National Semiconductor MM54HC266A, MM74HC266A Service Manual

MM54HC266A/MM74HC266A Quad 2-Input
Exclusive NOR Gate (Open Drain)

MM54HC266A/MM74HC266A Quad 2-Input Exclusive NOR Gate (Open Drain)

January 1988

General Description

This exclusive NOR gate utilizes advanced silicon-gate
CMOS technology to achieve operating speeds similar to
equivalent LS-TTL gates while maintaining the low power
consumption and high noise immunity characteristic of stan­dard CMOS integrated circuits. These gates are fully buff­ered and have a fanout of 10 LS-TTL loads. The MM54HC/
MM74HC logic family is functionally as well as pin out com­patible with the standard 54LS/74LS logic family. All inputs
are protected from damage due to static discharge by inter­nal diode clamps to V

and ground.

CC

Connection Diagram

Dual-In-Line Package

Top View

Order Number MM54HC266A or MM74HC266A

Features

Y

Typical propagation delay: 9 ns

Y

Wide operating voltage range: 2 –6V

Y

Low input current: 1 mA maximum

Y

Low quiescent current: 20 mA maximum (74 Series)

Y

Output drive capability: 10 LS-TTL loads

Y

Open drain outputs

TL/F/8435– 1

Truth Table

Inputs

Outputs

Logic Diagram

AB Y

LL Z
LH L
HL L
HH Z

e

Y

TRI-STATEÉis a registered trademark of National Semiconductor Corporation.

C

1995 National Semiconductor Corporation RRD-B30M105/Printed in U. S. A.

eABa

AZB

AB

TL/F/8435– 2

TL/F/8435

Absolute Maximum Ratings (Notes1&2)

Operating Conditions

If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.

Supply Voltage (V

CC

)

DC Input Voltage (VIN)

DC Output Voltage (V

OUT

)

Clamp Diode Current (IIK,IOK)

DC Output Current, per pin (I

OUT

)

DC VCCor GND Current, per pin (ICC)

Storage Temperature Range (T

STG

b

b

)

b

0.5 toa7.0V

1.5 to V

CC

0.5 to V

CC

g

g

b

g

65§Ctoa150§C

a

1.5V

a

0.5V

20 mA

25 mA

50 mA

Supply Voltage (V

)26V

CC

DC Input or Output Voltage 0 V

(V

IN,VOUT

)

Operating Temp. Range (TA)

MM74HC
MM54HC

Input Rise or Fall Times

e

V

2.0V(tr,tf) 1000 ns

CC

e

V

4.5V 500 ns

CC

e

V

6.0V 400 ns

CC

Power Dissipation (PD)

(Note 3) 600 mW
S.O. Package only 500 mW

Lead Temp. (T

) (Soldering 10 seconds) 260§C

L

DC Electrical Characteristics (Note 4)

e

T

25§C

Symbol Parameter Conditions V

CC

A

Typ Guaranteed Limits

V

Minimum High Level 2.0V 1.5 1.5 1.5 V

IH

Input Voltage 4.5V 3.15 3.15 3.15 V

6.0V 4.2 4.2 4.2 V

V

Maximum Low Level 2.0V 0.5 0.5 0.5 V

IL

Input Voltage** 4.5V 1.35 1.35 1.35 V

6.0V 1.8 1.8 1.8 V

V

Minimum High Level V

OH

Output Voltage

e

VIHor V

IN

I

l

OUT

IL

s

20 mA 2.0V 2.0 1.9 1.9 1.9 V

l

4.5V 4.5 4.4 4.4 4.4 V

6.0V 6.0 5.9 5.9 5.9 V

e

V

V

IN

IL

s

I

4.0 mA 4.5V 4.2 3.98 3.84 3.7 V

l

l

OUT

s

I

5.2 mA 6.0V 5.7 5.48 5.34 5.2 V

l

l

OUT

V

Maximum Low Level V

OL

Output Voltage

e

VIHor V

IN

I

l

OUT

IL

s

20 mA 2.0V 0 0.1 0.1 0.1 V

l

4.5V 0 0.1 0.1 0.1 V

6.0V 0 0.1 0.1 0.1 V

e

V

VIHor V

IN

I

l

OUT

I

l

OUT

I

IN

I

CC

I

OZ

Maximum Input V
Current

Maximum Quiescent V
Supply Current I

Maximum TRI-STATEÉV
Leakage Current V

Note 1: Absolute Maximum Ratings are those values beyond which damage to the device may occur.

