Clocks and Reset troubleshooting ........................................................................... 107
RM-12
CCS Technical Documentation
Introduction to RM-12 troubleshooting
This document is intended to be a guide for localising and repairing electrical faults in the RM12 device. First there is a brief guide for fault localising. Then fault repairing is divided into troubleshooting paths.
Before any service operation you must be familiar with the RM-12 product and module level
architecture. You have to also be familiar with the RM-12 specified service tools such as the
Phoenix service software, flashing tools and software.
General guidelines for RM-12 troubleshooting
Tools needed for troubleshooting
•Service tools (as listed at service tools chapter in service manual)
•Laboratory power supply with current indicator
•Oscilloscope
•Digital multimeter etc. normal equipments
General guidelines
If the device cannot be turned on by any means, see “Dead device” troubleshooting.
Current consumption (missing consumption) gives an idea whether the device is able to start
up.
Dropping supply voltage or very large current consumption indicates a short circuit.
Check whether the connection with Phoenix works and what can be discovered with Phoenix
(ADC-readings, baseband selftest, bb-calibrations etc.).
Check display, keyboard and rocker faults visually.
Force phone to LOCAL mode and make keyboard test by Phoenix.
NOTE! If liquid damage, stop repairing.
Flash phone before disassembling it if fault is not obvious and Phoenix connection is OK.
Continue with specific troubleshooting procedure for the current fault.
If flashing does not work go to “Flashing” troubleshooting.
Due to CSP packages short circuits or broken solder joints are not easily seen. If the examined
signal seems to be continuously in low or high level, then measure for possible short circuit to
ground (signal low) or to supply voltage (signal high). Note that if a problem is not found from
any visible contact/component, it can be under CSPs where the signal is connected.
Care must be taken when assembling and disassembling the transceiver. Failure to do this may
result in unnecessary damage to the device.
NOTE! If an ASIC is changed, see “ASIC Changed” troubleshooting flow chart.
Measurements should be done using Spectrum analyzer with high-frequency high-impedance
passive probe (LO-/reference frequencies and RF power levels) and Oscilloscope with a 10:1
probe (DC-voltages and low frequency signals).
The RF-section is build around one RF-ASIC (HELGO N7300). For easier troubleshooting, this
RF troubleshooting document is divided into sections.
Before changing HELGO, please check the following things: supply voltages are OK and serial
communication coming from baseband to HELGO.
Please note that the grounding of the PA module is directly below PA-module so it is difficult to
check or change. Most RF semiconductors are static discharge sensitive! So ESD protection must be taken care of during repair (ground straps and ESD soldering irons). HELGO and
PA are moisture sensitive so parts must be pre-baked prior to soldering.
Apart from key components described in this document, here are a lot of discrete components
(resistors, inductors and capacitors) the troubleshooting of which is done by checking if sold ering of the component is done properly (for factory repairs checking if it is missing from PWB).
Capacitor can be checked for shortening and resistors for value by means of an ohmmeter, but
be aware that in-circuit measurements should be evaluated carefully.
Please be also aware that all measured voltages or RF levels in this document are rough figures. Especially RF levels vary due to different measuring equipment or different grounding of
the used probe. When using RF probe, usually a good way is to use metallic tweezers to connect probe ground to PWB ground as close to measurement point as possible.
Note! If the measurement values of RM-12 are as mentioned in this RF troubleshooting guide, but
there are still difficulties making calls with the device, then check the antenna contacts in PWB.
Kindly refer to the Service Software Section, Service Concept diagram.
Connect test jig to computer with DAU-9S cable or to FPS-8 Flash Prommer with XCS-4 mod-
ular cable.
Make sure that you have PKD-1 dongle connected to computer’s parallel port.
Connect DC power supply to module test jig with FLC-2 cable.
NOTE! When repairing or tuning transmitter use external DC supply with at least 3A current capability. Set the DC supply voltage to 4.2V.
Connect an RF-cable to the module test jig (MJ-32) RF connector and to measurement equipment or at least a 10dB attenuator, otherwise the PA may be damaged. Normally a spectrum
analyzer is used as measurement equipment.
NOTE! Normally Spectrum analyzer maximum input power is +30dBm. It is recommended to use
10dB attenuator on Spectrum analyzer input to prevent damage.
Set the phone module to test jig and start Phoenix service sofware.
Initialize connection to phone. (Use FBUS driver when using DAU9S, COMBOX driver when
using FPS-8.)
