NXP BCV29, BCV49 Schematic [ru]

DATA SH EET
ook, halfpage
DISCRETE SEMICONDUCTORS
M3D109
BCV29; BCV49
NPN Darlington transistors
Product data sheet Supersedes data of 1999 Apr 08
2004 Dec 06
NXP Semiconductors Product data sheet
7
NPN Darlington transistors BCV29; BCV49

FEATURES

High current (max. 500 mA)
Low voltage (max. 60 V)
High DC current gain (min. 20 000).

APPLICATIONS

Preamplifier input applications.

DESCRIPTION

NPN small-signal Darlington transistor in a surface mount SOT89 plastic package. PNP complements: BCV28 and BCV48.

MARKING

T YPE NUMBER MARKING CODE
BCV29 EF BCV49 EG

ORDERING INFORMATION

PINNING

PIN DESCRIPTION
1 emitter 2 collector 3 base
TR1
321
Fig.1 Simplified outline (SOT89) and symbol.
23
TR2
1
sym08
T YPE NUMBER
PACKAGE
NAME DESCRIPTION VERSION
BCV29 SC-62 plastic surface mounted package; collector pad for good heat BCV49
transfer; 3 leads
SOT89
2004 Dec 06 2
NXP Semiconductors Product data sheet
NPN Darlington transistors BCV29; BCV49

LIMITING VALUES

In accordance with the Absolu te Maximum Rating System (IEC 60134).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
V
V I I I P T T T
CBO
CES
EBO C CM BM
tot
stg
j
amb
collector-base voltage open emitter
BCV29 40 V BCV49 80 V
collector-emitter voltage VBE = 0 V
BCV29 30 V
BCV49 60 V emitter-base voltage open collector 10 V collector current (DC) 500 mA peak collector current 1 A peak base current 200 mA total power dissipation T
25 °C; note 1 1.3 W
amb
storage temperature 65 +150 °C junction temperature 150 °C ambient temperature 65 +150 °C
Note
1. Device mounted on a printed-circuit board, single-sided copp er, tin-plated, mounting pad for collector 1 cm2. For other mounting conditions, see “Thermal considerations for SOT89 in the General Part of associated Handbook”.

THERMAL CHARACTERISTICS

SYMBOL PARAMETER CONDITIONS VALUE UNIT
R R
th(j-a) th(j-s)
thermal resistance from junction to ambient note 1 96 K/W thermal resistance from junction to soldering point 16 K/W
Note
1. Device mounted on a printed-circuit board, single-sided copp er, tin-plated, mounting pad for collector 1 cm2. For other mounting conditions, see “Thermal considerations for SOT89 in the General Part of associated Handbook”.
2004 Dec 06 3
NXP Semiconductors Product data sheet
NPN Darlington transistors BCV29; BCV49

CHARACTERISTICS

T
= 25 °C unless otherwise specified.
amb
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
I
CBO
I
EBO
h
V V V f
T
FE
CEsat BEsat BEon
collector-base cut-off curren t
BCV29 IE = 0 A; VCB = 30 V 100 nA
BCV49 IE = 0 A; VCB = 60 V 100 nA emitter-base cut-off current IC = 0 A; VEB = 10 V 100 nA DC current gain VCE = 5 V; s ee Fig.2
BCV29 IC = 1 mA 4 000
IC = 10 mA 10 000 IC = 100 mA 20 000 IC = 500 mA 4 000
DC current gain VCE = 5 V; s ee Fig.2
BCV49 IC = 1 mA 2 000
IC = 10 mA 4 000 IC = 100 mA 10 000
IC = 500 mA 2 000 collector-emitter saturation voltage IC = 100 mA; IB = 0.1 mA 1 V base-emitter saturation vo ltage IC = 100 mA; IB = 0.1 mA 1.5 V base-emitter on-state voltage IC = 10 mA; VCE = 5 V 1.4 V transition frequency IC = 30 mA; VCE = 5 V; f = 100 MHz 220 MHz
2004 Dec 06 4
NXP Semiconductors Product data sheet
NPN Darlington transistors BCV29; BCV49
80000
handbook, full pagewidth
h
FE
60000
40000
20000
0
1
10
VCE = 2 V.
1
10 10
Fig.2 DC current gain; typical values.
MGD837
2
IC (mA)
3
10
2004 Dec 06 5
NXP Semiconductors Product data sheet
9
NPN Darlington transistors BCV29; BCV49

PACKAGE OUTLINE

Plastic surface-mounted package; collector pad for good heat transfer; 3 leads SOT8
w M
D
b
p3
123
b
p2
b
p1
e
1
e
B
A
E
L
p
H
E
c
0 2 4 mm
scale
DIMENSIONS (mm are the original dimensions)
UNIT
A
b
p1
1.6
1.4
0.48
0.35
mm
OUTLINE VERSION
SOT89 TO-243 SC-62
b
b
0.53
0.40
p3
p2
1.8
1.4
IEC JEDEC JEITA
c
0.44
0.23
D
4.6
4.4
REFERENCES
2.6
2.4
e
e
1.5
H
1
E
4.25
3.75
E
3.0
L
1.2
0.8
w
p
0.13
EUROPEAN
PROJECTION
ISSUE DATE
04-08-03 06-03-16
2004 Dec 06 6
NXP Semiconductors Product data sheet
NPN Darlington transistors BCV29; BCV49

DATA SHEET STATUS

DOCUMENT
STATUS
Objective data sheet Development This docume nt contains data from the objective specification for product
Preliminary data sheet Qualification This document contains data from the preliminary specification. Product data sheet Production This document contains the produc t specification.
Notes
1. Please consult the most recently issued document before initiating or completing a design.
2. The product status of device(s) desc ribed in this document may have changed since this document was pub lished and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com.
DISCLAIMERS General Information in this document is believed to be
accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information.
Right to make changes NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof.
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Applications ⎯ Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modificati on .
(1)
PRODUCT STATUS
(2)
DEFINITION
development.
above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability.
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Quick reference data The Quick reference data is an extract of the product data given in the Limiting values and Characteristics sections of this document, and as such is not complete, exhaustive or legally binding.
Limiting values Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only an d operation of the device at these or any other conditions
2004 Dec 06 7
NXP Semiconductors
Customer notification
This data sheet was changed to reflect the new company name NXP Semiconductors, including new legal definitions and disclaimers. No changes were made to the technical content, except for package outline drawings which were updated to the latest version.
Contact information
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© NXP B.V. 2009 All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this documen t d oes not form part of any quotation or contract, is believe d t o b e a ccur ate a nd re li a ble and may be chan ged without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industri al or intellectual property rights.
Printed in The Netherlands R75/06/pp8 Date of release: 2004 Dec 06 Document order number: 9397 750 13863
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