MOTOROLA MMSF4205 Technical data

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SEMICONDUCTOR TECHNICAL DATA
Medium Power Surface Mount Products
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Motorola Preferred Device
MiniMOS devices are an advanced series of power MOSFETs which utilize Motorola’s High Cell Density HDTMOS process. These miniature surface mount MOSFETs feature ultra low R
and true logic level performance. They are capable of withstanding high energy in the avalanche and commutation modes and the drain–to–s ource diode has a very low reverse recovery time. MiniMOS devices are designed for use in low voltage, high speed switching applications where power efficiency is important. Typical applications are dc–dc converters, and power management in portable and battery powered products such as
computers, printers, cellular and cordless phones. They can also be used for low voltage motor controls in mass storage products such as disk drives and tape drives. The avalanche energy is specified to eliminate the guesswork in designs where induc tive loads are switched and offer additional safety margin against unexpected voltage transients.
Ultra Low R
Provides Higher Efficiency and Extends Battery Life
DS(on)
Logic Level Gate Drive — Can Be Driven by Logic ICs
Miniature SO–8 Surface Mount Package — Saves Board Space
Diode Is Characterized for Use In Bridge Circuits
Diode Exhibits High Speed, With Soft Recovery
I
Mounting Information for SO–8 Package Provided
Avalanche Energy Specified
MAXIMUM RATINGS
Negative sign for P–Channel devices omitted for clarity
(1) Repetitive rating; pulse width limited by maximum junction temperature.
Specified at Elevated Temperature
DSS
G
(TJ = 25°C unless otherwise noted)
Rating
Drain–to–Source Voltage V Drain–to–Gate Voltage (RGS = 1.0 M) V Gate–to–Source Voltage — Continuous V 1 inch SQ.
FR–4 or G–10 PCB
10 seconds
Minimum FR–4 or G–10 PCB
10 seconds
Operating and Storage Temperature Range TJ, T Single Pulse Drain–to–Source Avalanche Energy — Starting TJ = 25°C
(VDD = 20 Vdc, VGS = 4.5 Vdc, Peak IL = 5.0 Apk, L = 40 mH, RG = 25 W)
Thermal Resistance — Junction to Ambient Total Power Dissipation @ TA = 25°C Linear Derating Factor Drain Current @ TA = 25°C Continuous @ TA = 70°C Pulsed Drain Current
Thermal Resistance — Junction to Ambient Total Power Dissipation @ TA = 25°C Linear Derating Factor Drain Current @ TA = 25°C Continuous @ TA = 70°C Pulsed Drain Current
(1)
(1)
D
SOURCE SOURCE SOURCE
S
Symbol Max Unit
DSS
DGR
R
THJA
P
I I
I
DM
R
THJA
P
I I
I
DM
E
DEVICE MARKING ORDERING INFORMATION
Device Reel Size Tape Width Quantity
MMSF4205R2 13 12 mm embossed tape 2500 units
HDTMOS and MiniMOS are trademarks of Motorola, Inc. TMOS is a registered trademark of Motorola, Inc.
Preferred devices are Motorola recommended choices for future use and best overall value. This document contains information on a new product. Specifications and information herein are subject to change without notice.