Select product from the menu:
File -> Choose product -> RM-12
From toolbar, set operating mode to "Local"
Activate RF controls window from the menu:
Testing -> RF Controls
From the RF controls window:
•Select band "GSM900" or "GSM 1800" or "GSM1900" (Default = "GSM900")
•Set Active unit to "Tx" (Default = "Rx")
•Set Operation mode to "Burst" (Default = "Burst")
•Set Tx data type to "Random" (Default = "All1")
•Set Rx/Tx channel to 37 on GSM900 band or 700 on GSM1800 band or 661 on
GSM1900 (Defaults)
•Set Tx PA mode to "Free" (Default)
•Set power level to 5 (Default = 19) on GSM900 or to 0 (Default = 15) on
GSM1800 or GSM1900
Figure 17: TXI/TXQ signal at C7311/C7312/R7304/R7305
Figure 18: VPECTRL3 (ALC) signal at C7309
RM-12
CCS Technical Documentation
EGSM900, GSM1800 and GSM1900 Receiver
General instructions for Rx troubleshooting
Connect test jig to computer with DAU-9S cable or to FPS-8 Flash Prommer with XCS-4 modular cable.
Make sure that you have PKD-1 dongle connected to the computer’s parallel port.
Connect DC power supply to module test jig with FLC-2 cable.
Set the DC supply voltage to 4.2V.
Connect an RF-cable to the module test jig (MJ-32) RF connector and to RF signal generator.
Set the phone module to test jig and start Phoenix service sofware.
Initialize connection to phone. (Use FBUS driver when using DAU-9S, COMBOX driver when
using FPS-8.)
Choose product from the menu:
File -> Choose product -> RM-12
From toolbar, set operating mode to "Local"
Activate RF controls window from the menu:
Testing -> RF Controls
From the RF controls window:
•Select band "GSM900", "GSM 1800" or “GSM1900” (Default =
"GSM900")
•Set Active unit to "Rx" (Default = "Rx")
•Set Operation mode to "Burst" (Default = "Burst")
For continuous mode:
•Set Operation mode to "Continuous"
•Set AGC to "12: FEG_ON + DTOS_ON + BB_30=Vgain60” (maximum
gain setting used in normal mode)
Figure 3: RX I&Q, phase difference 90 deg between signals
RM-12
Detailed view of GSM900 continuous mode RX I and Q signals measured from testpoints RXI
and RXQ simultaneously.
Used channel 37, input signal 942.46771 MHz, level –90 dBm at antenna port, AGC setting 12.
Phase difference should be 90 degrees between RX I and Q signals at all bands.
942.46771MHz signal
from generator to
antenna connector
Osilloscope at RX_I
signal 170mVpp DC
offset 1.35***
Fre
uency 67.7kHz
Rx 900 chain
functional
Check
L809,L810
L7104, L7103
Figure 4: GSM900 receiver troubleshooting
Note! Generator level can be set higher if
needed. Just note that levels will be different
in whole chain respectively.
Spectrumanalyzer:
ntenna Switch
output GSM900
88dBm
Spectrumanalyzer:
HELGO inputs
GSM900 –89dBm
Oscilloscope
VANT_1…3 0V
Check Antenna
Switch Z800
Spectrumanalyzer:
ntenna Switch
input –88dBm
Z7100
Oscilloscope:Check
HELGO serial
interface (burst
mode
Check
C809
X7100
Check
Baseband
Check SAW
Z809
Z7101
Check SAW
filter output
Oscilloscope:
VR1,3…6 2.7V
Check HELGO
serial interface
(burst mode)
Spectrumanalyzer:
4G VCO output
3769.6MHz
~-30dBm*
Check HELGO
N500
N7300
Check
Baseband
Synthesizer
troubleshooting
Check HELGO
N500
N7300
reading values are
measured with 1 kohm
passive probe (use
tweezers to connect the
probe ground to the nearest
PWB ground). Reading
value is represented without
+26 dB compensation.
* Spectrumanalyzer reading
with 1 kohm passive probe
(right value add +26dB)
*** DC-level of RXI/RXQ in
continuous mode will
decrase slowly. The original
level can be rest ored by
rewriting gain set
1842.86771MHz signal
from generator to
antenna connector
Osilloscope at RX_I
signal 170mVpp DC
offset 1.35***
Fre
uency 67.7kHz
Rx 1800 chain
functional
Z7102,
Check Z808,L838,L839
L7105, L7106
Figure 5: GSM1800 receiver troubleshooting
Note! Generator level can be set higher if needed.
