LM12454/LM12458/LM12H458
12-Bit + Sign Data Acquisition System with
Self-Calibration
February 2006
LM12454/LM12458/LM12H458
12-Bit + Sign Data Acquisition System with Self-Calibration
General Description
The LM12458, and LM12H458 are highly integrated Data
Acquisition Systems. Operating on just 5V, they combine a
fully-differential self-calibrating (correcting linearity and zero
errors) 13-bit (12-bit + sign) analog-to-digital converter
(ADC) and sample-and-hold (S/H) with extensive analog
functions and digital functionality. Up to 32 consecutive conversions, using two’s complement format, can be stored in
an internal 32-word (16-bit wide) FIFO data buffer. An internal 8-word RAM can store the conversion sequence for up to
eight acquisitions through the LM12(H)458’s eight-input multiplexer. The obsolete LM12454 has a four-channel multiplexer, a differential multiplexer output, and a differential S/H
input. The LM12(H)458 can also operate with 8-bit + sign
resolution and in a supervisory “watchdog” mode that compares an input signal against two programmable limits.
Programmable acquisition times and conversion rates are
possible through the use of internal clock-driven timers. The
reference voltage input can be externally generated for absolute or ratiometric operation or can be derived using the
internal 2.5V bandgap reference.
All registers, RAM, and FIFO are directly addressable
through the high speed microprocessor interface to either an
8-bit or 16-bit data bus. The LM12(H)458 includes a direct
memory access (DMA) interface for high-speed conversion
data transfer.
Additional applications information can be found in applications notes AN-906, AN-947 and AN-949.
Key Specifications
(f
= 5 MHz; 8 MHz, H)
CLK
j
Resolution12-bit + sign or 8-bit + sign
j
13-bit conversion time8.8 µs, 5.5 µs (H) (max)
j
9-bit conversion time4.2 µs, 2.6 µs (H) (max)
j
13-bit Through-put rate88k samples/s (min),
140k samples/s (H) (min)
j
Comparison time
(“watchdog” mode)
j
ILE
j
VINrangeGND to V
j
Power Consumption30 mW, 34 mW (H) (max)
j
Stand-by mode50 µW (typ)
j
Single supply3V to 5.5V
2.2 µs (max),
1.4 µs (H) (max)
±
1 LSB (max)
Features
n Three operating modes: 12-bit + sign, 8-bit + sign, and
“watchdog”
n Single-ended or differential inputs
n Built-in Sample-and-Hold and 2.5V bandgap reference
n Instruction RAM and event sequencer
n 8-channel multiplexer
n 32-word conversion FIFO
n Programmable acquisition times and conversion rates
n Self-calibration and diagnostic mode
n 8- or 16-bit wide data bus microprocessor or DSP
interface
+
A
Applications
n Data Logging
n Instrumentation
n Process Control
n Energy Management
n Inertial Guidance
TRI-STATE®is a registered trademark of National Semiconductor Corporation.
®
AT
is a registered trademark of International Business Machines Corporation.
* These products are obsolete and shown for reference only.
Connection Diagrams
Order Part NumberNS Package
LM12H458CIV
LM12H458CIVX
LM12H458CIVF
LM12454CIV *
LM12458CIV
LM12458CIVX
LM12458CIVF *
V44A (PLCC) (Tape and Reel)
V44A (PLCC) (Tape and Reel)
V44A (PLCC)
VGZ44A (PQFP)
V44A (PLCC)
V44A (PLCC)
VGZ44A (PQFP)
* Pin names in ( ) apply to the obsolete LM12454 and LM12H454.
Order Number LM12454CIV,
LM12458CIV or LM12H458CIV
See NS Package Number V44A
01126402
Order Number LM12458CIVF or LM12H458CIVF
01126434
NS Package Number VGZ44A
www.national.com2
Functional Diagrams
LM12454/LM12458/LM12H458
LM12454
The LM12(H)454 is obsolete
LM12(H)458
01126401
01126421
www.national.com3
Absolute Maximum Ratings
(Notes 1, 2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage (V
+ and VD+)6.0V
A
Voltage at Input and Output Pins,
except analog inputs−0.3V to (V
Voltage at Analog Inputs− 5V to (V
|V
+−VD+|300 mV
LM12454/LM12458/LM12H458
A
Input Current at Any Pin (Note 3)
Package Input Current (Note 3)
Power Dissipation, PQFP
= 25˚C)(Note 4)875 mW
(T
A
Storage Temperature−65˚C to +150˚C
Lead Temperature
PQFP, Infrared, 15 sec.+300˚C
PLCC, Solder, 10 sec.+250˚C
ESD Susceptibility (Note 5)1.5 kV
See AN-450 “Surface Mounting Methods and Their Effect on
Product Reliability” for other methods of soldering surface
mount devices.
Package Thermal Resistances
Packageθ
44-Lead PQFP47˚C / W
44-Lead PLCC50˚C / W
JA
+
+ 0.3V)
+
±
±
20 mA
+ 5V)
5mA
Operating Ratings (Notes 1, 2)
Temperature Range
(T
min
≤ TA≤ T
)−40˚C ≤ TA≤ 85˚C
max
Supply Voltage
+, VD+3.0V to 5.5V
V
A
|V
+−VD+|≤100 mV
A
V
Input RangeGND ≤ V
IN+
V
Input RangeGND ≤ V
IN−
V
Input Voltage1V ≤ V
REF+
V
Input Voltage0V ≤ V
REF−
V
REF+−VREF−
V
Common Mode
REF
Range (Note 16)0.1 V
+
A
REF−
≤ V
1V ≤ V
REFCM
≤ V
IN+
IN−
REF+
REF+
REF
≤ 0.6 V
≤ VA+
≤ VA+
≤ VA+
−1V
≤ VA+
TJ(MAX)150˚C
Reliability Information Transistor Count
Device TypeNmber
P-Chan MOS Transistor12,232
N-Chan MOS Transistor15,457
Parasitic Vertical Bipolar Junction Transistor4
Parasitic Lateral Bipolar Junction Transistor2
TOTAL Transistors27,695
+
A
Converter Characteristics (Notes 6, 7, 8, 9)
The following specifications apply to the LM12454, LM12458, and LM12H458 for VA+=VD+ = 5V, V
12-bit + sign conversion mode, f
V
REF+
and V
≤ 25Ω, fully-differential input with fixed 2.5V common-mode voltage, and minimum acquisition time unless
The following specifications apply to the LM12454, LM12458, and LM12H458 for VA+=VD+ = 5V, tr=tf= 3 ns, and CL= 100
pF on data I/O, INT and DMARQ lines unless otherwise specified. Boldface limits apply for T
limits TA=TJ= 25˚C.
