Dual N-channel enhancement mode Field-Effect Transistor (FET) in a very small
SOT363 (SC-88) Surface-Mounted Device (SMD) plastic package using Trench MOSFET
technology.
1.2Features and benefits
Logic-level compatible
Very fast switching
Trench MOSFET technology
ESD protection up to 2 kV
AEC-Q101 qualified
In accordance with the Absolute Maximum Rating System (IEC 60134).
SymbolParameterConditionsMinMaxUnit
I
DM
P
tot
Source-drain diode
I
S
ESD maximum rating
V
ESD
Per device
P
tot
T
j
T
amb
T
stg
2N7002BKS
60 V, 300 mA dual N-channel Trench MOSFET
peak drain currentT
total power dissipationT
source currentT
electrostatic discharge
voltage
total power dissipationT
junction temperature150°C
ambient temperature−55+150°C
storage temperature−65+150°C
amb
=25°C;
-1.2A
single pulse; tp≤ 10 μs
=25°C
amb
=25°C-1040mW
T
sp
=25°C
amb
human body model
=25°C
amb
[2]
-295mW
[1]
-340mW
[1]
-300mA
[3]
-2000V
[2]
-445mW
[1] Device mounted on an FR4 PCB, single-sided copper, tin-plated, mounting pad for drain 1 cm2.
[2] Device mounted on an FR4 Printed-Circuit Board (PCB), single-sided copper, tin-plated and standard
Product data sheetRev. 2 — 23 September 2010 3 of 16
NXP Semiconductors
017aaa056
2N7002BKS
60 V, 300 mA dual N-channel Trench MOSFET
10
I
D
(A)
1
−1
10
−2
10
−3
10
−1
10
I
= single pulse
DM
= 100 μs
(1) t
p
=1ms
(2) t
p
=10ms
(3) t
p
(4) DC; T
(5) t
(6) DC; T
sp
= 100 ms
p
amb
=25°C
=25°C; drain mounting pad 1 cm
Fig 3.Safe operating area; junction to ambient; continuous and peak drain currents as a function of
drain-source voltage
Limit R
DSon
2
= VDS/I
D
101
VDS (V)
(1)
(2)
(3)
(4)
(5)
(6)
2
10
6. Thermal characteristics
Table 6.Thermal characteristics
SymbolParameterConditionsMinTypMaxUnit
Per transistor
R
th(j-a)
R
th(j-sp)
Per device
R
th(j-a)
[1] Device mounted on an FR4 PCB, single-sided copper, tin-plated and standard footprint.
[2] Device mounted on an FR4 PCB, single-sided copper, tin-plated, mounting pad for drain 1 cm