SINGLE TMOS
POWER MOSFET
10 AMPERES
20 VOLTS
R
CASE 751–06, Style 12
GATE
GS
D
D D
D
D D
stg
AS
= 14 m
DS(on)
SO–8
1
8
2
7
3
6
4
5
TOP VIEW
20 V 20 V
± 12 V
50
2.5 20 10
8.0 50
80
1.6
12.5
8.8
6.4 44
– 55 to 150 °C
500
W
DRAIN DRAIN DRAIN DRAIN
°C/W
Watts
mW/°C
A A A
°C/W
Watts
mW/°C
A A A
mJ
Motorola TMOS Power MOSFET Transistor Device Data
Motorola, Inc. 1999
1
MMSF4205
)
f = 1.0 MHz)
V
4.5 Vd
G
)( )
(
DS
,
D
,
(
S
,
GS
,
ELECTRICAL CHARACTERISTICS
OFF CHARACTERISTICS
Drain–to–Source Breakdown Voltage
(VGS = 0 Vdc, ID = 250 µAdc) T emperature Coef ficient (Positive)
Zero Gate Voltage Drain Current
(VDS = 20 Vdc, VGS = 0 Vdc) (VDS = 20 Vdc, VGS = 0 Vdc, TJ = 70°C)
Gate–Body Leakage Current (VGS = ± 12 Vdc, VDS = 0) I
ON CHARACTERISTICS
Gate Threshold Voltage
(VDS = VGS, ID = 250 µAdc) Threshold Temperature Coefficient (Negative)
Static Drain–to–Source On–Resistance
(VGS = 4.5 Vdc, ID = 10 Adc) (VGS = 2.5 Vdc, ID = 8.8 Adc)
Forward Transconductance (VDS = 10 Vdc, ID = 10 Adc) g
DYNAMIC CHARACTERISTICS
Input Capacitance Output Capacitance Transfer Capacitance
SWITCHING CHARACTERISTICS
Turn–On Delay Time Rise Time Turn–Off Delay Time Fall Time Gate Charge
SOURCE–DRAIN DIODE CHARACTERISTICS
Forward On–Voltage
Reverse Recovery Time
Reverse Recovery Stored Charge Q
(1) Pulse Test: Pulse Width 300 µs, Duty Cycle 2%. (2) Switching characteristics are independent of operating junction temperature. (3) Reflects typical values.
(4) Repetitive rating; pulse width limited by maximum junction temperature.
(1)
(1)
Cpk =
(TC = 25°C unless otherwise noted)
Characteristic Symbol Min Typ Max Unit
(VDS = 16 Vdc, VGS = 0 Vdc,
(2)
(VDD = 10 Vdc, ID = 1.0 Adc,
(IS = 2.1 Adc, VGS = 0 Vdc) (1)
(IS = 2.1 Adc, VGS = 0 Vdc, TJ = 125°C)
Max limit – Typ
3 x SIGMA
f = 1.0 MHz
=
GS
RG = 6.0 ) (1)
(VDS = 10 Vdc, ID = 10 Adc,
VGS = 4.5 Vdc) (1)
(IS = 2.1 Adc, VGS = 0 Vdc,
dIS/dt = 100 A/µs) (1)
c,
V
(BR)DSS
I
DSS
GSS
V
GS(th)
R
DS(on)
FS
C
iss
C
oss
C
rss
t
d(on)
t
r
t
d(off)
t
f
Q Q Q Q
V
SD
t
rr
t
a
t
b
RR
20 —
— —
100 nAdc
0.6 —
— —
36 Mhos
2600 3640 pF — 1190 1670 — 720 1010
21 29 — 49 69 — 137 192 — 150 210
T 1 2 3
60 70 — 5.0 — — 29 — — 13
— —
80 100 — 25 — — 42 — — 0.083 µC
12.1
— —
0.8
2.7
11 16
0.7
0.6
— —
1.0
5.0
— —
14 20
1.2 —
Vdc
mV/°C
µAdc
Vdc
mV/°C
m
ns
nC
Vdc
ns
2
Motorola TMOS Power MOSFET Transistor Device Data
TYPICAL ELECTRICAL CHARACTERISTICS
MMSF4205
20
10 V
16
12
8
, DRAIN CURRENT (AMPS)
D
I
4
0
0 0.2 0.4 1.20.6 1.0
2.3 V
3.1 V
2.5 V
VDS, DRAIN–TO–SOURCE VOL TAGE (VOL TS)
Figure 1. On–Region Characteristics
0.020
0.016
0.012
4.5 V
0.8
2.1 V
VGS = 10 V thru 1.7 V
TJ = 25
°
C
1.9 V
1.7 V
1.4 1.6 2.0
1.8
ID = 8.8 A TJ = 25
°
C
20
VDS ≥ 10 V
16
12
8
, DRAIN CURRENT (AMPS)
D
I
4
0
02
VGS, GATE–T O–SOURCE VOLTAGE (VOLTS)
25°C
TJ = 100°C
1
–55°C
3
Figure 2. Transfer Characteristics
0.020 TJ = 25°C
0.016
0.012
VGS = 2.5 V
4.5 V
0.008
0.004
, DRAIN–TO–SOURCE RESIST ANCE (OHMS)
0
DS(on)
R
204 10
VGS, GATE–T O–SOURCE VOLTAGE (VOLTS)
68
Figure 3. On–Resistance versus
Gate–T o–Source Voltage
2.0 VGS = 2.5 V
ID = 8.8 A
1.5
1.0
(NORMALIZED)
0.5
, DRAIN–TO–SOURCE RESIST ANCE
DS(on)
R
0
–50 –25 0 25 50 75 100 125 150
°
TJ, JUNCTION TEMPERATURE (
C)
0.008
0.004
, DRAIN–TO–SOURCE RESIST ANCE (OHMS)
0
DS(on)
048 16
R
ID, DRAIN CURRENT (AMPS)
12
Figure 4. On–Resistance versus Drain Current
and Gate Voltage
10000
VGS = 0 V
1000
100
10
, LEAKAGE (nA)
1
DSS
I
0.1
0.01 0
41216
VDS, DRAIN–TO–SOURCE VOL TAGE (VOLTS)
TJ = 125°C
100°C
25°C
8
20
20
