The µPD75P3018 replaces the µPD753017’s internal mask ROM with a one-time PROM, and features expanded ROM
capacity.
Because the µPD75P3018 supports programming by users, it is suitable for use in evaluations of systems in
development stages using the µPD753012, 753016, or 753017, and for use in small-scale production.
The following document describes further details of the functions. Please make sure to read this document
before starting design.
µPD753017 User's Manual : U11282E
FEATURES
Compatible with µPD753017
Memory capacity:
• PROM : 32768 x 8 bits
• RAM: 1024 x 4 bits
Can operate in same power supply voltage as the mask version µPD753017
DD = 2.2 to 5.5 V
• V
LCD controller/driver
ORDERING INFORMATION
Part NumberPackagePROM (¥ 8 bits)
µ
PD75P3018GC-3B980-pin plastic QFP (14 x 14 mm, 0.65-mm pitch)32768
µ
PD75P3018GK-BE980-pin plastic TQFP (fine pitch) (12 x 12 mm, 0.5-mm pitch)32768
Caution Mask-option pull-up resistors are not provided in this device.
*
The information in this document is subject to change without notice.
Document No. U10956EJ1V0DS00 (1st edition)
(Previous No. IP-3538)
Date Published August 1996 P
Printed in Japan
(detected edge is selectable)is selectable
INT1P11Asynch
INT2InputP12/TI1/TI2Rising edge detection test inputAsynchInput<B>-C
KR0-KR3I/OP60-P63Parallel falling edge detection test inputInput<F>-A
KR4-KR7I/OP70-P73Parallel falling edge detection test inputInput<F>-A
X1Input—Ceramic/crystal oscillation circuit connection for main system——
clock. If using an external clock, input to X1 and input
X2—inverted phase to X2.
XT1Input—Crystal oscillation circuit connection for subsystem clock.——
If using an external clock, input to XT1 and input inverted
XT2—phase to XT2. XT1 can be used as a 1-bit (test) input.
RESETInput—System reset input—<B>
MD0I/OP30/LCDCLMode selection for program memory (PROM) write/verifyInputE-B
MD1P31/SYNC
MD2, MD3P32, P33
D0-D3I/OP40-P43Data bus for program memory (PROM) write/verifyInputM-E
D4-D7P50-P53
VPP——Programmable power supply voltage for program memory——
(PROM) write/verify.
For normal operation, connect directly to VDD.
Apply +12.5 V for PROM write/verify.
VDD——Positive power supply——
Vss——Ground——
Note
Note Circuit types enclosed in brackets indicate Schmitt trigger input.
8
µ
PD75P3018
3.2 Non-port Pins (2/2)
Pin nameI/OShared byFunctionStatusI/O circuit
after resettype
S0-S23Output—Segment signal outputNote 1G-A
S24-S31Output BP0-BP7Segment signal outputNote 1H-A
COM0-COM3 Output—Common signal outputNote 1G-B
VLC0-VLC2——Power source for LCD driver——
BIASOutput—Output for external split resistor cutHigh—
Note 2
LCDCL
SYNC
Note 2
I/OP30Clock output for driving external expansion driverInputE-B
I/OP31Clock output for synchronization of external expansion driverInputE-B
impedance
Notes 1. The VLCX (X = 0, 1, 2) shown below are selected as the input source for the display outputs.
S0-S31: V
LC1, COM0-COM2: VLC2, COM3: VLC0
2. These pins are provided for future system expansion. Currently, only P30 and P31 are used.
9
3.3 Pin Input/Output Circuits
The input/output circuits for the µPD75P3018’s pins are shown in abbreviated form below.
TYPE ATYPE D
V
DD
µ
PD75P3018
V
DD
IN
P-ch
N-ch
CMOS standard input buffer
IN
Data
Output
disable
Push-pull output that can be set to high impedance output
(with both P-ch and N-ch OFF).
TYPE E-BTYPE B
P.U.R.
enable
Data
Type D
Output
disable
P-ch
N-ch
V
DD
P.U.R.
P-ch
IN/OUT
OUT
Schmitt trigger input with hysteresis characteristics.
TYPE B-CTYPE F-A
V
DD
P.U.R.
P-ch
IN
P.U.R. : Pull-Up Resistor
P.U.R.
enable
Output
disable
Data
Type A
P.U.R. : Pull-Up Resistor
P.U.R.
enable
Type D
Type B
P.U.R. : Pull-Up Resistor
V
DD
P.U.R.
P-ch
IN/OUT
(Continued)
10
µ
PD75P3018
TYPE F-BTYPE H-A
P.U.R.
Output
disable
(P)
Data
Output
disable
Output
disable
(N)
P.U.R. : Pull-Up Resistor
enable
V
DD
P-ch
N-ch
V
DD
P-ch
IN/OUT
P.U.R.
SEG
data
Bit Port
data
Output
disable
TYPE M-CTYPE G-A
*
V
LC0
P-ch
V
LC1
N-chP-ch
*
Type G-A
Type E-B
P.U.R.
enable
V
DD
IN/OUT
P.U.R.
P-ch
IN/OUT
OUT
SEG
data
V
LC2
N-ch
TYPE G-BTYPE M-E
V
LC0
P-ch
V
LC1
P-ch
COM
data
N-ch
V
LC2
N-ch
N-ch
N-ch
OUT
P-ch
Data
Output
disable
Output
disable
Input instruction
Pull-up resistor operated only when executing input instructions
Note
(when pins are low level, current flows from VDD to pins).
P.U.R. : Pull-Up Resistor
*
Data
V
DD
P-ch
P.U.R.
N-ch
Note
Voltage
controller
IN/OUT
N-ch
(+13-V
breakdown
voltage)
(+13-V
breakdown
voltage)
11
3.4 Recommended Connection for Unused Pins
PinRecommended connection
P00/INT4Connect to VSS or VDD
P01/SCKConnect to VSS or VDD
P02/SO/SB0
P03/SI/SB1Connect to VSS
P10/INT0, P11/INT1Connect to VSS or VDD
P12/TI1/TI2/INT2
P13/TI0
P20/PTO0Input status :connect to Vss or VDD through
P21/PTO1individual resistor
P22/PTO2/PCLOutput status :open
P23/BUZ
P30/LCDCL/MD0
P31/SYNC/MD1
P32/MD2, P33/MD3
P40-P43
P50-P53
P60/KR0-P63/KR3
P70/KR4-P73/KR7
S0-S23Open
S24/BP0-S31/BP7
COM0-COM3
VLC0-VLC2Connect to Vss
BIASConnect to Vss only when VLC0 to VLC2 are all not used.
Note
XT1
Note
XT2
In other cases, leave open.
Connect to Vss
Open
µ
PD75P3018
*
Note When subsystem clock is not used, specify SOS.0 = 1 (indicates that
internal feedback resistor is disconnected).
