Motorola MTP4N40E Datasheet

1
Motorola TMOS Power MOSFET Transistor Device Data
  
 
   
N–Channel Enhancement–Mode Silicon Gate
Robust High Voltage Termination
Avalanche Energy Specified
Source–to–Drain Diode Recovery Time Comparable to a Discrete
Fast Recovery Diode
Diode is Characterized for Use in Bridge Circuits
I
DSS
and V
DS(on)
Specified at Elevated Temperature
MAXIMUM RATINGS
(TC = 25°C unless otherwise noted)
Rating
Symbol Value Unit
Drain–to–Source Voltage V
DSS
400 Vdc
Drain–to–Gate Voltage (RGS = 1.0 M) V
DGR
400 Vdc
Gate–to–Source Voltage — Continuous
— Non–Repetitive (tp 10 ms)
V
GS
V
GSM
±20 ±40
Vdc Vpk
Drain Current — Continuous
— Continuous @ 100°C — Single Pulse (tp 10 µs)
I
D
I
D
I
DM
4.0
3.0 14
Adc
Apk
Total Power Dissipation
Derate above 25°C
P
D
74
0.59
Watts
W/°C
Operating and Storage Temperature Range TJ, T
stg
–55 to 150 °C
Single Pulse Drain–to–Source Avalanche Energy — Starting TJ = 25°C
(VDD = 25 Vdc, VGS = 10 Vdc, Peak IL = 4.0 Apk, L = 25 mH, RG = 25 )
E
AS
200
mJ
Thermal Resistance — Junction to Case
— Junction to Ambient
R
θJC
R
θJA
1.7
62.5
°C/W
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 seconds T
L
260 °C
Designer’s Data for “Worst Case” Conditions — The Designer’s Data Sheet permits the design of most circuits entirely from the information presented. SOA Limit curves — representing boundaries on device characteristics — are given to facilitate “worst case” design.
E–FET and Designer’s are trademarks of Motorola, Inc. TMOS is a registered trademark of Motorola, Inc.
Preferred devices are Motorola recommended choices for future use and best overall value.
REV 2
Order this document
by MTP4N40E/D