Note 2: Unless otherwise specified all voltages are referenced to ground.

Note 3: Power Dissipation temperature derating Ð plastic ‘‘N’’ package:

Note 4: For a power supply of 5V

with this supply. Worst case V

) occur for CMOS at the higher voltage and so the 6.0V values should be used.

I

OZ

**V

limits are currently tested at 20% of VCC. The above VILspecification (30% of VCC) will be implemented no later than Q1, CY’89.

IL

g

10% the worst case output voltages (VOH, and VOL) occur for HC at 4.5V. Thus the 4.5V values should be used when designing

and VILoccur at V

IH

IN

IN

OUT

IN

OUT

e

e

e

IL

s

4.0 mA 4.5V 0.2 0.26 0.33 0.4 V

l

s

5.2 mA 6.0V 0.2 0.26 0.33 0.4 V

l

VCCor GND 6.0V

g

0.1

VCCor GND 6.0V 2.0 20 40 mA

e

0 mA

VILor V

e

VCCor GND

e

5.5V and 4.5V respectively. (The VIHvalue at 5.5V is 3.85V.) The worst case leakage current (IIN,ICC, and

CC

6.0V

IH

b

12 mW/§C from 65§Cto85§C; ceramic ‘‘J’’ package:b12 mW/§C from 100§Cto125§C.

g

0.5

74HC 54HC

eb

T

40 to 85§CT

A

g

1.0

g

5.0

Min Max Units

V

§

§

Units

b
b

40
55

A

eb

55 to 125§C

g

g

CC

a

85

a

125

1.0 mA

10.0 mA

C
C

2

AC Electrical Characteristics V

Symbol Parameter Conditions Typ

t

PLZ,tPZL

Maximum Propagation 12 20 ns
Delay

CC

e

5V, T

e

A

25§C, C

e

L

15 pF, t

e

e

t

6ns

r

f

Guaranteed

Limit

Units

AC Electrical Characteristics V

CC

Symbol Parameter Conditions V

t

PLZ,tPZL

t

THL

C

PD

C

IN

C

OUT

Maximum Propagation 2.0V 60 120 151 179 ns
Delay 4.5V 12 24 30 36 ns

Maximum Output 2.0V 30 75 95 110 ns
Fall Time 4.5V 8 15 19 22 ns

Power Dissipation (per gate) 25 pF
Capacitance (Note 5)

Maximum Input 5 10 10 10 pF
Capacitance

Maximum Three State 10 10 10 pF
Output Capacitance

Output in
TRI-STATE

Note 5: CPDdetermines the no load dynamic power consumption, P

Physical Dimensions inches (millimeters)

e

2.0V to 6.0V, C

T

CC

e

L

e

25§C

A

e

50 pF, t

e

t

6 ns (unless otherwise specified)

r

f

74HC 54HC

eb

T

40 to 85§CT

A

eb

A

55 to 125§C

Units

Typ Guaranteed Limits

6.0V 10 20 26 30 ns

6.0V 7 13 16 19 ns

2

e

CPDV

D

faICCVCC, and the no load dynamic current consumption, I

CC

e

CPDVCCfaICC.

S

Ceramic Dual-In-Line Package (J)

Order Number MM54HC266AJ

NS Package Number J14A

3

Physical Dimensions inches (millimeters) (Continued)

Molded Dual-In-Line Package (N)

Order Number MM74HC266AN

NS Package Number N14A

LIFE SUPPORT POLICY

NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:

MM54HC266A/MM74HC266A Quad 2-Input Exclusive NOR Gate (Open Drain)

1. Life support devices or systems are devices or 2. A critical component is any component of a life
systems which, (a) are intended for surgical implant support device or system whose failure to perform can
into the body, or (b) support or sustain life, and whose be reasonably expected to cause the failure of the life
failure to perform, when properly used in accordance support device or system, or to affect its safety or
with instructions for use provided in the labeling, can effectiveness.
be reasonably expected to result in a significant injury
to the user.

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a

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