Spectrumanalyzer
ntenna Switch
output, GSM1800
-88dBm
Spectrumanalyzer
HELGO inputs
GSM1800 –88dBm
Just note that levels will be different in whole chain
respectively.
Spectrumanalyzer
input –84dBm
Oscilloscope
VANT_1…3 0V
Check Antenna
Z7100
Switch Z800
ntenna Switch
Oscilloscope:Check
HELGO serial
interface (burst
mode
Check
C809
X7100
Check
Baseband
Check Z808
Z7102
Check SAW
filter output
Oscilloscope
VR1,3…6 2.7V
Check HELGO
serial interface
(burst mode)
Spectrumanalyzer
4G VCO output
3685.6MHz
~-30dBm*
Check HELGO
N500
N7300
Check
Baseband
Synthesizer
troubleshooting
Check HELGO
N500
N7300
ll spectrumanalyzer
reading values are
measured with 1 kohm
passive probe (use
tweezers to connect the
probe ground to the nearest
PWB ground). Reading
value is represented without
+26 dB compensation.
* Spectrumanalyzer reading
with 1 kohm passive probe
(right value add +26dB)
*** DC-level of RXI/RXQ in
continuous mode will
decrase slowly. The original
level can be restored by
rewriting gain set
1960.06771MHz signal
from generator to
antenna connector
Note! Generator level can be set higher
if needed. Just note that levels will be
different in whole chain respectively.
CCS Technical Documentation
Osilloscope at RX_I
signal 160mVpp DC
offset 1.35***
uency 67.7kHz
Fre
Rx 1900 chain
functional
Spectrumanalyzer:
HELGO inputs
GSM1900 –88dBm
Check LNA
output fromC829
–84dBm
Check Balun
T701 output
Z7104
C808, C807
C7111, C7112
C7110
Spectrumanalyzer:
ntenna Switch
outputs, GSM1900
ut -88dBm
SAW in
Oscilloscope:
VANT_3 2.7V
VANT_1/2 0V
Spectrumanalyzer:
RX_SAW_out –
90dBm (C826)
(C7108)
Oscilloscope:
LNA_VCC 2.6
LNA_P 0V
Check Antenna
Switch Z800
Z7100
Spectrumanalyzer:
ntenna Switch
input –84dBm
Oscilloscope:Check
HELGO serial
interface (burst
mode
Check Z806
Oscilloscope:
Check R800,
R7100
R810, L800
R7101, L7107
VR1,3…6 2.7V
Check HELGO
serial interface
(burst mode)
Z7103
Check
C809
X7100
Check
Baseband
Check HELGO
N500
N7300
Check Baseband
Oscilloscope:
VR1,3…6 2.7V
Check HELGO
serial interface
(burst mode)
Spectrumanalyzer:
4G VCO output
3920 MHz
~-30dBm*
Check HELGO
N500
N7300
Check
Balun
Check
Baseband
Synthesizer
troubleshooting
C7111,
Check C808,L805, C807
L7108, C7112
Check
HELGO N500
N7300
ll spectrumanalyzer
reading values are
measured with 1 kohm
passive probe (use
tweezers to connect the
probe ground to the nearest
PWB ground). Reading
value is represented without
+26 dB compensation.
* Spectrumanalyzer reading
with 1 kohm passive probe
(right value add +26dB)
*** DC-level of RXI/RXQ in
continuous mode will
decrase slowly. The original
level can be restored by
rewriting gain set
General instructions for synthesizer troubleshooting
Connect test jig to computer with DAU9S cable or to FPS-8 Flash Prommer with XCS-4 modular cable.
Make sure that you have PKD-1 dongle connected to the computer’s parallel port.
Connect DC power supply or FPS-8 to module test jig with PCS-1 cable.
Set the DC supply voltage to 4.2V.
Set the phone module to test jig and start Phoenix service sofware.
Initialize connection to phone. (Use FBUS driver when using DAU9S, COMBOX driver when
using FPS-8.)