SEMICONDUCTOR TECHNICAL DATA

TMOS POWER FET
4.0 AMPERES 400 VOLTS
R
DS(on)
= 1.8 OHM
Motorola Preferred Device
D
S
G
CASE 221A–06, Style 5
TO–220AB
Motorola, Inc. 1996
MTP4N40E
2
Motorola TMOS Power MOSFET Transistor Device Data
ELECTRICAL CHARACTERISTICS
(T
J
= 25°C unless otherwise noted)
Characteristic
Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage
(VGS = 0 Vdc, ID = 0.25 mAdc) Temperature Coefficient (Positive)
V
(BR)DSS
400
420
— —
Vdc
mV/°C
Zero Gate Voltage Drain Current
(VDS = 400 Vdc, VGS = 0 Vdc) (VDS = 400 Vdc, VGS = 0 Vdc, TJ = 125°C)
I
DSS
— —
— —
10
100
µAdc
Gate–Body Leakage Current (VGS = ±20 Vdc, VDS = 0 Vdc) I
GSS
100 nAdc
ON CHARACTERISTICS
(1)
Gate Threshold Voltage
(VDS = VGS, ID = 250 µAdc) Threshold Temperature Coefficient (Negative)
V
GS(th)
2.0 —
3.0
6.0
4.0 —
Vdc
mV/°C
Static Drain–to–Source On–Resistance (VGS = 10 Vdc, ID = 2.0 Adc) R
DS(on)
1.3 1.8 Ohms
Drain–to–Source On–Voltage
(VGS = 10 Vdc, ID = 4.0 Adc) (VGS = 10 Vdc, ID = 2.0 Adc, TJ = 125°C)
V
DS(on)
— —
— —
8.6
4.3
Vdc
Forward Transconductance (VDS = 15 Vdc, ID = 2.0 Adc) g
FS
1.8 2.5 mhos
DYNAMIC CHARACTERISTICS
Input Capacitance
C
iss
440 616 pF
Output Capacitance
(VDS = 25 Vdc, VGS = 0 Vdc,
f = 1.0 MHz)
C
oss
72 100
Reverse Transfer Capacitance
f = 1.0 MHz)
C
rss
14 19.6
SWITCHING CHARACTERISTICS
(2)
Turn–On Delay Time
t
d(on)
9.0 20 ns
Rise Time
t
r
11 30
Turn–Off Delay Time
VGS = 10 Vdc,
RG = 9.1 )
t
d(off)
18 30
Fall Time
G
= 9.1 )
t
f
14 30
Q
T
13 21 nC
DS
= 320 Vdc, ID = 4.0 Adc,
Q
1
2.5
(VDS = 320 Vdc, ID = 4.0 Adc,
VGS = 10 Vdc)
Q
2
6.0
Q
3
7.0
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage
(IS = 4.0 Adc, VGS = 0 Vdc)
(IS = 4.0 Adc, VGS = 0 Vdc, TJ = 125°C)
V
SD
— —
0.9
0.78
1.6 —
Vdc
t
rr
200
S
= 4.0 Adc, VGS = 0 Vdc,
t
a
99
(IS = 4.0 Adc, VGS = 0 Vdc,
dIS/dt = 100 A/µs)
t
b
101
Reverse Recovery Stored Charge Q
RR
1.03 µC
INTERNAL PACKAGE INDUCTANCE
Internal Drain Inductance
(Measured from contact screw on tab to center of die) (Measured from the drain lead 0.25″ from package to center of die)
L
D
— —
3.5
4.5
— —
nH
Internal Source Inductance
(Measured from the source lead 0.25″ from package to source bond pad)
L
S
7.5
nH
(1) Pulse Test: Pulse Width 300 µs, Duty Cycle 2%. (2) Switching characteristics are independent of operating junction temperature.
Gate Charge
Reverse Recovery Time
(VDD = 200 Vdc, ID = 4.0 Adc,
(V
(I
ns
MTP4N40E
3
Motorola TMOS Power MOSFET Transistor Device Data
TYPICAL ELECTRICAL CHARACTERISTICS
R
DS(on)
, DRAIN–TO–SOURCE RESISTANCE
(NORMALIZED)
R
DS(on)
, DRAIN–TO–SOURCE RESISTANCE (OHMS)
R
DS(on)
, DRAIN–TO–SOURCE RESISTANCE (OHMS)
0 4 8 12 16 20
0
3
5
6
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 1. On–Region Characteristics
I
D
, DRAIN CURRENT (AMPS)
I
D
, DRAIN CURRENT (AMPS)
VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
Figure 2. Transfer Characteristics
0 1 2 4
0
0.5
1.5
2.5
3.5
0 1 4 6
0.5
1
1.5
2
ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance versus Drain Current
and Temperature
ID, DRAIN CURRENT (AMPS)
Figure 4. On–Resistance versus Drain Current
and Gate Voltage
–50
0
0.5
1.25
2.0
100 200 300 400
1
10
100
1000
TJ, JUNCTION TEMPERATURE (
°
C)
Figure 5. On–Resistance Variation with
Temperature
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 6. Drain–To–Source Leakage
Current versus Voltage
I
DSS
, LEAKAGE (nA)
–25 0 25 50 75 100 125 150
TJ = 25°C
VDS ≥ 10 V
TJ = –55°C
25°C
100°C
TJ = 100°C
25°C
–55°C
TJ = 25°C
VGS = 10 V
2
4
2 6 10 14 18
1
9 V
5 V
6 V
7 V
8 V
VGS = 10 V
0
3
5
6
2
4
1
2 3 4 5 6 7 8 9
3
2
1
3 5 6
2.25
1.75
1.25
0.75
2 3 5
0.75
2.5
150 250 350
VGS = 10 V
15 V
VGS = 10 V ID = 2 A
0.25
1.5
2.25
1.0
1.75
500
VGS = 0 V
TJ = 125°C
100°C
7
8
7
8
2.5 3.5 4.5 5.5 6.5 7.5 8.5
4
7 8
70.5 1.5 4.5 6.52.5 3.5 5.5 7.5
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