12
µ
PD75P3018
4. SWITCHING FUNCTION BETWEEN Mk I AND Mk II MODE
Setting a stack bank selection (SBS) register for the µPD75P3018 enables the program memory to be switched between
Mk I mode and Mk II mode. This function is applicable when using the µPD75P3018 to evaluate the µPD753012, 753016,
or 753017.
When the SBS bit 3 is set to 1 : sets Mk I mode (supports Mk I mode for µPD753012, 753016, and 753017)
When the SBS bit 3 is set to 0 : sets Mk II mode (supports Mk II mode for µPD753012, 753016, and 753017)
4.1 Difference between Mk I Mode and Mk II Mode
Table 4-1 lists points of difference between the Mk I mode and the Mk II mode for the µPD75P3018.
Table 4-1. Difference between Mk I Mode and Mk II Mode
ItemMk I ModeMk II Mode
Program counterPC13-0PC14-0
PC14 is fixed at 0
Program memory (bytes)1638432768
Data memory (bits)1024 x 4
StackStack bankSelectable via memory banks 0 to 3
CALLA !addr1 instruction
InstructionCALL !addr instruction3 machine cycles4 machine cycles
execution time CALLF !faddr instruction2 machine cycles3 machine cycles
Supported mask ROMsWhen set to Mk I mode:When set to Mk II mode:
µPD753012, 753016, and 753017µPD753012, 753016, and 753017
Caution The Mk II mode supports a program area exceeding 16 Kbytes for the 75X and 75XL series. Therefore,
this mode is effective for enhancing software compatibility with products that have a program area of
more than 16 Kbytes.
With regard to the number of stack bytes during execution of subroutine call instructions, the usable
area increases by 1 byte per stack compared to the Mk I mode when the Mk II mode is selected.
However, when the CALL !addr and CALLF !faddr instructions are used, the machine cycle becomes
longer by 1 machine cycle. Therefore, if more emphasis is placed on RAM use efficiency and
processing performance than on software compatibility, the Mk I mode should be used.
*
13
µ
PD75P3018
4.2 Setting of Stack Bank Selection Register (SBS)
Use the stack bank selection register to switch between Mk I mode and Mk II mode. Figure 4-1 shows the format for doing
this.
The stack bank selection register is set using a 4-bit memory manipulation instruction. When using the Mk I mode, be
sure to initialize the stack bank selection register to 10XXB
Note
be sure to initialize it to 00XXB
.
Note
at the beginning of the program. When using the Mk II mode,
Note Set the desired value for XX.
Figure 4-1. Format of Stack Bank Selection Register
Address3210
SBS3 SBS2 SBS1 SBS0F84H
Symbol
SBS
Stack area specification
0
0
Memory bank 0
0
1
Memory bank 1
1
0
Memory bank 2
1
1
Memory bank 3
0Be sure to enter “0” for bit 2.
Mode selection specification
01Mk II mode
Mk I mode
Cautions 1. SBS3 is set to “1” after RESET input, and consequently the CPU operates in Mk I mode. When using
instructions for Mk II mode, set SBS3 to “0” and set Mk II mode before using the instructions.
2. When using Mk II mode, execute a subroutine call instruction and an interrupt instruction after
RESET input and after setting the stack bank selection register.
14
µ
PD75P3018
5. DIFFERENCES BETWEEN µPD75P3018 AND µPD753012, 753016, AND 753017
The µPD75P3018 replaces the internal mask ROM in the µPD753012, 753016, and 753017 with a one-time PROM and
features expanded ROM capacity. The µPD75P3018’s Mk I mode supports the Mk I mode in the µPD753012, 753016,
and 753017 and the µPD75P3018’s Mk II mode supports the Mk II mode in the µPD753012, 753016, and 753017.
Table 5-1 lists differences among the µPD75P3018 and the µPD753012, 753016, and 753017. Be sure to check the
differences among these products before using them with PROMs for debugging or prototype testing of application
systems or, later, when using them with a mask ROM for full-scale production.
For the CPU functions and internal hardwares, refer to µPD753017 User's Manual (U11282E).
Table 5-1. Differences between µPD75P3018 and µPD753012, 753016, and 753017
ItemµPD753012µPD753016µPD753017µPD75P3018
Program counter14 bits15 bits
Program memory (bytes)Mask ROMOne-time PROM
During12288163841638416384
Mk I mode
During12288163842457632768
Mk II mode
Data memory (x 4 bits)1024
Mask optionsPull-up resistor forYes (Can be specified whether to incorporate or not)
Pin configuration Pin Nos. 29 to 32P40 to P43P40/D0 to P43/D3
OtherNoise resistance and noise radiation may differ due to the different circuit sizes and mask
PORT4 and PORT5
LCD split resistor
Feed back resistorYes (Can be specified with the SOS register whether to
for subsystem clockincorporate or not)
Wait timeYes (Can be specified either 217/fX or 215/fX)
during RESET
Pin Nos. 34 to 37P50 to P53P50/D4 to P53/D7
Pin No. 50P30/LCDCLP30/LCDCL/MD0
Pin No. 51P31/SYNCP31/SYNC/MD1
Pin Nos. 52 and 53P32, P33P32/MD2, P33/MD3
Pin No. 57ICVPP
layouts.
Note
No (Cannot incorporate)
No (Cannot incorporate)
No (Fixed at 215/fX)
Note
*
*
Note For 217/fX, during 6.0 MHz operation is 21.8 ms, and during 4.19 operation is 31.3 ms.
15
/fX, during 6.0 MHz operation is 5.46 ms, and during 4.19 operation is 7.81 ms.
For 2
Caution Noise resistance and noise radiation are different in PROM and mask ROMs. In transferring to mask
ROM versions from the PROM version in a processe between prototype development and full
production, be sure to fully evaluate the mask ROM version’s CS (not ES).
15
µ
PD75P3018
6. MEMORY CONFIGURATION
6.1 Program Counter (PC) ... 15 bits
This is a 15-bit binary counter that stores program memory address data.
Bit 15 is valid during Mk II mode. But PC14 is fixed at zero during Mk I mode, and the lower 14 bits are all valid.
The program memory consists of 32768 x 8-bit one-time PROM. The program memory address can be selected as shown
below by setting the stack bank selection (SBS) register.
Mk I modeMk II mode
Usable address0000H to 3FFFH0000H to 7FFFH
Figures 6-2 and 6-3 show the addressing ranges for the program memory and branch instruction and the subroutine call
instruction, during Mk I and Mk II modes.
Caution To allow the vectored interrupt’s 14-bit start address (noted above), set the address within a 16-K area
(0000H to 3FFFH).
Remark For instructions other than those noted above, the BR PCDE and BR PCXA instructions can be used to branch
18
to addresses with changes in the PC’s lower 8 bits only.
µ
PD75P3018
6.3 Data Memory (RAM) ... 1024 x 4 bits
Figure 6-4 shows the data memory configuration.
