Motorola MGY25N120 Datasheet

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Motorola TMOS Power MOSFET Transistor Device Data
  
   
N–Channel Enhancement–Mode Silicon Gate
This Insulated Gate Bipolar Transistor (IGBT) uses an advanced termination scheme to provide an enhanced and reliable high voltage–blocking capability. Short circuit rated IGBT’s are specifi­cally suited for applications requiring a guaranteed short circuit withstand time. Fast switching characteristics result in efficient operation at high frequencies.
Industry Standard High Power TO–264 Package (TO–3PBL)
High Speed E
off
: 273 mJ/A typical at 125°C
High Short Circuit Capability – 10 ms minimum
Robust High Voltage Termination
MAXIMUM RATINGS
(TJ = 25°C unless otherwise noted)
Rating
Symbol Value Unit
Collector–Emitter Voltage V
CES
1200 Vdc
Collector–Gate Voltage (RGE = 1.0 M) V
CGR
1200 Vdc
Gate–Emitter Voltage — Continuous V
GE
±20 Vdc
Collector Current — Continuous @ TC = 25°C
— Continuous @ TC = 90°C — Repetitive Pulsed Current (1)
I
C25
I
C90
I
CM
38 25 76
Adc
Apk
Total Power Dissipation @ TC = 25°C
Derate above 25°C
P
D
212
1.69
Watts
W/°C
Operating and Storage Junction Temperature Range TJ, T
stg
–55 to 150 °C
Short Circuit Withstand Time
(VCC = 720 Vdc, VGE = 15 Vdc, TJ = 125°C, RG = 20 )
t
sc
10
m
s
Thermal Resistance — Junction to Case – IGBT
— Junction to Ambient
R
θJC
R
θJA
0.6 35
°C/W
Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 5 seconds T
L
260 °C
Mounting Torque, 6–32 or M3 screw
10 lbfSin (1.13 NSm)
(1) Pulse width is limited by maximum junction temperature. Repetitive rating.
Designer’s Data for “Worst Case” Conditions — The Designer’s Data Sheet permits the design of most circuits entirely from the information presented. SOA Limit curves — representing boundaries on device characteristics— are given to facilitate “worst case” design.
Preferred devices are Motorola recommended choices for future use and best overall value.
REV 1
Order this document
by MGY25N120/D

SEMICONDUCTOR TECHNICAL DATA
IGBT IN TO–264
25 A @ 90°C 38 A @ 25°C 1200 VOLTS
SHORT CIRCUIT RATED
CASE 340G–02, Style 5
TO–264
Motorola Preferred Device
C
E
G
G
C
E
Motorola, Inc. 1996
MGY25N120
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Motorola TMOS Power MOSFET Transistor Device Data
ELECTRICAL CHARACTERISTICS
(T
J
= 25°C unless otherwise noted)
Characteristic
Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Collector–to–Emitter Breakdown Voltage
(VGE = 0 Vdc, IC = 25 µAdc) Temperature Coefficient (Positive)
BV
CES
1200
960
— —
Vdc
mV/°C
Emitter–to–Collector Breakdown Voltage (VGE = 0 Vdc, IEC = 100 mAdc) BV
ECS
25 Vdc
Zero Gate Voltage Collector Current
(VCE = 1200 Vdc, VGE = 0 Vdc) (VCE = 1200 Vdc, VGE = 0 Vdc, TJ = 125°C)
I
CES
— —
— —
100
2500
µAdc
Gate–Body Leakage Current (VGE = ± 20 Vdc, VCE = 0 Vdc) I
GES
250 nAdc
ON CHARACTERISTICS (1)
Collector–to–Emitter On–State Voltage
(VGE = 15 Vdc, IC = 12.5 Adc) (VGE = 15 Vdc, IC = 12.5 Adc, TJ = 125°C) (VGE = 15 Vdc, IC = 25 Adc)
V
CE(on)
— — —
2.37
2.15
2.98
3.24 —
4.19
Vdc
Gate Threshold Voltage
(VCE = VGE, IC = 1.0 mAdc) Threshold Temperature Coefficient (Negative)
V
GE(th)
4.0 —
6.0 10
8.0 —
Vdc
mV/°C
Forward Transconductance (VCE = 10 Vdc, IC = 25 Adc) g
fe
12 Mhos
DYNAMIC CHARACTERISTICS
Input Capacitance
C
ies
2795 pF
Output Capacitance
(VCE = 25 Vdc, VGE = 0 Vdc,
f = 1.0 MHz)
C
oes
181
Transfer Capacitance
f = 1.0 MHz)
C
res
45
SWITCHING CHARACTERISTICS (1)
Turn–On Delay Time
t
d(on)
91 ns
Rise Time
t
r
124
Turn–Off Delay Time
CC
= 720 Vdc, IC = 25 Adc,
VGE = 15 Vdc, L = 300 mH
R
= 20 Ω, T
= 25°C)
t
d(off)
196
Fall Time
m
H
RG = 20 Ω, TJ = 25°C)
Energy losses include “tail”
t
f
310
Turn–Off Switching Loss
m
H
RG = 20 Ω, TJ = 25°C)
Energy losses include “tail”
E
off
2.44 4.69 mJ
Turn–On Delay Time
t
d(on)
88 ns
Rise Time
t
r
126
Turn–Off Delay Time
CC
= 720 Vdc, IC = 25 Adc,
VGE = 15 Vdc, L = 300 mH
R
= 20 Ω, T
= 125°C)
t
d(off)
236
Fall Time
m
H
RG = 20 Ω, TJ = 125°C)
Energy losses include “tail”
t
f
640
Turn–Off Switching Loss
m
H
RG = 20 Ω, TJ = 125°C)
Energy losses include “tail”
E
off
5.40 mJ
Q
T
97 nC
(VCC = 720 Vdc, IC = 25 Adc,
V
= 15 Vdc)
Q
1
31
VGE = 15 Vdc)
Q
2
40
INTERNAL PACKAGE INDUCTANCE
Internal Emitter Inductance
(Measured from the emitter lead 0.25 from package to emitter bond pad)
L
E
13
nH
(1) Pulse Test: Pulse Width 300 µs, Duty Cycle 2%.
Gate Charge
(VCC = 720 Vdc, IC = 25 Adc,
(VCC = 720 Vdc, IC = 25 Adc,
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