Motorola MTE215N10E Datasheet

1
Motorola TMOS Power MOSFET Transistor Device Data
  
 
N–Channel Enhancement–Mode Silicon Gate
This a dvanced h igh voltage TMOS E–FET is designed to withstand high energy in the avalanche mode and switch efficiently. This new high energy device also offers a drain–to–source diode with fast recovery time. Designed for high voltage, high s peed switching applications such a s power supplies, P WM motor controls and other inductive loads, the avalanche energy capability is specified to eliminate the guesswork in designs where inductive loads are switched and offer additional s afety margin against unexpected voltage transients.
2500 V RMS Isolated Isotop Package
Avalanche Energy Specified
Source–to–Drain Diode Recovery Time Comparable to a Discrete
Fast Recovery Diode
Diode is Characterized for Use in Bridge Circuits
Very Low Internal Parasitic Inductance
I
DSS
and V
DS(on)
Specified at Elevated Temperature
U. L. Recognized, File #E69369
MAXIMUM RATINGS
(TC = 25°C unless otherwise noted)
Rating
Symbol Value Unit
Drain–Source Voltage V
DSS
100 Vdc
Drain–Gate Voltage (RGS = 1.0 M) V
DGR
100 Vdc
Gate–Source Voltage — Continuous
Gate–Source Voltage — Non–Repetitive (tp 10 ms)
V
GS
V
GSM
± 20 ± 40
Vdc Vpk
Drain Current — Continuous
Drain Current — Continuous @ 100°C Drain Current — Single Pulse (tp 10 µs)
I
D
I
D
I
DM
215 136 860
Adc
Total Power Dissipation
Derate above 25°C
P
D
460
3.70
Watts
W/°C
Operating and Storage Temperature Range TJ, T
stg
–40 to 150 °C
Single Pulse Drain–to–Source Avalanche Energy
(VDD = 25 Vdc, VGS = 10 Vdc, IL = 215 Apk, L = 0.017 mH, RG = 25 Ω,)
E
AS
400
mJ
RMS Isolation Voltage V
ISO
2500 Vac
Thermal Resistance — Junction to Case
Thermal Resistance — Junction to Ambient
R
θJC
R
θJA
0.28
62.5
°C/W
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 seconds T
L
260 °C
Designer’s Data for “Worst Case” Conditions — The Designer’s Data Sheet permits the design of most circuits entirely from the information presented. SOA Limit curves — representing boundaries on device characteristics — are given to facilitate “worst case” design.
E–FET is a trademark of Motorola, Inc. TMOS is a registered trademark of Motorola, Inc. ISOTOP is a trademark of SGS–THOMSON Microelectronics.
Preferred devices are Motorola recommended choices for future use and best overall value.
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SEMICONDUCTOR TECHNICAL DATA
TMOS POWER FET
215 AMPERES
100 VOLTS
R
DS(on)
= 0.0055 OHM
Motorola Preferred Device
D
S
G
SOT–227B
1
2
3
4
1. Source
2. Gate
3. Drain
4. Source 2
Motorola, Inc. 1995
MTE215N10E
2
Motorola TMOS Power MOSFET Transistor Device Data
ELECTRICAL CHARACTERISTICS
(T
J
= 25°C unless otherwise noted)
Characteristic
Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage
(VGS = 0 Vdc, ID = 250 µAdc) Temperature Coefficient (Positive)
V
(BR)DSS
100
110 120
— —
Vdc
mV/°C
Zero Gate Voltage Drain Current
(VDS = 100 Vdc, VGS = 0 Vdc) (VDS = 100 Vdc, VGS = 0 Vdc, TJ = 125°C)
I
DSS
— —
— —
10
100
µAdc
Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) I