Data memory consists of a data area and a peripheral hardware area. The data area consists of 1024 x 4-bit static RAM.
Figure 6-4. Data Memory Map
Data area
static RAM
(1024 x 4)
Display data memory
Stack area
Note
General-purpose register area
000H
01FH
020H
0FFH
100H
1DFH
1E0H
1FFH
200H
Data memory
(8 x 4)
256 x 4
(248 x 4)
256 x 4
(224 x 4)
(32 x 4)
256 x 4
Memory bank
0
1
2
2FFH
300H
3FFH
F80H
Peripheral hardware area
FFFH
Note Memory bank 0, 1, 2, or 3 can be selected as the stack area.
256 x 4
Not incorporated
128 x 4
3
15
19
µ
PD75P3018
7. INSTRUCTION SET
(1) Representation and coding formats for operands
In the instruction’s operand area, use the following coding format to describe operands corresponding to the instruction’s
operand representations (for further description, see the RA75X Assembler Package User’s Manual –Language (EEU-
1363)). When there are several codes, select and use just one. Codes that consist of upper-case letters and + or – symbols
are key words that should be entered as they are.
For immediate data, enter an appropriate numerical value or label.
Enter register flag symbols as label descriptors instead of mem, fmem, pmem, bit, etc. (For details, refer to the User'sManual). The number of labels that can be entered for fmem and pmem are restricted.
RepresentationCoding format
regX, A, B, C, D, E, H, L
reg1X, B, C, D, E, H, L
rpXA, BC, DE, HL
rp1BC, DE, HL
rp2BC, DE
rp’XA, BC, DE, HL, XA’, BC’, DE’, HL’
rp’1BC, DE, HL, XA’, BC’, DE’, HL’
rpaHL, HL+, HL–, DE, DL
rpa1DE, DL
n44-bit immediate data or label
n88-bit immediate data or label
mem8-bit immediate data or label
bit2-bit immediate data or label
fmemFB0H-FBFH, FF0H-FFFH immediate data or label
pmemFC0H-FFFH immediate data or label
addr0000H-3FFFH immediate data or label (Mk I mode and Mk II mode)
addr10000H-7FFFH immediate data or label (Mk II mode only)
caddr12-bit immediate data or label
faddr11-bit immediate data or label
taddr20H-7FH immediate data (however, bit0 = 0) or label
PORTnPORT0-PORT7
IEXXXIEBT, IECSI, IET0, IET1, IET2, IE0-IE2, IE4, IEW
RBnRB0-RB3
MBnMB0-MB3, MB15
Note
20
Note When processing 8-bit data, only even-numbered addresses can be specified.
(2) Operation legend
A: A register; 4-bit accumulator
B: B register
C: C register
D: D register
E: E register
H: H register
L: L register
X: X register
XA: Register pair (XA); 8-bit accumulator
BC: Register pair (BC)
DE: Register pair (DE)
HL: Register pair (HL)
XA’: Expansion register pair (XA’)
BC’: Expansion register pair (BC’)
DE’: Expansion register pair (DE’)
HL’: Expansion register pair (HL’)
PC: Program counter
SP: Stack pointer
CY: Carry flag; bit accumulator
PSW: Program status word
MBE: Memory bank enable flag
RBE: Register bank enable flag
PORTn : Port n (n = 0 to 7)
IME: Interrupt master enable flag
IPS: Interrupt priority selection register
IEXXX: Interrupt enable flag
RBS: Register bank selection register
MBS: Memory bank selection register
PCC: Processor clock control register
.: Delimiter for address and bit
(XX): Addressed data
XXH: Hexadecimal data
µ
PD75P3018
21
(3) Description of symbols used in addressing area
MB = MBE • MBS
*1
MB = 0
*2
*3
MBE = 0 :
MBE = 1 :
MB = 15, fmem = FB0H-FBFH, FF0H-FFFH
*4
MB = 15, pmem = FC0H-FFFH
*5
addr = 0000H-3FFFH
*6
addr, addr1 =*7(Current PC) –15 to (Current PC) –1
Caution The GETI instruction is skipped for one machine cycle.
..............S = 2
One machine cycle equals one cycle (= t
CY) of the CPU clock F. Use the PCC setting to select among four cycle times.
23
µ
PD75P3018
InstructionMnemonicOperand
group
TransferMOVA, #n411A<-n4String-effect A
reg1, #n422reg1<-n4
XA, #n822XA<-n8String-effect A
HL, #n822HL<-n8String-effect B
rp2, #n822rp2<-n8
A, @HL11A<-(HL)*1
A, @HL+12+SA<-(HL), then L<-L+1*1L=0
A, @HL–12+S A<-(HL), then L<-L–1*1L=FH
A, @rpa111A<-(rpa1)*2
XA, @HL22XA<-(HL)*1
@HL, A11(HL)<-A*1
@HL, XA22(HL)<-XA*1
A, mem22A<-(mem)*3
XA, mem22XA<-(mem)*3
mem, A22(mem)<-A*3
mem, XA22(mem)<-XA*3
A, reg122A<-reg1
XA, rp’22XA<-rp’
reg1, A22reg1<-A
rp’1, XA22rp’1<-XA
XCHA, @HL11A<->(HL)*1
A, @HL+12+SA<->(HL), then L<-L+1*1L=0
A, @HL–12+S A<->(HL), then L<-L–1*1L=FH
A, @rpa111A<->(rpa1)*2
XA, @HL22XA<->(HL)*1
A, mem22A<->(mem)*3
XA, mem22XA<->(mem)*3
A, reg111A<->reg1
TBR or TCALLreferenced
Execute (taddr)(taddr+1) instructionsinstruction
Addressing
Skip
condition
- - - - - - - - - - - -
- - - - - - - - - - - -
- - - - - - - - - - - -
- - - - - - - - - - - -
Notes 1. Before executing the IN or OUT instruction, set MBE to 0 or 1 and set MBS to 15.
2. TBR and TCALL are assembler pseudo-instructions for the GETI instruction’s table definitions.
3. Shaded areas indicate support for Mk II mode only. Other areas indicate support for Mk I mode only.
29
8. ONE-TIME PROM (PROGRAM MEMORY) WRITE AND VERIFY
The program memory contained in the µPD75P3018 is a 32768 x 8-bit one-time PROM that can be electrically written one
time only. The pins listed in the table below are used for this PROM’s write/verify operations. Clock input from the X1
pin is used instead of address input as a method for updating addresses.
PinFunction
VPPPin where program voltage is applied during program memory
write/verify (usually VDD potential)
X1, X2Clock input pins for address updating during program memory
write/verify. Input the X1 pin’s inverted signal to the
X2 pin.
