CD4025BM/CD4025BC Buffered Triple 3-Input NOR Gate
General Description
These triple gates are monolithic complementary MOS
(CMOS) integrated circuits constructed with N- and P-channel enhancement mode transistors. They have equal source
and sink current capabilities and conform to standard B series output drive. The devices also have buffered outputs
which improve transfer characteristics by providing very
high gain. All inputs are protected against static discharge
with diodes to V
DD
and VSS.
Connection Diagrams
CD4023BM/CD4023BC
Dual-In-Line Package
Top View
TL/F/5956– 1
Features
Y
Wide supply voltage range3.0V to 15V
Y
High noise immunity0.45 VDD(typ.)
Y
Low power TTLfan out of 2 driving 74L
compatibilityor 1 driving 74LS
Y
5V–10V–15V parametric ratings
Y
Symmetrical output characteristics
Y
Maximum input leakage 1 mA at 15V over full
temperature range
CD4025BM/CD4025BC
Dual-In-Line Package
Top View
TL/F/5956– 2
Order Number CD4023B or CD4025B
C
1995 National Semiconductor CorporationRRD-B30M105/Printed in U. S. A.
TL/F/5956
Page 2
Absolute Maximum Ratings (Notes1&2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
DC Supply Voltage (V
DD
)
Input Voltage (VIN)
Storage Temp. Range (TS)
b
0.5 VDCtoa18 V
b
0.5 VDCto V
a
0.5 V
DD
b
65§Ctoa150§C
DC
DC
Recommended Operating
Conditions
DC Supply Voltage (VDD)5V
Input Voltage (VIN)0V
Operating Temperature Range (TA)
CD4023BM, CD4025BM
CD4023BC, CD4025BC
Power Dissipation (PD)
Dual-In-Line700 mW
Small Outline500 mW
Lead Temperature (T
(Soldering, 10 seconds)260
)
L
C
§
DC Electrical Characteristics CD4023BM, CD4025BM (Note 2)
SymbolParameterConditions
I
Quiescent Device Current V
DD
V
Low Level Output Voltage V
OL
V
High Level Output Voltage V
OH
V
Low Level Input VoltageV
IL
V
High Level Input Voltage V
IH
I
Low Level Output Current V
OL
(Note 3)V
I
High Level Output Current V
OH
(Note 3)V
I
Input CurrentV
IN
e
5V0.250.0040.257.5mA
DD
e
10V0.50.0050.515mA
V
DD
e
15V1.00.0061.030mA
V
DD
e
5V0.0500.050.05V
DD
e
10V0.0500.050.05V
V
DD
e
V
15V0.0500.050.05V
DD
e
5V4.954.9554.95V
DD
e
10V9.959.95109.95V
V
DD
e
15V14.9514.951514.95V
V
DD
e
e
5V, V
DD
e
V
DD
e
V
DD
e
DD
e
V
DD
e
V
DD
e
DD
e
DD
e
V
DD
e
DD
e
DD
e
V
DD
e
DD
e
V
DD
4.5V1.521.51.5V
O
e
10V, V
15V, V
5V, V
10V, V
15V, V
5V, V
9.0VlI
O
e
13.5V (4.064.04.0V
O
e
0.5V3.53.533.5V
O
e
1.0VlI
O
e
1.5V (11.011.0911.0V
O
e
0.4V0.640.510.880.36mA
O
e
10V, V
15V, V
5V, V
10V, V
15V, V
15V, V
15V, V
0.5V1.61.32.20.90mA
O
e
1.5V4.23.482.4mA
O
e
4.6V
O
e
9.5V
O
e
13.5V
O
e
0V
IN
e
15V0.1010
IN
k
l
O
k
l
O
b
MinTypMinTypMaxMin Max
1mA3.043.03.0V
1mA 7.07.067.0V
b
0.64
b
1.6
b
4.2
55§C
b
0.10
b
0.51b0.88
b
1.3b2.2
b
3.4b8
to 15 V
DC
DC
b
55§Ctoa125§C
b
40§Ctoa85§C
a
25§C
b
5
b
b
10
b
5
a
125§C
b
0.36mA
b
0.90mA
b
2.4mA
0.10
0.101.0mA
to VDDV
b
1.0 mA
DC
DC
Units
Schematic Diagram
CD4023BC/CD4023BM
2
(/3 Device Shown
*All Inputs Protected
by Standard CMOS Input
Protection Circuit.
