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SEMICONDUCTOR TECHNICAL DATA
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by MMSF7N03Z/D
Medium Power Surface Mount Products
Motorola Preferred Device
!
EZFETs are an advanced series of power MOSFET s which utilize
Motorola’s High Cell Density TMOS process and contain monolithic
back–to–back zener diodes. These zener diodes provide protection
against ESD and unexpected transients. These miniature surface
mount MOSFETs feature ultra low R
amd true logic level
DS(on)
performance. They are capable of withstanding high energy in the
avalanche and commutation modes and the drain–to–source diode
has a very low reverse recovery time. EZFET devices are designed
for use in low voltage, high speed switching applications where power
efficiency is important. Typical applications are dc–dc converters, and
power management in portable and battery powered products such as
computers, printers, cellular and cordless phones. They can als o be
used for low voltage motor controls in mass storage products such as
G
disk drives and tape drives.
• Zener Protected Gates Provide Electrostatic Discharge Protection
• Ultra Low R
Provides Higher Efficiency and Extends Battery Life
DS(on)
• Designed to withstand 200V Machine Model and 2000V Human Body Model
• Logic Level Gate Drive — Can Be Driven by Logic ICs
• Miniature SO–8 Surface Mount Package — Saves Board Space
• Diode Is Characterized for Use In Bridge Circuits
• Diode Exhibits High Speed, With Soft Recovery
• I
Specified at Elevated Temperature
DSS
• Mounting Information for SO–8 Package Provided
MAXIMUM RATINGS
Drain–to–Source Voltage V
Drain–to–Gate Voltage (RGS = 1.0 MΩ) V
Gate–to–Source Voltage — Continuous V
Drain Current — Continuous @ TA = 25°C (1)
Drain Current — Continuous @ TA = 70°C (1)
Drain Current — Pulsed Drain Current (3)
Total Power Dissipation @ TA = 25°C (1)
Linear Derating Factor (1)
Total Power Dissipation @ TA = 25°C (2)
Linear Derating Factor (2)
Operating and Storage Temperature Range TJ, T
Single Pulse Drain–to–Source Avalanche Energy — Starting TJ = 25°C
(VDD = 30 Vdc, VGS = 5.0 Vdc, Peak IL = 15 Apk, L = 4.0 mH, RG = 25 Ω)
Thermal Resistance — Junction to Ambient (1)
(1) When mounted on 1 inch square FR–4 or G–10 board (VGS = 10 V, @ 10 Seconds)
(2) When mounted on 1 inch square FR–4 or G–10 board (VGS = 10 V, @ Steady State)
(3) Repetitive rating; pulse width limited by maximum junction temperature.
(TJ = 25°C unless otherwise noted)
Rating
— Junction to Ambient (2)
DEVICE MARKING ORDERING INFORMATION
Device Reel Size Tape Width Quantity
MMSF7N03ZR2 13″ 12 mm embossed tape 2500 units
Designer’s Data for “Worst Case” Conditions — The Designer’s Data Sheet permits the design of most circuits entirely from the information presented. SOA Limit
curves — representing boundaries on device characteristics — are given to facilitate “worst case” design.
Preferred devices are Motorola recommended choices for future use and best overall value.
HDTMOS and EZFET are trademarks of Motorola, Inc. TMOS is a registered trademark of Motorola, Inc. Thermal Clad is a trademark of the
Bergquist Company.
D
S
SINGLE TMOS
POWER MOSFET
7.5 AMPERES
30 VOLTS
R
CASE 751–05, Style 12
Source
Source
Source
Gate
Symbol Value Unit
DSS
DGR
GS
I
D
I
D
I
DM
P
D
P
D
stg
E
AS
R
θJA
= 0.030 OHM
DS(on)
SO–8
1
2
3
4
Top View
30 Vdc
30 Vdc
± 15 Vdc
7.5
5.6
60
2.5
20
1.6
12
– 55 to 150 °C
450
50
80
8
7
6
5
Watts
mW/°C
Watts
mW/°C
°C/W
Drain
Drain
Drain
Drain
Adc
Apk
mJ
Motorola TMOS Power MOSFET Transistor Device Data
Motorola, Inc. 1996
1
MMSF7N03Z
ELECTRICAL CHARACTERISTICS
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage (Cpk ≥ 2.0) (1) (3)
(VGS = 0 Vdc, ID = 250 µAdc)
T emperature Coef ficient (Positive)
Zero Gate Voltage Drain Current
(VDS = 30 Vdc, VGS = 0 Vdc)
(VDS = 30 Vdc, VGS = 0 Vdc, TJ = 125°C)
Gate–Body Leakage Current (VGS = ± 15 Vdc, VDS = 0) I
ON CHARACTERISTICS
Gate Threshold Voltage (Cpk ≥ 2.0) (1) (3)
(VDS = VGS, ID = 250 µAdc)
Threshold Temperature Coefficient (Negative)
Static Drain–to–Source On–Resistance (Cpk ≥ 2.0) (1) (3)
(VGS = 10 Vdc, ID = 7.5 Adc)
(VGS = 4.5 Vdc, ID = 3.8 Adc)
Forward Transconductance (VDS = 3.0 Vdc, ID = 3.8 Adc) (1) g
DYNAMIC CHARACTERISTICS
Input Capacitance
Output Capacitance
Transfer Capacitance
SWITCHING CHARACTERISTICS
Turn–On Delay Time
Rise Time
Turn–Off Delay Time
Fall Time t
Turn–On Delay Time
Rise Time
Turn–Off Delay Time
Fall Time t
Gate Charge
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage
Reverse Recovery Time
Reverse Recovery Storage Charge Q
(1) Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
(2) Switching characteristics are independent of operating junction temperature.
