NSC 54F379LMQB, 54F379DMQB, 54F379DC Datasheet

TL/F/9527

54F/74F379 Quad Parallel Register with Enable

August 1995

54F/74F379
Quad Parallel Register with Enable

General Description

The ’F379 is a 4-bit register with buffered common Enable.
This device is similar to the ’F175 but features the common
Enable rather than common Master Reset.

Features

Y

Edge triggered D-type inputs

Y

Buffered positive edge-triggered clock

Y

Buffered common enable input

Y

True and complement outputs

Y

Guaranteed 4000V minimum ESD protection

Commercial Military

Package

Package Description

Number

74F379PC N16E 16-Lead (0.300×Wide) Molded Dual-In-Line

54F379DM (QB) J16A 16-Lead Ceramic Dual-In-Line

74F379SC (Note 1) M16A 16-Lead (0.300×Wide) Molded Small Outline, JEDEC

74F379SJ (Note 1) M16D 16-Lead (0.300×Wide) Molded Small Outline, EIAJ

54F379FM (QB) W16A 16-Lead Cerpack

54F379LM (QB) E20A 20-Lead Ceramic Leadless Chip Carrier, Type C

Note 1: Devices also available in 13×reel. Use suffixeSCX and SJX.

Logic Symbols

IEEE/IEC

TL/F/9527– 5

Connection Diagrams

Pin Assignment

DIP, SOIC and Flatpak

TL/F/9527– 1

Pin Assignment

for LCC

TL/F/9527– 2

TL/F/9527– 3

TRI-STATEÉis a registered trademark of National Semiconductor Corporation.

C

1995 National Semiconductor Corporation RRD-B30M115/Printed in U. S. A.

Unit Loading/Fan Out

54F/74F

Pin Names Description

U.L. Input I

IH/IIL

HIGH/LOW Output IOH/I

OL

E Enable Input (Active LOW) 1.0/1.0 20 mA/b0.6 mA
D

0–D3

Data Inputs 1.0/1.0 20 mA/b0.6 mA

CP Clock Pulse Input (Active Rising Edge) 1.0/1.0 20 mA/

b

0.6 mA
Q0–Q3Flip-Flop Outputs 50/33.3b1 mA/20 mA
Q

0–Q3

Complement Outputs 50/33.3b1 mA/20 mA

Functional Description

The ’F379 consists of four edge-triggered D-Type flip-flops
with individual D inputs and Q and Q

outputs. The Clock

(CP) and Enable (E

) inputs are common to all flip-flops.

When the E

is input HIGH, the register will retain the present

data independent of the CP input. The D

n

and E inputs can
change when the clock is in either state, provided that the
recommended setup and hold times are observed.

Truth Table

Inputs Outputs

E CP D

n

Q

n

Q

n

H L XNCNC

LLHH L
LLLLH

H

e

HIGH Voltage Level

L

e

LOW Voltage Level

X

e

Immaterial

L

e

LOW-to-HIGH Transition

NC

e

No Change

Logic Diagram

TL/F/9527– 4

Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.

2

Absolute Maximum Ratings (Note 1)

If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.

Storage Temperature

b

65§Ctoa150§C

Ambient Temperature under Bias

b

55§Ctoa125§C

Junction Temperature under Bias

b

55§Ctoa175§C

Plastic

b

55§Ctoa150§C

V

CC

Pin Potential to

Ground Pin

b

0.5V toa7.0V

Input Voltage (Note 2)

b

0.5V toa7.0V

Input Current (Note 2)

b

30 mA toa5.0 mA

Voltage Applied to Output

in HIGH State (with V

CC

e

0V)

Standard Output

b

0.5V to V

CC

TRI-STATEÉOutput

b

0.5V toa5.5V

Current Applied to Output

in LOW State (Max) twice the rated I

OL

(mA)

ESD Last Passing Voltge (Min) 4000V

Note 1: Absolute maximum ratings are values beyond which the device may
be damaged or have its useful life impaired. Functional operation under
these conditions is not implied.

Note 2: Either voltage limit or current limit is sufficient to protect inputs.

Recommended Operating
Conditions

Free Air Ambient Temperature

Military

b

55§Ctoa125§C

Commercial 0

§

Ctoa70§C

Supply Voltage

Military

a

4.5V toa5.5V

Commercial

a

4.5V toa5.5V

DC Electrical Characteristics

Symbol Parameter

54F/74F

Units V

CC

Conditions

Min Typ Max

V

IH

Input HIGH Voltage 2.0 V Recognized as a HIGH Signal

V

IL

Input LOW Voltage 0.8 V Recognized as a LOW Signal

V

CD

Input Clamp Diode Voltage

b

1.2 V Min I

IN

eb

18 mA

V

OH

Output HIGH 54F 10% V

CC

2.5 I

OH

eb

1mA

Voltage 74F 10% V

CC

2.5 V Min I

OH

eb

1mA

74F 5% V

CC

2.7 I

OH

eb

1mA

V

OL

Output LOW 54F 10% V

CC

0.5
V Min

I

OL

e

20 mA

Voltage 74F 10% V

CC

0.5 I

OL

e

20 mA

I

IH

Input HIGH 54F 20.0

mA Max

V

IN

e

2.7V

Current 74F 5.0

I

BVI

Input HIGH Current 54F 100

mA Max

V

IN

e

7.0V

Breakdown Test 74F 7.0

I

CEX

Output HIGH 54F 250

mA Max

V

OUT

e

V

CC

Leakage Current 74F 50

V

ID

Input Leakage

74F 4.75 V 0.0

I

ID

e

1.9 mA

Test All Other Pins Grounded

I

OD

Output Leakage

74F 3.75 mA 0.0

V

IOD

e

150 mV

Circuit Current All Other Pins Grounded

I

IL

Input LOW Current

b

0.6 mA Max V

IN

e

0.5V

I

OS

Output Short-Circuit Current

b

60

b

150 mA Max V

OUT

e

0V

I

CCL

Power Supply Current 28 40 mA Max V

O

e

LOW

3