LM12L458
12-Bit + Sign Data Acquisition System with
Self-Calibration
LM12L458 12-Bit + Sign Data Acquisition System with Self-Calibration
July 1999
General Description
The LM12L458 is a highly integrated 3.3V Data Acquisition
System. It combines a fully-differential self-calibrating (correcting linearity and zero errors) 13-bit (12-bit + sign)
analog-to-digital converter (ADC) and sample-and-hold
(S/H) with extensive analog functions and digital functionality. Up to 32 consecutive conversions, using two’s complement format, can be stored in an internal 32-word (16-bit
wide) FIFO data buffer. An internal 8-word RAM can store
the conversion sequence for up to eight acquisitions through
the LM12L458’s eight-input multiplexer. The LM12L458 can
also operate with 8-bit + sign resolution and in a supervisory
“watchdog” mode that compares an input signal against two
programmable limits. Programmable acquisition times and
conversion rates are possible through the use of internal
clock-driven timers.
All registers, RAM, and FIFO are directly addressable
through the high speed microprocessor interface to either an
8-bit or 16-bit databus. The LM12L458 includes a direct
memory access (DMA) interface for high-speed conversion
data transfer.
Applications
n Data Logging
n Process Control
n Energy Management
n Medical Instrumentation
Key Specifications
=
(f
6 MHz)
CLK
n Resolution12-bit + sign or 8-bit + sign
n 13-bit conversion time7.3 µs
n 9-bit conversion time3.5 µs
n 13-bit Through-put rate106k samples/s (min)
n Comparison time (“watchdog” mode)1.8 µs (max)
n ILE
n V
rangeGND to V
IN
n Power dissipation15 mW (max)
n Stand-by mode5 µW (typ)
n Single supply3V to 5.5V
±
1 LSB (max)
Features
n Three operating modes: 12-bit + sign, 8-bit + sign, and
“watchdog”
n Single-ended or differential inputs
n Built-in Sample-and-Hold
n Instruction RAM and event sequencer
n 8-channel multiplexer
n 32-word conversion FIFO
n Programmable acquisition times and conversion rates
n Self-calibration and diagnostic mode
n 8- or 16-bit wide databus microprocessor or DSP
interface
n CMOS compatible I/O
+
A
TRI-STATE®is a registeredtrademark of National Semiconductor Corporation.
®
AT
is a registered trademark of International Business Machines Corporation.
Clock Freq (min)Linearity Error (max)Part NumberPackage Number
6 MHz
±
1.0 LSBLM12L458CIVV44A
DS011711-3
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Absolute Maximum Ratings (Notes 1, 2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage (V
Voltage at Input and Output Pins
except IN0–IN7 (LM12L458)−0.3V to V
Voltage at Analog Inputs
IN0–IN7 (LM12L458)GND − 5V to V
+−VD+|300 mV
|V
A
Input Current at Any Pin (Note 3)
Package Input Current (Note 3)
Power Dissipation (T
V Package (Note 4)875 mW
Storage Temperature−65˚C to +150˚C
Lead Temperature
V Package, Infrared, 15 sec.+300˚C
ESD Susceptibility (Note 5)1.5 kV
+ and VD+)6.0V
A
+
+ 0.3V
+
±
5mA
±
=
25˚C)
A
20 mA
+5V
See AN-450 “Surface Mounting Methods and Their Effect
on Product Reliability” for other methods of soldering
surface mount devices.