Select product from the menu:
File -> Choose product -> RM-12
From toolbar, set operating mode to "Local"
Activate RF controls window from the menu:
Testing -> RF Controls
From the RF controls window:
•Select band "GSM900", "GSM 1800" or "GSM1900" (Default =
"GSM900")
•Set Active unit to "Rx" (Default = "Rx")
•Set Operation mode to "Continuous" (Default = "Burst")
•Set Rx/Tx channel to 37 on GSM900 band, 700 on GSM1800 band, 661
on GSM1900 band (Defaults)
TXPJ7300"1" and "0"1.8/0 V digital signalPower amplifier enable
TXAJ7301"1" and "0"1.8/0V digital signalPower control loop enable
RXI/RXQJ7302/J7303 voltage swing (static) 1.4VppDC level 1.4VReceived demodulated I -and Q sign als
RFBus Data J7304"1" and "0"1.8/0V digital signal data frequency max. 10MHz RFBUs data; read/write
RFBusClkJ7305"1" and "0"1.8/0V digital signal data frequency max. 10MHz RF Bus clock
RFBus Ena1 J7306"1" and "0"1.8/0V digital signalRFBus enable
RESETJ7307"1" and "0"1.8/0V digital signalReset to Helgo
If the device is working, but some functionality is missing, try to localise the problem(s) and see
a relevant part of this manual. For example, if audio is not working see “Audio Troubleshooting”,
if charging is not working see “Charging troubleshooting”, and so on.
Most common symptoms reported by customer
Here you can find some common symptoms reported by customers when the device is brought
in for service. Some tips for locating the problem are also given. When troubleshooting, use
these tips and follow the given troubleshooting path.
Most common symptoms for audio problems
•“Earpiece sound is missing”
•”Handsfree sound is missing”
•”Microphone is not working”
•”Ringing tones do not work”
•”Audio volume too low”
•“IHF does not work”
If the symptom is one of the above, see “Audio troubleshooting”.
Most common symptoms for Bluetooth problems
•”Bluetooth does not work or connection cannot be established”
Follow “Bluetooth troubleshooting” guidelines.
Symptoms related to energy management
•“Phone does not stay on”
•”Charging is not working”
•”Time is lost during battery change”
•”Charging takes too long”
•”Operating time is very short”
With these symptoms, follow “Power troubleshooting”.
ASICs can be changed only at a defined service level.
•If UEM is changed
If UEM is changed, baseband calibrations should be made. IMEI must be prog rammed also.
•If UPP8M is changed
If UPP is changed, there is no need to flash the phone.
•If Zocus is changed
If Zocus is changed, it must be calibrated.
•Nor flash changed
If CMT Nor flash is changed, re-flash the phone. IMEI must be programmed also.
•SDRAM changed
If SDRAM is changed, there is no need to flash the phone.
•MDOC flash changed
If MDOC memory is changed, User data needs to be back-upped if possible. Re-flash the
phone.
•Touch screen controller
If touch screen controller or display module is changed, calibrations should be made.
•BT
If BT chip is changed, there is no need to flash the phone.
Test points
Test point locations and possible signal levels are listed in the Schematics chapter of this Service Manual.
Selftests / “Contact service” on display
MCU selftest cases can be split into two categories: ones that are executed during power up
and ones that are executed only with a PC connected.
“CONTACT SERVICE” on display means that software is able to run and thus the watchdog of
UEM can be served. Selftest functions are executed when the phone is powered on a nd if one
or more selftest functions fail, the message “Contact Service” is shown on the display.
ST_AUX_DA_LOOP_TESTThis function tests the connection of
AuxDa and UemInt signals between
UPP and UEM.
ST_EAR_DATA_LOOP_TESTThis function tests the connection of
EarData and MicData signals between
UPP and UEM.
ST_KEYBOARD_STUCK_TESTThis function tests if some key is
stucked.
ST_MBUS_RX_TX_LOOP_TEST
ST_SIM_CLK_LOOP_TEST
ST_SIM_IO_CTRL_LOOP_TEST
ST_SLEEP_X_LOOP_TEST
ST_TX_IDP_LOOP_TEST
This function tests the connection of
MBusTx and MBusRx signals between
UPP and UEM.
This function tests the connection of
SimClk and SimIODa signals between
UPP and UEM. This test requires also
that SimIOCtrl signal can be set to high
state.
This function tests the connection of
SimIOCtrl and SimIODa signals
between UPP and UEM. This test
requires also that SimClk signal can be
switched.
This function tests the connection of
SleepX and SleepClk signals between
UPP and UEM.
This function tests the connection of
TxIdp and RxIdp signals between UPP
and UEM.