MD0-MD3Operation mode selection pin for program memory write/verify
D0/P40 to D3/P438-bit data I/O pins for program memory write/verify
(lower 4 bits)
D4/P50 to D7/P53
(upper 4 bits)
VDDPin where power supply voltage is applied.
*
Applies VDD = 2.2 to 5.5 V in normal operation mode and +6 V
for program memory write/verify.
µ
PD75P3018
Caution Pins not used for program memory write/verify should be connected to Vss.
8.1 Operation Modes for Program Memory Write/Verify
When +6 V is applied to the V
mode. The following operation modes can be specified by setting pins MD0 to MD3 as shown below.
Program memory can be written at high speed using the following procedure.
(1) Pull unused pins to Vss through resistors. Set the X1 pin low.
(2) Supply 5 V to the V
DD and VPP pins.
(3) Wait 10 µs.
(4) Select the zero-clear program memory address mode.
(5) Supply 6 V to the V
DD and 12.5 V to the VPP pins.
(6) Select the program inhibit mode.
(7) Write data in the 1 ms write mode.
(8) Select the program inhibit mode.
(9) Select the verify mode. If the data is correct, go to step (10) and if not, repeat steps (7) to (9).
(10) (X : number of write operations from steps (7) to (9)) x 1 ms additional write.
(11) Select the program inhibit mode.
(12) Apply four pulses to the X1 pin to increment the program memory address by one.
(13) Repeat steps (7) to (12) until the end address is reached.
(14) Select the zero-clear program memory address mode.
(15) Return the V
DD and VPP pins back to 5 V.
(16) Turn off the power.
µ
PD75P3018
The following figure shows steps (2) to (12).
Write
VPP
VPP
VDD
VDD + 1
VDD
V
DD
X1
D0/P40 to D3/P43
D4/P50 to D7/P53
MD0
(P30)
MD1
(P31)
Data input
X repetitions
Verify
Data
output
Additional write
Data input
Address
increment
MD2
(P32)
MD3
(P33)
31
µ
PD75P3018
8.3 Program Memory Read Procedure
The µPD75P3018 can read program memory contents using the following procedure.
(1) Pull unused pins to Vss through resistors. Set the X1 pin low.
(2) Supply 5 V to the V
DD and VPP pins.
(3) Wait 10 µs.
(4) Select the zero-clear program memory address mode.
(5) Supply 6 V to the V
DD and 12.5 V to the VPP pins.
(6) Select the program inhibit mode.
(7) Select the verify mode. Apply four pulses to the X1 pin. Every four clock pulses will output the data stored in one
address.
(8) Select the program inhibit mode.
(9) Select the zero-clear program memory address mode.
(10) Return the V
DD and VPP pins back to 5 V.
(11) Turn off the power.
The following figure shows steps (2) to (9).
V
PP
V
PP
V
DD
V
DD
+ 1
V
DD
DD
V
X1
D0/P40 to D3/P43
D4/P50 to D7/P53
MD0
(P30)
MD1
(P31)
MD2
(P32)
Data outputData output
“L”
32
MD3
(P33)
µ
PD75P3018
8.4 One-time PROM Screening
Due to its structure, the one-time PROM cannot be fully tested before shipment by NEC. Therefore, NEC recommends
that after the required data is written and the PROM is stored under the temperature and time conditions shown below,
the PROM should be verified via a screening.
Storage temperatureStorage time
125°C24 hours
33
9. ELECTRICAL CHARACTERISTICS
*
Absolute Maximum Ratings (TA = 25 °C)
ParameterSymbolConditionsRatingsUnit
Supply voltageVDD–0.3 to +7.0V
PROM supply voltageVPP–0.3 to +13.5V
Input voltageVI1Other than ports 4 and 5–0.3 to VDD + 0.3V
Output voltageVO–0.3 to VDD + 0.3V
High-level output currentIOHPer pin–10mA
Low-level output currentIOLPer pin30mA
Operating ambientTA–40 to +85°C
temperature
Storage temperatureTstg–65 to +150°C
VI2
µ
PD75P3018
Ports 4 and 5 (During N-ch open drain)
Total of all pins–30mA
Total of all pins220mA
–0.3 to +14V
Caution If the absolute maximum rating of even one of the parameters is exceeded even momentarily, the
quality of the product may be degraded. The absolute maximum ratings are therefore values which,
when exceeded, can cause the product to be damaged. Be sure that these values are never exceeded
when using the product.
Capacitance (T
Input capacitanceCINf = 1 MHz15pF
Output capacitanceCOUTUnmeasured pins returned to 0 V15pF
I/O capacitanceCIO15pF
A = 25 °C, VDD = 0 V)
ParameterSymbolConditionsMIN.TYP.MAX.Unit
34
µ
PD75P3018
Main System Clock Oscillation Circuit Characteristics (TA = –40 to +85 °C)
Resonator Recomended Constants Parameter Conditions MIN. TYP. MAX. Unit
Ceramic VDD = 2.2 to 5.5 V Oscillation frequency 1.0 6.0
resonator (fX)
Note 1
X1 X2
Note 2
MHz
C1 C2
V
DD
Crystal VDD = 2.2 to 5.5 V Oscillation frequency 1.0 6.0
resonator (fX)
Oscillation After VDD has 4 ms
stabilization time
Note 3
reached MIN. value
of oscillation voltage
range
Note 2
Note 1
MHz
X1 X2
C1 C2
V
DD
External VDD = 1.8 to 5.5 V X1 input frequency 1.0 6.0
clock (fX)
Oscillation VDD = 4.5 to 5.5 V 10 ms
stabilization time
Notes1.The oscillation frequency and X1 input frequency shown above indicate characteristics of the oscillation circuit
only. For the instruction execution time, refer to AC Characteristics.
2.When the supply voltage is 1.8 V ≤ VDD < 2.7 V and the oscillation frequency is 4.19 MHz < fX≤ 6.0 MHz, do
not select processor clock control register (PCC) = 0011 as the instruction execution time. If PCC = 0011, one
µ
machine cycle is less than 0.95
3.The oscillation stabilization time is the time required for oscillation to be stabilized after V
s, falling short of the rated value of 0.95 µs.
DD has been applied
or STOP mode has been released.
CautionWhen using the main system clock oscillation circuit, wire the portion enclosed in the broken line in
the above figure as follows to prevent adverse influences due to wiring capacitance:
• Keep the wiring length as short as possible.
• Do not cross the wiring with other signal lines.
• Do not route the wiring in the vicinity of a line through which a high alternating current flows.
• Always keep the ground point of the capacitor of the oscillation circuit at the same potential as V
DD.
• Do not ground to a power supply pattern through which a high current flows.
• Do not extract signals from the oscillation circuit.