Operating Ratings (Notes 1, 2)
Temperature Range
≤ TA≤ T
(T
min
LM12L458CIV−40˚C ≤ T
Supply Voltage
+, VD+3.0V to 5.5V
V
A
+−VD+|≤100 mV
|V
A
Input RangeGND ≤ V
V
IN+
Input RangeGND ≤ V
V
IN−
Input Voltage1V ≤ V
V
REF+
Input Voltage0V ≤ V
V
REF−
V
REF+−VREF−
Common Mode
V
REF
Range (Note 16)0.1 V
max
)
≤ 85˚C
A
IN+
IN−
REF+
≤ V
REF−
REF+
1V ≤ V
REF
+
≤ V
A
REFCM
≤ 0.6 V
≤ VA+
≤ VA+
≤ VA+
−1V
≤ VA+
+
A
Converter Characteristics
The following specifications apply for VA+=VD+=3.3V, V
6.0 MHz, R
age, and minimum acquisition time unless otherwise specified. Boldface limits apply for T
limits T
=
25Ω, source impedance for V
S
=
=
T
25˚C. (Notes 6, 7, 8, 9)
A
J
REF+
and V
=
2.5V, V
REF+
≤ 25Ω, fully-differential input with fixed 1.25V common-mode volt-
REF−
SymbolParameterConditionsTypicalLimitsUnit
ILEPositive and Negative Integral
After Auto-Cal (Notes 12, 17)
Linearity Error
TUETotal Unadjusted ErrorAfter Auto-Cal (Note 12)
Resolution with No Missing CodesAfter Auto-Cal (Note 12)13Bits (max)
DNLDifferential Non-LinearityAfter Auto-Cal
Zero ErrorAfter Auto-Cal (Notes 13, 17)
Positive Full-Scale ErrorAfter Auto-Cal (Notes 12, 17)
Negative Full-Scale ErrorAfter Auto-Cal (Notes 12, 17)
DC Common Mode Error(Note 14)
ILE8-Bit + Sign and “Watchdog” Mode
(Note 12)
Positive and Negative Integral
Linearity Error
TUE8-Bit + Sign and “Watchdog” Mode
After Auto-Zero
Total Unadjusted Error
8-Bit + Sign and “Watchdog” Mode
Resolution with No Missing Codes
DNL8-Bit + Sign and “Watchdog” Mode
Differential Non-Linearity
8-Bit + Sign and “Watchdog” Mode
After Auto-Zero
Zero Error
8-Bit + Sign and “Watchdog” Positive
and Negative Full-Scale Error
8-Bit + Sign and “Watchdog” Mode DC
Common Mode Error
Multiplexer Channel-to-Channel
Matching
V
IN+
Non-Inverting Input RangeGNDV (min)
=
0V, 12-bit + sign conversion mode, f
REF−
=
=
T
A
J
(Note 10)(Note 11)(Limit)
±
1/2
±
1LSB
±
1/4
±
1/2
±
1/2
±
2
±
1/2
±
1/8
±
0.05
to T
T
MIN
MAX
±
1
±
1LSB (max)
±
1LSB (max)
±
3LSB (max)
±
3LSB (max)
±
4LSB (max)
±
1/2LSB (max)
±
3/4
9
±
1
±
1/2
±
1/2
V
+V (max)
A
; all other
=
CLK
LSB (max)
LSB (max)
Bits (max)
LSB (max)
LSB (max)
LSB (max)
LSB
LSB
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Converter Characteristics (Continued)
The following specifications apply for VA+=VD+=3.3V, V
6.0 MHz, R
age, and minimum acquisition time unless otherwise specified. Boldface limits apply for T
limits T
=
25Ω, source impedance for V
S
=
=
T
25˚C. (Notes 6, 7, 8, 9)
A
J
REF+
and V
=
2.5V, V
REF+
≤ 25Ω, fully-differential input with fixed 1.25V common-mode volt-
The following specifications apply for VA+=VD+=3.3V, t
unless otherwise specified. Boldface limits apply for T
=
t
3 ns, and C
r
f
=
=
T
A
T
J
MIN
SymbolTypicalLimitsUnit
(See
Figures 10,
11, 12
)
ParameterConditions(Note 10)(Note 11)(Limit)
1, 3CS or Address Valid to ALE Low
Set-Up Time
2, 4CS or Address Valid to ALE Low
Hold Time
5ALE Pulse Width45ns (min)
6RD High to Next ALE High
7ALE Low to RD Low
8RD Pulse Width
9RD High to Next RD or WR Low
10ALE Low to WR Low
11WR Pulse Width
12WR High to Next ALE High
13WR High to Next RD or WR Low
14Data Valid to WR High Set-Up Time
15Data Valid to WR High Hold Time
16RD Low to Data Bus Out of TRI-STATE
17RD High to TRI-STATE
R
L
18RD Low to Data Valid (Access Time)
20Address Valid or CS Low to RD Low
21Address Valid or CS Low to WR Low
19Address Invalid
from RD or WR High
22INT High from RD Low3010ns (min)
23DMARQ Low from RD Low
Note 1: Absolute Maximum Ratings indicate limits beyond which damage tothe device may occur. OperatingRatings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions.
Note 2: All voltages are measured with respect to GND, unless otherwise specified.
Note 3: When the input voltage (V
The 20 mA maximum package input current rating allows the voltage at any four pins, with an input current of 5 mA, to simultaneously exceed the power supply voltages.
Note 4: The maximum power dissipation must be derated at elevated temperatures and is dictated by T
to ambient thermal resistance), andT
ber given in the Absolute Maximum Ratings, whichever is lower. For this device, T
LM12L458 in the V package, when board mounted, is 47˚C/W.
Note 5: Human body model, 100 pF discharged through a 1.5 kΩ resistor.