Symbol (See Figures
8, 9, 10)
1, 3
2, 4
ParameterConditions
CS or Address Valid to ALE Low Set-Up
Time
CS or Address Valid to ALE Low Hold
Time
Typical
(Note 10)
5ALE Pulse Width45ns (min)
6RD High to Next ALE High
7ALE Low to RD Low
8RD Pulse Width
9RD High to Next RD or WR Low
10ALE Low to WR Low
11WR Pulse Width
12WR High to Next ALE High
13WR High to Next RD or WR Low
14Data Valid to WR High Set-Up Time
15Data Valid to WR High Hold Time
16RD Low to Data Bus Out of TRI-STATE
17RD High to TRI-STATE
18RD Low to Data Valid (Access Time)
RL=1kΩ30
40
30
20Address Valid or CS Low to RD Low
21Address Valid or CS Low to WR Low
19Address Invalid from RD or WR High
22INT High from RD Low
23DMARQ Low from RD Low
30
30
A=TJ=TMIN
to T
Limits
(Note 11)
40ns (min)
20ns (min)
35ns (min)
20ns (min)
100ns (min)
100ns (min)
20ns (min)
60ns (min)
75ns (min)
140ns (min)
40ns (min)
30ns (min)
10ns (min)
70ns (max)
10ns (min)
110ns (max)
10ns (min)
80ns (max)
20ns (min)
20ns (min)
10ns (min)
10ns (min)
60ns (max)
10ns (min)
60ns (max)
MAX
Units
; all other
Units
www.national.com8
Digital Timing Characteristics (Notes 6, 7, 8) (Continued)
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed
specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test
conditions.
Note 2: All voltages are measured with respect to GND, unless otherwise specified.
Note 3: When the input voltage (V
The 20 mA maximum package input current rating allows the voltage at any four pins, with an input current of 5 mA, to simultaneously exceed the power supply
) at any pin exceeds the power supply rails (V
IN
IN
<
GND or V
voltages.
Note 4: The maximum power dissipation must be derated at elevated temperatures and is dictated by T
to ambient thermal resistance), and T
(ambient temperature).
A
Note 5: Human body model, 100 pF discharged through a 1.5 kΩ resistor.
Note 6: Two on-chip diodes are tied to each analog input through a series resistor, as shown below. Input voltage magnitude up to 5V above V
will not damage the LM12454 or the LM12(H)458. However, errors in the A/D conversion can occur if these diodes are forward biased by more than 100 mV. As an
example, if V
+ is 4.5 VDC, full-scale input voltage must be ≤4.6 VDCto ensure accurate conversions.
A
Note 7: VA+ and VD+ must be connected together to the same power supply voltage and bypassed with separate capacitors at each V+pin to assure
conversion/comparison accuracy.
Note 8: Accuracy is guaranteed when operating at f
Note 9: With the test condition for V
Note 10: Typical figures are at T
REF(VREF+−VREF−
= 25˚C and represent most likely parametric norm.
A
= 5 MHz for the LM12454/8 and f
CLK
) given as +5V, the 12-bit LSB is 1.22 mV and the 8-bit/“Watchdog” LSB is 19.53 mV.
Note 11: Limits are guaranteed to National’s AOQL (Average Output Quality Level).
Note 12: Positive integral linearity error is defined as the deviation of the analog value, expressed in LSBs, from the straight line that passes through positive
full-scale and zero. For negative integral linearity error the straight line passes through negative full-scale and zero. (See Figure 6 Figure 7).
Note 13: Zero error is a measure of the deviation from the mid-scale voltage (a code of zero), expressed in LSB. It is the worst-case value of the code transitions
between −1 to 0 and 0 to +1 (see Figure 8).
Note 14: The DC common-mode error is measured with both inputs shorted together and driven from 0V to 5V. The measured value is referred to the resulting
output value when the inputs are driven with a 2.5V signal.
Note 15: Power Supply Sensitivity is measured after Auto-Zero and/or Auto-Calibration cycle has been completed with V
Note 16: V
(Reference Voltage Common Mode Range) is defined as (V
REFCM
REF++VREF−
Note 17: The LM12(H)454/8’s self-calibration technique ensures linearity and offset errors as specified, but noise inherent in the self-calibration process will result
in a repeatability uncertainty of
±
0.10 LSB.
Note 18: The Throughput Rate is for a single instruction repeated continuously. Sequencer states 0 (1 clock cycle), 1 (1 clock cycle), 7 (9 clock cycles) and 5 (44
clock cycles) are used (see Figure 15). One additional clock cycle is used to read the conversion result stored in the FIFO, for a total of 56 clock cycles per
conversion. The Throughput Rate is f
(MHz)/N, where N is the number of clock cycles/conversion.
CLK
>
(VA+orVD+)), the current at that pin should be limited to 5 mA.