Motorola MTP3N100E Datasheet

1
Motorola TMOS Power MOSFET Transistor Device Data
  
 
   
N–Channel Enhancement–Mode Silicon Gate
Robust High Voltage Termination
Avalanche Energy Specified
Source–to–Drain Diode Recovery Time Comparable to a
Discrete Fast Recovery Diode
Diode is Characterized for Use in Bridge Circuits
I
DSS
and V
DS(on)
Specified at Elevated Temperature
MAXIMUM RATINGS
(TC = 25°C unless otherwise noted)
Rating
Symbol Value Unit
Drain–Source Voltage V
DSS
1000 Vdc
Drain–Gate Voltage (RGS = 1.0 M) V
DGR
1000 Vdc
Gate–Source Voltage — Continuous
Gate–Source Voltage — Non–Repetitive (tp 10 ms)
V
GS
V
GSM
± 20 ± 40
Vdc Vpk
Drain Current — Continuous
Drain Current — Continuous @ 100°C Drain Current — Single Pulse (tp 10 µs)
I
D
I
D
I
DM
3.0
2.4
9.0
Adc
Apk
Total Power Dissipation
Derate above 25°C
P
D
125
1.0
Watts
W/°C
Operating and Storage Temperature Range TJ, T
stg
–55 to 150 °C
Single Pulse Drain–to–Source Avalanche Energy — Starting TJ = 25°C
(VDD = 150 Vdc, VGS = 10 Vdc, IL = 7.0 Apk, L = 10 mH, RG = 25 )
E
AS
245 mJ
Thermal Resistance — Junction to Case
Thermal Resistance — Junction to Ambient
R
θJC
R
θJA
1.00
62.5
°C/W
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 seconds T
L
260 °C
Designer’s Data for “Worst Case” Conditions — The Designer’s Data Sheet permits the design of most circuits entirely from the information presented. SOA Limit curves — representing boundaries on device characteristics — are given to facilitate “worst case” design.
E–FET and Designer’s are trademarks of Motorola, Inc. TMOS is a registered trademark of Motorola, Inc.
Preferred devices are Motorola recommended choices for future use and best overall value.
REV 3
Order this document
by MTP3N100E/D