TL/F/5956– 3
Page 3
DC Electrical Characteristics CD4023BC, CD4025BC (Note 2)
b
SymbolParameterConditions
40§C
MinTypMinTypMaxMinMax
I
Quiescent Device Current V
DD
V
Low Level Output Voltage V
OL
V
High Level Output Voltage V
OH
V
Low Level Input VoltageV
IL
V
High Level Input VoltageV
IH
I
Low Level Output Current V
OL
(Note 3)V
I
High Level Output Current V
OH
(Note 3)V
I
Input CurrentV
IN
Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed; they are not meant to imply that the devices
should be operated at these limits. The table of ‘‘Recommended Operating Conditions’’ and ‘‘Electrical Characteristics’’ provides conditions for actual device
operation.
Note 2: V
Note 3: I
e
0V unless otherwise specified.
SS
and IOLare tested one output at a time.
OH
e
5V1.00.0041.07.5mA
DD
e
V
10V2.00.0052.015m A
DD
e
V
15V4.00.0064.030m A
DD
e
5V0.0500.050.05V
DD
e
V
10V0.0500.050.05V
DD
e
V
15V0.0500.050.05V
DD
e
5V4.954.9554.95V
DD
e
V
10V9.959.95109.95V
DD
e
V
15V14.9514.951514.95V
DD
e
e
5V, V
DD
e
V
DD
e
V
DD
e
DD
e
V
DD
e
V
DD
e
DD
e
DD
e
V
DD
e
DD
e
DD
e
V
DD
e
DD
e
V
DD
4.5V1.521.51.5V
O
e
10V, V
15V, V
5V, V
10V, V
15V, V
5V, V
9.0VlI
O
e
13.5V (4.064.04.0V
O
e
0.5V3.53.533.5V
O
e
1.0VlI
O
e
1.5V (11.011.0911.0V
O
e
0.4V0.520.440.880.36mA
O
e
10V, V
15V, V
5V, V
10V, V
15V, V
15V, V
15V, V
0.5V1.31.12.20.90mA
O
e
1.5V3.63.082.4mA
O
e
4.6V
O
e
9.5V
O
e
13.5V
O
e
0V
IN
e
15V0.310
IN
k
1mA3.043.03.0V
l
O
k
1mA7.07.067.0V
l
O
b
0.52
b
1.3
b
3.6
b
0.3
a
b
0.44b0.88
b
1.1b2.2
b
3.0b8
b
25§C
b
5
b
10
0.3
b
5
0.31.0mA
a
85§C
b
0.36mA
b
0.90mA
b
2.4mA
b
1.0 mA
Units
Schematic Diagram
CD4025BM/CD4025BC
3
(/3 Device Shown
*All Inputs Protected
by Standard CMOS Input
Protection Circuit.
TL/F/5956– 4
Page 4
AC Electrical Characteristics* T
e
A
25§C, C
L
e
50 pF, R
e
200k, unless otherwise specified
L
CD4023BCCD4025BC
SymbolParameterConditionsCD4023BMCD4025BMUnits
MinTypMaxMinTypMax
t
PHL
t
PLH
t
THL
t
TLH
C
IN
C
PD
*AC Parameters are guaranteed by DC correlated testing.
Note 4: C
Note AN-90.
Propagation Delay, High-to-Low LevelV
Propagation Delay, Low-to-High LevelV
,Transition TimeV
Average Input CapacitanceAny Input57.557.5pF
Power Dissipation Capacity (Note 4)Any Gate1717pF
determines the no load AC power consumption of any CMOS device. For complete explanation, see 54C/74C Family Characteristics Application
PD
e
5V130250130250ns
DD
e
V
10V6010060100ns
DD
e
V
15V40704070ns
DD
e
5V110250120250ns
DD
e
V
10V5010060100ns
DD
e
V
15V35704070ns
DD
e
5V9020090200ns
DD
e
V
10V5010050100ns
DD
e
V
15V40804080ns
DD
4
Page 5
Physical Dimensions inches (millimeters)
Order Number CD4023BMJ, CD4023BCJ, CD4025BMJ or CD4025BCJ
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DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or2. A critical component is any component of a life
systems which, (a) are intended for surgical implantsupport device or system whose failure to perform can
into the body, or (b) support or sustain life, and whosebe reasonably expected to cause the failure of the life
failure to perform, when properly used in accordancesupport device or system, or to affect its safety or
with instructions for use provided in the labeling, caneffectiveness.
be reasonably expected to result in a significant injury
to the user.
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