35
µ
PD75P3018
Subsystem Clock Oscillation Circuit Characteristics (TA = –40 to +85 °C, VDD = 2.2 to 5.5 V)
Resonator Recomended Constants Parameter Conditions MIN. TYP. MAX. Unit
Crystal Oscillation frequency 32 32.768 35 kHz
resonator (fXT)
XT1 XT2
R
C3 C4
V
DD
Note 1
Oscillation VDD = 4.5 to 5.5 V 1.0 2 s
stabilization time
Note 2
VDD≥ 2.2 V 10
External XT1 input frequency 32 100 kHz
clolck (fXT)
Notes1.The oscillation frequency and XT1 input frequency shown above indicate characteristics of the oscillation circuit
only. For the instruction execution time, refer to AC Characteristics.
2.The oscillation stabilization time is the time required for oscillation to be stabilized after V
DD has been applied.
CautionWhen using the subsystem clock oscillation circuit, wire the portion enclosed in the broken line in the
above figure as follows to prevent adverse influences due to wiring capacitance:
• Keep the wiring length as short as possible.
• Do not cross the wiring with other signal lines.
• Do not route the wiring in the vicinity of a line through which a high alternating current flows.
• Always keep the ground point of the capacitor of the oscillation circuit at the same potential as V
DD.
• Do not ground to a power supply pattern through which a high current flows.
• Do not extract signals from the oscillation circuit.
The subsystem clock oscillation circuit has a low amplification factor to reduce current dissipation and
is more susceptible to noise than the main system clock oscillation circuit. Therefore, exercise utmost
care in wiring the subsystem clock oscillation circuit.
36
µ
PD75P3018
DC Characteristics (TA = –40 to +85 °C, VDD = 2.2 to 5.5 V)
Parameter Symbol Conditions MIN. TYP. MAX. Unit
Low-level output IOL Per pin 15 mA
current Total of all pins 150 mA
High-level input VIH1 Ports 2, 3 2.7 V ≤ VDD≤ 5.5 V 0.7 VDD VDD V
voltage 2.2 V ≤ VDD < 2.7 V 0.9 VDD VDD V
VIH2 Ports 0, 1, 6, 7, RESET 2.7 V ≤ VDD≤ 5.5 V 0.8 VDD VDD V
2.2 V ≤ VDD < 2.7 V 0.9 VDD VDD V
VIH3 Ports 4, 5 2.7 V ≤ VDD≤ 5.5 V 0.7 VDD 13 V
(During N-ch open drain) 2.2 V ≤ VDD < 2.7 V 0.9 VDD 13 V
VIH4 X1, XT1 VDD – 0.1 VDD V
Low-level input VIL1 Ports 2, 3, 4, 5 2.7 V ≤ VDD≤ 5.5 V 0 0.3 VDD V
voltage 2.2 V ≤ VDD < 2.7 V 0 0.1 VDD V
VIL2 Ports 0, 1, 6, 7, RESET 2.7 V ≤ VDD≤ 5.5 V 0 0.2 VDD V
2.2 V ≤ VDD < 2.7 V 0 0.1 VDD V
VIL3 X1, XT1 0 0.1 V
High-level output VOH SCK, SO/SB0, SB1, Ports 2, 3, 6, 7, BP0 to 7 VDD – 0.5 V
voltage IOH = –1 mA
Low-level output VOL1 SCK, SO, Ports 2, 3, 4, 5, 6, 7, IOL = 15 mA 0.2 2.0 V
voltage BP0 to 7 VDD = 4.5 to 5.5 V
IOL = 1.6 mA 0.4 V
VOL2 SB0, SB1 During N-ch open drain 0.2 VDD V
Pull-up resistor ≥ 1 kΩ
High-level input ILIH1 VIN = VDD Pins other than X1, XT1 3
leakage current ILIH2 X1, XT1 20
ILIH3 VIN = 13 V Ports 4, 5 (During N-ch open drain) 20
Low-level input ILIL1 VIN = 0 V Pins other than X1, XT1, Ports 4, 5 –3
leakage current ILIL2 X1, XT1 –20
ILIL3 Ports 4, 5 (During N-ch open drain) –30
When input instruction VDD = 5.0 V –10 –27
is executed VDD = 3.0 V –3 –8
High-level output ILOH1 VOUT = VDD SCK, SO/SB0, SB1, Ports 2, 3, 6, 7 3
leakage current ILOH2 VOUT = 13 V Ports 4, 5 (During N-ch open drain) 20
Low-level output ILOL VOUT = 0 V –3
leakage current
Internal pull-up RL1 VIN = 0 V Ports 0, 1, 2, 3, 6, 7 (except P00 pin) 50 100 200 kΩ
resistor
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
37
µ
PD75P3018
DC Characteristics (TA = –40 to +85 °C, VDD = 2.2 to 5.5 V)
ParameterSymbolConditionsMIN.TYP.MAX.Unit
LCD drive voltage VLCDVAC0 = 02.2VDDV
LCD output voltage
deviation
Note 1
(common)VLCD2 = VLCD¥ 1/3
LCD output voltage
deviation
Note 1
(segment)
Supply current
VODCIO = ±5 µAVLCD0 = VLCD0±0.2V
VLCD1 = VLCD¥ 2/3
VODSIO = ±1 µA2.2 V - VLCD - VDD0±0.2V
Note 2
IDD16.0 MHz
Note 3
VDD = 5.0 V ±10 %
crystalVDD = 3.0 V ±10 %
Note 4
Note 5
3.711.0mA
0.732.2mA
IDD2oscillationHALT VDD = 5.0 V ±10 %0.922.6mA
IDD1
C1 = C2 = 22 pF
4.19 MHz
crystalVDD = 3.0 V ±10 %
mode VDD = 3.0 V ±10 %0.300.9mA
Note 3
VDD = 5.0 V ±10 %
Note 4
Note 5
2.78.0mA
0.571.7mA
IDD2oscillationHALT VDD = 5.0 V ±10 %0.902.5mA
C1 = C2 = 22 pF
mode VDD = 3.0 V ±10 %0.280.8mA
IDD332.768Low-VDD = 3.0 V ±10 %42126
Note 6
kHz
crystal
oscillation
voltage VDD = 2.5 V ±10 %37110
Note 7
mode
VDD = 3.0 V, TA = 25 °C4284
Low power
VDD = 3.0 V ±10 %391 17
dissipation
VDD = 3.0 V, TA = 25 °C3978
Note 8
mode
IDD4HALT Low-VDD = 3.0 V ±10 %8.525
mode voltage V DD = 2.5 V ±10 %5.817
Note 7
mode
VDD = 3.0 V, TA = 25 °C8.517
Low power
VDD = 3.0 V ±10 %3.512
dissipation
VDD = 3.0 V, TA = 25 °C3.57
Note 8
mode
IDD5
XT1 = 0 V
Note 9
VDD = 5.0 V ±10 %0.0510
STOP mode VDD = 3.0 V ±10 %0.025
TA = 25 °C0.023
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
µ
A
Notes 1. Voltage deviation is the difference between the ideal values (VLCDn ; n = 0, 1, 2) of the segment and common
outputs and the output voltage.
