Motorola MC54HC597J, MC74HC597N Datasheet

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SEMICONDUCTOR TECHNICAL DATA
1
REV 6
Motorola, Inc. 1995
10/95
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High–Performance Silicon–Gate CMOS
The MC54/74HC597 is identical in pinout to the LS597. The device inputs are compatible with standard CMOS outputs; with pullup resistors, they are compatible with LSTTL outputs.
This device consists of an 8–bit input latch which feeds parallel data to an 8–bit shift register. Data can also be loaded serially (see Function Table).
The HC597 is similar in function to the HC589, which is a 3–state device.
Output Drive Capability: 10 LSTTL Loads
Outputs Directly Interface to CMOS, NMOS, and TTL
Operating Voltage Range: 2 to 6 V
Low Input Current: 1 µA
High Noise Immunity Characteristic of CMOS Devices
In Compliance with the Requirements Defined by JEDEC Standard
No. 7A
Chip Complexity: 516 FETs or 129 Equivalent Gates
LOGIC DIAGRAM
SERIAL
DATA
INPUT
14
15 1 2 3 4 5 6 7
12
11 13 10
S
A
A B C D E
F G H
LATCH CLOCK
SHIFT CLOCK
SERIAL SHIFT/
PARALLEL LOAD
RESET
PARALLEL
DATA
INPUTS
INPUT LATCH
SHIFT
REGISTER
PIN 16 = V
CC
PIN 8 = GND
9
Q
H
SERIAL
DATA
OUTPUT

PIN ASSIGNMENT
13
14
15
16
9
10
11
125
4
3
2
1
8
7
6
LATCH CLOCK
SERIAL SHIFT/ PARALLEL LOAD
S
A
A
V
CC
Q
H
RESET
SHIFT CLOCK
E
D
C
B
GND
H
G
F
D SUFFIX
SOIC PACKAGE
CASE 751B–05
N SUFFIX
PLASTIC PACKAGE
CASE 648–08
ORDERING INFORMATION
MC54HCXXXJ MC74HCXXXN MC74HCXXXD
Ceramic Plastic SOIC
1
16
1
16
J SUFFIX
CERAMIC PACKAGE
CASE 620–10
1
16
MC54/74HC597
MOTOROLA High–Speed CMOS Logic Data
DL129 — Rev 6
2
MAXIMUM RATINGS*
Symbol
Parameter
Value
Unit
V
CC
DC Supply Voltage (Referenced to GND)
– 0.5 to + 7.0
V
V
in
DC Input Voltage (Referenced to GND)
– 1.5 to VCC + 1.5
V
V
out
DC Output Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
V
I
in
DC Input Current, per Pin
± 20
mA
I
out
DC Output Current, per Pin
± 25
mA
I
CC
DC Supply Current, VCC and GND Pins
± 50
mA
P
D
Power Dissipation in Still Air,Plastic or Ceramic DIP†
SOIC Package†
750 500
mW
T
stg
Storage Temperature
– 65 to + 150
_
C
T
L
Lead Temperature, 1 mm from Case for 10 Seconds
(Plastic DIP or SOIC Package)
(Ceramic DIP)
260 300
_
C
*Maximum Ratings are those values beyond which damage to the device may occur.
Functional operation should be restricted to the Recommended Operating Conditions.
†Derating — Plastic DIP: – 10 mW/_C from 65_ to 125_C
Ceramic DIP: – 10 mW/_C from 100_ to 125_C — SOIC Package: – 7 mW/_C from 65_ to 125_C
For high frequency or heavy load considerations, see Chapter 2 of the Motorola High–Speed CMOS Data Book (DL129/D).
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Unit
V
CC
DC Supply Voltage (Referenced to GND)
2.0
6.0
V
Vin, V
out
DC Input Voltage, Output Voltage (Referenced to GND)
0
V
CC
V
T
A
Operating Temperature, All Package Types
– 55
+ 125
_
C
tr, t
f
Input Rise and Fall Time VCC = 2.0 V
(Figure 1) VCC = 4.5 V
VCC = 6.0 V
0 0 0
1000
500 400
ns
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
Symbol
Parameter
Test Conditions
V
CC V
– 55 to
25_C
v
85_Cv 125_C
Unit
V
IH
Minimum High–Level Input Voltage
V
out
= 0.1 V or VCC – 0.1 V
|I
out
| v 20 µA
2.0
4.5
6.0
1.5
3.15
4.2
1.5
3.15
4.2
1.5
3.15
4.2
V
V
IL
Maximum Low–Level Input Voltage
V
out
= 0.1 V or VCC – 0.1 V
|I
out
| v 20 µA
2.0
4.5
6.0
0.3
0.9
1.2
0.3
0.9
1.2
0.3
0.9
1.2
V
V
OH
Minimum High–Level Output Voltage
Vin = VIH or V
IL
|I
out
| v 20 µA
2.0
4.5
6.0
1.9
4.4
5.9
1.9 4 4
5.9
1.9 4 4
5.9
V
Vin = VIH or VIL|I
out
| v 4.0 mA
|I
out
| v 5.2 mA
4.5
6.0
3.98
5.48
3.84
5.34
3.70
5.20
V
OL
Maximum Low–Level Output Voltage
Vin = VIH or V
IL
|I
out
| v 20 µA
2.0
4.5
6.0
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
V
Vin = VIH or VIL|I
out
| v 4.0 mA
|I
out
| v 5.2 mA
4.5
6.0
0.26
0.26
0.33
0.33
0.40
0.40
I
in
Maximum Input Leakage Current
Vin = VCC or GND
6.0
± 0.1
± 1.0
± 1.0
µA
I
CC
Maximum Quiescent Supply Current (per Package)
Vin = VCC or GND I
out
= 0 µA
6.0
8
80
160
µA
NOTE: Information on typical parametric values can be found in Chapter 2 of the Motorola High–Speed CMOS Data Book (DL129/D).