ST_TX_IQ_DP_LOOP_TEST
This function tests the connection of
TxQdp and RxQdp signals between
UPP and UEM.
ST_BACKUP_BATT_TEST
This function tests if the backup battery
was ok during power-up.
ST_LPRF_IF_TEST
This test verifies, whether BT MCM
internal selftests are o.k.
A fault or complaint associated to camera operation can be roughly categorized to three subgroups:
1Camera is not functional at all, no image can be obtained
2Images can be taken but there is nothing recognizable in them
3Images can be taken and they are recognizable but for some reason the quality of
images is seriously degraded, or customer complains about image quality
Image quality is very hard to measure quantitatively, and even comparative measure ments are
difficult (comparing two images) if the difference is small. Especially if the user is not satisfied
with his/her devices' image quality, and tells e.g. that the images are not sharp, it is fairly difficult to accurately test the device and get an exact figure which then would tell if the device is
OK or not.
Most often, subjective evaluation has to be used for finding out if a certain property of the camera is acceptable or not. Some training or experience of a correctly operating reference device
may be needed in order to detect what actually is wrong, or is there anything wrong at all. It is
easy for the user to take bad looking images in bad conditions; thus the cam era operation has
to be checked always in constant conditions (lighting, temperature) or by using a second,
known to be good device as a reference. Experience significantly helps in analyzing image
quality.
Terms
Dynamic range: camera's ability to capture details in dark and bright areas of the scene si-
multaneously. See Image which has been taken against light. The actual object is dark for example.
Exposure time: camera modules use silicon sensor to collect light and for forming an image.
The imaging process roughly corresponds to traditional film photography, in which exposure
time means the time during which the film is exposed to light coming through optics. Increasing
the time will allow for more light hitting the film and thus results in brighter image. The operation
principle is exactly the same with silicon sensor, but the shutter functionality is handled electronically i.e. there is no mechanical moving parts like in film cameras.
Flicker: Phenomenon, which is caused by pulsating in scene lighting, typically appearing as
wide horizontal stripes in image.
Noise: Variation of response between pixels with same level of input illumination. See e.g.
Noisy image taken in +70 degrees Celsius for example of noisy image.
Resolution: Usually the amount of pixels in the camera sensor, e.g. this product has 1152 x
864 pixel sensor resolution. In some occasions the term resolution is used for describing the
sharpness of the images.
Sensitivity: camera module's sensitivity to light. In equivalent illumination conditions, a less
sensitive camera needs longer exposure time to gather enough light for forming a good image.
Analogous to ISO speed in photographic film.
Sharpness: good quality images are 'sharp' or 'crisp', meaning that image details are well vis-
ible in the picture. However, certain issues like non-idealities in optics, cause ima ge blurring,
making objects in picture to appear 'soft'. Each camera type typically has it's own level of performance.
Image taking conditions effect to image quality
This chapter lists some of the factors, which may cause poor image quality if not taken into
account by end user when shooting pictures, and thus may result in complaints.
items are normal to camera operation and do not cause a need for e.g. changing the
camera module.
The listed
1Distance to target: the lens in the module is specified to operate satisfactorily
from 40 cm to infinite distance of scene objects. In practice, the operation is
such that close objects may be noticed to get more blurred when distance to
them is shortened from 40 cm. Lack of sharpness will be first visible in full resolution (1152 x 864) images. If observing just the viewfinder, even very close
objects may seem to appear sharp. This is normal behavior, do not change the
camera module.
Figure 1: Image blurred due to too close distance to target
2Amount of light available: in dim conditions camera runs out of sensitivity. Expo-
sure time is long (especially in night mode) and the risk of getting shaken (=
blurred) images grows. Image noise level grows. The maximum exposure time in
night mode is ¼ seconds, so images need to be taken with extreme care and by
supporting the phone when the amount of light reflected from the target is low.
Due to longer exposure time and larger gain value noise level is increasing under
low light conditions. Sometimes blurring may even happen at daytime if image is
taken very carelessly. See Handshake has caused blurring of this image for exam-
ple. This is normal behavior, do not change the camera module.
RM-12
Figure 2: Handshake has caused blurring of this image
3Movement in bright light: If pictures of moving objects are taken or if the device
is used in a moving car, object 'skewing' or 'tilting' will occur. This phenomenon is
fundamental to most CMOS camera types and normal, and can’t be avoided.
