL Output−Noninverted Differential Outputs [0:2]. Typically Terminated
with 50 W to V
= VCC − 2 V
TT
18,15,121, 21, 17Q[0:2]NECL Output−Inverted Differential Outputs [0:2]. Typically Terminated with
50 W to V
= VCC − 2 V
TT
1110NC−−No Connect. The NC Pin is NOT Electrically Connected to
the Die and may Safely be Connected to Any Voltage from
V
to V
EE
CC
N/A−EP−Exposed Pad (Note 1)
1. The thermally conductive exposed pad on the package bottom (see case drawing) must be attached to a heat−sinking conduit and may
only be electrically connected to V
(not GND).
EE
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2
MC100EP91
GND GNDQ1
Exposed Pad
GND
GNDQ1
(EP)
192423222021
VCCQ0
1920
Q0
Q1 Q1Q2 Q2 NC
GNDGND
17181615141312
MC100EP91
43
56789
V
BB
D1D1D2
V
BB
CC
21
D0
D0D2V
Figure 2. SOIC−20 Lead Pinout (Top View)
Q0
1
Q0
2
11
10
V
EE
3
V
CC
4
V
CC
5
D0
6
D0
7891110
BB
MC100EP91
D1
D1
12
V
NCV
BB
V
CC
Figure 3. QFN−24Lead Pinout (Top View)*
Q2
18
Q2
17
V
16
EE
15
V
EE
14
D2
D2
13
*All VCC, VEE and GND pins must be externally connected to a power supply and the underside exposed pad must be attached to an adequate
heat−sinking conduit to guarantee proper operation.
Table 2. ATTRIBUTES
CharacteristicsValue
Internal Input Pulldown Resistor (R1)
Internal Input Pullup Resistor (R2)
ESD Protection
Human Body Model
Machine Model
Charged Device Model
Moisture Sensitivity (Note 1)Pb-Free Pkg
SOIC−20 WB
QFN−24
Flammability Rating
Oxygen Index: 28 to 34
Transistor Count446 Devices
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1. For additional information, see Application Note AND8003/D.
75 kW
75 kW
> 2 kV
> 150 V
> 2 kV
Level 3
Level 1
UL 94 V−0 @ 0.125 in
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3
MC100EP91
Table 3. MAXIMUM RATINGS
SymbolParameterCondition 1Condition 2RatingUnit
V
V
V
T
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
Positive Power SupplyGND = 0 V3.8 to 0V
CC
Negative Power SupplyGND = 0 V−6V
EE
V
Positive Input VoltageGND = 0 VVI ≤ V
I
Operating VoltageGND = 0 VVCC − V
OP
I
Output CurrentContinuous
out
I
PECL VBB Sink/Source±0.5mA
BB
T
Operating Temperature Range−40 to +85°C
A
Storage Temperature Range−65 to +150°C
stg
Thermal Resistance (Junction-to-Ambient)
q
JA
JESD 51−3 (1S-Single Layer Test Board)
Thermal Resistance (Junction-to-Ambient)
q
JA
JESD 51−6 (2S2P Multilayer Test Board) with Filled Thermal Vias
RMS Random Clock Jitter (Note 4)fin = 2.0 GHz
Peak-to-Peak Data Dependant Jitter f
(Note 5)
= 2.0 Gb/s
in
Input Voltage Swing (Differential Configuration)
(Note 6)
Output Rise/Fall Times @ 50 MHz (20%−80%)
Q, Q
MinTypMaxMinTypMaxMinTy pMax
575
525
300
375
300
800
750
600
500
450
15
25
50
600
650
75
95
125
600
525
250
375
300
800
750
550
500
450
15
30
50
600
675
75
105
125
550
400
150
400
300
800
750
500
550
500
15
30
70
650
750
80
105
150
Unit
mV
ps
ps
0.5202.00.5202.00.5202.0ps
200800120020080012002008001200mV
ps
751502507515025075150275
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm.
1. Measured using a 750 mV source, 50% duty cycle clock source. All loading with 50 W to GND − 2.0 V. Input edge rates 150 ps (20% − 80%).
2. Pulse Skew = |t
3. Skews are valid across specified voltage range, part-to-part skew is for a given temperature.
4. RMS Jitter with 50% Duty Cycle Input Clock Signal.
5. Peak-to-Peak Jitter with input NRZ PRBS 2
PLH
− t
PHL
|
31−1
at 2.0 Gb/s.
6. Input voltage swing is a Single-Ended measurement operating in differential mode. The device has a DC gain of ≈ 50.
850
750
650
550
(mV)
450
350
OUTPUT VOLTAGE AMPLITUDE
RMS JITTER
250
0.51.01.52.02.5
INPUT FREQUENCY (GHz)
Figure 4. Output Voltage Amplitude (V
Input Frequency (f
D
D
Q
Q
t
PLH
) at Ambient Temperature (Typical)
in
Figure 5. AC Reference Measurement
AMP
) / RMS Jitter vs.