2. The current flowing through the internal pull-up resistor is not included.
3. Including the case when the subsystem clock oscillates.
4. When the device operates in high-speed mode with the processor clock control register (PCC) set to 0011.
5. When the device operates in low-speed mode with PCC set to 0000.
6. When the device operates on the subsystem clock, with the system clock control register (SCC) set to 1001
and oscillation of the main system clock stopped.
7. When the sub-oscillation control register (SOS) is set to 0000.
8. When the SOS is set to 0010.
9. When the SOS is set to 0011.
38
µ
Operation
guaranteed range
Supply voltage
V
DD
[V]
0123456
0.5
1
2
3
4
5
6
60
64
70
Cycle time t
CY
[µs]
tCY vs V
DD
(with main system clock)
AC Characteristics (TA = –40 to +85 °C, VDD = 2.2 to 5.5 V)
ParameterSymbolConditionsMIN.TYP.MAX.Unit
CPU clock cycle time
(minimum instructionwith
execution timemain system
= 1 machine cycle)clockclock is used0.9564
VDD = 2.7 to 5.5 V
VDD = 2.2 to 5.5 V
VDD = 2.7 to 5.5 V
0.6764
0.8564
0.6764
0275kHz
PD75P3018
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
Notes 1. The cycle time of the CPU clock
(F) is determined by the
oscillation frequency of the
connected resonator (and
external clock), the system clock
control register (SCC), and
processor clock control register
(PCC).
The figure on the right shows the
supply voltage V
t
CY characteristics when the
DD vs. cycle time
device operates with the main
system clock.
CY or 128/fX depending on the
2. 2t
setting of the interrupt mode
register (IM0).
Remark The shaded portion indicates the range when
the external clock is used.
39
µ
PD75P3018
Serial transfer operation
2-wire and 3-wire serial I/O modes (SCK ... internal clock output): (TA = –40 to +85 °C, VDD = 2.2 to 5.5 V)
Parameter Symbol Conditions MIN. TYP. MAX. Unit
SCK cycle time tKCY1 VDD = 2.7 to 5.5 V 1300 ns
3800 ns
SCK high-/low-level widths tKL1, tKH1 VDD = 2.7 to 5.5 V
Note 1
SI
setup time (to SCK ↑)
tSIK1 VDD = 2.7 to 5.5 V 150 ns
t
KCY1
/2–50
t
KCY1
/2–150
500 ns
Note 1
SI
hold time (from SCK ↑)
tKSI1 VDD = 2.7 to 5.5 V 400 ns
600 ns
SCK Ø Æ SO
delay
Note 1
output
tKSO1 RL = 1 kΩ,
time CL = 100 pF 0 1000 ns
Note 2
VDD = 2.7 to 5.5 V 0 250 ns
2-wire and 3-wire serial I/O modes (SCK ... external clock input): (TA = –40 to +85 °C, VDD = 2.2 to 5.5 V)
ns
ns
Parameter Symbol Conditions MIN. TYP. MAX. Unit
SCK cycle time tKCY2 VDD = 2.7 to 5.5 V 800 ns
3200 ns
SCK high-/low-level widths tKL2, tKH2 VDD = 2.7 to 5.5 V 400 ns
1600 ns
Note 1
SI
setup time (to SCK ↑)
tSIK2 VDD = 2.7 to 5.5 V 100 ns
150 ns
Note 1
SI
hold time (from SCK ↑)
tKSI2 VDD = 2.7 to 5.5 V 400 ns
600 ns
SCK Ø Æ SO
delay
Note 1
output
tKSO2 RL = 1 kΩ,
time CL = 100 pF 0 1000 ns
Note 2
VDD = 2.7 to 5.5 V 0 300 ns
Notes1.In 2-wire serial I/O mode, read SB0 or SB1 instead.
2.R
L and CL respectively indicate the load resistance and load capacitance of the SO output line.
40
µ
PD75P3018
SBI mode (SCK ... internal clock output (master)): (TA = –40 to +85 °C, VDD = 2.2 to 5.5 V)
Parameter Symbol Conditions MIN. TYP. MAX. Unit
SCK cycle time tKCY3 VDD = 2.7 to 5.5 V 1300 ns
3800 ns
SCK high-/low-level widths tKL3, tKH3 VDD = 2.7 to 5.5 V
SB0, 1 setup time
(to SCK ↑)
SB0, 1 hold time (from SCK ↑)
SCK Ø Æ SB0, 1 output
delay
Input voltage high VIH1 Except X1, X2 0.7 VDD VDD V
VIH2 X1, X2 VDD – 0.5 VDD V
Input voltage low VIL1 Except X1, X2 0 0.3 VDD V
VIL2 X1, X2 0 0.4 V
Input leakage current ILI VIN = VIL or VIH 10
Output voltage high VOH IOH = –1 mA VDD – 1.0 V
Output voltage low VOL IOL = 1.6 mA 0.4 V
VDD supply current IDD 30 mA
VPP supply current IPP MD0 = VIL, MD1 = VIH 30 mA
Cautions1.Ensure that VPP does not exceed +13.5 V including overshoot.
2.V
DD must be applied before VPP, and cut after VPP.
µ
A
AC Programming Characteristics (T
Parameter Symbol Note 1 Conditions MIN. TYP. MAX. Unit
Address setup time
MD1 setup time (to MD0Ø)tM1S tOES 2
Data setup time (to MD0Ø)tDS tDS 2
Address hold time
Data hold time (from MD0↑)tDH tDH 2
MD0↑ÆData output float delay time
VPP setup time (to MD3↑)tVPS tVPS 2
VDD setup time (to MD3↑)tVDS tVCS 2
Initial program pulse width tPW tPW 0.95 1.0 1.05 ms
Additional program pulse width tOPW tOPW 0.95 21.0 ms
MD0 setup time (to MD1↑)tM0S tCES 2
MD0ØÆData output delay time
MD1 hold time (from MD0↑)tM1H tOEH 2
MD1 recovery time (from MD0Ø)tM1R tOR 2
Program counter reset time tPCR —10
X1 input high-/low-level width tXH, tXL — 0.125
X1 input frequency fX — 4.19 MHz
Initial mode setting time tI —2
MD3 setup time (to MD1↑)tM3S —2
MD3 hold time (from MD1Ø)tM3H —2
MD3 setup time (to MD0Ø)tM3SR — Program memory read 2
Data output delay time from address
Data output hold time from address
MD3 hold time (from MD0↑)tM3HR — Program memory read 2
MD3ØÆData output float delay time
Solder the µPD75P3018 under the following recommended conditions.
For the details on the recommended soldering conditions, refer to Information Document Semiconductor DeviceMounting Technology Manual (C10535E).
For the soldering methods and conditions other than those recommended, consult NEC.
