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DS90CF383
+3.3V LVDS Transmitter 24-Bit Flat Panel Display (FPD)
Link—65 MHz
DS90CF383 +3.3V LVDS Transmitter 24-Bit Flat Panel Display (FPD) Link—65 MHz
January 2000
General Description
The DS90CF383 transmitter converts 28 bits of CMOS/TTL
data into four LVDS (Low Voltage Differential Signaling) data
streams. A phase-locked transmit clock is transmitted in parallel with the data streams over a fifthLVDS link. Every cycle
of the transmit clock 28 bits of input data are sampled and
transmitted. At a transmit clock frequency of 65 MHz, 24 bits
of RGB data and 3 bits of LCD timing and control data
(FPLINE, FPFRAME, DRDY) are transmitted at arate of 455
Mbps per LVDS data channel. Using a 65 MHz clock, the
data throughputs is 227 Mbytes/sec.
This chipset is an ideal means to solve EMI and cable size
problems associated with wide, high speed TTL interfaces.
Block Diagram
DS90CF383
Features
n 20 to 65 MHz shift clock support
n Single 3.3V supply
n Chipset (Tx + Rx) power consumption
n Power-down mode (
n Single pixel per clock XGA (1024x768) ready
n Supports VGA, SVGA, XGA and higher addressability.
n Up to 227 Megabytes/sec bandwidth
n Up to 1.8 Gbps throughput
n Narrow bus reduces cable size and cost
n 290 mV swing LVDS devices for low EMI
n PLL requires no external components
n Low profile 56-lead TSSOP package
n Falling edge data strobe Transmitter
n Compatible with TIA/EIA-644 LVDS standard
n ESD rating
n Operating Temperature: −40˚C to +85˚C
>
7kV
<
0.5 mW total)
<
250 mW (typ)
DS100033-1
Order Number DS90CF383MTD
See NS Package Number MTD56
TRI-STATE®is a registered trademark of National Semiconductor Corporation.
© 2000 National Semiconductor Corporation DS100033 www.national.com
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National SemiconductorSales Office/
Distributors for availability and specifications.
DS90CF383
Supply Voltage (V
CMOS/TTL Input Voltage −0.3V to (V
LVDS Driver Output Voltage −0.3V to (V
LVDS Output Short Circuit
Duration Continuous
Junction Temperature +150˚C
Storage Temperature −65˚C to +150˚C
Lead Temperature
(Soldering, 4 sec) +260˚C
Maximum Package Power Dissipation Capacity
MTD56 (TSSOP) Package:
DS90CF383 1.63 W
) −0.3V to +4V
CC
CC
CC
@
+ 0.3V)
+ 0.3V)
25˚C
Package Derating:
DS90CF383 12.5 mW/˚C above +25˚C
ESD Rating
(HBM, 1.5 kΩ, 100 pF)
Recommended Operating
Conditions
Supply Voltage (V
) 3.0 3.3 3.6 V
CC
Operating Free Air
Temperature (T
) −40 +25 +85 ˚C
A
Receiver Input Range 0 2.4 V
Supply Noise Voltage (V
Min Nom Max Units
) 100 mV
CC
Electrical Characteristics
Over recommended operating supply and temperature ranges unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Units
CMOS/TTL DC SPECIFICATIONS
V
IH
V
IL
V
OH
V
OL
V
CL
I
IN
I
OS
LVDS DC SPECIFICATIONS
V
OD
∆V
V
OS
∆V
I
OS
I
OZ
V
TH
V
TL
I
IN
TRANSMITTER SUPPLY CURRENT
ICCTW Transmitter Supply Current
ICCTG Transmitter Supply Current
ICCTZ Transmitter Supply Current
Note 1: “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the device
should be operated at these limits. The tables of “Electrical Characteristics” specify conditions for device operation.
