National Semiconductor CD4002M, CD4012M, CD4002C, CD4012C Service Manual

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National Semiconductor CD4002M, CD4012M, CD4002C, CD4012C Service Manual

March 1988

CD4002M/CD4002C Dual 4-Input NOR Gate

CD4012M/CD4012C Dual 4-Input NAND Gate

General Description

These NOR and NAND gates are monolithic complementary MOS (CMOS) integrated circuits. The N- and P-channel enhancement mode transistors provide a symmetrical circuit with output swings essentially equal to the supply voltage. This results in high noise immunity over a wide supply voltage range. No DC power other than that caused by leakage current is consumed during static conditions. All inputs are protected against static discharge and latching conditions.

Features

Y Wide supply voltage range

3.0V to 15V

Y Low power

10 nW (typ.)

Y High noise immunity

0.45 VDD (typ.)

Applications

Y Automotive

Y Alarm system

Y Data terminals

Y Industrial controls

Y Instrumentation

Y

Remote metering

Y Medical Electronics

Y

Computers

Connection Diagrams

CD4002

CD4012

Dual-In-Line Package

Dual-In-Line Package

TL/F/5940 ± 1

TL/F/5940 ± 2

Top View

Top View

Order Number CD4002 or CD4012

Gate NOR Input-4 Dual CD4002M/CD4002C

Gate NAND Input-4 Dual CD4012M/CD4012C

C1995 National Semiconductor Corporation

TL/F/5940

RRD-B30M105/Printed in U. S. A.

Absolute Maximum Ratings (Note 1)

If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications.

Voltage at Any Pin

VSS b0.3V to VDD a0.3V

Operating Temperature Range

b55§C to a125§C

CD4002M, CD4012M

CD4002C, CD4012C

b40§C to a85§C

Storage Temperature Range (TS)

b65§C to a150§C

Power Dissipation (PD)

 

Dual-In-Line

700 mW

Small Outline

500 mW

Operating Range (VDD)

VSS a3.0V to VSS a15V

Lead Temperature (TL)

260§C

(Soldering, 10 seconds)

DC Electrical Characteristics CD4002M, CD4012M

 

 

 

 

 

 

 

Limits

 

 

 

 

Symbol

Parameter

Conditions

b55§C

 

a25§C

 

a125§C

Units

 

 

 

Min

Max

Min

 

Typ

Max

Min

Max

 

IDD

Quiescent

VDD e 5.0V

 

0.05

 

 

0.001

0.05

 

3.0

mA

 

Device Current

VDD e 10V

 

0.1

 

 

0.001

0.1

 

6

mA

PD

Quiescent Device

VDD e 5.0V

 

0.25

 

 

0.005

0.25

 

15

mW

 

Dissipation/Package

VDD e 10V

 

1.0

 

 

0.01

1.0

 

60

mW

VOL

Output Voltage

VDD e 5.0V, VI e VDD, IO e 0A

 

0.05

 

 

0

0.05

 

0.05

V

 

Low Level

VDD e 10V, VI e VDD, IO e 0A

 

0.05

 

 

0

0.05

 

0.05

V

VOH

Output Voltage

VDD e 5.0V, VI e VSS, IO e 0A

4.95

 

4.95

 

5.0

 

4.95

 

V

 

High Level

VDD e 10V, VI e VSS, IO e 0A

9.95

 

9.95

 

10

 

9.95

 

V

VNL

Noise Immunity

VDD e 5.0V, VO e 3.6V, IO e 0A

1.5

 

1.5

 

2.25

 

1.4

 

V

 

(All Inputs)

VDD e 10V, VO e 7.2V, IO e 0A

3.0

 

3.0

 

4.5

 

2.9

 

V

VNH

Noise Immunity

VDD e 5.0V, VO e 0.95V, IO e 0A

1.4

 

1.5

 

2.25

 

1.5

 

V

 

(All Inputs)

VDD e 10V, VO e 2.9V, IO e 0A

2.9

 

3.0

 

4.5

 

3.0

 

V

IDN

Output Drive Current

VDD e 5.0V, VO e 0.4V, VI e VDD

0.5

 

0.40

 

1.0

 

0.28

 

mA

 

N-Channel (4002)

VDD e 10V, VO e 0.5V, VI e VDD

1.1

 

0.9

 

2.5

 

0.65

 

mA

 

(Note 2)

 

 

 

 

 

 

 

 

 

 

IDP

Output Drive Current

VDD e 5.0V, VO e 2.5V, VI e VSS

b0.62

 

b0.5

 

b2.0

 

b0.35

 

mA

 

P-Channel (4002)

VDD e 10V, VO e 9.5V, VI e VSS

b0.62

 

b0.5

 

b1.0

 

b0.35

 

mA

 

(Note 2)

 

 

 

 

 

 

 

 

 

 

IDN

Output Drive Current

VDD e 5.0V, VO e 0.4V, VI e VDD

0.31

 

0.25

 

0.5

 

0.175

 

mA

 

N-Channel (4012)

VDD e 10V, VO e 0.5V, VI e VDD

0.63

 

0.5

 

0.6

 

0.35

 

mA

 

(Note 2)

 

 

 

 

 

 

 

 

 

 

IDP

Output Drive Current

VDD e 5.0V, VO e 2.5V, VI e VSS

b0.31

 

b0.25

 

b0.5

 

b0.175

 

mA

 

P-Channel (4012)

VDD e 10V, VO e 9.5V, VI e VSS

b0.75

 

b0.6

 

b1.2

 

b0.4

 

mA

 

(Note 2)

 

 

 

 

 

 

 

 

 

 

II

Input Current

 

 

 

 

 

10

 

 

 

pA

Note 1: ``Absolute Maximum Ratings'' are those values beyond which the safety of the device cannot be guaranteed. Except for ``Operating Temperature Range'' they are not meant to imply that the devices should be operated at these limits. The table of ``Electrical Characteristics'' provides conditions for actual device operation.

Note 2: IDN and IDP are tested one output at a time.

2

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