Movement of camera or object will usually cause blurring in inside or dim lighting conditions due to long exposure time. This is normal behavior, do not change
the camera module.
Figure 3: Near objects in image get skewed when shooting from a moving car
4Temperature: high temperatures inside the mobile phone will cause more noise
to appear in images, e.g. in +70 degrees of celsius the noise level may be very
high, and it further grows if the conditions are dim. If phone processor has been
heavily loaded for a long time before image taking inside of the phone might
have considerably higher temperature than neighbourhood temperature. This is
also normal to camera operation. This is normal behavior, do not change the cam-
era module.
Figure 4: Noisy image taken in +70 degrees Celsius
5Phone display: if the display contrast is set too dark, the image quality degrades
quite much: the images may be very dark, naturally depending on the setting. If
display contrast is set too bright, image contrast appears bad and "faint". This
flaw is easily cured by setting the display contrast to correct value. This is normal
behavior, do not change the camera module.
6Basic rules of photography, especially shooting against light: due to dynamic
range limitations taking image against bright light might cause either saturated
image or actual target to look too dark. In practice this means that when taking
a picture inside e.g. having a window behind object, will produce poor results.
This is normal behavior, do not change the camera module.
RM-12
Figure 5: Image which has been taken against light. The actual object is dark
7Flicker: in some occasions a bright fluorescent light may cause flicker to be seen
in the viewfinder and captured image. This phenomenon may also result if pictures are taken indoors under mismatch of 50/60 Hz electricity network frequency. The used electricity frequency will be detected automatically by the
camera module. In some very few countries, both 50 and 60 Hz networks are
present and thus probability for the phenomenon grows. Flickering occurs also
under high artificial illumination level. This is normal behavior, do not change the
camera module.
Figure 6: Flicker in image of white, uniform object illuminated by strong fluorescent light
8Bright light outside of image view: Especially sun can cause clearly visible lens
glare phenomenon and poor contrast in images. This happens due to unwanted
reflections inside camera optics. Generally this kind of reflections are common in
all optical systems. This is normal behavior, do not change the camera module.
Figure 7: A lens reflection effect caused by sun shining above the scene
In this chapter, some information of the actual construction of the camera module is given for
getting understanding of the actual mechanical structure of the module.
Figure 10: Cross section of the camera module and assembly principle
Figure 11: Bottom view including camera module serial numbering
The camera module as a component is not a repairable part i.e. components in the module
may not be changed. Cleaning dust from the front face is the only allowable operation, do this
by using clean
Figure Cross section of the camera module and assembly principle shows the cross section
view of the camera module. The main parts of the module are
compressed air.
•Lens unit including lens aperture
•Infrared filter, which is used to prevent infrared light from contaminating
the image colors. IR filter is glued to the EMI shielded camera body
•Camera body, which is made of conductive metallized plastic and
attached to PWB by glue
•Sensor array including DSP functions is glued and wire bonded to PWB
•PWB, FR-4 type
•Socket type connecting is used
•Laser marked serial numbering on PWB is used for versioning
•Passive components
•Camera protection window is part of phone cover mechanics
•Dust gasket between lens unit and camera protection window
Image quality analysis
Possible faults in image quality
When checking for possible errors in camera functionality, knowing what error is suspected will
significantly help the testing by narrowing down the amount of test cases. The following types
of image quality problems may be expected to appear
•Dust (black spots)
•Lack of sharpness
•Bit errors
In addition, there are many other kinds of possibilities for getting bad im age quality, but th ose
are ruled out from the scope of this document since probability of their appearance is going to
be minimized by production testing.
Testing for dust
For detecting this kind of problems, take an image of uniform white surface and analyze it in
full resolution. Good quality PC monitor is preferred for analysis. Search carefully since finding
these defects is not always easy. Figure Effects of dust on optical path is an example of image
containing easily detectable dust problems.
For taking a white image uniformly lightened white paper or white wall can be used. One possibility is to use uniform light but make sure that came ra image is not flickering when taking test
image. In case flickering happens try to reduce illumination level. JPEG image format can be
used for analyzing but image quality parameter should be set to ‘High Quality’.
Black spots in image are caused by dirt particles trapped in side the optical system. Clearly visible and sharp edged black dots in image are typically dust particles on image sensor. The se
spots are searched for in manufacturing phase, but it is possible that the camera body cavity
contains a particle, which may move onto the image sensor active surface, e.g. when the
phone is dropped. Thus it is also possible that the problem will disappear before the phone is
brought to service. The camera should be replaced if the problem is present when the service
technician analyses the phone.