High Level Input Voltage 2.0 V
Low Level Input Voltage GND 0.8 V
High Level Output Voltage IOH= −0.4 mA 2.7 3.3 V
Low Level Output Voltage IOL= 2 mA 0.1 0.3 V
Input Clamp Voltage ICL= −18 mA −0.79 −1.5 V
Input Current VIN=VCC, GND, 2.5V or 0.4V
Output Short Circuit Current V
= 0V −60 −120 mA
OUT
±
5.1±10 µA
Differential Output Voltage RL= 100Ω 250 345 450 mV
Change in VODbetween
OD
complimentary output states
Offset Voltage (Note 4) 1.125 1.25 1.375 V
Change in VOSbetween
OS
complimentary output states
Output Short Circuit Current V
Output TRI-STATE®Current Power Down = 0V,
= 0V, RL= 100Ω −3.5 −5 mA
OUT
V
OUT
=0VorV
CC
±
1
Differential Input High Threshold VCM= +1.2V +100 mV
Differential Input Low Threshold −100 mV
Input Current VIN= +2.4V, VCC= 3.6V
V
= 0V, VCC= 3.6V
IN
R
Worst Case
16 Grayscale
Power Down
= 100Ω,
L
= 5 pF,
C
L
Worst Case Pattern
(Figures 1, 3)
R
= 100Ω,
L
= 5 pF,
C
L
16 Grayscale Pattern
(Figures 2, 3)
Power Down = Low
Driver Outputs in TRI-STATE®under
f = 32.5 MHz 31 45 mA
f = 37.5 MHz 32 50 mA
f = 65 MHz 42 55 mA
f = 32.5 MHz 23 35 mA
f = 37.5 MHz 28 40 mA
f = 65 MHz 31 45 mA
10 55 µA
Power Down Mode
CC
35 mV
35 mV
±
10 µA
±
10 µA
±
10 µA
>
7kV
PP
V
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Electrical Characteristics (Continued)
Note 2: Typical values are given for VCC= 3.3V and TA= +25C.
Note 3: Current into device pins is defined as positive. Current out of device pins is defined as negative. Voltages are referenced to ground unless otherwisespeci-
fied (except V
Note 4: V
and ∆VOD).
OD
previously referred as VCM.
OS
Transmitter Switching Characteristics
Over recommended operating supply and temperature ranges unless otherwise specified
Symbol Parameter Min Typ Max Units
(Figure 4 )
(Figure 3 )
(Figure 3 )
(Figure 5 )
(Figure 12 )
f = 65 MHz −0.4 0 0.3 ps
LLHT LVDS Low-to-High Transition Time
LHLT LVDS High-to-Low Transition Time
TCIT TxCLK IN Transition Time
TCCS TxOUT Channel-to-Channel Skew
TPPos0 Transmitter Output Pulse Position for Bit 0
TPPos1 Transmitter Output Pulse Position for Bit 1 1.8 2.2 2.5 ns
TPPos2 Transmitter Output Pulse Position for Bit 2 4.0 4.4 4.7 ns
TPPos3 Transmitter Output Pulse Position for Bit 3 6.2 6.6 6.9 ns
TPPos4 Transmitter Output Pulse Position for Bit 4 8.4 8.8 9.1 ns
TPPos5 Transmitter Output Pulse Position for Bit 5 10.6 11.0 11.3 ns
TPPos6 Transmitter Output Pulse Position for Bit 6 12.8 13.2 13.5 ns
TCIP TxCLK IN Period
TCIH TxCLK IN High Time
TCIL TxCLK IN Low Time
TSTC TxIN Setup to TxCLK IN
THTC TxIN Hold to TxCLK IN
TCCD TxCLK IN to TxCLK OUT Delay 25˚C, V
TPLLS Transmitter Phase Lock Loop Set
TPDD Transmitter Power Down Delay
(Figure 6)
(Figure 6)
(Figure 6)
(Figure 6)
(Figure 6)
(Figure 11)
CC
(Figure 8 )
= 3.3V
0.35T 0.5T 0.65T ns
0.35T 0.5T 0.65T ns
f = 65 MHz 2.5 ns
(Figure 7 )
0.75 1.5 ns
0.75 1.5 ns
5ns
250 ps
15 T 50 ns
0ns
3 5.5 ns
10 ms
100 ns
DS90CF383
AC Timing Diagrams
DS100033-4
FIGURE 1. “Worst Case” Test Pattern
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