OUTPP
V
INPP
V
OUTPP
t
PHL
10
9.0
8.0
7.0
6.0
5.0
4.0
RMS JITTER (ps)
3.0
2.0
1.0
0
= VIH(D) − VIL(D)
= VOH(Q) − VOL(Q)
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6
MC100EP91
Application Information
All MC100EP91 inputs can accept LVPECL, LVTTL,
LVCMOS, HSTL, CML, or LVDS signal levels. The
limitations for differential input signal (LVDS, HSTL,
LVPECL, or CML) are the minimum input swing of 150 mV
V
CC
LVPECL
Driver
GND
Z
Z
50 W
= VCC − 2.0 V
V
TT
50 W
Figure 6. Standard LVPECL Interface
V
CC
D
EP91
D
GNDV
V
CC
EE
V
CC
and the maximum input swing of 3.0 V. Within these
conditions, the input voltage can range from V
to GND.
CC
Examples interfaces are illustrated below in a 50 W
environment (Z = 50 W).
V
CC
LVDS
Driver
GNDGNDV
Z
100 W
Z
Figure 7. Standard LVDS Interface
V
CC
V
CC
V
CC
D
EP91
D
EE
V
CC
50 W
50 W
HSTL
Driver
GNDGNDV
Z
Z
50 W50 W
GND
Figure 8. Standard HSTL Interface
V
CC
LVTTL
Driver
(externally generated
reference voltage)
Z
1.5 V
D
EP91
D
V
EE
CML
Driver
GNDGND
Figure 9. Standard 50 W Load CML Interface
V
CC
D
EP91
D
V
CC
LVCMOS
Driver
Z
Z
Z
Open
D
EP91
D
V
D
EP91
D
EE
CC
GND
Figure 10. Standard LVTTL Interface
GNDV
V
EE
GNDGND
Figure 11. Standard LVCMOS Interface
(D
will default to VCC/2 when left open.
A reference voltage of V
to D input, if D
is interfaced to CMOS signals)
/2 should be applied
CC
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7
EE
MC100EP91
QD
Driver
Device
QD
Figure 12. Typical Termination for Output Driver and Device Evaluation
(See Application Note AND8020/D
Resource Reference of Application Notes
AN1405/D− ECL Clock Distribution Techniques
AN1406/D− Designing with PECL (ECL at +5.0 V)
AN1503/D−
AN1504/D− Metastability and the ECLinPS Family
AN1568/D− Interfacing Between LVDS and ECL
AN1672/D− The ECL Translator Guide
AND8001/D − Odd Number Counters Design
AND8002/D − Marking and Date Codes
AND8020/D − Termination of ECL Logic Devices
AND8066/D − Interfacing with ECLinPS
AND8090/D − AC Characteristics of ECL Devices
ECLinPSt I/O SPiCE Modeling Kit
Zo = 50 W
Zo = 50 W
Receiver
Device
50 W50 W
V
VTT = GND − 2.0 V
TT
− Termination of ECL Logic Devices)
ECLinPS is a trademark of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or other countries.
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8
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
24
1
SCALE 2:1
D
PIN 1
REFEENCE
2X
0.15 C
2X
0.15 C
TOP VIEW
DETAIL B
0.10 C
0.08 C
NOTE 4
DETAIL A
1
SIDE VIEW
D2
7
24
e
e/2
BOTTOM VIEW
RECOMMENDED
SOLDERING FOOTPRINT
4.30
2.90
1
A3
A
B
E
A
SEATING
24X
C
PLANE
L
A1
13
E2
19
24X
b
0.10B
AC
NOTE 3
0.05
C
24X
0.55
QFN24, 4x4, 0.5P
CASE 485L
ISSUE B
L1
DETAIL A
ALTERNATE
CONSTRUCTIONS
MOLD CMPDEXPOSED Cu
DETAIL B
ALTERNATE TERMINAL
CONSTRUCTIONS
DATE 05 JUN 2012
A3
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME
Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED TERMINAL
AND IS MEASURED BETWEEN 0.25 AND 0.30 MM
FROM THE TERMINAL TIP.
4. COPLANARITY APPLIES TO THE EXPOSED PAD
AS WELL AS THE TERMINALS.
MILLIMETERS
DIM MINMAX
A0.801.00
A10.000.05
A30.20 REF
b0.200.30
D4.00 BSC
D22.702.90
E4.00 BSC
E22.702.90
e0.50 BSC
L0.300.50
L10.050.15
L
L
A1
GENERIC
MARKING DIAGRAM*
XXXXX
XXXXX
ALYWG
G
XXXXX = Specific Device Code
A= Assembly Location
L= Wafer Lot
Y= Year
W= Work Week
G= Pb−Free Package
(Note: Microdot may be in either location)
*This information is generic. Please refer to
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “ G”,
may or may not be present.
24X
0.32
4.30
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
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3. DIMENSIONS D AND E DO NOT INCLUDE MOLD
PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 PER SIDE.
5. DIMENSION B DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE PROTRUSION
SHALL BE 0.13 TOTAL IN EXCESS OF B
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
MILLIMETERS
DIM MINMAX
A2.352.65
A10.100.25
b0.350.49
c0.230.32
D 12.65 12.95
E7.407.60
e1.27 BSC
L
H 10.05 10.55
h0.250.75
L0.500.90
q0 7
__
GENERIC
MARKING DIAGRAM*
20
XXXXXXXXXXX
XXXXXXXXXXX
AWLYYWWG
11.00
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XXXXX = Specific Device Code
1
10
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1.27
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DIMENSIONS: MILLIMETERS
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