
ook, halfpage
DISCRETE SEMICONDUCTORS
M3D187
PMSS3904
NPN switching transistor
Product data sheet
Supersedes data of 1997 Sep 03
1999 May 27

NXP Semiconductors Product data sheet
NPN switching transistor PMSS3904
FEATURES
• Low current (max. 100 mA)
• Low voltage (max. 40 V).
APPLICATIONS
• General purpose switching and amplification
• Telephony and professional communication equipment.
DESCRIPTION
NPN switching transistor in an SC-70 (SOT323) plastic
package. PNP complement: PMSS3906.
MARKING CODE
T YPE NUMBER MARKING CODE
(1)
PMSS3904 ∗04
Note
1. ∗ = - : Made in Hong Kong.
∗ = t : Made in Malaysia.
PINNING
PIN DESCRIPTION
1 base
2 emitter
3 collector
handbook, halfpage
Top view
3
1
1
2
MAM062
Fig.1 Simplified outline (SC-70; SOT323)
and symbol.
3
2
LIMITING VALUES
In accordance with the Absolu te Maximum Rating System (IEC 134).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
V
V
I
I
I
P
T
T
T
CBO
CEO
EBO
C
CM
BM
tot
stg
j
amb
collector-base voltage open emitter − 60 V
collector-emitter voltage open base − 40 V
emitter-base voltage open collector − 6 V
collector current (DC) − 100 mA
peak collector current − 200 mA
peak base current − 200 mA
total power dissipation T
≤ 25 °C; note 1 − 200 mW
amb
storage temperature −65 +150 °C
junction temperature − 150 °C
operating ambient temperature −65 +150 °C
Note
1. Transistor mounted on an FR4 printed-circuit board.
1999 May 27 2

NXP Semiconductors Product data sheet
NPN switching transistor PMSS3904
THERMAL CHARACTERISTICS
SYMBOL PARAMETER CONDITIONS VALUE UNIT
R
th j-a
Note
1. Transistor mounted on an FR4 printed-circuit board.
CHARACTERISTICS
T
= 25 °C unless otherwise specified.
amb
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
I
CBO
I
EBO
h
FE
V
CEsat
V
BEsat
C
c
C
e
f
T
F noise figure IC = 100 μA; VCE = 5 V; RS = 1 kΩ
Switching times (between 10% and 90% levels); see Fig.3
t
on
t
d
t
r
t
off
t
s
t
f
thermal resistance from junction to ambient note 1 625 K/W
collector cut-off current IE = 0; VCB = 30 V − 50 nA
IE = 0; VCB = 30 V; Tj = 150 °C − 10 μA
emitter cut-off current IC = 0; VEB = 5 V − 50 nA
DC current gain VCE = 1 V; see Fig.2
IC = 0.1 mA 40 −
IC = 1 mA 70 −
IC = 10 mA 100 300
IC = 50 mA; note 1 60 −
IC = 100 mA; note 1 30 −
collector-emitter saturation voltage IC = 10 mA; IB = 1 mA − 200 mV
IC = 50 mA; IB = 5 mA; note 1 − 300 mV
base-emitter saturation vo ltage IC = 10 mA; IB = 1 mA 650 850 mV
IC = 50 mA; IB = 5 mA; note 1 − 950 mV
collector capacitance IE = ie = 0; VCB = 5 V; f = 1 MHz − 4 pF
emitter capacitance IC = ic = 0; VEB = 0.5 V; f = 1 MHz − 12 pF
transition frequency IC = 10 mA; VCE = 20 V; f = 100 MHz 180 − MHz
− 5 dB
f = 10 Hz to 15.7 KHz
turn-on time I
delay time − 50 ns
rise time − 60 ns
= 10 mA; I
Con
I
= − 1 mA; VCC = 3 V;
Boff
Bon
VBB = −1.9 V
= 1 mA;
− 110 ns
turn-off time − 1200 ns
storage time − 1000 ns
fall time − 200 ns
Note
1. Pulse test: tp ≤ 300 μs; δ ≤ 0.02.
1999 May 27 3

NXP Semiconductors Product data sheet
NPN switching transistor PMSS3904
300
handbook, full pagewidth
h
FE
200
100
0
−2
10
MBH724
VCE = 5 V
−1
10
1
10 10
2
10
IC (mA)
3
Fig.2 DC gain current; typical values.
BB
handbook, full pagewidth
oscilloscope
V
i
(probe)
450 Ω
R2
R
B
CC
R
C
V
(probe)
o
450 Ω
oscilloscope
DUT
R1
MLB826
Vi = 5 V; T = 500 μs; tp = 10 μs; tr = tf ≤ 3 ns.
R1 = 56 Ω; R2 = 2.5 kΩ; RB = 3.9 kΩ; RC = 270 Ω.
Oscilloscope: input impedance Zi = 50 Ω.
Fig.3 Test circuit for switching times.
1999 May 27 4

NXP Semiconductors Product data sheet
NPN switching transistor PMSS3904
PACKAGE OUTLINE
Plastic surface mounted package; 3 leads SOT32
D
y
3
A
12
e
b
1
p
e
B
w
M
E
AB
X
H
E
Q
A
1
L
p
detail X
v
M
A
c
0 1 2 mm
scale
DIMENSIONS (mm are the original dimensions)
A
1
UNIT
A
1.1
mm
0.8
OUTLINE
VERSION
SOT323 SC-70
max
0.1
b
cD
p
0.4
0.25
0.10
2.2
1.8
0.3
IEC JEDEC EIAJ
E
1.35
1.3
1.15
REFERENCES
e
e1H
0.65
2.2
2.0
L
Qwv
p
E
0.45
0.15
0.23
0.13
0.20.2
EUROPEAN
PROJECTION
ISSUE DATE
97-02-28
1999 May 27 5

NXP Semiconductors Product data sheet
NPN switching transistor PMSS3904
DATA SHEET STATUS
DOCUMENT
STATUS
Objective data sheet Development This document contains data from the objective specification for product
Preliminary data sheet Qualification This document contains data from the preliminary specification.
Product data sheet Production This document contains the product specification.
Notes
1. Please consult the most recently issued document before initiating or completing a design.
2. The product status of device(s) described in this document may have changed since this do cument was published
and may differ in case of multiple devices. The latest product status information is available on the Internet at
URL http://www.nxp.com.
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Applications ⎯ Applications that are described herein for
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NXP Semiconductors makes no representation or
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specified use without further testing or modificati on .
(1)
PRODUCT
STATUS
(2)
DEFINITION
development.
above those given in the Characteristics sections of this
document is not implied. Exposure to limiting values for
extended periods may affect device reliability.
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Quick reference data ⎯ The Quick reference data is an
extract of the product data given in the Limiting values and
Characteristics sections of this document, and as such is
not complete, exhaustive or legally binding.
Limiting values ⎯ Stress above one or more limiting
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) may cause permanent damage to
the device. Limiting values are stress ratings only an d
operation of the device at these or any other conditions
1999 May 27 6

NXP Semiconductors
Customer notification
This data sheet was changed to reflect the new company name NXP Semiconductors . No changes were
made to the content, except for the legal definitions and disclaimers.
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The information presented in this documen t d oes not form part of any quotation or contract, is believe d to be accurate and reliable and may be changed
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Printed in The Netherlands 115002/04/pp7 Date of release: 1999 May 27 Document order numbe r : 9397 750 05965