If dust particle is lying on infrared filter surface on either side, they are much harder to locate
because they will be out of focus, and appear in image as large, grayish and fading-edge
'blobs'. Sometimes they will be very hard to find, and thus the user probably will not notice them
at all since they do no harm. But it is possible that a larger particle disturbs the user, causing
need for service.
Figure 12: Effects of dust on optical path
If large dust particles get trapped on top of the l ens surface in the cavity between camera window and lens, they will cause image blurring and poor contrast (see also item 'sharpness'). The
dust gasket between the window and lens should prevent any particles from getting into the
cavity after manufacturing phase.
If dust particles are found on sensor, this is classified as a manufacturing error of the mod ule
and thus the camera should be replaced. Any particles inside the cavity between protection
window and lens have most probably been trapped there in assembly phase at Nokia fa ctory.
Unauthorized disassembling of product can also be root cause for the problem. However, in
most cases it should be possible to remove the particle(s) by using clean compressed air. Nev-
er wipe the lens surface before trying compressed air; the possibility of damaging the lens is
substantial. Always check the image sharpness after removing dust.
Testing of sharpness
If pictures taken with some device are claimed to be blurry, there are four possible so urces for
the claim:
1Protection window is fingerprinted, soiled, dirty, visibly scratched or broken.
2User has tried to take a picture of a too close object – lens operates with dis-
tances from 40 cm to infinity. This is no cause to replace camera module.
3User has tried to take pictures in too dark conditions and images are blurred due
to handshake or movement. This is no cause to replace camera module.
4There is dirt between protection window and camera lens.
5The protection window is defective This can be either manufacturing failure or
caused by user. Window should be changed.
6Camera lens is misfocused due to manufacturing error.
Quantitative analysis of sharpness is very difficult to conduct in other than optics laborato ry environment. Thus subjective analysis should be used.
If no visible defects (items 1-4) can be found, a couple of test images should be taken and
checked. Generally, a well illuminated typical indoor office scene, such as the one in F igure A
good picture taken indoor, can be used as a target. The main consideration s are:
•The protection window has to be clean
•Amount of light: 300 – 600 lux (bright office lighting) is sufficient
•The scene should contain e.g. small objects for checking sharpness
and distance to them should be in order of 1 – 2 meters
•If possible, compare the image to another image of the same scene,
taken by different device. Note that comparison device has to be similar
Nokia cellular phone.
The taken images should be analyzed on PC screen at 100% scaling simultaneously with re ference image. Pay attention to the computer display settings; at least 65000 colors (16 bit)
have to be used. 256 (8-bit) color setting is not sufficient, and true color (24 bit, 16 million
colors) or 32 bit (full color) setting is recommended.
If there appears to be a clearly noticeable difference between the reference image and the test
images, the module might have misfocused lens. In this case, the module should be changed.
Always re-check the resolution after changing the camera.
same result, the fault is probably in camera window. Check the window by looking carefully
through it when replacing the module. As a reference image A good picture taken indoor and
A good picture taken outdoors can be used. Another possibility is to use service point comparison phone if available.
Effects of dirty or defective protection window
The following series of images demonstrates the effects of fingerprints on the camera protection window.
It should be noted that the effects of any dirt in images can vary very much; it may be difficult
to judge if the window has been dirty when some image has been taken or if something else
has been wrong. That is why the cleanness of the protection window should always be
checked and the window should be wiped clean with a suitable cloth.
Figure 13: Image taken with clear protection window
Figure 14: Image taken with a greasy protection window
Bit errors
Bit errors are defects in image caused by data transmission error between camera and phone
baseband or inside camera module. Bit errors can be typically seen in images taken of any
object, and they should be most visible in full resolution images. A good practice is to use uniform white test target when analyzing this kind of errors.
The errors will be clearly visible as colorful sharp dots or lines in camera images. See Example
about bit errors caused by JPEG compression. One type of bit erro r is lack of bit depth. In that
case image is almost totally black under normal conditions sensing something only unde r very
high illumination.
Typically this is a contact problem between the camera module and phone main PWB. Check
camera assembly and connector contacts.
If fault is in the camera module typically bit error is visible only when using some specific im age
resolution. E. g. in viewfinder fault might exist but not in full size image.