Motorola MTP1N50E Datasheet

1
Motorola TMOS Power MOSFET Transistor Device Data
  
 
   
N–Channel Enhancement–Mode Silicon Gate
Robust High Voltage Termination
Avalanche Energy Specified
Source–to–Drain Diode Recovery Time Comparable to a Discrete
Fast Recovery Diode
Diode is Characterized for Use in Bridge Circuits
I
DSS
and V
DS(on)
Specified at Elevated Temperature
MAXIMUM RATINGS
(TC = 25°C unless otherwise noted)
Rating
Symbol Value Unit
Drain–Source Voltage V
DSS
500 Vdc
Drain–Gate Voltage (RGS = 1.0 M) V
DGR
500 Vdc
Gate–Source Voltage — Continuous
— Non–Repetitive (tp 10 ms)
V
GS
V
GSM
± 20 ± 40
Vdc Vpk
Drain Current — Continuous
— Continuous @ 100°C — Single Pulse (tp 10 µs)
I
D
I
D
I
DM
1.0
0.8
3.0
Adc
Apk
Total Power Dissipation
Derate above 25°C
P
D
40
0.32
Watts
W/°C
Operating and Storage Temperature Range TJ, T
stg
–55 to 150 °C
Single Pulse Drain–to–Source Avalanche Energy — Starting TJ = 25°C
(VDD = 100 Vdc, VGS =10 Vdc, IL = 3.0 Apk, L =10 mH, RG = 25 )
E
AS
45 mJ
Thermal Resistance
— Junction to Case — Junction to Ambient, when surface mounted using minimum recommended pad size
R
θJC
R
θJA
3.13
62.5
°C/W
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 seconds T
L
260 °C
Designer’s Data for “Worst Case” Conditions — The Designer’s Data Sheet permits the design of most circuits entirely from the information presented. SOA Limit curves — representing boundaries on device characteristics — are given to facilitate “worst case” design.
E–FET and Designer’s are trademarks of Motorola, Inc. TMOS is a registered trademark of Motorola, Inc.
Preferred devices are Motorola recommended choices for future use and best overall value.
REV 1
Order this document
by MTP1N50E/D

