AC Electrical Characteristics The following specifications apply for V
CC
e
V
a
e
5V and t
r
e
t
f
e
20 ns
unless otherwise specified. These limits apply for T
A
e
T
j
e
25§C.
Typ
Tested Design
Parameter Conditions
(Note 6)
Limit Limit Units
(Note 7) (Note 8)
f
CLK
, Clock Frequency Min 10 kHz
Max 400 kHz
TC, Conversion Time Not including MUX Addressing Time 8 1/f
CLK
Clock Duty Cycle (Note 12) Min 40 %
Max 60 %
t
SET-UP
,CSFalling Edge or 250 ns
Data Input Valid to CLK
Rising Edge
t
HOLD
, Data Input Valid 90 ns
after CLK Rising Edge
t
pd1,tpd0
ÐCLK Falling C
L
e
100 pF
Edge to Output Data Valid Data MSB First 650 1500 ns
(Note 13) Data LSB First 250 600 ns
t1H,tOHÐRising Edge of CS C
L
e
10 pF, R
L
e
10k 125 250 ns
to Data Output and SARS C
L
e
100 pF, R
L
e
2k 500 ns
Hi-Z (see TRI-STATE Test Circuits)
CIN, Capacitance of Logic 5 pF
Input
C
OUT
, Capacitance of Logic 5 pF
Outputs
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating
the device beyond its specified operating conditions.
Note 2: All voltages are measured with respect to the ground pins.
Note 3: Internal zener diodes (approx. 7V) are connected from V
a
to GND and VCCto GND. The zener at Vacan operate as a shunt regulator and is connected to
V
CC
via a conventional diode. Since the zener voltage equals the A/D’s breakdown voltage, the diode insures that VCCwill be below breakdown when the device is
powered from V
a
. Functionality is therefore guaranteed for V
a
operation even though the resultant voltage at VCCmay exceed the specified Absolute Max. of
6.5V. It is recommended that a resistor be used to limit the max. current into V
a
.
Note 4: When the input voltage (V
IN
) at any pin exceeds the power supply rails (V
IN
k
Vbor V
IN
l
Va) the absolute value of current at that pin should be limited
to 5 mA or less. The 20 mA package input current limits the number of pins that can exceed the power supply boundaries witha5mAcurrent limit to four.
Note 5: Human body model, 100 pF discharged through a 1.5 kX resistor.
Note 6: Typicals are at 25
§
C and represent most likely parametric norm.
Note 7: Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).
Note 8: Design limits are guaranteed but not 100% tested. These limits are not used to calculate outgoing quality levels.
Note 9: See Applications, section 3.0.
Note 10: For V
IN
(b)tVIN(a) the digital output code will be 0000 0000. Two on-chip diodes are tied to each analog input (see Block Diagram) which will forward
conduct for analog input voltages one diode drop below ground or one diode drop greater than the V
CC
supply. Be careful, during testing at low VCClevels (4.5V),
as high level analog inputs (5V) can cause this input diode to conductÐespecially at elevated temperatures, and cause errors for analog inputs near full-scale. The
spec allows 50 mV forward bias of either diode. This means that as long as the analog V
IN
or V
REF
does not exceed the supply voltage by more than 50 mV, the
output code will be correct. To achieve an absolute 0 V
DC
to5VDCinput voltage range will therefore require a minimum supply voltage of 4.950 VDCover
temperature variations, initial tolerance and loading.
Note 11: Leakage current is measured with the clock not switching.
Note 12: A 40% to 60% clock duty cycle range insures proper operation at all clock frequencies. In the case that an available clock has a duty cycle outside of
these limits, the minimum time the clock is high or the minimum time the clock is low must be at least 1 ms. The maximum time the clock can be high is 60 ms. The
clocked can be stopped when low so long as the analog input voltage remains stable.
Note 13: Since data, MSB first, is the output of the comparator used in the successive approximation loop, an additional delay is built in (see Block Diagram) to
allow for comparator response time.
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