This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high–impedance cir­cuit. For proper operation, Vin and V
out
should be constrained to the
range GND v (Vin or V
out
) v VCC.
Unused inputs must always be tied to an appropriate logic voltage level (e.g., either GND or VCC). Unused outputs must be left open.
MC54/74HC597
High–Speed CMOS Logic Data DL129 — Rev 6
3 MOTOROLA
AC ELECTRICAL CHARACTERISTICS (C
L
= 50 pF, Input tr = tf = 6 ns)
Guaranteed Limit
Symbol
Parameter
V
CC V
– 55 to
25_C
v
85_Cv 125_C
Unit
f
max
Maximum Clock Frequency (50% Duty Cycle)
(Figures 2 and 8)
2.0
4.5
6.0
6.0 30 35
4.8 24 28
4.0 20 24
MHz
t
PLH
,
t
PHL
Maximum Propagation Delay, Latch Clock to Q
H
(Figures 1 and 8)
2.0
4.5
6.0
210
42 36
265
53 45
315
63 54
ns
t
PLH
,
t
PHL
Maximum Propagation Delay, Shift Clock to Q
H
(Figures 2 and 8)
2.0
4.5
6.0
175
35 30
220
44 37
265
53 45
ns
t
PHL
Maximum Propagation Delay, Reset to Q
H
(Figures 3 and 8)
2.0
4.5
6.0
175
35 30
220
44 37
265
53 45
ns
t
PLH
,
t
PHL
Maximum Propagation Delay, Serial Shift/Parallel Load to Q
H
(Figures 4 and 8)
2.0
4.5
6.0
175
35 30
220
44 37
265
53 45
ns
t
TLH
,
t
THL
Maximum Output Transition Time, Any Output
(Figures 1 and 8)
2.0
4.5
6.0
75 15 13
95 19 16
110
22 19
ns
C
in
Maximum Input Capacitance
10
10
10
pF
NOTES:
1. For propagation delays with loads other than 50 pF, see Chapter 2 of the Motorola High–Speed CMOS Data Book (DL129/D).
2. Information on typical parametric values can be found in Chapter 2 of the Motorola High–Speed CMOS Data Book (DL129/D).
Typical @ 25°C, VCC = 5.0 V
C
PD
Power Dissipation Capacitance (Per Package)*
50
pF
*Used to determine the no–load dynamic power consumption: PD = CPD V
CC
2
f + ICC VCC. For load considerations, see Chapter 2 of the
Motorola High–Speed CMOS Data Book (DL129/D).
PIN DESCRIPTIONS
DATA INPUTS A, B, C, D, E, F, G, H (Pins 15, 1, 2, 3, 4, 5, 6, 7)
Parallel data inputs. Data on these inputs is stored in the
input latch on the rising edge of the Latch Clock input.
SA (Pin 14)
Serial data input. Data on this input is shifted into the shift register on the rising edge of the Shift Clock input it Serial Shift/Parallel Load
is high. Data on this input is ignored when
Serial Shift/Parallel Load
is low.
CONTROL INPUTS Serial Shift/Parallel Load
(Pin 13)
Shift register mode control. When a high level is applied to this pin, the shift register is allowed to serially shift data. When a low level is applied to this pin, the shift register accepts parallel data from the input latch, and serial shifting is inhibited.
Reset (Pin 10)
Asynchronous, Active–low shift register reset. A low level applied to this input resets the shift register to a low level, but does not change the data in the input latch.
Shift Clock (Pin 11)
Serial shift register clock. A low–to–high transition on this input shifts data on the Serial Data Input into the shift register and data in stage H is shifted out QH, being replaced by the data previously stored in stage G.
Latch Clock (Pin 12)
Latch clock. A low–to–high transition on this input loads the parallel data on inputs A–H into the input latch.
OUTPUT QH (Pin 9)
Serial data output. This pin is the output from the last stage of the shift register.
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