Note 6: Two on-chip diodes are tied to each analog input through a series resistor, as shown below.Input voltage magnitude up to 5V above V
will not damage the LM12L458. However, errors in the A/D conversion can occur if these diodes are forward biased by more than 100 mV.As an example, if V
, full-scale input voltage must be ≤3.1 VDCto ensure accurate conversions.
3.0 V
DC
) at any pin exceeds the power supply rails (V
IN
(ambient temperature). Themaximum allowable power dissipation at any temperature is PD
A
IN
<
GND or V
Jmax
=
100 pF on data I/O, INT and DMARQ lines
to T
MAX
L
; all other limits T
=
=
T
A
J
25˚C. (Notes 6, 7, 8)
40
20
ns (min)
ns (min)
35ns (min)
20ns (min)
100ns (min)
100ns (min)
20ns (min)
60ns (min)
75ns (min)
140ns (min)
40ns (min)
30ns (min)
3010ns (min)
70ns (max)
=
1kΩ3010ns (min)
110ns (max)
3010ns (min)
95ns (max)
20ns (min)
20ns (min)
10
ns (min)
60ns (max)
3010ns (min)
60ns (max)
>
(VA+orVD+)), the current at that pin should be limited to 5 mA.
Note 7: VA+ and VD+ must be connected together to the same power supply voltage and bypassed with separate capacitors at each V+pin to assure conversion/
comparison accuracy.
Note 8: Accuracy is guaranteed when operating at f
Note 9: With the test condition for V
Note 10: Typicals are at T
Note 11: Limits are guaranteed to National’s AOQL (Average Output Quality Level).
Note 12: Positive integral linearity error is defined as the deviation of the analog value, expressed in LSBs, from the straight line that passes through positive
full-scale and zero. For negative integral linearity error the straight line passes through negative full-scale and zero. (See
Note 13: Zero error is a measure of the deviation from the mid-scale voltage (a code of zero), expressed in LSB. It is the worst-case value of the code transitions
between −1 to 0 and 0 to +1 (see
Note 14: The DC common-mode error is measured with both inputs shorted together and driven from 0V to 2.5V.The measured value is referred to the resulting
output value when the inputs are driven with a 1.25V signal.
=
A
=
V
REF
25˚C and represent most likely parametric norm.
Figure 8
).
Note 15: Power Supply Sensitivity is measured after Auto-Zero and/or Auto-Calibration cycle has been completed with V
Note 16: V
Note 17: The LM12L458’s self-calibration technique ensures linearity and offset errors as specified, but noise inherent in the self-calibration process will result in
a repeatability uncertainty of
Note 18: The Throughput Rate is for a single instruction repeated continuously. Sequencer states 0 (1 clock cycle), 1 (1 clock cycle), 7 (9 clock cycles) and 5 (44
clock cycles) are used (see
version. The Throughput Rate is f
(Reference Voltage Common Mode Range) is defined as (V
REFCM
±
0.10 LSB.
Figure 15
). One additional clock cycle is used to read the conversion result stored in the FIFO, for a total of 56 clock cycles per con-
(MHz)/N, where N is the number of clock cycles/conversion.
CLK
CLK
REF+−VREF−
=
6 MHz.
given as +2.5V, the 12-bit LSB is 305 µV and the 8-bit/“Watchdog” LSB is 4.88 mV.
Figures 6, 7
).
+ and VD+ at the specified extremes.
REF++VREF−
)/2.
A
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Digital Timing Characteristics (Continued)
V
REF
=
V
IN
GND ≤ V
GND ≤ V
=
V
REF+−VREF−
V
IN+−VIN−
≤ VA+
IN+
≤ VA+
IN−
DS011711-5
FIGURE 1. The General Case of Output Digital Code vs the Operating Input Voltage Range
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Digital Timing Characteristics (Continued)
=
V
IN+−VIN−
≤ VA+
IN+
≤ VA+
IN−
=
2.5V
V
REF+−VREF−
V
IN
GND ≤ V
GND ≤ V
FIGURE 2. Specific Case of Output Digital Code vs the Operating Input Voltage Range for V
DS011711-6
REF
=
2.5V
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Digital Timing Characteristics (Continued)
FIGURE 3. The General Case of the V
Operating Range
REF
DS011711-7
FIGURE 4. The Specific Case of the V
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Operating Range for VA+=3.3V
REF
DS011711-8
Digital Timing Characteristics (Continued)
FIGURE 5. Transfer Characteristic
DS011711-9
DS011711-10
FIGURE 6. Simplified Error Curve vs Output Code without Auto-Calibration or Auto-Zero Cycles
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