GSS
200 nAdc
ON CHARACTERISTICS (1)
Gate Threshold Voltage
(VDS = VGS, ID = 250 µAdc) Threshold Temperature Coefficient (Negative)
V
GS(th)
2.0 —
3.0 —
4.0 —
Vdc
mV/°C
Static Drain–Source On–Resistance (VGS = 10 Vdc, ID = 107.5 Adc) R
DS(on)
4.6 5.5 mOhm
Drain–Source On–Voltage (VGS = Vdc)
(ID = 215 Adc) (ID = 107.5 Adc, TJ = 125°C)
V
DS(on)
— —
— —
1.5
1.2
Vdc
Forward Transconductance (VDS = 15 Vdc, ID = 107.5 Adc) g
FS
100 140 mhos
DYNAMIC CHARACTERISTICS
Input Capacitance
C
iss
15200 pF
Output Capacitance
(VDS = 25 Vdc, VGS = 0 Vdc,
f = 1.0 MHz)
C
oss
6600
Reverse Transfer Capacitance
f = 1.0 MHz)
C
rss
2400
SWITCHING CHARACTERISTICS (2)
Turn–On Delay Time
t
d(on)
48 ns
Rise Time
t
r
490
Turn–Off Delay Time
VGS = 10 Vdc,
RG = 5.0 )
t
d(off)
186
Fall Time
G
= 5.0 )
t
f
384
Q
T
540 nC
DS
= 80 Vdc, ID = 215 Adc,
Q
1
104
(VDS = 80 Vdc, ID = 215 Adc,
VGS =10 Vdc)
Q
2
300
Q
3
440
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage (1)
(IS = 215 Adc, VGS = 0 Vdc)
(IS = 215 Adc, VGS = 0 Vdc, TJ = 125°C)
V
SD
— —
1.0
1.2
1.5 —
Vdc
t
rr
145
S
= 215 Adc, VGS = 0 Vdc,
t
a
90
(IS = 215 Adc, VGS = 0 Vdc,
dIS/dt = 100 A/µs)
t
b
55
Reverse Recovery Stored Charge Q
RR
4.6 µC
INTERNAL PACKAGE INDUCTANCE
Internal Drain Inductance
(Measured from contact screw on tab to center of die) (Measured from the drain lead 0.25″ from package to center of die)
L
D
— —
3.5
5.0
— —
nH
Internal Source Inductance
(Measured from the source lead 0.25″ from package to source pad)
L
S
5.0 nH
(1) Pulse Test: Pulse Width 300 µs, Duty Cycle 2%. (2) Switching characteristics are independent of operating junction temperature.
Gate Charge
Reverse Recovery Time
(VDD = 50 Vdc, ID = 215 Adc,
(V
(I
ns
MTE215N10E
3
Motorola TMOS Power MOSFET Transistor Device Data
TYPICAL ELECTRICAL CHARACTERISTICS
R
DS(on)
, DRAIN–TO–SOURCE RESISTANCE
(NORMALIZED)
R
DS(on)
, DRAIN–TO–SOURCE RESISTANCE (OHMS)
0
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 1. On–Region Characteristics
I
D
, DRAIN CURRENT (AMPS)
I
D
, DRAIN CURRENT (AMPS)
VGS, GATE–TO–SOURCE VOLTAGE (VOLTS)
Figure 2. Transfer Characteristics
ID, DRAIN CURRENT (AMPS)
Figure 3. On–Resistance versus Drain Current
and Temperature
ID, DRAIN CURRENT (AMPS)
Figure 4. On–Resistance versus Drain Current
and Gate Voltage
TJ, JUNCTION TEMPERATURE (°C)
Figure 5. On–Resistance Variation with
Temperature
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 6. Drain–To–Source Leakage Current
versus Voltage
TJ = 25°C
VGS = 10 V
VGS = 10 V ID = 107.5 A
7 V
6 V
–50 0 50 100 150
220
165
110
55
0
43.5321
240
160
120
0
86421
200
80
150100500 200 250
7
0 20 6040 80 100
5 V
4 V
125
0.5 1.5 2.5
9 V
8 V
40
3 5
VDS ≥ 5 V
100°C
25°C
TJ = –55°C
0.018
0.016
0.014
0.012
0.01
0.008
0.006
0.004 0 50 100 150 200 250
TJ = 100°C
25°C
–55°C
0.016
0.014
0.012
0.01
0.008
0.006
VGS = 10 V
TJ = 25°C
VGS = 10 V
15 V
R
DS(on)
, DRAIN–TO–SOURCE RESISTANCE (OHMS)
–25 25 75
1.6
1.4
1.2
1
0.8
0.6
I
DSS
, LEAKAGE (nA)
100000
10000
1000
100
10
1
VGS = 0 V
TJ = 125°C
100°C
25°C
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