MOTOROLA MC74HC4020AFR2, MC74HC4020AFL2, MC74HC4020AF, MC74HC4020ADT, MC74HC4020AD Datasheet

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Semiconductor Components Industries, LLC, 2000
March, 2000 – Rev. 2
1 Publication Order Number:
MC74HC4020A/D
MC74HC4020A
14-Stage Binary Ripple Counter
High–Performance Silicon–Gate CMOS
This device consists of 14 master–slave flip–flops with 12 stages brought out to pins. The output of each flip–flop feeds the next and the frequency at each output is half of that of the preceding one. Reset is asynchronous and active–high.
State changes of the Q outputs do not occur simultaneously because of internal ripple delays. Therefore, decoded output signals are subject to decoding spikes and may have to be gated with the Clock of the HC4020A for some designs.
Output Drive Capability: 10 LSTTL Loads
Outputs Directly Interface to CMOS, NMOS, and TTL
Operating Voltage Range: 2 to 6 V
Low Input Current: 1 µA
High Noise Immunity Characteristic of CMOS Devices
In Compliance With JEDEC Standard No. 7A Requirements
Chip Complexity: 398 FETs or 99.5 Equivalent Gates
LOGIC DIAGRAM
Q1
9
Q4
7
Q5
5
Q6
4
Q7
6
Q8
13
Q9
12
Q10
14
Q11
15
Q12
1
Q13
2
Q14
3
Clock
10
Reset
11
Pin 16 = V
CC
Pin 8 = GND
1516 14 13 12 11 10
21 34567
V
CC
9
8
Q11 Q10 Q8 Q9 Reset Clock Q1
Q12 Q13 Q14 Q6 Q5 Q7 Q4
GND
Pinout: 16–Lead Plastic Package
(Top View)
SO–16
D SUFFIX
CASE 751B
http://onsemi.com
TSSOP–16 DT SUFFIX CASE 948F
1
16
PDIP–16 N SUFFIX CASE 648
1
16
1
16
MARKING
DIAGRAMS
1
16
MC74HC4020AN
AWLYYWW
1
16
HC4020A
AWLYWW
A = Assembly Location WL = Wafer Lot YY = Year WW = Work Week
HC40
20A
ALYW
1
16
Device Package Shipping
ORDERING INFORMATION
MC74HC4020AN PDIP–16 2000 / Box MC74HC4020AD SOIC–16
48 / Rail MC74HC4020ADR2 SOIC–16 2500 / Reel MC74HC4020ADT TSSOP–16 96 / Rail MC74HC4020ADTR2 TSSOP–16
2500 / Reel
FUNCTION TABLE
Clock Reset Output State
X
L L H
No Charge
Advance to Next State
All Outputs Are Low
MC74HC4020A
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2
MAXIMUM RATINGS*
Symbol
Parameter
Value
Unit
V
CC
DC Supply Voltage (Referenced to GND)
– 0.5 to + 7.0
V
V
in
DC Input Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
V
V
out
DC Output Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
V
I
in
DC Input Current, per Pin
± 20
mA
I
out
DC Output Current, per Pin
± 25
mA
I
CC
DC Supply Current, VCC and GND Pins
± 50
mA
ÎÎ
Î
P
D
ОООООООООООО
Î
Power Dissipation in Still Air Plastic DIP†
SOIC Package†
TSSOP Package†
ÎÎÎ
Î
750 500 450
Î
Î
mW
T
stg
Storage Temperature Range
– 65 to + 150
_
C
ÎÎ
Î
T
L
ОООООООООООО
Î
Lead Temperature, 1 mm from Case for 10 Seconds
Plastic DIP, SOIC or TSSOP Package
ÎÎÎ
Î
260
Î
Î
_
C
*Maximum Ratings are those values beyond which damage to the device may occur.
Functional operation should be restricted to the Recommended Operating Conditions.
†Derating — Plastic DIP: – 10 mW/_C from 65_ to 125_C
SOIC Package: – 7 mW/_C from 65_ to 125_C TSSOP Package: – 6.1 mW/_C from 65_ to 125_C
For high frequency or heavy load considerations, see Chapter 2 of the ON Semiconductor High–Speed CMOS Data Book (DL129/D).