SEMICONDUCTOR TECHNICAL DATA
Motorola, Inc. 1995

TMOS POWER FET
3.0 AMPERES 1000 VOLTS
R
DS(on)
= 4.0 OHM
Motorola Preferred Device
D
S
G
CASE 221A–06, Style 5
TO–220AB
MTP3N100E
2
Motorola TMOS Power MOSFET Transistor Device Data
ELECTRICAL CHARACTERISTICS
(TJ = 25°C unless otherwise noted)
Characteristic
Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage
(VGS = 0 Vdc, ID = 250 µAdc) Temperature Coefficient (Positive)
V
(BR)DSS
1000
1.23
— —
Vdc
mV/°C
Zero Gate Voltage Drain Current
(VDS = 1000 Vdc, VGS = 0 Vdc) (VDS = 1000 Vdc, VGS = 0 Vdc, TJ = 125°C)
I
DSS
— —
— —
10
100
µAdc
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) I
GSS
100 nAdc
ON CHARACTERISTICS (1)
Gate Threshold Voltage
(VDS = VGS, ID = 250 µAdc) Temperature Coefficient (Negative)
V
GS(th)
2.0 —
3.0
6.0
4.0 —
Vdc
mV/°C
Static Drain–Source On–Resistance (VGS = 10 Vdc, ID = 1.5 Adc) R
DS(on)
2.96 4.0 Ohm
Drain–Source On–Voltage (VGS = 10 Vdc)
(ID = 3.0 Adc) (ID = 1.5 Adc, TJ = 125°C)
V
DS(on)
— —
4.97 —
12 10
Vdc
Forward Transconductance (VDS = 15 Vdc, ID = 1.5 Adc) g
FS
2.0 3.56 mhos
DYNAMIC CHARACTERISTICS
Input Capacitance
C
iss
1316 1800 pF
Output Capacitance
(VDS = 25 Vdc, VGS = 0 Vdc,
f = 1.0 MHz)
C
oss
117 260
Reverse Transfer Capacitance
f = 1.0 MHz)
C
rss
26 75
SWITCHING CHARACTERISTICS (2)
Turn–On Delay Time
t
d(on)
13 25 ns
Rise Time
t
r
19 40
Turn–Off Delay Time
VGS = 10 Vdc,
RG = 9.1 )
t
d(off)
42 90
Fall Time
G
= 9.1 )
t
f
33 55
Q
T
32.5 45 nC
(See Figure 8)
DS
= 400 Vdc, ID = 3.0 Adc,
Q
1
6.0
(VDS = 400 Vdc, ID = 3.0 Adc,
VGS = 10 Vdc)
Q
2
14.6
Q
3
13.5
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (1)
(IS = 3.0 Adc, VGS = 0 Vdc)
(IS = 3.0 Adc, VGS = 0 Vdc, TJ = 125°C)
V
SD
— —
0.794
0.63
1.1 —
Vdc
t
rr
615
(See Figure 14)
S
= 3.0 Adc, VGS = 0 Vdc,
t
a
104
(IS = 3.0 Adc, VGS = 0 Vdc,
dIS/dt = 100 A/µs)
t
b
511
Reverse Recovery Stored Charge Q
RR
2.92 µC
INTERNAL PACKAGE INDUCTANCE
Internal Drain Inductance
(Measured from contact screw on tab to center of die) (Measured from the drain lead 0.25″ from package to center of die)
L
D
3.5
4.5
nH
Internal Source Inductance
(Measured from the source lead 0.25″ from package to source bond pad)
L
S
7.5 nH
(1) Pulse Test: Pulse Width 300 µs, Duty Cycle 2%. (2) Switching characteristics are independent of operating junction temperature.
Gate Charge
Reverse Recovery Time
(VDD = 400 Vdc, ID = 3.0 Adc,
(V
(I
ns
MTP3N100E
3
Motorola TMOS Power MOSFET Transistor Device Data
TYPICAL ELECTRICAL CHARACTERISTICS
R
DS(on)
, DRAIN–TO–SOURCE RESISTANCE (OHMS)
R
DS(on)
, DRAIN–TO–SOURCE RESISTANCE
(NORMALIZED)
R
DS(on)
, DRAIN–TO–SOURCE RESISTANCE (OHMS)
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 1. On–Region Characteristics
I
D
, DRAIN CURRENT (AMPS)
VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
Figure 2. Transfer Characteristics
ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance versus Drain Current
and Temperature
ID, DRAIN CURRENT (AMPS)
Figure 4. On–Resistance versus Drain Current
and Gate Voltage
TJ, JUNCTION TEMPERATURE (°C)
Figure 5. On–Resistance Variation with
Temperature
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 6. Drain–To–Source Leakage
Current versus Voltage
I
DSS
, LEAKAGE (nA)
TJ = 25°C
0 4 8 12 16 202 6 10 14 18
3
5 V
6 V
VDS ≥ 10 V
2.0 2.8 3.6 4.4 5.22.4 3.2 4.0 4.8
TJ = –55°C
25°C
100°C
TJ = 25°C
VGS = 10 V
15 V
2.8
3.4
VGS = 0 V
0 200 400
1
100
100000
100 300 600500
25°C
100°C
TJ = 125°C
1.0 3.0 5.5
1
3
5
6
4
2
4.5
TJ = 100°C
25°C
–55°C
VGS = 10 V
–50
0.4
0.8
1.2
2.0
2.4
–25 0 25 50 75 100 125 150
VGS = 10 V ID = 1.5 A
4 V
5
1
1000
3.2
3.6
3.8
3.0
1.6
6
2
4
I
D
, DRAIN CURRENT (AMPS)
5.6
2.0 4.0 6.05.0
10
1000800
0
1.0 3.0 5.02.0 4.0 6.05.5
3
5
1
6
2
4
0
6.0
2.51.5 3.5 1.5 2.5 3.5 4.5
700
900
10000
VGS = 10 V
Loading...
+ 5 hidden pages