Figure 5. On–Resistance Variation with
T emperature
Motorola TMOS Power MOSFET Transistor Device Data
Figure 6. Drain–T o–Source Leakage
Current versus Voltage
3
MMSF4205
POWER MOSFET SWITCHING
Switching behavior is most easily modeled and predicted by recognizing that the power MOSFET is charge controlled. The lengths of various switching intervals (t) are deter­mined by how fast the FET input capacitance can be charged by current from the generator.
The published capacitance data is difficult to use for calculat­ing rise and fall because drain–gate capacitance varies greatly with applied voltage. Accordingly , gate charge data is used. In most cases, a satisfactory estimate of average input current (I
) can be made from a rudimentary analysis of
G(A V)
the drive circuit so that t = Q/I
G(AV)
During the rise and fall time interval when switching a resis­tive load, VGS remains virtually constant at a level known as the plateau voltage, V
. Therefore, rise and fall times may
SGP
be approximated by the following: tr = Q2 x RG/(VGG – V tf = Q2 x RG/V
GSP
GSP
)
where VGG = the gate drive voltage, which varies from zero to V
GG
RG = the gate drive resistance and Q2 and V
are read from the gate charge curve.
GSP
During the turn–on and turn–off delay times, gate current is not constant. The simplest calculation uses appropriate val­ues from the capacitance curves in a standard equation for voltage change in an RC network. The equations are:
t
d(on)
t
d(off)
= RG C = RG C
In [VGG/(VGG – V
iss
In (VGG/V
iss
GSP
)]
GSP
)
The capacitance (C
) is read from the capacitance curve at
iss
a voltage corresponding to the off–state condition when cal­culating t on–state when calculating t
and is read at a voltage corresponding to the
d(on)
d(off)
.
At high switching speeds, parasitic circuit elements com­plicate the analysis. The inductance of the MOSFET source lead, inside the package and in the circuit wiring which is common to both the drain and gate current paths, produces a voltage at the source which reduces the gate drive current. The voltage is determined by Ldi/dt, but since di/dt is a func­tion of drain current, the mathematical solution is complex. The MOSFET output capacitance also complicates the mathematics. And finally, MOSFETs have finite internal gate resistance which effectively adds to the resistance of the driving source, but the internal resistance is difficult to mea­sure and, consequently , is not specified.
The resistive switching time variation versus gate resis­tance (Figure 9) shows how typical switching performance is affected by the parasitic circuit elements. If the parasitics were not present, the slope of the curves would maintain a value of unity regardless of the switching speed. The circuit used to obtain the data is constructed to minimize common inductance in the drain and gate circuit loops and is believed readily achievable with board mounted components. Most power electronic loads are inductive; the data in the figure is taken with a resistive load, which approximates an optimally snubbed inductive load. Power MOSFETs may be safely op­erated into an inductive load; however, snubbing reduces switching losses.
12000
10000
8000
6000
4000
C, CAPACITANCE (pF)
2000
C
iss
C
rss
0
–10 0 5 10–5
VDS = 0 V VGS = 0 V
C
iss
C
C
rss
V
V
DS
GS
VDS, DRAIN–TO–SOURCE VOL TAGE (VOLTS)
oss
Figure 7. Capacitance Variation
TJ = 25°C
15 20
4
Motorola TMOS Power MOSFET Transistor Device Data
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