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
ÎÎ
Max
Unit
V
CC
DC Supply Voltage (Referenced to GND)
2.0
ÎÎ
6.0
V
Vin, V
out
DC Input Voltage, Output Voltage (Referenced to GND)
0
ÎÎ
V
CC
V
T
A
Operating Temperature Range, All Package Types
– 55
ÎÎ
+ 125
_
C
ÎÎ
Î
ÎÎ
Î
tr, t
f
ООООООООООООО
Î
ООООООООООООО
Î
Input Rise/Fall Time VCC = 2.0 V
(Figure 1) VCC = 3.0 V
VCC = 4.5 V VCC = 6.0 V
Î
Î
Î
Î
0 0 0 0
ÎÎ
ÎÎ
ÎÎ
1000
600 500 400
Î
Î
Î
Î
ns
DC CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
Symbol Parameter Condition
V
CC
V
–55 to 25°C ≤85°C ≤125°C
Unit
V
IH
Minimum High–Level Input Voltage
V
out
= 0.1V or VCC –0.1V
|I
out
| 20µA
2.0
3.0
4.5
6.0
1.50
2.10
3.15
4.20
1.50
2.10
3.15
4.20
1.50
2.10
3.15
4.20
V
V
IL
Maximum Low–Level Input Voltage
V
out
= 0.1V or VCC – 0.1V
|I
out
| 20µA
2.0
3.0
4.5
6.0
0.50
0.90
1.35
1.80
0.50
0.90
1.35
1.80
0.50
0.90
1.35
1.80
V
V
OH
Minimum High–Level Output Voltage
Vin = VIH or V
IL
|I
out
| 20µA
2.0
4.5
6.0
1.9
4.4
5.9
1.9
4.4
5.9
1.9
4.4
5.9
V
Vin =VIH or V
IL
|I
out
| 2.4mA
|I
out
| 4.0mA
|I
out
| 5.2mA
3.0
4.5
6.0
2.48
3.98
5.48
2.34
3.84
5.34
2.20
3.70
5.20
V
OL
Maximum Low–Level Output Voltage
Vin = VIH or V
IL
|I
out
| 20µA
2.0
4.5
6.0
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
V
Vin = VIH or V
IL|Iout
| 2.4mA
|I
out
| 4.0mA
|I
out
| 5.2mA
3.0
4.5
6.0
0.26
0.26
0.26
0.33
0.33
0.33
0.40
0.40
0.40
This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high–impedance cir­cuit. For proper operation, Vin and V
out
should be constrained to the
range GND v (Vin or V
out
) v VCC.
Unused inputs must always be tied to an appropriate logic voltage level (e.g., either GND or VCC). Unused outputs must be left open.
MC74HC4020A
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DC CHARACTERISTICS (Voltages Referenced to GND)
Symbol Unit
Guaranteed Limit
V
CC V
ConditionParameter
Symbol Unit≤125°C≤85°C–55 to 25°C
V
CC V
ConditionParameter
I
in
Maximum Input Leakage Current Vin = VCC or GND 6.0 ±0.1 ±1.0 ±1.0 µA
I
CC
Maximum Quiescent Supply Current (per Package)
Vin = VCC or GND I
out
= 0µA
6.0 4 40 160 µA
NOTE: Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High–Speed CMOS Data Book
(DL129/D).
AC CHARACTERISTICS (C
L
= 50 pF, Input tr = tf = 6 ns)
V
Guaranteed Limit
Symbol Parameter
V
CC
V
–55 to 25°C ≤85°C ≤125°C
Unit
f
max
Maximum Clock Frequency (50% Duty Cycle) (Figures 1 and 4)
2.0
3.0
4.5
6.0
10 15 30 50
9.0 14 28 50
8.0 12 25 40
MHz
t
PLH
,
t
PHL
Maximum Propagation Delay, Clock to Q1* (Figures 1 and 4)
2.0
3.0
4.5
6.0
96 63 31 25
106
71 36 30
115
88 40 35
ns
t
PHL
Maximum Propagation Delay, Reset to Any Q (Figures 2 and 4)
2.0
3.0
4.5
6.0
45 30 30 26
52 36 35 32
65 40 40 35
ns
t
PLH
,
t
PHL
Maximum Propagation Delay, Qn to Qn+1 (Figures 3 and 4)
2.0
3.0
4.5
6.0
69 40 17 14
80 45 21 15
90 50 28 22
ns
t
TLH
,
t
THL
Maximum Output Transition Time, Any Output (Figures 1 and 4)
2.0
3.0
4.5
6.0
75 27 15 13
95 32 19 15
110
36 22 19
ns
C
in
Maximum Input Capacitance 10 10 10 pF
NOTE: For propagation delays with loads other than 50 pF, and information on typical parametric values, see Chapter 2 of the ON
Semiconductor High–Speed CMOS Data Book (DL129/D).
* For TA = 25°C and CL = 50 pF , typical propagation delay from Clock to other Q outputs may be calculated with the following equations:
VCC = 2.0 V: tP = [93.7 + 59.3 (n–1)] ns VCC = 4.5 V: tP = [30.25 + 14.6 (n–1)] ns VCC = 3.0 V: tP = [61.5 + 34.4 (n–1)] ns VCC = 6.0 V: tP = [24.4 + 12 (n–1)] ns
Typical @ 25°C, VCC = 5.0 V
C
PD
Power Dissipation Capacitance (Per Package)*
38
pF
*Used to determine the no–load dynamic power consumption: PD = CPD V
CC
2
f + ICC VCC. For load considerations, see Chapter 2 of the
ON Semiconductor High–Speed CMOS Data Book (DL129/D).
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