(3) Reflects typical values.
(1)
(1)
Cpk =
(TC = 25°C unless otherwise noted)
(VDS = 24 Vdc, VGS = 0 Vdc,
(2)
(VDS = 15 Vdc, ID = 5.0 Adc,
VGS = 10 Vdc, RG = 6 Ω) (1)
(VDD = 15 Vdc, ID = 5.0 Adc,
VGS = 4.5 Vdc, RG = 6 Ω) (1)
(VDS = 24 Vdc, ID = 5.0 Adc,
(IS = 7.5 Adc, VGS = 0 Vdc) (1)
(IS = 7.5 Adc, VGS = 0 Vdc, TJ = 125°C)
Max limit – Typ
3 x SIGMA
f = 1.0 MHz
VGS = 10 Vdc) (1)
(IS = 7.5 Adc, VGS = 0 Vdc,
dI
/dt = 100 A/µs) (1
V
(BR)DSS
I
DSS
GSS
V
GS(th)
R
DS(on)
FS
C
iss
C
oss
C
rss
t
d(on)
t
r
t
d(off)
f
t
d(on)
t
r
t
d(off)
f
Q
Q
Q
Q
V
SD
t
rr
t
a
t
b
RR
30
—
—
—
— 1.3 5.0 µAdc
1.0
—
—
—
4.0 9.5 — Mhos
— 750 1500 pF
— 340 680
— 45 90
— 40 80 ns
— 90 180
— 470 940
— 170 340
— 120 240 ns
— 350 700
— 430 860
— 140 280
T
1
2
3
— 34 48 nC
— 3.5 —
— 9.5 —
— 6.5 —
—
—
— 110 —
— 22 —
— 90 —
— 0.17 — µC
—
35
0.03
0.15
2.0
5.5
22
30
0.83
0.67
—
—
2.0
10
3.0
—
30
40
1.6
—
Vdc
mV/°C
µAdc
Vdc
mV/°C
mΩ
Vdc
ns
2
Motorola TMOS Power MOSFET Transistor Device Data
TYPICAL ELECTRICAL CHARACTERISTICS
MMSF7N03Z
10
TJ = 25°C
8
6
4
, DRAIN CURRENT (AMPS)
D
I
2
0
0 0.4 1.6 2
VDS, DRAIN–TO–SOURCE VOL TAGE (VOLTS)
VGS = 10 V
4.5 V
3.8 V
0.8
3.5 V
3.3 V
3.1 V
2.7 V
1.2
Figure 1. On–Region Characteristics
0.1
ID = 2.5 A
0.08
0.06
0.04
TJ = 25
10
VDS ≥ 10 V
8
6
4
, DRAIN CURRENT (AMPS)
D
I
2
0
2.21.8
VGS, GATE–T O–SOURCE VOLTAGE (VOLTS)
100°C
25°C
TJ = –55°C
2.6 3 3.4 3.8
Figure 2. Transfer Characteristics
0.05
TJ = 25°C
°
C
0.04
0.03
0.02
VGS = 4.5
10 V
0.02
, DRAIN–TO–SOURCE RESIST ANCE (OHMS)
0
DS(on)
0
R
24 86
VGS, GATE–T O–SOURCE VOLT AGE (VOLTS)
Figure 3. On–Resistance versus
Gate–to–Source V oltage
2.0
VGS = 10 V
ID = 2.5 A
1.5
1.0
0.5
, DRAIN–TO–SOURCE RESIST ANCE (NORMALIZED)
0
–50 0 50 100 150
DS(on)
R
TJ, JUNCTION TEMPERATURE (°C)
0.01
, DRAIN–TO–SOURCE RESIST ANCE (OHMS)
0
10
DS(on)
024 810
R
ID, DRAIN CURRENT (AMPS)
6
Figure 4. On–Resistance versus Drain Current
and Gate Voltage
1000
VGS = 0 V
100
, LEAKAGE (nA)
10
DSS
I
1
1257525–25
0 5 10 15 30
VDS, DRAIN–TO–SOURCE VOL TAGE (VOLTS)
TJ = 125°C
100°C
20 25
Figure 5. On–Resistance Variation
with Temperature
Motorola TMOS Power MOSFET Transistor Device Data
Figure 6. Drain–to–Source Leakage Current
versus V oltage
3