SEMICONDUCTOR TECHNICAL DATA
Motorola, Inc. 1995

TMOS POWER FET
1.0 AMPERES 500 VOLTS
R
DS(on)
= 5.0 OHM
Motorola Preferred Device
D
S
G
CASE 221A–06, Style 5
TO–220AB
MTP1N50E
2
Motorola TMOS Power MOSFET Transistor Device Data
ELECTRICAL CHARACTERISTICS
(T
J
= 25°C unless otherwise noted)
Characteristic
Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage
(VGS = 0 Vdc, ID = 250 µAdc) Temperature Coefficient (Positive)
V
(BR)DSS
500
480
— —
Vdc
mV/°C
Zero Gate Voltage Drain Current
(VDS = 500 Vdc, VGS = 0 Vdc) (VDS = 500 Vdc, VGS = 0 Vdc, TJ = 125 °C)
I
DSS
— —
— —
10
100
µAdc
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) I
GSS
100 nAdc
ON CHARACTERISTICS (1)
Gate Threshold Voltage
(VDS = VGS, ID = 250 µAdc) Temperature Coefficient (Negative)
V
GS(th)
2.0 —
3.2
6.0
4.0 —
Vdc
mV/°C
Static Drain–Source On–Resistance (VGS = 10 Vdc, ID = 0.5 Adc) R
DS(on)
4.3 5.0 Ohm
Drain–Source On–Voltage (VGS = 10 Vdc)
(ID = 1 .0 Adc) (ID = 0.5 Adc, TJ = 125 °C)
V
DS(on)
— —
4.5 —
6.0
5.30
Vdc
Forward Transconductance (VDS = 15 Vdc, ID = 0.5 Adc) g
FS
0.5 0.9 mhos
DYNAMIC CHARACTERISTICS
Input Capacitance
C
iss
215 315 pF
Output Capacitance
(VDS = 25 Vdc, VGS = 0 Vdc,
f = 1.0 MHz)
C
oss
30.2 42
Reverse Transfer Capacitance
f = 1.0 MHz)
C
rss
6.7 12
SWITCHING CHARACTERISTICS (2)
Turn–On Delay Time
t
d(on)
8.0 20 ns
Rise Time
t
r
9.0 10
Turn–Off Delay Time
VGS = 10 Vdc,
RG = 9.1 )
t
d(off)
14 30
Fall Time
G
= 9.1 )
t
f
17 30
Q
T
7.4 9.0 nC
(See Figure 8)
DS
= 400 Vdc, ID = 1.0 Adc,
Q
1
1.6
(VDS = 400 Vdc, ID = 1.0 Adc,
VGS = 10 Vdc)
Q
2
3.8
Q
3
5
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (1) (IS = 1.0 Adc, VGS = 0 Vdc)
(IS = 1.0 Adc, VGS = 0 Vdc,
TJ = 125 °C)
V
SD
— —
0.81
0.68
1.2 —
Vdc
t
rr
145
(See Figure 14)
S
= 1.0 Adc, VGS = 0 Vdc,
t
a
85
(IS = 1.0 Adc, VGS = 0 Vdc,
dIS/dt = 100 A/µs)
t
b
60
Reverse Recovery Stored Charge Q
RR
0.702 µC
INTERNAL PACKAGE INDUCTANCE
Internal Drain Inductance
(Measured from contact screw on tab to center of die) (Measured from the drain lead 0.25″ from package to center of die)
L
D
— —
3.5
4.5
— —
nH
Internal Source Inductance
(Measured from the source lead 0.25″ from package to source bond pad)
L
S
7.5
nH
(1) Pulse Test: Pulse Width 300 µs, Duty Cycle 2%. (2) Switching characteristics are independent of operating junction temperature.
Gate Charge
Reverse Recovery Time
(VDD = 250 Vdc, ID = 1.0 Adc,
(V
(I
ns
MTP1N50E
3
Motorola TMOS Power MOSFET Transistor Device Data
TYPICAL ELECTRICAL CHARACTERISTICS
, DRAIN–TO–SOURCE RESISTANCE
(NORMALIZED)
R
DS(on)
, DRAIN–TO–SOURCE RESISTANCE (OHMS)
0 4 8 12 16
0
0.50
1.0
1.50
2.0
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 1. On–Region Characteristics
I
D
, DRAIN CURRENT (AMPS)
2.0 3.0 4.0 5.0 6.5
0
0.75
1.25
1.75
2.0
I
D
, DRAIN CURRENT (AMPS)
VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
Figure 2. Transfer Characteristics
0 0.4 0.8 1.2 1.6 2.0
0
2
8
10
0 0.50 1.0 1.50 2.0
3.0
4.0
5.5
6.0
ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance versus Drain Current
and Temperature
ID, DRAIN CURRENT (AMPS)
Figure 4. On–Resistance versus Drain Current
and Gate Voltage
–50
0
0.5
1.0
2.0
2.5
0 100 200 300 400 500
1
10
100
1000
10000
TJ, JUNCTION TEMPERATURE (
°
C)
Figure 5. On–Resistance Variation with
Temperature
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 6. Drain–To–Source Leakage
Current versus Voltage
I
DSS
, LEAKAGE (nA)
–25 0 25 50 75 100 125 150
TJ = 25°C VDS ≥ 10 V
TJ = 100°C
25°C
–55°C
25°C
TJ = 25°C
VGS = 0 V
VGS = 10 V
VGS = 10 V
VGS = 10 V
VGS = 10 V ID = 0.5 A
7 V
8 V
6 V
5 V
15 V
TJ = 125°C
100°C
25°C
1.50
0.50
1.0
0.25
0.75
1.25
1.75
6
1.5
3.5
4.5
5.0
6.03.5 4.5 5.56 10 14
0.25 0.75 1.25 1.75
2
0.25
2.5
4
TJ = 100°C
–55°C
, DRAIN–TO–SOURCE RESISTANCE (OHMS)
DS(on)
R
DS(on)
R
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