Table 11-1. Soldering Conditions of Surface Mount Type
µ
PD75P3018
(1) µPD75P3018GC-3B9: 80-pin plastic QFP (14
Soldering MethodSoldering ConditionsSymbol
Infrared reflowPackage peak temperature: 235 °C, Time: 30 seconds max. (210 °C min.), IR35-00-3
Number of times: 3 max.
VPSPackage peak temperature: 215 °C, Time: 40 seconds max. (200 °C min.), VP15-00-3
Number of times: 3 max.
Wave solderingSolder temperature: 260 °C max., Time: 10 seconds max.,WS60-00-1
Number of times: 1
Preheating temperature: 120 °C max. (package surface temperature)
Pin partial heatingPin temperature: 300 °C max., Time: 3 seconds max. (per side of device)—
¥ ¥
¥ 14 mm)
¥ ¥
Caution Do not use two or more soldering methods in combination (except the pin partial heating method).
Package peak temperature: 235 °C, Time: 30 seconds max. (210 °C min.),
Number of times: 2 max., Exposure limit: 7 days
necessary at 125 °C for 10 hours.)
Package peak temperature: 215 °C, Time: 40 seconds max. (200 °C min.),
Number of times: 2 max., Exposure limit: 7 days
necessary at 125 °C for 10 hours.)
Solder temperature: 260 °C max., Time: 10 seconds max.,
Number of times: 1,
Preheating temperature: 120 °C max. (package surface temperature)
Exposure limit: 7 days
hours.)
Pin temperature: 300 °C max., Time: 3 seconds max. (per side of device)
Note
(After that, prebaking is necessary at 125 °C for 10
¥ ¥
¥ 12 mm)
¥ ¥
Note
Note
(After that, prebaking is
(After that, prebaking is
Note
The number of days for storage after the dry pack has been opened. The storage conditions are 25 °C, 65 % RH max.
Caution Do not use two or more soldering methods in combination (except the pin partial heating method).
50
APPENDIX AµPD75316B, 753017 AND 75P3018 FUNCTION LIST
µ
PD75P3018
Parameter
Program memoryMask ROMMask ROMOne-time PROM
Data memory000H-3FFH (1024 ¥ 4 bits)
CPU75X Standard75XL CPU
InstructionWhen main system0.95, 1.91, or 15.3 µs• 0.95, 1.91, 3.81, or 15.3 µs (at 4.19 MHz operation)
execution timeclock is selected(at 4.19 MHz operation)• 0.67, 1.33, 2.67, or 10.7 µs (at 6.0 MHz operation)
When subsystem122 µs (at 32.768 kHz operation)
clock is selected
Pin connection 29 to 32P40 to P43P40/D0 to P43/D3
34 to 37P50 to P53P50/D4 to P53/D7
44P12/INT2P12/INT2/TI1/TI2
47P21P21/PTO1
48P22/PCLP22/PCL/PTO2
50 to 53P30 to P33P30/MD0 to P33/MD3
57ICVPP
StackSBS registerNoneSBS.3 = 1; Mk I mode selection
Register bank selection register (RBS)NoneYes
Standby release by INT0NoYes
Vectored interruptExternal: 3, Internal: 3External: 3, Internal: 5
Supply voltageVDD = 2.0 to 6.0 VVDD = 2.2 to 5.5 V
Operating ambient temperatureTA = –40 to +85 °C
Package• 80-pin plastic TQFP (fine pitch) (12 x 12 mm)
Feedback resistor cut flag
(SOS.0)
Sub-oscillator currentNoneProvided
cut flag (SOS.1)
µ
PD75316B
(Main system clock: (Main system clock: at 4.19 MHz operation)
at 4.19 MHz operation)• F, 750, 375, 93.8 kHz
(Main system clock: (Main system clock: at 4.19 MHz operation or
at 4.19 MHz operation) subsystem clock: at 32.768 kHz operation)
• 3-wire serial I/O mode ... MSB/LSB can be selected for transfer top bit
• 2-wire serial I/O mode
• SBI mode
NoneProvided
• 80-pin plastic QFP (14 x 14 mm)
µ
PD753017
(Main system clock: at 6.0 MHz operation)
• 2.86, 5.72, 45.8 kHz
(Main system clock: at 6.0 MHz operation)
µ
PD75P3018
52
µ
PD75P3018
APPENDIX B DEVELOPMENT TOOLS
The following development tools have been provided for system development using the µPD75P3018. In the 75XL Series,
the relocatable assembler common to series is used in combination with the device file of each type.
IBM PC/ATRefer to "OS for3.5" 2HCµS7B13DF753017
or compatibleIBM PCs"5" 2HCµS7B10DF753017
TM
Refer to "OS for3.5" 2HCµS7B13RA75X
OSSupply medium
TM
Ver.3.30 to5" 2HDµS5A10RA75X
Note
Ver.6.2
Ver.3.30 to5" 2HDµS5A10DF753017
Note
Ver.6.2
3.5" 2HDµS5A13RA75X
*
*
Note Ver. 5.00 or later includes a task swapping function, but this software is not able to use that function.
Remark Operation of the assembler and device file is guaranteed only when using the host machine and OS described
above.
53
*
*
µ
PD75P3018
PROM Write Tools
HardwarePG-1500This is a PROM programmer that can program single-chip microcontroller with PROM in stand
alone mode or under control of host machine when connected with supplied accessory board
and optional programmer adapter.
It can also program typical PROMs in capacities ranging from 256 K to 4 M bits.
PA-75P316BGCThis is a PROM programmer adapter for the µPD75P316BGC and µPD75P3018GC.
It can be used when connected to a PG-1500.
PA-75P316BGKThis is a PROM programmer adapter for the µPD75P316BGK and µPD75P3018GK.
It can be used when connected to a PG-1500.
SoftwarePG-1500 controllerConnects PG-1500 to host machine with serial and parallel interface and controls PG-1500 on
host machine.
Host machinePart No. (name)
OSSupply medium
PC-9800 SeriesMS-DOS3.5" 2HDµS5A13PG1500
Ver.3.30 to5" 2HDµS5A10PG1500
Note
Ver.6.2
IBM PC/ATRefer to "OS for3.5" 2HDµS7B13PG1500
or compatibleIBM PCs"5" 2HCµS7B10PG1500
Note Ver. 5.00 or later includes a task swapping function, but this software is not able to use that function.
Remark Operation of the PG-1500 controller is guaranteed only when using the host machine and OS described above.
54
µ
PD75P3018
Debugging Tools
In-circuit emulators (IE-75000-R and IE-75001-R) are provided as program debugging tools for the µPD75P3018.
Various system configurations using these in-circuit emulators are listed below.
HardwareIE-75000-R
IE-75001-RThe IE-75001-R is an in-circuit emulator to be used for hardware and software debugging during
IE-75300-R-EM
EP-753018GC-RThis is an emulation probe for the µPD75P3018GC.
EP-753018GK-RThis is an emulation probe for the µPD75P3018GK.
SoftwareIE control programThis program can control the IE-75000-R or IE-75001-R on a host machine when connected to
Note 1
EV-9200GC-80It includes a 80-pin conversion socket (EV-9200GC-80) to facilitate connections
EV-9500GK-80It includes a 80-pin conversion adapter (EV-9500GK-80) to facilitate connections with target
The IE-75000-R is an in-circuit emulator to be used for hardware and software debugging during
development of application systems using the 75X or 75XL Series products.
For development of the µPD75P3018, the IE-75000-R is used with optional emulation board (IE75300-R-EM) and emulation probe (EP-753018GC-R or EP-753018GK-R).
Highly efficient debugging can be performed when connected to host machine and PROM
programmer.
The IE-75000-R includes a connected emulation board (IE-75000-R-EM).
development of application systems using the 75X or 75XL Series products.
The IE-75001-R is used with optional emulation board (IE-75300-R-EM) and emulation probe
(EP-753018GC-R or EP-753018GK-R).
Highly efficient debugging can be performed when connected to host machine and PROM
programmer.
Note 2
This is an emulation board for evaluating application systems using the µPD75P3018.
It is used in combination with the IE-75000-R or IE-75001-R.
When being used, it is connected with the IE-75000-R or IE-75001-R and the IE-75300-R-EM.
with target system.
When being used, it is connected with the IE-75000-R or IE-75001-R and the IE-75300-R-EM.
system.
the IE-75000-R or IE-75001-R via an RS-232-C or Centronics interface.
Host machinePart No. (name)
OSSupply medium
PC-9800 SeriesMS-DOS3.5" 2HDµS5A13IE75X
Ver.3.30 to5" 2HDµS5A10IE75X
Note 3
Ver.6.2
IBM PC/ATRefer to "OS for3.5" 2HCµS7B13IE75X
or compatibleIBM PCs"5" 2HCµS7B10IE75X
*
Notes 1. This is a maintenance product.
2. The IE-75300-R-EM is sold separately.
3. Ver. 5.00 or later includes a task swapping function, but this software is not able to use that function.
Remark Operation of the IE control program is guaranteed only when using the host machine and OS described above.
55
OS for IBM PCs
The following operating systems for the IBM PC are supported.
OSVersion
PC DOS
*
MS-DOSVer.5.0 to Ver.6.22
*
*
Caution Ver. 5.0 or later includes a task swapping function, but this software is not able to use that function.
IBM DOS
TM
TM
Ver.3.1 to Ver.6.3
5.0/V to 6.2/V
J5.02/V
µ
PD75P3018
56
µ
PD75P3018
APPENDIX C RELATED DOCUMENTS
The related documents indicated in this publication may include preliminary versions. However, preliminary versions are
not marked as such.
IC Package ManualC10943X
Semiconductor Device Mounting Technology ManualC10535JC10535E
Quality Grades on NEC Semiconductor DevicesIEI-620IEI-1209
NEC Semiconductor Device Reliability/Quality Control SystemC10983JC10983E
Electrostatic Discharge (ESD) TestMEM-539—
Guide to Quality Assurance for Semiconductor DevicesMEI-603MEI-1202
Guide for Products Related to Microcomputer: Other CompaniesMEI-604—
JapaneseEnglish
Document No.
Caution The above related documents are subject to change without notice. For design purpose, etc., be sure
to use the latest documents.
57
NOTES FOR CMOS DEVICES
1PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note: Strong electric field, when exposed to a MOS device, can cause destruction of
the gate oxide and ultimately degrade the device operation. Steps must be taken
to stop generation of static electricity as much as possible, and quickly dissipate
it once, when it has occurred. Environmental control must be adequate. When
it is dry, humidifier should be used. It is recommended to avoid using insulators
that easily build static electricity. Semiconductor devices must be stored and
transported in an anti-static container, static shielding bag or conductive
material. All test and measurement tools including work bench and floor should
be grounded. The operator should be grounded using wrist strap. Semiconductor
devices must not be touched with bare hands. Similar precautions need to be
taken for PW boards with semiconductor devices on it.
µ
PD75P3018
2HANDLING OF UNUSED INPUT PINS FOR CMOS
Note: No connection for CMOS device inputs can be cause of malfunction. If no
connection is provided to the input pins, it is possible that an internal input level
may be generated due to noise, etc., hence causing malfunction. CMOS devices
behave differently than Bipolar or NMOS devices. Input levels of CMOS devices
must be fixed high or low by using a pull-up or pull-down circuitry. Each unused
pin should be connected to VDD or GND with a resistor, if it is considered to have
a possibility of being an output pin. All handling related to the unused pins must
be judged device by device and related specifications governing the devices.
3STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note: Power-on does not necessarily define initial status of MOS device. Production
process of MOS does not define the initial operation status of the device.
Immediately after the power source is turned ON, the devices with reset function
have not yet been initialized. Hence, power-on does not guarantee out-pin
levels, I/O settings or contents of registers. Device is not initialized until the
reset signal is received. Reset operation must be executed immediately after
power-on for devices having reset function.
58
µ
PD75P3018
Regional Information
Some information contained in this document may vary from country to country. Before using any NEC
product in your application, please contact the NEC office in your country to obtain a list of authorized
representatives and distributors. They will verify:
• Device availability
• Ordering information
• Product release schedule
• Availability of related technical literature
• Development environment specifications (for example, specifications for third-party tools and
components, host computers, power plugs, AC supply voltages, and so forth)
• Network requirements
In addition, trademarks, registered trademarks, export restrictions, and other legal issues may also vary
from country to country.
NEC Electronics Inc. (U.S.)
Mountain View, California
Tel: 800-366-9782
Fax: 800-729-9288
United Square, Singapore 1130
Tel:253-8311
Fax: 250-3583
NEC Electronics Taiwan Ltd.
Taipei, Taiwan
Tel: 02-719-2377
Fax: 02-719-5951
NEC do Brasil S.A.
Sao Paulo-SP, Brasil
Tel: 011-889-1680
Fax: 011-889-1689
J96. 3
59
µ
PD75P3018
MS-DOS is a trademark of Microsoft Corporation.
IBM DOS, PC DOS, and PC/AT are trademarks of International Business Machines Corporation.
The export of this product from Japan is regulated by the Japanese government. To export this product may be prohibited
without governmental license, the need for which must be judged by the customer. The export or re-export of this product
from a country other than Japan may also be prohibited without a license from that country. Please call an NEC sales
representative.
No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in
this document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property
rights of third parties by or arising from use of a device described herein or any other liability arising from use
of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other
intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a
customer designated "quality assurance program" for a specific application. The recommended applications of
a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device
before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special:Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
Anti-radioactive design is not implemented in this product.
60
M4 96.5
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